Data Sheet

Freescale Semiconductor
Technical Data
Document Number: MMG20271H
Rev. 1, 9/2014
Enhancement Mode pHEMT
Technology (E--pHEMT)
MMG20271HT1
High Linearity Amplifier
The MMG20271H is a high dynamic range, low noise amplifier MMIC, housed
in a QFN 3  3 standard plastic package. It is ideal for Cellular, PCS, LTE,
TD--SCDMA, W--CDMA base station, wireless LAN and other systems in the
1500 to 2700 MHz frequency range. With high OIP3 and low noise figure, it can
be utilized as a driver amplifier in the transmit chain and as a second stage LNA
in the receive chain.
1500--2700 MHz, 16 dB
27.5 dBm
E--pHEMT LNA/GPA
Features










Frequency: 1500--2700 MHz
Noise Figure: 1.7 dB @ 2140 MHz
P1dB: 27.5 dBm @ 2140 MHz
Small--Signal Gain: 16 dB @ 2140 MHz
Third Order Output Intercept Point: 42 dBm @ 2140 MHz
Single 5 V Supply
Supply Current: 180 mA
50 Ohm Operation (some external matching required)
Cost--effective 12--pin, 3 mm QFN Surface Mount Plastic Package
In Tape and Reel. T1 Suffix = 1,000 Units, 12 mm Tape Width, 7--inch Reel.
Table 1. Typical Performance (1)
Table 2. Maximum Ratings
Rating
Symbol
1500
MHz
2140
MHz
2700
MHz
Unit
Noise Figure
NF
2.0
1.7
1.9
dB
Input Return Loss
(S11)
IRL
--16
--14
--17
dB
Characteristic
--20
QFN 3  3
Output Return Loss
(S22)
ORL
--22
--17
dB
Small--Signal Gain
(S21)
Gp
18
16
14
dB
Power Output @
1dB Compression
P1db
27
27.5
28
dBm
Third Order Input
Intercept Point
IIP3
22
26
28
dBm
Third Order Output
Intercept Point
OIP3
40
42
42
dBm
Symbol
Value
Unit
Supply Voltage
VDD
6
V
Supply Current
IDD
400
mA
RF Input Power
Pin
25
dBm
Storage Temperature Range
Tstg
--65 to +150
C
Junction Temperature
TJ
175
C
1. VDD = 5 Vdc, TA = 25C, 50 ohm system, application circuit
tuned for specified frequency.
Table 3. Thermal Characteristics
Characteristic
Thermal Resistance, Junction to Case
Case Temperature 96C, 5 Vdc, 190 mA, no RF applied
Symbol
Value (2)
Unit
RJC
38
C/W
2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes -- AN1955.
 Freescale Semiconductor, Inc., 2010, 2014. All rights reserved.
RF Device Data
Freescale Semiconductor, Inc.
MMG20271HT1
1
Table 4. Electrical Characteristics (VDD = 5 Vdc, 2140 MHz, TA = 25C, 50 ohm system, in Freescale Application Circuit)
Symbol
Min
Typ
Max
Unit
Small--Signal Gain (S21)
Gp
13.9
16
—
dB
Input Return Loss (S11)
IRL
—
--14
—
dB
Output Return Loss (S22)
ORL
—
--22
—
dB
Power Output @ 1dB Compression
P1dB
—
27.5
—
dBm
IIP3
—
26
—
dBm
Third Order Output Intercept Point
OIP3
—
42
—
dBm
Reverse Isolation (S12)
|S12|
—
--23
—
dB
Noise Figure
NF
—
1.7
—
dB
Supply Current
IDD
148
180
227
mA
Supply Voltage
VDD
—
5
—
V
Characteristic
Third Order Input Intercept Point
Table 5. Functional Pin Description
Name
Pin Number
RFin (1)
3
Description
RF input for the power amplifier. RFin has an RF choke
to ground internal to the package. No external blocking is
necessary unless externally applied DC is present on
the trace.
RFout/
VDD
8, 9
RF output for the power amplifier. This pin is DC coupled
and requires a DC blocking capacitor.
VBA
12
Bias voltage and current adjust pin.
GND
Backside
Center Metal
The center metal base of the QFN package provides
both DC and RF ground as well as the heat sink contact
for the IC.
1. The RF input has a DC path to ground and therefore may require an external
decoupling capacitor.
VBA N.C. N.C.
12
N.C.
1
N.C.
2
RFin
3
11
10
GND
9
RFout/VDD
8
RFout/VDD
7
N.C.
