Test Report 026
Neutron Testing of the ISL70003SEH Hardened
Point-of-Load Regulator
Introduction
This report summarizes results of 1MeV equivalent neutron
testing of the ISL70003SEH integrated FET point-of-load
regulator. The test was conducted in order to determine the
sensitivity of the part to Displacement Damage (DD) caused by
neutron or proton environments. Neutron fluences ranged from
2x1012 n/cm2 to 1x1014 n/cm2. This project was carried out
in collaboration with VPT, Inc. (Blacksburg, VA) and their
support is gratefully acknowledged.
Reference Documents
For more information about the ISL70003SEH, refer to the
following documentation.
• ISL70003SEH datasheet
• Standard Microcircuit Drawing (SMD): 5962-14203
• MIL-STD-883 test method 1017
• AN1913 “Single Event Effects Testing of the ISL70003SEH,
a 3V to 13.2V, 6A Synchronous Buck Regulator”
Part Description
The ISL70003SEH is a radiation hardened synchronous buck
regulator capable of operating over an input voltage range of
3.0V to 13.2V. With integrated MOSFETs, the part provides an
efficient single chip power solution that is externally adjustable
from 0.6V to ~90% of the input voltage. Continuous output
load current capability is 6A for TJ ≤ +125°C and 3A for
TJ ≤ +150°C. The ISL70003SEH uses voltage mode control
architecture with feed-forward and switches at pin-selected
fixed frequencies of 500kHz or 300kHz. Loop compensation is
externally adjustable to allow for an optimum balance
between stability and output dynamic performance. The
on-chip synchronous power MOSFET switches are optimized
for efficiency and thermal performance. The chip features two
logic-level disable inputs that can be used to inhibit pulses on
the phase (LXx) pins in order to maximize efficiency as a
function of load current.
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The ISL70003SEH supports DDR applications and contains a
buffer amplifier for generating the VREF voltage required by
that protocol. Typical ISL70003SEH applications include FPGA,
CPLD and DSP power management, CPU core and I/O supply
and DDR memory power management in high-density
distributed power systems for space applications.
The ISL70003SEH is hardened to achieve a Total Dose (TID)
rating of 100krad(Si) at both high (50-300rad(Si)/s) and low
(≤0.01rad(Si)/s) dose rates as specified in MIL-STD-883 test
method 1019. The part is acceptance tested on a
wafer-by-wafer basis at low dose rate to 50krad(Si) and at high
dose rate to 100krad(Si), as indicated by the '-EH' suffix in the
part number.
The ISL70003SEH is also SEE rated to a Linear Energy Transfer
(LET) value of 86.4 MeV.cm2/mg. Single-Event Transients (SET)
are well known to be a major issue in power management
parts driving voltage-sensitive loads, and the part provides
superior performance in this environment; refer to Intersil
application note AN1913 for further details. Additional SET
hardening is achieved by specifying or restricting the values of
certain external components.
The ISL70003SEH is implemented in a submicron
junction-isolated BiCMOS process optimized for power
management applications, with 0.6µm minimum ground rules
and three layers of interconnect. The process is in volume
production under MIL-PRF-38535 certification and is used for
a wide range of commercial power management devices.
Specifications for radiation hardened QML devices are
controlled by the Defense Logistics Agency (DLA) in Columbus,
OH. The SMD is the controlling document and must be cited
when ordering.
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774 | Copyright Intersil Americas LLC 2016. All Rights Reserved
Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries.
All other trademarks mentioned are the property of their respective owners.
