PIC16(L)F1782/1783 PIC16(L)F1782/1783 Family Silicon Errata and Data Sheet Clarification The PIC16(L)F1782/1783 family devices that you have received conform functionally to the current Device Data Sheet (DS41579D), except for the anomalies described in this document. For example, to identify the silicon revision level using MPLAB IDE in conjunction with a hardware debugger: 1. The silicon issues discussed in the following pages are for silicon revisions with the Device and Revision IDs listed in Table 1. The silicon issues are summarized in Table 2. 2. 3. The errata described in this document will be addressed in future revisions of the PIC16(L)F1782/1783 silicon. 4. Note: This document summarizes all silicon errata issues from all revisions of silicon, previous as well as current. Only the issues indicated in the last column of Table 2 apply to the current silicon revision (B4). 5. Data Sheet clarifications and corrections start on page 10, following the discussion of silicon issues. The silicon revision level can be identified using the current version of MPLAB® IDE and Microchip’s programmers, debuggers, and emulation tools, which are available at the Microchip corporate web site (www.microchip.com). TABLE 1: Using the appropriate interface, connect the device to the hardware debugger. Open an MPLAB IDE project. Configure the MPLAB IDE project for the appropriate device and hardware debugger. Based on the version of MPLAB IDE you are using, do one of the following: a) For MPLAB IDE 8, select Programmer > Reconnect. b) For MPLAB X IDE, select Window > Dashboard and click the Refresh Debug Tool Status icon ( ). Depending on the development tool used, the part number and Device Revision ID value appear in the Output window. Note: If you are unable to extract the silicon revision level, please contact your local Microchip sales office for assistance. The DEVREV values for the various PIC16(L)F1782/ 1783 silicon revisions are shown in Table 1. SILICON DEVREV VALUES DEVICE ID<13:0>(1),(2) Part Number DEV<8:0> REV<4:0> Silicon Revision B2 B4 PIC16F1782 01 0111 000 0 0110 0 1000 PIC16LF1782 01 0111 001 0 0110 0 1000 PIC16F1783 01 0110 010 0 0110 0 1000 PIC16LF1783 01 0111 010 0 0110 0 1000 Note 1: 2: The Device ID is located in the configuration memory at address 8006h. Refer to the “PIC16(L)F178X Memory Programming Specification” (DS41457) for detailed information on Device and Revision IDs for your specific device. 2012-2014 Microchip Technology Inc. DS80000541D-page 1 PIC16(L)F1782/1783 TABLE 2: SILICON ISSUE SUMMARY Module Feature Item Number Affected Revisions(1) Issue Summary B2 B4 ADC FOSC/2 1.1 FOSC/2 not functional. X ADC Offset 1.2 Time between conversions affects offset. X ADC INL (12-bit mode) 1.3 INL is ±4 LSb. X ADC FRC 1.4 ADC not functional if using FRC with FOSC<2 MHz. X Op Amp Offset 2.1 Offset increases when Common mode <200 mV. X Comparator Low-Power mode 3.1 Improper Low-Power mode operation. X Comparator Typical Offset Performance mode 3.2 Normal Speed mode. X Data EEPROM Endurance 4.1 Limited to 10k cycles, VDD <2.3V, PIC16LF1782/1783. X HF Internal Oscillator Clock Switching 5.1 Clock switching can cause a single corrupted instruction. X PSMC Rising Edge Input 6.1 Period and falling edge race condition. X PSMC Auto-shutdown 6.2 Failure to auto-restart after shutdown from comparator. X Low-Dropout (LDO) Voltage Regulator Low-Power Sleep 7.1 Unexpected Resets may occur at ambient temperatures below 0C. X X FVR FVR Module 8.1 Use of FVR module can cause device to Reset. X X PFM PFM Self-Write 9.1 PFM self-write will not work depending on clock selection. Note 1: X X X Only those issues indicated in the last column apply to the current silicon revision. DS80000541D-page 2 2012-2014 Microchip Technology Inc. PIC16(L)F1782/1783 Silicon Errata Issues Note: This document summarizes all silicon errata issues from all revisions of silicon, previous as well as current. Only the issues indicated by the shaded column in the following tables apply to the current silicon revision (B4). 