6 PIN DFN, 3x3

MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
Ç
ÇÇ
6 PIN DFN, 3x3x0.9
CASE 488AE−01
ISSUE B
DATE 30 NOV 2005
1
SCALE 2:1
EDGE OF PACKAGE
A
D
B
L1
DETAIL A
BOTTOM VIEW
E
PIN ONE
REFERENCE
ÇÇ
ÇÇ
ÇÇ
0.15 C
2X
NOTES:
1. DIMENSIONS AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED
TERMINAL AND IS MEASURED BETWEEN
0.25 AND 0.30 MM FROM TERMINAL.
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
5. TERMINAL b MAY HAVE MOLD COMPOUND
MATERIAL ALONG SIDE EDGE. MOLD
FLASHING MAY NOT EXCEED 30 MICRONS
ONTO BOTTOM SURFACE OF TERMINAL b.
DIM
A
A1
A3
b
D
D2
E
E2
e
K
L
L1
EXPOSED Cu
MOLD COMPOUND
0.15 C
2X
TOP VIEW
DETAIL B
A1
0.10 C
6X
0.08 C
A1
SEATING
PLANE
ÇÇÇ
ÇÇÇ
(A3)
DETAIL B
SIDE VIEW
A
GENERIC
MARKING DIAGRAM*
(A3)
C
SIDE VIEW
Ç
Ç
Ç
ÇÇÇ
ÇÇÇÇ
ÇÇÇÇ
ÇÇÇÇ
XXXX
XXXX
ALYW
D2
1
6X
L
6X
K
3
ÇÇÇ
ÇÇÇ
6
e
DETAIL A
E2
XXXX
A
L
Y
W
= Specific Device Code
= Assembly Location
= Wafer Lot
= Year
= Work Week
4
BOTTOM VIEW
DOCUMENT NUMBER:
MILLIMETERS
MIN
MAX
0.80
1.00
0.00
0.05
0.20
0.25
0.18
0.30
3.00 BSC
2.25
2.55
3.00 BSC
1.55
1.85
0.65 BSC
0.20
−−−
0.30
0.50
0.00 0.021
6X
b
NOTE 3
0.10 C A B
0.05 C
98AON15231D
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “ G”,
may or may not be present.
Electronic versions are uncontrolled except when
accessed directly from the Document Repository. Printed
STATUS: ON SEMICONDUCTOR STANDARD
© Semiconductor Components Industries, LLC, 2004
versions are uncontrolled except
whenOrder
stamped
1
Publication
Number:
March, 2004 − Rev. P1
NCP623/D
“CONTROLLED COPY” in red.
NEW STANDARD:
© Semiconductor Components Industries, LLC, 2002
Case Outline Number:
http://onsemi.com
October, DESCRIPTION:
2002 − Rev. 0
PAGE 1 OFXXX
2
6 PIN DFN, 3X3X0.9 MM, 0.65 MM
1 PITCH
DOCUMENT NUMBER:
98AON15231D
PAGE 2 OF 2
ISSUE
REVISION
DATE
O
RELEASED FOR PRODUCTION. REQ. BY B. LOFTS.
13 APR 2004
A
ADDED NOTE 5, ADDED DETAIL VIEWS AND DIMENSION L1. REQ. BY B. LOFTS
26 JAN 2005
B
CHANGED DESCRIPTION FROM QFN TO DFN. REQ. BY B. LOFTS.
30 NOV 2005
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
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“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
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© Semiconductor Components Industries, LLC, 2005
November, 2005 − Rev. 01B
Case Outline Number:
488AE