Data Sheet

Freescale Semiconductor
Technical Data
Document Number: MRF1513N
Rev. 12, 6/2009
RF Power Field Effect Transistor
N - Channel Enhancement - Mode Lateral MOSFET
MRF1513NT1
Designed for broadband commercial and industrial applications with frequencies to 520 MHz. The high gain and broadband performance of this device
make it ideal for large - signal, common source amplifier applications in 7.5 volt
portable and 12.5 volt mobile FM equipment.
D
• Specified Performance @ 520 MHz, 12.5 Volts
Output Power — 3 Watts
Power Gain — 15 dB
Efficiency — 65%
• Capable of Handling 20:1 VSWR, @ 15.5 Vdc,
520 MHz, 2 dB Overdrive
Features
• Excellent Thermal Stability
G
• Characterized with Series Equivalent Large - Signal
Impedance Parameters
• N Suffix Indicates Lead - Free Terminations. RoHS Compliant.
S
• In Tape and Reel. T1 Suffix = 1,000 Units per 12 mm,
7 inch Reel.
520 MHz, 3 W, 12.5 V
LATERAL N - CHANNEL
BROADBAND
RF POWER MOSFET
CASE 466 - 03, STYLE 1
PLD - 1.5
PLASTIC
Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Drain - Source Voltage
VDSS
- 0.5, +40
Vdc
Gate - Source Voltage
VGS
± 20
Vdc
ID
2
Adc
PD
31.25
0.25
W
W/°C
Storage Temperature Range
Tstg
- 65 to +150
°C
Operating Junction Temperature
TJ
150
°C
Symbol
Value (2)
Unit
RθJC
4
°C/W
Drain Current — Continuous
Total Device Dissipation @ TC = 25°C
Derate above 25°C
(1)
Table 2. Thermal Characteristics
Characteristic
Thermal Resistance, Junction to Case
Table 3. Moisture Sensitivity Level
Test Methodology
Per JESD22 - A113, IPC/JEDEC J - STD - 020
1. Calculated based on the formula PD =
Rating
Package Peak Temperature
Unit
3
260
°C
TJ – TC
RθJC
2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF
calculators by product.
NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and
packaging MOS devices should be observed.
© Freescale Semiconductor, Inc., 2008-2009. All rights reserved.
RF Device Data
Freescale Semiconductor
MRF1513NT1
1
Table 4. Electrical Characteristics (TA = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
Zero Gate Voltage Drain Current
(VDS = 40 Vdc, VGS = 0 Vdc)
IDSS
—
—
1
μAdc
Gate - Source Leakage Current
(VGS = 10 Vdc, VDS = 0 Vdc)
IGSS
—
—
1
μAdc
Gate Threshold Voltage
(VDS = 12.5 Vdc, ID = 60 μA)
VGS(th)
1
1.7
2.1
Vdc
Drain - Source On - Voltage
(VGS = 10 Vdc, ID = 500 mAdc)
VDS(on)
—
0.65
—
Vdc
Input Capacitance
(VDS = 12.5 Vdc, VGS = 0, f = 1 MHz)
Ciss
—
33
—
pF
Output Capacitance
(VDS = 12.5 Vdc, VGS = 0, f = 1 MHz)
Coss
—
16.5
—
pF
Reverse Transfer Capacitance
(VDS = 12.5 Vdc, VGS = 0, f = 1 MHz)
Crss
—
2.2
—
pF
Common - Source Amplifier Power Gain
(VDD = 12.5 Vdc, Pout = 3 Watts, IDQ = 50 mA, f = 520 MHz)
Gps
—
15
—
dB
Drain Efficiency
(VDD = 12.5 Vdc, Pout = 3 Watts, IDQ = 50 mA, f = 520 MHz)
η
—
65
—
%
Off Characteristics
On Characteristics
Dynamic Characteristics
Functional Tests (In Freescale Test Fixture)
