CYII4SC014KAA-GTC CYII4SM014KAA-GEC IBIS4-14000 14-Megapixel CMOS Image Sensor Features Table 1. Key Performance Parameters The IBIS4-14000 is a CMOS active pixel image sensor that is comprised of 14 MegaPixels with 3048 x 4560 active pixels on an 8m pitch. The sensor has a focal plane array of 36 x 24mm2 and operates in rolling shutter mode. At 15 MHz, 3 fps are achieved at full resolution. On-chip FPN correction is available Parameter Typical Value Active Pixels 3048 (H) x 4560 (V) Pixel Size 8 μm x 8 μm Optical format 35 mm The pixel design is based on the high-fill-factor active pixel sensor technology of Cypress Semiconductor Corporation (US patent No. 6,225,670 and others). The sensor is available in a monochrome version and a Bayer (RGB) patterned color filter array. Shutter Type Rolling Shutter Master Clock 15 MHz Frame rate 3 fps at full resolution Sensitivity (@ 650 nm) 1256 V.m2/W.s This data sheet allows the user to develop a camera system based on the described timing and interfacing. Full Well Charge 65.000 e- kTC Noise 35 e- Applications Dark current 223 e-/s Dynamic Range 65.4 dB Supply Voltage 3.3V Power Consumption < 176 mW Color Filter Array Mono and RGB Packaging 49-pins PGA Document scanning ■ Biometrics 4560 Row drivers y shift register SYL Logic Block Diagram pixel array 4560 x 3048 active pixels y shift register ■ RESET SYR Digital photography 4560 Row drivers ■ Pixel (0,0) CLK_YL SYNC_YL CLK_YR SYNC_YR SHS SHR CLK_X SYNC_X Cypress Semiconductor Corporation Document #: 38-05709 Rev. *C • 3048 column amplifiers 4 parallel analog outputs x-shift register 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600 Revised April 1, 2008 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Architecture and Operation Floor Plan Pixel Specifications The basic architecture of the sensor is shown in the Logic Block Diagram on page 1. The Y shift registers point at a row of imager arrays. The imager arrays row is selected by the row drivers or reset by them. There are two Y shift registers, one points at the row that is read out and the other points at the row to be reset. The second pointer may lead the first pointer by a specific number of rows. In that case, the time difference between both pointers is the integration time. Alternatively, both shift registers can point at the same row for reset and readout for a faster reset sequence. When the row is read out, it is also reset. This is to do double sampling for fixed pattern noise reduction. Figure 2. Pixel and Column Structure Schematic Column VDD_ ARRAY PC RESET M1 SELECT M2 M3 The pixel array of the IBIS4-14000 consists of 4536 x 3024 active pixels and 24 additional columns and rows which can be addressed (see Figure 1). The column amplifiers read out the pixel information and perform the double sampling operation. They also multiplex the signals on the readout buses which are buffered by the output amplifiers. SHS SHR The shift registers can be configured for various subsampling modes. The output amplifiers can be individually powered down and some other extra functions are available. These options are configurable via a serial input port. Figure 1. Location of the 24 Additional Columns and Rows, Scan Direction of the Array 24 x 4536 dummy pixels 3024 x 24 dummy pixels Top of camera 3024 x 4536 active pixels 3048 x 4560 total pixels The pixel is a classic three transistor active pixel. The photodiode is a high-fill-factor n-well/p-substrate diode. The chip has separate power supplies for the following: ■ General power supply for the analog image core (VDD) ■ Power supply for the reset line drivers (VDDR) ■ Separate power supply for the pixel itself (VDDARRAY). FPN and PRNU ------------- SKY -------------- pixel 0,0 4 analog outputs Architecture Fixed Pattern Noise correction is done on-chip using the Double Sampling technique. The pixel is read out and this voltage value is sampled on the capacitor SHS. After read out the pixel is reset again and this value is sampled by SHR. Both sample and reset values of each pixel are subtracted in the column amplifiers to subtract FPN. Raw images taken by the sensor typically feature a residual (local) FPN of 0.11% RMS of the saturation voltage. The Photo Response Non Uniformity (PRNU), caused by mismatch of photodiode node capacitances, is not corrected on-chip. Measurements indicate that the typical PRNU is less than1% RMS of the signal level. Document #: 38-05709 Rev. *C Page 2 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Color Filter Array (CFA) Output Stage Figure 3. Color Filter Arrangement on the Pixels Unity gain buffers are implemented as output amplifiers. These amplifiers can be directly DC-coupled to the analog-digital converter or coupled to an external programmable gain amplifier. The (dark reference) offset of the output signal is adjustable between 1.7V and 3V. The amplifier output signal is negative going with increasing light levels, with