ISL7884xASRH SEE Test Report

Test Report 005
Single Event Effects (SEE) Test Report for
ISL78843ASRH and ISL78845ASRH High Performance
Single-ended Current Mode PWM Controllers
Table of Contents
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Product Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Reference Documents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Irradiation Facility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Test Objectives . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Flux Calculation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Test Setup Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Device Block Diagram. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3
Device Pin Configurations. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3
SEE Evaluation PWB Layout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4
Schematic of SET Evaluation Board . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6
Test Setup Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Test Method . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6
Test Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7
Converter Design Considerations. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7
Details of SET Tests Performed Based on Pulse Width Captures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Details of SET Tests Performed Based on Period Captures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
SET Pulse Width Trigger Histogram Data 0.22µF, ISL78843ASRH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
SET Histograms Pulse Width Trigger 0.22µF, ISL78843ASRH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
SET Period Trigger Histogram Data 0.22µF, ISL78843ASRH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
SET Histograms Period Trigger 0.22µF, ISL78843ASRH. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
SET Pulse Width Trigger Histogram Data 0.22µF, ISL78845ASRH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
SET Histograms Pulse Width Trigger 0.22µF, ISL78845ASRH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
SET Period Trigger Histogram Data 0.22µF, ISL78845ASRH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
SET Histograms Period Trigger 0.22µF, ISL78845ASRH. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Typical Captures on Pulse Width Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
ISL78843ASRH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
ISL78845ASRH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Typical Captures on Period Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
ISL78843ASRH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
ISL78845ASRH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Details of Destructive SEB/L Tests Performed. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Binomial Estimated Cross Section for LET86 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Nondestructive Latch-up Events . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Die and Mask Number Details . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
ISL78843ASRH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
ISL78845ASRH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
SEE Test Summary/Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
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CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
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Test Report 005
Introduction
Irradiation Facility
This document describes the SEE Tests performed on
ISL78843ASRH and ISL78845ASRH in order to characterize its
Single Event Burnout (SEB), Single Event Latch-up (SEL) and
Single Event Transient (SET) sensitivity. The test facility used for
this purpose was the Cyclotron at Texas A&M Radiation Effects
Test laboratory.
• Name: TAMU
Product Description
• Location: College Station, TX
• Date: August 28, 2009
• Characteristics of the tests performed: (15Mev Beam)
• LET43: 109Ag
• LET86: 109Ag at angle 60°
The ISL7884xASRH are high performance, radiation hardened
drop-in replacements for the popular 28C4x and 18C4x PWM
controllers suitable for a wide range of power conversion
applications including boost, flyback and isolated output
configurations. Its fast signal propagation and output switching
characteristics make this an ideal product for existing and new
designs. Features include up to 13.2V operation, low operating
current, 300µA typical start-up current, adjustable switching
frequency and high peak current drive capability with 50ns rise
and fall times. The differences in the part numbers of the metal
mask variants are listed in Table 1.
TABLE 1. METAL MASK VARIANT DIFFERENCES BETWEEN PARTS
For the details on test conditions and fluence and cross sections
refer to relevant tables and plots in this report.
Test Objectives
The aim is to characterize the SEE performance of the device at
the LET levels mentioned in “Irradiation Facility”. This could be a
missed pulse or wide pulse event, occurring at a fluence of 1x106
particles/cm2 and does not contribute to an output voltage
transient of greater than +2% or less than -2%. For details on the
SEE events and type detected during the testing refer to relevant
tables and plots in this report.
Flux Calculation
RISING UVLO
MAX. DUTY CYCLE
(%)
ISL78840ASRH
7.0
100
ISL78841ASRH
7.0
50
ISL78843ASRH
8.4V
100
x is the SET cross-section (cm²), expressed as a function of the
Heavy Ion LET
ISL78845ASRH
8.4V
50
LET is the Linear Energy Transfer in MeV•cm2/mg
PART NUMBER
The cross-sections were calculated as follows: x(LET) = N/F
Where:
• Name: ISL78843ASRH and ISL78845ASRH
N is the total Number of SET/SEU
• Function: Single-ended current mode PWM controllers
F = Fluence (particles/cm2) (corrected according to the incident
angle, if any).
• Supply voltage: Minimum = 9V, typical = 12V,
maximum = 13.2V
1/F is the assumed cross-section when no event is observed.
