NB3N551 3.3 V / 5.0 V Ultra-Low Skew 1:4 Clock Fanout Buffer Description The NB3N551 is a low skew 1−to 4 clock fanout buffer, designed for clock distribution in mind. The NB3N551 specifically guarantees low output−to−output skew. Optimal design, layout and processing minimize skew within a device and from device to device. The output enable (OE) pin three−states the outputs when low. http://onsemi.com MARKING DIAGRAMS* 8 8 1 Features 3N551 ALYW G 1 Input/Output Clock Frequency up to 180 MHz Low Skew Outputs (50 ps typical) RMS Phase Jitter (12 kHz – 20 MHz): 43 fs (Typical) Output goes to Three−State Mode via OE Operating Range: VDD = 3.0 V to 5.5 V Ideal for Networking Clocks Packaged in 8−pin SOIC Industrial Temperature Range These are Pb−Free Devices 3N551 A L Y W G DFN8 MN SUFFIX CASE 506AA 1 6K M G Q1 = Specific Device Code = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package 6K MG G • • • • • • • • • SOIC−8 D SUFFIX CASE 751 1 4 = Specific Device Code = Date Code = Pb−Free Package (Note: Microdot may be in either location) Q2 *For additional marking information, refer to Application Note AND8002/D. CLK Q3 PIN CONNECTIONS Q4 ICLK Q1 OE Q2 Figure 1. Block Diagram Q3 1 8 2 7 3 6 4 5 OE VDD GND Q4 ORDERING INFORMATION Device Package Shipping† NB3N551DG SOIC−8 (Pb−Free) 98 Units/Rail NB3N551DR2G SOIC−8 (Pb−Free) 2500/Tape & Reel NB3N551MNR4G DFN−8 (Pb−Free) 1000/Tape & Reel †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. © Semiconductor Components Industries, LLC, 2012 July, 2012 − Rev. 4 1 Publication Order Number: NB3N551/D NB3N551 Table 1. OE, OUTPUT ENABLE FUNCTION OE Function 0 Disable 1 Enable Table 2. PIN DESCRIPTION Pin # Name Type Description 1 ICLK (LV)CMOS/(LV)TTL Input 2 Q1 (LV)CMOS/(LV)TTL Output Clock Output 1 3 Q2 (LV)CMOS/(LV)TTL Output Clock Output 2 4 Q3 (LV)CMOS/(LV)TTL Output Clock Output 3 5 Q4 (LV)CMOS/(LV)TTL Output Clock Output 4 6 GND Power Negative supply voltage; Connect to ground, 0 V 7 VDD Power Positive supply voltage (3.0 V to 5.5 V) 8 OE (LV)CMOS/(LV)TTL Input − EP Thermal Exposed Pad Clock Input. Internal pull-up resistor. Output Enable for the clock outputs. Outputs are enabled when HIGH or when left open; OE pin has internal pull−up resistor. Three−states outputs when LOW. (DFN8 only) Thermal exposed pad must be connected to a sufficient thermal conduit. Electrically connect to the most negative supply (GND) or leave unconnected, floating open. http://onsemi.com 2 NB3N551 Table 3. MAXIMUM RATINGS Symbol VDD VI/VO Parameter Positive Power Supply Input/Output Voltage Condition 1 Condition 2 Rating Units GND = 0 V − 7.0 V t ≤ 1.5 ns − GND–1.5 ≤ VI/VO ≤ VDD+1.5 V TA Operating Temperature Range, Industrial − − ≥ −40 to ≤ +85 °C Tstg Storage Temperature Range − − −65 to +150 °C qJA Thermal Resistance (Junction−to−Ambient) 0 lfpm 500 lfpm SOIC−8 190 130 °C/W °C/W qJC Thermal Resistance (Junction−to−Case) (Note 1) SOIC−8 41 to 44 °C/W qJA Thermal