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FINAL PRODUCT/PROCESS CHANGE NOTIFICATION
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14-NOV-2003
SUBJECT: ON Semiconductor Final Product/Process Change Notification #13215
TITLE: Phase#2 Die Design Change (Die Shrink) for Bipolar Power Products
EFFECTIVE DATE: 14-Jan-2004
AFFECTED CHANGE CATEGORY: Die Shrink
AFFECTED PRODUCT DIVISION: Bipolar Discretes Products Div
ADDITIONAL RELIABILITY DATA: Available
Contact your local ON Semiconductor Sales Office or Laura Rivers <[email protected]>
SAMPLES: Contact your local ON Semiconductor Sales Office
or Mike Schager <[email protected]>
FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION:
Contact Sales Office or Jose Ramirez <[email protected]>
NOTIFICATION TYPE:
Final Product/Process Change Notification (FPCN)
Final change notification sent to customers. FPCNs are issued at least 60 days prior to implementation
of the change.
ON Semiconductor will consider this change approved unless specific conditions of acceptance
are provided in writing within 30 days of receipt of this notice. To do so, contact your local ON
Semiconductor Sales Office.
DESCRIPTION AND PURPOSE:
This is the Final Notification for the Phase #2 of IPCN#12868. ON Semiconductor wishes to notify its
Customers that some Bipolar Power Transistors have been subjected to a Die size reduction.
Electrical characterization and qualification data have been completed, device parametric specifications
and ratings have not changed.
RELIABILITY DATA SUMMARY:
QUALIFICATION PLAN:
*Per AEC-Q101 Guidelines.
Test*
Conditions
Parametric verification Per device specification @ 25DegC
HTRB
1008 hrs Vcb=80% T=150DegC
H3TRB
1008 hrs RH=85% Temp=85DegC
Temp Cycle
1K cycles -65DegC to 150DegC
Autoclave
96 hrs RH=100% P=15psi Ta=121DegC
IOL
8572 cycles Dtj=100DegC
Issue Date: 14 Nov, 2003
Page 1 of 6
-2-
Final Product/Process Change Notification #13215
Mask#1
TEST
HTRB
H3TRB
IOL
TC
AC
BD244C*
Lot A Control
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
BD243C
Lot A Control
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
Mask#2
TEST
HTRB
H3TRB
IOL
TC
AC
Lot A
0/77
0/77
0/77
0/77
0/77
TIP102
Lot B
0/77
0/77
0/77
0/77
0/77
Lot A
0/77
0/77
0/77
0/77
0/77
MJD127
Lot B Control
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
Control
0/77
0/77
0/77
0/77
0/77
Lot A
0/77
0/77
0/77
0/77
