Test Report 028 Neutron Testing of the ISL75052SEH Low Dropout Regulator Introduction This report summarizes results of 1MeV equivalent neutron testing of the ISL75052SEH Low Droput (LDO) regulator. The test was conducted in order to determine the sensitivity of the part to Displacement Damage (DD) caused by neutron or proton environments. Neutron fluences ranged from 2x1012n/cm2 to 1x1014n/cm2. This project was carried out in collaboration with VPT, Inc. (Blacksburg, VA), and their support is gratefully acknowledged. Reference Documents • MIL-STD-883 test method 1017 • ISL75052SEH datasheet • Standard Microcircuit Drawing (SMD) 5962-13220 Part Description The ISL75052SEH is a radiation hardened, single output Low Dropout (LDO) regulator specified for an output current of 1.5A. The device operates from an input voltage range of 4.0V to 13.2V and an output voltage range of 0.6V to 12.7V. The output voltage is adjustable based on an external resistor divider setting. Dropout voltages as low as 75mV (at 0.5A) typical can be realized, allowing the user to improve system efficiency by lowering VIN to nearly VOUT. An ENABLE feature allows the part to be placed into a low shutdown current mode of 165μA (typical). When enabled, the ISL75052SEH operates with a low ground current of 11mA (typical), which provides operation with low quiescent power consumption. The device has superior transient response and is designed for predictable operation in the Single-Event Effects (SEE) environment, including reduced Single-Event Transient (SET) magnitude seen on the output. There is no need for additional SET protection diodes and filters. A compensation (COMP) pin is provided to enable the use of external compensation. This is achieved by connecting a resistor and capacitor from the COMP pin to ground. The device is stable with tantalum capacitors as low as 47μF (KEMET T525 series) and provides excellent voltage regulation from no load to full load. The programmable soft-start function allows the user to program the inrush current by means of the decoupling capacitor used on the Bypass (BYP) pin. The Overcurrent Protection (OCP) pin allows the short-circuit output current limit threshold to be programmed by means of a resistor from the OCP pin to ground. The OCP setting range is from 0.16A minimum to 3.2A maximum. A thermal shutdown function disables the output if the device temperature exceeds a specified value; the ISL75052SEH will subsequently enter an ON/OFF (hiccup) cycle until the fault is removed. The ISL75052SEH is available in a 16 Ld hermetic ceramic flatpack and in die form. The part offers guaranteed performance across the full -55°C to +125°C military temperature range. The ISL75052SEH is hardened to achieve a Total Dose (TID) rating of 100krads(Si) at both high (50-300rad(Si)/s) and low (< 0.01rad(Si)/s) dose rates as specified in MIL-STD-883 test method 1019. The part is acceptance tested on a wafer-by-wafer basis at a low dose rate to 50krad(Si) and at a high dose rate to 100krad(Si). The ISL75052SEH is also SEE tolerant to a Linear Energy Transfer (LET) value of 86.4MeV•cm2/mg. Single-Event Transients (SETs) have evolved into a major issue in power management parts driving voltage-sensitive loads, and the part provides superior performance in this environment. The ISL75052SEH is implemented in a submicron BiCMOS process optimized for power management applications. The process is in volume production under MIL-PRF-38535 certification