a max. amplitude of 1.2V (at 4V reset voltage, in hard reset mode). The output signal range of the output amplifiers is between 0.5V and 3V. Notes on analog video signal and output amplifier specifications: ■ Video polarity: the video signal is negative going with increasing light level. ■ Signal offset: the analog offset of the video signal is settable by an external DC bias (pin 12 DARKREF). The settable range is between 1.7V and 3V, with 2.65V being the nominal expected set point. Hence, the output range (including 1.2V video signal) is between 3V and 0.5V. ■ Power control: the output amplifiers can be switched between an “operating” mode and a “standby” mode via the serial port of the imager (see “SPI Register ” on page 12 for the configuration). ■ Coupling: the IBIS4-14000 can be DC- or AC-coupled to the AD converter. The IBIS4-14000 can also be processed with a Bayer RGB color pattern. Pixel (0,0) has a green filter and is situated on a green-red row. Figure 4 shows the response of the color filter array as a function of the wavelength. Note that this response curve includes the optical cross talk and the NIR filter of the color glass lid as well (see “Cover Glass” on page 24 for response of the color glass lid). Figure 4. Color Filter Response Curve Document #: 38-05709 Rev. *C Page 3 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Output Amplifier Crossbar Switch (multiplexer) Figure 5. Output Amplifier Crossbar Switch A crossbar switch is available that routes the green pixels always to the same output (this is useful for a color device to avoid gain and offset differences between green pixels). The switch can be controlled automatically (with a toggle on every CLK_Y rising edge) or manually (through the SPI register). A pulse on SYNC_Y resets the crossbar switch. The initial state after reset of the switchboard is read from the SPI control register. When the automatic toggling of the switchboard is enabled, it toggles on every rising edge of the CLK_Y clock. Separate pins are used for the SYNC_Y and CLK_Y signals on the crossbar logic these pins can be connected to the SYNC_YL and CLK_YL pins of the shift register that is used for readout as shown in Figure 5. CLK_YR SYNC_YR Manual Q Power Power Power Power Document #: 38-05709 Rev. *C Page 4 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Readout and Subsampling Modes The subsampling modes available on the IBIS4-14000 are summarized in Table 2. Table 2. Subsampling Modes Subsampling Modes Programmed into SPI Register X shift register subsampling settings BitMode Use code Full resolution (4 outputs) 1:1 000 4:1 subsampling Full resolution (all 001 columns) 010 011 24:1 24:1 subsampling ( 2 Select 4 columns/ skip 20 outputs) 100 8:1 8:1 subsampling (2 Select 4 columns / skip 4s outputs) 101 12:1 12:1 subsampling (2 Select 4 columns / skip 8 outputs) Y shift register subsampling settings BitMode Use code 000 4:1 4:1 subsampling 010 Select 2 rows / skip 2 100 001 1:1 Full resolution Full resolution (all rows) 011 6:1 6:1 subsampling Select 2 rows / skip 4 101 12:1 12:1 subsampling Select 2 rows / skip 10 Each mode is selected independently for the X and Y shift registers. The subsampling mode is configured via the serial input port of the chip. The Y and X shift registers have some difference in subsampling modes because of constraints in the design of the chip. The baseline full resolution operation mode uses four outputs to read out the entire image. Four consecutive pixels of a row are put in parallel on the four parallel outputs. Subsampling is implemented by a shift register with hard coded subsample modes. Depending on the selected mode the shift register skips the required number of pixels when shifting the row or column pointer. The X shift register always selects four consecutive columns in parallel. You can subsample in X by activating one of the modes wherein a multiple of four consecutive columns are skipped on a CLK_X pulse. The Y shift register selects a single row. It consecutively selects two adjacent rows and then skips a set number of rows (the number of rows to skip is set in the subsample mode). This implementation is chosen for easy subsampling of color images through a 2-channel readout. This way color data from 2x2 pixels is made available in all subsample modes. On monochrome sensors this is not required, one output can be used and every second row selected by the Y shift register can be skipped. This doubles the frame rate. Note that for 2 or 1 channel readout, you can power down the not-used output amplifiers through the SPI shift register. Rows can also be skipped by extra CLK_Y pulses. You do not need to apply additional control pulses to rows that are skipped. This is another way to implement extra subsampling schemes. For example, to support the 24:1 X shift register mode vertically, set the Y shift register to the 12:1 mode and given an additional CLK_Y pulse at