NB6L11S 2.5 V 1:2 AnyLevel] Input to LVDS Fanout Buffer / Translator The NB6L11S is a differential 1:2 clock or data receiver and will accept AnyLevel™ input signals: LVPECL, CML, LVCMOS, LVTTL, or LVDS. These signals will be translated to LVDS and two identical copies of Clock or Data will be distributed, operating up to 2.0 GHz or 2.5 Gb/s, respectively. As such, the NB6L11S is ideal for SONET, GigE, Fiber Channel, Backplane and other Clock or Data distribution applications. The NB6L11S has a wide input common mode range from GND + 50 mV to VCC − 50 mV. Combined with the 50 W internal termination resistors at the inputs, the NB6L11S is ideal for translating a variety of differential or single−ended Clock or Data signals to 350 mV typical LVDS output levels. The NB6L11S is the 2.5 V version of the NB6N11S and is offered in a small 3 mm X 3 mm 16−QFN package. Application notes, models, and support documentation are available at www.onsemi.com. www.onsemi.com MARKING DIAGRAM* 16 1 1 QFN−16 MN SUFFIX CASE 485G A L Y W G Features • • • • • • • • Input Clock Frequency > 2.0 GHz Input Data Rate > 2.5 Gb/s RMS Clock Jitter −0.5 ps, Typical 622 Mb/s Data Dependent Jitter − 6 ps, Typical 380 ps Typical Propagation Delay 120 ps Typical Rise and Fall Times Single Power Supply; VCC = 2.5 V " 5% These are Pb−Free Devices NB6L 11S ALYW G G = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package (Note: Microdot may be in either location) *For additional marking information, refer to Application Note AND8002/D. Q0 VTD Q0 D D VOLTAGE (130 mV/div) VTD Q1 Q1 Device DDJ = 10 ps Figure 1. Logic Diagram ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 10 of this data sheet. TIME (58 ps/div) Figure 2. Typical Output Waveform at 2.488 Gb/s with PRBS 223−1 (VINPP = 400 mV; Input Signal DDJ = 14 ps) © Semiconductor Components Industries, LLC, 2014 November, 2014 − Rev. 9 1 Publication Order Number: NB6L11S/D NB6L11S Exposed Pad (EP) VCC VCC VCC VCC 16 Q0 1 Q0 2 15 14 13 12 VTD 11 D NB6L11S Q1 3 10 D Q1 4 9 5 6 7 VCC NC VEE VTD 8 VEE Figure 3. NB6L11S Pinout, 16−pin QFN (Top View) Table 1. PIN DESCRIPTION Pin Name I/O 1 Q0 LVDS Output Non−inverted D output. Typically loaded with 100 W receiver termination resistor across differential pair. 2 Q0 LVDS Output Inverted D output. Typically loaded with 100 W receiver termination resistor across differential pair. 3 Q1 LVDS Output Non−inverted D output. Typically loaded with 100 W receiver termination resistor across differential pair. 4 Q1 LVDS Output Inverted D output. Typically loaded with 100 W receiver termination resistor across differential pair. 5 VCC − 6 NC No Connect. 7 VEE Negative Supply Voltage. 8 VEE 9 VTD − 10 D LVPECL, CML, LVDS, LVCMOS, LVTTL Inverted Differential Clock/Data Input (Note 1). 11 D LVPECL, CML, LVDS, LVCMOS, LVTTL Non−inverted Differential Clock/Data Input (Note 1). 12 VTD − Internal 50 W termination pin for D. 13 VCC − Positive Supply Voltage. 14 VCC − Positive Supply Voltage. 15 VCC − Positive Supply Voltage. 