-1- FINAL PRODUCT/PROCESS CHANGE NOTIFICATION Generic Copy 14-NOV-2003 SUBJECT: ON Semiconductor Final Product/Process Change Notification #13215 TITLE: Phase#2 Die Design Change (Die Shrink) for Bipolar Power Products EFFECTIVE DATE: 14-Jan-2004 AFFECTED CHANGE CATEGORY: Die Shrink AFFECTED PRODUCT DIVISION: Bipolar Discretes Products Div ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Laura Rivers <[email protected]> SAMPLES: Contact your local ON Semiconductor Sales Office or Mike Schager <[email protected]> FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact Sales Office or Jose Ramirez <[email protected]> NOTIFICATION TYPE: Final Product/Process Change Notification (FPCN) Final change notification sent to customers. FPCNs are issued at least 60 days prior to implementation of the change. ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact your local ON Semiconductor Sales Office. DESCRIPTION AND PURPOSE: This is the Final Notification for the Phase #2 of IPCN#12868. ON Semiconductor wishes to notify its Customers that some Bipolar Power Transistors have been subjected to a Die size reduction. Electrical characterization and qualification data have been completed, device parametric specifications and ratings have not changed. RELIABILITY DATA SUMMARY: QUALIFICATION PLAN: *Per AEC-Q101 Guidelines. Test* Conditions Parametric verification Per device specification @ 25DegC HTRB 1008 hrs Vcb=80% T=150DegC H3TRB 1008 hrs RH=85% Temp=85DegC Temp Cycle 1K cycles -65DegC to 150DegC Autoclave 96 hrs RH=100% P=15psi Ta=121DegC IOL 8572 cycles Dtj=100DegC Issue Date: 14 Nov, 2003 Page 1 of 6 -2- Final Product/Process Change Notification #13215 Mask#1 TEST HTRB H3TRB IOL TC AC BD244C* Lot A Control 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 BD243C Lot A Control 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 Mask#2 TEST HTRB H3TRB IOL TC AC Lot A 0/77 0/77 0/77 0/77 0/77 TIP102 Lot B 0/77 0/77 0/77 0/77 0/77 Lot A 0/77 0/77 0/77 0/77 0/77 MJD127 Lot B Control 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 Control 0/77 0/77 0/77 0/77 0/77 Lot A 0/77 0/77 0/77 0/77 0/77 TIP107* Lot B Control 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 2N6388 Lot A 0/77 0/77 0/77 0/77 0/77 Control 0/77 0/77 0/77 0/77 0/77 Mask#3 TEST HTRB H3TRB IOL TC AC Mask#4 TEST HTRB H3TRB IOL TC AC 2N6488 Lot A Control 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 2N6491 Lot A Control 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 Mask#5 TEST HTRB H3TRB IOL TC AC Lot A 0/77 0/77 0/77 0/77 0/77 MJD41C Lot B Control 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 Lot A 0/77 0/77 0/77 0/77 0/77 TIP41C Lot B 0/77 0/77 0/77 0/77 0/77 Lot C 0/77 0/77 0/77 0/77 0/77 ELECTRICAL CHARACTERISTIC SUMMARY: Mask#1 Test Iebo Ices Iceo Icex BVceo hFE Condition Veb=5V Vcb=100V Vce=60V Vce= 60V IC=30mA 0.3A/4V Limit <10uA <400uA <700uA <100uA >100V >30 Issue Date: 14 Nov, 2003 Unit nA nA uA nA Volt Stat Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd BD243C - NPN Lot A Control 0.58/0.38 0.32/0.08 9.5/8.6 8.6/0.7 0.43/0.22 