View PDF

-1-
FINAL PRODUCT/PROCESS CHANGE NOTIFICATION
Generic Copy
19-FEB-2004
SUBJECT: ON Semiconductor Final Product/Process Change Notification #13317
TITLE: Phase#3 Die Design Change (Die Shrink) for Bipolar Power Products
EFFECTIVE DATE: 19-Apr-2004
AFFECTED CHANGE CATEGORY: Design Change
AFFECTED PRODUCT DIVISION: Discretes Products
ADDITIONAL RELIABILITY DATA: Available
Contact your local ON Semiconductor Sales Office or Laura Rivers <[email protected]>
SAMPLES: Contact your local ON Semiconductor Sales Office
or Mike Schager <[email protected]>
FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION:
Contact Sales Office or Jose Ramirez <[email protected]>
NOTIFICATION TYPE:
Final Product/Process Change Notification (FPCN)
Final change notification sent to customers. FPCNs are issued at least 60 days prior to implementation
of the change.
ON Semiconductor will consider this change approved unless specific conditions of acceptance
are provided in writing within 30 days of receipt of this notice. To do so, contact your local ON
Semiconductor Sales Office.
DESCRIPTION AND PURPOSE:
This is the Final Notification for the devices listed in Phase#3 of the Die design change (Die shrink) for
Bipolar Power Products manufactured in ON Semiconductor's ZR fab in Phoenix, Arizona.
This FPCN corresponds to IPCN#12868 found at www.onsemi.com. ON Semiconductor wishes to
notify its customers that the listed Bipolar Power Transistors have been subjected to a Die size
reduction. Electrical characterization and qualification data have been completed, and device
parametric specifications and ratings have not changed.
RELIABILITY DATA SUMMARY:
Mask#1
TEST MJD45H11T4
Qual Lot
Control
HTRB 0/77 0/77
H3TRB 0/77 0/77
IOL
0/77 0/77
TC
0/77 0/77
AC
0/77 0/77
Issue Date: 19 Feb, 2004
Page 1 of 4
-2-
Final Product/Process Change Notification #13317
Mask#2
TEST MJD44H11T4
Qual Lot
Control
HTRB 0/77 0/77
H3TRB 0/77 0/77
IOL
0/77 0/77
TC
0/77 0/77
AC
0/77 0/77
Mask#3
TEST 2N5884 2N5886
Qual Lot
Control Qual Lot
HTRB 0/77 0/77 0/77 0/77
IOL
0/77 0/77 0/77 0/77
TC
0/77 0/77 0/77 0/77
Control
ELECTRICAL CHARACTERISTIC SUMMARY:
Mask#1
Test
Condition
Limit
Unit
Stat
MJD45H11 - NPN
QUAL LOT
CONTROL
Iebo
Veb=5V <5.00E-5
Amp
Avg/Sd 1.83E-10 / 6.55E-11
1.70E-10 / 4.00E-11
Ices
Vcb=80V <1.00E-5
Amp
Avg/Sd 7.25E-10 / 5.23E-10
6.69E-10 / 2.38E-11
BVceo
IC=30mA >80V
Volt
Avg/Sd 106.6 / 2.9 117.8 / 1.1
hFE
2A/1V >60
Avg/Sd 135.1 / 2.4 117.2 / 0.7
hFE
4A/1V >40
Avg/Sd 93.9 / 1.8 68.0 / 1.1
hFE
8A/1V >20
Avg/Sd 38.2 / 2.0 24.5 / 0.6
VCE(sat)
8A/0.8A <1.0V
Volt
Avg/Sd 0.5135 / 0.0100
.5361 / 0.0036
VBE(sat)
8A/0.8A <1.5V
Volt
Avg/Sd 1.1438 / 0.0035
1.0945 / 0.0017
Mask#2
Test
Condition
Limit
Unit
Stat
MJD44H11 - NPN
Iebo
Veb=5V <5.00E-5
Amp
Ices
Vcb=80V <1.00E-5