Test Report 026
VREF_OUTS
VREFD
VREFA
EN
Block Diagram
POR and ON/OFF
POR_VIN
LINEAR
REGULATORs
CONTROL
AVDD
DVDD
SEL1
SEL2
RAMP
RT/CT
IMON
CURRENT
SENSE
PVINx
SOFT
START
SS_CAP
NI
EA
FB
COMP
PWM
CONTROL
LOGIC
GATE
DRIVE
LXx
VERR
VOUT
MONITOR
PGOOD
PWM
REFERENCE
0.6V
REF
SGND
PGNDx
OVERCURRENT
ADJUST
OCSETA
OCSETB
BUFINBUFIN+
BUFOUT
BUF
DDR VREF
BUFFER AMP
PGNDx
DGND
SYNC
FSEL
AGND
DE
FIGURE 1. BLOCK DIAGRAM
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Test Report 026
Test Description
Attributes Data
TABLE 1. ATTRIBUTES DATA
Irradiation Facility
Neutron irradiation was performed by the VPT team at the
University of Massachusetts Lowell Fast Neutron Irradiation (FNI)
facility, which provides a controlled 1MeV equivalent neutron
flux. Parts were tested in an unbiased configuration with all leads
shorted together in accordance with TM 1017 of MIL-STD-883. As
neutron irradiation activates many of the heavier elements found
in a packaged integrated circuit, the parts exposed at the higher
neutron levels required (as expected) some 'cooldown' time
before being shipped back to Intersil (Palm Bay, FL) for electrical
testing.
FLUENCE, n/cm2
SAMPLE
SIZE
PASS
(Note 1)
FAIL
ISL70003SEH
2 x 1012
5
5
0
ISL70003SEH
1 x 1013
5
5
0
ISL70003SEH
3 x 1013
5
0
5
ISL70003SEH
1 x 1014
5
0
5
PART
NOTE:
1. 'Pass' indicates a sample that passes all SMD limits.
Test Fixturing
Variables Data
No formal irradiation test fixturing is involved, as these DD tests
are 'bag tests' in the sense that the parts are irradiated with all
leads shorted together.
The plots in Figures 2 through 29 show data plots for key
parameters before and after irradiation to each level. The plots
show the median of each parameter as a function of neutron
irradiation. We chose to plot the median because of the small
sample sizes (five per cell) involved. We also show the applicable
electrical limits taken from the SMD; it should be carefully noted
that these limits are provided for guidance only as the
ISL70003SEH is not specified for the neutron environment.
Characterization Equipment
Electrical testing was performed before and after irradiation
using the Intersil production Automated Test Equipment (ATE). All
electrical testing was performed at room temperature.
Experimental Matrix
Testing proceeded in general accordance with the guidelines of
MIL-STD-883 TM 1017. The experimental matrix consisted of 5
samples irradiated at 2 x 1012 n/cm2, 5 irradiated at
1 x 1013 n/cm2, 5 irradiated at 3 x 1013 n/cm2 and 5 irradiated
at 1 x 1014 n/cm2. Two control units were used.
All samples passed the post-irradiation SMD limits after 2 x 1012
and 1 x 1013 n/cm2 but failed the SMD post-irradiation limits
after 3 x 1013 and 1 x 1014 n/cm2.
The ISL70003SEH samples were drawn from Lot 3XKFBC.
Samples were packaged in the standard hermetic 64 Ld Ceramic
Quad Flatpack (CQFP) production package, code RKV. Samples
were processed through burnin before irradiation and were
screened to the SMD limits at room, low and high temperatures
before the start of neutron testing.
Results
Test Results
Neutron testing of the ISL70003SEH is complete and the results
are reported in the balance of this report. It should be carefully
realized when interpreting the data that each neutron irradiation
was performed on a different five-unit sample; this is not total
dose testing, where the damage is cumulative.
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Test Report 026
Variables Data Plots
300
Ioper3v_500KHz
Ioper13p2_500KHz
OPERATING CURRENT, 500kHz (mA)
250
Spec limit, 3.0V
Spec limit, 13.2V
200
150
100
50
0
PRE-RAD
1E+11
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 2. ISL70003SEH operating current at 500kHz, 3V (blue) and 13.2V (red) input voltage cases, as a function of neutron irradiation,
showing the median of the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were
2 x 1012 n/cm2 (5 samples), 1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD
limits are 60.0mA maximum (3V case) and 125.0mA maximum (13.2V case).