1.32/0.17 107.8/2.2 114.3/1.3 330.1/18.4 322.2/10.5 BD244C* - PNP Lot A Control 0.38/0.06 0.40/0.06 0.32/0.22 134.9/0.4 1.1/0.8 136.9/0.3 Page 2 of 6 -3- Final Product/Process Change Notification #13215 Test Condition Limit Unit Stat Lot A Control hFE 3A/4V >15 Avg/Sd 80.8/4.7 58.3/1.8 hFE 0.5A/4V >100 Avg/Sd hFE 1.5A/4V >60 Avg/Sd VCE 6A/0.1A <1.5V Volt Avg/Sd 0.361/0.006 0.664/0.004 (sat) VCE 1.5A/50mA <0.7V Volt Avg/Sd (sat) VBE 6A/4V <2.0V Volt Avg/Sd 1.06/0.006 1.31/0.007 (on) VBE 1.5A/50mA <1.0V Volt Avg/Sd (sat) Mask#2 Test Iebo Icbo Iceo BVceo hFE hFE VCE(sat) VCE(sat) VBE(on) Condition Veb=5V Vcb=100V Vce=50V IC=30mA 3A/4V 8A/4V 3A/6mA 8A/80mA 8A/4V Mask#2 Test Condition Iebo Veb=5V Icbo Vcb=25V Iceo Vce=25V BVceo IC=30mA hFE 3A/4V hFE 8A/4V VCE(sat) 3A/6mA VCE(sat) 8A/80mA VBE(on) 8A/4V Lot A Control 218.8/1.3 126.3/0.7 189.4/2.7 104.6/1.4 0.235/0.002 0.220/0.002 0.855/0.0003 0.886/0.0006 TIP102 - NPN Lot B 0.73/0.02 3.87/0.51 2.17/0.24 151.1/2.1 10707/888 2296/389 0.893/0.006 1.229/0.019 1.864/0.018 Control 0.96/0.03 6.8/1.2 4.37/0.82 141.6/3.0 9156/561 3805/486 0.937/0.007 1.316/0.014 1.974/0.014 Stat Lot A Avg/Sd 0.518/0.016 Avg/Sd 3.11/0.37 Avg/Sd 3.24/0.33 Avg/Sd 157.6/7.3 Avg/Sd 12160/1626 Avg/Sd 2409/499 Avg/Sd 0.971/0.007 Avg/Sd 1.369/0.02 Avg/Sd 1.885/0.019 TIP107* - PNP Lot B 0.534/0.023 2.87/0.01 2.96/0.01 184.1/6.5 10153/183 1788/298 0.977/0.006 1.413/0.016 1.906/0.016 Control 0.384/0.11 3.73/0.03 3.83/0.31 187.9/7.5 7745/1019 1050/186 0.993/0.009 1.498/0.026 1.960/0.018 MJD127T4 - PNP Lot B Control 560/8.4 465/4 3.5/1.0 3.6/0.55 2.4/4.9 2.6/0.27 170.6/6.2 170.3/3.5 5108/788 2551/126 582/120 146/5.4 1.316/0.014 1.517/0.005 2.085/0.064 3.279/0.055 2.681/0.037 3.007/0.004 1.845/0.012 1.947/0.004 Limit Unit <2mA mA <50uA nA <50uA nA >100V Volt 1K-20K >200 <2.0V Volt <2.5V Volt <1.0V Volt Stat Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Limit Unit <2mA mA <100uA nA <50uA nA >80V Volt 1K-30K >200 <2.0V Volt <2.5V Volt <1.0V Volt Lot A 1.11/0.03 4.85/0.70 2.75/0.69 152.2/2.1 8576/493 3019/421 0.881/0.005 1.173/0.014 1.818/0.013 * Special device Mask#3 Test Iebo Icbo Iceo BVceo hFE hFE Vce(sat) Vce(sat) Vbe(sat) Vbe(on) Condition Veb=5V Vcb=100V Vce= 50V Ic=100mA 4A/4V 8A/4V 4A/16mA 8A/80mA 8A/80mA 4A/4V Limit Unit 2mA uA <10uA nA <10uA nA >100V Volts 1K-12K >100 <2.0V Volts <4.0V Volts <4.5V Volts <2.8V Volts Stat Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Mask#3 Test Iebo Icex Iceo Condition Veb=5V Vcb=80V Vce=80V Limit <5mA <300uA <1mA Stat Avg/Sd Avg/Sd Avg/Sd Issue Date: 14 Nov, 2003 Unit uA nA nA Lot A 540/9 11.4/14.5 6.8/8.3 161.2/1.1 5859/169 675/26 1.320/0.006 2.100/0.015 2.707/0.011 1.842/0.003 2N6388 - NPN Lot A 487/13.7 3.0/1.2 3.1/1.2 Control 421/11.5 3.9/0.4 4.0/0.4 Page 3 of 6 -4- Final Product/Process Change Notification #13215 Test Condition Limit Unit Stat BVceo Ic=10mA >80V Volt Avg/Sd hFE 5A/3V 1K-20K Avg/Sd hFE 10A/3V >100 Avg/Sd Vce(sat) 5A/10mA <2.0V Volt Avg/Sd Vce(sat) 10A/0.1A <3.0V Volt Avg/Sd Vbe(on) 5A/3V <2.8V Volt Avg/Sd Vbe(on) 10A/3V <4.5V Volt Avg/Sd Mask#4 Test Iebo Iceo Icex BVceo