FREESCALE MRF1513T1

Freescale Semiconductor
Technical Data
Document Number: MRF1513
Rev. 7, 5/2006
Replaced by MRF1513NT1. There are no form, fit or function changes with this part
replacement. N suffix added to part number to indicate transition to lead - free
terminations.
MRF1513T1
RF Power Field Effect Transistor
Designed for broadband commercial and industrial applications with frequencies to 520 MHz. The high gain and broadband performance of this device
make it ideal for large - signal, common source amplifier applications in 7.5 volt
D
portable and 12.5 volt mobile FM equipment.
• Specified Performance @ 520 MHz, 12.5 Volts
Output Power — 3 Watts
Power Gain — 11 dB
Efficiency — 55%
• Capable of Handling 20:1 VSWR, @ 15.5 Vdc,
520 MHz, 2 dB Overdrive
• Excellent Thermal Stability
G
• Characterized with Series Equivalent Large - Signal
Impedance Parameters
• Broadband UHF/VHF Demonstration Amplifier Information
Available Upon Request
S
• In Tape and Reel. T1 Suffix = 1,000 Units per 12 mm,
7 Inch Reel.
520 MHz, 3 W, 12.5 V
LATERAL N - CHANNEL
BROADBAND
RF POWER MOSFET
CASE 466 - 03, STYLE 1
PLD - 1.5
PLASTIC
Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Drain- Source Voltage
VDSS
- 0.5, +40
Vdc
Gate - Source Voltage
VGS
± 20
Vdc
ID
2
Adc
PD
31.25
0.25
W
W/°C
Storage Temperature Range
Tstg
- 65 to +150
°C
Operating Junction Temperature
TJ
150
°C
Symbol
Value
Unit
RθJC
4
°C/W
Drain Current — Continuous
Total Device Dissipation @ TC = 25°C
Derate above 25°C
(1)
Table 2. Thermal Characteristics
Characteristic
Thermal Resistance, Junction to Case
ARCHIVE INFORMATION
ARCHIVE INFORMATION
N - Channel Enhancement - Mode Lateral MOSFET
Table 3. Moisture Sensitivity Level
Test Methodology
Per JESD 22 - A113, IPC/JEDEC J - STD - 020
1. Calculated based on the formula PD =
Rating
Package Peak Temperature
Unit
1
260
°C
TJ – TC
RθJC
NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and
packaging MOS devices should be observed.
© Freescale Semiconductor, Inc., 2006. All rights reserved.
RF Device Data
Freescale Semiconductor
MRF1513T1
1
Table 4. Electrical Characteristics (TC = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
Zero Gate Voltage Drain Current
(VDS = 40 Vdc, VGS = 0 Vdc)
IDSS
—
—
1
μAdc
Gate - Source Leakage Current
(VGS = 10 Vdc, VDS = 0 Vdc)
IGSS
—
—
1
μAdc
Gate Threshold Voltage
(VDS = 12.5 Vdc, ID = 60 μA)
VGS(th)
1.0
1.7
2.1
Vdc
Drain- Source On - Voltage
(VGS = 10 Vdc, ID = 500 mAdc)
VDS(on)
—
0.65
—
Vdc
Input Capacitance
(VDS = 12.5 Vdc, VGS = 0, f = 1 MHz)
Ciss
—
33
—