Resistance (Junction−to−Ambient) 0 lfpm 500 lfpm DFN8 DFN8 129 84 °C/W qJC Thermal Resistance (Junction−to−Case) (Note 1) DFN8 35 to 40 °C/W Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. JEDEC standard multilayer board − 2S2P (2 signal, 2 power) Table 4. ATTRIBUTES Characteristic ESD Protection Value Human Body Model Machine Model Moisture Sensitivity, Indefinite Time Out of Drypack (Note 2) Flammability Rating Oxygen Index: 28 to 34 Transistor Count > 4 kV > 200 V Level 1 UL−94 code V−0 @ 0.125 in 531 Devices Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test 2. For additional Moisture Sensitivity information, refer to Application Note AND8003/D. http://onsemi.com 3 NB3N551 Table 5. DC CHARACTERISTICS (VDD = 3.0 V to 3.6 V, GND = 0 V, TA = −40°C to +85°C) (Note 3) Symbol Characteristic IDD Power Supply Current @ 135 MHz, No Load, VDD = 3.3 V VOH Output HIGH Voltage – IOH = −25 mA, VDD = 3.3 V VOL Output LOW Voltage – IOL = 25 mA VOH Output HIGH Voltage – IOH = −12 mA (CMOS level) Min Typ Max Unit − 20 40 mA 2.4 − − V − − 0.4 V VDD − 0.4 − − V (VDD/2)+0.7 − 3.8 V VIH, ICLK Input HIGH Voltage, ICLK VIL, ICLK Input LOW Voltage, ICLK − − (VDD/2)−0.7 V VIH, OE Input HIGH Voltage, OE 2.0 − VDD V VIL, OE Input LOW Voltage, OE 0 − 0.8 V ZO Nominal Output Impedance − 20 − W RPU Input Pull−up Resistor, OE − 220 − kW CIN Input Capacitance, OE − 5.0 − pF IOS Short Circuit Current − ± 50 − mA Min Typ Max Unit − 50 95 mA 2.4 − − V − − 0.4 V VDD – 0.4 − − V (VDD/2) + 1 − 5.5 V DC CHARACTERISTICS (VDD = 4.5 V to 5.5 V, GND = 0 V, TA = −40°C to +85°C) (Note 3) Symbol Characteristic IDD Power Supply Current @ 135 MHz, No Load, VDD = 5.0 V VOH Output HIGH Voltage – IOH = −35 mA VOL Output LOW Voltage – IOL = 35 mA VOH Output HIGH Voltage – IOH = −12 mA (CMOS level) VIH, ICLK Input HIGH Voltage, ICLK VIL, ICLK Input LOW Voltage, ICLK − − (VDD/2) − 1 V VIH, OE Input HIGH Voltage, OE 2.0 − VDD V VIL, OE Input LOW Voltage, OE 0 − 0.8 V ZO Nominal Output Impedance − 20 − W RPU Input Pull−up Resistor, OE − 220 − kW CIN Input Capacitance, OE − 5.0 − pF IOS Short Circuit Current − ±80 − mA Min Typ Max Unit − − 180 MHz − − 43 16 − − fs Table 6. AC CHARACTERISTICS (VDD = 3.0 V to 5.5 V, GND = 0 V, TA = −40°C to +85°C) (Note 3) Symbol fin Characteristic Conditions Input Frequency tjitter (f) RMS Phase Jitter (Integrated 12 kHz − 20 MHz) (See Figures 2 and 3) tjitter (pd) Period Jitter (RMS, 1s) − 2.0 − ps tr/tf Output rise and fall times; 0.8 V to 2.0 V − 0.5 1.0 ns tpd Propagation Delay, CLK to Qn, 0 − 180 MHz, (Note 4) 1.5 3.0 6.0 ns − 50 160 ps tskew fcarrier = 25 MHz fcarrier = 50 MHz Output−to−Output Skew; (Note 5) 3. Outputs loaded with external RL = 33−W series resistor and CL = 15 pF to GND. Duty cycle out = duty in. A 0.01 mF decoupling capacitor should be connected between VDD and GND. A 33 W series terminating resistor may be used on each clock output if the trace is longer than 1 inch. 4. Measured with rail−to−rail input clock. 