• Supply voltage absolute maximum: 14.7V
• Package: Hermetic 8 Ld dual-in-line flatpack
Reference Documents
• Datasheet ISL7884xASRH
• ISL7884xASRH evaluation board schematic
• ISL7884xASRH evaluation board layout
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Test Setup Diagrams
Device Block Diagram
VDD
+
-
VREF
VREF
5V
START/STOP
UV COMPARATOR
ENABLE
VDD OK
VREF FAULT
+-
+
2.5V
A
4.65V
4.80V
+-
VREF
UV COMPARATOR
GND
A = 0.5
PWM
COMPARATOR
+-
CS
100mV
2R
+
-
FB
VF TOTAL = 1.15V
ERROR
AMPLIFIER
+
-
ONLY
ISL78841ASRH,
ISL78845ASRH
1.1V
CLAMP
R
Q
T
COMP
Q
OUT
S Q
36k
R Q
RESET
DOMINANT
VREF
100k
2.9V
1.0V
ON
150k
OSCILLATOR
COMPARATOR
<10ns
+
RTCT
CLOCK
8.4mA
ON
FIGURE 1. BLOCK DIAGRAM
Device Pin Configurations
COMP
1
8
VREF
FB
2
7
VDD
CS
3
6
OUT
RTCT
4
5
GND
FIGURE 2. PIN CONFIGURATION
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Test Report 005
SEE Evaluation PWB Layout
FIGURE 3. SILKSCREEN TOP
FIGURE 4. SILKSCREEN BOTTOM
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Schematic of SEB/L Evaluation Board
ISL78845ASRH
FIGURE 5. SCHEMATIC OF SEB/L EVALUATION BOARD
NOTE: SEE Evaluation board populated with the components shown in the schematic to place the device in an open loop configuration.
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Schematic of SET Evaluation Board
ISL78840ASRH
ISL78841ASRH
ISL78843ASRH
ISL78845ASRH
ISL7884XASRH
FIGURE 6. SCHEMATIC OF SET EVALUATION BOARD
NOTE: The SEE Evaluation board is populated with the components listed above to place the device in a closed loop configuration providing an output of
12V at 1A.
Test Setup Description
The SEB/L evaluation board was wired up in the open loop
configuration as shown in Figure 5 on page 5. The SET evaluation
board was wired up in the closed loop configuration as shown in
Figure 6. The overall test setup includes the test jig containing
four evaluation boards mounted and wired through a 20ft cable
to the data room. The end of the 20ft cable in the data room is
connected to a switchboard. The switchboard is wired to the
power supplies and monitoring equipment/scopes.
The biasing used for SET test runs VDD = 13.5V and that for
SEB/L tests runs were 14V/14.5V/14.7V/15V. The signals from
the switchboard were connected to three LeCroy oscilloscopes,
two set to capture transients due to pulse width change and
period change, and a third scope was set to monitor SET events
in real time.
Test Method
An SET is said to have occurred when a perturbation is detected,
this can be a change in pulse width, which can cause missing
pulses.
a. Scope 1 is set to trigger to pulse width variations of
SEBL = ±90% and SET = ±30% over the nominal value.
Measurements on Scope 1 are CH1 = OUT, CH2 = VOUT,
CH3 = RTCT, CH4 = VREF, TRIG = OUT PW.
b. Scope 2 is set to trigger to missing pulse events. This setting
triggers when two rising edges are not detected within a SEBL
= 2.25T and SET = 1.2T window. Measurements on Scope 2
CH1 = OUT, CH2 = VOUT, CH3 = RTCT, = VREF, TRIG = OUT PM.
c. Scope 3 is set to monitor events in real time only. Channels
monitored on Scope 3 CH1 = OUT, CH2 = VOUT, CH3 = RTCT,
CH4 = VREF, TRIG = VREF.
The switchboard at the end of the 20ft cabling was found to
require terminations to keep the noise on the waveforms to a
minimum. OUT and RTCT were terminated with a series
combination of 1000pF and 51Ω and the VOUT and VREF signals
with a 10nF capacitor to GND.
Since SEB/L test setup is open loop, there are no VOUT captures.
So the CH2 of the scope is not used.
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Test Overview
Converter Design Considerations
The details of the SET tests performed are summarized in
Tables 2 and 3. Waveforms for select typical conditions are
shown in Figures 15 through 30. An overall summary is provided
in “SEE Test Summary/Conclusion” on page 27.
The converter design is important for the proper evaluation of the
SEE performance under beam. In particular, one should ensure
that the magnetic components used in the design do not
saturate under wide pulse conditions. This can be made possible
by choosing the right magnetic component and appropriately
setting the pulse-by-pulse current limit thresholds. Failure to do
this can result in the observation of SEE events not related to the
device being tested.
The details of the SEB/L tests performed are summarized in
Table 8 on page 24. An overall summary is in “SEE Test
Summary/Conclusion” on page 27. Binomial estimated cross
sections are shown in Figure 31 on page 24.
