k12729-010k kird1129e

Two-color detector
K12729-010K
Wide spectral response range: 0.9 to 2.55 μm
Compact ceramic package
The K12729-010K is a two-color detector in a compact ceramic package, covering a wide spectral response range. Like the
current K11908-010K, it incorporates two InGaAs PIN photodiodes with different spectral response, along the same optical
axis. It features low noise and low dark current and supports reflow soldering.
Features
Applications
Wide spectral response range
Spectrophotometers
Compact, low noise, low dark current
Radiation thermometers
Supports reflow soldering
Structure
Parameter
Window material
Package
Photosensitive area
Symbol
-
Condition
Specification
Borosilicate glass
Ceramic
2.4 × 2.4
ϕ1.0
InGaAs (λc=1.7 μm)
InGaAs (λc=2.55 μm)
Unit
mm
Absolute maximum ratings
Parameter
Symbol
Condition
Value
Unit
InGaAs (λc=1.7 μm), Ta=25 °C
2
Reverse voltage
VR max
V
InGaAs (λc=2.55 μm), Ta=25 °C
1
Operating temperature
Topr
No condensation
-20 to +70
°C
Storage temperature
Tstg
No condensation
-20 to +85
°C
Note: Exceeding the absolute maximum ratings even momentarily may cause a drop in product quality. Always be sure to use the
product within the absolute maximum ratings.
Electrical and optical characteristics (Ta=25 °C)
Parameter
Spectral response
range
Peak sensitivity
wavelength
Symbol
λ
λp
Photosensitivity
S
Dark current
ID
Cutoff frequency
fc
Terminal capacitance
Ct
Shunt resistance
Rsh
Detectivity
D*
Condition
InGaAs (λc=1.7 μm)
InGaAs (λc=2.55 μm)
InGaAs (λc=1.7 μm)
InGaAs (λc=2.55 μm)
InGaAs (λc=1.7 μm), λ=λp
InGaAs (λc=2.55 μm), λ=λp
InGaAs (λc=1.7 μm), VR=10 mV
InGaAs (λc=2.55 μm), VR=10 mV
InGaAs (λc=1.7 μm), -3 dB
VR=0 V, RL=50 Ω
InGaAs (λc=2.55 μm), -3 dB
VR=0 V, RL=50 Ω
InGaAs (λc=1.7 μm), VR=0 V, f=1 MHz
InGaAs (λc=2.55 μm), VR=0 V, f=1 MHz
InGaAs (λc=1.7 μm), VR=10 mV
InGaAs (λc=2.55 μm), VR=10 mV
InGaAs (λc=1.7 μm), λ=λp
InGaAs (λc=2.55 μm), λ=λp
Min.
0.85
0.7
-
Typ.
0.9 to 1.7
1.7 to 2.55
1.55
2.1
0.95
1.0
1
0.7
Max.
10
3.5
1
2
-
2
6
-
1
2.8
1 × 1012
2 × 1010
1.5
0.5
10
14
5 × 1012
7 × 1010
2.5
1
-
Unit
μm
μm
A/W
nA
μA
MHz
www.hamamatsu.com
nF
MΩ
kΩ
cm∙Hz1/2/W
1
Two-color detector
K12729-010K
Spectral response
Spectral transmittance of window material
(Typ. Ta=25 °C)
1.2
(Typ. Ta=25 °C)
100
98
96
Transmittance (%)
Photosensitivity (A/W)
1.0
0.8
InGaAs (λc=2.55 μm)
0.6
0.4
InGaAs (λc=1.7 μm)
94
92
90
88
86
84
0.2
82
0
0.9 1.0 1.1 1.2 1.3 1.4 1.5 1.6 1.7 1.8 1.9 2.0 2.1 2.2 2.3 2.4 2.5 2.6
80
0.9 1.0 1.1 1.2 1.3 1.4 1.5 1.6 1.7 1.8 1.9 2.0 2.1 2.2 2.3 2.4 2.5 2.6
Wavelength (μm)
Wavelength (μm)
KIRDB0479EB
KIRDB0606EA
Dark current vs. reverse voltage
(Typ. VR=0 V, Ta=15 to 65 °C)
2.0
(Typ. Ta=25 °C)
1 mA
1.5
100 μA
InGaAs (λc=1.7 μm)
1.0
10 μA
0.5
Dark current
Temperature coefficient of sensitivity (%/°C)
Temperature characteristics of sensitivity
0
-0.5
InGaAs (λc=2.55 μm)
InGaAs (λc=2.55 μm)
1 μA
100 nA
InGaAs (λc=1.7 μm)
10 nA
-1.0
1 nA
-1.5
-2.0
0.9 1.0 1.1 1.2 1.3 1.4 1.5 1.6 1.7 1.8 1.9 2.0 2.1 2.2 2.3 2.4 2.5 2.6
100 pA
0.01
0.1
1
10
Reverse voltage (V)
Wavelength (μm)
KIRDB0495EB
KIRDB0603EA
2
Two-color detector
K12729-010K
Terminal capacitance vs. reverse voltage
Shunt resistance vs. element temperature
(Typ. Ta=25 °C, f=1 MHz)
10 nF
(Typ. VR=10 mV)
10 GΩ
1 GΩ
InGaAs (λc=1.7 μm)
100 MΩ
1 nF
Shunt resistance
Terminal capacitance
InGaAs (λc=1.7 μm)
100 pF
10 MΩ
1 MΩ
100 kΩ
10 kΩ
InGaAs (λc=2.55 μm)
InGaAs (λc=2.55 μm)
1 kΩ
100 Ω
10 pF
0.001
0.01
0.1
1
10
10 Ω
-20
0
20
40
60
80
Element temperature (°C)
Reverse voltage (V)
KIRDB0604EA
KIRDB0605EA
Dimensional outline (unit: mm)
6.6
2.5
± 0.2
3.3
2.5
2.4
Photosensitive area
InGaAs (λc=1.7 μm)
Window
Ž