300
Ioper3v_300KHz
Ioper13p2_300KHz
OPERATING CURRENT, 300kHz (mA)
250
Spec limit, 3.0V
Spec limit, 13.2V
200
150
100
50
0
PRE-RAD
1E+11
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 3. ISL70003SEH operating current at 300kHz, 3V (blue) and 13.2V (red) input voltage cases, as a function of neutron irradiation,
showing the median of the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were
2 x 1012 n/cm2 (5 samples), 1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD
limits are 60.0mA maximum (3V case) and 125.0mA maximum (13.2V case).
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Test Report 026
Variables Data Plots (Continued)
120
Istndby3v _500Khz
Istndby13 p2v _500Khz
STANDBY CURRENT, 500kHz (mA)
100
Spec limit, 3.0V
Spec limit, 13 .2V
80
60
40
20
0
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 4. ISL70003SEH standby current at 500kHz, 3V (blue) and 13.2V (red) cases, as a function of neutron irradiation, showing the median of
the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2
(5 samples), 1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are 15.0mA
maximum (3V case) and 30.0mA maximum (13.2V case).
120
Istndby13p2_300Khz
Istndby3v_300Khz
STANDBY CURRENT, 300kHz (mA)
100
Spec limit, 3.0V
Spec limit, 13.2V
80
60
40
20
0
PRE-RAD
1E+11
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 5. ISL70003SEH standby current at 300kHz, 3V (red) and 13.2V (blue) cases, as a function of neutron irradiation, showing the median of
the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2
(5 samples), 1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are 15.0mA
maximum (3V case) and 30.0mA maximum (13.2V case).
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Variables Data Plots (Continued)
3.5
Ishut13 p2 v
SHUTDOWN SUPPLY CURRENT (mA)
3
Ishut3v
Spec limit, 3.0V
2.5
Spec limit, 13 .2V
2
1.5
1
0.5
0
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 6. ISL70003SEH shutdown ('quiescent') supply current, 3V (red) and 13.2V (blue) cases, as a function of neutron irradiation, showing the
median of the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 1 x 1012 n/cm2
(5 samples), 1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 2 x 1014 n/cm2 (5 samples). The SMD limits are 1.0mA
maximum (3V case) and 3.0mA maximum (13.2V case).
SERIES REGULATOR OUTPUT VOLTAGE (V)
5.6
5.4
5.2
5
4.8
VREF_out
Spec limit
4.6
Spec limit
4.4
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 7. ISL70003SEH series regulator output voltage, 13.2V input (blue), as a function of neutron irradiation, showing the median of the
populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2 (5 samples),
1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are 4.5V to 5.5V.
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Test Report 026
Variables Data Plots (Continued)
-40
SERIES REGULATOR CURRENT LIMIT (mA)
-60
-80
-100
-120
-140
VrefOut_Ilim it
-160
Spec limit
-180
Spec limit
-200
1E+11 AD
PRE-R
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 8. ISL70003SEH on-chip series regulator current limit (blue) as a function of neutron irradiation, showing the median of the populations
following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2 (5 samples), 1 x 1013 n/cm2
(5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are -50.0mA to -190.0mA.
0.66
POR PIN INPUT VOLTAGE (V)
0.64
0.62
0.6
POR_V in_3V
0.58
POR_V in_13 .2V
Spec limit
0.56
Spec limit
0.54
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEU TRON FLUENCE (n/cm2)
FIGURE 9. ISL70003SEH POR input pin voltage, 3V (blue) and 13.3V (red) cases, as a function of neutron irradiation, showing the median of the
populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2 (5 samples),
1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are 0.56V to 0.64V.
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Test Report 026
Variables Data Plots (Continued)
15
POR_Isink_3V
14
POR_Isink_13.2V
POR SINK CURRENT (µA)
Spec limit
13
Spec limit
12
11
10
9
1E+11
PR
E-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 10. ISL70003SEH power on reset (POR) sink current, 3V (blue) and 13.3V (red) cases, as a function of neutron irradiation, showing the
median of the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012
n/cm2 (5 samples), 1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are
9.6mA to 14.4mA.
