FINAL NOTICE – PRODUCT / PROCESS CHANGE Generic Copy 04-JUL-2001 SUBJECT: Product/Process Change Notification #11148 TITLE: Final Notification for SOT23 CapacityExpansion to PSI EFFECTIVE DATE: 14-Aug-2001 AFFECTED CHANGE CATEGORY: Subcontractor Assembly Site & Subcontractor Test Site AFFECTED PRODUCT DIVISION: Bipolar Discrete Products Division ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Jake Lee <[email protected]> SAMPLES: Contact Below Contact your local ON Semiconductor Sales Office or Bonap Man <[email protected]> FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact Sales Office or Frederic Lavarenne [email protected] DISCLAIMER: Initial Product/Process Change Notification (IPCN) - First Notification distributed to customers. Distributed at least 120 days from the effective date of the change. Final Product/Process Change Notification (FPCN) - Final Notification completing the notification process. Distributed at least 60 days from the effective date of the change. ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact your local ON Semiconductor Sales Office. DESCRIPTION AND PURPOSE: ON Semiconductor is pleased to announce Assembly/Test qualification of SOT23 manufacturing at PSI(Pacific Semiconductor Inc.), ON Semiconductor's subcontractor in the Philipines. This notification affects NPN/PNP General purpose transistors, and Switching diodes. PSI has been both QS9000 and AEC certified and has been producing many technologies in various packages for customers worldwide. This expansion will provide additional flexibility and capacity needed to improve responsiveness and on time delivery to our valuable customers. Process/equipment will be an exact copy of ON Semiconductor's. Therefore, there will be no change to the form, fit, and function of the devices. Parts will continue to meet or exceed ON Semiconductor's reliability standards. Though customers might not be receiving the parts from PSI upon the expiration of FPCN, it is expected for PSI to build devices in the list below, if necessary, when ON Semiconductor needs additional capacity after the effective date of this FPCN. Issue Date: 4 July, 2001 Page 1 of 3 Product/Process Change Notification #11148 QUALIFICATION PLAN: Reliability Test Vehicles: MMBT3904LT1 and BAS19LT1 Test Desc. Test condition Interval Autoclave Ta=121DegC, P=15psig, RH=100% 96 hours Sample size 231 Temp cycle Ta= -65/150DegC, air to air Dwell >10 mins 1000 cycles 231 High Temp Storage Ta=150DegC 1008 hours 231 Solder Heat Ta=260DegC 1X 135 High Temp Reverse Bias Ta=150DegC, V=rated 1008 hours 231 IOL Ton=Toff, Ta=25DegC, Delta Tj=100DegC or rated Pd 1008 hours 231 H3TRB Ta=85DegC, RH=85%, V=80% of rated voltage or 100V depending on whichever is lower. 1008 hours 231 RELIABILITY DATA SUMMARY: Reliability Test Vehicles: MMBT3904LT1 and BAS19LT1 ENVIRONMENTAL TEST SUMMARY SAMPLE REJECTS TEST TEST CONDITIONS INTERVAL SIZE CAT/LIM/DEL Autoclave Ta=121DegC,P=15psig, 96 hrs 231 0 0 0 RH = 100% 192 hrs 231 0 0 0 Temp Cycle Ta=-65/150DegC, Air to Air, Dwell > 10 min High Temp Storage Ta=150DegC Solder Heat Ta=260DegC 500 cyc 1000 cyc 231 231 0 0 0 0 0 0 500 hrs 1000 hrs 231 231 0 0 0 0 0 0 135 0 0 0 1X LIFE TEST SUMMARY TEST High Temp Reverse Bias Intermittent Operating Life TEST CONDITIONS Environment Bias Ta=150DegC V=rated Ton=Toff, Ta=25DegC SAMPLE REJECTS SIZE CAT/LIM/DEL 231 0 0 0 231 0 0 0 500 hrs 1000 hrs 231 231 0 0 0 0 0 0 High Humidity Ta=85DegC, V=80% of 500 hrs High Temp RH=85% rated voltage 1000 hrs Reverse Bias or 100V depending on whichever is lower 231 231 0 0 0 0 0 0 Issue Date: 4 July, 2001 Delta Tj= 100DegC or rated PD INTERVAL 500 hrs 1000 hrs Page 2 of 3 Product/Process Change Notification #11148 ELECTRICAL CHARACTERISTIC SUMMARY: Data summary shows no significant variation between current assembly sites and PSI. CHANGED PART IDENTIFICATION: For site identification purpose, the date code character will be rotated 90 degrees counterclockwise and have a bar on the bottom with respect to the device marking. ADDITIONAL INFORMATION: Additional contacts for Notifications: Sample contact(s) at ON Semiconductor: Americas Name Jake Lee Email [email protected] Phone 602 244-3453 Country USA Asia-Pacific Name Bonap Man Email [email protected] Phone 852-26890231 Country Hongkong Europe Name Frederic Lavarenne Email [email protected] Phone 33.5.34.61.13.14 Country France AFFECTED DEVICE LIST (WITHOUT SPECIALS): PART BAS19LT1 BAS20LT1 BAV74LT1 BAV74LT3 BC856ALT1 BC857ALT1 BC857BLT1 BC857BLT3 BC858ALT1 BC858CLT1 BC858CLT3 BC859CLT1 MMBD2835LT1 MMBD2836LT1 MMBD2838LT1 MMBD6100LT1 MMBD6100LT3 Issue Date: 4 July, 2001 Page 3 of 3