NPIC6C596-Q100 Power logic 8-bit shift register; open-drain outputs Rev. 2 — 4 July 2013 Product data sheet 1. General description The NPIC6C596-Q100 is an 8-bit serial-in/serial or parallel-out shift register with a storage register and open-drain outputs. Both the shift and storage register have separate clocks. The device features a serial input (DS) and a serial output (Q7S) to enable cascading and an asynchronous reset MR input. A LOW on MR resets both the shift register and storage register. Data is shifted on the LOW-to-HIGH transitions of the SHCP input. The data in the shift register is transferred to the storage register on a LOW-to-HIGH transition of the STCP input. If both clocks are connected together, the shift register is always one clock pulse ahead of the storage register. To provide additional hold time in cascaded applications, the serial output QS7 is clocked out on the falling edge of SHCP. Data in the storage register drives the gate of the output extended-drain NMOS (EDNMOS) transistor whenever the output enable input (OE) is LOW. A HIGH on OE causes the outputs to assume a high-impedance OFF-state. Operation of the OE input does not affect the state of the registers. The open-drain outputs are 33 V/100 mA continuous current extended-drain NMOS transistors designed for use in systems that require moderate load power such as LEDs. Integrated voltage clamps in the outputs provide protection against inductive transients making the device suitable for power driver applications such as relays, solenoids and other low-current or medium-voltage loads. This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications. 2. Features and benefits Automotive product qualification in accordance with AEC-Q100 (Grade 1) Specified from 40 C to +125 C Low RDSon Eight Power EDNMOS transistor outputs of 100 mA continuous current 250 mA current limit capability Output clamping voltage 33 V 30 mJ avalanche energy capability Enhanced cascading for multiple stages All registers cleared with single input Low power consumption ESD protection: HBM AEC-Q100-002 revision D exceeds 2500 V CDM AEC-Q100-011 revision B exceeds 1000 V NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs 3. Applications LED sign Graphic status panel Fault status indicator 4. Ordering information Table 1. Ordering information Type number Package Temperature range Name Description Version 40 C to +125 C SO16 plastic small outline package; 16 leads; body width 3.9 mm SOT109-1 NPIC6C596PW-Q100 40 C to +125 C TSSOP16 plastic thin shrink small outline package; 16 leads; body width 4.4 mm SOT403-1 NPIC6C596BQ-Q100 40 C to +125 C DHVQFN16 plastic dual in-line compatible thermal enhanced SOT763-1 very thin quad flat package; no leads; 16 terminals; body 2.5 3.5 0.85 mm NPIC6C596D-Q100 5. Functional diagram 15 SHCP 10 STCP Q0 Q1 Q2 2 Q3 DS Q4 Q5 Q6 Q7 Q7S MR OE 7 8 3 4 2 DS 15 SHCP 7 MR 10 STCP 8 OE Logic symbol NPIC6C596_Q100 Product data sheet 9 5 6 11 8-BIT STORAGE REGISTER 12 13 14 OPEN-DRAIN OUTPUTS 9 Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7 3 6 4 5 11 12 13 14 aaa-002548 aaa-002547 Fig 1. Q7S 8-STAGE SHIFT REGISTER Fig 2. Functional diagram All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 2 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs VCC Qn 33 V GND GND aaa-002551 aaa-002550 Fig 3. Schematic of all inputs Fig 4. STAGE 0 DS D Schematic of open-drain outputs (Qn) STAGE 1 TO 6 Q D STAGE 7 Q D FF0 Q STAGE 7S CP Q7S FF7 CP R Q D FF7 CP R R SHCP MR R D Q R D FF Q FF CP CP STCP OE GND GND aaa-002552 Q0 Fig 5. Q1 Q2 Q3 Q4 Q5 Q6 Q7 Logic diagram NPIC6C596_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 3 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs 7 6 5 4 3 2 1 0 SHCP 5V GND 5V OE GND 5V DS GND 5V STCP GND 5V MR GND Q1 VOH VOL aaa-002553 Fig 6. Timing diagram NPIC6C596_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 4 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs 6. Pinning