the start of each row. Table 3 lists the frame rates of the IBIS4-14000 in various subsample modes with only one output. The row blanking time (dead time between readout of successive rows) is set to 17.5 s. Table 3. Frame Rates and Resolution for Various Subsample Modes Ratio 1:1 4:1 8:1 12:1 # Outputs 4 1 1 1 Image Resolution 3024 x 4536 756 x 1134 378 x 567 252 x 378 Frame rate [frames/s] 3.25 12.99 41.30 77.13 Frame readout time [s] 0.308 0.077 0.024 0.013 Note The 24 additional columns and rows do not subsample (see Figure 1 on page 2). Document #: 38-05709 Rev. *C Page 5 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Figure 6. B and C Subsample Mode 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 mode B - 1:1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 mode C - 1:4 Document #: 38-05709 Rev. *C Page 6 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Figure 7. D and E Subsample Mode 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 mode D - 1:6 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 mode E - 1:8 Document #: 38-05709 Rev. *C Page 7 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Figure 8. F Subsample Mode 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 modeF - 1:12 Sensor Read Out Timing Diagrams Row Sequencer the same position. The falling edge of RESET lags behind the rising PC edge. ■ SHR (Sample & Hold pixel Reset level): This signal controls another track and hold circuit in the column amplifiers. It is used to sample the pixel reset level in the columns (for double sampling). (0 = track ; 1 = hold). ■ SYL (Select YL register): Selects the YL shift register to drive the reset line of the pixel array. ■ SYR (Select YR register): Selects the YR shift register to drive the reset line of the pixel array. For rolling shutter applications, SYL and SYR are complementary. In full frame readout, both registers may be selected together, only if it is guaranteed that both shift registers point to the same row. This can reduce the row blanking time. ■ SYNC_YR and SYNC_YL: Synchronization pulse for the YR and YL shift registers. The SYNC_YR/SYNC_YL signal is clocked in during a rising edge on CLK_YR/CLK_YL and resets the YR/YL shift register to the first row. Both pulses are pulsed only once each frame. The exact pulsing scheme depends on the mode of use (full frame/ rolling shutter). A 200 ns setup time applies. See Table 4 on page 9. ■ SYNC_X: Resets the column pointer to the first row. This has to be done before the end of the first PC pulse in case the previous line has not been read out completely. The row sequencer controls pulses to be given at the start of each new line. Figure 9 on page 9 shows the timing diagram for this sequence. The signals to be controlled at each row are: ■ CLK_YL and CLK_YR: These are the clocks of the YL and YR shift register. They can be driven by the same signals and at a continuous frequency. At every rising edge, a new row is being selected. ■ SELECT: This signal connects the pixels of the currently sampled line with the columns. It is important that PC and SELECT are never active together. ■ PC: An initialization pulse that needs to be given to precharge the column. ■ SHS (Sample & Hold pixel Signal): This signal controls the track and hold circuits in the column amplifiers. It is used to sample the pixel signal in the columns. (0 = track ; 1 = hold). ■ RESET: This pulse resets the pixels of the row that is currently being selected. In rolling shutter mode, the RESET signal is pulsed a second time to reset the row selected by the YR shift register. For “reset black” dark reference signals, the reset pulse can be pulsed also during the first PC pulse. Normally, the rising edge of RESET and the falling edge of PC occur at Document #: 38-05709 Rev. *C Figure 9 on page 9 shows the basic timing diagram of the IBIS4-14000 image sensor and Table 4 on page 9 shows the timing specifications of the clocking scheme. Page 8 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Figure 9. Line Read Out Timing CLOCK_YL SYNC_YR SYNC_YL PC k Once each frame a l b b c SHS d SELECT RESET f d e e g h h j m h j For each new row Optional reset pulse for reset black c SHR SYL f i SYR Only when the electronic shutter is used Table 4. Timing Constraints for the Row Sequencer Symbol a b c 2.7 μs 10 μs d e f g h i j k 1.3 μs 6.5 μs 100 ns 1.4 μs 5 μs 1.28 μs 500 ns 240 ns Description Min. SYNC set-up times. SYNC_Y is clocked in on rising edge on CLK_Y. SYNC_Y pulse must overlap CLK_Y by one clock period. Setup times of 200 ns apply after SYNC edges. Within this setup time no rising CLK edge may occur. Duration of PC pulse. Delay between falling edge on PC and rising edge on SHS/SHR. Duration of SHS/SHR pulse. Delay between rising edge on PC and rising edge on SELECT. Delay between rising edge on SELECT and rising edge on SHS/SHR. Delay between rising edge on SHS and falling edge on SELECT. Delay between falling edge of SELECT and rising edge of RESET. Duration of RESET pulse. Delay between rising edge on SHR and rising edge on SYR. SYL and SYR pulses must overlap second RESET pulse at both sides by one clock cycle. Duration of CLOCK_Y pulse. 