Details of SET Tests Performed Based on Pulse Width Captures
TABLE 2. SET TESTS BASED ON PULSE WIDTH CAPTURES
TEST ID
DEVICE#
VDD (V)/
EFF LET
PIN 7
(cm2/mg)
ION
FLUENCE PER RUN
(PART/cm2)
TOTAL EVENTS
PW EVENT CS
(cm2)
SET +25°C LET43 CLOSED LOOP, 0.22µF, ISL78843ASRH
358
2
109Ag
13.50
43.20
1.99E+06
1709
8.59E-04
360
3
109Ag
13.50
43.20
1.99E+06
1064
5.35E-04
Sum of Fluence
3.98E+06
run per part/cm2:
Sum of Total
2773
Events:
6.97E-04
SET +25°C LET43 CLOSED LOOP, 0.22µF, ISL78845ASRH
378
21
109Ag
13.50
43.20
2.00E+06
1276
6.38E-04
381
22
109Ag
13.50
43.20
2.00E+06
1311
6.56E-04
Sum of Fluence
4.00E+06
run per part/cm2:
Sum of Total
2587
Events:
6.47E-04
NOTE: PW capture indicates that events were captured based on variations in pulse width based on settings shown in “Test Method” on page 6.
Details of SET Tests Performed Based on Period Captures
TABLE 3. SET TESTS BASED ON PERIOD CAPTURES
TEST ID
DEVICE#
ION
VDD (V)/
PIN 7
EFF LET
(cm2/mg)
FLUENCE PER RUN
(PART/cm2)
TOTAL EVENTS
EVENT CS
(cm2)
SET +25°C LET43 CLOSED, 0.22µF, ISL78843ASRH
358
2
109Ag
13.50
43.20
1.99E+06
144
7.24E-05
360
3
109Ag
13.50
43.20
1.99E+06
196
9.85E-05
Sum of Fluence
3.98E+06
run per part/cm2:
Sum Of Total
Events
340
8.54E-05
SET +25°C LET43 CLOSED, 0.22µF, ISL78845ASRH
378
21
109Ag
13.50
43.20
2.00E+06
266
1.33E-04
381
22
109Ag
13.50
43.20
2.00E+06
254
1.27E-04
Sum of Fluence
4.00E+06
run per part/cm2:
Sum Of Total
Events
520
1.30E-04
NOTE: Period capture indicates that events were captured based on variations in period of the switching waveform based on settings shown in
“Test Method” on page 6.
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SET Pulse Width Trigger Histogram Data 0.22µF, ISL78843ASRH
TABLE 4. (Continued)
TABLE 4.
BIN
FREQUENCY
TOL %
BIN
FREQUENCY
TOL %
VREF HISTOGRAM DATA FOR PULSE WIDTH TRIGGER RUNS
BIN
FREQUENCY
TOL %
BIN
FREQUENCY
TOL %
VOUT HISTOGRAM DATA FOR PULSE WIDTH TRIGGER RUNS
-3.00
0
-3.0
2.20
129
2.2
-3.00
0
-3.0
0.40
1044
0.4
-2.80
0
-2.8
2.40
193
2.4
-2.80
0
-2.8
0.60
858
0.6
-2.60
0
-2.6
2.60
215
2.6
-2.60
0
-2.6
0.80
419
0.8
-2.40
0
-2.4
2.80
137
2.8
-2.40
0
-2.4
1.00
29
1.0
-2.20
0
-2.2
3.00
112
3.0
-2.20
0
-2.2
1.20
0
1.2
-2.00
0
-2.0
3.20
81
3.2
-2.00
0
-2.0
1.40
0
1.4
-1.80
1
-1.8
3.40
60
3.4
-1.80
0
-1.8
1.60
0
1.6
-1.60
128
-1.6
3.60
40
3.6
-1.60
0
-1.6
1.80
0
1.8
-1.40
328
-1.4
3.80
58
3.8
-1.40
0
-1.4
2.00
0
2.0
-1.20
684
-1.2
4.00
50
4.0
-1.20
0
-1.2
2.20
0
2.2
-1.00
535
-1.0
4.20
73
4.2
-1.00
0
-1.0
2.40
0
2.4
-0.80
765
-0.8
4.40
56
4.4
-0.80
0
-0.8
2.60
0
2.6
-0.60
332
-0.6
4.60
47
4.6
-0.60
0
-0.6
2.80
0
2.8
-0.40
0
-0.4
4.80
42
4.8
-0.40
83
-0.4
3.00
0
3.0
-0.20
0
-0.2
5.00
28
5.0
-0.20
2637
-0.2
3.20
0
3.2
0.00
0
0.0
5.20
34
5.2
0.00
53
0.0
3.40
0
3.4
0.20
0
0.2
5.40
9
5.4
0.20
423
0.2
3.60
0
3.6
0.40
0
0.4
5.60
15
5.6
0.60
117
0.6
5.80
7
5.8
0.80
327
0.8
6.00
3
6.0
1.00
207
1.0
6.20
0
6.2
1.20
235
1.2
6.40
0
6.4
1.40
133
1.4
6.60
0
6.6
1.60
121
1.6
6.80
0
6.8
1.80
125
1.8
7.00
0
7.0
2.00
119
2.0
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Test Report 005
SET Histograms Pulse Width Trigger 0.22µF, ISL78843ASRH
900
800
700
EVENTS
600
500
400
300
200
100
0
-3
-2
-1
0
1
2
3
4
5
6
7
8
9
POSITIVE AND NEGATIVE OVERSHOOT (%)
FIGURE 7. % POSITIVE AND NEGATIVE OVERSHOOT, TOTAL EVENTS = 2773, AREA OF CS = 6.96733668341709 x 10-4 cm2
3000
2500
EVENTS
2000
1500
1000
500
0
-3
-2
-1
0
1
2
3
4
5
6
7
8
9
POSITIVE AND NEGATIVE OVERSHOOT (%)
FIGURE 8. % POSITIVE AND NEGATIVE OVERSHOOT, TOTAL EVENTS = 2773, AREA OF CS = 6.96733668341709 x 10-4 cm2
NOTE: The scope set to trigger to pulse width variations of ±30% over the nominal value. The two peaks seen represent positive and negative transients.
