R117 Reliability Data

RELIABILITY DATA
LT1074 / LT1076 / LT1176
8/21/2006
• OPERATING LIFE TEST
PACKAGE
TYPE
SAMPLE
SIZE
OLDEST
DATE CODE
TO-3
DD PACK
TO-220
NEWEST
DATE CODE
77
0318
838
9148
1,598
9125
2,513
• HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH
PACKAGE
TYPE
SAMPLE
SIZE
OLDEST
DATE CODE
DD PACK
TO-220
540
9148
1,117
9125
1,657
• PRESSURE COOKER TEST AT 15 PSIG, +121°C
PACKAGE
TYPE
SAMPLE
SIZE
SAMPLE
SIZE
PLASTIC DIP
SOIC/SOT/MSOP
DD PACK
TO-220
SOIC/SOT/MSOP
DD PACK
TO-220
SAMPLE
SIZE
431.20
3,513.79
2,534.16
6,479.15
K DEVICE
(4)
HOURS
AT +85°C
0310
9646
9325
9323
9148
8664
0241
9933
0552
0617
OLDEST
DATE CODE
NEWEST
DATE CODE
250
1,820
13,236
22,731
38,037
• THERMAL SHOCK FROM -65°C to +150°C
PACKAGE
TYPE
NEWEST
DATE CODE
NEWEST
DATE CODE
1,349
1,973
7,645
15,274
26,241
• TEMP CYCLE FROM -65°C to +150°C
PACKAGE
TYPE
0318
9549
0234
OLDEST
DATE CODE
PLASTIC DIP
SOIC/SOT/MSOP
DD PACK
TO-220
K DEVICE
HOURS (1)
AT +125°C
9426
9607
9148
8664
0241
9933
0552
0617
OLDEST
DATE CODE
NEWEST
DATE CODE
403.52
1,385.38
1,788.90
K DEVICE
HOURS
64.96
65.44
461.23
894.19
1,485.83
K DEVICE
CYCLES
25.00
389.90
1,848.40
3,138.64
5,401.94
K DEVICE
CYCLES
1,158
9521
0032
2,048
9148
0552
7,532
9125
0617
10,738
(1) Assumes Activation Energy = 1.0 Electron Volts
(2) Failure Rate Equivalent to +55°C, 60% Confidence Level = 0.28 FITS
(3) Mean Time Between Failures in Years = 407,418
(4) Assumes 20X Acceleration from 85°C to +131°C
Note: 1 FIT = 1 Failure in One Billion Hours.
Form: 00-03-6209B. R117
360.71
426.66
1,238.70
2,026.07
NUMBER
OF (2)
FAILURES
0
0
0
0
NUMBER
OF
FAILURES
0
0
0
NUMBER
OF
FAILURES
0
0
0
0
0
NUMBER
OF
FAILURES
0
0
0
0
0
NUMBER
OF
FAILURES
0
0
0
0
Rev 32