MRF1513NT1
2
RF Device Data
Freescale Semiconductor
B2
VGG
C9
+
C8
C7
R4
B1
C16
C17
R3
C15
+
VDD
C14
L1
C6
R2
Z7
Z8
Z9
Z10
N2
Z11
R1
N1
Z1
Z2
Z3
Z4
Z5
DUT
Z6
C10
RF
INPUT
RF
OUTPUT
C13
C11
C12
C1
C2
B1, B2
C1, C13
C2, C3, C4, C10,
C11, C12
C5, C6, C17
C7, C14
C8, C15
C9, C16
L1
N1, N2
R1, R3
R2
C3
C4
C5
Short Ferrite Beads, Fair Rite Products
#2743021446
240 pF, 100 mil Chip Capacitors
R4
Z1
Z2
Z3
Z4
Z5
Z6, Z7
Z8
Z9
Z10
Z11
Board
0 to 20 pF Trimmer Capacitors
120 pF, 100 mil Chip Capacitors
10 mF, 50 V Electrolytic Capacitors
1,200 pF, 100 mil Chip Capacitors
0.1 mF, 100 mil Chip Capacitors
55.5 nH, 5 Turn, Coilcraft
Type N Flange Mounts
15 Ω Chip Resistors (0805)
1 kΩ, 1/8 W Resistor
33 kΩ, 1/8 W Resistor
0.236″ x 0.080″ Microstrip
0.981″ x 0.080″ Microstrip
0.240″ x 0.080″ Microstrip
0.098″ x 0.080″ Microstrip
0.192″ x 0.080″ Microstrip
0.260″ x 0.223″ Microstrip
0.705″ x 0.080″ Microstrip
0.342″ x 0.080″ Microstrip
0.347″ x 0.080″ Microstrip
0.846″ x 0.080″ Microstrip
Glass Teflon®, 31 mils, 2 oz. Copper
Figure 1. 450 - 520 MHz Broadband Test Circuit
TYPICAL CHARACTERISTICS, 450 - 520 MHz
5
0
VDD = 12.5 Vdc
IRL, INPUT RETURN LOSS (dB)
Pout , OUTPUT POWER (WATTS)
470 MHz
4
520 MHz
450 MHz 500 MHz
3
2
1
−5
−10
500 MHz
470 MHz
−15
520 MHz
VDD = 12.5 Vdc
0
450 MHz
−20
0
0.05
0.10
0.15
Pin, INPUT POWER (WATTS)
Figure 2. Output Power versus Input Power
0.20
0
1
2
3
Pout, OUTPUT POWER (WATTS)
4
5
Figure 3. Input Return Loss
versus Output Power
MRF1513NT1
RF Device Data
Freescale Semiconductor
3
TYPICAL CHARACTERISTICS, 450 - 520 MHz
70
16
450 MHz
15
470 MHz
Eff, DRAIN EFFICIENCY (%)
520 MHz
500 MHz
GAIN (dB)
14
13
12
11
60
450 MHz
50
500 MHz
40
30
VDD = 12.5 Vdc
VDD = 12.5 Vdc
20
10
0
1
2
3
Pout, OUTPUT POWER (WATTS)
5
4
2
3
Pout, OUTPUT POWER (WATTS)
4
5
Figure 5. Drain Efficiency versus Output Power
70
6
450 MHz
5
Eff, DRAIN EFFICIENCY (%)
Pout , OUTPUT POWER (WATTS)
1
0
Figure 4. Gain versus Output Power
470 MHz
500 MHz
4
520 MHz
3
2
0
100
500
200
300
400
IDQ, BIASING CURRENT (mA)
65 520 MHz
60 470 MHz
500 MHz
55
450 MHz
50
VDD = 12.5 Vdc
Pin = 20.3 dBm
45
VDD = 12.5 Vdc
Pin = 20.3 dBm
1
40
600
0
100
Figure 6. Output Power versus Biasing Current
500
200
300
400
IDQ, BIASING CURRENT (mA)
600
Figure 7. Drain Efficiency versus
Biasing Current
5
80
Eff, DRAIN EFFICIENCY (%)
Pout , OUTPUT POWER (WATTS)
470 MHz
520 MHz
4
3
450 MHz
520 MHz
2
470 MHz
500 MHz
Pin = 20.3 dBm
IDQ = 50 mA
1
470 MHz
70
520 MHz
60
450 MHz
50
500 MHz
40
Pin = 20.3 dBm
IDQ = 50 mA
30
0
20
8
9
10
11
12
13
14
15
VDD, SUPPLY VOLTAGE (VOLTS)
Figure 8. Output Power versus Supply Voltage
16
8
9
10
11
12
13
14
15
16
VDD, SUPPLY VOLTAGE (VOLTS)
Figure 9. Drain Efficiency versus Supply Voltage
MRF1513NT1
4
RF Device Data
Freescale Semiconductor
B2
VGG
C9
+
C8
C7
B1
R4
C15
C16
R3
C14
+
VDD
C13
L1
C6
R2
Z7
Z8
Z9
N2
Z10
R1
N1
Z1
RF
INPUT
Z2
Z3
Z4
Z5
Z6
DUT
C12
C10