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Test Report 005
SET Period Trigger Histogram Data 0.22µF, ISL78843ASRH
TABLE 5. (Continued)
TABLE 5.
BIN
FREQUENCY
TOL %
BIN
FREQUENCY
TOL %
VREF HISTOGRAM DATA FOR PERIOD TRIGGER RUNS
BIN
FREQUENCY
TOL %
BIN
FREQUENCY
TOL %
VOUT HISTOGRAM DATA FOR PERIOD TRIGGER RUNS
-3.00
0
-3.0
3.20
0
3.2
-2.00
0
-2.0
0.60
0
0.6
-2.80
0
-2.8
3.40
0
3.4
-1.80
0
-1.8
0.80
57
0.8
-2.60
0
-2.6
3.60
0
3.6
-1.60
0
-1.6
1.00
21
1.0
-2.40
0
-2.4
3.80
0
3.8
-1.40
0
-1.4
1.20
0
1.2
-2.20
0
-2.2
4.00
2
4.0
-1.20
0
-1.2
1.40
0
1.4
-2.00
0
-2.0
4.20
6
4.2
-1.00
0
-1.0
1.60
0
1.6
-1.80
0
-1.8
4.40
3
4.4
-0.80
0
-0.8
1.80
0
1.8
-1.60
13
-1.6
4.60
8
4.6
-0.60
0
-0.6
2.00
0
2.0
-1.40
17
-1.4
4.80
7
4.8
-0.40
16
-0.4
2.20
0
2.2
-1.20
46
-1.2
5.00
9
5.0
-0.20
317
-0.2
2.40
0
2.4
-1.00
2
-1.0
5.20
9
5.2
0.00
7
0.0
2.60
0
2.6
-0.80
12
-0.8
5.40
12
5.4
0.20
195
0.2
2.80
0
2.8
-0.60
204
-0.6
5.60
10
5.6
0.40
67
0.4
3.00
0
3.0
-0.40
46
-0.4
5.80
11
5.8
-0.20
0
-0.2
6.00
1
6.0
0.00
0
0.0
6.20
0
6.2
0.20
0
0.2
6.40
0
6.4
0.40
0
0.4
2.20
0
2.2
0.60
47
0.6
2.40
0
2.4
0.80
51
0.8
2.60
0
2.6
1.00
102
1.0
2.80
0
2.8
1.20
62
1.2
3.00
0
3.0
1.40
0
1.4
6.60
0
6.6
1.60
0
1.6
6.80
0
6.8
1.80
0
1.8
7.00
0
7.0
2.00
0
2.0
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Test Report 005
SET Histograms Period Trigger 0.22µF, ISL78843ASRH
250
200
EVENTS
150
100
50
0
-4
-3
-2
-1
0
1
2
3
4
5
6
7
8
POSITIVE AND NEGATIVE OVERSHOOT (%)
FIGURE 9. % POSITIVE AND NEGATIVE OVERSHOOT, TOTAL EVENTS = 340, AREA OF CS = 0.85427135678392 x 10-4 cm2
350
300
EVENTS
250
200
150
100
50
0
-4
-3
-2
-1
0
1
2
3
4
5
6
7
8
POSITIVE AND NEGATIVE OVERSHOOT (%)
FIGURE 10. % POSITIVE AND NEGATIVE OVERSHOOT, TOTAL EVENTS = 340, AREA OF CS = 0.85427135678392 x 10-4 cm2
NOTE: The scope set to trigger to period, when two rising edges are not detected within a 1.2T window. The two peaks seen represent positive and
negative transients.
