R177 Reliability Data

RELIABILITY DATA
LT1103 / 1105 / 1106 / 1107 / 1108 / 1109 / 1110 / 1111
8/21/2006
• OPERATING LIFE TEST
PACKAGE
TYPE
SAMPLE
SIZE
OLDEST
DATE CODE
FLATPAK/LCC
SIDEBRAZE
PLASTIC DIP
SSOP/TSSOP
TO-92
NEWEST
DATE CODE
50
9320
44
9213
306
9130
306
9326
201
9501
907
• HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH
PACKAGE
TYPE
SAMPLE
SIZE
OLDEST
DATE CODE
PLASTIC DIP
SSOP/TSSOP
TO-92
150
9434
385
9326
185
9501
720
• PRESSURE COOKER TEST AT 15 PSIG, +121°C
PACKAGE
TYPE
SAMPLE
SIZE
SAMPLE
SIZE
PLASTIC DIP
SOIC/SOT/MSOP
SSOP/TSSOP
TO-220
TO-92
PLASTIC DIP
SOIC/SOT/MSOP
SSOP/TSSOP
TO-220
TO-92
SAMPLE
SIZE
50.12
293.46
210.39
724.83
835.03
2,113.83
K DEVICE
(4)
HOURS
AT +85°C
9440
9403
9602
9228
9124
9403
9236
9150
0133
0344
9403
0101
0601
OLDEST
DATE CODE
NEWEST
DATE CODE
1,087
2,216
585
300
127
4,315
• THERMAL SHOCK FROM -65°C to +150°C
PACKAGE
TYPE
NEWEST
DATE CODE
NEWEST
DATE CODE
3,338
12,636
230
350
477
17,031
• TEMP CYCLE FROM -65°C to +150°C
PACKAGE
TYPE
9320
9213
9644
9403
9512
OLDEST
DATE CODE
PLASTIC DIP
SOIC/SOT/MSOP
SSOP/TSSOP
TO-220
TO-92
K DEVICE
HOURS (1)
AT +125°C
9228
9124
9328
9625
9150
0117
0344
9403
0223
0601
OLDEST
DATE CODE
NEWEST
DATE CODE
112.00
729.92
239.64
1,081.56
K DEVICE
HOURS
157.79
628.01
234.26
12.00
88.11
1,120.16
K DEVICE
CYCLES
117.20
421.46
587.28
30.00
39.65
1,195.59
K DEVICE
CYCLES
900
9239
9813
1,812
9124
0344
433
9333
9403
100
9624
0101
127
9150
0601
3,372
(1) Assumes Activation Energy = 1.0 Electron Volts
(2) Failure Rate Equivalent to +55°C, 60% Confidence Level = 0.87 FITS
(3) Mean Time Between Failures in Years = 131,123
(4) Assumes 20X Acceleration from 85°C to +131°C
Note: 1 FIT = 1 Failure in One Billion Hours.
Form: 00-03-6209B. R177
156.79
244.00
306.99
10.00
159.00
876.78
NUMBER
OF (2)
FAILURES
0
0
0
0
0
0
NUMBER
OF
FAILURES
0
0
0
0
NUMBER
OF
FAILURES
0
0
0
0
0
0
NUMBER
OF
FAILURES
0
0
0
0
0
0
NUMBER
OF
FAILURES
0
0
0
0
0
0
Rev 25