SPO-2012-PCN-0009

AEROFLEX DATA EXCHANGE PROGRAM TRANSMITTAL
PRODUCT CHANGE NOTICE
1. TITLE
2. DOCUMENT NUMBER
MICROCIRCUIT, MEMORY, DIGITAL,CMOS, 1MEG X
39-BIT (40M), RADIATION-HARDENED DUAL
VOLATGE, SRAM, MULTICHIP MODULE
SPO-2012-PCN-0009
3. DATE (Year, Month, Date)
2012, OCTOBER, 04
4. MANUFACTURER NAME AND ADDRESS
5. MANUFACTURER POINT OF CONTACT NAME
AEROFLEX COLORADO SPRINGS, INC.
Mike Leslie
4350 CENTENNIAL BOULEVARD
COLORADO SPRINGS, COLORADO 80907-3486
6. MANUFACTURER POINT OF CONTACT TELEPHONE
(719) 594-8148
7. MANUFACTURER POINT OF CONTACT EMAIL
[email protected]
8. CAGE CODE
9. EFFECTIVE DATE
10. PRODUCT IDENTIFICATION CODE
11. BASE PART
65342
2010, April, 08
QS13
UT8R1M39
12. BLANK
13. SMD NUMBER
14. DEVICE TYPE DESIGNATOR
5962-10205
01, 02
15. RHA LEVELS
16. QML LEVEL
R
Q, Q+, V
17. NON QML LEVEL
18. BLANK
HiRel, Protos
19. PRODUCT CHANGE
Aeroflex is working in coordination with DLA Land and Maritime to revise SMD 5962-10205, revision
level B, for the following changes:
Section 1.5 Radiation features (sheet 3)
PREVIOUS:
1.5 Radiation features
Maximum total dose available (effective dose rate = 1 rads(Si)/s) ...................... 10.0 x 104 rads(Si) 5/
Single event phenomenon (SEP) effective
linear energy threshold (LET) with no upsets.................................................... 1 MeV – cm2/mg
2
with no latch-up................................................................................................. > 111 MeV-cm /mg
CORRECTED:
1.5 Radiation features
Maximum total dose available (effective dose rate = 1 rads(Si)/s) ...................... 100 K rads(Si) 5/
Single event phenomenon (SEP):
2
Effective linear energy transfer (LET) with no upsets (see 4.4.4.3)................... 0.8 MeV - cm /mg 6/
Effective LET with no latch-up (see 4.4.4.2)...................................................... ≤ 110 MeV-cm2/mg
-7
Single event upset (SEU) error rate (Adam’s 90% worst case environment)....... 7.3 x 10 errors/bit-day
14
Neutron irradiation test (Displacement damage test) .......................................... 3.0 x 10 n/cm2 7/
ADDED: Notes /6 and /7 (bottom of sheet 3)
0.8 MeV-cm2/mg is the estimated onset LET with no errors based on SEU testing where the minimum heavy ion LET available at
the test facility was 0.9 MeV-cm2/mg. At 0.9 MeV-cm2/mg the cross-section is three orders of magnitude lower than the saturated
cross-section and will therefore be close to the onset LET with no upsets.
7/ Parameter is guaranteed to the limit shown but not specifically tested.
6/
20. DISPOSITIONARY RECOMMENDATION:
21. ADEPT REPRESENTATIVE
Timothy L. Meade
ADEPT FORM F##### REV -
USE AS IS
22.
☐
SIGNATURE
CONTACT
MANUFACTURER
☐
REMOVE &
REPLACE
☐
CHECK &
☒
USE AS IS
23. DATE
2012, October, 04
RELEASE DATE: 11/11/11
ADDED: Table 1B SEP test limits and corresponding notes (sheet 9 )
≤ 110
1/ For SEP test conditions, see 4.4.4.4 herein.
2/ Technology characterization and model verification supplemented by in-line data may be used in lieu of end-of-line testing. Test plan
must be approved by TRB and qualifying activity.
3/ Test temperature TA = +25°C ±10°C.
4/ Soft error rate = 7.3 x 10-7 error/bit-day assuming Adam’s 90% worst case environment, geosynchronous orbit, and 100 mil aluminum
shielding. Contact the device manufacturer for detailed information.
5/ Worst case test temperature TA = +125°C ±10°C.
6/ Memory patterns are as specified in Appendix A, Algorithm A herein.
7/ 0.8 MeV-cm2/mg is the estimated onset LET with no errors based on SEU testing where the minimum heavy ion LET available
at the test facility was 0.9 MeV-cm2/mg. At 0.9 MeV-cm2/mg the cross-section is three orders of magnitude lower than the
saturated cross-section and will therefore be close to the onset LET with no upsets.
ADDED: Alternative marking as package pin one indenifier to FIGURE 1. Case outline (sheet 11).
CORRECTED: Drawing of original pin one identifier corrected and detail B drawing added.
PREVIOUS:
CORRECTED:
(SEE NOTE 9)
ADDED: Note 9 (sheet 12):
9/. A dot may be marked on lid to indicate pin 1 index within area shown.
ADEPT FORM F##### REV -
RELEASE DATE: 11/11/11
CORRECTED: FIGURE 2. Terminal connections (sheet 13).
Terminal Number
100
101
PREVIOUS:
Terminal Symbol
TOP_DQ36
BOT_DQ36
ADEPT FORM F##### REV -
Terminal Number
100
101
CORRECTED:
Terminal Symbol
BOT_DQ36
TOP_DQ36
RELEASE DATE: 11/11/11