pF
Output Capacitance
(VDS = 12.5 Vdc, VGS = 0, f = 1 MHz)
Coss
—
16.5
—
pF
Reverse Transfer Capacitance
(VDS = 12.5 Vdc, VGS = 0, f = 1 MHz)
Crss
—
2.2
—
pF
Common - Source Amplifier Power Gain
(VDD = 12.5 Vdc, Pout = 3 Watts, IDQ = 50 mA, f = 520 MHz)
Gps
10
11
—
dB
Drain Efficiency
(VDD = 12.5 Vdc, Pout = 3 Watts, IDQ = 50 mA, f = 520 MHz)
η
50
55
—
%
Off Characteristics
On Characteristics
Functional Tests (In Freescale Test Fixture)
ARCHIVE INFORMATION
ARCHIVE INFORMATION
Dynamic Characteristics
MRF1513T1
2
RF Device Data
Freescale Semiconductor
C9
+
C8
B2
C7
R4
B1
R3
Z7
R1
Z2
Z3
Z4
Z5
Z6
Z8
C2
C1, C13
C2, C3, C4, C10,
C11, C12
C5, C6, C17
C7, C14
C8, C15
C9, C16
L1
N1, N2
R1, R3
R2
C3
C4
Z9
Z10
+
C14
VDD
N2
Z11
DUT
RF
OUTPUT
C13
C10
C1
B1, B2
C11
C12
C5
Short Ferrite Beads, Fair Rite Products
#2743021446
240 pF, 100 mil Chip Capacitors
R4
Z1
Z2
Z3
Z4
Z5
Z6, Z7
Z8
Z9
Z10
Z11
Board
0 to 20 pF Trimmer Capacitors
120 pF, 100 mil Chip Capacitors
10 mF, 50 V Electrolytic Capacitors
1,200 pF, 100 mil Chip Capacitors
0.1 mF, 100 mil Chip Capacitors
55.5 nH, 5 Turn, Coilcraft
Type N Flange Mounts
15 Ω Chip Resistors (0805)
1 kΩ, 1/8 W Resistor
33 kΩ, 1/8 W Resistor
0.236″ x 0.080″ Microstrip
0.981″ x 0.080″ Microstrip
0.240″ x 0.080″ Microstrip
0.098″ x 0.080″ Microstrip
0.192″ x 0.080″ Microstrip
0.260″ x 0.223″ Microstrip
0.705″ x 0.080″ Microstrip
0.342″ x 0.080″ Microstrip
0.347″ x 0.080″ Microstrip
0.846″ x 0.080″ Microstrip
Glass Teflon®, 31 mils, 2 oz. Copper
Figure 1. 450 - 520 MHz Broadband Test Circuit
TYPICAL CHARACTERISTICS, 450 - 520 MHz
5
0
4
IRL, INPUT RETURN LOSS (dB)
470 MHz
Pout , OUTPUT POWER (WATTS)
ARCHIVE INFORMATION
RF
INPUT
Z1
C15
L1
C6
R2
N1
C16
C17
ARCHIVE INFORMATION
VGG
520 MHz
450 MHz 500 MHz
3
2
1
VDD = 12.5 Vdc
−5
−10
500 MHz
470 MHz
−15
520 MHz
VDD = 12.5 Vdc
0
0
0.05
0.10
0.15
Pin, INPUT POWER (WATTS)
Figure 2. Output Power versus Input Power
0.20
−20
450 MHz
0
1
2
3
Pout, OUTPUT POWER (WATTS)
4
5
Figure 3. Input Return Loss
versus Output Power
MRF1513T1
RF Device Data
Freescale Semiconductor
3
TYPICAL CHARACTERISTICS, 450 - 520 MHz
450 MHz
15
Eff, DRAIN EFFICIENCY (%)
520 MHz
500 MHz
14
GAIN (dB)
70
470 MHz
13
12
11
ARCHIVE INFORMATION
10
1
2
3
Pout, OUTPUT POWER (WATTS)
60
50
30
20
5
4
0
1
Eff, DRAIN EFFICIENCY (%)
450 MHz
470 MHz
500 MHz
5
4
520 MHz
3
2
100
500
200
300
400
IDQ, BIASING CURRENT (mA)
60 470 MHz
500 MHz
55
450 MHz
50
VDD = 12.5 Vdc
Pin = 20.3 dBm
45
VDD = 12.5 Vdc
Pin = 20.3 dBm
0
65 520 MHz
40
600
0
100
Figure 6. Output Power versus Biasing Current
500
