Efficiency through technology
RELIABILITY REPORT
1/05
Power Semiconductor Devices
January 2003 - December 2004
IXYS Corporation
3540 Bassett Street
Santa Clara CA 95054
USA
IXDN0008
Published February 2005
IXYS Semiconductor GmbH
Edisonstrasse 15
D-68623 Lampertheim
Germany
Humidity Test
QUALITY AND RELIABILITY
Failure Modes: Degradation of electrical leakage
characteristics due to moisture penetration into plastic
packages.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, IGSS, IGES,
VTH.
IXYS is committed to setting a new standard for excellence in Power Semiconductors. Reflecting our
dedication to industry leadership in the manufacture of
medium to high power devices, reliability has assumed a primary position in raw material selection,
design, and process technology.
Reliability utilizes information derived from applied
research, engineering design, analysis of field applications and accelerated stress testing and integrates
this knowledge to optimize device design and manufacturing processes.
All areas that impact reliability have received considerable attention in order to achieve our goal to be the
# 1 Reliability Supplier of Power Semiconductor products. We believe IXYS products should be the most
reliable components in your system.
We have committed significant resources to continuously improve and optimize our device design, wafer
fab processes, assembly processes and test capabilities. As a result of this investment, IXYS has realized
a dramatic improvement in reliability performance on
all standardized tests throughout the product line.
Excellence in product reliability is “built-in”, not testedin. Moreover, it requires a total systems approach,
involving all parties: from design to raw materials to
manufacturing.
In addition to qualifying new products released to the
market, life and environmental tests are periodically
performed on standard products to maintain feedback
on assembly and fabrication performance to assure
product reliability. Further information on reliability of
power devices is provided on www.ixys.com.
Power Cycle
Failure Modes: Thermal fatigue of silicon-metal and
metal-metal interfaces due to heating and cooling can
cause thermal and electrical performance degradation.
Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF, IDSS,
ICES, IDRM, IRRM, BVDSS, BVCES, VDRRM,
VRRM.
TERMS IN TABLES
SUMMARY TABLES 1 AND 2:
AF: acceleration factor
AF = exp { Ea *[ (T2 -T1) / ( T2 * T1 ) ] / k }
(1)
Ea: activation energy; @ HTRB Ea = 1.0 eV
@ HTGB Ea = 0.4 eV
-5
k: Boltzmann’s constant 8.6·10 eV/K
T1: abs. application junction temperature (273+Tj) K
T2: abs. test junction temperature (273+Tj) K
UCL: upper confidence limit (60%)
Total Failures @ 60% UCL:
RELIABILITY TESTS
N = r + dr
High Temperature Reverse Bias (HTRB)
(2)
r: number of failed devices
dr: additional term, depending on both r and UCL
Failure Modes: Gradual degradation of break-down
characteristics due to presence of foreign materials
and polar/ionic contaminants disturbing the electric
field termination structure.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, VTH.
MTTF: Mean Time To Failures = 1/Failure Rate
9
FIT: 1 FIT = 1 failure / 10 hrs
TABLES 3:
∆T: max Tj - min Tj during Test
High Temperature Gate Bias (HTGB)
Failure Modes: Rupture of the gate oxide due to localized thickness variations, structural anomalies,
particulates in the oxide, channel inversion due to
presence of mobile ions in the gate oxide.
Sensitive Parameters: IGSS, IGES,VTH, IDSS, ICES.
DEFINITION OF FAILURE
Failure criteria are defined according to IEC 60747
standard series
DEFINITION OF RoHS COMPLIANT
Temperature Cycle
Acronym RoHS stands for Restriction of Hazardous
Substances (Directive 2002/95/EC).
Failure modes: Thermal fatigue of silicon-metal and
metal-metal interfaces due to heating and cooling,
causing thermal and electrical performance degradation.
Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF.
There is a note in columns "Remark" only if the part
was tested in a RoHS compliant status and if the family to which it belongs was non compliant before.
(see also http://www.ixys.com/prodinfor.html)
2
Summary of Tables 1A - 1J: HTRB
Failure Rate [FIT] 125°C, 60% UCL
Failure Rate [FIT] 90°C, 60% UCL
Total Lots Tested
Total Devices Tested
Total
Actual
Failures
60% UCL {eq. (2)}
Total Equivalent Device Hours
@ 125°C {AF eq. (1)}
MTTF
125°C 60% UCL
(Years)
90°C 60% UCL
Table 1A
Table 1B
Table 1C
Table 1D
Table 1E
Table 1F
Table 1G
Table 1H
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
ISOPLUS
discrete device *)
Module
Module
Rec. Bridge*)
*)
Diode*)
discrete device*)
343
21
91
2616
0
0,92
40140
2404
7
65
0
0,92
6813
408
26
270
0
0,92
13241
793
18
180
0
0,92
10123
606
16
300
0
0,92
11039
661
14
250
0
0,92
3669
220
10
180
0
0,92
13
270
0
-
2679480
332
5552
22920
3
47
135035
17
280
69480
9
144
90883
11
188
83344
10
173
250734
31
520
293606
-
Summary of Table 2A - 2C: HTGB
