-1- FINAL PRODUCT/PROCESS CHANGE NOTIFICATION Generic Copy 19-FEB-2004 SUBJECT: ON Semiconductor Final Product/Process Change Notification #13317 TITLE: Phase#3 Die Design Change (Die Shrink) for Bipolar Power Products EFFECTIVE DATE: 19-Apr-2004 AFFECTED CHANGE CATEGORY: Design Change AFFECTED PRODUCT DIVISION: Discretes Products ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Laura Rivers <[email protected]> SAMPLES: Contact your local ON Semiconductor Sales Office or Mike Schager <[email protected]> FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact Sales Office or Jose Ramirez <[email protected]> NOTIFICATION TYPE: Final Product/Process Change Notification (FPCN) Final change notification sent to customers. FPCNs are issued at least 60 days prior to implementation of the change. ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact your local ON Semiconductor Sales Office. DESCRIPTION AND PURPOSE: This is the Final Notification for the devices listed in Phase#3 of the Die design change (Die shrink) for Bipolar Power Products manufactured in ON Semiconductor's ZR fab in Phoenix, Arizona. This FPCN corresponds to IPCN#12868 found at www.onsemi.com. ON Semiconductor wishes to notify its customers that the listed Bipolar Power Transistors have been subjected to a Die size reduction. Electrical characterization and qualification data have been completed, and device parametric specifications and ratings have not changed. RELIABILITY DATA SUMMARY: Mask#1 TEST MJD45H11T4 Qual Lot Control HTRB 0/77 0/77 H3TRB 0/77 0/77 IOL 0/77 0/77 TC 0/77 0/77 AC 0/77 0/77 Issue Date: 19 Feb, 2004 Page 1 of 4 -2- Final Product/Process Change Notification #13317 Mask#2 TEST MJD44H11T4 Qual Lot Control HTRB 0/77 0/77 H3TRB 0/77 0/77 IOL 0/77 0/77 TC 0/77 0/77 AC 0/77 0/77 Mask#3 TEST 2N5884 2N5886 Qual Lot Control Qual Lot HTRB 0/77 0/77 0/77 0/77 IOL 0/77 0/77 0/77 0/77 TC 0/77 0/77 0/77 0/77 Control ELECTRICAL CHARACTERISTIC SUMMARY: Mask#1 Test Condition Limit Unit Stat MJD45H11 - NPN QUAL LOT CONTROL Iebo Veb=5V <5.00E-5 Amp Avg/Sd 1.83E-10 / 6.55E-11 1.70E-10 / 4.00E-11 Ices Vcb=80V <1.00E-5 Amp Avg/Sd 7.25E-10 / 5.23E-10 6.69E-10 / 2.38E-11 BVceo IC=30mA >80V Volt Avg/Sd 106.6 / 2.9 117.8 / 1.1 hFE 2A/1V >60 Avg/Sd 135.1 / 2.4 117.2 / 0.7 hFE 4A/1V >40 Avg/Sd 93.9 / 1.8 68.0 / 1.1 hFE 8A/1V >20 Avg/Sd 38.2 / 2.0 24.5 / 0.6 VCE(sat) 8A/0.8A <1.0V Volt Avg/Sd 0.5135 / 0.0100 .5361 / 0.0036 VBE(sat) 8A/0.8A <1.5V Volt Avg/Sd 1.1438 / 0.0035 1.0945 / 0.0017 Mask#2 Test Condition Limit Unit Stat MJD44H11 - NPN Iebo Veb=5V <5.00E-5 Amp Ices Vcb=80V <1.00E-5 Amp BVceo hFE hFE hFE VCE(sat) IC=30mA >80V 2A/1V >60 4A/1V >40 8A/1V >20 8A/0.8A <1.0V