View PDF

FINAL PRODUCT/PROCESS CHANGE NOTIFICATION
Generic Copy
02 Jun 2009
SUBJECT: ON Semiconductor Final Product/Process Change Notification #16271
TITLE: Final Notification for Transfer of Products from MOS9 Wafer Fab (East Kilbride,
Scotland) to CZ4 Wafer Fab (Roznov, Czech Republic)
PROPOSED FIRST SHIP DATE: 31 Aug 2009
AFFECTED CHANGE CATEGORY(S): ON Semiconductor Wafer Fab site
AFFECTED PRODUCT DIVISION(S): Emitter-Coupled Logic (ECL) E-Plus Translators
FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION:
Contact Sales Office or Eric Rupnow < [email protected] >
SAMPLES: Samples will be available at the beginning of July 2009
ADDITIONAL RELIABILITY DATA: Available
Contact your local ON Semiconductor Sales Office or Matt Kas < [email protected] >
NOTIFICATION TYPE:
Final Product/Process Change Notification (FPCN)
Final change notification sent to customers. FPCNs are issued at least 90 days prior to implementation
of the change.
ON Semiconductor will consider this change approved unless specific conditions of acceptance are
provided in writing within 30 days of receipt of this notice. To do so, contact your local ON
Semiconductor Sales Office.
DESCRIPTION AND PURPOSE:
This is the FPCN to IPCN16242 available at www.onsemi.com.
MOS9 wafer fab will no longer support the fabrication of the E-Plus ECL translators. In order
to continue to support our customer’s requirements for E-Plus ECL Translator products, the
fabrication of these devices is being moved from current wafer fab, MOS9 in East Kilbride
Scotland, to ON Semiconductor’s wafer fab, CZ4 in Roznov Czech Republic.
Due to slight increase in circuit current observed on CZ4 material, ICCH and ICCL upper
specification limits are being changed.
For MC100EPT23 and MC100LVELT23:
Change ICCH Limits at all temperatures from (10mA, 25mA) to (10mA, 30mA)
Change ICCL Limits at all temperatures from (15mA, 36mA) to (15mA, 40mA)
Issue Date: 02 Jun 2009
Rev.14 Jun 2007
Page 1 of 3
Final Product/Process Change Notification #16271
For NB100ELT23L:
Change ICCH Limits at all temperatures from (10mA, 20mA) to (10mA, 25mA)
Change ICCL Limits at all temperatures from (15mA, 25mA) to (15mA, 30mA)
For MC100EPT21:
Change ICCH Limits at all temperatures from (5mA, 20mA) to (5mA, 25mA)
Change ICCL Limits at all temperatures from (8mA, 26mA) to (8mA, 30mA)
For MC100EPT26:
Change ICCH Limits at all temperatures from (10mA, 18mA) to (10mA, 25mA)
Change ICCL Limits at all temperatures from (15mA, 35mA) to (15mA, 40mA)
QUALIFICATION PLAN:
Reliability testing will be performed on the MC100EPT23DG qualification vehicle chosen
based on die size, voltage rating, and run rates.
RELIABILITY TEST RESULTS:
Reliability Test
1. High Temp Op Life
2. High Temp Storage (150 °C)
3. Pre-Conditioning MSL1 260
4. HAST (130°C/85%RH)
5. Autoclave (121°C/100%RH/15PSIG)
6. Temp Cycling (-65 °C to +150 °C)
8. ESD - Human Body Model
9. ESD - Machine Model
10. Latch-Up
11. SAT (Pre-condition 260 C, MSL 1
Conditions
1008 hrs. (FIT < 1000)
504 hrs.
96 hrs.
96 hrs.
500 cycles
2000 V Minimum
200 V Minimum
JESD78 Minimum
Results
0/80
0/80
0/80
0/80
0/80
0/80
4000V
200V
Passed
Passed
ELECTRICAL CHARACTERISTIC SUMMARY:
DC,AC, ESD, and Latch-up testing has been performed on representative qualification vehicle
and compared to historical data. Characterization results on all qualification device matched
historical data. Characterization results are available for review upon request.
CHANGED PART IDENTIFICATION: N/A
Issue Date: 02 Jun 2009
Rev.14 Jun 2007
Page 2 of 3
Final Product/Process Change Notification #16271
AFFECTED DEVICE LIST
MC100EPT21D
MC100EPT21DG
MC100EPT21DR2
MC100EPT21DR2G
MC100EPT21DT
MC100EPT21DTG
MC100EPT21DTR2
MC100EPT21DTR2G
MC100EPT21MNR4
MC100EPT21MNR4G
MC100EPT23D
MC100EPT23DG
MC100EPT23DR2
MC100EPT23DR2G
MC100EPT23DT
MC100EPT23DTG
MC100EPT23DTR2
MC100EPT23DTR2G
MC100EPT23MNR4
MC100EPT23MNR4G
MC100EPT26D
MC100EPT26DG
MC100EPT26DR2
MC100EPT26DR2G
MC100EPT26DT
MC100EPT26DTG
MC100EPT26DTR2
MC100EPT26DTR2G
MC100EPT26MNR4
MC100EPT26MNR4G
MC100LVELT23D
MC100LVELT23DG
MC100LVELT23DR2
MC100LVELT23DR2G
MC100LVELT23DT
MC100LVELT23DTG
MC100LVELT23DTR2
MC100LVELT23DTRG
MC100LVELT23MNRG
NB100ELT23LD
NB100ELT23LDG
NB100ELT23LDR2
NB100ELT23LDR2G
NB100ELT23LDT
NB100ELT23LDTG
NB100ELT23LDTR2
NB100ELT23LDTR2G
Issue Date: 02 Jun 2009
Rev.14 Jun 2007
Page 3 of 3