RF
OUTPUT
C11
C1
C2
B1, B2
C1, C12
C2, C3, C4,
C10, C11
C5, C6, C16
C7, C13
C8, C14
C9, C15
L1
N1, N2
R1
R2
C3
C4
C5
Short Ferrite Bead, Fair Rite Products
#2743021446
330 pF, 100 mil Chip Capacitors
R3
R4
Z1
Z2
Z3
Z4
Z5
Z6, Z7
Z8
Z9
Z10
Board
1 to 20 pF Trimmer Capacitors
120 pF, 100 mil Chip Capacitors
10 μF, 50 V Electrolytic Capacitors
1,200 pF, 100 mil Chip Capacitors
0.1 mF, 100 mil Chip Capacitors
55.5 nH, 5 Turn, Coilcraft
Type N Flange Mounts
15 Ω Chip Resistor (0805)
1 kΩ, 1/8 W Resistor
15 Ω Chip Resistor (0805)
33 kΩ, 1/8 W Resistor
0.253″ x 0.080″ Microstrip
0.958″ x 0.080″ Microstrip
0.247″ x 0.080″ Microstrip
0.193″ x 0.080″ Microstrip
0.132″ x 0.080″ Microstrip
0.260″ x 0.223″ Microstrip
0.494″ x 0.080″ Microstrip
0.941″ x 0.080″ Microstrip
0.452″ x 0.080″ Microstrip
Glass Teflon®, 31 mils, 2 oz. Copper
Figure 10. 400 - 470 MHz Broadband Test Circuit
TYPICAL CHARACTERISTICS, 400 - 470 MHz
5
0
440 MHz
4
470 MHz
3
2
1
IRL, INPUT RETURN LOSS (dB)
Pout , OUTPUT POWER (WATTS)
400 MHz
VDD = 12.5 Vdc
−5
440 MHz
−10
400 MHz
−15
VDD = 12.5 Vdc
470 MHz
0
−20
0
0.02
0.08
0.04
0.06
Pin, INPUT POWER (WATTS)
0.10
Figure 11. Output Power versus Input Power
0.12
0
1
3
2
Pout, OUTPUT POWER (WATTS)
4
5
Figure 12. Input Return Loss
versus Output Power
MRF1513NT1
RF Device Data
Freescale Semiconductor
5
TYPICAL CHARACTERISTICS, 400 - 470 MHz
18
70
470 MHz
60
470 MHz
17
16
GAIN (dB)
Eff, DRAIN EFFICIENCY (%)
400 MHz
440 MHz
15
14
13
400 MHz
50
440 MHz
40
30
20
VDD = 12.5 Vdc
10
VDD = 12.5 Vdc
12
0
1
0
3
2
Pout, OUTPUT POWER (WATTS)
4
0
5
Figure 13. Gain versus Output Power
1
2
3
Pout, OUTPUT POWER (WATTS)
4
5
Figure 14. Drain Efficiency versus Output
Power
70
6
5
Eff, DRAIN EFFICIENCY (%)
Pout , OUTPUT POWER (WATTS)
400 MHz
440 MHz
4
470 MHz
3
VDD = 12.5 Vdc
Pin = 18.7 dBm
2
65 470 MHz
60 440 MHz
55
400 MHz
50
VDD = 12.5 Vdc
Pin = 18.7 dBm
45
1
40
0
100
200
300
400
IDQ, BIASING CURRENT (mA)
500
600
0
100
Figure 15. Output Power versus
Biasing Current
600
500
Figure 16. Drain Efficiency versus
Biasing Current
5
80
400 MHz
4
440 MHz
Eff, DRAIN EFFICIENCY (%)
Pout , OUTPUT POWER (WATTS)
300
400
200
IDQ, BIASING CURRENT (mA)
470 MHz
3
2
Pin = 18.7 dBm
IDQ = 50 mA
1
70
470 MHz
60
440 MHz
400 MHz
50
40
Pin = 18.7 dBm
IDQ = 50 mA
30
20
0
8
9
10
11
12
13
14
VDD, SUPPLY VOLTAGE (VOLTS)
Figure 17. Output Power versus
Supply Voltage
15
16
8
9
10
11
12
13
14
15
16
VDD, SUPPLY VOLTAGE (VOLTS)
Figure 18. Drain Efficiency versus
Supply Voltage
MRF1513NT1
6
RF Device Data
Freescale Semiconductor
B2
VGG
C9
+
C8
C7
B1
R4
C16
C17
R3
+
C15
VDD
C14
L4
C6
RF
OUTPUT
Z10 C13
R2
Z6
RF
INPUT
N1
Z7
L2
Z8
L3
Z9
R1
L1
Z1
Z2
Z3
Z4
Z5
DUT
N2
C10
C1
C3
C4
C11
C12
C5
C2
B1, B2
C1, C13
C2, C4, C10, C12
C3
C5
C6, C17
C7, C14
C8, C15
C9, C16
C11
L1
L2
L3
Short Ferrite Beads, Fair Rite Products
#2743021446
330 pF, 100 mil Chip Capacitors
0 to 20 pF Trimmer Capacitors
