HA-5177/883 Ultra Low Offset Voltage Operational Amplifier July 1994 Features Description • This Circuit is Processed in Accordance to MIL-STD883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1. The HA-5177/883 is a monolithic, all bipolar, precision operational amplifier, utilizing Intersil Dielectric Isolation and advance processing techniques. This design features a combination of precision input characteristics, wide gain bandwidth (2MHz) and high speed (0.5V/µs min) and is an improved version of the HA-5135/883. • Low Offset Voltage. . . . . . . . . . . . . . . . . . . . .60µV (Max) 10µV (Typ) • Low Offset Voltage Drift . . . . . . . . . . . . 0.6µV/oC (Max) 0.1µV/oC (Typ) The HA-5177/883 uses advanced matching techniques and laser trimming to produce low offset voltage (10µV typ, 60µV max) and low offset voltage drift (0.1µV/oC typ, 0.6µV/oC max). This design also features low voltage noise (9nV/√Hz typ), Low current noise (0.32pA/√Hz typ), nanoamp input currents, and 126dB minimum gain. • High Voltage Gain . . . . . . . . . . . . . . . . . . . . 126dB (Min) 150dB (Typ) • High CMRR . . . . . . . . . . . . . . . . . . . . . . . . . . 110dB (Min) 140dB (Typ) These outstanding features along with high CMRR (140dB typ, 110dB min) and high PSRR (135dB typ, 110dB min) make this unity gain stable amplifier ideal for high resolution data acquisition systems, precision integrators, and low level transducer amplifiers. • High PSRR . . . . . . . . . . . . . . . . . . . . . . . . . . 110dB (Min) 135dB (Typ) • Low Noise . . . . . . . . . . . . . . . . . . . . . . . . 11nV/√Hz (Max) 9nV/√Hz (Typ) • Low Power Consumption . . . . . . . . . . . . . 51mW (Max) Ordering Information • Wide Gain Bandwidth Product . . . . . . . . . . 2MHz (Min) • Unity Gain Stable PART NUMBER Applications • High Gain Instrumentation Amplifiers TEMPERATURE RANGE PACKAGE HA2-5177/883 -55oC to +125oC 8 Pin Can HA7-5177/883 -55oC to +125oC 8 Lead CerDIP HA4-5177/883 -55oC to +125oC 20 Lead Ceramic LCC • Precision Control Systems • Precision Integrators • High Resolution Data Converters • Precision Threshold Detectors • Low Level Transducer Amplifiers Pinouts ININ+ V- 2 3 4 + 7 6 5 V+ 3 2 OUT NC HA-5177/883 (METAL CAN) TOP VIEW BAL1 NC BAL1 NC BAL1 8 1 BAL 2 BAL 2 HA-5177/883 (CLCC) TOP VIEW NC HA-5177/883 (CERDIP) TOP VIEW 8 18 NC NC 4 -IN 5 NC 6 +IN 7 15 OUT 8 14 NC NC 7 V+ BAL 2 1 1 20 19 17 V+ - 6 OUT CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. http://www.intersil.com or 407-727-9207 | Copyright © Intersil Corporation 1999 3-159 IN+ 5 3 NC 4 V- NC NC NC 9 10 11 12 13 V- + 2 16 NC + NC IN - 511041-883 File Number 3733.1 Spec Number Specifications HA-5177/883 Absolute Maximum Ratings Thermal Information Voltage Between V+ and V- Terminals . . . . . . . . . . . . . . . . . . . . 44V Differential Input Voltage (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . 7V Voltage at Either Input Terminal . . . . . . . . . . . . . . . . . . . . . . V+ to VInput Current. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25mA Output Current . . . . . . . . . . . . . . . . . . . .Full Short Circuit Protection Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC Storage Temperature Range . . . . . . . . . . . . . . . . . -65oC to +150oC ESD Rating. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . <2000V Lead Temperature (Soldering 10s) . . . . . . . . . . . . . . . . . . . . +300oC Thermal Resistance θJA θJC CerDIP Package . . . . . . . . . . . . . . . . . . . 