5962-7900901VCA

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
E
Add case 2. Change CAGE code to 67268. Add VCC to test conditions for
table I. Editorial changes throughout.
89-05-18
M. A. FRYE
F
Drawing updated to reflect current requirements. Editorial changes throughout.
–drw.
00-11-17
Raymond Monnin
G
Make correction to marking paragraph 3.5. -rrp
05-05-04
Raymond Monnin
H
Add device class V. -rrp
07-08-28
Robert M. Heber
CURRENT CAGE CODE 67268
THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED.
REV
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SHEET
REV STATUS
REV
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OF SHEETS
SHEET
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PMIC N/A
PREPARED BY
William E. Shoup
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
CHECKED BY
C. R. Jackson
APPROVED BY
N. A. HAUCK
MICROCIRCUIT, LINEAR, DUAL, DIFFERENTIAL
LINE DRIVER, MONOLITHIC SILICON
DRAWING APPROVAL DATE
79-04-12
AMSC N/A
REVISION LEVEL
H
SIZE
CAGE CODE
A
14933
SHEET
DSCC FORM 2233
APR 97
1 OF
79009
12
5962-E573-07
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)
and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or
Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
1.2 PIN. The PIN is as shown in the following examples.
For device classes M and Q:
79009
01
C
A
Drawing number
Device type
(see 1.2.2)
Case outline
(see 1.2.4)
Lead finish
(see 1.2.5)
For device class V:
5962
-
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
79009
01
V
C
A
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A
specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
Generic number
Circuit function
55183, 7830
Dual, differential line driver
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed
below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q
designators will not be included in the PIN and will not be marked on the device.
Device class
M
Q or V
Device requirements documentation
Vendor self-certification to the requirements for MIL-STD-883 compliant, nonJAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A
Certification and qualification to MIL-PRF-38535
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
79009
A
REVISION LEVEL
H
SHEET
2
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
A
C
D
2
Descriptive designator
Terminals
GDFP5-F14 or CDFP6-F14
GDIP1-T14 or CDIP2-T14
GDFP1-F14 or CDFP2-F14
CQCC1-N20
14
14
14
20
Package style
Flat pack
Dual-in-line
Flat pack
Square leadless chip carrier
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,
appendix A for device class M.
1.3 Absolute maximum ratings. 1/
Supply voltage (VCC) 2/ ......................................................
Input voltage........................................................................
Output short circuit duration 3/...........................................
Lead temperature (soldering 10 seconds)...........................
Storage temperature range.................................................
Power dissipation (PD) ........................................................
Thermal resistance, junction to case (θJC): .........................
Junction temperature (TJ) ...................................................
7.0 V dc
5.5 V dc
1 second
300°C
-65°C to +150°C
600 mW 4/ 5/
See MIL-STD-1835
150°C
1.4 Recommended operating conditions.
Supply voltage (VCC) ............................................................
High level output current (IOH) ..............................................
Low level output current (IOL) ...............................................
Ambient operating temperature range (TA) ...........................
4.5 V dc to 5.5 V dc
-40 mA maximum
40 mA maximum
-55°C to +125°C
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 MIL-STD-1835 -
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 MIL-HDBK-780 -
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from the
Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
1/
2/
3/
4/
5/
Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
All voltage values, except differential voltages, are with respect to network ground terminal.
At +125°C not more than one output should be shorted to ground at a time.
Derate 10.4 mW/°C above TA = 90°C.
Must withstand the added PD due to short circuit test, e.g., IOS.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
79009
A
REVISION LEVEL
H
SHEET
3
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in
MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Voltage waveforms and test circuit. The voltage waveforms and test circuit shall be as specified on figure 2.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this
drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and
herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2
herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the
option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 53 (see MIL-PRF-38535, appendix A).
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
79009
A
REVISION LEVEL
H
SHEET
4
TABLE I. Electrical performance characteristics.