information 6.1 Pinning VCC 1 terminal 1 index area NPIC6C596-Q100 16 GND NPIC6C596-Q100 DS 2 15 SHCP VCC 1 16 GND Q0 3 14 Q7 DS 2 15 SHCP Q1 4 13 Q6 Q0 3 14 Q7 Q2 5 Q1 4 13 Q6 Q3 6 Q2 5 12 Q5 MR 7 Q3 6 11 Q4 MR 7 10 STCP OE 8 11 Q4 8 9 OE 10 STCP Q7S 9 12 Q5 GND(1) Q7S aaa-002555 Transparent top view aaa-002554 (1) This is not a supply pin. The substrate is attached to this pad using conductive die attach material. There is no electrical or mechanical requirement to solder this pad. However, if it is soldered, the solder land should remain floating or be connected to GND. Fig 7. Pin configuration SO16 and TSSOP16 Fig 8. Pin configuration DHVQFN16 6.2 Pin description Table 2. Pin description Symbol Pin Description VCC 1 supply voltage DS 2 serial data input Q0, Q1, Q2, Q3, Q4, Q5, Q6, Q7 3, 4, 5, 6, 11, 12, 13, 14 parallel data output (open-drain) MR 7 master reset (active LOW) OE 8 output enable input (active LOW) Q7S 9 serial data output STCP 10 storage register clock input SHCP 15 shift register clock input GND 16 ground (0 V) NPIC6C596_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 5 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs 7. Limiting values Table 3. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to GND (ground = 0 V). Symbol Parameter Conditions Min Max Unit VCC supply voltage 0.5 +7.0 V VI input voltage VDS drain-source voltage power EDNMOS drain-source voltage 0.3 +7.0 V - +33 V Id(SD) source-drain diode current continuous - 250 mA - 500 mA - 100 mA [2] - 250 mA [2] - 250 mA non-repetitive avalanche energy single pulse; see Figure 9 [3] - 30 mJ IAL avalanche current [3] Tstg storage temperature pulsed [2] Tamb = 25 C drain current ID [1] continuous; each output; all outputs on pulsed; each output; all outputs on single output; Tamb = 25 C peak drain current IDM EAS see Figure 9 Tamb = 25 C total power dissipation Ptot - 200 mA 65 +150 C - 800 mW [4] SO16 TSSOP16 - 725 mW DHVQFN16 - 1825 mW - 160 mW Tamb = 125 C SO16 [4] TSSOP16 - 145 mW DHVQFN16 - 365 mW [1] Each power EDNMOS source is internally connected to GND. [2] Pulse duration 100 s and duty cycle 2 %. [3] VDS = 15 V; starting junction temperature (Tj) = 25 C; L = 1.5 H; avalanche current (IAL) = 200 mA. [4] For SO16 packages: above 25 C the value of Ptot derates linearly with 6.4 mW/C. For TSSOP16 packages: above 25 C the value of Ptot derates linearly with 5.8 mW/C. For DHVQFN16 packages: above 25 C the value of Ptot derates linearly with 14.6 mW/C. NPIC6C596_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 6 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs 7.1 Test circuit and waveform 5V 15 V VCC 7 15 WORD GENERATOR(1) 2 10 8 lD 1 MR SHCP DUT DS Qn 3-6, 11-14 tAL tw(2) 30 Ω 5V 1.5 mH 0V lAL = 200 mA ID VDS STCP OE V(BR)DSS = 33 V VDS GND min 16 aaa-002556 (1) The word generator has the following characteristics: tr, tf 10 ns; ZO = 50 . (2) The input pulse duration (tW) is increased until peak current IAL = 200 mA. Energy test level is defined as: EAS = IAL V(BR)DSS tAL/2 = 30 mJ. Fig 9. Test circuit and waveform for measuring single-pulse avalanche energy 8. Recommended operating conditions Table 4. Recommended operating conditions Symbol Parameter VCC supply voltage VI input voltage Conditions ID drain current Tamb ambient temperature pulsed drain output current; VCC = 5 V; Tamb = 25 C; all outputs on [1] Pulse duration 100 s and duty cycle 2 %. [2] Technique should limit Tj Tamb to 10 C maximum. [1][2] Min Typ Max Unit 4.5 - 5.5 V 0 - 5.5 V - - 250 mA 40 - +125 C 9. Static characteristics Table 5. Static characteristics At recommended operating conditions. Voltages are referenced to GND (ground = 0 V). Symbol Parameter VCC = 5.0 V; Tamb = 25 C Conditions Min Typ Max Unit VIH HIGH-level input voltage VCC = 4.5 V to 5.5 V 0.85VCC - - V VIL LOW-level input voltage VCC = 4.5 V to 5.5 V - - 0.15VCC V VOH HIGH-level output voltage serial data output Q7S; VI = VIH or VIL IO = 20 A; VCC = 4.5 