0/77
TIP107*
Lot B Control
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
2N6388
Lot A
0/77
0/77
0/77
0/77
0/77
Control
0/77
0/77
0/77
0/77
0/77
Mask#3
TEST
HTRB
H3TRB
IOL
TC
AC
Mask#4
TEST
HTRB
H3TRB
IOL
TC
AC
2N6488
Lot A Control
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
2N6491
Lot A Control
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
Mask#5
TEST
HTRB
H3TRB
IOL
TC
AC
Lot A
0/77
0/77
0/77
0/77
0/77
MJD41C
Lot B Control
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
Lot A
0/77
0/77
0/77
0/77
0/77
TIP41C
Lot B
0/77
0/77
0/77
0/77
0/77
Lot C
0/77
0/77
0/77
0/77
0/77
ELECTRICAL CHARACTERISTIC SUMMARY:
Mask#1
Test
Iebo
Ices
Iceo
Icex
BVceo
hFE
Condition
Veb=5V
Vcb=100V
Vce=60V
Vce= 60V
IC=30mA
0.3A/4V
Limit
<10uA
<400uA
<700uA
<100uA
>100V
>30
Issue Date: 14 Nov, 2003
Unit
nA
nA
uA
nA
Volt
Stat
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
BD243C - NPN
Lot A
Control
0.58/0.38 0.32/0.08
9.5/8.6
8.6/0.7
0.43/0.22 1.32/0.17
107.8/2.2 114.3/1.3
330.1/18.4 322.2/10.5
BD244C* - PNP
Lot A
Control
0.38/0.06 0.40/0.06
0.32/0.22
134.9/0.4
1.1/0.8
136.9/0.3
Page 2 of 6
-3-
Final Product/Process Change Notification #13215
Test
Condition Limit
Unit Stat
Lot A
Control
hFE
3A/4V
>15
Avg/Sd
80.8/4.7
58.3/1.8
hFE
0.5A/4V
>100
Avg/Sd
hFE
1.5A/4V
>60
Avg/Sd
VCE
6A/0.1A
<1.5V Volt Avg/Sd
0.361/0.006 0.664/0.004
(sat)
VCE
1.5A/50mA <0.7V Volt Avg/Sd
(sat)
VBE
6A/4V
<2.0V Volt Avg/Sd
1.06/0.006 1.31/0.007
(on)
VBE
1.5A/50mA <1.0V Volt Avg/Sd
(sat)
Mask#2
Test
Iebo
Icbo
Iceo
BVceo
hFE
hFE
VCE(sat)
VCE(sat)
VBE(on)
Condition
Veb=5V
Vcb=100V
Vce=50V
IC=30mA
3A/4V
8A/4V
3A/6mA
8A/80mA
8A/4V
Mask#2
Test
Condition
Iebo
Veb=5V
Icbo
Vcb=25V
Iceo
Vce=25V
BVceo IC=30mA
hFE
3A/4V
hFE
8A/4V
VCE(sat) 3A/6mA
VCE(sat) 8A/80mA
VBE(on) 8A/4V
Lot A
Control
218.8/1.3
126.3/0.7
189.4/2.7
104.6/1.4
0.235/0.002 0.220/0.002
0.855/0.0003 0.886/0.0006
TIP102 - NPN
Lot B
0.73/0.02
3.87/0.51
2.17/0.24
151.1/2.1
10707/888
2296/389
0.893/0.006
1.229/0.019
1.864/0.018
Control
0.96/0.03
6.8/1.2
4.37/0.82
141.6/3.0
9156/561
3805/486
0.937/0.007
1.316/0.014
1.974/0.014
Stat
Lot A
Avg/Sd 0.518/0.016
Avg/Sd 3.11/0.37
Avg/Sd 3.24/0.33
Avg/Sd 157.6/7.3
Avg/Sd 12160/1626
Avg/Sd 2409/499
Avg/Sd 0.971/0.007
Avg/Sd 1.369/0.02
Avg/Sd 1.885/0.019
TIP107* - PNP
Lot B
0.534/0.023
2.87/0.01
2.96/0.01
184.1/6.5
10153/183
1788/298
0.977/0.006
1.413/0.016
1.906/0.016
Control