and is used for a wide range of commercial power management devices. Specifications for Radiation Hardened QML devices are controlled by the Defense Logistics Agency (DLA) in Columbus, OH. The SMD is the controlling document and must be cited when ordering. April 15, 2016 TR028.0 1 CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 1-888-468-3774 | Copyright Intersil Americas LLC 2016 All Rights Reserved Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries. All other trademarks mentioned are the property of their respective owners. Test Report 028 Block Diagram COMP VIN 3.8V LDO OCP VCCX CURRENT LIMIT BYP 600mV + REFERENCE BIAS POWER PDMOS EN VOUT THERMAL SHUTDOWN UVLO ADJ PG 540mV + DELAY GND FIGURE 1. ISL75052SEH BLOCK DIAGRAM Test Description Irradiation Facilities Neutron irradiation was performed by the VPT team at the University of Massachusetts Lowell Fast Neutron Irradiation (FNI) facility, which provides a controlled 1MeV equivalent neutron flux. Parts were tested in an unbiased configuration with all leads shorted together in accordance with Test Method 1017 of MIL-STD-883. As neutron irradiation activates many of the heavier elements found in a packaged integrated circuit, the parts exposed at the higher neutron levels required (as expected) some ‘cool-down’ time before being shipped back to Intersil (Palm Bay, FL) for electrical testing. Testing proceeded in general accordance with the guidelines of MIL-STD-883 Test Method 1017. The experimental matrix consisted of 5 samples irradiated at 2x1012n/cm2, 5 irradiated at 1x1013n/cm2, 5 irradiated at 3x1013n/cm2 and 5 irradiated at 1x1014n/cm2. Two control units (serial numbers 68 and 70) were used. ISL75052SEHF/PROTO samples were drawn from Lot WXW8MA. Samples were packaged in the standard hermetic 16 Ld ceramic flatpack production package, code K16.E. Samples were screened to the SMD limits over temperature before the start of neutron testing. Results Test Fixturing No formal irradiation test fixturing was involved, as these DD tests are ‘bag tests’ in the sense that the parts are irradiated in an electrically inactive state with all leads shorted together. Characterization Equipment and Procedures Electrical testing was performed before and after irradiation using the Intersil production Automated Test Equipment (ATE). All electrical testing was performed at room temperature. Submit Document Feedback Experimental Matrix 2 Neutron testing of the ISL75052SEH is complete and the results are reported in the balance of this report. It should be carefully realized when interpreting the data that each neutron irradiation was performed on a different five-unit sample; this is not total dose testing, where the damage is cumulative over a number of downpoints. TR028.0 April 15, 2016 Test Report 028 Attributes Data TABLE 1. ISL75052SEH ATTRIBUTES DATA SERIAL SAMPLE SIZE FLUENCE N/CM2 PASS (Note 1) FAIL ISL75052SEH 379 through 383 5 2x1012 5 0 All passed ISL75052SEH 384, 385, 406, 407, 409 5 1x1013 5 5 All passed ISL75052SEH 410 through 414 5 3x1013 0 5 All failed parametrically, VREF and VOUT at ±1.5% specification ISL75052SEH 416, 417, 419 through 421 5 1x1014 0 5 All failed parametrically, VREF and VOUT outside ±2.0% range PART NOTES NOTE: 1. ‘Pass’ indicates a sample that passes all SMD limits. Variables Data The plots in Figures 2 through 26 show data plots for key parameters before and after irradiation to each level. The reported parameters and their datasheet