12
ENABLE LOW INPUT CURRENT (µA)
10
IIL
8
Spec limit
6
4
2
0
-2
-4
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 11. ISL70003SEH enable low input current (blue) as a function of neutron irradiation, showing the median of the populations following
irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2 (5 samples), 1 x 1013 n/cm2
(5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limit is +10.0µA maximum.
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Test Report 026
Variables Data Plots (Continued)
12
IIH
ENABLE HIGH INPUT CURRENT (µA)
10
Spec limit
8
6
4
2
0
1E+11 D
PRE-RA
1E+12
1E+13
1E+14
NEUTRON FLUENCE(n/cm2)
FIGURE 12. ISL70003SEH enable high input current (blue) as a function of neutron irradiation, showing the median of the populations following
irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2 (5 samples), 1 x 1013 n/cm2
(5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limit is +10.0µA maximum.
350
MinOn_time, 3.0 V
300
MinOn_time, 13.2V
MINIMUM ON-TIME (ns)
250
Spec limit
200
150
100
50
0
1E+11
P
RE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 13. ISL70003SEH minimum on-time, 3V (blue) and 13.2V (red) cases, as a function of neutron irradiation, showing the median of the
populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2 (5 samples),
1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limit is 320.0ns maximum.
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Variables Data Plots (Continued)
350
300
MINIMUM OFF-TIME (ns)
250
200
150
MinOff_time, 3.0V
100
MinOff_time, 13.2V
50
Spec limit
0
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 14. ISL70003SEH minimum off-time, 3V (blue) and 13.2V (red) cases, as a function of neutron irradiation, showing the median of the
populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2
(5 samples), 1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limit is 270.0ns
maximum.
4
ERROR AMPLIFIER OFFSET VOLTAGE (mV)
3
2
1
0
-1
ErrA m pVIO_ 3p0
ErrA m pVIO_ 13p2
-2
Spe c limit, 3.0V
-3
Spe c limit, 13 .2V
-4
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 15. ISL70003SEH error amplifier input offset voltage, 3V (blue) and 13.2V (red) cases as a function of neutron irradiation, showing the median
of the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2 (5 samples),
1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are -3.0mV to 3.0mV.
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Variables Data Plots (Continued)
800
D_RdsUpperAvg_3V
UPPER DEVICE ON-RESISTANCE (mΩ)
700
Spec limit
600
Spec limit
500
400
300
200
100
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 16. ISL70003SEH average upper device ON-resistance at 3V in (blue), ten power blocks, as a function of neutron irradiation, showing the
median of the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012
n/cm2 (5 samples), 1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are
170.0mΩ to 700.0mΩ.
450
Rds Lower_3 V
400
LOWER DEVICE ON-RESISTANCE (mΩ)
Spec limit
350
Spec limit
300
250
200
150
100
1E+11
PRE-RAD
1E+1 2
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 17. ISL70003SEH average lower device ON-resistance at 3V in (blue), ten power blocks, as a function of neutron irradiation, showing the
median of the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2
(5 samples), 1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are 90.0mΩ to
455.0mΩ.
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Test Report 026
Variables Data Plots (Continued)
4
3
LXx LOW LEAKAGE (µA)
2
1
LX1LkgLow
LX2LkgLow
LX3LkgLow
LX4LkgLow
LX5LkgLow
LX6LkgLow
LX7LkgLow
LX8LkgLow
LX9LkgLow
LX10LkgLow
Spec limit
Spec limit
0
-1
-2
-3
-4
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 18. ISL70003SEH LXx low leakage current, each of ten power blocks, as a function of neutron irradiation, showing the median of the
populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2 (5 samples),
1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are -3.0µA to +3.0µA.
4
3
LXx HIGH LEAKAGE (µA)
2
1
LX1LkgHigh
LX2LkgHigh
LX3LkgHigh
LX4LkgHigh
LX5LkgHigh
LX6LkgHigh
LX7LkgHigh
LX8LkgHigh
LX9LkgHigh
LX10LkgHigh
Spec limit
Spec limit
0
-1
-2
-3
-4
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 19. ISL70003SEH LXx high leakage current, each of ten power blocks, as a function of neutron irradiation, showing the median of the
populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2 (5 samples),
1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are -3.0µA to +3.0µA.