Failure Rate [FIT] 125°C, 60% UCL
Failure Rate [FIT] 90°C, 60% UCL
Total Lots Tested
Total Devices Tested
Total
Actual
Failures
60% UCL {eq. (2)}
Total Equivalent Device Hours
@ 125°C {AF eq. (1)}
MTTF
125°C 60% UCL
(Years)
90°C 60% UCL
Table 2A
Table 2B
Table 2C
MOSFET/IGBT
MOSFET/IGBT
ISOPLUS
discrete device *)
Module
487
157
65
1866
0
0,92
32394
10450
5
50
0
0,92
3
50
0
-
1889440
234
727
28400
4
11
41680
-
*) including ISOPLUS
3
Summary of Tables 3A - 3H: Power Cycle
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Cycles
Table 3A
Table 3C
Table3D
Table 3E
Table 3F
Table 3G
Table 3H
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Isoplus
discrete device *)
Module
Rec. Bridge*)
*)
Diode*)
discrete device*)
22
520
0
4755200
6
80
0
1890000
7
66
0
260360
13
220
0
820000
3
60
0
180000
10
200
0
920000
4
84
0
540000
Summary of Tables 4A - 4J: Temperature Cycle
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Cycles
Table 4A
Table 4B
Table 4C
Table4D
Table 4E
Table 4F
Table 4G
Table 4H
Table 4J
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Isoplus
Breakover
discrete device *)
Module
Module
Rec. Bridge*)
*)
Diode*)
discrete device*)
29
746
0
103800
6
60
0
4500
29
360
2
39500
23
225
2
18200
22
420
2
33600
21
470
1
34900
23
350
0
24400
16
370
0
40400
Diode
Summary of Tables 5A - 5H: Humidity Test
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Hours
Table 5A
Table 5C
Table5D
Table 5E
Table 5F
Table 5G
Table 5H
Table 5J
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Isoplus
Breakover
discrete device *)
Module
Rec. Bridge*)
*)
Diode*)
discrete device*)
12
340
0
52560
1
10
0
10000
5
50
0
25040
8
150
0
11280
3
60
0
5760
8
150
1
12000
*) including ISOPLUS
4
Diode
6
140
0
16320
3
60
0
2880
7
120
0
10000
HTRB (Tables 1A .. 1J)
TABLE 1A: MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
1 IRFP450
CK 0420
400
2 IXBH40N160
1047
1280
3 IXBH9N160G
1103
1280
4 IXDA20N120AS
757
960
5 IXDA20N120AS
757
960
6 IXDH30N120D1
1007
960
7 IXEH25N120
829
960
8 IXFB70N60Q2
SP 0335
480
9 IXFB80N50Q
SP 0251
400
10 IXFH12N100F
SP 0130
800
11 IXFH21N50
SK 0407
400
12 IXFH21N50Q
SK 0245
400
13 IXFH21N50Q
MP 0423
400
14 IXFH23N80Q
SK 0401
640
15 IXFH24N50
SK 0313
400
16 IXFH24N50
MP 0419
400
17 IXFH26N50
SP 0237
400
18 IXFH26N50Q
SP 0308
400
19 IXFH26N50Q
SK 0316
400
20 IXFH26N50Q
MP 0431
400
21 IXFH26N60Q
SK 0310
480
22 IXFH26N60Q
SK 0405
480
23 IXFH32N50Q
SK 0330
400
24 IXFH36N50P
SP 0436
400
25 IXFH50N20
SK 0325
160
26 IXFH6N100Q
TK 0401
800
27 IXFH80N10Q
SK 0313
80
28 IXFH80N10Q
SK 0416
80
29 IXFH9N80
CP 0423
640
30 IXFK34N80
SP 0345
640
31 IXFK48N50
SP 0309
400
32 IXFK48N50
SP 0417
400
33 IXFK73N30Q
SP 0311
240
34 IXFN48N50
SP 0417
400
35 IXFX21N100Q
SP 0436
800
36 IXFX27N80Q
SP 0419
640
37 IXFX34N80
SP 0422
640
38 IXFX38N80Q2
SP 0403
640
39 IXFX48N50Q
SP 0339
400
40 IXFX48N50Q
SP 0434
400
41 IXFX55N50F
SP 0305
400
42 IXGH28N120B
SK 0301
800
43 IXGH28N120B
SK 0305
800
44 IXGR40N60C2
SP 0337
480
45 IXKC20N60C
1018
480
46 IXKN40N60C
838
480
47 IXKR40N60C
987
480
48 IXTM1N100
TP 0423
800
49 IXTM1N100
TP 0423
800
50 IXTM1N100
TP 0424
800
51 IXTH20N60
MP 0419
480
52 IXTH28N50Q
MK 0352
400
53 IXTH41N25
SP 0311
200
54 IXTH48N20
SP 0315
160
55 IXTH72N20
SK 0306
160
56 IXTH75N15
SK 0306
120
57 IXTH75N15
SK 0338
120
58 IXTH75N15
SK 0402
120
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
168
1000
1000
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
5
Sample
Size
30
20
20
20
20
20
20
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
20
10
20
32
32
32
30
30
30
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
20000
3360
20000
20000
3360
20000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
20000
1680
20000
32000
32000
32000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
59 IXTH75N15
SK 0415
120
60 IXTH75N15
SK 0425
120
61 IXTH75N15
SK 0439
120
62 IXTH75N15
SK 0442
120
63 IXTH88N30P
SK 0348
240
64 IXTK102N30P
SS 0349
240
65 IXTK120N25
SP 0305
200
66 IXTK250N10
SP 0318
80
67 IXTK62N25
SS 0348
200
68 IXTK62N25
SP 0413
200
69 IXTK62N25
SS 0420
200
70 IXTK62N25
SS 0428
200
71 IXTK80N25
SS 0347
200
72 IXTK82N25P
SS 0403
200
73 IXTK88N30P
SS 0403
240
74 IXTN79N20
1140
160
75 IXTQ23N60Q
MK 0421
480
76 IXTQ26N50P
SK 0435
400
77 IXTQ36N30P
SK 0405
240
78 IXTQ42N25P
SK 0405
200
79 IXTQ50N20P
SK 0405
160
80 IXTQ62N15P
SK 0405
120
81 IXTQ64N25P
SK 0405
200
82 IXTQ69N30P
SK 0425
240
83 IXTQ74N20P
SK 0403
160
84 IXTQ74N20P
SK 0405
160
85 IXTQ75N10P
SK 0405
80
86 IXTQ82N25P
SW 0435
200
87 IXTQ82N25P
SK 0431
200
88 IXTQ88N30P
SK 0402
240
89 IXTQ96N15P
SK 0402
120
90 IXTQ96N20P
SK 0403
160
91 IXTQ96N20P
SK 0405
160
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
125
150
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
10
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
Failures
TABLE 1B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MKI50-12F7
932
2 MUBW15-12A7
964
3 MUBW30-12E6K
1127
4 MWI25-12E7
1013
5 MWI75-12A8
677
6 MWI75-12A8
677
7 VMM300-03FP
636
Temp.