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Test Report 005
SET Pulse Width Trigger Histogram Data 0.22µF, ISL78845ASRH
TABLE 6. (Continued)
TABLE 6.
BIN
FREQUENCY
TOL %
BIN
FREQUENCY
TOL %
VREF HISTOGRAM DATA FOR PULSE WIDTH TRIGGER RUNS
BIN
FREQUENCY
TOL %
BIN
FREQUENCY
TOL %
VOUT HISTOGRAM DATA FOR PULSE WIDTH TRIGGER RUNS
-3.00
0
-3.0
2.20
156
2.2
-3.00
0
-3.0
0.20
11
0.2
-2.80
0
-2.8
2.40
247
2.4
-2.80
0
-2.8
0.40
1206
0.4
-2.60
0
-2.6
2.60
315
2.6
-2.60
0
-2.6
0.60
1042
0.6
-2.40
0
-2.4
2.80
268
2.8
-2.40
0
-2.4
0.80
327
0.8
-2.20
0
-2.2
3.00
130
3.0
-2.20
0
-2.2
1.00
1
1.0
-2.00
0
-2.0
3.20
94
3.2
-2.00
0
-2.0
1.20
0
1.2
-1.80
23
-1.8
3.40
72
3.4
-1.80
0
-1.8
1.40
0
1.4
-1.60
279
-1.6
3.60
63
3.6
-1.60
0
-1.6
1.60
0
1.6
-1.40
487
-1.4
3.80
57
3.8
-1.40
0
-1.4
1.80
0
1.8
-1.20
701
-1.2
4.00
58
4.0
-1.20
0
-1.2
2.00
0
2.0
-1.00
705
-1.0
4.20
73
4.2
-1.00
0
-1.0
2.20
0
2.2
-0.80
153
-0.8
4.40
107
4.4
-0.80
0
-0.8
2.40
0
2.4
-0.60
239
-0.6
4.60
97
4.6
-0.60
0
-0.6
2.60
0
2.6
-0.40
0
-0.4
4.80
59
4.8
-0.40
32
-0.4
2.80
0
2.8
-0.20
0
-0.2
5.00
84
5.0
-0.20
2549
-0.2
3.00
0
3.0
0.00
0
0.0
5.20
39
5.2
0.00
6
0.0
0.20
0
0.2
5.40
53
5.4
0.40
0
0.4
5.60
44
5.6
0.60
49
0.6
5.80
30
5.8
0.80
152
0.8
6.00
8
6.0
1.00
99
1.0
6.20
2
6.2
1.20
36
1.2
6.40
0
6.4
1.40
13
1.4
6.60
0
6.6
1.60
17
1.6
6.80
0
6.8
1.80
52
1.8
7.00
0
7.0
2.00
113
2.0
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Test Report 005
SET Histograms Pulse Width Trigger 0.22µF, ISL78845ASRH
800
700
600
EVENTS
500
400
300
200
100
0
-3
-2
-1
0
1
2
3
4
5
6
7
8
9
POSITIVE AND NEGATIVE OVERSHOOT (%)
FIGURE 11. % POSITIVE AND NEGATIVE OVERSHOOT, TOTAL EVENTS = 2587, AREA OF CS = 6.5 x 10-4 cm2
3000
2500
EVENTS
2000
1500
1000
500
0
-3
-2
-1
0
1
2
3
4
5
6
7
8
9
POSITIVE AND NEGATIVE OVERSHOOT (%)
FIGURE 12. % POSITIVE AND NEGATIVE OVERSHOOT, TOTAL EVENTS = 2587, AREA OF CS = 6.5x10-4 cm2
NOTE: The scope set to trigger to pulse width variations of ±30% over the nominal value. The two peaks seen represent positive and negative transients
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Test Report 005
SET Period Trigger Histogram Data 0.22µF, ISL78845ASRH
TABLE 7. (Continued)
TABLE 7.