200
300
400
IDQ, BIASING CURRENT (mA)
600
Figure 7. Drain Efficiency versus
Biasing Current
5
80
4
3
Eff, DRAIN EFFICIENCY (%)
Pout , OUTPUT POWER (WATTS)
4
70
5
450 MHz
520 MHz
2
470 MHz
500 MHz
Pin = 20.3 dBm
IDQ = 50 mA
1
0
2
3
Pout, OUTPUT POWER (WATTS)
Figure 5. Drain Efficiency versus Output Power
6
Pout , OUTPUT POWER (WATTS)
500 MHz
40
Figure 4. Gain versus Output Power
1
450 MHz
VDD = 12.5 Vdc
VDD = 12.5 Vdc
0
470 MHz
520 MHz
8
9
10
11
12
13
14
15
VDD, SUPPLY VOLTAGE (VOLTS)
Figure 8. Output Power versus Supply Voltage
470 MHz
70
520 MHz
60
450 MHz
50
500 MHz
40
Pin = 20.3 dBm
IDQ = 50 mA
30
16
ARCHIVE INFORMATION
16
20
8
9
10
11
12
13
14
15
16
VDD, SUPPLY VOLTAGE (VOLTS)
Figure 9. Drain Efficiency versus Supply Voltage
MRF1513T1
4
RF Device Data
Freescale Semiconductor
VGG
C9
+
C8
B2
C7
B1
R4
R3
N1
RF
INPUT
Z1
Z2
Z4
Z5
Z6
+
VDD
C13
Z7
Z8
Z9
N2
Z10
DUT
C12
C10
RF
OUTPUT
C11
C1
B1, B2
C1, C12
C2, C3, C4,
C10, C11
C5, C6, C16
C7, C13
C8, C14
C9, C15
L1
N1, N2
R1
R2
C3
C4
C5
Short Ferrite Bead, Fair Rite Products
#2743021446
330 pF, 100 mil Chip Capacitors
R3
R4
Z1
Z2
Z3
Z4
Z5
Z6, Z7
Z8
Z9
Z10
Board
1 to 20 pF Trimmer Capacitors
120 pF, 100 mil Chip Capacitors
10 μF, 50 V Electrolytic Capacitors
1,200 pF, 100 mil Chip Capacitors
0.1 mF, 100 mil Chip Capacitors
55.5 nH, 5 Turn, Coilcraft
Type N Flange Mounts
15 Ω Chip Resistor (0805)
1 kΩ, 1/8 W Resistor
15 Ω Chip Resistor (0805)
33 kΩ, 1/8 W Resistor
0.253″ x 0.080″ Microstrip
0.958″ x 0.080″ Microstrip
0.247″ x 0.080″ Microstrip
0.193″ x 0.080″ Microstrip
0.132″ x 0.080″ Microstrip
0.260″ x 0.223″ Microstrip
0.494″ x 0.080″ Microstrip
0.941″ x 0.080″ Microstrip
0.452″ x 0.080″ Microstrip
Glass Teflon®, 31 mils, 2 oz. Copper
ARCHIVE INFORMATION
C2
Figure 10. 400 - 470 MHz Broadband Test Circuit
TYPICAL CHARACTERISTICS, 400 - 470 MHz
5
0
440 MHz
4
470 MHz
3
2
1
IRL, INPUT RETURN LOSS (dB)
400 MHz
Pout , OUTPUT POWER (WATTS)
ARCHIVE INFORMATION
Z3
C14
L1
C6
R2
R1
C15
C16
VDD = 12.5 Vdc
−5
440 MHz
−10
400 MHz
−15
VDD = 12.5 Vdc
0
0
0.02
0.08
0.04
0.06
Pin, INPUT POWER (WATTS)
0.10
Figure 11. Output Power versus Input Power
0.12
−20
470 MHz
0
1
2
3
Pout, OUTPUT POWER (WATTS)
4
5
Figure 12. Input Return Loss
versus Output Power
MRF1513T1
RF Device Data
Freescale Semiconductor
5
TYPICAL CHARACTERISTICS, 400 - 470 MHz
18
70
440 MHz
GAIN (dB)
16
15
14
13
ARCHIVE INFORMATION
12
1
2
3
Pout, OUTPUT POWER (WATTS)
4
440 MHz
40
30
20
VDD = 12.5 Vdc
10
VDD = 12.5 Vdc
0
400 MHz
50
0
5
0
Figure 13. Gain versus Output Power
1
2
3
Pout, OUTPUT POWER (WATTS)
4