0.384/0.11
3.73/0.03
3.83/0.31
187.9/7.5
7745/1019
1050/186
0.993/0.009
1.498/0.026
1.960/0.018
MJD127T4 - PNP
Lot B
Control
560/8.4
465/4
3.5/1.0
3.6/0.55
2.4/4.9
2.6/0.27
170.6/6.2
170.3/3.5
5108/788
2551/126
582/120
146/5.4
1.316/0.014
1.517/0.005
2.085/0.064
3.279/0.055
2.681/0.037
3.007/0.004
1.845/0.012
1.947/0.004
Limit Unit
<2mA mA
<50uA nA
<50uA nA
>100V Volt
1K-20K
>200
<2.0V Volt
<2.5V Volt
<1.0V Volt
Stat
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Limit Unit
<2mA mA
<100uA nA
<50uA nA
>80V Volt
1K-30K
>200
<2.0V Volt
<2.5V Volt
<1.0V Volt
Lot A
1.11/0.03
4.85/0.70
2.75/0.69
152.2/2.1
8576/493
3019/421
0.881/0.005
1.173/0.014
1.818/0.013
* Special device
Mask#3
Test
Iebo
Icbo
Iceo
BVceo
hFE
hFE
Vce(sat)
Vce(sat)
Vbe(sat)
Vbe(on)
Condition
Veb=5V
Vcb=100V
Vce= 50V
Ic=100mA
4A/4V
8A/4V
4A/16mA
8A/80mA
8A/80mA
4A/4V
Limit Unit
2mA
uA
<10uA nA
<10uA nA
>100V Volts
1K-12K
>100
<2.0V Volts
<4.0V Volts
<4.5V Volts
<2.8V Volts
Stat
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Mask#3
Test
Iebo
Icex
Iceo
Condition
Veb=5V
Vcb=80V
Vce=80V
Limit
<5mA
<300uA
<1mA
Stat
Avg/Sd
Avg/Sd
Avg/Sd
Issue Date: 14 Nov, 2003
Unit
uA
nA
nA
Lot A
540/9
11.4/14.5
6.8/8.3
161.2/1.1
5859/169
675/26
1.320/0.006
2.100/0.015
2.707/0.011
1.842/0.003
2N6388 - NPN
Lot A
487/13.7
3.0/1.2
3.1/1.2
Control
421/11.5
3.9/0.4
4.0/0.4
Page 3 of 6
-4-
Final Product/Process Change Notification #13215
Test
Condition
Limit
Unit
Stat
BVceo Ic=10mA
>80V
Volt
Avg/Sd
hFE
5A/3V
1K-20K
Avg/Sd
hFE
10A/3V
>100
Avg/Sd
Vce(sat) 5A/10mA
<2.0V Volt
Avg/Sd
Vce(sat) 10A/0.1A
<3.0V Volt
Avg/Sd
Vbe(on) 5A/3V
<2.8V Volt
Avg/Sd
Vbe(on) 10A/3V
<4.5V Volt
Avg/Sd
Mask#4
Test
Iebo
Iceo
Icex
BVceo
hFE
hFE
VCE
(sat)
VCE
(sat)
VBE
(on)
VBE
(on)
Control
115.9/1.8
4664/588
341/78
1.303/0.01
1.937/0.03
1.926/0.011
2.593/0.021
2N6488 - NPN
2N6491 - PNP
Lot A
Control
Lot A
Control
0.16/0.05
0.24/0.12 0.56/0.13
0.76/0.17
0.58/0.07
0.57/0.16 0.21/0.04
0.16/0.03
2.6/0.19
4.4/0.94
2.79/0.68
3.63/0.66
104.9/1.9
113.7/1.6 126.7/2.3
130.7/2.7
104.0/5.5
101.0/2.7 65.3/3.6
54.3/3.9
14.2/0.8
26.4/0.3
16.4/0.9
15.6/1.1
0.222/0.003 0.287/0.012 0.332/0.018 0.361/0.008
Condition
Veb=5V
Vce=40V
Vce= 85V
Ic=200mA
5/4V
15A/4V
5A/0.5A
Limit Unit
<1mA nA
<1mA uA
<500uA nA
>80V Volt
20-150
>15
<1.3V Volt
Stat
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
15A/5A
<3.5V
Volt
Avg/Sd 0.696/0.008 1.065/0.059 0.994/0.023 1.412/0.022
