2 Channel ESD Protection Array

PACDN004, SZPACDN004
2-Channel ESD Protection
Array
Product Description
The PACDN004 is a diode array designed to provide two channels
of ESD protection for electronic components or sub−systems. Each
channel consists of a pair of diodes which steers the ESD current pulse
either to the positive (VP) or negative (VN) supply. The PACDN004
will protect against ESD pulses up to ±15 kV Human Body Model,
and ±8 kV contact discharge per International Standard
IEC 61000−4−2.
This device has identical characteristics as the PACDN006
(6−channel array). They can be used together in order to provide
a larger number of protected inputs if required. This device is
particularly well−suited for a wide range of portable electronics
(e.g. cellular phones, PDAs, notebook computers) because of its small
package footprint, high ESD protection level and low loading
capacitance. It is also suitable for protecting video output lines and I/O
ports in computers and peripherals.
The PACDN004 is available with RoHS compliant lead−free
finishing.
www.onsemi.com
SOT−143
PACDN004SR
CASE 527AF
SOT−143
SZPACDN004SR
CASE 318A
SIMPLIFIED ELECTRICAL SCHEMATIC
VP
4
2
3
CH1
CH2
Features
• Two Channels of ESD Protection
• ±8 kV Contact, ±15 kV Air ESD Protection per Channel
•
•
•
•
•
•
(IEC 61000−4−2 Standard)
±15 kV of ESD Protection per Channel (HBM)
Low Loading Capacitance of 3 pF Typical
Low Leakage Current is Ideal for Battery−Powered Devices
Miniature 4−Pin SOT−143 Package
SZ Prefix for Automotive and Other Applications Requiring Unique
Site and Control Change Requirements; AEC−Q101 Qualified and
PPAP Capable
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
1
VN
MARKING DIAGRAM
D014
D014
= PACDN004SR
Applications
•
•
•
•
•
•
•
Consumer Electronic Products
Cellular Phones
PDAs
Notebook Computers
Desktop PCs
Digital Cameras and Camcorders
VGA (Video) Port Protection for Desktop and Portable PCs
© Semiconductor Components Industries, LLC, 2015
July, 2015 − Rev. 5
1
ORDERING INFORMATION
Package
Shipping†
PACDN004SR
SOT−143
(Pb−Free)
3000/Tape & Reel
SZPACDN004SR
SOT−143
(Pb−Free)
3000/Tape & Reel
Device
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
Publication Order Number:
PACDN004/D
PACDN004, SZPACDN004
TYPICAL APPLICATION CIRCUIT
VCC
1
4
PACDN004
0.22 mF*
Video
Driver
2
Camera
Video
Connector
NTSC Video
Digital Camera Video Port
ESD Protection
* Decoupling capacitor must be placed as close as possible to Pin4.
PACKAGE / PINOUT DIAGRAM
Top View
1
CH1
2
4
VP
3
CH2
D014
VN
SOT−143
Table 1. PIN DESCRIPTIONS
PACDN004 (SOT−143)
Pin
Name
Type
Description
1
VN
GND
2
CH1
I/O
ESD Channel 1
3
CH2
I/O
ESD Channel 2
4
VP
Supply
Negative Voltage Supply Rail or Ground Reference Rail
Positive Voltage Supply Rail
www.onsemi.com
2
PACDN004, SZPACDN004
SPECIFICATIONS
Table 2. ABSOLUTE MAXIMUM RATINGS
Parameter
Rating
Units
Supply Voltage (VP − VN)
6.0
V
Diode Forward DC Current (Note 1)
20
mA
Operating Temperature Range
−40 to +85
°C
Storage Temperature Range
−65 to +150
°C
(VN − 0.5) to (VP + 0.5)
V
225
mW
DC Voltage at any Channel Input
Package Power Rating
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Only one diode conducting at a time.