16 VCC − Positive Supply Voltage. EP Description Positive Supply Voltage. Negative Supply Voltage. Internal 50 W termination pin for D. Exposed pad. The exposed pad (EP) on the package bottom must be attached to a heat−sinking conduit. The exposed pad may only be electrically connected to VEE. 1. In the differential configuration when the input termination pins (VTD, VTD) are connected to a common termination voltage or left open, and if no signal is applied on D, D input, then the device will be susceptible to self−oscillation. www.onsemi.com 2 NB6L11S Table 2. ATTRIBUTES Characteristic ESD Protection Value Human Body Model Machine Model Charged Device Model Moisture Sensitivity (Note 2) > 2 kV > 200 V > 1 kV Pb−Free Pkg QFN−16 Flammability Rating Oxygen Index: 28 to 34 Level 1 UL 94 V−0 @ 0.125 in Transistor Count 225 Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test 2. For additional information, see Application Note AND8003/D. Table 3. MAXIMUM RATINGS Symbol Parameter Condition 1 VCC Positive Power Supply GND = 0 V VIN Positive Input GND = 0 V IIN Input Current Through RT (50 W Resistor) Static Surge IOSC Output Short Circuit Current Line−to−Line (Q to Q) Line−to−End (Q or Q to GND) Q or Q Q to Q to GND TA Operating Temperature Range QFN−16 Tstg Storage Temperature Range qJA Thermal Resistance (Junction−to−Ambient) (Note 3) 0 lfpm 500 lfpm qJC Thermal Resistance (Junction−to−Case) 1S2P (Note 3) Tsol Wave Solder Condition 2 VIN ≤ VCC Rating Unit 3.8 V 3.8 V 35 70 mA mA mA Pb−Free Continuous Continuous 12 24 −40 to +85 °C −65 to +150 °C QFN−16 QFN−16 41.6 35.2 °C/W °C/W QFN−16 4.0 °C/W 265 °C Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 3. JEDEC standard multilayer board − 1S2P (1 signal, 2 power) with 8 filled thermal vias under exposed pad. www.onsemi.com 3 NB6L11S Table 4. DC CHARACTERISTICS, CLOCK INPUTS, LVDS OUTPUTS VCC = 2.375 V to 2.625 V, GND = 0 V, TA = −40°C to +85°C Characteristic Symbol ICC Min Power Supply Current (Note 8) Typ Max Unit 30 45 mA DIFFERENTIAL INPUTS DRIVEN SINGLE−ENDED (Figures 15, 16, 20, and 22) Vth Input Threshold Reference Voltage Range (Note 7) GND +100 VCC − 100 mV VIH Single−ended Input HIGH Voltage Vth + 100 VCC mV VIL Single−ended Input LOW Voltage GND Vth − 100 mV DIFFERENTIAL INPUTS DRIVEN DIFFERENTIALLY (Figures 11, 12, 13, 14, 21, and 23) VIHD Differential Input HIGH Voltage 100 VCC mV VILD Differential Input LOW Voltage GND VCC − 100 mV VCMR Input Common Mode Range (Differential Configuration) GND + 50 VCC − 50 mV VID Differential Input Voltage (VIHD − VILD) 100 VCC − GND mV RTIN Internal Input Termination Resistor 40 60 W 450 mV 25 mV 1375 mV 1 25 mV 1425 1600 mV 50 LVDS OUTPUTS (Note 4) VOD Differential Output Voltage 250 DVOD Change in Magnitude of VOD for Complementary Output States (Note 9) VOS Offset Voltage (Figure 19) DVOS Change in Magnitude of VOS for Complementary Output States (Note 9) VOH Output HIGH Voltage (Note 5) VOL Output LOW Voltage (Note 6) 0 1 1125 0 900 1075 mV NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 4. LVDS outputs require 100 W receiver termination resistor between differential pair. See Figure 18. 5. VOHmax = VOSmax + ½ VODmax. 6. VOLmax = VOSmin − ½ VODmax. 