[°C]
125
125
125
125
125
125
125
Time
[hrs]
1000
120
168
168
1000
168
168
Sample
Size
5
10
10
10
10
10
10
Failures
Voltage
[V]
960
1120
1120
960
960
960
240
6
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
1680
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Device Hours
[hrs]
5000
1200
1680
1680
10000
1680
1680
Remark
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
Remark
TABLE 1C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCC122-16
1023
2 MCC122-16
1023
3 MCC162
874
4 MCC162-16
922
5 MCC162-18
732
6 MCC250-16
652
7 MCC26-16
796
8 MCC26-16
912
9 MCC310-16
870
10 MCC310-16
969
11 MCC44
1027
12 MCC56
888
13 MCC56-18
696
14 MCC72-16
727
15 MCC95-16io1
598
16 MCC95-16io1
599
17 MCC95-16io1B
816
18 MCD56-16io1B
809
19 MCO150-12io1
607
20 MCO150-12io1
607
21 MCO50-16io1
1154
22 MDD56-16
679
23 MDD56-18
739
24 MDD95-16
971
25 MDD95-16
971
26 MDO500-22
815
Voltage
[V]
1120
1120
1260
1120
1260
1120
1120
1120
1120
1120
1260
1260
1260
1120
1120
1280
1120
1120
960
840
1120
1120
1260
1120
1120
1540
Temp.
[°C]
125
130
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
150
125
Time
[hrs]
168
1000
168
168
168
168
500
168
168
168
1000
168
1000
168
168
168
168
500
1000
168
1000
168
1000
168
1000
168
Sample
Size
10
10
10
10
10
10
10
10
10
10
10
10
20
10
10
10
10
10
10
10
10
10
10
10
10
10
Failures
TABLE 1D: Controller/Rectifier Bridge
Date Code
# Part Number
or
Test #
1 MMO75-16
761
2 MMO75-17AB
1002
3 VBH40-05B
814
4 VBH40-05B
814
5 VBO105-18NO7
1090
6 VBO19-16DT1
794
7 VBO25-16AO2
1057
8 VBO40-16NO6
1014
9 VUB120-16NO2
833
10 VUB72-16
835
11 VUM24-05
846
12 VUM24-05
846
13 VUO121-16NO1
709
14 VUO121-16NO1
999
15 VUO34-18
907
16 VUO36-16NO8
740
17 VUO50-16
625
18 VVY40-16
700
Voltage
[V]
1120
1190
840
400
1260
1120
1120
1120
960
960
560
400
1120
1120
1260
1120
1120
1120
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
168
168
168
168
168
168
168
1000
500
300
300
1000
1000
1000
168
168
168
Sample
Size
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
Failures
7
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
1680
10000
1680
1680
1680
1680
5000
1680
1680
1680
10000
1680
20000
1680
1680
1680
1680
5000
10000
1680
10000
1680
10000
1680
10000
1680
Remark
Device Hours
[hrs]
1680
1680
1680
1680
1680
1680
1680
1680
10000
5000
3000
3000
10000
10000
10000
1680
1680
1680
Remark
Input - Rectifier
Mosfet
Input - Rectifier
Mosfet, FRED
TABLE 1E: FRED
Date Code
or
Test #
1148
1049
742
600
1121
889
722
1004
960
715
1114
1114
902
791
1118
714
Voltage
[V]
320
480
200
240
240
320
960
960
960
960
480
600
480
480
960
600
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
Time
[hrs]
168
168
1000
168
168
168
1000
168
168
168
168
168
168
168
168
168
Sample
Size
20
20
20
20
20
20
10
10
20
20
20
20
20
20
20
20
Failures
Date Code
or
Test #
984
985
789
1143
714
790
1065
1050
961
1111
676
676
998
910
Voltage
[V]
144
200
32
100
600
32
100
20
45
80
50
50
48
64
Temp.
[°C]
125
125
100
125
150
100
125
100
125
125
100
100
100
125
Time
[hrs]
168
168
1000
168
168
1000
168
168
168
1000
168
168
1000
1000
Sample
Size
20
20
20
20
20
20
10
20
20
20
10
10
20
20
Failures
TABLE 1G: Thyristor/Diode single device
Date Code
# Part Number
or
Voltage
Test #
[V]
1 CS22-12
707
840
2 CS30-16io1
1001
1120
3 CS60-14io1
594
980
4 DSA17-16A
1092
1120
5 DSAI35-16A
900
1120
6 DSAI75-16B
668
1120
7 DSI45-16AR
823
1120
8 DSIK45-16AR
608
1120
9 DSP25-16A
877
1120
10 DSP25-16A
886
1120
Temp.