3μs 500ns Delay between falling edge of CLK_Y and Falling edge of PC and SHS. Delay between falling edge of RESET and falling edge of PC and SHR. l m Min 200 ns h+2*CLK Typ. 600 ns Notes CLK = one clock period of the master clock, shortest system time period available. Document #: 38-05709 Rev. *C Page 9 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC In the Figure 9 on page 9 timing diagram, the YR shift register is used for the electronic shutter. The CLK_YR is driven identically as CLK_YL. The SYNC_YR pulse leads the SYNC_YL pulse by a given number of rows. Relative to the row timing, both SYNC pulses are given at the same time position. ■ Preset the X shift register: Apply a low level to SYNC_X during a rising edge on CLK_X at the start of a new row ■ Readout of the image row: Pulse CLK_X ■ Analog-digital conversion: Clock the ADC SYNC_YR and SYNC_YL are only pulsed once each frame, SYNC_YL is pulsed when the first row is read out and SYNC_YR is pulsed for the electronic shutter at the appropriate moment. The SYNC pulses perform a synchronous reset of the shift registers to the first row/column on a rising edge on CLK. This is identical for all shift registers (YR, YL and X). This timing assumes that the registers that control the subsampling modes have been loaded in advance (through the SPI interface), before the pulse on SYNC_YL or SYNC_YR. Note The SYNC_X signal has a setup time Ts of 150 ns. For the YR and YS shift registers, the setup time is 200 ns. CLK_X must be stable at least during this setup time. The second reset pulse and the pulses on SYL and SYR (all pulses drawn in red) are only applied when the rolling electronic shutter is used. For full frame integration, these pulses are skipped. If a partial row readout is performed, 2 CLK_X pulses (with SYNC_X = LOW) are required to fully deselect the column where the X pointer is stopped. A single CLK_X leaves the column partially selected which then has a different response when read out in the next row. The SYNC_Y pulse is also used to initialize the switchboard (output multiplexer). This is also done by a synchronous reset on the rising edge of CLK_Y. Normally the switchboard is controlled by the shift register used for readout (this is the YL shift register). This means that pin SYNC_Y can be connected to SYNC_YL, and pin CLK_Y can be connected to CLK_YL. The additional RESET BLACK pulse (indicated in dashed lines in Figure 9 on page 9) can be given to make one or more lines black. This is useful to generate a dark reference signal. Timing Pulse Pattern for Readout of a Pixel Figure 10 shows the timing diagram to preset (sync) the X shift register, read out the image row, and analog-digital conversion. There are 3 tasks: When full row readout is performed, the last column is fully deselected by a single CLK_X pulse (with SYNC_X = LOW). The X-register is reset by a single CLK_X pulse (with SYNC_X = LOW). In case of partial row readout, give the SYNC_X pulse before the sample pulses (SHR and SHS) of the process to avoid a different response of the last column of the previous window. For the X shift register the analog signal is delayed by 2 clock periods before it becomes available at the output (due to internal processing of the signal in the columns and output amplifier). Figure 10 gives an example of an ADC clock for an ADC that samples on the rising edge. Figure 10. Row Readout Timing Sequence Ts Ts SYNC_X CLK_X Analog Output pixel 1 CLK_ADC (example) Document #: 38-05709 Rev. *C pixel 2 pixel 3 X Page 10 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Figure 11. Fast Reset Sequence Timing Fast Frame Reset Timing Diagram Figure 11 shows the reset timing for a fast frame reset. Keep both SYL and SYR high to speed up the reset mechanism and reduce propagation delays. PC, SHS, SHR can be kept high since they do not interact with the pixel reset mechanism. CLK_YR CLK_YL SELECT a c d e Table 5 lists the timing specifications for RESET, CLK_Y and SELECT. Table 5. Fast Reset Timing Constraints PC Symbol Typical Description a 0 μs Delay between rising CLK_Y edge and Reset. b 4 μs Reset pulse width. c 0 Reset hold time. d 1.6 μs Select pulse width. e 1 μs Setup hold time. CONSTRAINT: a + e > 1 us due to propagation delay on pixel select line. SHS b RESET SHR SYL SYR b SYNC_YR SYNC_YL Document #: 38-05709 Rev. *C Page 11 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC SPI Register SPI Interface Architecture The elementary unit cell of the serial to parallel interface consists of two D-flip-flops. The architecture is shown in Figure 12. 