RELIABILITY DATA LT3011 LT3430/31/32/33/34/35/37/38/3800 LT4220 / LT4254/56 LT4356 6/1/2010 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE SOIC/SOT/MSOP SSOP/TSSOP QFN/DFN 516 725 304 1,545 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE SOIC/SOT/MSOP SSOP/TSSOP 2,154 5,895 8,049 • TEMP CYCLE FROM -65°C to +150°C PACKAGE TYPE SAMPLE SIZE SOIC/SOT/MSOP SSOP/TSSOP QFN/DFN 2,078 5,942 44 8,064 • THERMAL SHOCK FROM -65°C to +150°C PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE NEWEST DATE CODE 0329 0241 0630 0928 0711 0818 OLDEST DATE CODE NEWEST DATE CODE 0146 0244 0818 0911 OLDEST DATE CODE NEWEST DATE CODE 0146 0244 0840 0751 0910 0840 OLDEST DATE CODE NEWEST DATE CODE K DEVICE HOURS (1) AT +125°C 759.00 725.00 405.64 1,889.64 K DEVICE HOURS 539.98 634.89 1,174.87 K DEVICE CYCLES 1,543.90 2,234.85 4.40 3,783.15 K DEVICE CYCLES SOIC/SOT/MSOP SSOP/TSSOP QFN/DFN 1,362 0146 0818 5,977 0244 0911 43 0840 0840 7,382 (1) Assumes Activation Energy = 1.0 Electron Volts (2) Failure Rate Equivalent to +55°C, 60% Confidence Level = 0.97 FITS (3) Mean Time Between Failures in Years = 117,605 Note: 1 FIT = 1 Failure in One Billion Hours. Form: 00-03-6209B. R468 1,199.11 1,800.90 4.30 3,004.31 NUMBER OF (2) FAILURES 0 0 0 0 NUMBER OF FAILURES 0 0 0 NUMBER OF FAILURES 0 0 0 0 NUMBER OF FAILURES 0 0 0 0 Rev 11