Volt VBE(sat) 8A/0.8A <1.5V Volt Issue Date: 19 Feb, 2004 Volt QUAL LOT CONTROL Avg/Sd 1.64E-10 / 2.77E-11 2.38E-10 / 2.87E-10 Avg/Sd 3.74E-10 / 4.26E-11 4.84E-09 / 5.60E-09 Avg/Sd 114.6 / 2.6 14.3 / 2.9 Avg/Sd 132.1 / 13.0 115.9 / 12.4 Avg/Sd 88.2 / 6.4 76.9 / 5.9 Avg/Sd 44.8 / 2.3 42.4 / 2.1 Avg/Sd 0.3962 / 0.0044 0.3525 / 0.0059 Avg/Sd 1.1310 / 0.0036 1.0718 / 0.0023 Page 2 of 4 -3- Final Product/Process Change Notification #13317 Mask#3 Test Condition Limit Unit Stat 2N5884 - PNP Iebo Veb=5V <1.00E-03 Amp Iceo Vcb=40V <2.00E-03 Amp Icbo Vcb=80V <1.00E-03 Amp Icex Vce=80V <10.0E-03 Amp BVceo hFE hFE hFE VBE(on) IC=50mA >80V 3A/4V >35 10A/4V 20 - 100 25A/4V >4 10A/4V <1.5V Volt Volt VBE(sat) 25A/6.25A <2.5 Volt VCE(sat) 15A/1.5A <1.0V Volt VCE(sat) 25A/6.25A <4.0V Volt Mask#3 Test Condition Limit Unit Stat 2N5886 - NPN Iebo Veb=5V <1.00E-03 Amp Iceo Vcb=40V <2.00E-03 Amp Icbo Vcb=80V <1.00E-03 Amp Icex Vce=80V <10.0E-03 Amp BVceo hFE hFE hFE VBE(on) IC=50mA >80V 3A/4V >35 10A/4V 20 - 100 25A/4V >4 10A/4V <1.5V Volt Volt VBE(sat) 25A/6.25A <2.5 Volt VCE(sat) 15A/1.5A <1.0V Volt VCE(sat) 25A/6.25A <4.0V Volt Issue Date: 19 Feb, 2004 QUAL LOT CONTROL Avg/Sd 1.03E-09 / 3.51E-10 1.87E-09 / 2.45E-09 Avg/Sd 6.81E-07 / 3.09E-07 8.51E-08 / 1.13E-07 Avg/Sd 5.56E-09 / 6.15E-10 5.43E-09 / 1.36E-09 Avg/Sd 5.98E-09 / 7.11E-10 5.59E-09 / 8.25E-10 Avg/Sd 136.6 / 1.0 159.2 / 9.9 Avg/Sd 150.4 / 5.0 116.7 / 15.1 Avg/Sd 60.1 / 2.2 50.3 / 5.0 Avg/Sd 21.1 / 0.8 18.7 / 1.6 Avg/Sd 1.0261 / 0.0090 1.0462 / 0.0117 Avg/Sd 1.6968 / 0.0095 1.8919 / 0.0294 Avg/Sd 0.5396 / 0.0087 0.6638 / 0.0365 Avg/Sd 0.8809 / 0.0109 1.0987 / 0.0340 QUAL LOT CONTROL Avg/Sd 2.80E-10 / 4.02E-10 3.06E-10 / 3.04E-10 Avg/Sd 2.70E-07 / 1.19E-07 1.02E-07 / 2.41E-08 Avg/Sd 6.10E-09 / 2.04E-09 3.38E-09 / 5.15E-10 Avg/Sd 6.88E-09 / 1.91E-09 6.50E-09 / 1.47E-09 Avg/Sd 107.5 / 2.4 108.8 / 1.8 Avg/Sd 157.1 / 9.8 139.9 / 7.5 Avg/Sd 62.9 / 3.1 62.4 / 2.3 Avg/Sd 16.6 / 0.9 23.4 / 0.9 Avg/Sd 0.9936 / 0.0059 1.0251 / 0.0075 Avg/Sd 1.6271 / 0.0157 1.8355 / 0.0213 Avg/Sd 0.4540 / 0.0089 0.5339 / 0.0116 Avg/Sd 0.7859 / 0.0149 0.9796 / 0.0177 Page 3 of 4 -4- Final Product/Process Change Notification #13317 CHANGED PART IDENTIFICATION: Product marked with date code 0417 and higher may have the new Die design. AFFECTED DEVICE LIST (WITHOUT SPECIALS): PART 2N3771 2N5302 2N5684 2N5686 2N5883 2N5884 2N5885 2N5886 BD249C MJ14001 MJ14002 MJ14003 MJ4502 MJ802 MJD44H11 MJD44H11-001 MJD44H11RL MJD44H11T4 MJD44H11T5 MJD45H11 MJD45H11-001 MJD45H11RL MJD45H11T4 SJD44H11 SJD44H11-001 SJD44H11RL SJD44H11T4 SJD45H11 SJD45H11-001 SJD45H11RL SJD45H11T4 TIP35A TIP35C TIP36A TIP36C Issue Date: 19 Feb, 2004 Page 4 of 4