5. Measured on rising edges at VDD ÷ 2. http://onsemi.com 4 NB3N551 Figure 2. Phase Noise Plot at 25 MHz at an Operating Voltage of 3.3 V, Room Temperature The above plot captured using Agilent E5052A shows Additive Phase Noise of the NB3N551 device measured with an input source generated by Agilent E8663B. The RMS phase jitter contributed by the device (integrated between 12 kHz to 20 MHz; as shown in the shaded region of the plot) is 43 fs (RMS Jitter of the input source is 203.31 fs and Output (DUT+Source) is 247.06 fs). Figure 3. Phase Noise Plot at 50 MHz at an Operating Voltage of 5 V, Room Temperature The above plot captured using Agilent E5052A shows Additive Phase Noise of the NB3N551 device measured with an input source generated by Agilent E8663B. The RMS phase jitter contributed by the device (integrated between 12 kHz to 20 MHz; as shown in the shaded region of the plot) is 16 fs (RMS Jitter of the input source is 104.08 fs and Output (DUT + Source) is 119.77 fs). http://onsemi.com 5 NB3N551 PACKAGE DIMENSIONS SOIC−8 NB CASE 751−07 ISSUE AK −X− NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A AND B DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE. 5. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. 751−01 THRU 751−06 ARE OBSOLETE. NEW STANDARD IS 751−07. A 8 5 S B 0.25 (0.010) M Y M 1 4 −Y− K G C N DIM A B C D G H J K M N S X 45 _ SEATING PLANE −Z− 0.10 (0.004) H D 0.25 (0.010) M Z Y S X S M J SOLDERING FOOTPRINT* 1.52 0.060 7.0 0.275 4.0 0.155 0.6 0.024 1.270 0.050 SCALE 6:1 mm Ǔ ǒinches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. http://onsemi.com 6 MILLIMETERS MIN MAX 4.80 5.00 3.80 4.00 1.35 1.75 0.33 0.51 1.27 BSC 0.10 0.25 0.19 0.25 0.40 1.27 0_ 8_ 0.25 0.50 5.80 6.20 INCHES MIN MAX 0.189 0.197 0.150 0.157 0.053 0.069 0.013 0.020 0.050 BSC 0.004 0.010 0.007 0.010 0.016 0.050 0 _ 8 _ 0.010 0.020 0.228 0.244 NB3N551 PACKAGE DIMENSIONS DFN8 2x2, 0.5P CASE 506AA−01 ISSUE E D PIN ONE REFERENCE 2X 0.10 C 2X 0.10 C A B L1 ÇÇ ÇÇ ÇÇ DETAIL A E OPTIONAL CONSTRUCTIONS DIM A A1 A3 b D D2 E E2 e K L L1 ÉÉ ÉÉ EXPOSED Cu TOP VIEW A DETAIL B 0.10 C NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994 . 2. CONTROLLING DIMENSION: MILLIMETERS. 3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS MEASURED BETWEEN 0.15 AND 0.20 MM FROM TERMINAL TIP. 4. COPLANARITY APPLIES TO THE EXPOSED PAD AS WELL AS THE TERMINALS. L L MOLD CMPD DETAIL B OPTIONAL CONSTRUCTION 0.08 C (A3) NOTE 4 SIDE VIEW DETAIL A A1 D2 1 4 C 8X SEATING PLANE RECOMMENDED SOLDERING FOOTPRINT* L 8 5 e/2 e 8X 1.30 PACKAGE OUTLINE E2 K 0.90 b 8X 0.50 2.30 1 0.10 C A B 0.05 C MILLIMETERS MIN MAX 0.80 1.00 0.00 0.05 0.20 REF 0.20 0.30 2.00 BSC 1.10 1.30 2.00 BSC 0.70 0.90 0.50 BSC 0.30 REF 0.25 0.35 −−− 0.10 8X 0.30 NOTE 3 BOTTOM VIEW 0.50 PITCH DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). 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