[°C]
125
125
125
150
150
150
150
150
150
150
Time
[hrs]
1000
168
1000
168
168
168
168
1000
168
168
Sample
Size
20
20
30
10
10
10
20
20
20
20
Failures
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
DSEC240-04A
DSEC30-06A
DSEC60-02A
DSEC60-03AR
DSEC60-03AR
DSEC60-04A
DSEI2x61-12B
DSEI2x61-12P
DSEP12-12A
DSEP15-12CR
DSEP30-06A
DSEP30-06A
DSEP30-06CR
DSEP60-06A
DSEP60-12A
DSS17-06CR
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
3360
3360
20000
3360
3360
3360
10000
1680
3360
3360
3360
3360
3360
3360
3360
3360
Remark
Device Hours
[hrs]
3360
3360
20000
3360
3360
20000
1680
3360
3360
20000
1680
1680
20000
20000
Remark
Device Hours
[hrs]
20000
3360
30000
1680
1680
1680
3360
20000
3360
3360
Remark
TABLE 1F: Schottky Diode
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
DGS15-018CS
DGS19-025CS
DSS1-40BA
DSS160-01A
DSS17-06CR
DSS2-40BB
DSS2x41-01A
DSSK48-0025B
DSSK60-0045A
DSSK70-008AR
DSSK80-006B
DSSK80-006B
DSSK80-006BR
DSSS35-008AR
8
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
TABLE 1H: ISOPLUS
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
DSEC60-03AR
DSEC60-03AR
DSEP15-12CR
DSEP30-06CR
DSI45-16AR
DSIK45-16AR
DSS17-06CR
DSSK70-008AR
DSSS35-008AR
FBS10-12SCC
IXKC20N60C
IXKR40N60C
IXGR40N60C2
Date Code
or
Test #
600
1121
715
902
823
608
714
1111
910
1021
1018
987
SP 0337
TABLE 1J: Breakover Diode
Date Code
# Part Number
or
Test #
1 IXBOD1-08
1085
2 IXBOD1-09
743
3 IXBOD1-10
868
Voltage
[V]
240
240
Time
[hrs]
168
168
168
168
168
1000
168
1000
1000
1000
1000
1000
1000
Sample
Size
20
20
20
20
20
20
20
20
20
20
20
20
30
Failures
480
1120
1120
600
80
64
840
480
480
480
Temp.
[°C]
125
125
125
125
150
150
150
125
125
125
125
125
125
Voltage
[V]
640
720
800
Temp.
[°C]
125
125
125
Time
[hrs]
168
168
168
Sample
Size
20
20
20
Failures
9
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
3360
3360
3360
3360
3360
20000
3360
20000
20000
20000
20000
20000
30000
Remark
Device Hours
[hrs]
3360
3360
3360
Remark
HTGB (Tables 2A .. 2C)
TABLE 2A: MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
1
FII30-06D
829
16
2
IRFP450
CK 0420
16
3
IXDH30N120D1
1094
16
4
IXDN55N120D1
596
16
5
IXFB80N50Q2
SP 0251
16
6
IXFH12N100F
SP 0130
16
7
IXFH21N50
SK 0407
16
8
IXFH21N50Q
SK 0245
16
9
IXFH21N50Q
MP 0423
16
10 IXFH23N80Q
SK 0401
16
11 IXFH24N50
SK 0313
16
12 IXFH24N50
MP 0419
16
13 IXFH26N50
SP 0237
16
14 IXFH26N50Q
SP 0308
16
15 IXFH26N50Q
SK 0316
16
16 IXFH26N50Q
MP 0431
16
17 IXFH26N60Q
SK 0310
16
18 IXFH32N50Q
SK 0330
16
19 IXFH36N50P
SP 0436
16
20 IXFH50N20
SK 0325
16
21 IXFH80N10Q
SK 0313
16
22 IXFH80N10Q
SK 0416
16
23 IXFH9N80
CP 0423
16
24 IXFK48N50
SP 0309
16
25 IXFK48N50
SP 0417
16
26 IXFN48N50
SP 0417
16
27 IXFX21N100Q
SP 0436
16
28 IXFX27N80Q
SP 0419
16
29 IXFX34N80
SP 0422
16
30 IXFX38N80Q2
SP 0403
16
31 IXFX48N50Q
SP 0339
16
32 IXFX48N50Q
SP 0434
16
33 IXGR40N60C2
SP 0337
16
34 IXKN40N60C
838
20
35 IXLF19N250
1142
16
36 IXTH28N50Q
MK 0352
16
37 IXTH41N25
SP 0311
16
38 IXTH48N20
SP 0315
16
39 IXTH72N20
SK 0306
16
40 IXTH75N15
SK 0306
16
41 IXTH75N15
SK 0338
16
42 IXTH88N30P
SK 0348
16
43 IXTK102N30P
SS 0349
16
44 IXTK120N25
SP 0305
16
45 IXTK250N10
SP 0318
16
46 IXTK82N25P
SS 0403
16
47 IXTK88N30P
SS 0403
16
48 IXTM1N100
TP 0423
16
49 IXTM1N100
TP 0423
16
50 IXTM1N100
TP 0424
16
51 IXTQ23N60Q
MK 0421
16
52 IXTQ26N50P
SK 0435
16
53 IXTQ36N30P
SK 0405
16
54 IXTQ42N25P
SK 0405
16
55 IXTQ50N20P
SK 0405
16
Temp.
[°C]
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
10
Sample
Size
10
30
20
10
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
10
10
30
30
30
30
30
30
30
30
30
30
30
30
32
32
32
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
10000
30000
3360
1680
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
1680
1680
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
32000
32000
32000
30000
30000
30000
30000
30000
Remark
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
TABLE 2A (cont`d): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
56 IXTQ62N15P
SK 0405
16
57 IXTQ64N25P
SK 0405
16
58 IXTQ74N20P
SK 0403
16
59 IXTQ74N20P
SK 0405
16
60 IXTQ75N10P
SK 0405
16
61 IXTQ82N25P
SW 0435
16
62 IXTQ88N30P
SK 0402
16
63 IXTQ96N15P
SK 0402
16
64 IXTQ96N20P
SK 0403
16
65 IXTQ96N20P
SK 0405
16
Temp.