4
5
6
N.C. N.C. N.C.
(Top View)
Figure 1. Pin Connections
Table 6. ESD Protection Characteristics
Test Methodology
Class
Human Body Model (per JESD 22--A114)
1B
Machine Model (per EIA/JESD 22--A115)
A
Charge Device Model (per JESD 22--C101)
IV
Table 7. Moisture Sensitivity Level
Test Methodology
Per JESD22--A113, IPC/JEDEC J--STD--020
Rating
Package Peak Temperature
Unit
1
260
C
MMG20271HT1
2
RF Device Data
Freescale Semiconductor, Inc.
50 OHM APPLICATION CIRCUIT: 2140 MHz
R2
VSUPPLY
R1
C7
12
1
RF
INPUT
Z1
Z2
11
10
C3
L2
9
BIAS
CIRCUIT
Z3
2
8
3
7
C5
L1
RF
OUTPUT
Z4
C6
C2
C1
4
Z1
Z2
5
0.139 x 0.021 Microstrip
0.026 x 0.011 Microstrip
6
Z3
Z4
0.041 x 0.030 Microstrip
0.198 x 0.021 Microstrip
Figure 2. MMG20271HT1 Test Circuit Schematic
Table 8. MMG20271HT1 Test Circuit Component Designations and Values
Part
Description
Part Number
Manufacturer
C1
1.8 pF Chip Capicitor
GJM1555C1H1R8BB01D
Murata
C2, C3, C7
18 pF Chip Capacitors
GJM1555C1H180GB01D
Murata
C4
Component Not Used
C5
0.1 F Chip Capacitor
GRM155R61A104K01D
Murata
C6
1.5 pF Chip Capacitor
GJM1555C1H1R5BB01D
Murata
L1, R2 (1)
0 , 1 A Chip Resistor
ERJ2GE0R00X
Panasonic
L2
23 nH Chip Inductor
0402CS--23NXGL
Coilcraft
R1
220 , 1/16 W Chip Resistor
RC0402FR--07220RL
Yageo
PCB
0.010, r = 3.38, Multilayer
IS680--338
Isola
1. Location L1 can be an inductor, resistor or jumper depending on frequency.
MMG20271HT1
RF Device Data
Freescale Semiconductor, Inc.
3
50 OHM APPLICATION CIRCUIT: 2140 MHz
VDD 5 V
VBA
R2
C5
C4*
R1
RFIN
C3
C7
L2
C1
C6
L1
C2
RFOUT
QFN 3x3--12A
Rev. 0
*C4 component not used.
Figure 3. MMG20271HT1 Test Circuit Component Layout
Table 8. MMG20271HT1 Test Circuit Component Designations and Values
Part
Description
Part Number
Manufacturer
C1
1.8 pF Chip Capicitor
GJM1555C1H1R8BB01D
Murata
C2, C3, C7
18 pF Chip Capacitors
GJM1555C1H180GB01D
Murata
C4
Component Not Used
C5
0.1 F Chip Capacitor
GRM155R61A104K01D
Murata
C6
1.5 pF Chip Capacitor
GJM1555C1H1R5BB01D
Murata
L1, R2 (1)
0 , 1 A Chip Resistor
ERJ2GE0R00X
Panasonic
L2
23 nH Chip Inductor
0402CS--23NXGL
Coilcraft
R1
220 , 1/16 W Chip Resistor
RC0402FR--07220RL
Yageo
PCB
0.010, r = 3.38, Multilayer
IS680--338
Isola
1. Location L1 can be an inductor, resistor or jumper depending on frequency.
(Component Designations and Values table repeated for reference.)
MMG20271HT1
4
RF Device Data
Freescale Semiconductor, Inc.