115oC/W 28oC/W Ceramic LCC Package . . . . . . . . . . . . . . 65oC/W 15oC/W Metal Can Package . . . . . . . . . . . . . . . . . 155oC/W 67oC/W Package Power Dissipation Limit at +75oC for TJ ≤ +175oC CerDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 870mW Ceramic LCC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.54W Metal Can Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 645mW Package Power Dissipation Derating Factor Above +75oC CerDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8.7mW/oC Ceramic LCC Package . . . . . . . . . . . . . . . . . . . . . . . . 15.4mW/oC Metal Can Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6.5mW/oC CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Operating Conditions Operating Temperature Range . . . . . . . . . . . . . . . . -55oC to +125oC Operating Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±15V VINCM ≤ 1/2 (V+ - V-) RL ≥ 600Ω TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS Device Tested at: VSUPPLY = ±15V, RSOURCE = 50Ω, RLOAD = 100kΩ, VOUT = 0V, Unless Otherwise Specified. PARAMETERS SYMBOL Input Offset Voltage VIO CONDITIONS VCM = 0V TEMPERATURE MIN MAX UNITS 1 +25oC -60 60 µV -100 100 µV -6 6 nA -8 8 nA 2, 3 Input Bias Current IB VCM = 0V, RS = 10kΩ, 50Ω LIMITS GROUP A SUBGROUPS 1 2, 3 +125oC, -55oC +25oC +125oC, -55oC +I B + – I B - ---------------------------2 Input Offset Current Common Mode Range IIO +CMR VCM = 0V, +RS = 10kΩ, -RS = 10kΩ V+ = +3V, V- = -27V 1 +25oC -6 6 nA 2, 3 +125oC, -55oC -8 8 nA 1 +25oC 12 - V 12 - V - -12 V - -12 V 126 - dB 2, 3 -CMR V+ = +27V, V- = -3V 1 2, 3 Large Signal Voltage Gain +AVOL -AVOL Common Mode Rejection Ratio +CMRR -CMRR Output Voltage Swing +VOUT1 VOUT = 0V and +10V, RL = 2kΩ VOUT = 0V and -10V, RL = 2kΩ ∆VCM = 10V, V+ = +5V, V- = - 25V, VOUT = -10 ∆VCM = 10V, V+ = +25V, V- = - 5V, VOUT = +10 RL = 2kΩ RL = 2kΩ -VOUT2 RL = 600Ω RL = 600Ω +25oC +125oC, -55oC +25oC 5, 6 +125oC, -55oC 120 - dB 4 +25oC 126 - dB 5, 6 +125oC, -55oC 120 - dB 1 +25oC 116 - dB 2, 3 +125oC, -55oC 110 - dB 1 +25oC 116 - dB 2, 3 +125oC, -55oC 110 - dB 4 +25oC 12 - V 12 - V - -12 V 4 5, 6 +VOUT2 -55oC 4 5, 6 -VOUT1 +125oC, +125oC, -55oC +25oC +125oC, -55oC - -12 V 4 +25oC 10 - V 4 +25oC - -10 V Spec Number 3-160 511041-883 Specifications HA-5177/883 TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued) Device Tested at: VSUPPLY = ±15V, RSOURCE = 50Ω, RLOAD = 100kΩ, VOUT = 0V, Unless Otherwise Specified. PARAMETERS Output Current SYMBOL +IOUT CONDITIONS TEMPERATURE MIN MAX UNITS 4 +25oC 15 - mA 15 - mA - -15 mA - -15 mA - 1.7 mA VOUT = -10V 5, 6 -IOUT VOUT = +10V 4 5, 6 Quiescent Power Supply Current +ICC ∆VSUP = 15V, V+ = +5V, V- = - 15V, V+ = +20V, V- = - 15V ∆VSUP = 15V, V+ = +15V, V- = - 5V, V+ = +15V, V- = - 20V -PSRR Offset Voltage Adjustment +VIOAdj +125oC, -55oC +125oC, -55oC - 1.7 mA 1 +25oC -1.7 - mA -1.7 - mA 110 - dB 110 - dB 1 2, 3 +125oC, -55oC +25oC +125oC, -55oC 1 +25oC 110 - dB 2, 3 +125oC, -55oC 110 - dB 1 +25oC 0.3 - mV Note 2 2, 3 -VIOAdj +25oC 2, 3 VOUT = 0V, IOUT = 0mA +PSRR -55oC +25oC 2, 3 Power Supply Rejection Ratio +125oC, 1 VOUT = 0V, IOUT = 0mA -ICC LIMITS GROUP A SUBGROUPS +125oC, -55oC 0.3 - mV 1 +25oC - -0.3 mV 2, 3 +125oC, -55oC - -0.3 mV Note 2 NOTES: 1. The input stage has series 500Ω resistors along with back to back diodes. This provides large differential input voltage protection for a slight increase in noise voltage. 