[°C]
125
125
125
150
125
125
125
125
125
150
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
Failures
TABLE 2B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MUBW15-12A7
964
2 MUBW25-12A7
873
3 MUBW30-12E6K
1127
4 VIO25-06P1
1087
5 VMM300-03FP
636
Voltage
[V]
16
16
16
16
16
Temp.
[°C]
125
125
150
150
125
Time
[hrs]
1000
168
168
168
1000
Sample
Size
10
10
10
10
10
Failures
Voltage
[V]
16
16
16
Temp.
[°C]
125
125
150
Time
[hrs]
1000
1000
168
Sample
Size
10
30
10
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
RoHS compliant
Device Hours
[hrs]
10000
1680
1680
1680
10000
Remark
Device Hours
[hrs]
10000
30000
1680
Remark
TABLE 2C: ISOPLUS
#
Part Number
1
2
3
FII30-06D
IXGR40N60C2
IXLF19N250
Date Code
or
Test #
829
SP 0337
1142
11
0
0
0
POWER CYCLE (Tables 3A ..3H)
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Tj(max)
Test #
[°C]
1 IRFP450
CK 0420
125
2 IXDH30N120D1
1007
125
3 IXDH35N60B
1063
125
4 IXFB70N60Q2
SP 0335
125
5 IXFH12N100F
SP 0130
125
6 IXFH21N50Q
MP 0423
125
7 IXFH24N50
MP 0419
125
8 IXFH26N50
SP 0228
125
9 IXFH26N50Q
SK 0316
125
10 IXFH26N60Q
SK 0310
125
11 IXFH50N20
SK 0325
125
12 IXFK90N30
SP 0244
125
13 IXFR4N100Q
TP 0149
125
14 IXFX27N80Q
SP 0236
125
15 IXFX48N50Q
SP 0339
125
16 IXFX55N50
SP 0223
125
17 IXFX80N25
SP 0326
125
18 IXTH28N50Q
MK 0352
125
19 IXTK102N30P
SS 0349
125
20 IXTK62N25
SS 0420
125
21 IXTK80N25
SS 0347
125
22 IXTK80N25
SP 0406
125
∆Τ
[K]
100
80
80
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
Number
of
Cycles
10000
2000
2000
10000
4800
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
Sample
Size
24
20
20
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
24
TABLE 3C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCC200
747
2 MCC56
685
3 MCC56-16io1
820
4 MCO150-12io1
607
5 MDD172-16
992
6 MDD172-16
992
Tj(max)
[°C]
125
125
125
125
125
125
∆Τ
[K]
80
80
80
80
80
80
Number
of
Cycles
20000
35000
10000
4000
50000
10000
Sample
Size
10
10
10
10
20
20
Failures
Device Cycles
0
0
0
0
0
0
200000
350000
100000
40000
1000000
200000
TABLE 3D: Controller, Rectifier Bridge
Date Code
# Part Number
or
Tj(max)
Test #
[°C]
1 MMO36-16
875
125
2 VBO125-16NO7
741
125
3 VBO68-16NO7
995
125
4 VUE50-12
717
125
5 VUO121-16NO1
999
125
6 VUO36
766
125
7 VUO60-12
993
125
∆Τ
[K]
80
80
80
80
80
80
80
Number
of
Cycles
10000
2000
2000
5000
2000
60
5000
Sample
Size
10
10
10
10
10
6
10
Failures
Device Cycles
0
0
0
0
0
0
0
100000
20000
20000
50000
20000
360
50000
12
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
240000
40000
40000
240000
115200
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
240000
Remark
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
Remark
Remark
TABLE 3E: FRED
Date Code
or
Test #
795
664
956
722
1046
720
960
715
905
1045
714
830
639
Tj(max)
[°C]
125
150
125
125
150
150
150
125
125
125
150
125
125
∆Τ
[K]
80
105
80
80
105
105
105
80
80
80
105
80
80
Number
of
Cycles
4000
2000
4000
5000
2000
2000
2000
5000
5000
5000
5000
5000
5000
Sample
Size
20
20
20
10
20
20
20
20
10
20
20
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
80000
40000
80000
50000
40000
40000
40000
100000
50000
100000
100000
50000
50000
Date Code
or
Test #
714
901
1071
Tj(max)
[°C]
150
125
125
∆Τ
[K]
105
80
80
Number
of
Cycles
5000
2000
2000
Sample
Size
20
20
20
Failures
Device Cycles
0
0
0
100000
40000
40000
TABLE 3G: Thyristor/Diode single device
Date Code
# Part Number
or
Tj(max)
[°C]
Test #
1 CS19-12ho1
978
125
2 CS20-22moF1
952
125
3 CS22-12
707
125
4 CS9444L
602
125
5 CS9444LD
601
125
6 DSA17-16A
1092
130
7 DSA75-16B
718
150
8 DSI30-12A
1036
125
9 DSI45-12A
613
125
∆Τ
[K]
80
80
80
80
80
100
105
80
80
Number
of
Cycles
4000
10000
4000
6000
6000
2000
2000
2000
4000
Sample
Size
20
20
20
30
30
10
10
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
80000
200000
80000
180000
180000
20000
20000
40000
80000
∆Τ
[K]
80
80
105
100
Number
of
Cycles
5000
5000
5000
10000
Sample
Size
20
20
20
24
Failures
Device Cycles
0
0
0
0
100000
100000
100000
240000
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
DSEC30-02A
DSEC60-06A
DSEI120-06A
DSEI2x61-12B
DSEI60-12A
DSEK60-06A
DSEP12-12A
DSEP15-12CR
DSEP2x31-12A
DSEP30-12CR
DSS17-06CR
MEO450-12 "K"
MEO450-12DA "L"
Remark
RoHS compliant
RoHS compliant
TABLE 3F: Schottky Diode
#
Part Number
1
2
3
DSS17-06CR