5
Figure 14. Drain Efficiency versus Output
Power
70
6
5
Eff, DRAIN EFFICIENCY (%)
Pout , OUTPUT POWER (WATTS)
400 MHz
440 MHz
4
470 MHz
3
VDD = 12.5 Vdc
Pin = 18.7 dBm
2
1
0
100
200
300
400
IDQ, BIASING CURRENT (mA)
500
65 470 MHz
60 440 MHz
55
400 MHz
50
VDD = 12.5 Vdc
Pin = 18.7 dBm
45
40
600
0
100
Figure 15. Output Power versus
Biasing Current
80
400 MHz
4
440 MHz
Eff, DRAIN EFFICIENCY (%)
Pout , OUTPUT POWER (WATTS)
600
500
Figure 16. Drain Efficiency versus
Biasing Current
5
470 MHz
3
2
Pin = 18.7 dBm
IDQ = 50 mA
1
0
300
400
200
IDQ, BIASING CURRENT (mA)
8
9
10
11
12
13
14
VDD, SUPPLY VOLTAGE (VOLTS)
Figure 17. Output Power versus
Supply Voltage
15
70
470 MHz
60
440 MHz
400 MHz
50
40
Pin = 18.7 dBm
IDQ = 50 mA
30
16
ARCHIVE INFORMATION
400 MHz
Eff, DRAIN EFFICIENCY (%)
17
470 MHz
60
470 MHz
20
8
9
10
11
12
13
14
15
16
VDD, SUPPLY VOLTAGE (VOLTS)
Figure 18. Drain Efficiency versus
Supply Voltage
MRF1513T1
6
RF Device Data
Freescale Semiconductor
C9
+
C8
B2
C7
B1
R4
R3
N1
L1
Z1
Z2
Z3
Z4
Z5
Z7
L2
Z8
C3
B1, B2
C1, C13
C2, C4, C10, C12
C3
C5
C6, C17
C7, C14
C8, C15
C9, C16
C11
L1
L2
L3
C4
VDD
C14
L3
RF
OUTPUT
Z10 C13
Z9
DUT
N2
C10
C1
C2
C11
C12
C5
Short Ferrite Beads, Fair Rite Products
#2743021446
330 pF, 100 mil Chip Capacitors
0 to 20 pF Trimmer Capacitors
12 pF, 100 mil Chip Capacitor
130 pF, 100 mil Chip Capacitor
120 pF, 100 mil Chip Capacitors
10 μF, 50 V Electrolytic Capacitors
1,000 pF, 100 mil Chip Capacitors
0.1 μF, 100 mil Chip Capacitors
18 pF, 100 mil Chip Capacitor
26 nH, 4 Turn, Coilcraft
8 nH, 3 Turn, Coilcraft
55.5 nH, 5 Turn, Coilcraft
L4
N1, N2
R1
R2
R3
R4
Z1
Z2
Z3
Z4
Z5, Z6
Z7
Z8
Z9
Z10
Board
33 nH, 5 Turn, Coilcraft
Type N Flange Mounts
15 W Chip Resistor (0805)
56 W, 1/8 W Chip Resistor
10 W, 1/8 W Chip Resistor
33 kW, 1/8 W Chip Resistor
0.115″ x 0.080″ Microstrip
0.230″ x 0.080″ Microstrip
1.034″ x 0.080″ Microstrip
0.202″ x 0.080″ Microstrip
0.260″ x 0.223″ Microstrip
1.088″ x 0.080″ Microstrip
0.149″ x 0.080″ Microstrip
0.171″ x 0.080″ Microstrip
0.095″ x 0.080″ Microstrip
Glass Teflon®, 31 mils, 2 oz. Copper
Figure 19. 135 - 175 MHz Broadband Test Circuit
TYPICAL CHARACTERISTICS, 135 - 175 MHz
5
0
4
175 MHz
3
135 MHz
IRL, INPUT RETURN LOSS (dB)
Pout , OUTPUT POWER (WATTS)
ARCHIVE INFORMATION
Z6
R1
+
C15
L4
C6
R2
RF
INPUT
C16
C17
ARCHIVE INFORMATION
VGG
155 MHz
2
1
0
VDD = 12.5 Vdc
0
0.05
0.10
0.15
Pin, INPUT POWER (WATTS)
Figure 20. Output Power versus Input Power
0.20
−5
135 MHz
−10
155 MHz
175 MHz
−15
−20
VDD = 12.5 Vdc
0
1
2
3
Pout, OUTPUT POWER (WATTS)
4
5
