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FINAL NOTICE – PRODUCT / PROCESS CHANGE
Generic Copy
04-JUL-2001
SUBJECT: Product/Process Change Notification #11148
TITLE: Final Notification for SOT23 CapacityExpansion to PSI
EFFECTIVE DATE: 14-Aug-2001
AFFECTED CHANGE CATEGORY: Subcontractor Assembly Site & Subcontractor Test Site
AFFECTED PRODUCT DIVISION: Bipolar Discrete Products Division
ADDITIONAL RELIABILITY DATA: Available
Contact your local ON Semiconductor Sales Office or Jake Lee <[email protected]>
SAMPLES: Contact Below
Contact your local ON Semiconductor Sales Office or Bonap Man <[email protected]>
FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION:
Contact Sales Office or Frederic Lavarenne [email protected]
DISCLAIMER:
Initial Product/Process Change Notification (IPCN) - First Notification distributed to customers.
Distributed at least 120 days from the effective date of the change.
Final Product/Process Change Notification (FPCN) - Final Notification completing the notification
process. Distributed at least 60 days from the effective date of the change. ON Semiconductor will
consider this change approved unless specific conditions of acceptance are provided in writing within
30 days of receipt of this notice. To do so, contact your local ON Semiconductor Sales Office.
DESCRIPTION AND PURPOSE:
ON Semiconductor is pleased to announce Assembly/Test qualification of SOT23 manufacturing at
PSI(Pacific Semiconductor Inc.), ON Semiconductor's subcontractor in the Philipines.
This notification affects NPN/PNP General purpose transistors, and Switching diodes. PSI has been
both QS9000 and AEC certified and has been producing many technologies in various packages for
customers worldwide. This expansion will provide additional flexibility and capacity needed to
improve responsiveness and on time delivery to our valuable customers. Process/equipment will be an
exact copy of ON Semiconductor's. Therefore, there will be no change to the form, fit, and function of
the devices. Parts will continue to meet or exceed ON Semiconductor's reliability standards. Though
customers might not be receiving the parts from PSI upon the expiration of FPCN, it is expected for
PSI to build devices in the list below, if necessary, when ON Semiconductor needs additional capacity
after the effective date of this FPCN.
Issue Date: 4 July, 2001
Page 1 of 3
Product/Process Change Notification #11148
QUALIFICATION PLAN:
Reliability Test Vehicles: MMBT3904LT1 and BAS19LT1
Test Desc.
Test condition
Interval
Autoclave
Ta=121DegC, P=15psig, RH=100%
96 hours
Sample size
231
Temp cycle
Ta= -65/150DegC, air to air
Dwell >10 mins
1000 cycles
231
High Temp
Storage
Ta=150DegC
1008 hours
231
Solder Heat
Ta=260DegC
1X
135
High Temp
Reverse Bias
Ta=150DegC, V=rated
1008 hours
231
IOL
Ton=Toff, Ta=25DegC,
Delta Tj=100DegC or rated Pd
1008 hours
231
H3TRB
Ta=85DegC, RH=85%, V=80%
of rated voltage or 100V depending on
whichever is lower.
1008 hours
231
RELIABILITY DATA SUMMARY: Reliability Test Vehicles: MMBT3904LT1 and BAS19LT1
ENVIRONMENTAL TEST SUMMARY
SAMPLE
REJECTS
TEST
TEST CONDITIONS
INTERVAL
SIZE
CAT/LIM/DEL
Autoclave
Ta=121DegC,P=15psig,
96 hrs
231
0 0 0
RH = 100%
192 hrs
231
0 0
0
Temp Cycle
Ta=-65/150DegC,
Air to Air, Dwell > 10 min
High Temp
Storage
Ta=150DegC
Solder Heat
Ta=260DegC
500 cyc
1000 cyc
231
231
0
0
0
0
0
0
500 hrs
1000 hrs
231
231
0
0
0
0
0
0
135
0
0
0
1X
LIFE TEST SUMMARY
TEST
High Temp
Reverse Bias
Intermittent
Operating
Life
TEST CONDITIONS
Environment Bias
Ta=150DegC V=rated
Ton=Toff,
Ta=25DegC
SAMPLE
REJECTS
SIZE
CAT/LIM/DEL
231
0
0 0
231
0
0 0
500 hrs
1000 hrs
231
231
0
0
0
0
0
0
High Humidity Ta=85DegC, V=80% of
500 hrs
High Temp
RH=85%
rated voltage 1000 hrs
Reverse Bias
or 100V depending
on whichever is lower
231
231
0
0
0
0
0
0
Issue Date: 4 July, 2001
Delta Tj=
100DegC
or rated PD
INTERVAL
500 hrs
1000 hrs
Page 2 of 3
Product/Process Change Notification #11148
ELECTRICAL CHARACTERISTIC SUMMARY:
Data summary shows no significant variation between current assembly sites and PSI.
CHANGED PART IDENTIFICATION:
For site identification purpose, the date code character will be rotated 90 degrees counterclockwise and
have a bar on the bottom with respect to the device marking.
ADDITIONAL INFORMATION:
Additional contacts for Notifications:
Sample contact(s) at ON Semiconductor:
Americas
Name Jake Lee
Email [email protected]
Phone 602 244-3453
Country USA
Asia-Pacific
Name Bonap Man
Email [email protected]
Phone 852-26890231
Country Hongkong
Europe
Name Frederic Lavarenne
Email [email protected]
Phone 33.5.34.61.13.14
Country France
AFFECTED DEVICE LIST (WITHOUT SPECIALS):
PART
BAS19LT1
BAS20LT1
BAV74LT1
BAV74LT3
BC856ALT1
BC857ALT1
BC857BLT1
BC857BLT3
BC858ALT1
BC858CLT1
BC858CLT3
BC859CLT1
MMBD2835LT1
MMBD2836LT1
MMBD2838LT1
MMBD6100LT1
MMBD6100LT3
Issue Date: 4 July, 2001
Page 3 of 3