16 of these cells are connected in parallel, having a common /CS and SCLK form the entire uploadable parameter block, where Din is connected to Dout of the next cell. The uploaded settings are applied to the sensor on the rising edge of signal /CS. Figure 12. SPI Interface To sensor core 16 outputs to sensor core Din D Dout Q SCLK CS C Entire uploadable parameter block CS Din SCLK D Q Dout SCLK C Th Tsclk Unity Cell Din D0 D1 D2 D15 CS Data valid Ts Table 6. Timing Requirements Serial Parallel Interface Parameter Value Tsclk 100 ns Ts 50 ns Th 50 ns SPI Register Definition Sensor parameters can be serially uploaded inside the sensor at the start of a frame. The parameters are: ■ Subsampling modes for X and Y shift registers (3-bit code for six subsampling modes) ■ Power control of the output amplifiers, column amps and pixel array. Each amplifier can be individually powered up/down ■ Output crossbar switch control bits. The crossbar switch is used to route the green pixels to the same output amplifiers at all times. A first bit controls the crossbar. When a second bit is set, the first bit toggles on every CLK_Y edge to automatically route the green pixels of the bayer filter pattern. The code is uploaded serially as a 16-bit word (LSB uploaded first). Table 7 on page 13 lists the register definition. The default code for a full resolution readout is 33342 (decimal) or 1000 0010 0011 1110. Document #: 38-05709 Rev. *C Page 12 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Table 7. Serial Sensor Parameters Register Bit Definitions BIT Description’ 0 (LSB) set to zero (0). 1 1 = power on sensor array ; 0 = power-down. 2 1 = power up output amplifier 4; 0 = power-down. 3 1 = power up output amplifier 3; 0 = power-down. 4 1 = power up output amplifier 2; 0 = power-down. 5 1 = power up output amplifier 1; 0 = power-down. 6 3-bit code for subsampling mode of X shift register: 000 = full resolution 011 = select 4, skip 20 001 = full resolution 100 = select 4, skip 4 010 = full resolution 101 = select 4, skip 8 7 8 9 10 11 12 3-bit code for subsampling mode of Y shift registers: 000 = select 2, skip 2 011 = select 2, skip 4 001 = full resolution 100 = select 2, skip 2 010 = select 2, skip 2 101 = select 2, skip 2 Crossbar switch (output multiplexer) control bit initial value. This initial value is clocked into the crossbar switch at a SYNC_YR rising edge pulse (when the array pointers jump back to row 1). The crossbar switch control bit selects the correspondence between multiplexer busses and output amplifiers. Bus-to-output correspondence is according to the following table: Bus when bit set to 0 1 output 1 2 output 2 3 (4 outputs) output 3 4 (4 outputs) output 4 when bit set to 1 output 2 output 1 output 4 output 3 13 1 = Toggle crossbar switch control bit on every odd/even line. In order to let green pixels always use the same output amplifier automatically, this bit must be set to 1. On every CLK_Y rising edge (when a new row is selected), the crossbar switch control bit will toggle. Initial value (after SYNC_Y) is set by bit 12. 14 Not used. 15 (MSB) 1 = Power-up sensor array; 0 = Power-down. Three pins are used for the serial data interface. This interface converts the serial data into an (internal) parallel data bus (Serial-Parallel Interface or SPI). The control lines are: ■ DATA: The data input. LSB is clocked in first. ■ CLK: Clock, on each rising edge, the value of DATA is clocked in ■ CS: Chip select, a rising edge on CS loads the parallelized data into the on-chip register. The initial state of the register is undefined. However, no state exists that destroys the device. Document #: 38-05709 Rev. *C Page 13 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Pin Configuration Table 8 lists the pin configuration of the IBIS4-14000. Figure 16 on page 21 shows the assignment of pin numbers on the package. Table 8. Pinout Configuration Pin # Name Function 1 OBIAS Bias current output amplifiers. 2 GND Ground for output 3. 3 OUT3 Output 3. 4 GND Ground for output 4. 5 OUT4 Output 4. Comment Connect with 10kΩ to VDD and decouple with 100 nF to GND. 6 VDD Power supply. Nominal 3.3V 7 GND Ground. 0V 8 OUT2 Output 2. 9 GND Ground for output 2. 10 OUT1 Output 1. 11 GND Ground for output 1. 12 DARKREF Offset level of output signal. Typ. 2.6V. min. 1.7V max. 3V 13 TEMP1 Temperature sensor. Located near the output amplifiers (pixel 4536, 0) near the stitch line). Any voltage above GND forward biases the diode. Connect to GND if not used. 14 PHDIODE Photodiode output. Reverse biased by any voltage above GND Yields the equivalent photocurrent of 250 x Connect to GND if not used. 50 pixels. Diode is located right under the pad. 15 CLK_Y Y clock for switchboard. Clocks on rising edge Connect to CLK_YL (or drive identically) 16 SYNC_Y Y SYNC pulse for switchboard. Low active: synchronous sync on rising edge of CLK_Y Connect to SYNC_YL (or drive identically) 17 TEMP2 Temperature sensor. Located near pixel (24,0). Any voltage above GND forward biases the diode. Connect to GND if not used. 18 GNDAB Anti-blooming reference level (= pin 33). Typ. 0V. Set to 1.5V for improved anti-blooming. 