Table 3. STANDARD OPERATING CONDITIONS
Parameter
Operating Temperature Range
Operating Supply Voltage (VP − VN)
Rating
Units
−40 to +85
°C
0 to 5.5
V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
Table 4. ELECTRICAL OPERATING CHARACTERISTICS (Note 1)
Symbol
Parameter
Conditions
IP
Supply Current
(VP − VN) = 5.5 V
VF
Diode Forward Voltage
IF = 20 mA
ILEAK
CIN
VESD
VCL
Min
ESD Protection
Peak Discharge Voltage at any
Channel Input, in System
a) Human Body Model,
MIL−STD−883, Method 3015
b) Contact Discharge per
IEC 61000−4−2 Standard
c) Air Discharge per IEC 61000−4−2
Channel Clamp Voltage
Max
Units
10
mA
0.95
V
±0.1
±1.0
mA
3
5
pF
0.65
Channel Leakage Current
Channel Input Capacitance
Typ
@ 1 MHz, VP = 5 V,
VN = 0 V, VIN = 2.5 V
kV
(Note 2)
(Notes 2 and 3)
±15
(Notes 2 and 4)
±8
(Notes 2 and 4)
±15
@ 15 kV ESD HBM
(Notes 2 and 3)
Positive Transients
Negative Transients
V
VP + 13.0
VN − 13.0
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
1. All parameters specified at TA = 25°C unless otherwise noted. VP = 5 V, VN = 0 V unless noted.
2. From I/O pins to VP or VN only. VP bypassed to VN with a 0.22 mF ceramic capacitor (see Application Information for more details).
3. Human Body Model per MIL−STD−883, Method 3015, CDischarge = 100 pF, RDischarge = 1.5 kW, VP = 5.0 V, VN grounded.
4. Standard IEC 61000−4−2 with CDischarge = 150 pF, RDischarge = 330 W, VP = 5.0 V, VN grounded.
www.onsemi.com
3
PACDN004, SZPACDN004
PERFORMANCE INFORMATION
Input Capacitance vs. Input Voltage
Figure 1. Typical Variation of CIN vs. VIN
(VP = 5 V, VN = 0 V, 0.1 mF Chip Capacitor between VP and VN)
APPLICATION INFORMATION
Design Considerations
In order to realize the maximum protection against ESD pulses, care must be taken in the PCB layout to minimize parasitic
series inductances on the Supply/Ground rails as well as the signal trace segment between the signal input (typically
a connector) and the ESD protection device. Refer to Application of Positive ESD Pulse between Input Channel and Ground,
which illustrates an example of a positive ESD pulse striking an input channel. The parasitic series inductance back to the power
supply is represented by L1 and L2. The voltage VCL on the line being protected is:
V CL + FwdVoltageDropofD 1 ) V SUPPLY ) L 1
d(I ESD)ńdt ) L 2
d(I ESD)ńdt
where IESD is the ESD current pulse, and VSUPPLY is the positive supply voltage.
An ESD current pulse can rise from zero to its peak value in a very short time. As an example, a level 4 contact discharge
per the IEC61000−4−2 standard results in a current pulse that rises from zero to 30 Amps in 1 ns. Here d(IESD)/dt can be
approximated by DIESD/Dt, or 30/(1x10−9). So just 10 nH of series inductance (L1 and L2 combined) will lead to a 300 V
increment in VCL!
Similarly for negative ESD pulses, parasitic series inductance from the VN pin to the ground rail will lead to drastically
increased negative voltage on the line being protected.
Another consideration is the output impedance of the power supply for fast transient currents. Most power supplies exhibit
a much higher output impedance to fast transient current spikes. In the VCL equation above, the VSUPPLY term, in reality, is
given by (VDC + IESD x ROUT), where VDC and ROUT are the nominal supply DC output voltage and effective output impedance
of the power supply respectively. As an example, a ROUT of 1ĂW would result in a 10 V increment in VCL for a peak IESD of
10 A.
If the inductances and resistance described above are close to zero, the rail−clamp ESD protection diodes will do a good job
of protection. However, since this is not possible in practical situations, a bypass capacitor must be used to absorb the very high
frequency ESD energy. So for any brand of rail−clamp ESD protection diodes, a bypass capacitor should be connected between
the VP pin of the diodes and the ground plane (VN pin of the diodes) as shown in the Application Circuit diagram below. A value
of 0.22 mF is adequate for IEC−61000−4−2 level 4 contact discharge protection (±8 kV). Ceramic chip capacitors mounted with
short printed circuit board traces are good choices for this application. Electrolytic capacitors should be avoided as they have
poor high frequency characteristics. For extra protection, connect a zener diode in parallel with the bypass capacitor to mitigate
www.onsemi.com
4
PACDN004, SZPACDN004
the effects of the parasitic series inductance inherent in the capacitor. The breakdown voltage of the zener diode should be
slightly higher than the maximum supply voltage.
As a general rule, the ESD Protection Array should be located as close as possible to the point of entry of expected
electrostatic discharges. The power supply bypass capacitor mentioned above should be as close to the VP pin of the Protection
Array as possible, with minimum PCB trace lengths to the power supply, ground planes and between the signal input and the
ESD device to minimize stray series inductance.
