RELIABILITY DATA LT1113 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE PLASTIC DIP NEWEST DATE CODE 172 9312 172 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE PLASTIC DIP SOIC/SOT/MSOP 50 9648 33 9708 83 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP SOIC/SOT/MSOP 1,100 250 1,350 • TEMP CYCLE FROM -65°C to +150°C PACKAGE TYPE SAMPLE SIZE SOIC/SOT/MSOP SAMPLE SIZE NEWEST DATE CODE 9338 9337 9926 0041 OLDEST DATE CODE NEWEST DATE CODE OLDEST DATE CODE 1,008.40 1,008.40 K DEVICE (4) HOURS AT +85°C 9648 9708 NEWEST DATE CODE 100 9942 100 • THERMAL SHOCK FROM -65°C to +150°C PACKAGE TYPE 9312 OLDEST DATE CODE SOIC/SOT/MSOP K DEVICE HOURS (1) AT +125°C 336.00 174.24 510.24 NEWEST DATE CODE 35.00 6.00 41.00 K DEVICE CYCLES 10.00 10.00 K DEVICE CYCLES 100 9942 0041 100 (1) Assumes Activation Energy = 1.0 Electron Volts (2) Failure Rate Equivalent to +55°C, 60% Confidence Level = 1.82 FITS (3) Mean Time Between Failures in Years = 62,680 (4) Assumes 20X Acceleration from 85°C to +131°C Note: 1 FIT = 1 Failure in One Billion Hours. Form: 00-03-6209B. R361 0 0 NUMBER OF FAILURES 0 0 0 NUMBER OF FAILURES K DEVICE HOURS 0041 NUMBER OF (2) FAILURES 10.00 10.00 0 0 0 NUMBER OF FAILURES 0 0 NUMBER OF FAILURES 0 0 Rev 17