RH1021-5 - SPEC NO. 05-08-5016

SPEC NO. 05-08-5016
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RH1021-5, PRECISION 5V REFERENCE
REVISION RECORD
DESCRIPTION
INITIAL RELEASE
• PAGE 2, ADDED PARAGRAPHS 3.2.1, 3.2.2, AND 3.2.3. PARAGRAPH 3.3b, ADDED “(SEE
PARAGRAPH 3.2)”.
• PAGE 4, PARAGRAPH 3.12, WAFER LOT ACCEPTANCE REDEFINED. PARAGRAPH 4.4.2,
GROUP B INSPECTION, REDEFINED. PARAGRAPH 4.4.3, GROUP D INSPECTION,
REDEFINED.
• PAGE 5, PARAGRAPH 4.5, SOURCE INSPECTION, REDEFINED.
• PAGE 6, FIGURE 1, TO5 CASE OUTLINE, ADDED θja AND θjc.
• PAGE 4, AMENDED PARAGRAPHS 4.1 AND 4.1.1 TAKING EXCEPTION TO ANALYSIS OF
CATASTROPHIC FAILURES.
• PAGE 6, FIGURE 1, CHANGED θja FROM 180°C/W TO 150°C/W.
• PAGE 2, PARAGRAPHS 3.2.1, 3.2.2, 3.2.3 HAD FIGURES 1, 2, AND 3 REMOVED.
• PAGE 3, PARAGRAPH 3.7, CHANGED VERBIAGE FROM “SPECIFIED IN TABLE III TO “AND
AS SPECIFIED IN TABLE III HEREIN”, LINE 2. PARAGRAPH 3.9, ADDED “HEREIN” AFTER
“TABLE III”, LINE 2.
• PAGE 4, PARAGRAPH 4.3, ADDED “HEREIN” AFTER “TABLE III”, LINE 2. PARAGRAPH 4.4.1,
ADDED “HEREIN” AFTER “TABLE III”, LINE 2. PARAGRAPH 4.4.2.2, CHANGED VERBIAGE
IN LINE 1 FROM “ALL FOOTNOTES OF TABLE IIA OF MIL-STD-883” TO “ALL FOOTNOTES
PERTAINING TO TABLE IIA OF MIL-STD-883”. PARAGRAPH 4.4.3.2, CHANGED VERBIAGE
IN LINE 1 FROM “ALL FOOTNOTES OF TABLE IV OF MIL-STD-883” TO “ALL FOOTNOTES
PERTAINING TO TABLE IV IN MIL-STD-883.”
• PAGE 3, PARAGRAPH 3.2.4, ADDED NEW DEVICE OPTION 4 (W10 FLATPACK).
• PAGE 4, PARAGRAPH 3.8 CHANGED VERBIAGE ADDED FIGURES 5 AND 6. PARAGRAPH
3.10.1, ADDED FIGURE 2, PARAGRAPH 3.10.2, CHANGED VERBIAGE ADDED FIGURES 3
AND 4. PARAGRAPH 3.10.3, CHANGED VERBIAGE. PARAGRAPH 3.11.3, CHANGED FIGURE
4 TO 7.
• PAGE 8, ADDED PAGE 7 DEVICE OPTION 4, PACKAGE OUTLINE.
• PAGE 9, CHANGED FIGURE 2 TO 3.
• PAGE 10, ADDED DEVICE OPTION 4, FIGURE 4 TERMINAL CONNECTIONS.
• PAGE 11, CHANGED FIGURE 3 TO 5.
• PAGE 12, ADDED DEVICE OPTION 4, FIGURE 6 BURN-IN CIRCUIT.
• PAGE 13, CHANGED FIGURE 4 TO 7.
• PAGE 15, CHANGED Vout OUTPUT VOLTAGE 10 krad (SI) MIN TO 9.992 AND MAX TO 10.008
AND ADDED VERBIAGE TO NOTE 3.
• PAGE 8, CHANGED θja FROM +225°C/W TO +170°C/W AND θjc FROM +40°C/W TO 18°C/W
PER PACKAGE ENGINEERING.
DATE
06/12/96
11/25/97
04/8/98
09/28/99
11/18/99
06/23/00
9/06/00
REVISION RECORD AND DESCRIPTION CONTINUED ON NEXT PAGE.