BIN
FREQUENCY
TOL %
BIN
FREQUENCY
TOL %
VREF HISTOGRAM DATA FOR PERIOD TRIGGER RUNS
BIN
FREQUENCY
TOL %
BIN
FREQUENCY
TOL %
VOUT HISTOGRAM DATA FOR PERIOD TRIGGER RUNS
-2.00
0
-2.0
0.60
166
0.6
-1.00
0
-1.0
0.60
0
0.6
-1.90
0
-1.9
0.70
74
0.7
-0.90
0
-0.9
0.70
0
0.7
-1.80
0
-1.8
0.80
98
0.8
-0.80
0
-0.8
0.80
2
0.8
-1.70
1
-1.7
0.90
14
0.9
-0.70
0
-0.7
0.90
0
0.9
-1.60
1
-1.6
1.00
75
1.0
-0.60
0
-0.6
1.00
0
1.0
-1.50
0
-1.5
1.10
71
1.1
-0.50
0
-0.5
1.10
0
1.1
-1.40
0
-1.4
1.20
18
1.2
-0.40
2
-0.4
1.20
0
1.2
-1.30
0
-1.3
1.30
1
1.3
-0.30
126
-0.3
1.30
0
1.3
-1.20
0
-1.2
1.40
0
1.4
-0.20
367
-0.2
1.40
0
1.4
-1.10
0
-1.1
1.50
0
1.5
-0.10
25
-0.1
1.50
0
1.5
-1.00
2
-1.0
1.60
0
1.6
0.00
0
0.0
1.60
0
1.6
-0.90
37
-0.9
1.70
0
1.7
0.10
0
0.1
1.70
0
1.7
-0.80
63
-0.8
1.80
0
1.8
0.20
126
0.2
1.80
0
1.8
-0.70
166
-0.7
1.90
0
1.9
0.30
392
0.3
1.90
0
1.9
-0.60
222
-0.6
2.00
0
2.0
0.40
0
0.4
2.00
0
2.0
-0.50
28
-0.5
2.10
0
2.1
0.50
0
0.5
-0.40
0
-0.4
2.20
0
2.2
-0.30
0
-0.3
2.30
0
2.3
-0.20
0
-0.2
2.40
0
2.4
-0.10
0
-0.1
2.50
0
2.5
0.00
0
0.0
2.60
0
2.6
0.10
0
0.1
2.70
0
2.7
0.20
0
0.2
2.80
0
2.8
0.30
0
0.3
2.90
0
2.9
0.40
0
0.4
3.00
0
3.0
0.50
1
0.5
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Test Report 005
SET Histograms Period Trigger 0.22µF, ISL78845ASRH
250
200
EVENTS
150
100
50
0
-2
-1
0
1
2
3
4
5
6
7
8
POSITIVE AND NEGATIVE OVERSHOOT (%)
FIGURE 13. % POSITIVE AND NEGATIVE OVERSHOOT, TOTAL EVENTS = 520, AREA OF CS = 1.30653266331658 x 10-4 cm2
450
400
350
EVENTS
300
250
200
150
100
50
0
-2
-1
0
1
2
3
4
5
6
7
8
POSITIVE AND NEGATIVE OVERSHOOT (%)
FIGURE 14. % POSITIVE AND NEGATIVE OVERSHOOT, TOTAL EVENTS = 520, AREA OF CS = 1.30653266331658 x 10-4 cm2
NOTE: The scope set to trigger to period, when two rising edges are not detected within a 1.2T window. The two peaks seen represent positive and
negative transients.
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Test Report 005
Typical Captures on Pulse Width Trigger
ISL78843ASRH
FIGURE 15. SET +25°C LET43 CLOSED, 0.22µF, VREF POSITIVE TRANSIENT
FIGURE 16. SET +25°C LET43 CLOSED, 0.22µF, VOUT POSITIVE TRANSIENT
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ISL78843ASRH (Continued)
FIGURE 17. SET +25°C LET43 CLOSED, 0.22µF, VREF NEGATIVE TRANSIENT
FIGURE 18. SET +25°C LET43 CLOSED, 0.22µF, VOUT NEGATIVE TRANSIENT
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Test Report 005
ISL78845ASRH
FIGURE 19. SET +25°C LET43 CLOSED, 0.22µF, VREF POSITIVE TRANSIENT
FIGURE 20. SET +25°C LET43 CLOSED, 0.22µF, VOUT POSITIVE TRANSIENT/OUT WIDE FOLLOWED BY NARROW PULSES
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ISL78845ASRH
(Continued)
FIGURE 21. SET +25°C LET43 CLOSED, 0.22µF, VREF NEGATIVE TRANSIENT
FIGURE 22. SET +25°C LET43 CLOSED, 0.22µF, VOUT NEGATIVE TRANSIENT/OUT NARROW PULSE
NOTE: Worst case transient waveforms shown. For a distribution on the transients on VREF and VOUT refer to histograms on pages 8 through 15.
