ISL78845ASEH Neutron Test Report

Test Report 006
Neutron Testing of the ISL78845ASEH Pulse Width
Modulator
Introduction
This report summarizes results of 1MeV equivalent neutron
testing of the ISL78845ASEH current mode PWM controller.
The test was conducted in order to determine the sensitivity of
the part to the Displacement Damage (DD) caused by the
neutron environment. Neutron fluences ranged from
2x1011n/cm2 to 1x1014n/cm2. This project was carried out
in collaboration with Honeywell Aerospace (Clearwater, FL),
and their support is gratefully acknowledged.
Part Description
The ISL78845ASEH is a high performance, radiation hardened
drop-in replacement for the popular 28C4x and 18C4x PWM
controllers and is suitable for a wide range of power
conversion applications including boost, flyback and isolated
output configurations. Its fast signal propagation and output
switching characteristics make this an ideal product for
existing and new designs. Features include up to 13.2V
operation, low operating current, 90µA typical start-up current,
adjustable operating frequency to 1MHz, and high peak
current drive capability with 50ns rise and fall times.
There are four variants of this part: the ISL78840SEH with
rising Undervoltage Lockout (UVLO) threshold of 7V and 100%
maximum duty cycle, the ISL78841SEH with rising UVLO
threshold of 7V and 50% maximum duty cycle, the
ISL78843SEH with rising UVLO threshold of 8.4V and 100%
maximum duty cycle and finally the ISL78845ASEH with rising
UVLO threshold of 8.4V and 50% maximum duty cycle. The
four variants are closely similar and the ISL78845ASEH data
discussed in this report is considered applicable to the other
three variants.
The ISL78845ASEH is available in an 8 Ld hermetic ceramic
flatpack and in die form and offers guaranteed performance
across the full -55°C to +125°C military temperature range.
Characterization equipment and
procedures
Electrical testing was performed before and after irradiation
using the Intersil production Automated Test Equipment (ATE).
All electrical testing was performed at room temperature.
Experimental matrix
Testing proceeded in general accordance with the guidelines
of MIL-STD-883 Test Method 1017. The experimental matrix
consisted of six samples irradiated at 2.2x1011 n/cm2, six
samples irradiated at 4.4x1011n/cm2, six samples irradiated
at 6.6x1011n/cm2, three samples irradiated at
1x1012n/cm2, three samples irradiated at 1x1013n/cm2 and
five samples irradiated at 1x1014 n/cm2. Two control units
were used to insure repeatability. Samples were taken from
current production inventory.
Results
Test results
Neutron testing of the ISL78845ASEH is complete and the
results are reported in the balance of this report. It should be
realized when reviewing the data that each neutron irradiation
was made on a different 6- or 3-unit sample; this is not total
dose testing, where the damage is cumulative.
Variables data
The plots in Figures 1 through 20 show data plots for key
parameters before and after irradiation to each level. The plots
show the median, minimum and maximum of each parameter
for each of the four amplifier channels as a function of neutron
irradiation. We chose to plot the median because of the small
sample sizes involved. We also show the applicable electrical
limits taken from the SMD, this for guidance only as the
ISL78845ASEH is not specified for neutron irradiation.
Test Description
Irradiation Facilities
Neutron irradiation was performed by the Honeywell team at
the Fast Burst Reactor facility at White Sands Missile Range
(White Sands, NM), which provides a controlled 1MeV
equivalent neutron flux. Parts were tested in an unbiased
configuration with all leads shorted together. As neutron
irradiation activates many of the elements found in a
packaged integrated circuit, the parts exposed at the higher
neutron levels required (as expected) significant ‘cooldown’
time before being shipped back to Intersil (Palm Bay, FL) for
electrical testing.