Amp
BVceo
hFE
hFE
hFE
VCE(sat)
IC=30mA >80V
2A/1V >60
4A/1V >40
8A/1V >20
8A/0.8A <1.0V
Volt
VBE(sat)
8A/0.8A <1.5V
Volt
Issue Date: 19 Feb, 2004
Volt
QUAL LOT
CONTROL
Avg/Sd 1.64E-10 / 2.77E-11
2.38E-10 / 2.87E-10
Avg/Sd 3.74E-10 / 4.26E-11
4.84E-09 / 5.60E-09
Avg/Sd 114.6 / 2.6 14.3 / 2.9
Avg/Sd 132.1 / 13.0 115.9 / 12.4
Avg/Sd 88.2 / 6.4 76.9 / 5.9
Avg/Sd 44.8 / 2.3 42.4 / 2.1
Avg/Sd 0.3962 / 0.0044
0.3525 / 0.0059
Avg/Sd 1.1310 / 0.0036
1.0718 / 0.0023
Page 2 of 4
-3-
Final Product/Process Change Notification #13317
Mask#3
Test
Condition
Limit
Unit
Stat
2N5884 - PNP
Iebo
Veb=5V <1.00E-03
Amp
Iceo
Vcb=40V <2.00E-03
Amp
Icbo
Vcb=80V <1.00E-03
Amp
Icex
Vce=80V <10.0E-03
Amp
BVceo
hFE
hFE
hFE
VBE(on)
IC=50mA >80V
3A/4V >35
10A/4V 20 - 100
25A/4V >4
10A/4V <1.5V
Volt
Volt
VBE(sat)
25A/6.25A <2.5
Volt
VCE(sat)
15A/1.5A <1.0V
Volt
VCE(sat)
25A/6.25A <4.0V
Volt
Mask#3
Test
Condition
Limit
Unit
Stat
2N5886 - NPN
Iebo
Veb=5V <1.00E-03
Amp
Iceo
Vcb=40V <2.00E-03
Amp
Icbo
Vcb=80V <1.00E-03
Amp
Icex
Vce=80V <10.0E-03
Amp
BVceo
hFE
hFE
hFE
VBE(on)
IC=50mA >80V
3A/4V >35
10A/4V 20 - 100
25A/4V >4
10A/4V <1.5V
Volt
Volt
VBE(sat)
25A/6.25A <2.5
Volt
VCE(sat)
15A/1.5A <1.0V
Volt
VCE(sat)
25A/6.25A <4.0V
Volt
Issue Date: 19 Feb, 2004
QUAL LOT
CONTROL
Avg/Sd 1.03E-09 / 3.51E-10
1.87E-09 / 2.45E-09
Avg/Sd 6.81E-07 / 3.09E-07
8.51E-08 / 1.13E-07
Avg/Sd 5.56E-09 / 6.15E-10
5.43E-09 / 1.36E-09
Avg/Sd 5.98E-09 / 7.11E-10
5.59E-09 / 8.25E-10
Avg/Sd 136.6 / 1.0 159.2 / 9.9
Avg/Sd 150.4 / 5.0 116.7 / 15.1
Avg/Sd 60.1 / 2.2 50.3 / 5.0
Avg/Sd 21.1 / 0.8 18.7 / 1.6
Avg/Sd 1.0261 / 0.0090
1.0462 / 0.0117
Avg/Sd 1.6968 / 0.0095
1.8919 / 0.0294
Avg/Sd 0.5396 / 0.0087
0.6638 / 0.0365
Avg/Sd 0.8809 / 0.0109
1.0987 / 0.0340
QUAL LOT
CONTROL
Avg/Sd 2.80E-10 / 4.02E-10
3.06E-10 / 3.04E-10
Avg/Sd 2.70E-07 / 1.19E-07
1.02E-07 / 2.41E-08
Avg/Sd 6.10E-09 / 2.04E-09
3.38E-09 / 5.15E-10
Avg/Sd 6.88E-09 / 1.91E-09
6.50E-09 / 1.47E-09
Avg/Sd 107.5 / 2.4 108.8 / 1.8
Avg/Sd 157.1 / 9.8 139.9 / 7.5
Avg/Sd 62.9 / 3.1 62.4 / 2.3
Avg/Sd 16.6 / 0.9 23.4 / 0.9
Avg/Sd 0.9936 / 0.0059
1.0251 / 0.0075
Avg/Sd 1.6271 / 0.0157
1.8355 / 0.0213
Avg/Sd 0.4540 / 0.0089
0.5339 / 0.0116
Avg/Sd 0.7859 / 0.0149
0.9796 / 0.0177
Page 3 of 4
-4-
Final Product/Process Change Notification #13317
CHANGED PART IDENTIFICATION:
Product marked with date code 0417 and higher may have the new Die design.
AFFECTED DEVICE LIST (WITHOUT SPECIALS):
PART
2N3771
2N5302
2N5684
2N5686
2N5883
2N5884
2N5885
2N5886
BD249C
MJ14001
MJ14002
MJ14003
MJ4502
MJ802
MJD44H11
MJD44H11-001
MJD44H11RL
MJD44H11T4
MJD44H11T5
MJD45H11
MJD45H11-001
MJD45H11RL
MJD45H11T4
SJD44H11
SJD44H11-001
SJD44H11RL
SJD44H11T4
SJD45H11
SJD45H11-001
SJD45H11RL
SJD45H11T4
TIP35A
TIP35C
TIP36A
TIP36C
Issue Date: 19 Feb, 2004
Page 4 of 4