TI CDCVF2510PW

CDCVF2510
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
SCAS638 – DECEMBER 1999
D
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PW PACKAGE
(TOP VIEW)
Designed to Meet and Exceed PC133
SDRAM Registered DIMM Specification
Rev. 1.1
Spread Spectrum Clock Compatible
Operating Frequency 50 MHz to 175 MHz
Static Phase Error Distribution at 66MHz to
166 MHz is ±125 ps
Jitter (cyc – cyc) at 66 MHz to 166 MHz Is
|70| ps
Advanced Deep Sub-Micron Process
Results in More Than 40% Lower Power
Consumption Versus Current Generation
PC133 Devices
Available in Plastic 24-Pin TSSOP
Phase-Lock Loop Clock Distribution for
Synchronous DRAM Applications
Distributes One Clock Input to One Bank of
Ten Outputs
External Feedback (FBIN) Terminal Is Used
to Synchronize the Outputs to the Clock
Input
25-Ω On-Chip Series Damping Resistors
No External RC Network Required
Operates at 3.3 V
AGND
VCC
1Y0
1Y1
1Y2
GND
GND
1Y3
1Y4
VCC
G
FBOUT
1
24
2
23
3
22
4
21
5
20
6
19
7
18
8
17
9
16
10
15
11
14
12
13
CLK
AVCC
VCC
1Y9
1Y8
GND
GND
1Y7
1Y6
1Y5
VCC
FBIN
description
The CDCVF2510 is a high-performance, low-skew, low-jitter, phase-lock loop (PLL) clock driver. It uses a PLL
to precisely align, in both frequency and phase, the feedback (FBOUT) output to the clock (CLK) input signal.
It is specifically designed for use with synchronous DRAMs. The CDCVF2510 operates at 3.3 V VCC. It also
provides integrated series-damping resistors that make it ideal for driving point-to-point loads.
One bank of ten outputs provides ten low-skew, low-jitter copies of CLK. Output signal duty cycles are adjusted
to 50%, independent of the duty cycle at CLK. Outputs are enabled or disabled via the control (G) input. When
the G input is high, the outputs switch in phase and frequency with CLK; when the G input is low, the outputs
are disabled to the logic-low state.
Unlike many products containing PLLs, the CDCVF2510 does not require external RC networks. The loop filter
for the PLL is included on-chip, minimizing component count, board space, and cost.
Because it is based on PLL circuitry, the CDCVF2510 requires a stabilization time to achieve phase lock of the
feedback signal to the reference signal. This stabilization time is required, following power up and application
of a fixed-frequency, fixed-phase signal at CLK, and following any changes to the PLL reference or feedback
signals. The PLL can be bypassed for test purposes by strapping AVCC to ground.
The CDCVF2510 is characterized for operation from 0°C to 85°C.
For application information refer to application reports High Speed Distribution Design Techniques for
CDC509/516/2509/2510/2516 (literature number SLMA003) and Using CDC2509A/2510A PLL with Spread
Spectrum Clocking (SSC) (literature number SCAA039).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright  1999, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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1
CDCVF2510
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
SCAS638 – DECEMBER 1999
FUNCTION TABLE
OUTPUTS
INPUTS
G
CLK
1Y
(0:9)
X
L
L
L
L
H
L
H
H
H
H
H
FBOUT
functional block diagram
G
11
3
4
5
8
9
15
16
CLK
24
ÎÎÎÎÎÎÎ
ÁÁÁÁÁÁ
ÎÎÎÎÎÎÎ
ÁÁÁÁÁÁ
ÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎ
17
PLL
FBIN
AVCC
13
20
21
1Y1
1Y2
1Y3
1Y4
1Y5
1Y6
1Y7
1Y8
1Y9
23
12
AVAILABLE OPTIONS
PACKAGE
2
1Y0
TA
SMALL OUTLINE
(PW)
0°C to 85°C
CDCVF2510PWR
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FBOUT
CDCVF2510
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
SCAS638 – DECEMBER 1999
Terminal Functions
TERMINAL
NAME
NO.
TYPE
DESCRIPTION
CLK
24
I
Clock input. CLK provides the clock signal to be distributed by the CDCVF2510 clock driver. CLK is used
to provide the reference signal to the integrated PLL that generates the clock output signals. CLK must
have a fixed frequency and fixed phase for the PLL to obtain phase lock. Once the circuit is powered
up and a valid CLK signal is applied, a stabilization time is required for the PLL to phase lock the
feedback signal to its reference signal.