REVISION
INDEX
REVISION
INDEX
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REVISION
CAUTION: ELECTROSTATIC DISCHARGE SENSITIVE PART
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LINEAR TECHNOLOGY CORPORATION
MILPITAS, CALIFORNIA
TITLE:
MICROCIRCUIT, LINEAR,
RH1021-5, PRECISION 5V REFERENCE
SIZE
FUNCT
APPLICATION
13
P
SIGNOFFS
DATE
CAGE
CODE
94155
CONTRACT:
DRAWING
NUMBER
05-08-5016
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FOR OFFICIAL USE ONLY
LINEAR TECHNOLOGY CORPORATIION
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PAGE 1 OF 14
SPEC NO. 05-08-5016
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RH1021-5, PRECISION 5V REFERENCE
REVISION RECORD
DESCRIPTION
• CONVERSION FROM WORD PERFECT TO MICROSOFT WORD. REDUCED SPEC PAGES TO
14 TOTAL.
• PAGE 2, AN ADDITIONAL REVISION RECORD PAGE WAS INSTALLED.
• ACKNOWLEDGE THAT CHANGE IN REVISION E, PAGE 15, IS INCORRECT AND HAS BEEN
REMOVED.
• PAGE 3:
PARAGRAPH 3.2.1 THROUGH 3.2.4, ADDED THE WORD “OPTION” PRECEDING THE NUMBER OF
EACH LTC PART NUMBER FOR BETTER CUSTOMER ORDERING CONVENIENCE.
• PAGE 4:
PARAGRAPH 3.6, CHANGED “TABLE IA” TO “TABLE II”
PARAGRAPH 3.7, CHANGED “TABLE III” TO “TABLE IV”
PARAGRAPHS 3.8.1 AND 3.8.2, ADDED THE PACKAGE TYPES AND OPTIONS AFTER EACH
FIGURE.
PARAGRAPH 3.9, CHANGED “TABLE II” TO “TABLE III”
PARAGRAPHS 3.10.1 AND 3.10.2, ADDED THE PACKAGE TYPES AFTER EACH FIGURE
PARAGRAPH 3.11.1 WAS CHANGED FROM “…dosage rate of approximately 20 Rads per
second” TO “…dosage rate of less than or equal to 10 Rads per second”
• PAGE 5:
PARAGRAPHS 4.1 THROUGH 4.4.2.1 CHANGES WERE DONE TO CLARIFY GROUP SAMPLING.
• PAGE 6:
PARAGRAPH 4.4.3 CHANGE WAS DONE TO CLARIFY GROUP SAMPLING.
PARAGRAPHS 4.6.2 THROUGH 4.6.4 WERE RE-WRITTEN. THESE DATA PROVIDED, AND DATA
AVAILABLE.
PARAGRAPH 4.6.10 NOTE, ADDED FURTHER EXPLANATION OF MINIMUM DELIVERED DATA.
• PAGES 7 THROUGH 12, ALL FIGURE TITLES CHANGED TO HAVE DEVICE OPTIONS AND
PACKAGE TYPES AT TOP OF PAGE, AND HAVE ALL FIGURES AT BOTTOM OF PAGE.
• PAGE 9, MOVED FIGURE 4 TO PAGE 9 FROM PAGE 10 AS SHOWN IN PREVIOUS
SPECIFICATION REVISION.
• PAGE 12, FIGURE 7, TOTAL DOSE BIAS CURRENT REVISED BY ENGINEERING.
• PAGE 13, TABLES I, II AND CORRESPONDING NOTES ALL ON ONE PAGE.
• PAGE 8, CHANGED OUTLINE DRAWING PIN 1 NOTCH MOVED TO INSIDE LEAD
LOCATION.
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DATE
03/26/02
05/19/03
Page 4, Changed initial rate of rads to 240.
Page 4, Added: Out to ground voltage (shunt mode current limit…..10v and Note:
Absolute maximum ratings are those values beyond which the life of a device may be
impaired.
Page 4, changed (shunt mode current voltage) to (sink mode current limit) per datasheet
rev. D.
03/16/05
08/17/05
12/17/07
•
PAGE 5, CHANGED IN BOTH PARAGRAPHS 4.2, 4.3 IN CONJUNCTION TO 3.3 CHANGED
TO 3.4 AND PARAGRAPH 4.3 CHANGED 3.1.1 TO 3.1 AND 3.2.1 TO 3.1.1
PAGE 4 PARAGRAPH 3.11.1 CHANGED VERBIAGE.
•
•
PAGE 5, PARAGRAPH 4.4.2 CHANGED VERBIAGE.