50 OHM TYPICAL CHARACTERISTICS: 2140 MHz
--13
17
IRL, INPUT RETURN LOSS (dB)
Gp, SMALL--SIGNAL GAIN (dB)
18
TC = --40C
25C
16
85C
15
VDD = 5 Vdc
14
2000
2075
2150
2225
--15
85C
25C
--16
VDD = 5 Vdc
2075
2150
2225
f, FREQUENCY (MHz)
f, FREQUENCY (MHz)
Figure 4. Small--Signal Gain (S21) versus
Frequency
Figure 5. Input Return Loss (S11) versus
Frequency
TC = 85C
--20
25C
--22
--40C
--24
2000
VDD = 5 Vdc
2075
2150
2225
P1dB, 1 dB COMPRESSION POINT (dBm)
--18
TC = --40C
28
25C
27
85C
26
VDD = 5 Vdc
25
2040
2300
2090
2140
2190
2240
f, FREQUENCY (MHz)
f, FREQUENCY (MHz)
Figure 6. Output Return Loss (S22) versus
Frequency
Figure 7. P1dB versus Frequency
45
2.4
TC = 85C
TC = --40C
43
25C
41
85C
39
1.8
25C
1.2
--40C
0.6
VDD = 5 Vdc
37
2040
2300
29
NF, NOISE FIGURE (dB)
ORL, OUTPUT RETURN LOSS (dB)
TC = --40C
--17
2000
2300
--16
OIP3, THIRD ORDER OUTPUT INTERCEPT POINT (dBm)
--14
2090
2140
2190
2240
VDD = 5 Vdc
0
2000
2075
2150
2225
f, FREQUENCY (MHz)
f, FREQUENCY (MHz)
Figure 8. Third Order Output Intercept Point
versus Frequency
Figure 9. Noise Figure versus Frequency
2300
MMG20271HT1
RF Device Data
Freescale Semiconductor, Inc.
5
ACPR, ADJACENT CHANNEL POWER RATIO (dBc)
50 OHM TYPICAL CHARACTERISTICS: 2140 MHz
--20
--30
VDD = 5 Vdc, f = 2140 MHz
Single--Carrier W--CDMA, 3.84 MHz Channel Bandwidth
Input Signal PAR = 8.5 dB @ 0.01% Probability (CCDF)
--40
TC = 85C
--40C
--50
25C
--60
16
18
20
22
24
Pout, OUTPUT POWER (dBm)
Figure 10. Single--Carrier W--CDMA Adjacent
Channel Power Ratio versus Output Power
MMG20271HT1
6
RF Device Data
Freescale Semiconductor, Inc.
50 OHM APPLICATION CIRCUIT: 1900 MHz
R2
VSUPPLY
R1
C7
12
1
RF
INPUT
Z1
Z2
11
10
C3
L2
9
BIAS
CIRCUIT
Z3
2
8
3
7
C5
L1
RF
OUTPUT
Z4
C6
C2
C1
4
Z1
Z2
5
0.166 x 0.021 Microstrip
0.026 x 0.011 Microstrip
6
Z3
Z4
0.041 x 0.030 Microstrip
0.175 x 0.021 Microstrip
Figure 11. MMG20271HT1 Test Circuit Schematic
Table 9. MMG20271HT1 Test Circuit Component Designations and Values
Part
Description
Part Number
Manufacturer
C1, C6
1.6 pF Chip Capicitors
GJM1555C1H1R6BB01D
Murata
C2, C3, C7
18 pF Chip Capacitors
GJM1555C1H180GB01D
Murata
C4
Component Not Used
C5
0.1 F Chip Capacitor
GRM155R61A104K01D
Murata
L1
1 nH Chip Inductor
0402CS--1N0XGL
Coilcraft
L2
23 nH Chip Inductor
0402CS--23NXGL
Coilcraft
R1
220 , 1/16 W Chip Resistor
RC0402FR--07220RL
Yageo
R2
0 , 1 A Chip Resistor
ERJ2GE0R00X
Panasonic
PCB
0.010, r = 3.38, Multilayer
IS680--338
Isola
MMG20271HT1
RF Device Data
Freescale Semiconductor, Inc.
7
50 OHM APPLICATION CIRCUIT: 1900 MHz
VDD 5 V
VBA
R2
C5
C4*
R1
RFIN
C3
C7
L2
C1
C6
L1
C2
RFOUT
QFN 3x3--12A
Rev. 0
*C4 component not used.
Figure 12. MMG20271HT1 Test Circuit Component Layout
Table 9. MMG20271HT1 Test Circuit Component Designations and Values
Part
Description
Part Number
Manufacturer
C1, C6
1.6 pF Chip Capicitors
GJM1555C1H1R6BB01D
Murata
C2, C3, C7
18 pF Chip Capacitors
GJM1555C1H180GB01D
Murata
C4
Component Not Used
C5
0.1 F Chip Capacitor
GRM155R61A104K01D
Murata
L1
1 nH Chip Inductor
0402CS--1N0XGL
Coilcraft
L2
23 nH Chip Inductor
0402CS--23NXGL
Coilcraft
R1
220 , 1/16 W Chip Resistor
RC0402FR--07220RL
Yageo
R2
0 , 1 A Chip Resistor
ERJ2GE0R00X
Panasonic
PCB
0.010, r = 3.38, Multilayer
IS680--338
Isola
(Component Designations and Values table repeated for reference.)