19 GND Ground. 0V 20 VDD Power supply. Nominal 3.3V 21 VDDR Power supply for reset line drivers Nominal 4V Connected on-chip to pin 30 22 CLK_YR Clock of YR shift register. Shifts on rising edge. 23 SYR Activate YR shift register for driving of reset High active. Exact pulsing pattern see timing diagram. and select line of pixel array. Both SYR = 1 and SYL = 1 is not allowed, except when the same row is selected! 24 SYNC_YR Sets the YR shift register to row 1. 25 VDDARRAY Pixel array power supply (= pin 26). 26 VDDARRAY Pixel array power supply (= pin 25). 3V 27 SYNC_YL Sets the YL shift register to row 1. Low active. Synchronous sync on rising edge of CLK_YL 200 ns setup time. 28 SYL Activate YL shift register for driving of reset High active. Exact pulsing pattern see timing diagram. and select line of pixel array. Both SYR = 1 and SYL = 1 is not allowed, except when the same row is selected. Document #: 38-05709 Rev. *C Low active. Synchronous sync on rising edge of CLK_YR 200 ns setup time 3V Page 14 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Table 8. Pinout Configuration(continued) Pin # Name Function Comment 29 CLK_YL Clock of YL shift register. Shifts on rising edge. 30 VDDR Power supply for reset line drivers. Nominal 4V. Connected on-chip to pin 21. 31 VDD Power supply. Nominal 3.3V 32 GND Ground. 0V 33 GNDAB Anti-blooming reference level (= pin 33). Typ. 0V. Set to 1V for improved anti-blooming. 34 SELECT Control select line of pixel array. High active. See timing diagrams. 35 RESET Reset of the selected row of pixels. High active. See timing diagrams. 36 CBIAS Bias current column amplifiers. Connect with 22 kΩ to VDD and decouple with 100 nF to GND. 37 PCBIAS Bias current. Connect with 22 kΩ to VDD and decouple with 100 nF to GND. 38 DIN Serial data input. 16-bit word. LSB first. 39 SCLK SPI interface clock. Shifts on rising edge. 40 CS Chip select. Data copied to registers on rising edge. 41 PC Row initialization pulse. See timing diagrams. 42 SYNC_X Sets the X shift register to row 1. Low active. Synchronous sync on rising edge of CLK_X 150 ns setup time. 43 GND Ground. 0V 44 VDD Power supply. Nominal 3.3V 45 CLK_X Clock of YR shift register. Shifts on rising edge. 46 SHR Row track & hold reset level (1 = hold; 0 = track). See timing diagram. 47 SHS Row track & hold signal level (1 = hold; 0 = track). See timing diagram. 48 XBIAS Bias current X multiplexer. Connect with 10 kΩ to VDD and decouple with 100 nF to GND. 49 ABIAS Bias current pixel array. Connect with 10 MΩ to VDD and decouple with 100 nF to GND. Document #: 38-05709 Rev. *C Page 15 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Specifications General Specifications Table 9. IBIS4-14000 General Specifications Parameter Value Pixel architecture 3T pixel Technology CMOS Pixel size 8 x 8 μm2 Resolution 3048 x 4560 Remarks 13.9 megapixels Power supply 3.3V Shutter type Electronic rolling shutter Pixel rate 15 MHz nominal 20 MHz with extra power dissipation. Frame rate 3.25 frames/s Full resolution with 4 parallel analog outputs @ 15 MHz/channel Power dissipation 176 mW 53 mA Electro-Optical Specifications Overview All parameters are measured using the default settings (see recommended operating conditions) unless otherwise specified. Table 10. IBIS4-14000 Electro-optical Specifications Parameter Effective conversion gain Value 18.5 V/e25 V/e- Remarks Full range. See note 1. Linear range. See note 1. Spectral response * fill factor 0.22 A/W (peak) Peak Q.E. * fill factor 45% Full Well charge 65000 electrons See note 1. Linear range 90% of full well charge Linearity definition: < 3% deviation from straight line through zero point. Temporal noise (kTC noise limited) 35 electrons kTC noise, being the dominant noise source in the dark at short integration times. Dynamic range 1857:1 (65.4 dB) See note 1. Linear dynamic range 1671:1 (64.5 dB) See note 1; 3% deviation. Average dark current 55 pA/cm2 Average value @ 24°C lab temperature. Dark current signal 223 electrons/s 4.13 mV/s Average value @ 24°C lab temperature. MTF at Nyquist 0.55 in X 0.57 in Y Measured at 600 nm. Fixed pattern noise (local) 0.11% Vsat RMS Average value of RMS variation on local 32 x 32 pixel windows. Fixed pattern noise (global) 0.15% Vsat RMS PRNU <1% RMS of signal Anti-blooming 105 Between 500 and 700 nm. Charge spill-over to neighboring pixels (= CCD blooming mechanism) Note 1. Settings: VDD = 3.3V, VDDR = 4V and VDD_ARRAY = 3V. Document #: 38-05709 Rev. *C Page 16 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Spectral Response Curve Figure 13. IBIS4-14000 Spectral Response Curve Document #: 38-05709 Rev. *C Page 17 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Electro-voltaic Response Curve Figure 14. IBIS4-14000 Electro-voltaic Response Curve Electrical Specifications Absolute Maximum Ratings