1. Module: ADC 1.1 Operation with FOSC/2 The ADC is not functional when the ADCS<2:0> bits of ADCON1 select the FOSC/2 frequency. Work around Use the FRC selection which provides a valid TAD time, regardless of the system clock frequency. Affected Silicon Revisions B2 B4 X 1.2 ADC Offset The offset error exceeds the data sheet specification when the time between conversions is greater than 100 us. Work around The time dependent error is insignificant when the time between conversions is less than 100 us. When the time between conversions is greater than 100 us, take two back-to-back ADC conversions and discard the results of the first conversion. Affected Silicon Revisions B2 B4 X 2012-2014 Microchip Technology Inc. DS80000541D-page 3 PIC16(L)F1782/1783 1.3 ADC INL (12-bit mode) The ADC linearity is ±4 LSb for the 12-bit mode. Below are typical INL graphs in 12-bit mode (See Figure 1 and Figure 2). Work around None. Affected Silicon Revisions B2 B4 X FIGURE 1: ADC 12-BIT MODE, SINGLE-ENDED INL, VDD = 3.0V, TAD = 4 us, 25°C, TYPICAL MEASURED VALUES 0.5 0.0 INL (LSB) -0.5 -1.0 -1.5 -2.0 -2.5 -3.0 0 512 1024 1536 2048 2560 3072 3584 4096 Output Code FIGURE 2: ADC 12-BIT MODE, SINGLE-ENDED INL, VDD = 5.5V, TAD = 4 us, 25°C, TYPICAL MEASURED VALUES 0.5 0.0 -0.5 INL (LSB) -1.0 -1.5 -2.0 -2.5 -3.0 -3.5 -4.0 -4.5 0 512 1024 1536 2048 2560 3072 3584 4096 Output Code DS80000541D-page 4 2012-2014 Microchip Technology Inc. PIC16(L)F1782/1783 1.4 Incorrect Readings if using FOSC<2 MHz The ADC is not functional if using FRC with FOSC frequencies less than 2 MHz. Work around Use frequencies greater than 2 MHz for correct ADC functionality. Affected Silicon Revisions B2 B4 X 2. Module: Op Amp 2.1 Offset at Low Common Mode The op amp offset at Common mode input voltages below 200 mV increases with respect to temperature. Below are typical graphs showing the increase in offset (See Figure 3, Figure 4 and Figure 5). Work around None. Affected Silicon Revisions B2 B4 X FIGURE 3: OP AMP TYPICAL OFFSET VOLTAGE AT 25°C, HIGH GBWP MODE (OPAxSP = 1), VDD = 3.6V, 0V CMV 5.5V 20 Offset Voltage (mV) 15 10 5 0 -5 -10 0 0.5 1 1.5 2 2.5 3 3.5 4 COMMON MODE VOLTAGE (V) 2012-2014 Microchip Technology Inc. DS80000541D-page 5 PIC16(L)F1782/1783 FIGURE 4: OP AMP TYPICAL OFFSET VOLTAGE AT LOW VCM, 85°C, HIGH GBWP MODE (OPAxSP = 1), VDD = 3.6V, 0V CMV 0.5V 20 Offset Voltage (mV) 0 -20 -40 -60 -80 -100 0 0.1 0.2 0.3 0.4 0.5 COMMON MODE VOLTAGE (V) FIGURE 5: OP AMP TYPICAL OFFSET VOLTAGE AT 85°C, HIGH GBWP MODE (OPAxSP = 1), VDD = 3.6V, 0.5V CMV 3.5V 10 8 Offset Voltage (mV) 6 4 2 0 -2 -4 -6 -8 -10 0.5 1 1.5 2 2.5 3 3.5 COMMON MODE VOLTAGE (V) DS80000541D-page 6 2012-2014 Microchip Technology Inc. PIC16(L)F1782/1783 3. Module: Comparator 3.2 Typical Offset Performance CMRR performance for the range of VSS + 1V to VDD - 1V is better than specified in the data sheet. 3.1 No Low-Power, No Low-Speed Mode The comparator operation in Low-Power, LowSpeed mode (CxSP = 0) may not perform properly. Work around Work around See Figure 6 and Figure 7. Use the comparator in High Power mode. Affected Silicon Revisions Affected Silicon Revisions B2 B4 X X FIGURE 6: B2 B4 X COMPARATOR INPUT OFFSET, TYPICAL MEASURED VALUES, NORMAL SPEED MODE (CxSP = 1), VDD = 5.5V, PIC16F1782/1783 ONLY 20 15 10 Measured Max Offset Voltage (mV) 5 0 -5 Measured Min -10 -15 -20 -25 -30 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 Common Mode Voltage (V) 2012-2014 Microchip Technology Inc. DS80000541D-page 7 PIC16(L)F1782/1783 FIGURE 7: COMPARATOR INPUT OFFSET, TYPICAL MEASURED VALUES, NORMAL SPEED MODE (CxSP = 1), VDD = 3.2V 20 15 Measured Max Offset Voltage (mV) 10 5 0 -5 Measured Min -10 -15 -20 -25 0.0 0.5 1.0 1.5 2.0 2.5 3.0 Common Mode Voltage (V) 4. Module: Data EEPROM 5. Module: HF Internal Oscillator 4.1 Endurance of the Data EEPROM is 10k 5.1 Clock Switching The write/erase endurance of the data EE memory is limited to 10k cycles when VDD <2.3V. This errata applies to the PIC16LF1782/1783 only. Work around Use an error correction method that stores data in multiple locations. Affected Silicon Revisions B2 B4 X When switching clock sources between INTOSC clock source and an external clock source, one corrupted instruction may be executed after the switch occurs. This issue affects Two-Speed Start-up operation. Work around When switching from an external oscillator clock source, first switch to 16 MHz HFINTOSC. Once running at 16 MHz HFINTOSC, configure IRCF to run at desired internal oscillator frequency. When switching from an internal oscillator (INTOSC) to an external oscillator clock source, first switch to HFINTOSC High-Power mode (8 MHz or 16 MHz). Once running from HFINTOSC, switch to the external oscillator clock source. Affected Silicon Revisions B2 B4 X DS80000541D-page 8 2012-2014 Microchip Technology Inc. PIC16(L)F1782/1783 6. Module: PSMC Work around 6.1 Rising Edge Inhibit For applications that operate at ambient temperatures below 0C, use the LDO voltage regulator in Normal-Power mode (VREGPM = 0). When the period and falling edge sources are from the same asynchronous input, then a race condition may occur where the period is detected before the falling edge. When this occurs, then the falling edge properly terminates the cycle but subsequent rising edge inputs are ignored. Work around To configure the PSMC for fixed off-time and variable frequency, set the following: • Period = Asynchronous feedback • Rising Event = Synchronous @ PSMCxPH = 0 • Falling Event = Synchronous @ PSMCxDC = Off Time • Output inverted so drive time is from falling event to period event. Affected Silicon Revisions B2 B4 X X Affected Silicon Revisions B2 B4 X X 8. Module: FVR 8.1 FVR Module When using the FVR module, if the gain amplifier outputs are set via the CDAFVR or ADFVR bits in FVRCON while the module is disabled (FVREN = 0), the internal oscillator frequency may shift, device current consumption can increase, and a Brown-out Reset may occur. Additionally, after the FVREN is enabled, a switch from 4x to 1x can also cause a Reset. Work around 6.2 Auto-Restart When auto-shutdown is configured for auto-restart and the shutdown source is a comparator, then auto-restart may fail to occur after the shutdown condition ceases. Set the FVREN bit of FVRCON to enable the module prior to adjusting the amplifier output selections with the CDAFVR and ADFVR bits. Always set the amplifier output selections to off (‘00’) before disabling the FVR module. When switching from 4x to 1x, first switch from 4x to 2x and then from 2x to 1x. Affected Silicon Revisions Work around Enable the zero-latency filter of the comparator used for auto-shutdown. B2 B4 X X Affected Silicon Revisions B2 9. Module: PFM Self-Writes B4 9.1 PFM X 7. Module: Low-Dropout (LDO) Voltage Regulator 7.1 Low-Power Sleep mode temperatures below 0C at ambient Under the following conditions: • ambient temperatures below 0C • while in Sleep mode • VREGCON configured for Low-Power Sleep mode (VREGPM = 1) On very rare occasions, the LDO voltage will drop below the minimum VDD, causing unexpected device Resets. 