12 pF, 100 mil Chip Capacitor
130 pF, 100 mil Chip Capacitor
120 pF, 100 mil Chip Capacitors
10 μF, 50 V Electrolytic Capacitors
1,000 pF, 100 mil Chip Capacitors
0.1 μF, 100 mil Chip Capacitors
18 pF, 100 mil Chip Capacitor
26 nH, 4 Turn, Coilcraft
8 nH, 3 Turn, Coilcraft
55.5 nH, 5 Turn, Coilcraft
L4
N1, N2
R1
R2
R3
R4
Z1
Z2
Z3
Z4
Z5, Z6
Z7
Z8
Z9
Z10
Board
33 nH, 5 Turn, Coilcraft
Type N Flange Mounts
15 W Chip Resistor (0805)
56 W, 1/8 W Chip Resistor
10 W, 1/8 W Chip Resistor
33 kW, 1/8 W Chip Resistor
0.115″ x 0.080″ Microstrip
0.230″ x 0.080″ Microstrip
1.034″ x 0.080″ Microstrip
0.202″ x 0.080″ Microstrip
0.260″ x 0.223″ Microstrip
1.088″ x 0.080″ Microstrip
0.149″ x 0.080″ Microstrip
0.171″ x 0.080″ Microstrip
0.095″ x 0.080″ Microstrip
Glass Teflon®, 31 mils, 2 oz. Copper
Figure 19. 135 - 175 MHz Broadband Test Circuit
TYPICAL CHARACTERISTICS, 135 - 175 MHz
0
4
175 MHz
3
135 MHz
IRL, INPUT RETURN LOSS (dB)
Pout , OUTPUT POWER (WATTS)
5
155 MHz
2
1
−5
135 MHz
−10
155 MHz
175 MHz
−15
VDD = 12.5 Vdc
VDD = 12.5 Vdc
0
−20
0
0.05
0.10
0.15
Pin, INPUT POWER (WATTS)
Figure 20. Output Power versus Input Power
0.20
0
1
2
3
Pout, OUTPUT POWER (WATTS)
4
5
Figure 21. Input Return Loss
versus Output Power
MRF1513NT1
RF Device Data
Freescale Semiconductor
7
TYPICAL CHARACTERISTICS, 135 - 175 MHz
18
70
135 MHz
Eff, DRAIN EFFICIENCY (%)
175 MHz
16
GAIN (dB)
135 MHz
60
155 MHz
17
15
14
13
155 MHz
50
175 MHz
40
30
20
VDD = 12.5 Vdc
10
VDD = 12.5 Vdc
0
12
0
1
2
3
Pout, OUTPUT POWER (WATTS)
4
5
Figure 22. Gain versus Output Power
4
5
80
Eff, DRAIN EFFICIENCY (%)
175 MHz
5
155 MHz
4
135 MHz
3
VDD = 12.5 Vdc
Pin = 19.5 dBm
75
175 MHz
70
155 MHz
65
135 MHz
60
VDD = 12.5 Vdc
Pin = 19.5 dBm
55
50
2
0
100
500
200
300
400
IDQ, BIASING CURRENT (mA)
600
0
100
Figure 24. Output Power versus
Biasing Current
500
300
400
200
IDQ, BIASING CURRENT (mA)
600
Figure 25. Drain Efficiency versus
Biasing Current
5
80
Eff, DRAIN EFFICIENCY (%)
Pout , OUTPUT POWER (WATTS)
2
3
Pout, OUTPUT POWER (WATTS)
Figure 23. Drain Efficiency versus Output
Power
6
Pout , OUTPUT POWER (WATTS)
1
0
4
3
175 MHz
2
155 MHz
135 MHz
Pin = 19.5 dBm
IDQ = 50 mA
1
70
135 MHz
175 MHz
60
155 MHz
50
40
Pin = 19.5 dBm
IDQ = 50 mA
30
20
0
8
9
10
11
12
13
14
VDD, SUPPLY VOLTAGE (VOLTS)
Figure 26. Output Power versus
Supply Voltage
15
16
8
9
10
11
12
13
14
15
16
VDD, SUPPLY VOLTAGE (VOLTS)
Figure 27. Drain Efficiency versus
Supply Voltage
MRF1513NT1
8
RF Device Data
Freescale Semiconductor
TYPICAL CHARACTERISTICS
MTTF FACTOR (HOURS X AMPS2)
108
107
106
90 100
110 120 130 140 150 160 170 180 190 200 210
TJ, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours x ampere2
drain current. Life tests at elevated temperatures have correlated to
better than ±10% of the theoretical prediction for metal failure. Divide
MTTF factor by ID2 for MTTF in a particular application.
