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AN4022
Application note
TVS short pulse dynamic resistance measurement
and correlation with TVS clamping voltage during ESD
Introduction
This application note is addressed to technical engineers and designers to explain how
STMicroelectronics measure and specify dynamic resistance RD in protection devices.
This parameter can be conveniently and accurately used to calculate the remaining voltage
after a transient voltage suppressor or a filter including protection, especially for devices
dedicated to protect against very fast transient surges such as ESD.
Market environment
Mobile phones, computers and their peripherals are sensitive electronic products. Each of
these products has to be protected against electrostatic discharge using components able
to clamp the high voltages generated in transients defined by each standard level such as
IEC 61000-4-2. Knowing the clamping voltage level of transient voltage suppressors is a key
point in the protection definition during the circuit design to get reliable and robust products.
This application note describes
 The clamping characteristic
 Dynamic resistance and how to measure it
 Predicted results versus measured results
 TLP measurements
October 2013
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Clamping characteristic
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Clamping characteristic
The remaining voltage across a TVS device is linked to its clamping characteristic. Figure 1
shows the voltage across a unidirectional device versus the current flowing through it.
Figure 1. Typical clamping characteristic of a unidirectional device
I
IPP
R
D
Forward junction
area
V
1 mA
CL
VBR
VCL
Breakdown area
RD
IPP
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Clamping characteristic
For a positive surge (Figure 2) the maximum voltage at the IC input is the clamping voltage
VCL, directly linked to the VBR value of the device, and its dynamic resistance RD. For a
negative surge (Figure 3) this remaining voltage is linked to its forward characteristic and its
dynamic resistance RD.
Figure 2. Typical protection circuit, positive surge
Positive Surge
I PP
IC
V CL
to
protect
Figure 3. Typical protection circuit, negative surge
I PP
IC
V CL
to
protect
Negative Surge
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Clamping characteristic
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The clamping characteristic of a bidirectional TVS is shown in Figure 4.
Figure 4. Typical clamping characteristic bidirectional device
I
IPP
RD
VCL
Breakdown area
VBR
1 mA
VCL
VBR
Breakdown area
1 mA
RD
V
IPP
Some TVS devices have a breakdown characteristic with a “snap-back” effect, allowing a
lower VBR value in one or both polarities, or a mix of the two characteristics (Figure 5).
Figure 5. Typical clamping characteristic of a “snap-back” TVS
I
I PP
RD
1 mA
V CL
Snap-back effect
Forward junction
area
V CL
V BR
Breakdown area
RD
I PP
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Dynamic resistance and how to measure it
Dynamic resistance and how to measure it
In the previous section it was shown that the remaining voltage across a circuit to protect is
closely linked to the VBR of the protection device used and to its dynamic resistance RD. The
first parameter is generally well known and specified. In the past dynamic resistance has
been specified but with test conditions different from real surge conditions giving pessimistic
results, especially for short surges like electrostatic discharges. The pulse used had a
duration of 2.5 µs.
To be closer to typical ESD (defined in IEC61000-4-2), a 100 ns pulse width has been
chosen.
An accurate voltage measurement is quite difficult during high rate of rise current, due to the
voltage probing loop inductance, inducing parasitic voltage:
().
VPARASITIC = LPARASITIC ×
dl/dt
So a triangular pulse is used This is shown in Figure 6. No oscillations disturb the
measurement.
Figure 6. Current and voltage waveforms for RD measurement
IPP = 30 A
VCL value
tP≈71 ns
The current is measured during the test by a current monitor (Pearson Electronics). The
voltage measurement is by the “Kelvin” method in coaxial configuration in order to get best
accuracy (test board shown in Figure 7). An adequate voltage range and offset is set on the
oscilloscope to get the best dynamic measurement without amplifier saturation.
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Dynamic resistance and how to measure it
AN4022
Figure 7. Test board
The circuit can drive current from 500 mA up to 50 A, allowing measurements beyond the
IEC61000-4-2 standard highest level. In fact, at VPP = 15 kV contact, the current through the
device under test is 20 A to 62 A, between the first spike up to 60 ns. (Figure 8)
Figure 8. IEC61000-4-2 waveform, current level at VPP = 15 kV (contact discharge)
IPP = 62.3 A
IPP = 33.1 A
IPP = 19.2 A
To get the dynamic clamping characteristic of the device from 0 to IPP max, the current is
increase step by step, and at each level, the voltage is measured. Typical results up to
IPP = 40 A are shown in Figure 9. In this example, the device is an ESDA6V1P6.