Table 11. IBIS4-14000 Absolute Maximum Ratings Parameter Description Value Unit –0.5 to +4.5 V DC input voltage –0.5 to VDC + 0.5 V DC output voltage –0.5 to VDC + 0.5 V VDC DC supply voltage VIN VOUT I DC current per pin; any single input or output TSTG Storage temperature range ±50 mA –10 to 66 (@ 15% RH) –10 to +38 (@ 86% RH) (RH = relative humidity) °C 8000 feet Altitude Recommended Operating Specifications Table 12. IBIS4-14000 Recommended Operating Specifications Parameter Description Min Typ. Max Unit 3.3 3.6 V VDD Nominal power supply VDDRL VDDRR Reset power supply level 4 V VDD_ARRAY Pixel supply level 3 V DARKREF Dark reference offset level Document #: 38-05709 Rev. *C 1.7 2.65 3 V Page 18 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Table 12. IBIS4-14000 Recommended Operating Specifications (continued) Parameter Description Min Typ. Max Unit 0 0 1 V 0.5 3 V 2.5 3.3 V GNDAB Anti-blooming ground level VOUT Analog output level VIH Logic input high level VIL Logic input low level 0 1 V TA Commercial operating temperature 0 50 °C (@ 15% RH) TA Commercial operating temperature 0 38 °C (@ 86% RH) Bias Currents and References Table 13. IBIS4-14000 Bias Currents[2] Pin Number Pin Name Connection Input Current Pin Voltage 1 OBIAS 10k to VDD 179 μA 1.51V 36 CBIAS 22k to VDD 91 μA 1.29V 37 PCBIAS 22k to VDD 91 μA 1.29V 48 XBIAS 10k to VDD 181 μA 1.49V 49 ABIAS or 10M to VDD 0.8V Note 2. Tolerance on bias reference voltages: ±150 mV due to process variances. Document #: 38-05709 Rev. *C Page 19 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Geometry and Mechanical Die Geometry Figure 15. Die Geometry and Location of Pixel (0,0) Pin 1 pixel 0,0 4 output channels 500 μm Ground pad, also connected to package ground plane Analog output pad Ground for output pad (not connected to package ground plane) Locations of temperature sensing diodes Location of photodiode array Document #: 38-05709 Rev. *C Page 20 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Pin Number Assignment Figure 16. Pin Number Assignment 32 33 34 35 36 37 31 30 29 28 27 26 38 39 40 41 42 43 Package Back side 49 48 47 46 45 44 20 21 22 23 24 25 1 2 3 4 5 6 19 18 17 16 15 14 13 12 11 10 9 8 7 Note “Solid” drawn pins are connected to die attach area for a proper ground plane. Document #: 38-05709 Rev. *C Page 21 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Elaborated Package Diagram Figure 17. Package Dimensions All dimensions are in mm Document #: 38-05709 Rev. *C Based on 001-07577 *A Page 22 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Die Placement Dimensions and Accuracy Figure 18. Die Placement 200 2 all dimensions in mm Figure 19. Tolerances Document #: 38-05709 Rev. *C Page 23 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Cover Glass CYII4SM014KAA-GEC (monochrome) Schott D-263 plain glass is the cover glass of the IBIS4-14000 monochrome. Figure 20. D-263 Transmittance Curve 100 90 Transmission [%] 80 70 60 50 40 30 20 10 0 400 500 600 700 800 900 Wavelength [nm] CYII4SC014KAA-GTC (color) S8612 glass is the cover glass of the IBIS4-14000 color. Figure 21. S8612 Transmittance Curve (w/o AR coating) 100 Transmittance [%] 90 80 70 60 50 40 30 20 10 0 400 500 600 700 800 900 1000 Wavelength [nm] Document #: 38-05709 Rev. *C Page 24 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC protected workstations are recommended including the use of ionized blowers. All tools should be ESD protected. To ground the human body, provide a resistance of 1 MOhm between the human body and the ground to be on the safe side. Specification ■ AR coating: 400–690 nm R < 1.5% ■ Dig, haze, scratch 20 µm after coating ■ Substrate: Schott S8612 glass ■ Thickness: 0.7 mm ±0.050 mm ■ Size: 31.9 x 44.9 mm2 ±0.2 mm Defects (digs, scratches) are detected at final test using F/11 light source. Glass defects that do not generate non correctable pixels are accepted. ■ When directly handling the device with the fingers, hold the part without the leads and do not touch any lead. ■ To avoid generating static electricity: ❐ Do not scrub the glass surface with cloth or plastic. ❐ Do not attach any tape or labels. ❐ Do not clean the glass surface with dust cleaning tape. ■ When storing or transporting the device, put it in a container of conductive material. Storage and Handling Dust and Contamination Storage Conditions Unit Conditions Temperature Description Minimum Maximum –10 66 °C @ 15% RH Temperature –10 38 °C @ 86% RH Dust or contamination of the glass surface can deteriorate the output characteristics or cause a scar. In order to minimize dust or contamination on the glass surface, take the following precautions: ■ Handle the device in a clean environment such as a cleaned booth (the cleanliness should be, if possible, class 100). Handling Precautions ■ Do not touch the glass surface with the fingers. Special care should be taken when soldering image sensors with color filter arrays (RGB color