Figure 28. MTTF Factor versus Junction Temperature
MRF1513NT1
RF Device Data
Freescale Semiconductor
9
Zin
470
Zin
450
ZOL*
f = 520 MHz
470
f = 520 MHz
f = 400 MHz
Zin
135
ZOL*
135
ZOL*
Zo = 10 Ω
f = 175 MHz
f = 400 MHz
450
Zo = 10 Ω
f = 175 MHz
Zin
VDD = 12.5 V, IDQ = 50 mA, Pout = 3 W
VDD = 12.5 V, IDQ = 50 mA, Pout = 3 W
f
MHz
Zin
Ω
ZOL*
Ω
f
MHz
Zin
Ω
ZOL*
Ω
f
MHz
450
4.64 +j5.82
13.11 +j2.15
400
4.72 +j4.38
12.57 +j1.88
135
16.55 +j1.82 22.01 +j10.32
470
5.42 +j6.34
12.16 +j3.26
440
4.88 +j6.34
11.21 +j5.87
155
15.59 +j5.38
22.03 +j8.07
500
5.96 +j5.45
11.03 +j5.42
470
3.22 +j5.24
9.82 +j8.63
175
15.55 +j9.43
22.08 +j6.85
520
4.28 +j4.94
10.99 +j7.18
= Complex conjugate of source
impedance with parallel 15 Ω
resistor and 120 pF capacitor in
series with gate. (See Figure 1).
Zin
ZOL* = Complex conjugate of the load
impedance at given output power,
voltage, frequency, and ηD > 50 %.
VDD = 12.5 V, IDQ = 50 mA, Pout = 3 W
= Complex conjugate of source
impedance with parallel 15 Ω
resistor and 130 pF capacitor in
series with gate. (See Figure 10).
ZOL* = Complex conjugate of the load
impedance at given output power,
voltage, frequency, and ηD > 50 %.
Zin
Zin
Ω
ZOL*
Ω
= Complex conjugate of source
impedance with parallel 15 Ω
resistor and 130 pF capacitor in
series with gate. (See Figure 19).
ZOL* = Complex conjugate of the load
impedance at given output power,
voltage, frequency, and ηD > 50 %.
Note: ZOL* was chosen based on tradeoffs between gain, drain efficiency, and device stability.
Input
Matching
Network
Output
Matching
Network
Device
Under Test
Z
in
Z
*
OL
Figure 29. Series Equivalent Input and Output Impedance
MRF1513NT1
10
RF Device Data
Freescale Semiconductor
Table 5. Common Source Scattering Parameters (VDD = 12.5 Vdc)
IDQ = 50 mA
S11
S21
S12
S22
f
MHz
|S11|
∠φ
|S21|
∠φ
|S12|
∠φ
|S22|
∠φ
50
0.93
- 94
22.09
125
0.044
33
0.77
- 81
100
0.81
- 131
12.78
101
0.052
6
0.61
- 115
200
0.76
- 153
6.31
81
0.047
- 10
0.59
- 135
300
0.76
- 160
3.92
69
0.044
- 19
0.64
- 142
400
0.77
- 164
2.74
60
0.040
- 26
0.70
- 147
500
0.79
- 167
1.99
54
0.036
- 31
0.75
- 151
600
0.80
- 169
1.55
48
0.034
- 37
0.80
- 155
700
0.81
- 171
1.25
44
0.028
- 40
0.82
- 158
800
0.82
- 172
1.02
38
0.027
- 42
0.86
- 161
900
0.83
- 173
0.85
35
0.017
- 42
0.88
- 163
1000
0.84
- 175
0.70
29
0.018
- 49
0.91
- 166
IDQ = 500 mA
S11
S21
S12
S22
f
MHz
|S11|
∠φ
|S21|
∠φ
|S12|
∠φ
|S22|
∠φ
50
0.84
- 127
32.57
112
0.025
17
0.64
- 130
100
0.80
- 152
17.23
97
0.025
13
0.64
- 153
200
0.78
- 166
8.62
85
0.025
-9
0.65
- 163
300
0.78
- 171
5.58
79
0.023
-9
0.67
- 166
400
0.78
- 173
4.08
72
0.022
-9
0.69
- 166
500
0.78
- 175
3.14
68
0.020
- 10
0.71
- 167
600
0.79
- 176
2.55
63
0.022
- 15
0.74
- 168
700
0.79
- 177
2.14
60
0.019
- 20
0.76
- 168
800
0.80
- 178
1.80
54
0.018
- 31
0.79
- 170
900
0.81
- 178
1.54
51
0.015
- 25
0.80
- 170
1000
0.82
- 179
1.31
46
0.012
- 36
0.81
- 172
IDQ = 1 A
S11
S21
S12
S22
f
MHz
|S11|
∠φ
|S21|
∠φ
|S12|
∠φ
|S22|
∠φ
50
0.84
- 129
32.57
111
0.023
24
0.61
- 137
100
0.80
- 153
17.04
97
0.024
13
0.64
- 156
200
0.78
- 167
8.52
85
0.023
5
0.65
- 165
300
0.77
- 172
5.53
79
0.020
-7
0.67
- 167
400
0.77
- 174
4.06
73
0.020
- 11
0.69
- 167
500
0.78
- 175
3.13
69
0.021
-9
0.72
- 167
600
0.78
- 177
2.54
64
0.017
- 26
0.74
- 168
700
0.78
- 177
2.13
60
0.017
- 14
0.75
- 168
800
0.79
- 178
1.81
55
0.015
- 23
0.78
- 170
900
0.80
- 178
1.54
51
0.013
- 31
0.79
- 170
1000
0.80
- 179
1.30
46
0.011
- 17
0.80
- 172
MRF1513NT1
RF Device Data
Freescale Semiconductor
11
APPLICATIONS INFORMATION
DESIGN CONSIDERATIONS
This device is a common - source, RF power, N - Channel
enhancement mode, Lateral Metal - Oxide Semiconductor
Field - Effect Transistor (MOSFET). Freescale Application
Note AN211A, “FETs in Theory and Practice”, is suggested
reading for those not familiar with the construction and characteristics of FETs.
