PAGE 1 OF 6 ATMEL CORPORATION Tel:(408)441-0311 Fax:(408)436-4200 AT-28HC64 CMOS EEPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - CYCLE TEST * This report was generated from AT-28HC64 reliability testing. This data is applicable to the following device types due to same technology grouping as defined in MIL-M-38535 Appendix A: AT-28HC191/291 AT-28PC64 AT-28C256 AT-28HC16/17 JULY 2003 2325 Orchard Parkway San Jose CA. 95131 PAGE 2 OF 6 AT-28HC64 125°C DYNAMIC OPERATING LIFE TEST LOT NUMBER 72-2 141-5 141-3 81492-1 98760 92098 03302 03225-2 06561 033474C 234583C1 4B0907 DATE CODE SAMPLE SIZE 8716 8734 8734 8C8844 9D9006 0B9024 0C9035 0D9105 1D9148 2B9226 3A9309 4B9429 77 77 77 78 77 80 77 78 45 45 45 79 TOTAL CKT-HRS(K) 77.0 77.0 77.0 78.0 77.0 80.0 77.0 78.0 45.0 45.0 45.0 79.0 NUMBER OF FAILURES 0 0 0 0 0 0 0 0 0 0 0 0 FAILURE RATE TOTAL DEVICE HOURS BEST ESTIMATE 835,000 DEVICE HOURS λ 50°C AMBIENT λ CONFIDENCE ESTIMATE λ λ = 0.08% PER 1,000 HOURS EXTRAPOLATION TO 50°C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF 0.5eV = 0.003% PER 1,000 HOURS (28 FITS) 60 = 0.004% PER 1,000 HOURS 60% CONFIDENCE (37 FITS) 90 = 0.01% PER 1,000 HOURS 90% CONFIDENCE (92 FITS) PAGE 3 OF 6 AT-28HC64 200°C DATA RETENTION BAKE LOT NUMBER DATE CODE SAMPLE SIZE 4B0907 4B9429 79 TOTAL CKT-HRS(K) NUMBER OF FAILURES 79.0 0 FAILURE RATE TOTAL DEVICE HOURS BEST ESTIMATE 79,000 DEVICE HOURS λ 50°C AMBIENT λ CONFIDENCE ESTIMATE λ λ = 0.90% PER 1,000 HOURS EXTRAPOLATION TO 50°C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF 0.5eV = 0.003% PER 1,000 HOURS (30 FITS) 60 = 0.004% PER 1,000 HOURS 60% CONFIDENCE (40 FITS) 90 = 0.1% PER 1,000 HOURS 90% CONFIDENCE (98 FITS) PAGE 4 OF 6 AT-28HC64 PLASTIC PACKAGE 125°C DYNAMIC OPERATING LIFE TEST LOT NUMBER ------ DATE CODE ----- PKG TYPE ---- SAMPLE SIZE ------ TOTAL NUMBER OF CKT-HRS(K) FAILS ------------------ 93038 9C8944 28 PDIP 77 77.0 0 93417 9C8944 28 PDIP 80 80.0 0 3B0279K 3B9330 28 PDIP 77 77.0 0 FAILURE RATE TOTAL DEVICE HOURS BEST ESTIMATE 234,000 DEVICE HOURS λ 50°C AMBIENT λ CONFIDENCE ESTIMATE λ λ = 0.3% PER 1,000 HOURS EXTRAPOLATION TO 50°C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF 0.5eV = 0.01% PER 1,000 HOURS (100 FITS) 60 = 0.13% PER 60% CONFIDENCE 90 = 0.03% PER 90% CONFIDENCE 1,000 HOURS (132 FITS) 1,000 HOURS (300 FITS) PAGE 5 OF 6 AT-28HC64 PLASTIC PACKAGE PRESSURE POT TEST DATE CODE ---- PKG TYPE ---- SAMPLE SIZE ------ NUMBER OF FAILURES AT INDICATED HOURS -----------------(24) (48) (72) (96) 8806 32 PLCC 42 0 0 0 0 8B8833 28 PDIP 52 0 0 0 0 8D8907 28 PDIP 40 0 0 0 0 9D8950 28 PDIP 44 0 0 0 0 9D9011 28 PDIP 45 0 0 0 0 0B9021 32 PLCC 45 0 0 0 0 3B9330 28 PDIP 45 0 0 0 0 PAGE 6 OF 6 Data cycling followed by 200°C bakes were performed to determine the device endurance. Each address was byte cycled through all addresses. The parts were baked and then verified. The results of the cycling tests are shown below. No device failures have been found. CYCLE TEST RESULTS OF AT-28HC64 LOT BAKE NUMBER TIME DATE SAMPLE NO. OF NO. OF BAKE CODE SIZE BYTE CYCLE FAILURES TEMP 98760 hrs 9D9006 77 10,000 0 200°C 176 03302 hrs 0C9035 77 10,000 0 200°C 176 06561 hrs 1D9148 45 10,000 0 200°C 176 033474C hrs 2B9226 45 10,000 0 200°C 176 234583C1 hrs 3A9309 45 10,000 0 200°C 176 4B0907 hrs 4B9429 79 10,000 0 200°C 176