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Test Report 006
9.1
SPEC HIGH
UVLO START VOLTAGE (V)
8.9
8.7
MEDIAN
8.5
MIN
MAX
8.3
8.1
SPEC LOW
7.9
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 1. ISL78845ASEH Undervoltage Lockout (UVLO) START threshold voltage as a function of neutron irradiation, showing the median,
minimum and maximum of the populations following irradiation to each level. Neutron fluences and sample sizes (in parentheses)
were 2.2x1011n/cm2 (6 samples), 4.4x1011n/cm2 (6 samples), 6.6x1011 n/cm2 (6 samples), 1x1012n/cm2 (3 samples),
1x1013n/cm2 (3 samples) and 1x1014n/cm2 (3 samples). For reference, the SMD limits are 8V to 9V. (21)
8.1
SPEC HIGH
8.0
7.9
UVLO STOP VOLTAGE (V)
MIN
MAX
7.8
MEDIAN
7.7
7.6
7.5
7.4
7.3
SPEC LOW
7.2
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 2. ISL78845ASEH UVLO STOP threshold voltage as a function of neutron irradiation, showing the median, minimum and maximum of the
populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples), 4.4x1011n/cm2
(6 samples), 6.6x1011 n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2 (3 samples).
For reference, the SMD limits are 7.3V to 8V. (22)
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600
SPEC HIGH
STARTUP CURRENT (µA)
500
400
300
200
MAX
MEDIAN
100
MIN
0
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 3. ISL78845ASEH startup current as a function of neutron irradiation, showing the median, minimum and maximum of the populations
at each level. Neutron fluences and sample sizes (in parentheses) were 2.2 x 1011 n/cm2 (6 samples), 4.4 x 1011 n/cm2 (6 samples),
6.6x1011n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2 (3 samples). For reference,
the post-irradiation SMD limit is 500µA.
4.5
SPEC HIGH
4.0
OPERATING CURRENT (mA)
3.5
3.0
MEDIAN
MAX
2.5
2.0
MIN
1.5
1.0
0.5
0
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 4. ISL78845ASEH operating current as a function of neutron irradiation, showing the median, minimum and maximum of the
populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011 n/cm2 (6 samples), 4.4x1011 n/cm2
(6 samples), 6.6x1011n/cm2 (6 samples), 1 x 1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014 n/cm2 (3 samples).
The SMD limit is 4mA maximum.
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6
SPEC HIGH
OPERATING SUPPLY CURRENT (mA)
5
4
MEDIAN
MAX
3
2
MIN
1
0
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 5. ISL78845ASEH operating supply current as a function of neutron irradiation, showing the median, minimum and maximum of the
populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples), 4.4 x 1011 n/cm2
(6 samples), 6.6x1011n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1 x 1014 n/cm2 (3 samples).
The SMD limit is 5.5mA maximum.
5.06
SPEC HIGH
5.04
REFERENCE VOLTAGE (V)
5.02
5.00
MEDIAN
4.98
MIN
4.96
MAX
4.94
SPEC LOW
4.92
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 6. ISL78845ASEH reference voltage accuracy as a function of neutron irradiation, showing the median, minimum and maximum of the
populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples), 4.4x1011n/cm2
(6 samples), 6.6x1011n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2 (3 samples).
The SMD limits are 4.925V to 5.050V.
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0
VREF CURRENT LIMIT, SOURCING (mA)
-10
SPEC HIGH
-20
-30
-40
-50
MEDIAN
MAX
-60
MIN
-70
1E+11
1E+12
1E+13
1E+14
NEUTRON FLUENCE, (n/cm2)
FIGURE 7. ISL78845ASEH reference current limit, sourcing, as a function of neutron irradiation, showing the median, minimum and maximum of
the populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples),
4.4x1011n/cm2 (6 samples), 6.6x1011n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2
(3 samples). The SMD limit is -20mA minimum.