This surface mount packaged device was designed primarily for VHF and UHF portable power amplifier applications. Manufacturability is improved by utilizing the tape and
reel capability for fully automated pick and placement of
parts. However, care should be taken in the design process
to insure proper heat sinking of the device.
The major advantages of Lateral RF power MOSFETs include high gain, simple bias systems, relative immunity from
thermal runaway, and the ability to withstand severely mismatched loads without suffering damage.
MOSFET CAPACITANCES
The physical structure of a MOSFET results in capacitors
between all three terminals. The metal oxide gate structure
determines the capacitors from gate - to - drain (Cgd), and
gate - to - source (Cgs). The PN junction formed during fabrication of the RF MOSFET results in a junction capacitance
from drain - to - source (Cds). These capacitances are characterized as input (Ciss), output (Coss) and reverse transfer
(Crss) capacitances on data sheets. The relationships between the inter - terminal capacitances and those given on
data sheets are shown below. The Ciss can be specified in
two ways:
1. Drain shorted to source and positive voltage at the gate.
2. Positive voltage of the drain in respect to source and zero
volts at the gate.
In the latter case, the numbers are lower. However, neither
method represents the actual operating conditions in RF applications.
Drain
Cgd
Gate
Cds
Ciss = Cgd + Cgs
Coss = Cgd + Cds
Crss = Cgd
Cgs
Source
DRAIN CHARACTERISTICS
One critical figure of merit for a FET is its static resistance
in the full - on condition. This on - resistance, RDS(on), occurs
in the linear region of the output characteristic and is specified at a specific gate - source voltage and drain current. The
drain - source voltage under these conditions is termed
VDS(on). For MOSFETs, VDS(on) has a positive temperature
coefficient at high temperatures because it contributes to the
power dissipation within the device.
BVDSS values for this device are higher than normally required for typical applications. Measurement of BVDSS is not
recommended and may result in possible damage to the device.
GATE CHARACTERISTICS
The gate of the RF MOSFET is a polysilicon material, and
is electrically isolated from the source by a layer of oxide.
The DC input resistance is very high - on the order of 109 Ω
— resulting in a leakage current of a few nanoamperes.
Gate control is achieved by applying a positive voltage to
the gate greater than the gate - to - source threshold voltage,
VGS(th).
Gate Voltage Rating — Never exceed the gate voltage
rating. Exceeding the rated VGS can result in permanent
damage to the oxide layer in the gate region.
Gate Termination — The gates of these devices are essentially capacitors. Circuits that leave the gate open - circuited or floating should be avoided. These conditions can
result in turn - on of the devices due to voltage build - up on
the input capacitor due to leakage currents or pickup.
Gate Protection — These devices do not have an internal
monolithic zener diode from gate - to - source. If gate protection is required, an external zener diode is recommended.
Using a resistor to keep the gate - to - source impedance low
also helps dampen transients and serves another important
function. Voltage transients on the drain can be coupled to
the gate through the parasitic gate - drain capacitance. If the
gate - to - source impedance and the rate of voltage change
on the drain are both high, then the signal coupled to the gate
may be large enough to exceed the gate - threshold voltage
and turn the device on.
DC BIAS
Since this device is an enhancement mode FET, drain current flows only when the gate is at a higher potential than the
source. RF power FETs operate optimally with a quiescent
drain current (IDQ), whose value is application dependent.
This device was characterized at IDQ = 50 mA, which is the
suggested value of bias current for typical applications. For
special applications such as linear amplification, IDQ may
have to be selected to optimize the critical parameters.