2012-2014 Microchip Technology Inc. Writes to the PFM will not execute if the device’s clock source is HS, ECH, or the Internal oscillator is at either 8 MHz or 16 MHz. The DFM is unaffected. Work around To write to the PFM, the clock source must be one of the following settings: Internal oscillator set to 4 MHz or lower, ECM, ECL, XT, External RC, LP or T1OSC. Affected Silicon Revisions B2 B4 X DS80000541D-page 9 PIC16(L)F1782/1783 Data Sheet Clarifications The following typographic corrections and clarifications are to be noted for the latest version of the device data sheet (DS41579D): Note: Corrections are shown in bold. Where possible, the original bold text formatting has been removed for clarity. None. DS80000541D-page 10 2012-2014 Microchip Technology Inc. PIC16(L)F1782/1783 APPENDIX A: DOCUMENT REVISION HISTORY Rev A Document (03/2012) Initial release of this document. Rev B Document (07/2012) Added MPLAB X IDE; Added Silicon Revision B4; Updated Module 6.1; Added Modules 6.2, 7, 8 and 9. Rev C Document (09/2012) Removed Silicon Revision B4 from Module 4, Data EEPROM. Rev D Document (05/2014) Added Module 1.4; Other minor corrections. 2012-2014 Microchip Technology Inc. DS80000541D-page 11 Note the following details of the code protection feature on Microchip devices: • Microchip products meet the specification contained in their particular Microchip Data Sheet. • Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions. • There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property. • Microchip is willing to work with the customer who is concerned about the integrity of their code. • Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.” Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act. Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE. Microchip disclaims all liability arising from this information and its use. Use of Microchip devices in life support and/or safety applications is entirely at the buyer’s risk, and the buyer agrees to defend, indemnify and hold harmless Microchip from any and all damages, claims, suits, or expenses resulting from such use. No licenses are conveyed, implicitly or otherwise, under any Microchip intellectual property rights. Trademarks The Microchip name and logo, the Microchip logo, dsPIC, FlashFlex, KEELOQ, KEELOQ logo, MPLAB, PIC, PICmicro, PICSTART, PIC32 logo, rfPIC, SST, SST Logo, SuperFlash and UNI/O are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. FilterLab, Hampshire, HI-TECH C, Linear Active Thermistor, MTP, SEEVAL and The Embedded Control Solutions Company are registered trademarks of Microchip Technology Incorporated in the U.S.A. Silicon Storage Technology is a registered trademark of Microchip Technology Inc. in other countries. Analog-for-the-Digital Age, Application Maestro, BodyCom, chipKIT, chipKIT logo, CodeGuard, dsPICDEM, dsPICDEM.net, dsPICworks, dsSPEAK, ECAN, ECONOMONITOR, FanSense, HI-TIDE, In-Circuit Serial Programming, ICSP, Mindi, MiWi, MPASM, MPF, MPLAB Certified logo, MPLIB, MPLINK, mTouch, Omniscient Code Generation, PICC, PICC-18, PICDEM, PICDEM.net, PICkit, PICtail, REAL ICE, rfLAB, Select Mode, SQI, Serial Quad I/O, Total Endurance, TSHARC, UniWinDriver, WiperLock, ZENA and Z-Scale are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. SQTP is a service mark of Microchip Technology Incorporated in the U.S.A. GestIC and ULPP are registered trademarks of Microchip Technology Germany II GmbH & Co. KG, a subsidiary of Microchip Technology Inc., in other countries. All other trademarks mentioned herein are property of their respective companies. © 2012-2014, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved. Printed on recycled paper. ISBN: 978-1-63276-209-2 QUALITY MANAGEMENT SYSTEM CERTIFIED BY DNV == ISO/TS 16949 == DS80000541D-page 12 Microchip received ISO/TS-16949:2009 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona; Gresham, Oregon and design centers in California and India. The Company’s quality system processes and procedures are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified. 2012-2014 Microchip Technology Inc. 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