Reliability Data Report Product Family R536 LTC2952 \ LTC2953 \ LTC4215 \ LTC4217 \ LTC4218 \ LTC4219 \ LTC4222 \ LTC4223 \ LTC4225 \ LTC4227 \ LTC4228 \ LTC4229 \ LTC4232 \ LTC4233 \ LTC4234 \ LTC4235 \ LTC4236 \ LTC4242 \ LTC4245 \ LTC4260 \ LTC4264 \ LTC4280 \ LTC4352 \ LTC4353 \ LTC4355 \ LTC4357 \ LTC4358 \ LTC4370 Reliability Data Report Report Number: R536 Report generated on: Wed Feb 10 17:19:34 PST 2016 OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE NEWEST DATE K DEVICE HRS CODE CODE (+125°C) 1 No. of FAILURES 2,3 SSOP/TSSOP QFN/DFN SOIC/MSOP 1183 3722 308 0702 0630 0502 1450 1448 1138 877 3746 308 0 0 0 Totals 5,213 - - 4,931 0 HIGHLY ACCELERATED STRESS TEST AT +130 DEG C / 85% RH PACKAGE TYPE SAMPLE SIZE OLDEST DATE NEWEST DATE K DEVICE HRS CODE CODE (+85°C) No. of FAILURES 4 QFN/DFN SSOP/TSSOP 231 99 1345 1332 1345 1415 591 224 0 0 SOIC/MSOP Totals 160 490 0743 - 0836 - 307 1,122 0 0 K DEVICE HRS No. of FAILURES PRESSURE COOKER TEST AT 15 PSIG , +121 DEG C PACKAGE TYPE SAMPLE SIZE SSOP/TSSOP SOIC/MSOP 1718 1628 QFN/DFN Totals 5250 8,596 OLDEST DATE NEWEST DATE CODE CODE 0649 0511 1419 1338 143 364 0 0 0701 - 1417 - 390 897 0 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES CODE CODE CYCLES TEMP CYCLE FROM -65 TO 150 DEG C PACKAGE TYPE SAMPLE SIZE SSOP/TSSOP 1693 0724 1422 428 0 SOIC/MSOP QFN/DFN Totals 1447 5080 8,220 0511 0701 - 1338 1417 - 1087 1490 3,005 0 0 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES CYCLES THERMAL SHOCK FROM -65 TO 150 DEG C PACKAGE TYPE SAMPLE SIZE CODE CODE SSOP/TSSOP 1597 0724 1422 436 0 SOIC/MSOP QFN/DFN 1366 4841 0743 0701 1338 1417 1007 1471 0 0 Totals 7,804 - - 2,914 0 (1) Assumes Activation Energy = 0.7 Electron Volts (2) Failure Rate Equivalent to +55 °C, 60% Confidence Level =2.4 FITS (3) Mean Time Between Failure in Years = 47505.84 (4) Assumes 20X Acceleration from 85 °C to +130 °C Note 1: 1 FIT = 1 Failure in One Billion Hours. Note 2: HAST, Temp Cycle & Thermal Shock are subjected to J-STD-020 MSL Preconditioning Reliability Data Report Report Number: R536 Report generated on: Wed Feb 10 17:19:34 PST 2016 HIGH TEMPERATURE BAKE AT 150 DEG C PACKAGE TYPE SAMPLE SIZE QFN/DFN SSOP/TSSOP Totals 976 100 1,076 OLDEST DATE NEWEST DATE K DEVICE HRS No. of FAILURES CODE CODE 0722 1311 - 1349 1422 - 951 100 1,051 0 0 0 OLDEST DATE NEWEST DATE K DEVICE HRS No. of FAILURES CODE CODE HIGH TEMPERATURE BAKE AT 175 DEG C PACKAGE TYPE SAMPLE SIZE QFN/DFN 231 1345 1345 231 0 SSOP/TSSOP SOIC/MSOP 200 726 0908 0743 0946 0928 175 726 0 0 Totals 1,157 - - 1,132 0