limits are shown in Table 2 on page 17. The plots show the median of each parameter as a function of neutron irradiation. We chose to plot the median because of the small sample sizes (five per cell) involved. We also show the applicable electrical limits taken from the SMD; it should be carefully noted that these limits are provided for guidance only as the ISL75052SEH is not specified or guaranteed for the neutron environment. Intersil does not design, qualify or guarantee its parts for the DD environment, but has done some limited neutron testing for customer guidance. Submit Document Feedback 3 TR028.0 April 15, 2016 Test Report 028 Variables Data Plots 0.6 EN_IIL 0.4 EN_IIH Spec limit ENABLE LOW AND HIGH CURRENT (µA) 0.2 Spec limit 0 -0.2 -0.4 -0.6 -0.8 -1 -1.2 -1.4 PRE-RAD 1.00E+11 1.00E+12 NEUTRON FLUENCE 1.00E+13 1.00E+14 (n/cm2) FIGURE 2. ISL75052SEH enable LOW and enable HIGH current as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are -0.5µA to 0.5µA. 0.8 ADJ_Ibias 0.6 ADJUST PIN BIAS CURRENT (µA) 0.4 Spec limit Spec limit 0.2 0 -0.2 -0.4 -0.6 -0.8 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 3. ISL75052SEH adjust pin bias current as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are -0.7µA to 0.7µA. Submit Document Feedback 4 TR028.0 April 15, 2016 Test Report 028 Variables Data Plots (Continued) 350 IShtDw n_ Vm in 300 IShtDw n_ Vm ax SHUTDOWN CURRENT (µA) Spec limit 250 Spec limit 200 150 100 50 0 1.00E+11 PRE-RAD 1.00 E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 4. ISL75052SEH shutdown current at maximum and minimum input voltage as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 120.0µA (maximum) at 4.0V input and 300.0µA (maximum) at 13.2V input. 0.615 Vadj_Vmin Vadj_Vmax Spec limit ADJUST PIN VOLTAGE (V) Spec limit 0.605 0.595 0.585 1.00E+11 PRE-RAD 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 5. ISL75052SEH adjust pin voltage as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 0.591V to 0.609V. Submit Document Feedback 5 TR028.0 April 15, 2016 Test Report 028 Variables Data Plots (Continued) 0.615 Vbyp_Vmin Vbyp_Vmax Spec limit BYPASS VOLTAGE (V) Spec limit 0.605 0.595 0.585 1.00E+11 PRE-RAD 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 6. ISL75052SEH bypass voltage at an input voltage of 3.6V as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 0.588V to 0.612V. 2.58 V2p5_VinMin_NL V2p5_VinMin_1p5A 2.56 Spec limit Spec limit OUTPUT VOLTAGE (V) 2.54 2.52 2.5 2.48 2.46 2.44 1.00E+11 PRE-RAD 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 7. ISL75052SEH output voltage at minimum input voltage, 2.5V output voltage, no load and 1.5A output current, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 2.4625V to 2.5375V. Submit Document Feedback 6 TR028.0 April 15, 2016 Test Report 028 Variables Data Plots (Continued) 2.58 V2p5_Vin5V_NL V2p5_Vin5V_1p5A 2.56 Spec limit Spec limit OUTPUT VOLTAGE (V) 2.54 2.52 2.5 2.48 2.46 2.44 1.00E+11 PRE-RAD 1.00E+12 NEUTRON FLUENCE 1.00E+13 1.00E+14 (n/cm2) FIGURE 8. ISL75052SEH output voltage at 5.0V input voltage, 2.5V output voltage, no load and 1.5A output current, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 2.4625V to 2.5375V. 10 D_V2p5_LineReg 8 Spec limit 6 Spec limit LINE REGULATION (mV) 4 2 0 -2 -4 -6 -8 -10 1.00E+11 PRE-RAD 1.00E+12 NEUTRON FLUENCE 1.00E+13 1.00E+14 (n/cm2) FIGURE 9. ISL75052SEH line regulation, 4.0V to 13.2V input voltage, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are -8.0mV to 8.0mV. Submit Document Feedback 7 TR028.0 April 15, 2016 Test Report 028 Variables Data Plots (Continued) 10 V2p5_LoadReg 8 Spec limit 6 Spec limit LOAD REGULATION (mV) 4 2 0 -2 -4 -6 -8 -10 1.00E+11 PRE-RAD 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 10. ISL75052SEH load regulation, 2.5V output voltage, 4.0V input voltage, 0 to 1.5A load, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are -9.0mV to 9.0mV. 10.3 V10_Vin10p5_NL V10_Vin10p5_1p5A OUTPUT VOLTAGE (V) 10.2 Spec limit Spec limit 10.1 10 9.9 9.8 PRE-RAD 1.00E+11 1.00E+12 NEUTRON FLUENCE 1.00E+13 1.00E+14 (n/cm2) FIGURE 11. ISL75052SEH output voltage at 10.5V input voltage, 10.0V output voltage, no load and 1.5A output current, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 9.85V to 10.15V. Submit Document Feedback 8 TR028.0 April 15, 2016 Test Report 028 Variables Data Plots (Continued) 10.3 V10_VinMax_NL V10_VinMax_1p0A OUTPUT VOLTAGE (V) 10.2 Spec limit Spec limit 10.1 10 9.9 9.8 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 12. ISL75052SEH output voltage at 13.2V input voltage, 10.0V output voltage, no load and 1.5A output current, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 9.85V to 10.15V. 15 D_V10_LineReg 10 Spec limit LINE REGULATION (mV) Spec limit 5 0 -5 -10 -15 1.00E+11 PRE-RAD 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 13. ISL75052SEH line regulation, 10.0V to 13.2V input voltage, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are -10.0mV to 10.0mV. Submit Document Feedback 9 TR028.0 April 15, 2016 Test Report 028 Variables Data Plots (Continued) 40 V10_LoadReg 30 LOAD REGULATION (mV) 20 Spec limit Spec limit 10 0 -10 -20 -30 -40 1.00E+11 PRE-RAD 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 14. ISL75052SEH load regulation, 10.0V output voltage, 10.5V input voltage, 0 to 1.5A load, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are -36.0mV to 36.0mV. 450 VDO_3p6_500 VDO_3p6_1000 VDO_3p6_1500 Spec limit, 500mA Spec limit, 1000mA Spec limit, 1500mA 400 DROPOUT VOLTAGE (mV) 350 300 250 200 150 100 50 0 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 15. ISL75052SEH dropout voltage at 3.6V output, 500mA, 1000mA and 1500mA output current, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 160.0mV maximum at 500mA, 300.0mV at 1000mA and 400.0mV at 1500mA. Submit Document Feedback 10 TR028.0 April 15, 2016 Test Report 028 Variables Data Plots (Continued) 450 D_VDO_12p7_500 D_VDO_12p7_1000 D_VDO_12p7_1500 Spec limit, 500mA Spec limit, 1000mA Spec limit, 1500mA 400 DROPOUT VOLTAGE (mV) 350 300 250 200 150 100 50 0 PRE-RAD 1.00E+11 1.00E+12 NEUTRON FLUENCE 1.00E+13 1.00E+14 (n/cm2) FIGURE 16. ISL75052SEH dropout voltage at 12.7V output, 500mA, 1000mA and 1500mA output current, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 160.0mV maximum at 500mA, 300.0mV at 1000mA and 400.0mV at 1500mA. 0.6 PG_Lkg 0.4 Spec limit PGOOD LEAKAGE (µA) Spec limit 0.2 0 -0.2 -0.4 -0.6 1.00E+11 PRE-RAD 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 17. ISL75052SEH PGOOD leakage as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are -0.5µA to 0.5µA. Submit Document Feedback 11 TR028.0 April 15, 2016 Test Report 028 Variables Data Plots (Continued) 450 PG_VOL_1ma 400 PG_VOL_10ma Spec limit 350 Spec limit PGOOD VOL (mV) 300 250 200 150 100 50 0 1.00E+11 PRE-RAD 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 18. ISL75052SEH PGOOD LOW and HIGH output voltage as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The data sheet limits are 100.0mV maximum (VOL) and 400.0mV (VOH). 