Additional Information
See also ON Semiconductor Application Notes AP209, “Design Considerations for ESD Protection” and AP219, “ESD
Protection for USB 2.0 Systems”.
L2
POSITIVE SUPPLY RAIL
VP
ÇÇÇÇÇÇ
ÇÇÇÇÇÇ
ÇÇÇÇÇÇ
ÇÇÇÇÇÇ
ÇÇÇÇÇÇ
ÇÇÇÇÇÇ
D1
0.22 mF
D2
VN
ONE
CHANNEL
OF
PACDN004
ÇÇÇÇÇÇ
ÇÇÇÇÇÇ
ÇÇÇÇÇÇ
ÇÇÇÇÇÇ
ÇÇÇÇÇÇ
ÇÇÇÇÇÇ
PATH OF ESD CURRENT PULSE IESD
LINE BEING
PROTECTED
L1
BEING
PROTECTED
CHANNEL
INPUT
20 A
0A
SYSTEM OR
CIRCUITRY
VCL
GROUND RAIL
CHASSIS GROUND
Figure 2. Application of Positive ESD Pulse between Input Channel and Ground
www.onsemi.com
5
PACDN004, SZPACDN004
PACKAGE DIMENSIONS
SOT−143
CASE 318A−06
ISSUE U
D
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. MAXIMUM LEAD THICKNESS INCLUDES LEAD FINISH. MINIM­
UM LEAD THICKNESS IS THE MINIMUM THICKNESS OF BASE
MATERIAL.
4. DIMENSIONS D AND E DO NOT INCLUDE MOLD FLASH, PRO­
TRUSIONS, OR GATE BURRS. MOLD FLASH, PROTRUSIONS,
AND GATE BURRS SHALL NOT EXCEED 0.25 PER SIDE.
DIMENSION E1 DOES NOT INCLUDE INTERLEAD FLASH OR
PROTRUSION. INTERLEAD FLASH AND PROTRUSION SHALL
NOT EXCEED 0.25 PER SIDE.
5. DIMENSIONS D AND E1 ARE DETERMINED AT DATUM H.
6. DATUMS A AND B ARE DETERMINED AT DATUM H.
e
D
A
GAUGE
PLANE
E
SEATING
PLANE
L
L2
DETAIL A
E1
b1
e1
B
3X
b
0.20
TOP VIEW
H
c
A
A1
SIDE VIEW
C A-B D
M
c
0.10 C
C
DETAIL A
SEATING
PLANE
END VIEW
RECOMMENDED
SOLDERING FOOTPRINT
1.92
4X
0.75
2.70
0.20
3X
0.96
0.54
DIMENSIONS: MILLIMETERS
www.onsemi.com
6
DIM
A
A1
b
b1
c
D
E
E1
e
e1
L
L2
MILLIMETERS
MIN
MAX
0.80
1.12
0.01
0.15
0.30
0.51
0.76
0.94
0.08
0.20
2.80
3.05
2.10
2.64
1.20
1.40
1.92 BSC
0.20 BSC
0.35
0.70
0.25 BSC
PACDN004, SZPACDN004
PACKAGE DIMENSIONS
SOT−143, 4 Lead
CASE 527AF
ISSUE A
D
SYMBOL
MIN
e
A
0.80
1.22
A1
0.05
0.15
A2
0.75
b
0.30
0.50
b2
0.76
0.89
c
0.08
D
2.80
4
3
E1
1
E
2
e1
E
2.10
E1
1.20
e
b
0.40
0.20
2.90
3.04
1.30
1.40
2.64
0.50
L1
0.54 REF
L2
0.25
θ
0°
0.60
8°
q
A
1.07
0.20 BSC
L
A2
0.90
MAX
1.92 BSC
e1
TOP VIEW
NOM
c
L2
L
b2
A1
L1
SIDE VIEW
END VIEW
Notes:
(1) All dimensions are in millimeters. Angles in degrees.
(2) Complies with JEDEC TO-253.
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
P.O. Box 5163, Denver, Colorado 80217 USA
Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada
Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada
Email: [email protected]
N. American Technical Support: 800−282−9855 Toll Free
USA/Canada
Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
Japan Customer Focus Center
Phone: 81−3−5817−1050
www.onsemi.com
7
ON Semiconductor Website: www.onsemi.com
Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your local
Sales Representative
PACDN004/D