FBIN
13
I
Feedback input. FBIN provides the feedback signal to the internal PLL. FBIN must be hard-wired to
FBOUT to complete the PLL. The integrated PLL synchronizes CLK and FBIN so that there is nominally
zero phase error between CLK and FBIN.
G
11
I
Output bank enable. G is the output enable for outputs 1Y(0:9). When G is low, outputs 1Y(0:9) are
disabled to a logic-low state. When G is high, all outputs 1Y(0:9) are enabled and switch at the same
frequency as CLK.
FBOUT
12
O
Feedback output. FBOUT is dedicated for external feedback. It switches at the same frequency as CLK.
When externally wired to FBIN, FBOUT completes the feedback loop of the PLL. FBOUT has an
integrated 25-Ω series-damping resistor.
1Y (0:9)
3, 4, 5, 8, 9,
15, 16, 17, 20,
21
O
Clock outputs. These outputs provide low-skew copies of CLK. Output bank 1Y(0:9) is enabled via the
G input. These outputs can be disabled to a logic-low state by deasserting the G control input. Each
output has an integrated 25-Ω series-damping resistor.
AVCC
23
Power
Analog power supply. AVCC provides the power reference for the analog circuitry. In addition, AVCC can
be used to bypass the PLL for test purposes. When AVCC is strapped to ground, PLL is bypassed and
CLK is buffered directly to the device outputs.
AGND
1
Ground
Analog ground. AGND provides the ground reference for the analog circuitry.
VCC
GND
2, 10, 14, 22
Power
Power supply
6, 7, 18, 19
Ground
Ground
POST OFFICE BOX 655303
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3
CDCVF2510
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
SCAS638 – DECEMBER 1999
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage range, AVCC (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . AVCC < VCC +0.7 V
Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 4.3 V
Input voltage range, VI (see Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 4.6 V
Voltage range applied to any output in the high or low state,
VO (see Notes 2 and 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to VCC + 0.5 V
Input clamp current, IIK (VI < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –50 mA
Output clamp current, IOK (VO < 0 or VO > VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA
Continuous output current, IO (VO = 0 to VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA
Continuous current through each VCC or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±100 mA
Maximum power dissipation at TA = 55°C (in still air) (see Note 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.7 W
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. AVCC must not exceed VCC + 0.7 V.
2. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
3. This value is limited to 4.6 V maximum.
4. The maximum package power dissipation is calculated using a junction temperature of 150°C and a board trace length of 750 mils.
For more information, refer to the Package Thermal Considerations application note in the ABT Advanced BiCMOS Technology Data
Book, literature number SCBD002.
DISSIPATION RATING TABLE
PACKAGE
PW
BOARD
TYPE†
RθJA
TA ≤ 25°C
POWER RATNG
DERATING FACTOR‡
ABOVE TA = 25°C
TA = 70°C
POWER RATING
TA = 85°C
POWER RATING
JEDEC low-K
114.5°C/W
920 mW
8.7 mW/°C
520 mW
390 mW
960 mW
720 mW
JEDEC high-K
62.1°C/W
1690 mW
16.1 mW/°C
† JECEC high-K board has better thermal performance due to multiple internal copper planes.
‡ This is the inverse of the traditional junction-to-ambient thermal resistance (RθJA).
recommended operating conditions (see Note 5)
VCC, AVCC Supply voltage
VIH
High-level input voltage
VIL
VI
Low-level input voltage
IOH
IOL
MIN
MAX
3
3.6
2
UNIT
V
V
0.8
V
V
High-level output current
VCC
–12
mA
Low-level output current
12
mA
85
°C
Input voltage
0
TA
Operating free-air temperature
NOTE 5: Unused inputs must be held high or low to prevent them from floating.
0
timing requirements over recommended ranges of supply voltage and operating free-air
temperature
MIN
fclk
Clock frequency
Input clock duty cycle
Stabilization time†
MAX
UNIT
50
175
MHz
40%
60%
1
ms
† Time required for the integrated PLL circuit to obtain phase lock of its feedback signal to its reference signal. For phase lock to be obtained, a
fixed-frequency, fixed-phase reference signal must be present at CLK. Until phase lock is obtained, the specifications for propagation delay, skew,
and jitter parameters given in the switching characteristics table are not applicable. This parameter does not apply for input modulation under
SSC application.
