RELIABILITY DATA LT1117 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP NEWEST DATE CODE 3,698 9115 3,698 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP 1,680 9115 1,680 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE SOIC/SOT/MSOP DD PACK 24,187 1,050 25,237 • TEMP CYCLE FROM -65°C to +150°C PACKAGE TYPE SAMPLE SIZE SOIC/SOT/MSOP DD PACK SAMPLE SIZE NEWEST DATE CODE 9115 9303 0623 0502 OLDEST DATE CODE NEWEST DATE CODE OLDEST DATE CODE 12,132.08 12,132.08 K DEVICE (4) HOURS AT +85°C 9727 NEWEST DATE CODE 18,843 8904 1,700 9622 20,543 • THERMAL SHOCK FROM -65°C to +150°C PACKAGE TYPE 9816 OLDEST DATE CODE SOIC/SOT/MSOP DD PACK K DEVICE HOURS (1) AT +125°C 4,080.80 4,080.80 K DEVICE HOURS 2,926.26 28.80 2,955.06 K DEVICE CYCLES 0623 0235 NEWEST DATE CODE 4,578.50 170.00 4,748.50 K DEVICE CYCLES 11,099 9115 0623 500 9627 0118 11,599 (1) Assumes Activation Energy = 1.0 Electron Volts (2) Failure Rate Equivalent to +55°C, 60% Confidence Level = 0.15 FITS (3) Mean Time Between Failures in Years = 760,514 (4) Assumes 20X Acceleration from 85°C to +131°C Note: 1 FIT = 1 Failure in One Billion Hours. Form: 00-03-6209B. R162 4,064.04 50.00 4,114.04 NUMBER OF (2) FAILURES 0 0 NUMBER OF FAILURES 0 0 NUMBER OF FAILURES 0 0 0 NUMBER OF FAILURES 0 0 0 NUMBER OF FAILURES 0 0 0 Rev 34