2. This test is for functionality only to assure adjustment through 0V. TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS Device Tested at: VSUPPLY = ±15V, RSOURCE = 50Ω, RLOAD = 2kΩ, CLOAD = 50pF, AVCL = +1V/V, Unless Otherwise Specified. PARAMETERS Slew Rate Rise and Fall Time Overshoot SYMBOL CONDITIONS LIMITS GROUP A SUBGROUPS TEMPERATURE MIN MAX UNITS 0.5 - V/µs +SR VOUT = -3V to +3V, VIN S.R. ≤ 25V/µs 7 +25oC -SR VOUT = +3V to -3V, VIN S.R. ≤ 25V/µs 7 +25oC 0.5 - V/µs tR VOUT = 0 to +200mV 10% ≤ TR ≤ 90% 7 +25oC - 420 ns tF VOUT = 0 to -200mV 10% ≤ TF ≤ 90% 7 +25oC - 420 ns +OS VOUT = 0 to +200mV 7 +25oC - 40 % -OS VOUT = 0 to -200mV 7 +25oC - 40 % Spec Number 3-161 511041-883 Specifications HA-5177/883 TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS Device Characterized at: VSUPPLY = ±15V, RLOAD = 2kΩ, CLOAD = 50pF, AV = +1V/V, Unless Otherwise Specified. LIMITS NOTES TEMPERATURE MIN MAX UNITS Average Offset Voltage Drift PARAMETERS SYMBOL VIOTC VCM = 0V 1 -55oC to +125oC - 0.6 µV/oC Average Offset Current Drift IIOTC Versus Temperature 1 -55oC to +125oC - 40 pA/oC Average Bias Current Drift IRTC Versus Temperature 1 -55oC to +125oC - 40 pA/oC VCM = 0V 1 +25oC 20 - MΩ Differential Input Resistance RIN CONDITIONS Low Frequency Peak-to-Peak Noise Voltage ENP-P 0.1Hz to 10Hz 1 +25oC - 0.6 µVP-P Low Frequency Peak-to-Peak Noise Current INP-P 0.1Hz to 10Hz 1 +25oC - 45 pAP-P RS = 20Ω, fO = 10Hz 1 +25oC - 18 nV/√Hz RS = 20Ω, fO = 100Hz 1 +25oC - 13 nV/√Hz RS = 20Ω, fO = 1kHz 1 +25oC - 11 nV/√Hz RS = 2MΩ, fO = 10Hz 1 +25oC - 4 pA/√Hz RS = 2MΩ, fO = 100Hz 1 +25oC - 2.3 pA/√Hz RS = 2MΩ, fO = 1kHz 1 +25oC - 1 pA/√Hz 1 +25oC 2 - MHz Input Noise Voltage Density EN Input Noise Current Density IN Gain Bandwidth Product GBWP VO = 100mV, 1Hz ≤ fO ≤ 100kHz Full Power Bandwidth FPBW VPEAK = 10V Minimum Closed Loop Stable Gain CLSG Settling Time tS Output Resistance ROUT Power Consumption PC 1, 2 8 - kHz +1 - V/V +25oC - 15 µs 1 +25oC - 70 Ω 1, 3 -55oC to +125oC - 51 mW RL = 2kΩ, CL = 50pF 1 To 0.1% for a 10V Step 1 Open Loop VOUT = 0V, IOUT = 0mA +25oC -55oC to +125oC NOTES: 1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These parameters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon data from multiple production runs which reflect lot to lot and within lot variation. 2. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2πVPEAK). 3. Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs.) TABLE 4. ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUPS (SEE TABLES 1 AND 2) Interim Electrical Parameters (Pre Burn-In) 1 Final Electrical Test Parameters 1 (Note 1), 2, 3, 4, 5, 6, 7 Group A Test Requirements 1, 2, 3, 4, 5, 6, 7 Groups C and D Endpoints 1 NOTE: 1. PDA applies to Subgroup 1 only. Spec Number 3-162 511041-883 HA-5177/883 Die Characteristics DIE DIMENSIONS: 72 x 103 x 19 mils ± 1 mils 1840 x 2620 x 483µm ± 25.4µm METALLIZATION: Type: Al, 1% Cu Thickness: 16kÅ ± 2kÅ GLASSIVATION: Type: Nitride (Si3N4) over Silox (SIO2, 5% Phos.) Silox Thickness: 12kÅ ± 2kÅ Nitride Thickness: 3.5kÅ ± 1.5kÅ WORST CASE CURRENT DENSITY: 6.0 x 104A/cm2 SUBSTRATE POTENTIAL (Powered Up): VTRANSISTOR COUNT: 71 PROCESS: Bipolar Dielectric Isolation Metallization Mask Layout HA-5177/883 BAL1 V+ OUT NC BAL2 -IN +IN V- All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification. Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see web site http://www.intersil.com Spec Number 3-163 511041-883