R536 - Reliability Data

Reliability Data Report
Product Family R536
LTC2952 \ LTC2953 \ LTC4215 \
LTC4217 \ LTC4218 \ LTC4219 \
LTC4222 \ LTC4223 \ LTC4225 \
LTC4227 \ LTC4228 \ LTC4229 \
LTC4232 \ LTC4233 \ LTC4234 \
LTC4235 \ LTC4236 \ LTC4242 \
LTC4245 \ LTC4260 \ LTC4264 \
LTC4280 \ LTC4352 \ LTC4353 \
LTC4355 \ LTC4357 \ LTC4358 \
LTC4370
Reliability Data Report
Report Number: R536
Report generated on: Wed Feb 10 17:19:34 PST 2016
OPERATING LIFE TEST
PACKAGE TYPE
SAMPLE SIZE
OLDEST DATE
NEWEST DATE
K DEVICE HRS
CODE
CODE
(+125°C)
1
No. of FAILURES
2,3
SSOP/TSSOP
QFN/DFN
SOIC/MSOP
1183
3722
308
0702
0630
0502
1450
1448
1138
877
3746
308
0
0
0
Totals
5,213
-
-
4,931
0
HIGHLY ACCELERATED STRESS TEST AT +130 DEG C / 85% RH
PACKAGE TYPE
SAMPLE SIZE
OLDEST DATE
NEWEST DATE
K DEVICE HRS
CODE
CODE
(+85°C)
No. of FAILURES
4
QFN/DFN
SSOP/TSSOP
231
99
1345
1332
1345
1415
591
224
0
0
SOIC/MSOP
Totals
160
490
0743
-
0836
-
307
1,122
0
0
K DEVICE HRS
No. of FAILURES
PRESSURE COOKER TEST AT 15 PSIG , +121 DEG C
PACKAGE TYPE
SAMPLE SIZE
SSOP/TSSOP
SOIC/MSOP
1718
1628
QFN/DFN
Totals
5250
8,596
OLDEST DATE
NEWEST DATE
CODE
CODE
0649
0511
1419
1338
143
364
0
0
0701
-
1417
-
390
897
0
0
OLDEST DATE
NEWEST DATE
K DEVICE
No. of FAILURES
CODE
CODE
CYCLES
TEMP CYCLE FROM -65 TO 150 DEG C
PACKAGE TYPE
SAMPLE SIZE
SSOP/TSSOP
1693
0724
1422
428
0
SOIC/MSOP
QFN/DFN
Totals
1447
5080
8,220
0511
0701
-
1338
1417
-
1087
1490
3,005
0
0
0
OLDEST DATE
NEWEST DATE
K DEVICE
No. of FAILURES
CYCLES
THERMAL SHOCK FROM -65 TO 150 DEG C
PACKAGE TYPE
SAMPLE SIZE
CODE
CODE
SSOP/TSSOP
1597
0724
1422
436
0
SOIC/MSOP
QFN/DFN
1366
4841
0743
0701
1338
1417
1007
1471
0
0
Totals
7,804
-
-
2,914
0
(1) Assumes Activation Energy = 0.7 Electron Volts
(2) Failure Rate Equivalent to +55 °C, 60% Confidence Level =2.4 FITS
(3) Mean Time Between Failure in Years = 47505.84
(4) Assumes 20X Acceleration from 85 °C to +130 °C
Note 1: 1 FIT = 1 Failure in One Billion Hours.
Note 2: HAST, Temp Cycle & Thermal Shock are subjected to J-STD-020 MSL Preconditioning
Reliability Data Report
Report Number: R536
Report generated on: Wed Feb 10 17:19:34 PST 2016
HIGH TEMPERATURE BAKE AT 150 DEG C
PACKAGE TYPE
SAMPLE SIZE
QFN/DFN
SSOP/TSSOP
Totals
976
100
1,076
OLDEST DATE
NEWEST DATE
K DEVICE HRS
No. of FAILURES
CODE
CODE
0722
1311
-
1349
1422
-
951
100
1,051
0
0
0
OLDEST DATE
NEWEST DATE
K DEVICE HRS
No. of FAILURES
CODE
CODE
HIGH TEMPERATURE BAKE AT 175 DEG C
PACKAGE TYPE
SAMPLE SIZE
QFN/DFN
231
1345
1345
231
0
SSOP/TSSOP
SOIC/MSOP
200
726
0908
0743
0946
0928
175
726
0
0
Totals
1,157
-
-
1,132
0