hFE hFE VCE (sat) VCE (sat) VBE (on) VBE (on) Control 115.9/1.8 4664/588 341/78 1.303/0.01 1.937/0.03 1.926/0.011 2.593/0.021 2N6488 - NPN 2N6491 - PNP Lot A Control Lot A Control 0.16/0.05 0.24/0.12 0.56/0.13 0.76/0.17 0.58/0.07 0.57/0.16 0.21/0.04 0.16/0.03 2.6/0.19 4.4/0.94 2.79/0.68 3.63/0.66 104.9/1.9 113.7/1.6 126.7/2.3 130.7/2.7 104.0/5.5 101.0/2.7 65.3/3.6 54.3/3.9 14.2/0.8 26.4/0.3 16.4/0.9 15.6/1.1 0.222/0.003 0.287/0.012 0.332/0.018 0.361/0.008 Condition Veb=5V Vce=40V Vce= 85V Ic=200mA 5/4V 15A/4V 5A/0.5A Limit Unit <1mA nA <1mA uA <500uA nA >80V Volt 20-150 >15 <1.3V Volt Stat Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd 15A/5A <3.5V Volt Avg/Sd 0.696/0.008 1.065/0.059 0.994/0.023 1.412/0.022 5A/4V <1.3V Volt Avg/Sd 0.913/0.002 0.972/0.001 0.983/0.003 1.049/0.008 15A/4V <3.5V Volt Avg/Sd 1.374/0.008 1.766/0.048 1.561/0.006 2.143/0.042 Mask#5 Test Condition Iebo Veb=5V Ices Vce=100V Iceo Vce= 60V BVceo Ic=30mA hFE 0.3A/4V hFE 3A/4V Vce(sat) 6A/0.6A Vbe(on) 6A/4V Mask#5 Test Iebo Ices Iceo BVceo hFE hFE Vce (sat) Vbe (on) Lot A 119.9/1.6 6499/570 421/48 1.160/0.01 1.740/0.03 1.778/0.009 2.401/0.027 Limit Unit <0.5mA nA <10uA nA <50uA uA >100V Volts >30 15-75 <1.5V Volts <2.0V Volts Stat Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Lot A 0.24/0.03 3.4/0.25 0.22/0.002 112.2/1.2 311.9/11.2 63.5/1.5 0.480/0.011 1.112/0.008 MJD41C Lot B 0.25/0.04 3.3/0.31 0.22/0.004 114.0/0.7 289.5/7.1 61.3/1.0 0.504/0.009 1.126/0.004 Condition Veb=5V Vce=100V Vce= 60V Ic=30mA 0.3A/4V 3A/4V 6A/0.6A Limit <500uA <10uA <50uA >100V >30 15-75 <1.5V Unit nA nA uA Volts Volts Stat Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Lot A 0.31/0.03 2.2/0.09 0.19/0.02 133.5/0.7 240.7/6.7 62.1/1.9 0.882/0.034 TIP42C - PNP Lot B Lot C 0.25/0.03 0.20/0.04 1.8/0.06 1.5/0.08 0.20/0.01 0.08/0.01 133.0/0.7 135.4/3.0 257.7/4.1 233.9/14.4 65.2/1.3 63.0/4.0 0.882/0.015 0.951/0.06 6A/4V <2.0V Volts Avg/Sd 1.176/0.004 1.147/0.002 1.154/0.007 1.288/0.015 Control 0.16/0.05 1.4/0.17 0.04/0.001 123.3/1.3 220.4/9.3 50.7/0.8 0.659/0.012 1.319/0.008 Control 0.25/0.09 7.1/0.38 0.24/0.06 120.8/2.1 232.9/21.4 58.5/3.2 0.972/0.059 CHANGED PART IDENTIFICATION: Product marked with date code 0404 and later may have new Die design. Issue Date: 14 Nov, 2003 Page 4 of 6 -5- Final Product/Process Change Notification #13215 AFFECTED DEVICE LIST (WITHOUT SPECIALS): PART 2N6040 2N6042 2N6107 2N6109 2N6111 2N6288 2N6292 2N6387 2N6388 2N6487 2N6488 2N6490 2N6491 2N6667 2N6668 BD243B BD243C BD244B BD244C BD809 BD810 BDW42 BDW46 BDW47 BDX33B BDX33C BDX34B BDX34C BDX53B BDX53C BDX54B BDX54C MJB41C MJB41CT4 MJB42C MJB42CT4 MJD127 MJD127T4 MJD128T4 MJD2955 MJD2955-001 MJD2955T4 MJD3055 MJD3055T4 MJD41CRL MJD41CT4 MJD42C MJD42C1 MJD42CRL MJD42CT4 MJE2955T MJE3055T MJF2955 Issue Date: 14 Nov, 2003 Page 5 of 6 -6- Final Product/Process Change Notification #13215 MJF3055 MJF6388 MJF6668 SJB42C SJB42CT4 SJD127T4 SJE4021 SJE5384 TIP100 TIP101 TIP102 TIP105 TIP106 TIP107 TIP125 TIP126 TIP127 TIP41 TIP41A TIP41B TIP41C TIP42 TIP42A TIP42B TIP42C TIPC127WP Issue Date: 14 Nov, 2003 Page 6 of 6