filters) onto a circuit board becasue color filters are sensitive to high temperatures. Prolonged heating at elevated temperatures can result in deterioration of the performance of the sensor. The following recommendations are made to ensure that sensor performance is not compromised during users’ assembly processes. ■ Use gloves to manipulate the device. ESD Avoid spilling solder flux on the cover glass; bare glass and particularly glass with anti reflection filters can adversely affected by the flux. Avoid mechanical or particulate damage to the cover glass. Avoid mechanical stress when mounting the device. Note: RH = Relative Humidity Though not as sensitive as CCD sensors, the IBIS4-14000 is vulnerable to ESD like other standard CMOS devices. Device placement onto boards must be done in accordance with strict ESD controls for Class 0, JESD22 Human Body Model, and Class A, JESD22 Machine Model devices. Take into account standard ESD procedures when manipulating the device: ■ Soldering Soldering should be manually performed with 5 seconds at 350°C maximum at the tip of the soldering iron. Precautions and Cleaning RoHS (Pb-free) Compliance This section reports the use of Hazardous chemical substances as required by the RoHS Directive (excluding packing material). Assembly operators should always wear all designated and approved grounding equipment. Grounded wrist straps at ESD Table 14. Chemical Substances and Information about Any Intentional Content Any intentional content? If there is any intentional content, in which portion is it contained? Lead NO - Cadmium NO - Mercury NO - Hexavalent chromium NO - PBB (Polybrominated biphenyls) NO - PBDE (Polybrominated diphenyl ethers) NO - Chemical Substance Document #: 38-05709 Rev. *C Page 25 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Information on lead free soldering CYII4SM014KAA-GEC: The product is tested successfully for Pb-free soldering processes using a reflow temperature profile with maximum 260°C, minimum 40s at 255°C and minimum 90s at 217°C. CYII4SC014KAA-GTC: The product will not withstand a Pb-free soldering process. Maximum allowed reflow or wave soldering temperature is 220°C. Hand soldering is recommended for this part type. Note “Intentional content” is defined as any material demanding special attention is contained into the inquired product by following cases: 1. A case that the above material is added as a chemical composition into the inquired product intentionally in order to produce and maintain the required performance and function of the intended product . 2. A case that the above material, which is used intentionally in the manufacturing process, is contained in or adhered to the inquired product The following case is not treated as “intentional content”: 1. A case that the above material is contained as an impurity into raw materials or parts of the intended product. The impurity is defined as a substance that cannot be removed industrially, or it is produced at a process such as chemical composing or reaction and it cannot be removed technically. Ordering Information Part Numbers Table 15. Ordering Information Part number Package Monochrome/Color Glass lid CYII4SM014KAA-GEC 49-pin PGA package Monochrome Monochrome CYII4SC014KAA-GTC 49-pin PGA package RGB Color Color Defect Specification A document called “IBIS4-14000 Defect Specification” is available on request. This documents contains the criteria against which the IBIS4-14000 is tested before being shipped. Contact Cypress for more information ([email protected]). Document #: 38-05709 Rev. *C Page 26 of 27 [+] Feedback CYII4SC014KAA-GTC CYII4SM014KAA-GEC Document History Page Document Title: CYII4SC014KAA-GTC, CYII4SM014KAA-GEC IBIS4-14000 14-Megapixel CMOS Image Sensor Document Number: 38-05709 REV. ECN NO. Orig. of Change ** 310213 SIL Initial Cypress release Description of Change *A 428177 FVK Layout converted Figure 10 on page 10 updated Storage and handling section added IBIS4-14000-C added *B 642656 FPW Ordering information update+package spec label. Moved figure captions to the top of the figures and moved notes to the bottom of the page per new template. Verified all cross-referencing. Moved the specifications towards the back. Corrected all variables on the Master pages. *C 2220967 FPW Eval kit section is removed. Reference to Defect Spec is added. Defect description for a RCCA added. © Cypress Semiconductor Corporation, 2005-2008. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign), United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without the express written permission of Cypress. Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Use may be limited by and subject to the applicable Cypress software license agreement. Document #: 38-05709 Rev. *C Revised April 1, 2008 Page 27 of 27 All products and company names mentioned in this document may be the trademarks of their respective holders. [+] Feedback