Figure 21. Input Return Loss
versus Output Power
MRF1513T1
RF Device Data
Freescale Semiconductor
7
TYPICAL CHARACTERISTICS, 135 - 175 MHz
Eff, DRAIN EFFICIENCY (%)
175 MHz
16
15
14
13
ARCHIVE INFORMATION
12
1
2
3
Pout, OUTPUT POWER (WATTS)
4
155 MHz
50
175 MHz
40
30
20
VDD = 12.5 Vdc
10
VDD = 12.5 Vdc
0
135 MHz
60
155 MHz
17
GAIN (dB)
70
135 MHz
0
5
Figure 22. Gain versus Output Power
Eff, DRAIN EFFICIENCY (%)
Pout , OUTPUT POWER (WATTS)
175 MHz
5
155 MHz
4
135 MHz
3
VDD = 12.5 Vdc
Pin = 19.5 dBm
0
100
500
200
300
400
IDQ, BIASING CURRENT (mA)
75
175 MHz
70
155 MHz
65
135 MHz
60
VDD = 12.5 Vdc
Pin = 19.5 dBm
55
50
600
0
100
Figure 24. Output Power versus
Biasing Current
500
300
400
200
IDQ, BIASING CURRENT (mA)
600
Figure 25. Drain Efficiency versus
Biasing Current
5
80
4
3
Eff, DRAIN EFFICIENCY (%)
Pout , OUTPUT POWER (WATTS)
4
80
5
175 MHz
2
135 MHz
155 MHz
Pin = 19.5 dBm
IDQ = 50 mA
1
0
2
3
Pout, OUTPUT POWER (WATTS)
Figure 23. Drain Efficiency versus Output
Power
6
2
1
0
8
9
10
11
12
13
14
VDD, SUPPLY VOLTAGE (VOLTS)
Figure 26. Output Power versus
Supply Voltage
15
70
135 MHz
60
155 MHz
50
40
Pin = 19.5 dBm
IDQ = 50 mA
30
16
175 MHz
ARCHIVE INFORMATION
18
20
8
9
10
11
12
13
14
15
16
VDD, SUPPLY VOLTAGE (VOLTS)
Figure 27. Drain Efficiency versus
Supply Voltage
MRF1513T1
8
RF Device Data
Freescale Semiconductor
470
f = 520 MHz
f = 520 MHz
f = 400 MHz
ZOL*
135
f = 400 MHz
450
Zin
470
ZOL*
Zo = 10 Ω
ARCHIVE INFORMATION
Zin
Zin
ZOL*
135
f = 175 MHz
Zo = 10 Ω
f = 175 MHz
VDD = 12.5 V, IDQ = 50 mA, Pout = 3 W
VDD = 12.5 V, IDQ = 50 mA, Pout = 3 W
f
MHz
Zin
Ω
ZOL*
Ω
f
MHz
Zin
Ω
ZOL*
Ω
f
MHz
450
4.64 +j5.82
13.11 +j2.15
400
4.72 +j4.38
12.57 +j1.88
135
16.55 +j1.82 22.01 +j10.32
470
5.42 +j6.34
12.16 +j3.26
440
4.88 +j6.34
11.21 +j5.87
155
15.59 +j5.38
22.03 +j8.07
500
5.96 +j5.45
11.03 +j5.42
470
3.22 +j5.24
9.82 +j8.63
175
15.55 +j9.43
22.08 +j6.85
520
4.28 +j4.94
10.99 +j7.18
= Complex conjugate of source
impedance with parallel 15 Ω
resistor and 120 pF capacitor in
series with gate. (See Figure 1).
Zin
ZOL* = Complex conjugate of the load
impedance at given output power,
voltage, frequency, and ηD > 50 %.
VDD = 12.5 V, IDQ = 50 mA, Pout = 3 W
= Complex conjugate of source
impedance with parallel 15 Ω
resistor and 130 pF capacitor in
series with gate. (See Figure 10).
ZOL* = Complex conjugate of the load
impedance at given output power,
voltage, frequency, and ηD > 50 %.
Zin
Zin
Ω
= Complex conjugate of source
impedance with parallel 15 Ω
resistor and 130 pF capacitor in
series with gate. (See Figure 19).
