IRF IRL7833

PD - 94668B
IRL7833
IRL7833S
IRL7833L
Applications
l High Frequency Synchronous Buck
Converters for Computer Processor Power
l High Frequency Isolated DC-DC
Converters with Synchronous Rectification
for Telecom and Consumer Use
Benefits
l Very Low RDS(on) at 4.5V VGS
l Ultra-Low Gate Impedance
l Fully Characterized Avalanche Voltage
and Current
HEXFET® Power MOSFET
VDSS RDS(on) max
3.8m:
30V
D2Pak
IRL7833S
TO-220AB
IRL7833
Qg
32nC
TO-262
IRL7833L
Absolute Maximum Ratings
Parameter
Max.
Units
30
V
VDS
Drain-to-Source Voltage
VGS
Gate-to-Source Voltage
Continuous Drain Current, VGS @ 10V
± 20
150
IDM
Continuous Drain Current, VGS @ 10V
Pulsed Drain Current
600
PD @TC = 25°C
Maximum Power Dissipation
PD @TC = 100°C
Maximum Power Dissipation
TJ
Linear Derating Factor
Operating Junction and
TSTG
Storage Temperature Range
ID @ TC = 25°C
ID @ TC = 100°C
c
f
110f
g
g
A
140
W
72
0.96
-55 to + 175
y
Mounting Torque, 6-32 or M3 screw
W/°C
°C
y
10 lbf in (1.1N m)
Thermal Resistance
Parameter
RθJC
RθCS
Junction-to-Case
Case-to-Sink, Flat, Greased Surface
RθJA
Junction-to-Ambient h
RθJA
Junction-to-Ambient (PCB Mount)
h
g
Typ.
Max.
–––
1.04
0.50
–––
–––
62
–––
40
Units
°C/W
Notes  through † are on page 12
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1
4/22/04
IRL7833/S/L
Static @ TJ = 25°C (unless otherwise specified)
Parameter
Min. Typ. Max. Units
BVDSS
Drain-to-Source Breakdown Voltage
∆ΒVDSS/∆TJ
Breakdown Voltage Temp. Coefficient
RDS(on)
Static Drain-to-Source On-Resistance
30
V
–––
–––
18
–––
–––
3.1
3.8
mV/°C Reference to 25°C, ID = 1mA
mΩ VGS = 10V, ID = 38A
–––
3.7
4.5
VGS = 4.5V, ID = 30A
VGS(th)
Gate Threshold Voltage
1.4
–––
2.3
V
∆VGS(th)/∆TJ
Gate Threshold Voltage Coefficient
–––
-11
–––
mV/°C
IDSS
Drain-to-Source Leakage Current
–––
–––
1.0
µA
–––
–––
150
Gate-to-Source Forward Leakage
–––
–––
100
Gate-to-Source Reverse Leakage
–––
–––
-100
Forward Transconductance
150
–––
–––
IGSS
gfs
Qg
Conditions
–––
VGS = 0V, ID = 250µA
f
f
VDS = VGS, ID = 250µA
VDS = 24V, VGS = 0V
VDS = 24V, VGS = 0V, TJ = 125°C
nA
VGS = 20V
VGS = -20V
S
VDS = 15V, ID = 30A
Total Gate Charge
–––
32
47
Qgs1
Pre-Vth Gate-to-Source Charge
–––
8.7
–––
Qgs2
Post-Vth Gate-to-Source Charge
–––
5.1
–––
Qgd
Gate-to-Drain Charge
–––
13
–––
ID = 30A
Qgodr
Gate Charge Overdrive
Switch Charge (Qgs2 + Qgd)
–––
5.3
–––
See Fig. 16
Qsw
–––
18
–––
Qoss
Output Charge
–––
22
–––
td(on)
Turn-On Delay Time
–––
18
–––
tr
Rise Time
–––
50
–––
td(off)
Turn-Off Delay Time
–––
21
–––
tf
Fall Time
–––
6.9
–––
Ciss
Input Capacitance
–––
4170
–––
Coss
Output Capacitance
–––
950
–––
Crss
Reverse Transfer Capacitance
–––
470
–––
VDS = 16V
nC
nC
VGS = 4.5V
VDS = 16V, VGS = 0V
VDD = 15V, VGS = 4.5V
ns
f
ID = 26A
Clamped Inductive Load
VGS = 0V
pF
VDS = 15V
ƒ = 1.0MHz
Avalanche Characteristics
EAS
Parameter
Single Pulse Avalanche Energy
IAR
Avalanche Current
EAR
Repetitive Avalanche Energy
c
dh
c
Typ.
Max.
Units
–––
560
mJ
–––
30
A
–––
14
mJ
Diode Characteristics
Parameter
Min. Typ. Max. Units
IS
Continuous Source Current
–––
–––
ISM
(Body Diode)
Pulsed Source Current
–––
–––
VSD
(Body Diode)
Diode Forward Voltage
–––
trr
Reverse Recovery Time
–––
Qrr
Reverse Recovery Charge
–––
2
ch
150
f
Conditions
MOSFET symbol
A
D
600
showing the
integral reverse
–––
1.2
V
p-n junction diode.
TJ = 25°C, IS = 30A, VGS = 0V
42
63
ns
34
51
nC
G
S
f