0.9
1.6
8.0
2.4
± 0.1
7.0
Photosensitive area
InGaAs (λ=2.5 μm)
(0.07)
± 0.15
8.0
0.8
Index mark
Recommended land mark pattern (unit: mm)
Œ
0.5
2.0 ± 0.2
Ž
3.3
2.5
KIRDC0121EA
ΠCathode
(InGaAs, λc=1.7 μm)
Anode
(InGaAs, λc=1.7 μm)
Ž Cathode
(InGaAs, λc=2.55 μm)
Œ
2.5 ± 0.2
0.5 ± 0.1
2.0 ± 0.2

2.4 ± 0.3
0.7 ± 0.1
3.7 ± 0.2
2.0 ± 0.2
2.0 ± 0.2
1.4 ± 0.2
8.0
2.5
Anode

(InGaAs, λc=2.55 μm)
(0.15)
Center position accuracy of
photosensitive area
-0.3≤X≤+0.3
-0.3≤Y≤+0.3
KIRDA0244EA
3
Two-color detector
K12729-010K
Measured example of temperature profile with our hot-air reflow oven for product testing
300
260 °C max
Temperature (°C)
250
200
150
100
50
0
0
50 100 150 200 250 300 350 400 450 500 550
Time (s)
KIRDC0122EA
∙ After unpacking, store the device in an environment at a temperature range of 5 to 30 °C and a humidity of 60% or less, and perform
reflow soldering within 4 weeks.
∙ The thermal stress applied to the device during reflow soldering varies depending on the circuit board and the reflow oven that is
used.
∙ When setting the reflow conditions, verify that the reliability of the device is not compromised by the reflow soldering process.
4
Two-color detector
K12729-010K
Related information
www.hamamatsu.com/sp/ssd/doc_en.html
Precautions
∙ Notice
∙ Metal, ceramic, plastic packages
Technical information
∙ Infrared detector / Technical information
Information described in this material is current as of August, 2014.
Product specifications are subject to change without prior notice due to improvements or other reasons. This document has been carefully prepared and the
information contained is believed to be accurate. In rare cases, however, there may be inaccuracies such as text errors. Before using these products, always
contact us for the delivery specification sheet to check the latest specifications.
The product warranty is valid for one year after delivery and is limited to product repair or replacement for defects discovered and reported to us within that
one year period. However, even if within the warranty period we accept absolutely no liability for any loss caused by natural disasters or improper product use.
Copying or reprinting the contents described in this material in whole or in part is prohibited without our prior permission.
www.hamamatsu.com
HAMAMATSU PHOTONICS K.K., Solid State Division
1126-1 Ichino-cho, Higashi-ku, Hamamatsu City, 435-8558 Japan, Telephone: (81) 53-434-3311, Fax: (81) 53-434-5184
U.S.A.: Hamamatsu Corporation: 360 Foothill Road, Bridgewater, N.J. 08807, U.S.A., Telephone: (1) 908-231-0960, Fax: (1) 908-231-1218
Germany: Hamamatsu Photonics Deutschland GmbH: Arzbergerstr. 10, D-82211 Herrsching am Ammersee, Germany, Telephone: (49) 8152-375-0, Fax: (49) 8152-265-8
France: Hamamatsu Photonics France S.A.R.L.: 19, Rue du Saule Trapu, Parc du Moulin de Massy, 91882 Massy Cedex, France, Telephone: 33-(1) 69 53 71 00, Fax: 33-(1) 69 53 71 10
United Kingdom: Hamamatsu Photonics UK Limited: 2 Howard Court, 10 Tewin Road, Welwyn Garden City, Hertfordshire AL7 1BW, United Kingdom, Telephone: (44) 1707-294888, Fax: (44) 1707-325777
North Europe: Hamamatsu Photonics Norden AB: Torshamnsgatan 35 16440 Kista, Sweden, Telephone: (46) 8-509-031-00, Fax: (46) 8-509-031-01
Italy: Hamamatsu Photonics Italia S.r.l.: Strada della Moia, 1 int. 6, 20020 Arese (Milano), Italy, Telephone: (39) 02-93581733, Fax: (39) 02-93581741
China: Hamamatsu Photonics (China) Co., Ltd.: B1201, Jiaming Center, No.27 Dongsanhuan Beilu, Chaoyang District, Beijing 100020, China, Telephone: (86) 10-6586-6006, Fax: (86) 10-6586-2866
Cat. No. KIRD1129E01 Aug. 2014 DN
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