4
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CDCVF2510
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
SCAS638 – DECEMBER 1999
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
VIK
Input clamp voltage
II = –18 mA
IOH = –100 µA
VOH
High-level output voltage
IOH = –12 mA
IOH = – 6 mA
VOL
Low-level output voltage
IOL = 100 µA
IOL = 12 mA
VCC, AVCC
3V
MIN
MIN to MAX
3V
VCC–0.2
2.1
3V
2.4
High-level output current
0.8
3V
0.55
VO = 1.95 V
VO = 1.65 V
3V
II
Input current
VO = 0.4 V
VI = VCC or GND
ICC§
Supply current
(static, output not switching)
VI = VCC or GND,
Outputs: low or high
∆ICC
Change in supply current
One input at VCC – 0.6 V,
Other inputs at VCC or GND
Ci
Input capacitance
3.3 V
IO = 0,
V
–28
mA
–36
3.6 V
Low-level output current
V
0.2
3.3 V
IOL
UNIT
–1.2
3V
3V
VO = 1.65 V
VO = 3.135 V
MAX
V
MIN to MAX
IOL = 6 mA
VO = 1 V
IOH
TYP‡
–8
30
mA
40
3.6 V
10
3.6 V
±5
µA
0 V, 3.6 V
40
µA
3.3 V to 3.6 V
500
µA
VI = VCC or GND
VO = VCC or GND
2.5
pF
Co
Output capacitance
3.3 V
2.8
‡ For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
§ For dynamic ICC vs Frequency, refer to Figures 8 and 9.
pF
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3.3 V
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5
CDCVF2510
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
SCAS638 – DECEMBER 1999
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature, CL = 25 pF (see Note 6 and Figures 1 and 2)‡
PARAMETER
tsk(o)
Phase error time – static
(normalized)
(see Figures 3 – 6)
Output skew time§
Phase error time – jitter
(see Note 7)
Jitter(cycle
(cycle-cycle)
cycle)
(see Figure 7)
Duty cycle
tr
tf
Rise time
Fall time
FROM
(INPUT)/CONDITION
TO
(OUTPUT)
CLK↑ = 66 MHz to166 MHz
FBIN↑
Any Y
Any Y
CLK = 66 MHz to 166 MHz
Any Y or FBOUT
VCC, AVCC = 3.3 V
± 0.3 V
MIN
TYP
–125
–50
UNIT
MAX
125
ps
100
ps
50
ps
Any Y or FBOUT
|70|
CLK = 100 MHz to 166 MHz
Any Y or FBOUT
|65|
f(CLK) > 60 MHz
VO = 0.4 V to 2 V
VO = 0.4 V to 2 V
Any Y or FBOUT
45%
55%
Any Y or FBOUT
0.5
2.5
ns/V
Any Y or FBOUT
0.5
2.5
ns/V
ps
tPLH(bypass mode)
Low-to-high propagation
delay time, bypass mode
CLK
Any Y or FBOUT
0.4
2.3
ns
tPHL(bypass mode)
High-to-low propagation
delay time, bypass mode
CLK
Any Y or FBOUT
0.4
2.3
ns
‡ These parameters are not production tested.
§ The tsk(o) specification is only valid for equal loading of all outputs.
NOTES: 6. The specifications for parameters in this table are applicable only after any appropriate stabilization time has elapsed.
7. Calculated per PC DRAM SPEC (tphase error, static – jitter(cycle-to-cycle)).
6
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CDCVF2510
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
SCAS638 – DECEMBER 1999
PARAMETER MEASUREMENT INFORMATION
3V
Input
50% VCC
0V
tpd
From Output
Under Test
500
25 pF
W
Output
2V
0.4 V
tr
LOAD CIRCUIT FOR OUTPUTS
50% VCC
VOH
2V
0.4 V
VOL
tf
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
NOTES: A. CL includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 133 MHz, ZO = 50 Ω, tr ≤ 1.2 ns, tf ≤ 1.2 ns.
C. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
CLKIN
FBIN
tphase error
FBOUT
Any Y
tsk(o)
Any Y
Any Y
tsk(o)
Figure 2. Phase Error and Skew Calculations
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7
CDCVF2510
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
SCAS638 – DECEMBER 1999
TYPICAL CHARACTERISTICS
STATIC PHASE ERROR
vs
LOAD CAPACITANCE
STATIC PHASE ERROR
vs
LOAD CAPACITANCE
600
200
VCC = 3.3 V
fc = 133 MHz
C(LY1–n) = 25 pF || 500 Ω
TA = 25°C
See Notes A, B, and C
400
Static Phase Error – ps
400
Static Phase Error – ps
600
VCC = 3.3 V
fc = 100 MHz
C(LY1–n) = 25 pF || 500 Ω
TA = 25°C
See Notes A, B, and C
CLK to Y1–n
0
–200
200
CLK to Y1–n
0
–200
CLK to FBOUT
CLK to FBOUT
–400
–400
–600
–600
3
8
13
18
23
28
33
3
38
C(LF) – Lumped Feedback Capacitance at FBIN – pF
8
23
28
33
38
Figure 4
STATIC PHASE ERROR
vs
SUPPLY VOLTAGE AT FBOUT
STATIC PHASE ERROR
vs
CLOCK FREQUENCY
0
0
fc = 133 MHz
C(LY) = 25 pF || 500 Ω
C(LF) = 12 pF || 500 Ω
TA = 25°C
See Notes A, B, and C
–100
–150
CLK to FBOUT
–200
–250
–100
–150
–250
–300
–350
–350
–400
3.1
3.2
3.3
3.4
3.5
–400
3.6
CLK to FBOUT
–200
–300
3
VCC = 3.3 V
C(LY) = 25 pF || 500 Ω
C(LF) = 12 pF || 500 Ω
TA = 25°C
See Notes A, B, and C
–50
Static Phase Error – ps
–50
Static Phase Error – ps
18
C(LF) – Lumped Feedback Capacitance at FBIN – pF
Figure 3
50
VCC – Supply Voltage – V
75
100
125
Figure 6
NOTES: A. Trace length FBOUT to FBIN = 5 mm, ZO = 50 Ω
B. C(LY) = Lumped capacitive load Y1–n
C. C(LFx) = Lumped feedback capacitance at FBOUT = FBIN
POST OFFICE BOX 655303
150
fc – Clock Frequency – MHz
Figure 5
8
13
• DALLAS, TEXAS 75265
175
200
CDCVF2510
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
SCAS638 – DECEMBER 1999
TYPICAL CHARACTERISTICS
JITTER
vs
CLOCK FREQUENCY AT FBOUT
ANALOG SUPPLY CURRENT
vs
CLOCK FREQUENCY
140
25
120
AI CC – Analog Supply Current – mA
VCC = 3.3 V
C(LY) = 25 pF || 500 Ω
C(LF) = 12 pF || 500 Ω
TA = 25°C
See Notes C and D
Jitter – ps
100
80
60
Cycle to Cycle
40
20
0
50
75
100
125
150
175
AVCC = VCC = 3.6 V
Bias = 0/3 V
C(LY) = 25 pF || 500 Ω
C(LF) = 12 pF || 500 Ω
TA = 25°C
See Notes A and B
20
15
10
5
0
200
0
25
fc – Clock Frequency – MHz
50
75
100
125
150
175
200
fc – Clock Frequency – MHz
Figure 7
Figure 8
SUPPLY CURRENT
vs
CLOCK FREQUENCY
250
AVCC = VCC = 3.6 V
Bias = 0/3 V
C(LY) = 25 pF || 500 Ω
C(LF) = 12 pF || 500 Ω
TA = 25°C
See Notes A and B
I CC – Supply Current – mA
200
150
100
50
0
0
25
50
75
100
125
150
175
200
fc – Clock Frequency – MHz
Figure 9
NOTES: A.
B.
C.
D.
Trace length FBOUT to FBIN = 5 mm, ZO = 50 Ω
Total current = ICC + AICC
C(LY) = Lumped capacitive load Y1–n
C(LFx) = Lumped feedback capacitance at FBOUT = FBIN
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• DALLAS, TEXAS 75265
9
CDCVF2510
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
SCAS638 – DECEMBER 1999
MECHANICAL INFORMATION
PW (R-PDSO-G**)
PLASTIC SMALL-OUTLINE PACKAGE
14 PIN SHOWN
0,30
0,19
0,65
14
0,10 M
8
0,15 NOM
4,50
4,30
6,60
6,20
Gage Plane
0,25
1
7
0°– 8°
0,75
0,50
A
Seating Plane
1,20 MAX
0,10
0,05 MIN
PINS **
8
14
16
20
24
28
A MAX
3,10
5,10
5,10
6,60
7,90
9,80
A MIN
2,90
4,90
4,90
6,40
7,70
9,60
DIM
4040064 / E 08/96
NOTES: A.
B.
C.
D.
10
All linear dimensions are in millimeters.
This drawing is subject to change without notice.
Body dimensions do not include mold flash or protrusion not to exceed 0,15.
Falls within JEDEC MO-153
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IMPORTANT NOTICE
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any product or service without notice, and advise customers to obtain the latest version of relevant information
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subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
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DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
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In order to minimize risks associated with the customer’s applications, adequate design and operating
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TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
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Copyright  1999, Texas Instruments Incorporated