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Dynamic resistance and how to measure it
Figure 9. Dynamic clamping characteristic (unidirectional TVS)
IPP(A)
40
38
36
34
32
30
28
26
24
22
20
18
16
14
12
10
8
6
4
2
0
Breakdown
Forward
Linear (Breakdown)
Linear (Forward)
VCL(v)
0
5
10
y = 4.7921x -6.2303
R² = 0.9951
15
20
y = 0.6765x -6.0637
R² = 0.9976
25
The characteristic is linear in the interesting area and a good trend line can be extracted
(R2 = 0.99). A better representation can be obtained as in Figure 10, in order to calculate
directly the clamping voltage for a known IPP.
Figure 10. Clamping voltage VCL versus peak pulse current IPP
VCL(V)
20
18
16
14
Breakdown
12
Forward
10
Linear (Breakdown)
Linear (Forward)
8
6
4
IPP(A)
2
0
0
2
4
6
8
10
12
14
16
18
20
22
24
26
y = 0.2077 × + 1.3132
R² = 0.9951
VCL = 0.2077 × IPP + 1.3132
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30
32
34
36
38
40
y = 0.3175 × + 6.9364
R² = 0.9997
VCL = 0.3175 × IPP + 6.9364
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Predicted results versus measured results
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Predicted results versus measured results
With this information, we can now estimate the residual voltages remaining after the
protection device and compare these results with the results obtained during ESD surge
measurements. For this comparison the IEC61000-4-2 in contact mode has been selected.
In the standard, the current levels are specified versus the charging voltage (Figure 11).
Figure 11. Extract of IEC61000-4-2 standard [page 12], current levels versus charge
voltage levels (a)
From this table we can calculate the minimum and maximum current values that can be
found in our circuit, based on the tolerances specified (±15% or ±30% versus typical
values). The expected values are summarized in Table 1.
Table 1. Minimum, typical and maximum current values versus charge voltage
Level VPP (kV)
Peak current (±15%)
IPP@ 30 ns (±30%)
IPP@ 60 ns (±30%)
1
2
6.37
7.5
8.62
2.8
4
5.2
1.4
2
2.6
2
4
12.75
15
17.25
5.6
8
10.4
2.8
4
5.2
3
6
19.12
22.5
25.87
8.4
12
15.6
4.2
6
7.8
4
8
25.5
30
34.5
11.2
16
20.8
5.6
8
10.4
a.STMicroelectronics thanks the International Electrotechnical Commission (IEC) for
permission to reproduce Information from its International Standard IEC 61000-4-2 ed.2.0
(2008).
All such extracts are copyright of IEC, Geneva, Switzerland. All rights reserved. Further
information on the IEC is available from www.iec.ch. IEC has no responsibility for the
placement and context in which the extracts and contents are reproduced by
STMicroelectronics, nor is IEC in any way responsible for the other content or accuracy
therein.
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Predicted results versus measured results
The device under test is measured in ESD clamping test at the different standard voltage
levels, as in Figure 12 (example at +8 kV). The test conditions used are described in the
STMicroelectronics Application note AN3353, “IEC 61000-4-2 standard testing”.
Figure 12. Typical clamping voltage waveform with the measured values
t=60 ns
t=30 ns
We get from these waveforms three values: the peak clamping voltage (first spike) and the
clamping voltages at t = 30 ns and t = 60 ns at peak charging voltage of ±2 kV, ±4 kV, ±6 kV
and ±8 kV. The values at the add point ±15 kV was also obtained, even if this point is not
specified in the standard.
We can now represent in three charts the predicted values and the real measurement
results in order to compare them.
Figure 13. Measurements and predicted values for the first spike peak value
70
VCL (V)
Breakdown
60
50
Predicted peak min
Predicted peak typical
Predicted peak max
Measured peak
40
30
20
10
VPP (kV)
0
0
2
4
6
8
10
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Predicted results versus measured results
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Figure 14. Measurements and predicted values for 30 ns clamping value
V
(V)
CL
20
18
16
14
12
10
8
6
4
2
0
Breakdown
Predicted 30 ns Min
Predicted 30 ns Typ
Predicted 30ns Max
Measured 30 ns
V
(KV)
PP
0
2
4
6
8
10
12
14
16
Figure 15. Measurements and predicted values for 60 ns clamping value
V (V)
CL
20
18
16
14
12
10
8
6
4
2
0
Breakdown
Predicted 60 ns Min
Predicted 60 ns Typ
Predicted 60ns Max
Measured 60 ns
V
(KV)
PP
0
2
4
6
8
10
12
14
16
Figure 13 shows the predicted results for the first spike voltage are far from the measured
values. In fact, the dl/dt during the first spike is very high, between 10 A/ns up to 80 A/ns
(the current rise time is around 0.75 ns). If we represent the V between the measured and
ΔV
the calculated dl/dt values versus the dl/dt, we get the curve in Figure 16. From this curve,
we can extract the value, shown in Figure 17. This value is near a constant, equal to the
parasitic inductance of the measurement loop (board, ground etc), in this case around
0.5 nH.