ZOL* = Complex conjugate of the load
impedance at given output power,
voltage, frequency, and ηD > 50 %.
Note: ZOL* was chosen based on tradeoffs between gain, drain efficiency, and device stability.
Input
Matching
Network
Output
Matching
Network
Device
Under Test
Z
in
ZOL*
Ω
ARCHIVE INFORMATION
Zin
450
Z
*
OL
Figure 28. Series Equivalent Input and Output Impedance
MRF1513T1
RF Device Data
Freescale Semiconductor
9
Table 5. Common Source Scattering Parameters (VDD = 12.5 Vdc)
S21
S12
S22
f
MHz
|S11|
∠φ
|S21|
∠φ
|S12|
∠φ
|S22|
∠φ
50
0.93
- 94
22.09
125
0.044
33
0.77
- 81
100
0.81
- 131
12.78
101
0.052
6
0.61
- 115
200
0.76
- 153
6.31
81
0.047
- 10
0.59
- 135
300
0.76
- 160
3.92
69
0.044
- 19
0.64
- 142
400
0.77
- 164
2.74
60
0.040
- 26
0.70
- 147
500
0.79
- 167
1.99
54
0.036
- 31
0.75
- 151
600
0.80
- 169
1.55
48
0.034
- 37
0.80
- 155
700
0.81
- 171
1.25
44
0.028
- 40
0.82
- 158
800
0.82
- 172
1.02
38
0.027
- 42
0.86
- 161
900
0.83
- 173
0.85
35
0.017
- 42
0.88
- 163
1000
0.84
- 175
0.70
29
0.018
- 49
0.91
- 166
IDQ = 500 mA
S11
S21
S12
S22
f
MHz
50
|S11|
∠φ
|S21|
∠φ
|S12|
∠φ
|S22|
∠φ
0.84
- 127
32.57
112
0.025
17
0.64
- 130
100
0.80
- 152
17.23
97
0.025
13
0.64
- 153
200
0.78
- 166
8.62
85
0.025
-9
0.65
- 163
300
0.78
- 171
5.58
79
0.023
-9
0.67
- 166
400
0.78
- 173
4.08
72
0.022
-9
0.69
- 166
500
0.78
- 175
3.14
68
0.020
- 10
0.71
- 167
600
0.79
- 176
2.55
63
0.022
- 15
0.74
- 168
700
0.79
- 177
2.14
60
0.019
- 20
0.76
- 168
800
0.80
- 178
1.80
54
0.018
- 31
0.79
- 170
900
0.81
- 178
1.54
51
0.015
- 25
0.80
- 170
1000
0.82
- 179
1.31
46
0.012
- 36
0.81
- 172
IDQ = 1 A
S11
S21
S12
S22
f
MHz
50
|S11|
∠φ
|S21|
∠φ
|S12|
∠φ
|S22|
∠φ
0.84
- 129
32.57
111
0.023
24
0.61
- 137
100
0.80
- 153
17.04
97
0.024
13
0.64
- 156
200
0.78
- 167
8.52
85
0.023
5
0.65
- 165
300
0.77
- 172
5.53
79
0.020
-7
0.67
- 167
400
0.77
- 174
4.06
73
0.020
- 11
0.69
- 167
500
0.78
- 175
3.13
69
0.021
-9
0.72
- 167
600
0.78
- 177
2.54
64
0.017
- 26
0.74
- 168
700
0.78
- 177
2.13
60
0.017
- 14
0.75
- 168
800
0.79
- 178
1.81
55
0.015
- 23
0.78
- 170
900
0.80
- 178
1.54
51
0.013
- 31
0.79
- 170
1000
0.80
- 179
1.30
46
0.011
- 17
0.80
- 172
ARCHIVE INFORMATION
ARCHIVE INFORMATION
IDQ = 50 mA
S11
MRF1513T1
10
RF Device Data
Freescale Semiconductor
DESIGN CONSIDERATIONS
This device is a common - source, RF power, N - Channel
enhancement mode, Lateral Metal - Oxide Semiconductor
Field - Effect Transistor (MOSFET). Freescale Application
Note AN211A, “FETs in Theory and Practice”, is suggested
reading for those not familiar with the construction and characteristics of FETs.