7. Vth is applied to the complementary input when operating in single−ended mode. 8. Input termination pins open, D/D at the DC level within VCMR and output pins loaded with RL = 100 W across differential. 9. Parameter guaranteed by design verification not tested in production. Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. www.onsemi.com 4 NB6L11S Table 5. AC CHARACTERISTICS VCC = 2.375 V to 2.625 V, GND = 0 V; (Note 10) −40°C Characteristic Symbol fin ≤ 1.0 GHz fin= 1.5 GHz fin= 2.0 GHz Min Typ 220 200 170 350 300 270 2.5 25°C Max Min Typ 220 200 170 350 300 270 85°C Max Min Typ 220 200 170 350 300 270 1.5 2.5 VOUTPP Output Voltage Amplitude (@ VINPPmin) (Figure 4) fDATA Maximum Operating Data Rate 1.5 tPLH, tPHL Differential Input to Differential Output Propagation Delay 250 tSKEW Duty Cycle Skew (Note 11) Within Device Skew (Note 16) Device−to−Device Skew (Note 15) 8 5 30 tJITTER RMS Random Clock Jitter (Note 13) 0.5 0.5 0.5 0.5 0.5 0.5 6 7 10 6 7 10 6 7 10 fin = 1.0 GHz fin = 1.5 GHz Peak−to−Peak Data Dependent Jitter (Note 14) fDATA = 622 Mb/s fDATA = 1.5 Gb/s fDATA = 2.488 Gb/s VINPP Input Voltage Swing/Sensitivity (Differential Configuration) (Note 12) tr tf Output Rise/Fall Times @ 250 MHz (20% − 80%) 450 100 Q, Q 70 120 1.5 2.5 250 380 450 8 5 30 45 25 100 45 25 100 VCC− GND 100 170 70 250 8 5 30 VCC− GND 100 170 70 120 120 Max Unit mV Gb/s 450 ps 45 25 100 ps ps VCC− GND mV 170 ps NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 10. Measured by forcing VINPPmin with 50% duty cycle clock source and VCC − 1400 mV offset. All loading with an external RL = 100 W across “D” and “D” of the receiver. Input edge rates 150 ps (20%−80%). 11. See Figure 17 differential measurement of tskew = |tPLH − tPHL| for a nominal 50% differential clock input waveform @ 250 MHz. 12. Input voltage swing is a single−ended measurement operating in differential mode. 13. RMS jitter with 50% Duty Cycle input clock signal. 14. Deterministic jitter with input NRZ data at PRBS 223−1 and K28.5. 15. Skew is measured between outputs under identical transition @ 250 MHz. 16. The worst case condition between Q0/Q0 and Q1/Q1 from D, D, when both outputs have the same transition. OUTPUT VOLTAGE AMPLITUDE (mV) 400 350 300 −40°C 250 85°C 200 25°C 150 100 50 0 0 0.5 1 1.5 2 2.5 INPUT CLOCK FREQUENCY (GHz) Figure 4. Output Voltage Amplitude (VOUTPP) versus Input Clock Frequency (fin) and Temperature (@ VCC = 2.5 V) www.onsemi.com 5 3 NB6L11S Figure 5. Typical Phase Noise Plot at fcarrier = 622.08 MHz Figure 6. Typical Phase Noise Plot at fcarrier = 1 GHz Figure 7. Typical Phase Noise Plot at fcarrier = 1.5 GHz Figure 8. Typical Phase Noise Plot at fcarrier = 2 GHz device (integrated between 12 kHz and 20 MHz; as shown in the shaded region of the plot) at each of the frequencies is 40 fs, 22 fs, 14 fs and 12 fs respectively. The input source used for the phase noise measurements is Agilent E8663B. The above phase noise plots captured using Agilent E5052A show additive phase noise of the NB6L11S device at frequencies 622.08 MHz, 1 GHz, 1.5 GHz and 2 GHz respectively at an operating voltage of 2.5 V in room temperature. The RMS Phase Jitter contributed by the www.onsemi.com 6 VOLTAGE (63.23 mV/div) NB6L11S Device DDJ = 10 ps TIME (58 