Conditions
Test
Symbol
-55°C ≤ TA ≤+125°C
Group A
subgroups
4.5 V ≤ VCC ≤ 5.5 V
unless otherwise specified
Device
type
Min
High level input voltage
VIH
1, 2, 3
All
Low level input voltage
VIL
1, 2, 3
All
High level output voltage
(Y output)
VOH
1, 2, 3
All
VIH = 2.0 V
IOH = -0.8 mA
VIL = 0.8 V, IOL = 40 mA
1, 2, 3
All
VOH
VIL = 0.8 V
1, 2, 3
All
High level input current
IIH
V
0.8
V
2.4
V
IOH = -0.8 mA
0.4
V
2.4
IOH = -40 mA
VOL
Max
1.8
VOL
Low level output voltage
(Z output)
Unit
2.0
IOH = -40 mA
Low level output voltage (Y
output)
High level output voltage
(Z output)
Limits
V
1.8
VIH = 2.0 V, IOL = 40 mA
1, 2, 3
All
0.5
V
VIH = 2.4 V
1, 2, 3
All
120
μA
2
mA
-4.8
mA
-120
mA
18
mA
VIH = 5.5 V
Low level input current
IIL
VIL = 0.4 V
Short circuit output current
IOS
VCC = 5 V, TA = +125°C
Supply current
(average per driver)
ICC
VCC = 5 V
1, 2, 3
All
2
All
1, 2, 3
All
-40
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
79009
A
REVISION LEVEL
H
SHEET
5
TABLE I. Electrical performance characteristics – Continued.
Conditions
Test
-55°C ≤ TA ≤+125°C
Symbol
Group A
subgroups
4.5 V ≤ VCC ≤ 5.5 V
unless otherwise specified
Propagation delay time
low to high (Y output) 1/
tPLH1
Device
type
Min
CL = 15 pF, VCC = 5.0 V
9
All
tPHL1
CL = 15 pF, VCC = 5.0 V
9
tPLH2
CL = 15 pF, VCC = 5.0 V
All
9
tPHL2
CL = 15 pF, VCC = 5.0 V
12
ns
17
All
8
10, 11 2/
1/
2/
ns
25
All
9
ns
18
10, 11 2/
Propagation delay time
high to low (Z output) 1/
Max
17
10, 11 2/
Propagation delay time
low to high (Z output) 1/
Unit
12
10, 11 2/
Propagation delay time
high to low (Y output) 1/
Limits
ns
11
Propagation delay time
low to high (differential
output) 1/
tPLH3
RL = 100 Ω, CL = 5000 pF,
(Y output with respect to Z
output), TA = +25°C
9
All
16
ns
Propagation delay time
high to low (differential
output) 1/
tPHL3
RL = 100 Ω, CL = 5000 pF,
(Y output with respect to Z
output), TA = +25°C
9
All
16
ns
See figure 2.
Guaranteed, if not tested, to the limits specified.
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a.
Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015.
(2) TA = +125°C, minimum.
b.
Interim and final electrical test parameters shall be as specified in table IIA herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
79009
A
REVISION LEVEL
H
SHEET
6
Device type
Case outline
Terminal number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
All
A, C, and D
2
Terminal symbol
1A
NC
1B
1A
1C
1B
1D
1C
1Y
NC
1Z
1D
GND
NC
2Z
1Y
2Y
1Z
2A
GND
2B
NC
2C
2Z
2D
2Y
VCC
2A
---NC
---2B
---NC
---2C
---2D
---VCC
FIGURE 1. Terminal connections.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
79009
A
REVISION LEVEL
H
SHEET
7
NOTES:
1. The pulse generator has the following characteristics:
ZO = 50 Ω, tf = 10 ns, PRR = 1 MHz, tr = 10 ns, tw = 0.5 μs.