TJ = 25°C, IF = 30A, VDD = 15V
di/dt = 100A/µs
f
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IRL7833/S/L
1000
1000
100
BOTTOM
10
VGS
10V
7.0V
4.5V
3.7V
3.5V
3.3V
3.0V
2.7V
2.7V
TOP
ID, Drain-to-Source Current (A)
ID, Drain-to-Source Current (A)
TOP
100
BOTTOM
2.7V
10
20µs PULSE WIDTH
Tj = 175°C
20µs PULSE WIDTH
Tj = 25°C
1
1
0.1
1
10
100
1000
0.1
VDS, Drain-to-Source Voltage (V)
1
10
100
1000
VDS, Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
2.0
RDS(on) , Drain-to-Source On Resistance
(Normalized)
1000
ID, Drain-to-Source Current (Α)
VGS
10V
7.0V
4.5V
3.7V
3.5V
3.3V
3.0V
2.7V
T J = 175°C
100
TJ = 25°C
VDS = 15V
20µs PULSE WIDTH
ID = 75A
VGS = 10V
1.5
1.0
0.5
10
2.0
3.0
4.0
5.0
6.0
7.0
VGS, Gate-to-Source Voltage (V)
Fig 3. Typical Transfer Characteristics
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8.0
-60 -40 -20 0
20 40 60 80 100 120 140 160 180
T J , Junction Temperature (°C)
Fig 4. Normalized On-Resistance
Vs. Temperature
3
IRL7833/S/L
100000
12.0
VGS = 0V,
f = 1 MHZ
Ciss = Cgs + Cgd, C ds SHORTED
Crss = Cgd
VGS, Gate-to-Source Voltage (V)
ID= 30A
C, Capacitance(pF)
Coss = Cds + Cgd
10000
Ciss
Coss
1000
Crss
10.0
VDS= 24V
VDS= 15V
8.0
6.0
4.0
2.0
0.0
100
1
10
100
0
VDS, Drain-to-Source Voltage (V)
15
20
25
30
35
40
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000.00
1000
T J = 175°C
ID, Drain-to-Source Current (A)
ISD, Reverse Drain Current (A)
10
QG Total Gate Charge (nC)
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
100.00
OPERATION IN THIS AREA
LIMITED BY R DS(on)
100
10.00
T J = 25°C
1.00
100µsec
10
1msec
1
10msec
Tc = 25°C
Tj = 175°C
Single Pulse
VGS = 0V
0.10
0.1
0.0
0.5
1.0
1.5
2.0
2.5
VSD, Source-to-Drain Voltage (V)
Fig 7. Typical Source-Drain Diode
Forward Voltage
4
5
3.0
1
10
100
VDS, Drain-to-Source Voltage (V)
Fig 8. Maximum Safe Operating Area
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IRL7833/S/L
2.5
160
VGS(th) Gate threshold Voltage (V)
LIMITED BY PACKAGE
ID , Drain Current (A)
120
80
40
2.0
1.5
ID = 250µA
1.0
0.5
0.0
0
25
50
75
100
125
150
175
TC, Case Temperature (°C)
-75 -50 -25
0
25
50
75 100 125 150 175
T J , Temperature ( °C )
Fig 9. Maximum Drain Current Vs.
Case Temperature
Fig 10. Threshold Voltage Vs. Temperature
(Z thJC)
10
1
Thermal Response
D = 0.50
0.20
P DM
0.10
0.1
t1
0.05
0.02
0.01
t2
SINGLE PULSE
(THERMAL RESPONSE)
Notes:
1. Duty factor D =
2. Peak T
0.01
0.00001
0.0001
0.001
0.01
t1 / t 2
J = P DM x Z thJC
+TC
0.1
1
t 1, Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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5
IRL7833/S/L
15V
2000
ID
TOP
DRIVER
D.U.T
RG
+
V
- DD
IAS
20V
VGS
1600
A
0.01Ω
tp
Fig 12a. Unclamped Inductive Test Circuit
V(BR)DSS
tp
EAS , Single Pulse Avalanche Energy (mJ)
L
VDS
12A
21A
30A
BOTTOM
1200
800
400
0
25
50
75
100
125
150
175
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
LD
I AS
VDS
Fig 12b. Unclamped Inductive Waveforms
+
VDD D.U.T
Current Regulator
Same Type as D.U.T.
VGS
Pulse Width < 1µs
Duty Factor < 0.1%
50KΩ
12V
.2µF
.3µF
Fig 14a. Switching Time Test Circuit
D.U.T.
+
V
- DS
VDS
90%
VGS
3mA
10%
IG
ID
Current Sampling Resistors
Fig 13. Gate Charge Test Circuit
VGS
td(on)
tr
td(off)
tf
Fig 14b. Switching Time Waveforms
6
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IRL7833/S/L
D.U.T
Driver Gate Drive
ƒ
+
-
-
„
*
D.U.T. ISD Waveform
Reverse
Recovery
Current
+