V 4.4 4.49 - V IO = 4 mA; VCC = 4.5 V 4.0 4.2 - V NPIC6C596_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 7 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs Table 5. Static characteristics …continued At recommended operating conditions. Voltages are referenced to GND (ground = 0 V). Symbol Parameter VOL VCC = 5.0 V; Tamb = 25 C Conditions LOW-level output serial data output Q7S; VI = VIH or VIL voltage IO = 20 A; VCC = 4.5 V IO = 4 mA; VCC = 4.5 V Min Typ Unit Max - 0.005 0.1 V - 0.3 0.5 V IIH HIGH-level input current VCC = 5.5 V; VI = VCC - - 1 A IIL LOW-level input current VCC = 5.5 V; VI = 0 V 1 - - A V(BR)DSS drain-source breakdown voltage ID = 1 mA 33 37 - V VSD source-drain voltage diode forward voltage; IF = 100 mA - 0.85 1.2 V ICC supply current logic supply current; VCC = 5.5 V; VI = VCC or GND - 0.004 200 A - 0.006 500 A - 0.75 5 mA - 140 - mA - 0.002 0.2 A - 0.15 0.3 A - 3.0 9 5.4 12 3.1 10 all outputs off [1] all outputs on all outputs off; SHCP = 5 MHz;CL = 30 pF; see Figure 14 and Figure 16 IO(nom) nominal output current VDS = 0.5 V; Tamb = 85 C; Iout = ID IDSX drain cut-off current VCC = 5.5 V; VDS = 30 V RDSon drain-source on-state resistance [2][3][4] VCC = 5.5 V; VDS = 30 V; Tamb = 125 C see Figure 17 and Figure 18 [2][3] VCC = 4.5 V; ID = 50 mA VCC = 4.5 V; ID = 50 mA; Tamb = 125 C VCC = 4.5 V; ID = 100 mA - [1] Output currents below 250 mA current limit. [2] Technique should limit Tj Tamb to 10 C maximum. [3] These parameters are measured with voltage-sensing contacts separate from the current-carrying contacts. [4] Nominal output current is defined for a consistent comparison between devices from different sources. It is the current that produces a voltage drop of 0.5 V at Tamb = 85 C. NPIC6C596_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 8 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs 10. Dynamic characteristics Table 6. Dynamic characteristics Voltages are referenced to GND (ground = 0 V); For test circuit see Figure 14. Symbol Parameter VCC = 5.0 V; Tamb = 25 C Conditions Min Typ Max Unit tPLH LOW to HIGH propagation delay OE to Qn; ID = 75 mA; see Figure 10 and Figure 19 - 97 - ns tPHL HIGH to LOW propagation delay OE to Qn; ID = 75 mA; see Figure 10 and Figure 19 - 9 - ns tr rise time OE to Qn; ID = 75 mA; see Figure 10 and Figure 19 - 60 - ns tf fall time OE to Qn; ID = 75 mA; see Figure 10 and Figure 19 - 18 - ns tpd propagation delay SHCP to Q7S; ID = 75 mA; see Figure 11 [1] - 5 - fmax maximum frequency SHCP; ID = 75 mA; see Figure 11 [2] - - 10 trr reverse recovery time IF = 100 mA; dI/dt = 10 A/s; see Figure 13 [3][4] - 120 - ns ta reverse recovery current rise time IF = 100 mA; dI/dt = 10 A/s; see Figure 13 [3][4] - 100 - ns tsu set-up time DS to SHCP; see Figure 12 15 - - ns th hold time DS to SHCP; see Figure 12 15 - - ns tW pulse width 40 - - ns [1] [2] ns MHz tpd is the same as tPLH and tPHL. This is the maximum serial clock frequency assuming cascaded operation where serial data is passed from one stage to a second stage. The clock period allows for SHCP → Q7S propagation delay and setup time plus some timing margin. [3] Technique should limit Tj Tamb to 10 C maximum. [4] These parameters are measured with voltage-sensing contacts separate from the current-carrying contacts. 10.1 Test circuits and waveforms VI OE input VM GND tPLH 24 V Qn output LOW-to-OFF OFF-to-LOW VOL tPHL VY VY VX VX tr tf aaa-002557 Measurement points are given in Table 7. VOL is the typical output voltage level that occurs with the output load. Fig 10. The output enable (OE) input to data output (Qn) propagation delays and (Qn) output rise and fall times NPIC6C596_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 9 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs 1/fmax VI SHCP input VM GND tW tPLH tPHL VOH VM Q7S output VOL aaa-002558 Measurement points are given in Table 7. VOL and VOH are the typical output voltage levels that occur with