2. CL includes probe and jig capacitance.
FIGURE 2. Voltage waveforms and test circuit.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
79009
A
REVISION LEVEL
H
SHEET
8
NOTES:
1. The pulse generator has the following characteristics:
ZO = 50 Ω, tf = 10 ns, PRR = 1 MHz, tr = 10 ns, tw = 0.5 μs.
2. CL includes probe and jig capacitance.
FIGURE 2. Voltage waveforms and test circuit – Continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
79009
A
REVISION LEVEL
H
SHEET
9
4.2.2 Additional criteria for device classes Q and V.
a.
The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
b.
Interim and final electrical test parameters shall be as specified in table IIA herein.
c.
Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device
class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for
device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a.
Tests shall be as specified in table IIA herein.
b.
Subgroups 4, 5, 6, 7, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a.
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
b.
TA = +125°C, minimum.
c.
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD883.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
79009
A
REVISION LEVEL
H
SHEET
10
TABLE IIA. Electrical test requirements.
Test requirements
Interim electrical
parameters (see 4.2)
Final electrical
parameters (see 4.2)
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Device
class M
1
1
1
1, 2, 3, 9 1/
1, 2, 3, 9 1/
1, 2, 3, 9 1/ 3/
1, 2, 3, 2/
9, 10, 11
1, 2, 3
1, 2, 3, 2/
9, 10, 11
1, 2, 3
1, 2, 3, 2/
9, 10, 11
1, 2, 3 3/
1, 2, 3
1, 2, 3
1, 2, 3
----
----
----
Device
class Q
Device
class V
1/ PDA applies to subgroup 1.
2/ Subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in table I.
3/ Delta limits as specified in table IIB shall be required where specified, and the delta limits shall be
computed with reference to the zero hour electrical parameters.
TABLE IIB. Burn-in and operating life test. Delta parameters (+25°C).
Parameters 1/
Quiescent current
Output voltage low level
(IOL = 40 mA, VCC 4.5 V)
Output voltage high level
(IOH = -40 mA, VCC = 4.5 V)
Symbol
ICC
Delta limits
VOL
±0.04 V
VOH
±0.18 V
±1.8 mA
1/ These parameters shall be recorded before and after the required
burn-in and life test to determine delta limits
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein).
a.
End-point electrical parameters shall be as specified in table IIA herein.
b.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device
classes must meet the postirradiation end-point electrical parameter limits as defined in table I at
TA = +25°C ±5°C, after exposure, to the subgroups specified in table IIA herein.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
79009
A
REVISION LEVEL
H
SHEET
11
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
Q and V or MIL-PRF-38535, appendix A for device class M.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.3 Record of users. Military and industrial users should inform Defense Supply Center Columbus (DSCC) when a system
application requires configuration control and which SMD's are applicable to that system. DSCC will maintain a record of users
and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic
devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0525.
6.4 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone
(614) 692-0547
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-HDBK-1331.
6.6 Sources of supply.
6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.
The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DSCC-VA and have agreed to
this drawing.
6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.
The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been
submitted to and accepted by DSCC-VA.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
79009
A
REVISION LEVEL
H
SHEET
12
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 07-08-28
Approved sources of supply for SMD 79009 are listed below for immediate acquisition information only and shall be
added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to
include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of
compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded by the next
dated revision of MIL-HDBK-103 and QML-38535. DSCC maintains an online database of all current sources of
supply at http://www.dscc.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
7900901AA
3/
DS7830W
79009012A
01295
SNJ55183FK
7900901CA
01295
SNJ55183J
7900901DA
01295
SNJ55183W
5962-7900901VCA
01295
SNV55183J
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
3/ Not available from an approved source of supply.
Vendor CAGE
number
01295
Vendor name
and address
Texas Instruments, Incorporated
Semiconductor Group
8505 Forest Lane
P.O. Box 660199
Dallas, TX 75243
Point of contact:
U.S. Highway 75 South
P.O. Box 84, M/S 853
Sherman, TX 75090-9493
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.