DSSK70-0015B
DSSK80-003B
Remark
RoHS compliant
Remark
RoHS compliant
RoHS compliant
TABLE 3H: ISOPLUS
#
Part Number
1
2
3
4
DSEP15-12CR
DSEP30-12CR
DSS17-06CR
IXFR4N100Q
Date Code
or
Test #
715
1045
714
TP 0149
Tj(max)
[°C]
125
125
150
13
Remark
RoHS compliant
TEMPERATURE CYCLE (Tables 4A ..4J)
TABLE 4A: MOSFET/IGBT single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
1 FMM151-0075P
1145
-55
2 IRFP450
CK 0420
-55
3 IXBH40N160
935
-55
4 IXDA20N120AS
967
-40
5 IXFC26N50Q
648
-45
6 IXFF55N50
623
-45
7 IXFG55N50
622
-45
8 IXFH21N50Q
MP 0423
-55
9 IXFH24N50
MP 0419
-55
10 IXFH26N50Q
SK 0330
-65
11 IXFH75N10Q
827
-40
12 IXFL55N50
621
-45
13 IXFN80N50
693
-40
14 IXFQ26N50Q
SK 0330
-65
15 IXKC20N60C
1074
-55
16 IXKC20N60C
1018
-55
17 IXKN40N60C
838
-40
18 IXKR40N60C
987
-40
19 IXKR40N60C
1033
-40
20 IXTH75N15
SK 0330
-65
21 IXTM1N100
TP 0423
-55
22 IXTM1N100
TP 0423
-55
23 IXTM1N100
TP 0424
-55
24 IXTN79N20
1140
-40
25 IXTQ64N25P
SK 0414
-55
26 IXTQ69N30P
SK 0342
-65
27 IXTQ69N30P
SK 0411
-55
28 IXTQ75N115
SK 0330
-65
29 IXTQ96N15P
SK 0412
-55
High
Temp.
[°C]
150
125
150
150
150
150
150
125
125
155
125
150
150
155
150
150
150
150
150
155
125
125
125
150
150
155
150
155
150
Number
of
Cycles
100
100
100
100
250
250
100
100
100
100
1000
100
100
100
100
50
20
100
100
100
100
100
100
50
250
100
250
100
250
Sample
Size
20
30
20
20
30
30
30
30
30
30
10
30
20
30
40
20
10
20
10
30
32
32
32
10
30
30
30
30
30
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
3000
2000
2000
7500
7500
3000
3000
3000
3000
10000
3000
2000
3000
4000
1000
200
2000
1000
3000
3200
3200
3200
500
7500
3000
7500
3000
7500
TABLE 4B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MUBW15-12A7
964
2 MUBW50-12E8
945
3 MUBW50-12E8
1082
4 MWI50-06A7T
1144
5 MWI50-12A7
1017
6 VMO440-02FL
936
High
Temp.
[°C]
150
150
150
150
150
150
Number
of
Cycles
100
50
50
100
100
50
Sample
Size
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
1000
500
500
1000
1000
500
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
14
Remark
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
Remark
TABLE 4C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCC162-16
847
2 MCC21-14
725
3 MCC255-14io1
1120
4 MCC26
526
5 MCC26-14io8
723
6 MCC310-12
970
7 MCC44
673
8 MCC44-12
1101
9 MCC56
685
10 MCC56
685
11 MCC56
962
12 MCC56
963
13 MCC56
697
14 MCC56-14
698
15 MCC56-14
785
16 MCC56-14
786
17 MCC56-16
811
18 MCC56-16
812
19 MCC56-8
699
20 MCC95-16io1
976
21 MCD162-16
803
22 MCD56-16
783
23 MCD95-14
939
24 MCO150-12io1
607
25 MDD172-12
1083
26 MDD26-14
724
27 MDD95-08
637
28 MDD95-16
1058
29 VCC105-14NO7
1115
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
100
50
100
100
50
150
50
100
300
100
100
200
200
100
100
100
100
200
50
100
100
50
50
100
50
50
100
100
Sample
Size
10
10
10
10
10
10
10
10
20
20
10
10
10
10
10
10
30
30
10
10
10
10
10
10
10
10
10
20
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
1000
1000
500
1000
1000
500
1500
500
2000
6000
1000
1000
2000
2000
1000
1000
3000
3000
2000
500
1000
1000
500
500
1000
500
500
2000
1000
TABLE 4D: Controller, Rectifier Bridge
Date Code
# Part Number
or
Test #
1 MMO74-16io6
663
2 VBE60-06A
908
3 VBO19-16DT1
1113
4 VBO25-12
658
5 VBO25-16AO2
1028
6 VHFD37-14
1003
7 VUM24-05
846
8 VUO110
617
9 VUO121
1070
11 VUO27-12
792
12 VUO34
918
13 VUO36-16
883
14 VUO52
887
15 VUO52
887
16 VUO52-16
762
17 VUO52-16
770
18 VVY40-16
913
19 VVZ40-14
841
20 VVZ40-16
593
21 VW2x60-14
1039
22 VWO140-14
728
23 VWO140-14
842
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
20
100
50
50
100
50
100
20
100
50
100
20
100
100
200
200
50
100
50
50
20
100
Sample
Size
10
10
10
10
10
10
10
5
10
10
10
10
10
10
10
10
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
0
200
1000
500
500
1000
500
1000
100
1000
500
1000
200
1000
1000
2000
2000
500
1000
500
500
200
1000
15
Remark
Remark
TABLE 4E: FRED
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
DSEC29-02A
DSEC60-02A
DSEC60-02AQ
DSEC60-03A
DSEC60-03AR
DSEC60-03AR
DSEI2x121-02P
DSEI2x61-12B
DSEI30-10A
DSEI60-06A
DSEI8-06A
DSEK60-06A
DSEP12-12A
DSEP130-06A
DSEP130-06A
DSEP15-12CR
DSEP29-06B
DSEP2x25-12C
DSEP30-06B
DSEP30-06CR
DSEP60-06A
MEK350-02B
Date Code
or
Test #
1037
782
839
681
1121
600
1005
722
1126
705
778
720
960
616
616
715
767
1009
831
902
791
651
Low
Temp.