30
MEDIAN
MAX
VREF CURRENT LIMIT, SINKING (mA)
25
MIN
20
15
10
5
SPEC LOW
0
1E+11
1E+12
1E+13
1E+14
NEUTRON FLUENCE, (n/cm2)
FIGURE 8. ISL78845ASEH reference current limit, sinking, as a function of neutron irradiation, showing the median, minimum and maximum of
the populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples),
4.4x1011n/cm2 (6 samples), 6.6x1011n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2
(3 samples). The SMD limit is 5mA minimum.
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1.5
SPEC HIGH
CURRENT SENSE BIAS CURRENT (µA)
1.0
0.5
MAX
0
MEDIAN
MIN
-0.5
-1.0
-1.5
Pre-rad
SPEC LOW
1E+12
1E+13
1E+14
NEUTRON FLUENCE, (n/cm2)
FIGURE 9. ISL78845ASEH current sense input bias current as a function of neutron irradiation, showing the median, minimum and maximum of
the populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples),
4.4x1011n/cm2 (6 samples), 6.6x1011 n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2
(3 samples). The SMD limits are -1µA to 1µA.
1.04
SPEC HIGH
1.03
MAXIMUM INPUT SIGNAL (V)
1.02
MEDIAN
MIN
1.01
MAX
1.00
0.99
0.98
SPEC LOW
0.97
0.96
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE, (n/cm2)
FIGURE 10. ISL78845ASEH current sense maximum input signal as a function of neutron irradiation, showing the median, minimum and
maximum of the populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples),
4.4x1011n/cm2 (6 samples), 6.6x1011n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1 x 1014
n/cm2 (3 samples). The SMD limits are 0.97V to 1.03V.
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3.6
SPEC HIGH
3.4
CS GAIN (V/V)
3.2
3.0
MEDIAN
MAX
2.8
MIN
2.6
SPEC LOW
2.4
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE, (n/cm2)
FIGURE 11. ISL78845ASEH current sense gain (ACS = VCOMP / VCS) as a function of neutron irradiation, showing the median, minimum and
maximum of the populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples),
4.4x1011n/cm2 (6 samples), 6.6x1011n/cm2 (6 samples), 1x1012 n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2
(3 samples). The SMD limits are 2.5V/V to 3.5V/V. Two out of three samples were nonfunctional after irradiation to 1x1014n/cm2.
2.54
SPEC HIGH
2.53
EA REFERENCE VOLTAGE (V)
2.52
MIN
MAX
MEDIAN
2.51
2.50
2.49
2.48
SPEC LOW
2.47
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE, (n/cm2)
FIGURE 12. ISL78845ASEH error amplifier reference as a function of neutron irradiation, showing the median, minimum and maximum of the
populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples), 4.4x1011n/cm2
(6 samples), 6.6x1011n/cm2 (6 samples), 1x1012 n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2 (3 samples).
The SMD limits are 2.475V to 2.530V.
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1.5
SPEC HIGH
FEEDBACK INPUT BIAS CURRENT (µA)
1.0
0.5
MAX
MEDIAN
0
-0.5
MIN
SPEC LOW
-1.0
-1.5
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE, (n/cm2)
FIGURE 13. ISL78845ASEH error amplifier input bias current as a function of neutron irradiation, showing the median, minimum and maximum of
the populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples),
4.4x1011n/cm2 (6 samples), 6.6x1011n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2
(3 samples). The SMD limits are -1µA to 1µA.
12
COMPARATOR SINK CURRENT (mA)
10
MIN
8
MAX
MEDIAN
6
4
2
SPEC LOW
0
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE, (n/cm2)
FIGURE 14. ISL78845ASEH error amplifier sink current as a function of neutron irradiation, showing the median, minimum and maximum of the
populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples), 4.4x1011n/cm2
(6 samples), 6.6x1011n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2 (3 samples). The
SMD limit is 1mA minimum.