This surface mount packaged device was designed primarily for VHF and UHF portable power amplifier applications. Manufacturability is improved by utilizing the tape and
reel capability for fully automated pick and placement of
parts. However, care should be taken in the design process
to insure proper heat sinking of the device.
The major advantages of Lateral RF power MOSFETs include high gain, simple bias systems, relative immunity from
thermal runaway, and the ability to withstand severely mismatched loads without suffering damage.
MOSFET CAPACITANCES
The physical structure of a MOSFET results in capacitors
between all three terminals. The metal oxide gate structure
determines the capacitors from gate - to - drain (Cgd), and
gate - to - source (Cgs). The PN junction formed during fabrication of the RF MOSFET results in a junction capacitance
from drain - to - source (Cds). These capacitances are characterized as input (Ciss), output (Coss) and reverse transfer
(Crss) capacitances on data sheets. The relationships between the inter - terminal capacitances and those given on
data sheets are shown below. The Ciss can be specified in
two ways:
1. Drain shorted to source and positive voltage at the gate.
2. Positive voltage of the drain in respect to source and zero
volts at the gate.
In the latter case, the numbers are lower. However, neither
method represents the actual operating conditions in RF applications.
Drain
Cgd
Gate
Cds
Ciss = Cgd + Cgs
Coss = Cgd + Cds
Crss = Cgd
Cgs
Source
DRAIN CHARACTERISTICS
One critical figure of merit for a FET is its static resistance
in the full - on condition. This on - resistance, RDS(on), occurs
in the linear region of the output characteristic and is specified at a specific gate - source voltage and drain current. The
drain - source voltage under these conditions is termed
VDS(on). For MOSFETs, VDS(on) has a positive temperature
coefficient at high temperatures because it contributes to the
power dissipation within the device.
BVDSS values for this device are higher than normally required for typical applications. Measurement of BVDSS is not
recommended and may result in possible damage to the device.
GATE CHARACTERISTICS
The gate of the RF MOSFET is a polysilicon material, and
is electrically isolated from the source by a layer of oxide.
The DC input resistance is very high - on the order of 109 Ω
— resulting in a leakage current of a few nanoamperes.
Gate control is achieved by applying a positive voltage to
the gate greater than the gate - to - source threshold voltage,
VGS(th).
Gate Voltage Rating — Never exceed the gate voltage
rating. Exceeding the rated VGS can result in permanent
damage to the oxide layer in the gate region.
Gate Termination — The gates of these devices are essentially capacitors. Circuits that leave the gate open - circuited or floating should be avoided. These conditions can
result in turn - on of the devices due to voltage build - up on
the input capacitor due to leakage currents or pickup.
Gate Protection — These devices do not have an internal
monolithic zener diode from gate - to - source. If gate protection is required, an external zener diode is recommended.
Using a resistor to keep the gate - to - source impedance low
also helps dampen transients and serves another important
function. Voltage transients on the drain can be coupled to
the gate through the parasitic gate - drain capacitance. If the
gate - to - source impedance and the rate of voltage change
on the drain are both high, then the signal coupled to the gate
may be large enough to exceed the gate - threshold voltage
and turn the device on.
DC BIAS
Since this device is an enhancement mode FET, drain current flows only when the gate is at a higher potential than the
source. RF power FETs operate optimally with a quiescent
drain current (IDQ), whose value is application dependent.
This device was characterized at IDQ = 150 mA, which is the
suggested value of bias current for typical applications. For
special applications such as linear amplification, IDQ may
have to be selected to optimize the critical parameters.
The gate is a dc open circuit and draws no current. Therefore, the gate bias circuit may generally be just a simple resistive divider network. Some special applications may
require a more elaborate bias system.
GAIN CONTROL
Power output of this device may be controlled to some degree with a low power dc control signal applied to the gate,
thus facilitating applications such as manual gain control,
ALC/AGC and modulation systems. This characteristic is
very dependent on frequency and load line.
ARCHIVE INFORMATION
ARCHIVE INFORMATION
APPLICATIONS INFORMATION
MRF1513T1
RF Device Data
Freescale Semiconductor
11
Large - signal impedances are provided, and will yield a good
first pass approximation.