PAGE 8, FIGURE 2 NOTE 2 ADDED TO LEAD THICKNESS.
06/27/08
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01/24/06
04/30/08
PAGE 2 OF 14
SPEC NO. 05-08-5016
1.0
RH1021-5, PRECISION 5V REFERENCE
SCOPE:
1.1
2.0
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This specification defines the performance and test requirements for a microcircuit processed to a space
level manufacturing flow.
APPLICABLE DOCUMENTS:
2.1
Government Specifications and Standards: the following documents listed in the Department of Defense
Index of Specifications and Standards, of the issue in effect on the date of solicitation, form a part of this
specification to the extent specified herein.
SPECIFICATIONS:
2.2
3.0
MIL-PRF-38535
Integrated Circuits (Microcircuits) Manufacturing, General Specification for
MIL-STD-883
Test Method and Procedures for Microcircuits
MIL-STD-1835
Microcircuits Case Outlines
Order of Precedence: In the event of a conflict between the documents referenced herein and the contents
of this specification, the order of precedence shall be this specification, MIL-PRF-38535 and other
referenced specifications.
REQUIREMENTS:
3.1
General Description: This specification details the requirements for the RH1021-5, Precision 5V
Reference, processed to space level manufacturing flow.
3.2
Part Number:
3.3
3.2.1
Option 1 – RH1021BMH-5 (TO5 Metal Can, 8 Leads)
3.2.2
Option 2 – RH1021CMH-5 (TO5 Metal Can, 8 Leads)
3.2.3
Option 3 – RH1021DMH-5 (TO5 Metal Can, 8 Leads)
3.2.4
Option 4 – RH1021CMW-5 (Glass Sealed Flatpack, 10 Leads)
Part Marking Includes:
3.3.1
LTC Logo
3.3.2
LTC Part Number (See Paragraph 3.2)
3.3.3
Date Code
3.3.4
Serial Number
3.3.5
ESD Identifier per MIL-PRF-38535, Appendix A
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SPEC NO. 05-08-5016
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RH1021-5, PRECISION 5V REFERENCE
The Absolute Maximum Ratings:
Input Voltage
. . . . . . . . . . . . . . . . 40V
Input / Output Voltage Differential
. . . . . . . . . . 35V
Output to Ground Voltage
(Sink Mode Current Limit) . . . . . . . . . 10V
Trim Pin – to – Ground Voltage
Positive
. . . . . . . . . . . . . . . Equal to VOUT
. . . . . . . . . . . . . . . -20V
Negative
Output Short – Circuit Duration
VIN = 35V
. . . . . . . . . . . . . . . 10 sec
VIN = < 20V
. . . . . . . . . . . . . . Indefinite
Operating Temperature Range
. . . . . . . . . . . -55°C to 125°C
. . . . . . . . . . . . -65°C to 150°C
Storage Temperature Range
Lead Temperature (Soldering, 10 sec.) . . . . . . . . . 300°C
NOTE: Absolute maximum ratings are those values beyond which the life of a device
may be impaired.
3.5
Electrostatic discharge sensitivity, ESDS, shall be Class 1.
3.6
Electrical Performance Characteristics: The electrical performance characteristics shall be as specified in
Table I and Table II.
3.7
Electrical Test Requirements: Screening requirements shall be in accordance with 4.1 herein,
MIL-STD-883, Method 5004, and as specified in Table IV herein.
3.8
Burn-In Requirement:
3.8.1
Options 1, 2, 3 (TO5): Static Burn-In, Figure 5
3.8.2
Option 4 (Glass Sealed Flatpack) : Static Burn-In, Figure 6
3.9
Delta Limit Requirement: Delta limit parameters are specified in Table III herein, are calculated after
each burn-in, and the delta rejects are included in the PDA calculation.
3.10
Design, Construction, and Physical Dimensions: Detail design, construction, physical dimensions, and
electrical requirements shall be as specified herein.
3.11
3.10.1.1
Mechanical / Packaging Requirements: Case outlines and dimensions are in accordance with
Figure 1 (TO5/8 Leads) and Figure 2 (Glass Sealed Flatpack/10 Leads).
3.10.2
Terminal Connections: The terminal connections shall be as specified in Figure 3 (TO5/8
Leads) and Figure 4 (Glass Sealed Flatpack/10 Leads).
3.10.3
Lead Material and Finish: The lead material shall be Kovar for TO5 and alloy 42 for flatpack.