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0
-0.1
COMPARATOR SOURCE CURRENT (mA)
-0.2
-0.3
SPEC HIGH
-0.4
-0.5
MAX
MEDIAN
-0.6
MIN
-0.7
-0.8
-0.9
-1.0
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 15. ISL78845ASEH error amplifier source current as a function of neutron irradiation, showing the median, minimum and maximum of
the populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples),
4.4x1011n/cm2 (6 samples), 6.6x1011n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2
(3 samples). The SMD limit is -0.4mA minimum.
5.10
SPEC HIGH
5.05
MIN
COMPARATOR VOH (V)
5.00
MAX
MEDIAN
4.95
4.90
4.85
SPEC LOW
4.80
4.75
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 16. ISL78845ASEH error amplifier HIGH output voltage as a function of neutron irradiation, showing the median, minimum and maximum
of the populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples),
4.4x1011n/cm2 (6 samples), 6.6x1011n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2
(3 samples). The SMD limits are 4.80V to 5.050V.
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1.2
SPEC HIGH
1.0
MEDIAN
COMPARATOR VOL (V)
MAX
0.8
MIN
0.6
SPEC LOW
0.4
0.2
0
Pre-rad
1.E+12
1.E+13
1.E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 17. ISL78845ASEH error amplifier LOW output voltage as a function of neutron irradiation, showing the median, minimum and maximum
of the populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples),
4.4x1011n/cm2 (6 samples), 6.6x1011n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2
(3 samples). The SMD limits are 0.4V to 1V.
54
SPEC HIGH
53
MAX
MEDIAN
FREQUENCY (kHz)
52
MIN
51
50
49
SPEC LOW
48
47
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 18. ISL78845ASEH oscillator frequency as a function of neutron irradiation, showing the median, minimum and maximum of the
populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples), 4.4x1011n/cm2
(6 samples), 6.6x1011n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014 n/cm2 (3 samples).
The SMD limits are 48kHz to 53kHz.
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70
SPEC HIGH
CURRENT SENSE TO OUTPUT DELAY (ns)
60
50
MIN
40
MAX
MEDIAN
30
20
10
0
1E+12
Pre-rad
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 19. ISL78845ASEH current sense to output delay as a function of neutron irradiation, showing the median, minimum and maximum of
the populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples),
4.4x1011n/cm2 (6 samples), 6.6x1011n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2
(3 samples). The SMD limit is 60ns maximum.
50.5
50.0
MAXIMUM DUTY CYCLE (%)
49.5
49.0
48.5
MEDIAN
MAX
48.0
47.5
MIN
SPEC LOW
47.0
46.5
Pre-rad
1E+12
1E+13
1E+14
NEUTRON FLUENCE (n/cm2)
FIGURE 20. ISL78845ASEH maximum duty cycle as a function of neutron irradiation, showing the median, minimum and maximum of the
populations at each level. Neutron fluences and sample sizes (in parentheses) were 2.2x1011n/cm2 (6 samples), 4.4x1011n/cm2
(6 samples), 6.6x1011n/cm2 (6 samples), 1x1012n/cm2 (3 samples), 1x1013n/cm2 (3 samples) and 1x1014n/cm2 (3 samples). The
SMD limit is 47% minimum.
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Discussion and conclusion
This document reports the results of neutron testing of the
ISL78845ASEH current mode PWM controller. Samples were
irradiated to levels of 2.2x1011n/cm2, 4.4x1011n/cm2,
6.6x1011n/cm2, 1x1012n/cm2, 1x1013n/cm2 and
1x1014n/cm2, with sample sizes of six each for the first three
cells and three each for the last three cells. It should again be
carefully realized when interpreting the attributes and variables
data that each neutron irradiation was performed on a different
sample; this is not total dose testing, where a single set of
samples is used and the damage is cumulative. ATE
characterization testing was performed before and after the
irradiations, and two control units were used to insure repeatable
data. Variables data for monitored parameters is presented in
Figures 1 through 20.