MMG20271HT1
8
RF Device Data
Freescale Semiconductor, Inc.
50 OHM TYPICAL CHARACTERISTICS: 1900 MHz
--5
IRL, INPUT RETURN LOSS (dB)
Gp, SMALL--SIGNAL GAIN (dB)
19
18
17
16
VDD = 5 Vdc
15
1750
1825
1900
1975
--20
VDD = 5 Vdc
1900
1975
f, FREQUENCY (MHz)
Figure 13. Small--Signal Gain (S21) versus
Frequency
Figure 14. Input Return Loss (S11) versus
Frequency
2050
P1dB, 1 dB COMPRESSION POINT (dBm)
29
--10
--20
--30
VDD = 5 Vdc
1825
1900
1975
28
27
26
VDD = 5 Vdc
25
1800
2050
1850
1900
1950
f, FREQUENCY (MHz)
f, FREQUENCY (MHz)
Figure 15. Output Return Loss (S22) versus
Frequency
Figure 16. P1dB versus Frequency
45
2.4
43
2.2
41
39
VDD = 5 Vdc
1 MHz Tone Spacing
37
1800
1825
f, FREQUENCY (MHz)
NF, NOISE FIGURE (dB)
ORL, OUTPUT RETURN LOSS (dB)
OIP3, THIRD ORDER OUTPUT INTERCEPT POINT (dBm)
--15
--25
1750
2050
0
--40
1750
--10
1850
1900
1950
2000
2
1.8
VDD = 5 Vdc
2000
1.6
1750
1825
1900
1975
f, FREQUENCY (MHz)
f, FREQUENCY (MHz)
Figure 17. Third Order Output Intercept
Point versus Frequency
Figure 18. Noise Figure versus Frequency
2050
MMG20271HT1
RF Device Data
Freescale Semiconductor, Inc.
9
50 OHM APPLICATION CIRCUIT: 2700 MHz
R2
VSUPPLY
R1
C7
12
1
RF
INPUT
Z1
Z2
11
10
C3
L2
9
BIAS
CIRCUIT
Z3
2
8
3
7
C5
L1
RF
OUTPUT
Z4
C6
C2
C1
4
Z1
Z2
5
0.056 x 0.021 Microstrip
0.026 x 0.011 Microstrip
6
Z3
Z4
0.041 x 0.030 Microstrip
0.091 x 0.021 Microstrip
Figure 19. MMG20271HT1 Test Circuit Schematic
Table 10. MMG20271HT1 Test Circuit Component Designations and Values
Part
Description
Part Number
Manufacturer
C1
1.8 pF Chip Capicitor
GJM1555C1H1R8BB01D
Murata
C2, C3, C7
18 pF Chip Capacitors
GJM1555C1H180GB01D
Murata
C4
Component Not Used
C5
0.1 F Chip Capacitor
GRM155R61A104K01D
Murata
C6
1.5 pF Chip Capacitor
GJM1555C1H1R5BB01D
Murata
L1, R2 (1)
0 , 1 A Chip Resistor
ERJ2GE0R00X
Panasonic
L2
23 nH Chip Inductor
0402CS--23NXGL
Coilcraft
R1
220 , 1/16 W Chip Resistor
RC0402FR--07220RL
Yageo
PCB
0.010, r = 3.38, Multilayer
IS680--338
Isola
1. Location L1 can be an inductor, resistor or jumper depending on frequency.
MMG20271HT1
10
RF Device Data
Freescale Semiconductor, Inc.
50 OHM APPLICATION CIRCUIT: 2700 MHz
VDD 5 V
VBA
R2
C5
C4*
R1
RFIN
C3
C7
L2
C1
C6
L1
C2
RFOUT
QFN 3x3--12A
Rev. 0
*C4 component not used.
Figure 20. MMG20271HT1 Test Circuit Component Layout
Table 10. MMG20271HT1 Test Circuit Component Designations and Values
Part
Description
Part Number
Manufacturer
C1
1.8 pF Chip Capicitor
GJM1555C1H1R8BB01D
Murata
C2, C3, C7
18 pF Chip Capacitors
GJM1555C1H180GB01D
Murata
C4
Component Not Used
C5
0.1 F Chip Capacitor
GRM155R61A104K01D
Murata
C6
1.5 pF Chip Capacitor
GJM1555C1H1R5BB01D
Murata
L1, R2 (1)
0 , 1 A Chip Resistor
ERJ2GE0R00X
Panasonic
L2
23 nH Chip Inductor
0402CS--23NXGL
Coilcraft
R1
220 , 1/16 W Chip Resistor
RC0402FR--07220RL
Yageo
PCB
0.010, r = 3.38, Multilayer
IS680--338
Isola
1. Location L1 can be an inductor, resistor or jumper depending on frequency.
(Component Designations and Values table repeated for reference.)