the output load. Fig 11. The shift clock (SHCP) to serial data output (Q7S) propagation delays with the minimum shift clock pulse width and maximum shift clock frequency Table 7. Measurement points Supply voltage Input Output VCC VM VM VX VY 5V 0.5VCC 0.5VDS 0.1VDS 0.9VDS VI SHCP input VM GND tsu tsu th th VI DS input VM GND VOH VM Q7S output VOL aaa-002559 Measurement points are given in Table 8. The shaded areas indicate when the input is permitted to change for predictable output performance. VOL and VOH are the typical output voltage levels that occur with the output load. Fig 12. The data set-up and hold times for the serial data input (DS) Table 8. Measurement points Supply voltage Input Output VCC VM VM 5V 0.5VCC 0.5VCC NPIC6C596_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 10 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs K(1) Qn DUT 0.85 mH 2500 μF 250 V 0.1 A 15 V di/dt = 10 A/μs IF IF A(1) 0 t2 t1 25 % of lRM t3 driver RG VI(2) G IRM ta 50 Ω trr aaa-002560 (1) The open-drain Qn terminal under test is connected to test point K. All other terminals are connected together and connected to test point A. (2) The VI amplitude and RG are adjusted for dI/dt = 10 A/s. A VI double-pulse train is used to set IF = 0.1 A, where t1 = 10 s, t2 = 7 s and t3 = 3 s. Fig 13. Test circuit and waveform for measuring reverse recovery current NPIC6C596_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 11 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs VI tW 90 % negative pulse VM VM 10 % 0V tf tr tr tf VI 90 % VM positive pulse VM 10 % 0V tW 5V VDS = 15 V 1 7 15 WORD GENERATOR (1) 2 10 8 VCC MR RL SHCP Qn DS 3, 4, 5, 6 11, 12,13, 14 CL (2) STCP OE GND 16 aaa-002561 (1) The word generator has the following characteristics: tr, tf 10 ns; tW = 300 ns; pulsed repetition rate (PRR) = 5 kHz; ZO = 50 . (2) CL includes probe and jig capacitance. Test data is given in Table 9. Definitions for test circuit: VDS = External voltage for Power EDNMOS drain-source voltage. RL = Load resistance. CL = Load capacitance including jig and probe capacitance. Fig 14. Test circuit for measuring switching times Table 9. Test data Supply voltage 5V NPIC6C596_Q100 Product data sheet Input Load VI tr, tf VM CL RL 5V 10 ns 50 % 30 pF 200 All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 12 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs aaa-002562 1 aaa-002563 6 lCC (mA) IAL (A) 4 10-1 2 10-2 10-1 1 0 10-1 10 1 fi (MHz) Tamb = 25 C. Tamb = 40 C to 125 C; VCC = 5 V. Fig 15. Avalanche current (peak) versus time duration of avalanche aaa-002564 5 4 Fig 16. Supply current versus frequency aaa-002565 5 (1) RDSon (Ω) 102 10 tAL (ms) RDSon (Ω) 4 (2) (1) (2) (3) 3 3 (3) (4) 2 2 1 (4) 1 0 0 50 100 150 200 250 300 lD (mA) 4 5 8 VI = VCC or GND and VO = open circuit. VI = VCC or GND and VO = GND or VCC. (1) Tamb = 125 C (2) Tamb = 85 C (2) Tamb = 85 C (3) Tamb = 25 C (3) Tamb = 25 C (4) Tamb = 40 C (4) Tamb = 40 C Fig 17. Drain-source on-state resistance versus drain current Product data sheet 7 VCC (V) (1) Tamb = 125 C NPIC6C596_Q100 6 Fig 18. Static drain-source on-state resistance versus supply voltage All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 13 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs aaa-002546 140 switching time (ns) 120 (1) (2) 100 (3) 80 60 (4) 40 20 0 -50 -25 0 25 50 75 100 125 Tamb (°C) Technique should limit TJ TC to 10 C maximum. (1) tPLH. (2) tr. (3) tf. (4) tPHL. Fig 19. Switching time versus case temperature NPIC6C596_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 14 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs 11. Package outline SO16: plastic small outline package; 16 leads; body width 3.9 mm SOT109-1 D E A X c y HE v M A Z 16 9 Q A2 A (A 3) A1 pin 1 index θ Lp 1 L 8 e 0 detail X w M bp 2.5 5 mm scale DIMENSIONS (inch dimensions are derived from the original mm dimensions) UNIT A max. A1 A2 A3 bp c D (1) E (1) e HE L Lp Q v w y Z (1) mm 1.75 