The lead finish shall be hot solder dip (Finish letter A) in accordance with MIL-PRF-38535.
Radiation Hardness Assurance (RHA):
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SPEC NO. 05-08-5016
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RH1021-5, PRECISION 5V REFERENCE
3.11.1
The manufacturer shall perform a lot sample test as an internal process monitor for total dose
radiation tolerance. The sample test is performed with MIL-STD-883 TM1019 Condition A as
a guideline.
3.11.2
For guaranteed radiation performance to MIL-STD-883, Method 1019, total dose irradiation,
the manufacturer will provide certified RAD testing and report through an independent test
laboratory when required as a customer purchase order line item.
3.11.3
Total dose bias circuit is specified in Figure 7.
3.12
Wafer Lot Acceptance: Wafer lot acceptance shall be in accordance with MIL-PRF-38535, Appendix A,
except for the following: Topside glassivation thickness shall be a minimum of 4KÅ.
3.13
Wafer Lot Acceptance Report: SEM is performed per MIL-STD-883, Method 2018 and copies of SEM
photographs shall be supplied with the Wafer Lot Acceptance Report as part of a Space Data Pack when
specified as a customer purchase order line item.
VERIFICATION (QUALITY ASSURANCE PROVISIONS)
4.1
Quality Assurance Provisions: Quality Assurance provisions shall be in accordance with MIL-PRF-38535.
Linear Technology is a QML certified company and all Rad Hard candidates are assembled on qualified
Class S manufacturing lines.
4.2
Sampling and Inspection: Sampling and Inspection shall be in accordance with MIL-STD-883, Method
5005 with QML allowed and TRB approved deviations in conjunction with paragraphs 3.1.1, 3.2.1, and
3.4 of the test method.
4.3
Screening: Screening requirements shall be in accordance with MIL-STD-883, Method 5004 with QML
allowed and TRB approved deviations in conjunction with paragraphs 3.1, 3.1.1, and 3.4 of the test
method. Electrical testing shall be as specified in Table IV herein.
4.3.1
4.4
Analysis of catastrophic (open/short) failures from burn-in will be conducted only when a lot fails
the burn-in or re-burn-in PDA requirements.
Quality Conformance Inspection: Quality conformance inspection shall be in accordance with 4.2 and 4.3
herein and as follows:
4.4.1
Group A Inspection: Group A inspection shall be performed in accordance with 4.1 herein, per
MIL-STD-883, Method 5005, and specified in Table IV herein.
4.4.2
Group B Inspection: When purchased, a full Group B is performed on an inspection lot. As a
minimum, Subgroups 1-4 plus 6 are performed on every assembly lot, and Subgroup B2
(Resistance to Solvents / Mark Permanency) and Subgroup B3 (Solderability) are performed prior
to the first shipment from any inspection lot and Attributes provided when a Full Space Data Pack
is ordered. Subgroup B5 (Operating Life) is performed on each wafer lot. This subgroup may or
may not be from devices built in the same package style as the current inspection lot. Attributes
and variables data for this subgroup will be provided upon request at no charge.
4.4.2.1
Group B, Subgroup 2c = 10%
Group B, Subgroup 3 = 10%
Group B, Subgroup 5 = *5%
(*per wafer or inspection lot
whichever is the larger quantity)
Group B, Subgroup 4 = 5%
Group B, Subgroup 6 = 15%
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SPEC NO. 05-08-5016
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RH1021-5, PRECISION 5V REFERENCE
4.4.2.2 All footnotes pertaining to Table IIa in MIL-STD-883, Method 5005 apply. The quantity
(accept number) of all other subgroups are per MIL-STD-883, Method 5005, Table IIa.
4.4.3
4.5
4.6
Group D Inspection: When purchased, a full Group D is performed on an inspection lot. As a
minimum, periodic full Group D sampling is performed on each package family for each assembly
location every 26 weeks. A generic Group D Summary is provided when a full Space Data Pack is
ordered.
4.4.3.1
Group D, Subgroups 3, 4 and 5 = 15% each (Sample Size Series).
4.4.3.2
All footnotes pertaining to Table IV in MIL-STD-883, Method 5005 apply. The
quantity (accept number) or sample number and accept number of all other subgroups
are per MIL-STD-883, Method 5005, Table IV.
Source Inspection:
4.5.1
The manufacturer will coordinate Source Inspection at wafer lot acceptance and pre-seal internal
visual.