5A/4V
<1.3V
Volt
Avg/Sd 0.913/0.002 0.972/0.001 0.983/0.003 1.049/0.008
15A/4V
<3.5V
Volt
Avg/Sd 1.374/0.008 1.766/0.048 1.561/0.006 2.143/0.042
Mask#5
Test
Condition
Iebo
Veb=5V
Ices
Vce=100V
Iceo
Vce= 60V
BVceo Ic=30mA
hFE
0.3A/4V
hFE
3A/4V
Vce(sat) 6A/0.6A
Vbe(on) 6A/4V
Mask#5
Test
Iebo
Ices
Iceo
BVceo
hFE
hFE
Vce
(sat)
Vbe
(on)
Lot A
119.9/1.6
6499/570
421/48
1.160/0.01
1.740/0.03
1.778/0.009
2.401/0.027
Limit Unit
<0.5mA nA
<10uA nA
<50uA uA
>100V Volts
>30
15-75
<1.5V Volts
<2.0V Volts
Stat
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Lot A
0.24/0.03
3.4/0.25
0.22/0.002
112.2/1.2
311.9/11.2
63.5/1.5
0.480/0.011
1.112/0.008
MJD41C
Lot B
0.25/0.04
3.3/0.31
0.22/0.004
114.0/0.7
289.5/7.1
61.3/1.0
0.504/0.009
1.126/0.004
Condition
Veb=5V
Vce=100V
Vce= 60V
Ic=30mA
0.3A/4V
3A/4V
6A/0.6A
Limit
<500uA
<10uA
<50uA
>100V
>30
15-75
<1.5V
Unit
nA
nA
uA
Volts
Volts
Stat
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Lot A
0.31/0.03
2.2/0.09
0.19/0.02
133.5/0.7
240.7/6.7
62.1/1.9
0.882/0.034
TIP42C - PNP
Lot B
Lot C
0.25/0.03 0.20/0.04
1.8/0.06
1.5/0.08
0.20/0.01 0.08/0.01
133.0/0.7 135.4/3.0
257.7/4.1 233.9/14.4
65.2/1.3
63.0/4.0
0.882/0.015 0.951/0.06
6A/4V
<2.0V
Volts
Avg/Sd
1.176/0.004
1.147/0.002 1.154/0.007 1.288/0.015
Control
0.16/0.05
1.4/0.17
0.04/0.001
123.3/1.3
220.4/9.3
50.7/0.8
0.659/0.012
1.319/0.008
Control
0.25/0.09
7.1/0.38
0.24/0.06
120.8/2.1
232.9/21.4
58.5/3.2
0.972/0.059
CHANGED PART IDENTIFICATION:
Product marked with date code 0404 and later may have new Die design.
Issue Date: 14 Nov, 2003
Page 4 of 6
-5-
Final Product/Process Change Notification #13215
AFFECTED DEVICE LIST (WITHOUT SPECIALS):
PART
2N6040
2N6042
2N6107
2N6109
2N6111
2N6288
2N6292
2N6387
2N6388
2N6487
2N6488
2N6490
2N6491
2N6667
2N6668
BD243B
BD243C
BD244B
BD244C
BD809
BD810
BDW42
BDW46
BDW47
BDX33B
BDX33C
BDX34B
BDX34C
BDX53B
BDX53C
BDX54B
BDX54C
MJB41C
MJB41CT4
MJB42C
MJB42CT4
MJD127
MJD127T4
MJD128T4
MJD2955
MJD2955-001
MJD2955T4
MJD3055
MJD3055T4
MJD41CRL
MJD41CT4
MJD42C
MJD42C1
MJD42CRL
MJD42CT4
MJE2955T
MJE3055T
MJF2955
Issue Date: 14 Nov, 2003
Page 5 of 6
-6-
Final Product/Process Change Notification #13215
MJF3055
MJF6388
MJF6668
SJB42C
SJB42CT4
SJD127T4
SJE4021
SJE5384
TIP100
TIP101
TIP102
TIP105
TIP106
TIP107
TIP125
TIP126
TIP127
TIP41
TIP41A
TIP41B
TIP41C
TIP42
TIP42A
TIP42B
TIP42C
TIPC127WP
Issue Date: 14 Nov, 2003
Page 6 of 6