RELIABILITY DATA LT1505/1510/1511/1512/1513/1571 LT1768/1769 LT3420/3484/85 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP SSOP/TSSOP NEWEST DATE CODE 585 9601 178 9901 763 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SSOP/TSSOP 241 9724 241 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE SAMPLE SIZE PLASTIC DIP SOIC/SOT/MSOP SSOP/TSSOP DD PACK TO-220 QFN/DFN PLASTIC DIP SOIC/SOT/MSOP SSOP/TSSOP DD PACK QFN/DFN SAMPLE SIZE 842.90 180.10 1,023.00 K DEVICE (4) HOURS AT +85°C 0026 9606 9535 9724 9607 9635 0452 9606 0341 0617 0202 9635 0619 OLDEST DATE CODE NEWEST DATE CODE 100 5,336 18,676 3,720 100 439 28,371 • THERMAL SHOCK FROM -65°C to +150°C PACKAGE TYPE NEWEST DATE CODE NEWEST DATE CODE 50 4,863 6,157 2,025 15 439 13,549 • TEMP CYCLE FROM -65°C to +150°C PACKAGE TYPE 0537 0027 OLDEST DATE CODE PLASTIC DIP SOIC/SOT/MSOP SSOP/TSSOP DD PACK TO-220 QFN/DFN K DEVICE HOURS (1) AT +125°C 9606 9540 9641 9607 0148 0452 0511 0341 0617 0239 0210 0619 OLDEST DATE CODE NEWEST DATE CODE 841.32 841.32 K DEVICE HOURS 1.20 348.43 569.64 100.34 0.36 70.44 1,090.42 K DEVICE CYCLES 10.00 1,127.30 2,800.31 377.00 10.00 198.50 4,523.11 K DEVICE CYCLES 50 9606 9606 2,448 9605 0341 3,777 9724 0617 1,074 9607 0203 438 0452 0619 7,787 (1) Assumes Activation Energy = 1.0 Electron Volts (2) Failure Rate Equivalent to +55°C, 60% Confidence Level = 1.80 FITS (3) Mean Time Between Failures in Years = 63,376 (4) Assumes 20X Acceleration from 85°C to +131°C Note: 1 FIT = 1 Failure in One Billion Hours. Form: 00-03-6209B. R324 5.00 587.70 1,090.38 107.40 198.00 1,988.48 NUMBER OF (2) FAILURES 0 0 0 NUMBER OF FAILURES 0 0 NUMBER OF FAILURES 0 0 0 0 0 0 0 NUMBER OF FAILURES 0 0 0 0 0 0 0 NUMBER OF FAILURES 0 0 0 0 0 0 Rev 22