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Typical Captures on Period Trigger
ISL78843ASRH
FIGURE 23. SET +25°C LET43 CLOSED, 0.22µF, VREF NO TRANSIENT
FIGURE 24. SET +25°C LET43 CLOSED, 0.22µF, VOUT NEGATIVE TRANSIENT/OUT PULSE MISS
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ISL78843ASRH (Continued)
FIGURE 25. SET +25°C LET43 CLOSED, 0.22µF, VREF POSITIVE TRANSIENT
FIGURE 26. SET +25°C LET43 CLOSED, 0.22µF, VOUT POSITIVE TRANSIENT/OUT PULSE MISS
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Test Report 005
ISL78845ASRH
FIGURE 27. SET +25°C LET43 CLOSED, 0.22µF, VREF POSITIVE TRANSIENT
FIGURE 28. SET +25°C LET43 CLOSED, 0.22µF, VOUT POSITIVE TRANSIENT/OUT PULSE MISS
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Test Report 005
ISL78845ASRH
(Continued)
FIGURE 29. SET +25°C LET43 CLOSED, 0.22µF, RTCT/VREF TRANSIENT
FIGURE 30. SET +25°C LET43 CLOSED, 0.22µF, VOUT NEGATIVE TRANSIENT/OUT PULSE MISS
NOTE: Worst case transient waveforms shown. For a distribution on the transients on VREF and VOUT refer to histograms on pages 9 through 15.
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Test Report 005
Details of Destructive SEB/L Tests Performed
TABLE 8. DESTRUCTIVE SEB/L TESTS
CUMULATIVE
CROSS SECTION
(cm2)
TEMP
(°C)
LET Mev
(mg/cm2)
VREF CAP
(µF)
VDD
(V)
+125
86
0.22
14.7
0
9.98E+06
1.00E-07
1
PASS
+125
86
0.22
14.7
0
9.98E+06
1.00E-07
1
PASS
+125
86
0.22
14.7
0
1.00E+07
1.00E-07
1
PASS
+125
86
0.22
14.7
0
9.98E+06
1.00E-07
1
PASS
2.50E-08
Total 4
Units:
LATCH EVENTS
Total
Events:
0
CUMULATIVE FLUENCE
(PARTICLES/cm2)
Overall
Fluence:
Overall
CS:
3.99E+07
UNITS
SEB/L
NOTE: SEB/L tests were performed on the ISL78843ASRH, which is a metal mask variant of the ISL7884xASRH family of devices. The differences
between the variants are listed in “Test Setup Diagrams” on page 3 under part details.
TABLE 9. SUBSEQUENT SEB TESTING RESULTS IN NOVEMBER AND DECEMBER, 2014
TEMP
(ºC)
LET (MeV-cm2/mg)
AND ANGLE
VREF CAP
(µF)
VDD
(V)
TOTAL FLUENCE
(ions/cm2)
NET CROSS SECTION
(cm2)
UNITS
TESTED
SEB
+125
860º
0.22
13.5
1.6x107
6.25x10-8
8
PASS
+125
4360º
0.22
14.4
1.6x107
6.25x10-8
8
PASS
Binomial Estimated Cross
Section for LET86
1.0
NORMALIZED PROBABILITY DENSITY
Subsequent SEB testing in November and December of 2014
yielded the results (shown in Table 9) off of two new production
lots. SEB failures occurred above the VDD limits cited in Table 9.
The results are marginally worse than the original
characterization above which used LET = 43 MeV•cm2/mg at
60° incidence for an effective LET of 86 MeV•cm2/mg.
0.9
EVENTS/
CREF FLUENCE UNITS
0.8
TCASE
0.7
+125°C 14.7V LET 86 0.22µF
VIN
LET
0/4.0E7
4
0.6
0.5
0.4
0.3
0.2
0.1
0
0.0E+00
0.0E-07
1.0E-06
FIGURE 31. BINOMIAL ESTIMATED CROSS SECTION FOR
DESTRUCTIVE SEL (cm2)
NOTE: During the Single Event Latch-up testing of the four devices, no
destructive latch-up events were observed at a total fluence of 3.99x107
particles/cm2. The above chart aims at estimating the area of cross section
for destructive Single Event Latch-up that provides for a 99% confidence
level. This turns out to be 1.2x10-7 cm2.
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Test Report 005
Nondestructive Latch-up Events
latch-off state and a power cycle is needed to return to normal
operation. The soft latch causes no damage to the device,
indicated by no increase in operating current after restart. Full
details are presented in Table 10.
Further SEL/B testing of the ISL78843ASRH and ISL78845ASRH
conducted in May 2014 demonstrated that the DUTs experienced
a disruption to normal operation (shutdown), which requires
manual intervention to restart. Previously reported momentary
disruptions or SEFIs have been identified incorrectly as such due
to the accelerated nature of single event effect testing. A new
test approach, in which the ion beam was stopped after the DUT
shuts down, proves that the device enters a nondestructive
Additional latch-up testing was done in a closed loop
configuration at a lower input voltage and temperature. The
device was verified to experience the nondestructive latch-ups.
Details of the test is summarized in Table 11.
TABLE 10.