RG
•
•
•
•
dv/dt controlled by R G
Driver same type as D.U.T.
I SD controlled by Duty Factor "D"
D.U.T. - Device Under Test
V DD
P.W.
Period
VGS=10V
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
‚
D=
Period
P.W.
+
+
-
Body Diode Forward
Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
Re-Applied
Voltage
Body Diode
VDD
Forward Drop
Inductor Curent
ISD
Ripple ≤ 5%
* VGS = 5V for Logic Level Devices
Fig 15. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
Id
Vds
Vgs
Vgs(th)
Qgs1 Qgs2
Qgd
Qgodr
Fig 16. Gate Charge Waveform
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7
IRL7833/S/L
Power MOSFET Selection for Non-Isolated DC/DC Converters
Control FET
Synchronous FET
Special attention has been given to the power losses
in the switching elements of the circuit - Q1 and Q2.
Power losses in the high side switch Q1, also called
the Control FET, are impacted by the Rds(on) of the
MOSFET, but these conduction losses are only about
one half of the total losses.
The power loss equation for Q2 is approximated
by;
*
Ploss = Pconduction + Pdrive + Poutput
(
2
Ploss = Irms × Rds(on)
)
Power losses in the control switch Q1 are given
by;
+ (Qg × Vg × f )
Ploss = Pconduction+ Pswitching+ Pdrive+ Poutput
Q

+  oss × Vin × f + (Qrr × Vin × f )
 2

This can be expanded and approximated by;
*dissipated primarily in Q1.
Ploss = (Irms 2 × Rds(on ) )