The gate is a dc open circuit and draws no current. Therefore, the gate bias circuit may generally be just a simple resistive divider network. Some special applications may
require a more elaborate bias system.
GAIN CONTROL
Power output of this device may be controlled to some degree with a low power dc control signal applied to the gate,
thus facilitating applications such as manual gain control,
ALC/AGC and modulation systems. This characteristic is
very dependent on frequency and load line.
MRF1513NT1
12
RF Device Data
Freescale Semiconductor
MOUNTING
The specified maximum thermal resistance of 4°C/W assumes a majority of the 0.065″ x 0.180″ source contact on
the back side of the package is in good contact with an appropriate heat sink. As with all RF power devices, the goal of
the thermal design should be to minimize the temperature at
the back side of the package. Refer to Freescale Application
Note AN4005/D, “Thermal Management and Mounting Method for the PLD - 1.5 RF Power Surface Mount Package” for
additional information.
AMPLIFIER DESIGN
Impedance matching networks similar to those used with
bipolar transistors are suitable for this device. For examples
see Freescale Application Note AN721, “Impedance
Matching Networks Applied to RF Power Transistors.”
Large - signal impedances are provided, and will yield a good
first pass approximation.
Since RF power MOSFETs are triode devices, they are not
unilateral. This coupled with the very high gain of this device
yields a device capable of self oscillation. Stability may be
achieved by techniques such as drain loading, input shunt
resistive loading, or output to input feedback. The RF test fixture implements a parallel resistor and capacitor in series
with the gate, and has a load line selected for a higher efficiency, lower gain, and more stable operating region.
Two - port stability analysis with this device’s
S - parameters provides a useful tool for selection of loading
or feedback circuitry to assure stable operation. See Freescale Application Note AN215A, “RF Small - Signal Design
Using Two - Port Parameters” for a discussion of two port
network theory and stability.
MRF1513NT1
RF Device Data
Freescale Semiconductor
13
PACKAGE DIMENSIONS
0.146
3.71
A
F
0.095
2.41
3
B
D
1
2
R
0.115
2.92
0.115
2.92
L
0.020
0.51
4
0.35 (0.89) X 45_" 5 _
N
K
Q
ÉÉÉ
ÉÉ
ÉÉÉ
ÉÉÉ
ÉÉ
ÉÉÉ
ÉÉÉ
ÉÉ
ÉÉÉ
ÉÉÉ
ÉÉ
ÉÉÉ
ÉÉÉ
ÉÉ
ÉÉÉ
4
ZONE W
2
1
3
G
S
C
Y
Y
E
NOTES:
1. INTERPRET DIMENSIONS AND TOLERANCES
PER ASME Y14.5M, 1984.
2. CONTROLLING DIMENSION: INCH
3. RESIN BLEED/FLASH ALLOWABLE IN ZONE V, W,
AND X.
STYLE 1:
PIN 1.
2.
3.
4.
DRAIN
GATE
SOURCE
SOURCE
ZONE X
VIEW Y - Y
mm
SOLDER FOOTPRINT
P
U
H
ZONE V
inches
10_DRAFT
CASE 466 - 03
ISSUE D
PLD- 1.5
PLASTIC
DIM
A
B
C
D
E
F
G
H
J
K
L
N
P
Q
R
S
U
ZONE V
ZONE W
ZONE X
INCHES
MIN
MAX
0.255
0.265
0.225
0.235
0.065
0.072
0.130
0.150
0.021
0.026
0.026
0.044
0.050
0.070
0.045
0.063
0.160
0.180
0.273
0.285
0.245
0.255
0.230
0.240
0.000
0.008
0.055
0.063
0.200
0.210
0.006
0.012
0.006
0.012
0.000
0.021
0.000
0.010
0.000
0.010
MILLIMETERS
MIN
MAX
6.48
6.73
5.72
5.97
1.65
1.83
3.30
3.81
0.53
0.66
0.66
1.12
1.27
1.78
1.14
1.60
4.06
4.57
6.93
7.24
6.22
6.48
5.84
6.10
0.00
0.20
1.40
1.60
5.08
5.33
0.15
0.31
0.15
0.31
0.00
0.53
0.00
0.25
0.00
0.25
MRF1513NT1
14
RF Device Data
Freescale Semiconductor
PRODUCT DOCUMENTATION, TOOLS AND SOFTWARE
Refer to the following documents to aid your design process.
Application Notes
• AN211A: Field Effect Transistors in Theory and Practice
• AN215A: RF Small - Signal Design Using Two - Port Parameters
• AN721: Impedance Matching Networks Applied to RF Power Transistors
• AN4005: Thermal Management and Mounting Method for the PLD 1.5 RF Power Surface Mount Package
Engineering Bulletins
• EB212: Using Data Sheet Impedances for RF LDMOS Devices
Software
• Electromigration MTTF Calculator
For Software and Tools, do a Part Number search at http://www.freescale.com, and select the “Part Number” link. Go to the
Software & Tools tab on the part’s Product Summary page to download the respective tool.
