RELIABILITY DATA LT1055/56/57/58 LT1457/62/63/64/65 LF156/356 LF412 OP15/16/215 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP FLATPAK/LCC HERMETIC PLASTIC DIP SOIC/SOT/MSOP NEWEST DATE CODE 1,588 8607 237 9825 4,869 8427 3,489 8428 2,132 9210 12,315 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE PLASTIC DIP SOIC/SOT/MSOP 1,037 9410 2,231 9314 3,268 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE SAMPLE SIZE CERDIP FLATPAK/LCC HERMETIC PLASTIC DIP SOIC/SOT/MSOP CERDIP FLATPAK/LCC HERMETIC PLASTIC DIP SOIC/SOT/MSOP SAMPLE SIZE 4,364.66 247.26 8,396.24 11,416.23 5,643.85 30,068.24 K DEVICE (4) HOURS AT +85°C 9926 0321 8434 9032 9121 0613 0444 9244 OLDEST DATE CODE NEWEST DATE CODE 923 173 1,108 2,646 4,257 9,107 • THERMAL SHOCK FROM -65°C to +150°C PACKAGE TYPE NEWEST DATE CODE NEWEST DATE CODE 33,364 13,387 91 46,842 • TEMP CYCLE FROM -65°C to +150°C PACKAGE TYPE 0206 0226 0213 0613 0438 OLDEST DATE CODE PLASTIC DIP SOIC/SOT/MSOP TO-92 K DEVICE HOURS (1) AT +125°C 8607 8845 8427 8443 9032 0319 0226 0143 0229 0444 OLDEST DATE CODE NEWEST DATE CODE 2,547.34 3,010.46 5,557.80 K DEVICE HOURS 1,921.08 1,446.91 4.73 3,372.72 K DEVICE CYCLES 462.60 17.30 74.35 1,021.55 2,271.17 3,846.97 K DEVICE CYCLES 675 8720 0319 99 8845 9351 517 8444 9845 1,693 8443 0205 2,413 9032 0444 5,397 (1) Assumes Activation Energy = 1.0 Electron Volts (2) Failure Rate Equivalent to +55°C, 60% Confidence Level = 0.49 FITS (3) Mean Time Between Failures in Years = 232,810 (4) Assumes 20X Acceleration from 85°C to +131°C Note: 1 FIT = 1 Failure in One Billion Hours. Form: 00-03-6209B. R040 317.14 1.49 207.70 1,165.46 1,439.02 3,130.80 NUMBER OF (2) FAILURES 2 0 3 1 0 6 NUMBER OF FAILURES 0 0 0 NUMBER OF FAILURES 0 0 0 0 NUMBER OF FAILURES 0 0 0 0 0 0 NUMBER OF FAILURES 0 0 0 0 0 0 Rev 32