4.5.2
The procuring activity has the right to perform source inspection at the supplier’s facility prior to
shipment for each lot of deliverables when specified as a customer purchase order line item. This
may include wafer lot acceptance and final data review.
Deliverable Data: Deliverable data that will ship with devices when a Space Data Pack is ordered:
4.6.1
Lot Serial Number Sheets identifying all devices accepted through final inspection by serial
number
4.6.2
100% attributes (completed lot specific traveler; includes Group A Summary)
4.6.3
Burn-In Variables Data and Deltas (if applicable)
4.6.4
Group B2, B3, and B5 Attributes (Variables data, if performed on lot shipping)
4.6.5
Generic Group D data (4.4.3 herein)
4.6.6
SEM photographs (3.13 herein)
4.6.7
Wafer Lot Acceptance Report (3.13 herein)
4.6.8
X-Ray Negatives and Radiographic Report
4.6.9
A copy of outside test laboratory radiation report if ordered
4.6.10 Certificate of Conformance certifying that the devices meet all the requirements of this
specification and have successfully completed the mandatory tests and inspections herein
Note: Items 4.6.1 and 4.6.10 will be delivered as a minimum, with each shipment. This is noted
on the Purchase Order Review Form as “No Charge Data”.
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SPEC NO. 05-08-5016
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RH1021-5, PRECISION 5V REFERENCE
Packaging Requirements: Packaging shall be in accordance with Appendix A of MIL-PRF-38535. All devices
shall be packaged in conductive material or packaged in anti-static material with an external conductive field
shielding barrier.
DEVICE OPTIONS 1, 2, 3
TO5 METAL CAN / 8 LEADS CASE OUTLINE
θja = +150°C/W
θjc = +40°C/W
FIGURE 1
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SPEC NO. 05-08-5016
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RH1021-5, PRECISION 5V REFERENCE
DEVICE OPTION 4
W10, GLASS SEALED FLATPACK / 10 LEADS CASE OUTLINE
NOTE: 1. THIS DIMENSION ALLOWS FOR OFFCENTER LID, MENISCUS AND GLASS OVER RUN.
NOTE: 2. INCREASE DIMENSION BY 0.003 INCH
WHEN LEAD FINISH IS APPLIED (SOLDER DIPPED).
θja = +170°C/W
θjc = +40°C/W
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SPEC NO. 05-08-5016
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RH1021-5, PRECISION 5V REFERENCE
FIGURE 2
TERMINAL CONNECTIONS
DEVICE OPTIONS 1, 2, 3, TO5 METAL CAN / 8 LEADS
FIGURE 3
OPTION 4, GLASS SEALED FLATPACK / 10 LEADS
FIGURE 4
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SPEC NO. 05-08-5016
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RH1021-5, PRECISION 5V REFERENCE
BURN-IN CIRCUIT
OPTIONS 1, 2, 3, TO5 METAL CAN / 8 LEADS
FIGURE 5
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SPEC NO. 05-08-5016
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RH1021-5, PRECISION 5V REFERENCE
BURN-IN CIRCUIT
OPTION 4, GLASS SEALED FLATPACK / 10 LEADS
FIGURE 6
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SPEC NO. 05-08-5016
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RH1021-5, PRECISION 5V REFERENCE
TOTAL DOSE BIAS CIRCUIT
FIGURE 7
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SPEC NO. 05-08-5016
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RH1021-5, PRECISION 5V REFERENCE
TABLE I: ELECTRICAL CHARACTERISTICS (PRE-IRRADIATION) NOTE 8
TABLE II: ELECTRICAL CHARACTERISTICS (POST-IRRADIATION) NOTE 6
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SPEC NO. 05-08-5016
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RH1021-5, PRECISION 5V REFERENCE
TABLE III: POST BURN-IN ENDPOINTS AND DELTA LIMIT REQUIREMENTS
TA = 25°C
APPLIES TO RH1021BM-5 AND RH1021DM-5
PARAMETER
VOUT
ENDPOINT LIMIT
MIN
MAX
4.95
5.05
DELTA
MIN
-0.003
MAX
0.003
UNITS
V
MAX
0.003
UNITS
V
APPLIES TO RH1021CM-5
PARAMETER
VOUT
ENDPOINT LIMIT
MIN
MAX
4.9975
5.0025
DELTA
MIN
-0.003
TABLE IV: ELECTRICAL TEST REQUIREMENTS
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