REVISION HISTORY
The following table summarizes revisions to this document.
Revision
Date
10
Feb. 2008
Description
• Changed DC Bias IDQ value from 150 to 50 to match Functional Test IDQ specification, p. 12
• Added Product Documentation and Revision History, p. 15
11
June 2008
• Corrected specified performance values for power gain and efficiency on p. 1 to match typical
performance values in the functional test table on p. 2
12
June 2009
• Modified data sheet to reflect MSL rating change from 1 to 3 as a result of the standardization of packing
process as described in Product and Process Change Notification number, PCN13516, p. 1
• Added Electromigration MTTF Calculator availability to Product Documentation, Tools and Software, p. 15
MRF1513NT1
RF Device Data
Freescale Semiconductor
15
How to Reach Us:
Home Page:
www.freescale.com
Web Support:
http://www.freescale.com/support
USA/Europe or Locations Not Listed:
Freescale Semiconductor, Inc.
Technical Information Center, EL516
2100 East Elliot Road
Tempe, Arizona 85284
1 - 800 - 521 - 6274 or +1 - 480 - 768 - 2130
www.freescale.com/support
Europe, Middle East, and Africa:
Freescale Halbleiter Deutschland GmbH
Technical Information Center
Schatzbogen 7
81829 Muenchen, Germany
+44 1296 380 456 (English)
+46 8 52200080 (English)
+49 89 92103 559 (German)
+33 1 69 35 48 48 (French)
www.freescale.com/support
Japan:
Freescale Semiconductor Japan Ltd.
Headquarters
ARCO Tower 15F
1 - 8 - 1, Shimo - Meguro, Meguro - ku,
Tokyo 153 - 0064
Japan
0120 191014 or +81 3 5437 9125
[email protected]
Asia/Pacific:
Freescale Semiconductor China Ltd.
Exchange Building 23F
No. 118 Jianguo Road
Chaoyang District
Beijing 100022
China
+86 10 5879 8000
[email protected]
For Literature Requests Only:
Freescale Semiconductor Literature Distribution Center
1 - 800 - 441 - 2447 or +1 - 303 - 675 - 2140
Fax: +1 - 303 - 675 - 2150
[email protected]
Information in this document is provided solely to enable system and software
implementers to use Freescale Semiconductor products. There are no express or
implied copyright licenses granted hereunder to design or fabricate any integrated
circuits or integrated circuits based on the information in this document.
Freescale Semiconductor reserves the right to make changes without further notice to
any products herein. Freescale Semiconductor makes no warranty, representation or
guarantee regarding the suitability of its products for any particular purpose, nor does
Freescale Semiconductor assume any liability arising out of the application or use of
any product or circuit, and specifically disclaims any and all liability, including without
limitation consequential or incidental damages. “Typical” parameters that may be
provided in Freescale Semiconductor data sheets and/or specifications can and do
vary in different applications and actual performance may vary over time. All operating
parameters, including “Typicals”, must be validated for each customer application by
customer’s technical experts. Freescale Semiconductor does not convey any license
under its patent rights nor the rights of others. Freescale Semiconductor products are
not designed, intended, or authorized for use as components in systems intended for
surgical implant into the body, or other applications intended to support or sustain life,
or for any other application in which the failure of the Freescale Semiconductor product
could create a situation where personal injury or death may occur. Should Buyer
purchase or use Freescale Semiconductor products for any such unintended or
unauthorized application, Buyer shall indemnify and hold Freescale Semiconductor
and its officers, employees, subsidiaries, affiliates, and distributors harmless against all
claims, costs, damages, and expenses, and reasonable attorney fees arising out of,
directly or indirectly, any claim of personal injury or death associated with such
unintended or unauthorized use, even if such claim alleges that Freescale
Semiconductor was negligent regarding the design or manufacture of the part.
Freescalet and the Freescale logo are trademarks of Freescale Semiconductor, Inc.
All other product or service names are the property of their respective owners.
© Freescale Semiconductor, Inc. 2008-2009. All rights reserved.
RoHS-compliant and/or Pb-free versions of Freescale products have the functionality and electrical
characteristics of their non-RoHS-compliant and/or non-Pb-free counterparts. For further
information, see http://www.freescale.com or contact your Freescale sales representative.
For information on Freescale’s Environmental Products program, go to http://www.freescale.com/epp.
MRF1513NT1
Document Number: MRF1513N
Rev. 12, 6/2009
16
RF Device Data
Freescale Semiconductor