[°C]
-55
-55
-55
-55
-55
-55
-40
-40
-40
-40
-40
-40
-55
-55
-55
-55
-55
-40
-55
-55
-55
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
200
100
100
50
20
100
50
50
50
100
50
100
50
50
100
100
20
150
50
100
50
Sample
Size
20
20
20
20
20
20
10
10
20
20
40
20
20
20
20
20
20
10
20
20
20
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
1
0
0
0
1
0
0
0
0
0
0
0
0
1000
4000
2000
2000
1000
400
1000
500
1000
1000
4000
1000
2000
1000
1000
2000
2000
200
3000
1000
2000
500
Date Code
or
Test #
763
763
996
1106
789
790
1117
899
1131
744
744
854
1050
665
961
901
1119
729
729
983
910
Low
Temp.
[°C]
-55
-55
-55
-55
-55
-55
-40
-40
-55
-40
-40
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
100
100
100
100
100
100
10
100
10
10
100
50
50
50
50
100
100
100
100
100
Sample
Size
20
20
20
20
20
20
20
10
20
40
40
20
20
20
20
20
20
20
20
40
20
Failures
Device Cycles
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
2000
2000
2000
2000
2000
2000
100
2000
400
400
2000
1000
1000
1000
1000
2000
2000
2000
4000
2000
Remark
I_R @ 50 Cycles
I_R @ 50 Cycles
TABLE 4F: Schottky Diode
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
DGSK24-025CS
DGSK24-025CS
DGSK36-03CS
DGSK8-025A
DSS1-40BA
DSS2-40BB
DSS2x160-01A
DSS2x41-01A
DSS40-0008D
DSS81-0045
DSS81-0045B
DSSK20-0045AM
DSSK48-0025B
DSSK50-01A
DSSK60-0045A
DSSK70-0015B
DSSK80-0025B
DSSK80-006B
DSSK80-006B
DSSS30-01AR
DSSS35-008AR
16
Remark
I_R @ 100 Cycles
TABLE 4G: Thyristor/Diode single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
1 CS20-22moF1
979
-55
2 CS20-22moF1
952
-55
3 CS20-22moF1
979
-55
4 CS22-12
707
-40
5 CS30-16io1
1001
-40
6 CS35-14io1
1011
-40
7 CS35-14io4
825
-40
8 CS45
687
-40
9 CS45-16io1
890
-40
10 CS8-12io2
914
-40
11 DSA17-16A
1092
-40
12 DSA9-16F
704
-40
13 DSAI35-16A
735
-40
14 DSI30-16A
1075
-40
15 DSI45-16
764
-40
16 DSI45-16
764
-40
17 DSI45-16AR
823
-40
18 DSI75-04D
853
-40
19 DSI75-04D
853
-40
20 DSI75-16
1160
-40
21 DSIK45-16AR
608
-40
22 DSP45-16AR
645
-40
23 DSP8-08A
1146
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
100
100
50
50
20
20
150
50
20
20
20
20
100
100
100
50
50
50
20
100
100
50
Sample
Size
20
20
20
20
20
10
10
20
20
10
10
10
10
20
10
10
20
10
10
10
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
2000
2000
1000
1000
200
200
3000
1000
200
200
200
200
2000
1000
1000
1000
500
500
200
2000
2000
1000
Remark
RoHS compliant
RoHS compliant
RoHS compliant
RoHS compliant
TABLE 4H: ISOPLUS
Date Code
or
Test #
600
1121
715
902
823
608
645
983
910
1021
648
623
1018
1074
987
1033
Low
Temp.
[°C]
-55
-55
-55
-55
-40
-40
-40
-55
-55
-55
-45
-45
-55
-55
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
20
50
100
50
50
100
100
100
100
100
250
250
50
100
100
100
Sample
Size
20
20
20
20
20
20
20
40
20
20
30
30
20
40
20
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
400
1000
2000
1000
1000
2000
2000
4000
2000
2000
7500
7500
1000
4000
2000
1000
TABLE 4J: Breakover Diode
Date Code
# Part Number
or
Test #
1 IXBOD1-07
597
2 IXBOD1-08
612
3 IXBOD1-08
1085
4 IXBOD1-09
597
5 IXBOD1-09
743
6 IXBOD1-10
868
7 IXBOD1-10
991
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
Number
of
Cycles
50
200
100
50
50
50
50
Sample
Size
10
20
20
10
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
500
4000
2000
500
1000
1000
1000
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
DSEC60-03AR
DSEC60-03AR
DSEP15-12CR
DSEP30-06CR
DSI45-16AR
DSIK45-16AR
DSP45-16AR
DSSS30-01AR
DSSS35-008AR
FBS10-12SCC
IXFC26N50Q
IXFF55N50
IXKC20N60C
IXKC20N60C
IXKR40N60C
IXKR40N60C
17
Remark
RoHS compliant
RoHS compliant
RoHS compliant
Remark
RoHS compliant
HUMIDITY TEST (Tables 5A ..5H)
TABLE 5A: MOSFET/IGBT single device
Date Code
# Part Number
or
Temp.