96 94 PGOOD THRESHOLD (%) 92 VmaxPG_ThresRising VmaxPG_Thres_Falling Spec limit, rising Spec limit, rising Spec limit, falling Spec limit, falling 90 88 86 84 82 80 78 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 19. ISL75052SEH PGOOD rising and falling threshold, 13.2V input voltage, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 83% to 94% (rising) and 80% to 91% (falling). Submit Document Feedback 12 TR028.0 April 15, 2016 Test Report 028 Variables Data Plots (Continued) 4.5 VmaxPG_Hys 4 Spec limit PGOOD HYSTERESIS (%) Spec limit 3.5 3 2.5 2 1.5 1.00E+11 PRE-RAD 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 20. ISL75052SEH PGOOD hysteresis, 13.2V input voltage, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 1.75% to 4.0%. 96 94 VminPG_ThresRising VminPG_Thres_Falling Spec limit, rising Spec limit, rising Spec limit, falling Spec limit, falling PGOOD THRESHOLD (%) 92 90 88 86 84 82 80 78 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 21. ISL75052SEH PGOOD rising and falling threshold, 4.0V input voltage, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 83% to 94% (rising) and 80% to 91% (falling). Submit Document Feedback 13 TR028.0 April 15, 2016 Test Report 028 Variables Data Plots (Continued) 4.5 VminPG_Hys 4 Spec limit PGOOD HYSTERESIS (%) Spec limit 3.5 3 2.5 2 1.5 1.00E+11 PRE-RAD 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 22. ISL75052SEH PGOOD hysteresis, 4.0V input voltage, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 1.75% to 4.0%. 1.4 ENThrRisingVinMax ENThrFallingVinMax 1.2 Spec limit ENABLE THRESHOLD (V) Spec limit 1 0.8 0.6 0.4 1.00E+11 PRE-RAD 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 23. ISL75052SEH Enable rising and falling threshold, 13.2V input voltage, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 0.5V to 1.2V. Submit Document Feedback 14 TR028.0 April 15, 2016 Test Report 028 Variables Data Plots (Continued) 350 ENHystVinMax 300 Spec limit ENABLE HYSTERESIS (mV ) Spec limit 250 200 150 100 50 1.00E+11 PRE-RAD 1.00E+12 NEUTRON FLUENCE 1.00E+13 1.00E+14 (n/cm2) FIGURE 24. ISL75052SEH Enable hysteresis, 13.2V input voltage, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 75.0mV to 300.0mV. 1200 EN_TurnOn_Dly Spec limit 1000 Spec limit ENABLE DELAY (µs) 800 600 400 200 0 1.00E+11 PRE-RAD 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm2) FIGURE 25. ISL75052SEH Enable turnon delay as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The datasheet limits are 100.0µs to 1000µs. Submit Document Feedback 15 TR028.0 April 15, 2016 Test Report 028 Variables Data Plots (Continued) 3500 ENABLE TO PGOOD DELAY (µs) 3000 EN_PG_Dly22uf EN_PG_Dly200uf Spec limit 22uF Spec limit 200uF 2500 2000 1500 1000 500 0 PRE-RAD 1.00E+11 1.00E+12 1.00E+13 1.00E+14 NEUTRON FLUENCE (n/cm 2) FIGURE 26. ISL75052SEH Enable to PGOOD delay, 22µF and 200µF, as a function of 1MeV equivalent neutron irradiation at 2x1012n/cm2, 1x1013n/cm2, 3x1013n/cm2 and 1x1014n/cm2. Sample size for each cell was 5. The data sheet limits are 2500µs (22µF) and 3000µs (200µF). Conclusion This report summarizes results of 1MeV equivalent neutron testing of the ISL75052SEH low dropout voltage linear regulator. The test was conducted in order to determine the sensitivity of the part to Displacement Damage (DD) caused by neutron or proton environments in space. Neutron fluences