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Test Report 026
Variables Data Plots (Continued)
PGOOD RISING THRESHOLD (%)
116
114
112
110
PGD_ThrRiseChA
PGD_ThrRiseChB
PGD_ThrRiseChC
108
Spec limit
Spec limit
106
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 20. ISL70003SEH PGOOD rising threshold, channels A (blue), B (red) and C (green), as a function of neutron irradiation, showing the median
of the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2
(5 samples), 1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are 107% to
118%.
6
PGD_RiseChAHyst
PGD_RiseChBHyst
PGD_RiseChCHyst
PGOOD RISING HYSTERESIS (%)
5
Spec limit
Spec limit
4
3
2
1
PRE-RAD
1E+11
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 21. ISL70003SEH PGOOD rising hysteresis, channels A (blue), B (red) and C (green), as a function of neutron irradiation, showing the median
of the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2
(5 samples), 1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are 2% to 5%.
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Variables Data Plots (Continued)
94
PGD_ThrFallChA
PGD_ThrFallChB
PGD_ThrFallChC
PGOOD FALLING THRESHOLD (%)
92
Spec limit
Spec limit
90
88
86
84
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 22. ISL70003SEH PGOOD falling threshold, channels A (blue), B (red) and C (green), as a function of neutron irradiation, showing the median
of the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2
(5 samples), 1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are 85% to 93%.
6
PGD_FallChAHyst
PGD_FallChBHyst
PGOOD FALLING HYSTERESIS (%)
5
PGD_FallChCHyst
Spec limit
Spec limit
4
3
2
1
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 23. ISL70003SEH PGOOD falling hysteresis, channels A (blue), B (red) and C (green), as a function of neutron irradiation, showing the median
of the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2
(5 samples), 1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are 2% to 5%.
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Variables Data Plots (Continued)
30
PGOOD DRIVE CURRENT (mA)
25
20
15
PGOOD_Drive
10
Spec limit
5
PRE-RAD
1E+11
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 24. ISL70003SEH Power-Good (PGOOD) output drive current, 3V in (blue), as a function of neutron irradiation, showing the median of the
populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2 (5 samples),
1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limit is 7.2mA minimum.
1.5
PGOOD_Lkg_Vmax
1
PGOOD LEAKAGE (µA)
Spec limit
Spec limit
0.5
0
-0.5
-1
-1.5
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 25. ISL70003SEH PGOOD output leakage, 3V in (blue), as a function of neutron irradiation, showing the median of the populations following
irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2 (5 samples), 1 x 1013 n/cm2
(5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are -1.0µA to +1.0µA.
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Variables Data Plots (Continued)
80
UNDERVOLTAGE TRIP THRESHOLD (% OF VREF)
UV_TripThresVoter_3V
78
Spec limit
Spec limit
76
74
72
70
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 26. ISL70003SEH undervoltage trip threshold (blue) as a function of neutron irradiation, showing the median of the populations following
irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2 (5 samples), 1 x 1013 n/cm2
(5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are 71% to 79%.
BUFFER AMP OFFSET VOLTAGE (mV)
5
4
D_BuffAmp_VIO
3
Spec limit
2
Spec limit
1
0
-1
-2
-3
-4
-5
PRE-RAD
1E+11
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 27. ISL70003SEH buffer amplifier input offset voltage (blue) as a function of neutron irradiation, showing the median of the populations
following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2 (5 samples), 1 x 1013 n/cm2
(5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The data sheet limits are -4mV to 4mV.
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Variables Data Plots (Continued)
350
IMON_sample_time, 3.0V
IMON_sample_time, 13.2V
300
IMON SENSE TIME (ns)
Spec limit
Spec limit
250
200
150
100
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 28. ISL70003SEH current monitor (IMON) sense time for the 3V (blue) and 13.2V (red) cases, as a function of neutron irradiation, showing the
median of the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2
(5 samples), 1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are 145ns to
300ns.