0.25 0.10 1.45 1.25 0.25 0.49 0.36 0.25 0.19 10.0 9.8 4.0 3.8 1.27 6.2 5.8 1.05 1.0 0.4 0.7 0.6 0.25 0.25 0.1 0.7 0.3 0.01 0.019 0.0100 0.39 0.014 0.0075 0.38 0.039 0.016 0.028 0.020 inches 0.010 0.057 0.069 0.004 0.049 0.16 0.15 0.05 0.244 0.041 0.228 0.01 0.01 0.028 0.004 0.012 θ 8o o 0 Note 1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included. REFERENCES OUTLINE VERSION IEC JEDEC SOT109-1 076E07 MS-012 JEITA EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-19 Fig 20. Package outline SOT109-1 (SO16) NPIC6C596_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 15 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs TSSOP16: plastic thin shrink small outline package; 16 leads; body width 4.4 mm SOT403-1 E D A X c y HE v M A Z 9 16 Q (A 3) A2 A A1 pin 1 index θ Lp L 1 8 e detail X w M bp 0 2.5 5 mm scale DIMENSIONS (mm are the original dimensions) UNIT A max. A1 A2 A3 bp c D (1) E (2) e HE L Lp Q v w y Z (1) θ mm 1.1 0.15 0.05 0.95 0.80 0.25 0.30 0.19 0.2 0.1 5.1 4.9 4.5 4.3 0.65 6.6 6.2 1 0.75 0.50 0.4 0.3 0.2 0.13 0.1 0.40 0.06 8o o 0 Notes 1. Plastic or metal protrusions of 0.15 mm maximum per side are not included. 2. Plastic interlead protrusions of 0.25 mm maximum per side are not included. OUTLINE VERSION SOT403-1 REFERENCES IEC JEDEC JEITA EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-18 MO-153 Fig 21. Package outline SOT403-1 (TSSOP16) NPIC6C596_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 16 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs DHVQFN16: plastic dual in-line compatible thermal enhanced very thin quad flat package; no leads; SOT763-1 16 terminals; body 2.5 x 3.5 x 0.85 mm A B D A A1 E c detail X terminal 1 index area terminal 1 index area C e1 e 2 7 y y1 C v M C A B w M C b L 1 8 Eh e 16 9 15 10 Dh X 0 2.5 5 mm scale DIMENSIONS (mm are the original dimensions) UNIT mm A(1) max. A1 b 1 0.05 0.00 0.30 0.18 c D (1) Dh E (1) Eh 0.2 3.6 3.4 2.15 1.85 2.6 2.4 1.15 0.85 e 0.5 e1 L v w y y1 2.5 0.5 0.3 0.1 0.05 0.05 0.1 Note 1. Plastic or metal protrusions of 0.075 mm maximum per side are not included. REFERENCES OUTLINE VERSION IEC JEDEC JEITA SOT763-1 --- MO-241 --- EUROPEAN PROJECTION ISSUE DATE 02-10-17 03-01-27 Fig 22. Package outline SOT763-1 (DHVQFN16) NPIC6C596_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 17 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs 12. Abbreviations Table 10. Abbreviations Acronym Description CDM Charged Device Model CMOS Complementary Metal Oxide Semiconductor DUT Device Under Test EDNMOS Extended Drain Negative Metal Oxide Semiconductor ESD ElectroStatic Discharge HBM Human Body Model TTL Transistor-Transistor Logic 13. Revision history Table 11. Revision history Document ID Release date Data sheet status Change notice Supersedes NPIC6C596_Q100 v.2 20130704 Product data sheet - NPIC6C596_Q100 v.1 - - Modifications: NPIC6C596_Q100 v.1 NPIC6C596_Q100 Product data sheet • Figure 5 corrected (errata). 20120712 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 18 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs 14. Legal information 14.1 Data sheet status Document status[1][2] Product status[3] Definition Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification. [1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 14.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. 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This document supersedes and replaces all information supplied prior to the publication hereof. NPIC6C596_Q100 Product data sheet Suitability for use in automotive applications — This NXP Semiconductors product has been qualified for use in automotive applications. Unless otherwise agreed in writing, the product is not designed, authorized or warranted to be suitable for use in life support, life-critical or safety-critical systems or equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors and its suppliers accept no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer's own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Customers are responsible for the design and operation of their applications and products using NXP Semiconductors products, and NXP Semiconductors accepts no liability for any assistance with applications or customer product design. It is customer’s sole responsibility to determine whether the NXP Semiconductors product is suitable and fit for the customer’s applications and products planned, as well as for the planned application and use of customer’s third party customer(s). Customers should provide appropriate design and operating safeguards to minimize the risks associated with their applications and products. NXP Semiconductors does not accept any liability related to any default, damage, costs or problem which is based on any weakness or default in the customer’s applications or products, or the application or use by customer’s third party customer(s). Customer is responsible for doing all necessary testing for the customer’s applications and products using NXP Semiconductors products in order to avoid a default of the applications and the products or of the application or use by customer’s third party customer(s). NXP does not accept any liability in this respect. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation of the device at these or any other conditions above those given in the Recommended operating conditions section (if present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting values will permanently and irreversibly affect the quality and reliability of the device. Terms and conditions of commercial sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, unless otherwise agreed in a valid written individual agreement. In case an individual agreement is concluded only the terms and conditions of the respective agreement shall apply. NXP Semiconductors hereby expressly objects to applying the customer’s general terms and conditions with regard to the purchase of NXP Semiconductors products by customer. All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 19 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Translations — A non-English (translated) version of a document is for reference only. The English version shall prevail in case of any discrepancy between the translated and English versions. Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from competent authorities. 14.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. 15. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] NPIC6C596_Q100 Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 2 — 4 July 2013 © NXP B.V. 2013. All rights reserved. 20 of 21 NPIC6C596-Q100 NXP Semiconductors Power logic 8-bit shift register; open-drain outputs 16. Contents 1 2 3 4 5 6 6.1 6.2 7 7.1 8 9 10 10.1 11 12 13 14 14.1 14.2 14.3 14.4 15 16 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features and benefits . . . . . . . . . . . . . . . . . . . . 1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . . 5 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 5 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 6 Test circuit and waveform . . . . . . . . . . . . . . . . . 7 Recommended operating conditions. . . . . . . . 7 Static characteristics. . . . . . . . . . . . . . . . . . . . . 7 Dynamic characteristics . . . . . . . . . . . . . . . . . . 9 Test circuits and waveforms . . . . . . . . . . . . . . . 9 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 15 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 18 Legal information. . . . . . . . . . . . . . . . . . . . . . . 19 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 19 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Contact information. . . . . . . . . . . . . . . . . . . . . 20 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2013. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] Date of release: 4 July 2013 Document identifier: NPIC6C596_Q100