PART NUMBER
IDD
PREEXPOSURE
(mA)
LATCH
EVENTS
IDD
POSTEXPOSURE
(mA)
FLUENCE
(PARTICLES/cm2)
CROSS
SECTION
(cm2)
UNIT
ID
14.7
ISL78843ASRH
10
15
10
1.00E+07
1.50E-06
1
0.22
14.7
ISL78845ASRH
10
12
10
1.00E+07
1.20E-06
2
60
0.22
14.7
ISL78843ASRH
10
3
10
1.00E+07
3.00E-07
1
+125
60
0.22
14.7
ISL78845ASRH
10
1
10
1.00E+07
1.00E-07
2
+125
43
0.22
14.7
ISL78843ASRH
10
0
10
1.00E+07
1.00E-07
1
+125
43
0.22
14.7
ISL78845ASRH
10
0
10
1.00E+07
1.00E-07
2
TEMP
(°C)
LET
(Mev mg/cm2)
VREF
CAP
(µF)
VDD
(V)
+125
86
0.22
+125
86
+125
TABLE 11.
TEMP
(°C)
LET
(Mev mg/cm2)
+45
86
VREF
CAP VDD
(µF) (V)
0.22
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PART
NUMBER
13 ISL78840ASRH
25
IDD
IDD
PREEXPOSURE LATCH POSTEXPOSURE
(mA)
EVENTS
(mA)
33
14
33
FLUENCE
(PARTICLES/cm2)
2.00E+07
CROSS
SECTION VIN VOUT
(cm2)
(V)
(V)
7.00E-07
24
12
IOUT
(A)
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Test Report 005
Die and Mask Number Details
ISL78843ASRH
FIGURE 32. DIE MAP
FIGURE 33. MASK NUMBER
FIGURE 34. DIE MAP
FIGURE 35. MASK NUMBER
ISL78845ASRH
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Test Report 005
SEE Test Summary/Conclusion
Single Event Burnout/Latch-up: No Single Event Burnout (SEB)
was observed for the device up to an LET value of
86 MeV•cm2/mg (+125°C) and VDD ≤ 13.5V. No destructive
Single Event Latch-up (SEL) events were observed for the device
up to an LET value of 86 MeV•cm2/mg (+125°C, VREF
CAP = 0.22µF). A destructive event occurs when the supply
current of the device increases greater than 5% as indicated in
Notes 3 and 4. Nondestructive latch-up events that shut down
part operation and required a power cycle to restore the part to
pre-event operation were observed and are described in section
“Nondestructive Latch-up Events” on page 25
Single Event Transient: The device, however, is sensitive to soft
errors with a LET threshold around 43 MeV•cm2/mg. No soft
error was observed which caused more than one PWM output
pulse dropout at LET value of 43 MeV.cm2/mg.
Table 12 provides an overall summary of the SEE tests results.
TABLE 12. OVERALL SUMMARY OF THE SEE TESTS RESULTS
MISSED MISSED
LET
PULSES PULSES TEMP
(MAX)
(ºC) (Note 2)
(TYP)
TEST
UNITS
REMARKS
SEB/L
--
--
+125
86
MeV•cm2/mg No destructive single event burnouts or destructive latch-up events occurred up to
VDD = 13.5V using gold at 86 MeV•cm2/mg and 0° incidence, at a fluence of 1.6E+7
particles/cm2 (Notes 3, 4, 5)
SEB/L
--
--
+125
86
MeV•cm2/mg No destructive single event burnouts or destructive latch-up events occurred up to
VDD = 14.4V using silver at 43 MeV-cm2/mg and 60° incidence, at a fluence of 1.6E+7
particles/cm2 (Notes 3, 4, 5)
SET
1
--
+25
43
MeV•cm2/mg VDD = 13.5V
NOTES:
1. LET86 was achieved by using a LET43 beam and rotating the test sample by 60°.
2. SEE tests performed at a switching frequency of 200kHz, RT = 17.8k, CT = 390pF for ISL78843ASRH and CT = 220pF for ISL78845ASRH. SEB/L test
done in a standalone open loop configuration and the SET tests a closed loop configuration.
3. SEB is said to have occurred if an increase in the IDD of greater than 5% is measured after exposure to the beam. A 0.22µF capacitor was connected
from the VREF pin to GND for the purpose of bypass.
4. SEL results: No destructive latch-up conditions were observed, a destructive SEL is categorized by an increase in the IDD current greater than 5% after
exposure. A 0.22µF capacitor was used from VREF pin to GND for bypass.
5. The recommended highest operating VDD for the device is 13.2V, which is below the Single Event Breakdown survival voltage of 13.5V for normal
incidence LET = 86 MeV•cm2/mg.
6. The acronym “SEB/L” in this report is used to refer to Single Effect Burnout and Latch-up.
7. The acronym “SET” in this report is used to refer to Single Event Transient.
Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is
cautioned to verify that the document is current before proceeding.
For information regarding Intersil Corporation and its products, see www.intersil.com
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TR005.0
May 15, 2015