1.24
1.23
BANDGAP VOLTAGE (V)
1.22
1.21
1.2
1.19
VBG_3V
1.18
VBG_13.2V
Spec limit
1.17
Spec limit
1.16
1E+11
PRE-RAD
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 29. ISL70003SEH bandgap voltage for the 3V (blue) and 13.2V (red) cases, as a function of neutron irradiation, showing the median of the
populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses) were 2 x 1012 n/cm2 (5 samples),
1 x 1013 n/cm2 (5 samples), 3 x 1013 n/cm2 (5 samples) and 1 x 1014 n/cm2 (5 samples). The SMD limits are 1.17V to 1.23V.
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Discussion and Conclusion
This document reports the results of 1MeV equivalent neutron
testing of the ISL70003SEH hardened Point-of-Load (POL)
regulator. Parts were tested at 2 x 1012 n/cm2, 1 x 1013 n/cm2,
3 x 1013 n/cm2 and 1 x 1014 n/cm2. The data is reported in
Figures 2 through 29, show plots of key parameters before and
after irradiation to each level. The plots show the median of each
parameter as a function of neutron irradiation. The figures also
show the applicable electrical limits taken from the SMD; it
should be carefully noted that these limits are provided for
guidance only as the ISL70003SEH is not specified for the
neutron environment. All samples passed the SMD limits after
2 x 1012 and 1 x 1013 n/cm2 but failed after 3 x 1013 and
1 x 1014 n/cm2.
TABLE 2. REPORTED PARAMETERS
FIGURE
PARAMETER
LIMIT, LOW
LIMIT, HIGH
UNITS
NOTES
2
Operating Current, 500kHz
-
60/25
mA
3V and 13.2VIN
3
Operating Current, 300kHz
-
60/25
mA
3V and 13.2VIN
4
Standby Current, 500kHz
-
15/30
mA
3V and 13.2VIN
5
Standby Current, 300kHz
-
15/30
mA
3V and 13.2VIN
6
Shutdown Current, 500kHz
-
1/3
mA
3V and 13.2VIN
7
Series Regulator Output Voltage
4.5
5.5
V
13.2VIN
8
Series Regulator Current Limit
-50
-190
mA
13.2VIN
9
POR Input Pin Voltage
0.56
0.64
V
3V and 13.2VIN
10
POR Sink Current
9.6
14.4
mA
3V and 13.2VIN
11
Enable low Input Current
-
10.0
μA
13.2VIN
12
Enable high Input Current
-
10.0
μA
13.2VIN
13
Minimum On-Time
-
320
ns
3V and 13.2VIN
14
Minimum Off-Time
-
270
ns
3V and 13.2VIN
15
Error Amplifier Offset Voltage
-3
3
mV
3V and 13.2VIN
16
Upper Device ON-Resistance
170
700
mΩ
3V and 13.2VIN
17
Lower Device ON-Resistance
90
455
mΩ
3V and 13.2VIN
18
LXx low Leakage Current
-3
3
μA
3VIN
19
LXx high Leakage Current
-3
3
μA
3VIN
20
PGOOD Rising Threshold
107
118
%
3VIN
21
PGOOD Rising Hysteresis
2
5
%
3VIN
22
PGOOD Falling Threshold
85
93
%
3VIN
23
PGOOD Falling Hysteresis
2
5
%
3VIN
24
PGOOD Output Drive Current
7.2
-
mA
3VIN
25
PGOOD Output Leakage
-1
1
μA
3VIN
26
Undervoltage Trip Threshold
71
79
%
3VIN
27
Buffer Amplifier Offset Voltage
-4
4
mV
3VIN
28
Current Monitor Sense Time
145
300
ns
3V and 13.2VIN
29
Bandgap Output Voltage
1.17
1.23
V
3V and 13.2VIN
Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is
cautioned to verify that the document is current before proceeding.
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