ranged from 2x1012n/cm2 to 1x1014n/cm2. This project was carried out in collaboration with VPT, Inc. (Blacksburg, VA), and their support is gratefully acknowledged. The samples met all specifications (Bin 1) after 2x1011n/cm2 and 1x1013n/cm2. ATE testing showed rejects to the datasheet limits after 3x1013n/cm2 and 1x1014n/cm2. These were parametric failures, notably of the reference and output voltage, which were at the ±1.5% specification after 3x1013n/cm2 and exceeded a ±2.0% range after 1x1014n/cm2. The part may be usable at 3x1013n/cm2 with some derating. Submit Document Feedback 16 TR028.0 April 15, 2016 Test Report 028 Appendices Reported Parameters The limits are from the SMD and are provided for guidance only as the part is not designed or guaranteed for the neutron environment. A number of parameters are plotted in the same figure (see for example Figure 2 on page 4, which plots the neutron response of both the enable LOW and enable HIGH currents) in order to save space. TABLE 2. REPORTED PARAMETERS AND DATASHEET LIMITS FIGURE LIMIT, LOW LIMIT, HIGH UNITS Enable LOW Current -0.5 0.5 µA Enable HIGH Current -0.5 0.5 µA 3 Adjust Pin Bias Current -0.7 0.7 µA 4 Shutdown Current - 120.0 µA 4.0V in Shutdown Current - 300.0 µA 13.2V in Adjust Pin Voltage 0.591 0.609 V 4.0V in Adjust Pin Voltage 0.591 0.609 V 13.2V in Bypass Pin Voltage 0.588 0.612 V 4.0V in Bypass Pin Voltage 0.588 0.612 V 13.2V in Output Voltage, 2.5V 2.4625 2.5375 V 4.0V in, no load Output Voltage, 2.5V 2.4625 2.5375 V 4.0V in, 1.5A Output Voltage, 2.5V 2.4625 2.5375 V 5V, no load Output Voltage, 2.5V 2.4625 2.5375 V 5V, 1.5A 9 Line Regulation, 2.5V -8.0 8.0 mV 4.0V to 13.2V 10 Load Regulation, 2.5V -9.0 9.0 mV 4.0V in, 0 to 1.5A 11 Output Voltage, 10.0V 9.85 10.15 V 10.5V in, no load Output Voltage, 10.0V 9.85 10.15 V 10.5V in, 1.5A Output Voltage, 10.0V 9.85 10.15 V 13.2V in, no load Output Voltage, 10.0V 9.85 10.15 V 13.2V in, 1.5A 13 Line Regulation, 10.0V -10.0 10.0 mV 10.0V to 13.2V 14 Load Regulation, 10.0V -36.0 36.0 mV 1.5V in, 0 to 1.5A 15 Dropout Voltage, 3.6V - 160.0 mV 500mA output current Dropout Voltage, 3.6V - 300.0 mV 1000mA output current Dropout Voltage, 3.6V - 400.0 mV 1500mA output current Dropout Voltage, 12.7V - 160.0 mV 500mA output current Dropout Voltage, 12.7V - 300.0 mV 1000mA output current Dropout Voltage, 12.7V - 400.0 mV 1500mA output current -0.5 0.5 µA 13.2V in, PGOOD at 5.5V 2 5 6 7 8 12 16 PARAMETER NOTES 17 PGOOD Leakage 18 PGOOD VOL - 100.0 mV 1.0mA load PGOOD VOL - 400.0 mV 10.0mA load PGOOD Threshold, Rising 83 94 % 13.2V in, rising PGOOD Threshold, Falling 80 91 % 13.2V in, falling 1.75 4.0 % 13.2V in 19 20 PGOOD Hysteresis Submit Document Feedback 17 TR028.0 April 15, 2016 Test Report 028 TABLE 2. REPORTED PARAMETERS AND DATASHEET LIMITS (Continued) FIGURE 21 PARAMETER LIMIT, LOW LIMIT, HIGH UNITS NOTES PGOOD Threshold, Rising 83 94 % 4.0V in, rising PGOOD Threshold, Falling 80 91 % 4.0V in, falling 1.75 4.0 % 13.2V in 22 PGOOD Hysteresis 23 Enable Threshold, Rising 0.5 1.2 V 13.2V in, rising Enable Threshold, Falling 0.5 1.2 V 13.2V in, falling 24 Enable Hysteresis 75 300 mV 25 Enable Turn-On Delay - 1000 µs 26 Enable to PGOOD Delay - 2500 µs Enable to PGOOD Delay - 3000 µs 13.2V in Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that the document is current before proceeding. For information regarding Intersil Corporation and its products, see www.intersil.com Submit Document Feedback 18 TR028.0 April 15, 2016