Qgd
+I ×
× Vin ×
ig


 
Qgs 2
f +  I ×
× Vin × f 
ig
 

+ (Qg × Vg × f )
+
 Qoss
× Vin × f 
 2

This simplified loss equation includes the terms Qgs2
and Qoss which are new to Power MOSFET data sheets.
Qgs2 is a sub element of traditional gate-source
charge that is included in all MOSFET data sheets.
The importance of splitting this gate-source charge
into two sub elements, Qgs1 and Qgs2, can be seen from
Fig 16.
Qgs2 indicates the charge that must be supplied by
the gate driver between the time that the threshold
voltage has been reached and the time the drain current rises to Idmax at which time the drain voltage begins to change. Minimizing Q gs2 is a critical factor in
reducing switching losses in Q1.
Qoss is the charge that must be supplied to the output capacitance of the MOSFET during every switching cycle. Figure A shows how Qoss is formed by the
parallel combination of the voltage dependant (nonlinear) capacitance’s Cds and Cdg when multiplied by
the power supply input buss voltage.
For the synchronous MOSFET Q2, Rds(on) is an important characteristic; however, once again the importance of gate charge must not be overlooked since
it impacts three critical areas. Under light load the
MOSFET must still be turned on and off by the control IC so the gate drive losses become much more
significant. Secondly, the output charge Qoss and reverse recovery charge Qrr both generate losses that
are transfered to Q1 and increase the dissipation in
that device. Thirdly, gate charge will impact the
MOSFETs’ susceptibility to Cdv/dt turn on.
The drain of Q2 is connected to the switching node
of the converter and therefore sees transitions between ground and Vin. As Q1 turns on and off there is
a rate of change of drain voltage dV/dt which is capacitively coupled to the gate of Q2 and can induce
a voltage spike on the gate that is sufficient to turn
the MOSFET on, resulting in shoot-through current .
The ratio of Qgd/Qgs1 must be minimized to reduce the
potential for Cdv/dt turn on.
Figure A: Qoss Characteristic
8
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IRL7833/S/L
TO-220AB Package Outline
Dimensions are shown in millimeters (inches)
2.87 (.113)
2.62 (.103)
10.54 (.415)
10.29 (.405)
-B-
3.78 (.149)
3.54 (.139)
4.69 (.185)
4.20 (.165)
-A-
1.32 (.052)
1.22 (.048)
6.47 (.255)
6.10 (.240)
4
15.24 (.600)
14.84 (.584)
1.15 (.045)
MIN
1
2
3
14.09 (.555)
13.47 (.530)
4.06 (.160)
3.55 (.140)
3X
1.40 (.055)
3X
1.15 (.045)
LEAD ASSIGNMENTS
1 - GATE
2 - DRAIN
3 - SOURCE
4 - DRAIN
0.93 (.037)
0.69 (.027)
0.36 (.014)
3X
M
B A M
0.55 (.022)
0.46 (.018)
2.92 (.115)
2.64 (.104)
2.54 (.100)
2X
NOTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.
2 CONTROLLING DIMENSION : INCH
3 OUTLINE CONFORMS TO JEDEC OUTLINE TO-220AB.
4 HEATSINK & LEAD MEASUREMENTS DO NOT INCLUDE BURRS.
TO-220AB Part Marking Information
EXAMPLE : THIS IS AN IRF1010
WITH ASSEMBLY
LOT CODE 9B1M
A
INTERNATIONAL
RECTIFIER
LOGO
ASSEMBLY
LOT CODE
www.irf.com
PART NUMBER
IRF1010
9246
9B 1M
DATE CODE
(YYWW)
YY = YEAR
WW = WEEK
9
IRL7833/S/L
D2Pak Package Outline
D2Pak Part Marking Information
5
(
%
0
8
1
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$
3
/$
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www.irf.com
10
IRL7833/S/L
TO-262 Package Outline
TO-262 Part Marking Information
/
/
,5
1
$
,6
,6
7+
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11
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IRL7833/S/L
D2Pak Tape & Reel Information
Dimensions are shown in millimeters (inches)
TRR
1.60 (.063)
1.50 (.059)
4.10 (.161)
3.90 (.153)
FEED DIRECTION 1.85 (.073)
1.65 (.065)
1.60 (.063)
1.50 (.059)
11.60 (.457)
11.40 (.449)
0.368 (.0145)
0.342 (.0135)
15.42 (.609)
15.22 (.601)
24.30 (.957)
23.90 (.941)
TRL
10.90 (.429)
10.70 (.421)
1.75 (.069)
1.25 (.049)
4.72 (.136)
4.52 (.178)
16.10 (.634)
15.90 (.626)
FEED DIRECTION
13.50 (.532)
12.80 (.504)
27.40 (1.079)
23.90 (.941)
4
330.00
(14.173)
MAX.
NOTES :
1. COMFORMS TO EIA-418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HUB.
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
60.00 (2.362)
MIN.
26.40 (1.039)
24.40 (.961)
3
30.40 (1.197)
MAX.
4
Notes:
 Repetitive rating; pulse width limited by max. junction temperature.
‚ Starting TJ = 25°C, L = 1.3mH, RG = 25Ω, IAS = 30A.
ƒ Pulse width ≤ 400µs; duty cycle ≤ 2%.
„ Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 75A.
… When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques refer to
application note #AN-994.
† This is only applied to TO-220AB package.
TO-220AB package isnot recommended for Surface Mount Application.
Data and specifications subject to change without notice.
This product has been designed and qualified for the Industrial market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.04/04
12
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