Test #
[°C]
1 FII30-06D
829
121
2 IXER35N120D1
909
121
3 IXFB80N50F
647
121
4 IXFC26N50Q
648
121
4 IXFF55N50
623
121
5 IXFG55N50
622
121
6 IXFL55N50
621
121
7 IXFL55N50
SP 0207
125
7 IXFG55N50
SP 0207
125
8 IXFF55N50
SP 0207
125
9 IXFC26N50Q
SP 0235
125
10 IXTQ69N30P
SK 0342
125
Rel. H.
[%]
100
100
100
100
100
100
100
100
100
100
100
100
Time
[hrs]
168
48
168
168
168
168
168
168
168
168
168
96
Sample
Size
20
20
30
30
30
30
30
30
30
30
30
30
Failures
TABLE 5B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MUBW15-12A7
964
Temp.
[°C]
85
Rel. H.
[%]
85
Time
[hrs]
1000
Sample
Size
10
Failures
TABLE 5C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCC250-16io1
1104
2 MCC26-16
796
3 MCC44
1027
4 MCC56
631
5 MCC95-16io1
821
Temp.
[°C]
85
85
85
85
85
Rel. H.
[%]
85
85
85
85
85
Time
[hrs]
168
168
1000
1000
168
Sample
Size
10
10
10
10
10
Failures
TABLE 5D: Controller, Rectifier Bridge
Date Code
# Part Number
or
Test #
1 VBO160-16NO7
1091
2 VUM24-05
846
3 VUM24-05
846
4 VUO52-16
1079
5 VWO85-14
777
Temp.
[°C]
85
85
45
85
85
Rel. H.
[%]
85
85
65
85
85
Time
[hrs]
168
168
72
168
168
Sample
Size
10
10
10
10
10
Failures
Date Code
or
Test #
795
839
1121
889
616
616
787
793
Temp.
[°C]
121
121
121
121
121
121
121
85
Rel. H.
[%]
100
100
100
100
100
100
100
85
Time
[hrs]
48
96
48
48
96
96
48
168
Sample
Size
20
20
20
20
20
20
20
10
Failures
Date Code
or
Test #
807
763
763
Temp.
[°C]
121
121
121
Rel. H.
[%]
100
100
100
Time
[hrs]
96
96
96
Sample
Size
20
20
20
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
3360
960
5040
5040
5040
5040
5040
5040
5040
5040
5040
2880
Remark
Device Hours
[hrs]
10000
Remark
Device Hours
[hrs]
1680
1680
10000
10000
1680
Remark
Device Hours
[hrs]
1680
1680
720
1680
1680
Remark
TABLE 5E: FRED
#
Part Number
1
2
3
4
5
6
7
8
DSEC30-02A
DSEC60-02AQ
DSEC60-03AR
DSEC60-04A
DSEP130-06A
DSEP130-06A
DSEP2x91-06A
MEK350-02DA
0
0
0
0
0
0
0
0
Device Hours
Remark
[hrs]
960
1920
960
RoHS compliant
960
1920
1920
960
1680
TABLE 5F: Schottky Diode
#
Part Number
1
2
3
DGS11-025C
DGSK24-025CS
DGSK24-025CS
18
0
0
0
Device Hours
[hrs]
1920
1920
1920
Remark
TABLE 5G: Thyristor/Diode single device
Date Code
# Part Number
or
Temp.
Test #
[°C]
1 CS45
687
121
2 CS45
687
121
3 CS45
687
121
4 CS45-16io1
890
121
5 DSI45-16
764
121
6 DSI45-16AR
823
121
7 DSP8-08S
758
121
8 DSP8-08S
758
121
Rel. H.
[%]
100
100
100
100
100
100
100
100
Time
[hrs]
96
96
96
48
48
48
96
96
Sample
Size
20
20
20
20
10
20
20
20
Failures
0
1
0
0
0
0
0
0
Device Hours
[hrs]
1920
1920
1920
960
480
960
1920
1920
Remark
TABLE 5H: ISOPLUS
Date Code
or
Test #
1121
823
829
909
648
623
Temp.
[°C]
121
121
121
121
121
121
Rel. H.
[%]
100
100
100
100
100
100
Time
[hrs]
48
48
168
48
168
168
Sample
Size
20
20
20
20
30
30
Failures
TABLE 5J: Breakover diode
Date Code
# Part Number
or
Test #
1 IXBOD1-08
1085
2 IXBOD1-09
743
3 IXBOD1-10
868
Temp.
[°C]
121
121
121
Rel. H.
[%]
100
100
100
Time
[hrs]
48
48
48
Sample
Size
20
20
20
Failures
#
Part Number
1
2
3
4
5
5
DSEC60-03AR
DSI45-16AR
FII30-06D
IXER35N120D1
IXFC26N50Q
IXFF55N50
0
0
0
0
0
0
0
0
0
Device Hours
Remark
[hrs]
960
RoHS compliant
960
3360
960
5040
5040
Device Hours
Remark
[hrs]
960
RoHS compliant
960
960
MSLA classification standard Table: according to IEC 60749-20
#
Part Number
1
2
3
4
DSP8-08S
DSP8-08S
DSS6-0025BS
DSSK18-025
Date Code
Sample
Size
Housing style
Passed
class*
K317
K318
LSA408
L405
20
20
20
20
TO-263
TO-263
TO-252
TO-263
C
C
C
C
* "C" storage allowed <30°C; 85% relative humidity (no DRY-Pack required)
19
Remark
RoHS compliant
RoHS compliant