The current sense maximum input signal (Figure 10) showed
some degradation at the highest two neutron levels but
remained well within the SMD limits.
The current sense gain (Figure 11) showed good stability at the
lower levels but was nonfunctional after 1x1014n/cm2, with two
of the three samples failing this test.
The error amplifier reference voltage (Figure 12) showed good
stability after all neutron levels.
The error amplifier input bias current and sink current
(Figures 13 and 14) showed good stability to the 1x1013n/cm2
level but decreased significantly after 1x1014n/cm2. Both
parameters remained within the SMD limits.
The error amplifier source current (Figure 15) showed good
stability after all neutron levels.
The ISL78845ASEH is not formally designed for neutron
hardness. The part is built in a junction-isolated submicron
BiCMOS process; the bipolar transistors are minority carrier
devices, obviously, and may be expected to be sensitive to
Displacement Damage (DD) at the higher neutron levels. This
expectation turned out to be correct. We will discuss the results
on a parameter by parameter basis and then draw some
conclusions.
The error amplifier HIGH and LOW output voltages (Figures 16
and 17) showed good stability to the 1x1013n/cm2 level with
slight decreases after 1x1014n/cm2.
The Undervoltage Lockout (UVLO) START and STOP threshold
voltages (Figures 1 and 2) showed good stability after all neutron
levels.
The current sense to output delay (Figure 19) showed good
stability after all neutron levels.
The startup current, operating current and operating supply
current (Figures 3 through 5) showed excellent stability after all
neutron levels.
The reference voltage accuracy (Figure 6) showed good stability
after all neutron levels, with a gradually decreasing range at the
higher levels.
The reference sourcing and sinking current limits (Figures 7 and
8) showed excellent stability after all neutron levels.
The oscillator frequency (Figure 18) showed good stability to the
1x1013n/cm2 level but decreased significantly after
1x1014n/cm2. The parameter remained well within the SMD
limits.
The maximum duty cycle (Figure 20) showed good stability after
all neutron levels.
We conclude that the ISL78845ASEH is capable of post
1x1013n/cm2 operation (likely with some relaxation of
parametric specifications for some parameters) within the SMD
post-total dose parameters. The part is not capable of post
1x1014n/cm2 operation as it was nonfunctional, failing the
current sense gain parameter.
The current sense input bias current (Figure 9) showed good
stability to the 1x1013n/cm2 level but decreased significantly
after 1x1014n/cm2. The parameter was near the lower SMD
limit after 1x1014n/cm2.
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Appendices
TABLE 1. REPORTED PARAMETERS
FIGURE
PARAMETER
LIMIT, LOW
LIMIT, HIGH
UNIT
1
UVLO START Threshold Voltage
8
9
V
2
UVLO STOP Threshold Voltage
7.3
8
V
3
Startup Current
-
500
µA
4
Operating Current
-
4
mA
5
Operating Supply Current
-
5.5
mA
6
Reference Voltage Accuracy
4.925
5.050
V
7
Reference Current Limit, Sourcing
-20
-
mA
8
Reference Current Limit, Sinking
5
-
mA
9
Current Sense Input Bias Current
-1
1
µA
10
Current Sense Maximum Input Signal
0.97
1.03
V
11
Current Sense Gain
2.5
3.5
V/V
12
Error Amplifier Reference Voltage
2.475
2.530
V
13
Error Amplifier Input Bias Current
-1
1
µA
14
Error Amplifier Sink Current
1
-
mA
15
Error Amplifier Source Current
-0.4
-
mA
16
Error Amplifier HIGH Output Voltage
4.80
5.05
V
17
Error Amplifier LOW Output Voltage
0.4
1
V
18
Oscillator Frequency
48
53
kHz
19
Current Sense To Output Delay
-
60
ns
20
Maximum Duty Cycle
47
-
%
Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is
cautioned to verify that the document is current before proceeding.
For information regarding Intersil Corporation and its products, see www.intersil.com
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