Since RF power MOSFETs are triode devices, they are not
unilateral. This coupled with the very high gain of this device
yields a device capable of self oscillation. Stability may be
achieved by techniques such as drain loading, input shunt
resistive loading, or output to input feedback. The RF test fixture implements a parallel resistor and capacitor in series
with the gate, and has a load line selected for a higher efficiency, lower gain, and more stable operating region.
Two - port stability analysis with this device’s
S - parameters provides a useful tool for selection of loading
or feedback circuitry to assure stable operation. See Freescale Application Note AN215A, “RF Small - Signal Design
Using Two - Port Parameters” for a discussion of two port
network theory and stability.
ARCHIVE INFORMATION
ARCHIVE INFORMATION
MOUNTING
The specified maximum thermal resistance of 4°C/W assumes a majority of the 0.065″ x 0.180″ source contact on
the back side of the package is in good contact with an appropriate heat sink. As with all RF power devices, the goal of
the thermal design should be to minimize the temperature at
the back side of the package. Refer to Freescale Application
Note AN4005/D, “Thermal Management and Mounting Method for the PLD - 1.5 RF Power Surface Mount Package,” and
Engineering Bulletin EB209/D, “Mounting Method for RF
Power Leadless Surface Mount Transistor” for additional information.
AMPLIFIER DESIGN
Impedance matching networks similar to those used with
bipolar transistors are suitable for this device. For examples
see Freescale Application Note AN721, “Impedance
Matching Networks Applied to RF Power Transistors.”
MRF1513T1
12
RF Device Data
Freescale Semiconductor
NOTES
MRF1513T1
RF Device Data
Freescale Semiconductor
13
NOTES
MRF1513T1
14
RF Device Data
Freescale Semiconductor
PACKAGE DIMENSIONS
0.146
3.71
A
F
0.095
2.41
3
B
D
1
2
R
0.115
2.92
0.115
2.92
L
0.020
0.51
4
0.35 (0.89) X 45_" 5 _
N
K
Q
ÉÉÉ
ÉÉ
ÉÉ
ÉÉÉ
ÉÉ
ÉÉ
ÉÉÉ
ÉÉ
ÉÉ
ÉÉÉ
ÉÉ
ÉÉ
ÉÉÉ
ÉÉÉÉ
C
4
ZONE W
1
2
3
S
G
ZONE X
VIEW Y - Y
mm
SOLDER FOOTPRINT
P
U
H
ZONE V
inches
10_DRAFT
Y
Y
E
NOTES:
1. INTERPRET DIMENSIONS AND TOLERANCES
PER ASME Y14.5M, 1984.
2. CONTROLLING DIMENSION: INCH
3. RESIN BLEED/FLASH ALLOWABLE IN ZONE V, W,
AND X.
STYLE 1:
PIN 1.
2.
3.
4.
DRAIN
GATE
SOURCE
SOURCE
CASE 466 - 03
ISSUE D
PLD- 1.5
PLASTIC
DIM
A
B
C
D
E
F
G
H
J
K
L
N
P
Q
R
S
U
ZONE V
ZONE W
ZONE X
INCHES
MIN
MAX
0.255
0.265
0.225
0.235
0.065
0.072
0.130
0.150
0.021
0.026
0.026
0.044
0.050
0.070
0.045
0.063
0.160
0.180
0.273
0.285
0.245
0.255
0.230
0.240
0.000
0.008
0.055
0.063
0.200
0.210
0.006
0.012
0.006
0.012
0.000
0.021
0.000
0.010
0.000
0.010
MILLIMETERS
MIN
MAX
6.48
6.73
5.72
5.97
1.65
1.83
3.30
3.81
0.53
0.66
0.66
1.12
1.27
1.78
1.14
1.60
4.06
4.57
6.93
7.24
6.22
6.48
5.84
6.10
0.00
0.20
1.40
1.60
5.08
5.33
0.15
0.31
0.15
0.31
0.00
0.53
0.00
0.25
0.00
0.25
MRF1513T1
RF Device Data
Freescale Semiconductor
15
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MRF1513T1
Document Number: MRF1513
Rev. 7, 5/2006
16
RF Device Data
Freescale Semiconductor