ps/div) Figure 9. Typical Output Waveform at 2.488 Gb/s with PRBS 223−1 and OC48 mask (VINPP = 100 mV; Input Signal DDJ = 14 ps) RC RC 1.25 kW 1.25 kW Dx 50 W 1.25 kW 1.25 kW I VTDx VTDx 50 W Dx Figure 10. Input Structure www.onsemi.com 7 NB6L11S VCC = 3.3 V or 2.5 V VCC = 3.3 V or 2.5 V VCC = 2.5 V VCC = 2.5 V NB6L11S D Zo = 50 W NB6L11S D Zo = 50 W 50 W* LVPECL Driver 50 W* VTD VTD 50 W* Zo = 50 W VTD LVDS Driver VTD 50 W* Zo = 50 W D D VTD = VTD VTD = VTD = VCC − 2.0 V GND GND GND Figure 11. LVPECL Interface CML Driver Figure 12. LVDS Interface VCC = 3.3 V or 2.5 V VCC = 2.5 V VCC = 2.5 V GND VCC = 2.5 V NB6L11S D Zo = 50 W VCC VTD Zo = 50 W 50 W* VTD 50 W* VTD HSTL Driver 50 W* Zo = 50 W VTD Zo = 50 W D VTD = VTD = VCC GND GND GND Figure 13. Standard 50 W Load CML Interface VCC = 2.5 V D VTD = VTD = GND or VDD/2 Depending on Driver. VCC = 2.5 V GND NB6L11S D VCC = 2.5 V Zo = 50 W 50 W* NB6L11S D 50 W* VTD VTD LVTTL Driver VTD VTD 50 W* D 50 W* D 2.5 kW* GND 50 W* Figure 14. HSTL Interface VCC = 2.5 V Zo = 50 W LVCMOS Driver NB6L11S D 1.5 kW* GND GND GND GND VTD = OPEN VTD = VTD = OPEN Figure 15. LVCMOS Interface Figure 16. LVTTL Interface *RTIN, Internal Input Termination Resistor. www.onsemi.com 8 GND NB6L11S D VINPP = VIH(D) − VIL(D) D Q VOUTPP = VOH(Q) − VOL(Q) Q tPHL tPLH Figure 17. AC Reference Measurement Q LVDS Driver Device Zo = 50 W HI Z Probe D 100 W Q Zo = 50 W Oscilloscope D HI Z Probe Figure 18. Typical LVDS Termination for Output Driver and Device Evaluation QN VOH VOS VOD VOL QN Figure 19. LVDS Output D D VIH Vth VIL D D Vth Figure 20. Differential Input Driven Single−Ended Figure 21. Differential Inputs Driven Differentially VCC VCC VIHmax Vthmax D VIL VILmax VCMR Vth VIH VINPP = VIHD − VILD VIL VIHmin Vthmin GND VIH(MAX) D VIH VILmin GND Figure 22. Vth Diagram VIL(MIN) Figure 23. VCMR Diagram www.onsemi.com 9 NB6L11S ORDERING INFORMATION Package Shipping† NB6L11SMNG QFN−16, 3 X 3 mm (Pb−Free) 123 Units / Rail NB6L11SMNR2G QFN−16, 3 X 3 mm (Pb−Free) 3000 / Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. www.onsemi.com 10 NB6L11S PACKAGE DIMENSIONS QFN16 3x3, 0.5P CASE 485G−01 ISSUE E D A B ÇÇÇ ÇÇÇ ÇÇÇ PIN 1 LOCATION L1 DETAIL A ALTERNATE TERMINAL CONSTRUCTIONS E ÉÉ ÉÉ 0.10 C 2X EXPOSED Cu 0.10 C 2X TOP VIEW DETAIL B 0.05 C NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETERS. 3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS MEASURED BETWEEN 0.25 AND 0.30 MM FROM TERMINAL. 4. COPLANARITY APPLIES TO THE EXPOSED PAD AS WELL AS THE TERMINALS. L L (A3) ÉÉ ÉÉ ÇÇ A3 MOLD CMPD A1 DETAIL B A 0.05 C ALTERNATE CONSTRUCTIONS NOTE 4 A1 SIDE VIEW C L DETAIL A MILLIMETERS MIN MAX 0.80 1.00 0.00 0.05 0.20 REF 0.18 0.30 3.00 BSC 1.65 1.85 3.00 BSC 1.65 1.85 0.50 BSC 0.18 TYP 0.30 0.50 0.00 0.15 SEATING PLANE RECOMMENDED SOLDERING FOOTPRINT* 0.10 C A B 16X DIM A A1 A3 b D D2 E E2 e K L L1 16X D2 0.58 PACKAGE OUTLINE 8 4 9 1 E2 16X 2X K 2X 1.84 3.30 1 16 e e/2 BOTTOM VIEW 16X 16X b 0.30 0.10 C A B 0.05 C 0.50 PITCH NOTE 3 DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. AnyLevel is a trademark of Semiconductor Components Industries, LLC. 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