MMG20271HT1
RF Device Data
Freescale Semiconductor, Inc.
11
50 OHM TYPICAL CHARACTERISTICS: 2700 MHz
--5
IRL, INPUT RETURN LOSS (dB)
Gp, SMALL--SIGNAL GAIN (dB)
16
15
14
13
VDD = 5 Vdc
12
2550
2625
2700
2775
--20
VDD = 5 Vdc
2625
2700
2775
f, FREQUENCY (MHz)
f, FREQUENCY (MHz)
Figure 21. Small--Signal Gain (S21) versus
Frequency
Figure 22. Input Return Loss (S11) versus
Frequency
2850
29
P1dB, 1 dB COMPRESSION POINT (dBm)
ORL, OUTPUT RETURN LOSS (dB)
--15
--25
2550
2850
--5
--10
--15
--20
VDD = 5 Vdc
--25
2550
2625
2700
2775
28
27
26
VDD = 5 Vdc
25
2600
2850
2650
2700
2750
2800
f, FREQUENCY (MHz)
f, FREQUENCY (MHz)
Figure 23. Output Return Loss (S22) versus
Frequency
Figure 24. P1dB versus Frequency
45
2.2
43
2
NF, NOISE FIGURE (dB)
OIP3, THIRD ORDER OUTPUT INTERCEPT POINT (dBm)
--10
41
39
1.8
1.6
VDD = 5 Vdc
1 MHz Tone Spacing
37
2600
2650
2700
2750
VDD = 5 Vdc
2800
1.4
2550
2625
2700
2775
f, FREQUENCY (MHz)
f, FREQUENCY (MHz)
Figure 25. Third Order Output Intercept
Point versus Frequency
Figure 26. Noise Figure versus Frequency
2850
MMG20271HT1
12
RF Device Data
Freescale Semiconductor, Inc.
3.00
0.70
0.30
2.00
3.40
0.50
1.6  1.6 solder pad with
thermal via structure. All
dimensions in mm.
Figure 27. PCB Pad Layout for QFN 3  3
MG01
YWZ
Figure 28. Product Marking
MMG20271HT1
RF Device Data
Freescale Semiconductor, Inc.
13
PACKAGE DIMENSIONS
MMG20271HT1
14
RF Device Data
Freescale Semiconductor, Inc.
MMG20271HT1
RF Device Data
Freescale Semiconductor, Inc.
15
MMG20271HT1
16
RF Device Data
Freescale Semiconductor, Inc.
PRODUCT DOCUMENTATION, TOOLS AND SOFTWARE
Refer to the following resources to aid your design process.
Application Notes
 AN1955: Thermal Measurement Methodology of RF Power Amplifiers
Software
 .s2p File
Development Tools
 Printed Circuit Boards
For Software and Tools, do a Part Number search at http://www.freescale.com, and select the “Part Number” link. Go to
Software & Tools on the part’s Product Summary page to download the respective tool.
FAILURE ANALYSIS
At this time, because of the physical characteristics of the part, failure analysis is limited to electrical signature analysis. In
cases where Freescale is contractually obligated to perform failure analysis (FA) services, full FA may be performed by third
party vendors with moderate success. For updates contact your local Freescale Sales Office.
REVISION HISTORY
The following table summarizes revisions to this document.
Revision
Date
Description
0
Dec. 2010
 Initial Release of Data Sheet
1
Sept. 2014
 Table 2, Maximum Ratings: updated Junction Temperature from 150C to 175C to reflect recent test
results of the device, p. 1
 Table 6, ESD Protection Characteristics, removed the word “Minimum” after the ESD class rating. ESD
ratings are characterized during new product development but are not 100% tested during production. ESD
ratings provided in the data sheet are intended to be used as a guideline when handling ESD sensitive
devices, p. 2
 Revised Failure Analysis information, p. 17
MMG20271HT1
RF Device Data
Freescale Semiconductor, Inc.
17
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respective owners.
E 2010, 2014 Freescale Semiconductor, Inc.
MMG20271HT1
Document Number: MMG20271H
Rev. 1, 9/2014
18
RF Device Data
Freescale Semiconductor, Inc.