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Predicted results versus measured results
Figure 16. Gap between measured and calculated values versus current rate of rise
ΔVCL(V)
50
40
30
20
10
dI/dt (A/ns)
0
0
20
40
60
80
100
Figure 17. Parasitic inductance
LPARASITIC(nH)
1.0
0.8
0.6
Average value: 0.5 nH
0.4
0.2
dI/dt (A/ns)
0.0
0
20
40
60
80
100
There are three considerations regarding the first spike:

This calculation of the VCL for this first spike is not correct for a bidirectional device or a
rail to rail plus Transil™ device (USBULC6-2F3 for example), because in this case, a
parameter called VFP linked to one of the junctions in forward conduction induces
another added spike voltage. This VFP depends on the diode technology and cannot be
easily evaluated.

We see here the importance of the parasitic inductances especially the ground
inductance return pass. The lower the value of this inductance, the lower the value of
this transient voltage.

This spike is not the most critical for the device to protect against because I/O’s IC
circuits are dimensioned to withstand short pulses with these levels, similar to machine
model ESD tests, for example.
From Figure 14 and Figure 15 we see the predicted values for the clamping voltages at
30 ns and 60 ns are very close to the measured results, assuming the dynamic
characteristic measured in these conditions are consistent, even at high current and voltage
levels.
Note:
The study in forward polarity gives the same kind of results.
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TLP measurements
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TLP measurements
A commonly used method to probe the dynamic characteristic of a TVS is the TLP
(transmission line pulse). This uses square pulses with a duration between 75 ns to 200 ns
with fast rise times of few nanoseconds. The equipment required is specific and expensive
and is dedicated to the characterization of the ESD robustness of protection devices,
especially for integrated circuit I/O’s. The equipment is usually limited to 10 A in maximum
current level (sometimes 20 A).
It is interesting to compare the results obtained by our method and the TLP method.
In Figure 18 and Figure 19, TLP measurements have been made on an ESDAULC6-1U2 up
to 10 A, on the breakdown and forward area. The characteristics obtained by the triangular
pulse are superimposed in green. There is little difference between the two results.
Figure 18. TLP measurements compared with triangular waveform (breakdown
polarity)
-12
10
Leakage current (A)
-8
-6
10
10
-10
10
10
DUT current (A)
8
7
-2
10
It2
It2 = 9.6618 A
Issb = 9.5235 A
Vt1 = 9.1069 V
Vh = 9.1069 V
Ron = 1.2246 ohm
9
-4
10
TLP
6
5
4
Triangular waveform
3
2
Breakdown
1
0
0
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Vt1
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DUT voltage (V)
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TLP measurements
Figure 19. TLP measurements comparison with triangular waveform (forward
polarity)
-12
-10
10
10
Leakage current (A)
-8
-6
10
10
10
It2 = 9.8009 A
Issb = 9.7159 A
Vt1 = 1.1049 V
Vh = 1.1049 V
Ron = 0.90419 ohm
9
DUT current (A)
8
7
-4
10
-2
10
It2
TLP
6
5
4
Triangular waveform
3
2
Forward
1
0
DUT voltage (V)
Vt1
0
2
4
6
8
10
Conclusion
To be sure a circuit design will be robust against electrostatic discharges, it is important to
anticipate the maximum voltage that can appear at the I/O’s of the sensitive circuits.
Knowing the dynamic characteristic of a transient voltage suppressor used for their
protection is a key point during the design.
We have shown in this note that this dynamic characteristic, measured with a short pulse,
not necessarily TLP, allows accurate prediction of the remaining voltage across the TVS,
especially after the first spike of a standard surge such as that defined in IEC61000-4-2,
where the circuit to protect is the most sensitive.
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Revision history
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Revision history
Table 2. Document revision history
14/15
Date
Revision
Changes
20-Sep-2012
1
Initial release.
30-Oct-2013
2
Updated Figure 13.
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