PHILIPS 74ABT841DB

74ABT841
10-bit bus interface latch; 3-state
Rev. 03 — 25 March 2010
Product data sheet
1. General description
The 74ABT841 high performance BiCMOS device combines low static and dynamic
power dissipation with high speed and high output drive.
The 74ABT841 bus interface register is designed to provide extra data width for wider
data/address paths of buses carrying parity.
The 74ABT841 consists of ten D-type latches with 3-state outputs. The flip-flops appear
transparent to the data when latch enable (LE) is HIGH. This allows asynchronous
operation, as the output transition follows the data in transition. On the LE HIGH-to-LOW
transition, the data that meets the set-up and hold time is latched.
Data appears on the bus when the output enable (OE) is LOW. When OE is HIGH the
output is in the high-impedance state.
2. Features and benefits
„ High speed parallel latches
„ Extra data width for wide address/data paths or buses carrying parity
„ Ideal where high speed, light loading, or increased fan-in are required with MOS
microprocessors
„ Broadside pinout
„ Output capability: +64 mA and −32 mA
„ Power-up 3-state
„ Power-up reset
„ Latch-up protection exceeds 500 mA per JESD78B class II level A
„ ESD protection:
‹ HBM JESD22-A114F exceeds 2000 V
‹ MM JESD22-A115-A exceeds 200 V
74ABT841
NXP Semiconductors
10-bit bus interface latch; 3-state
3. Ordering information
Table 1.
Ordering information
Type number
Package
Temperature
range
Name
Description
Version
74ABT841D
−40 °C to +85 °C
SO24
plastic small outline package; 24 leads;
body width 7.5 mm
SOT137-1
74ABT841DB
−40 °C to +85 °C
SSOP24
plastic shrink small outline package; 24 leads;
body width 5.3 mm
SOT340-1
74ABT841PW
−40 °C to +85 °C
TSSOP24
plastic thin shrink small outline package; 24 leads;
body width 4.4 mm
SOT355-1
4. Functional diagram
1
13
2
3
4
5
6
7
8
9
10 11
2
D0 D1 D2 D3 D4 D5 D6 D7 D8 D9
13
1
LE
OE
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7 Q8 Q9
23 22 21 20 19 18 17 16 15 14
001aae911
EN
C1
23
1D
3
22
4
21
5
20
6
19
7
18
8
17
9
16
10
15
11
14
001aae912
Fig 1.
Logic symbol
D0
2
D1
3
D
L
LE
OE
Fig 2.
D2
4
D
Q
L
D3
5
D
Q
L
D4
6
D
Q
L
D5
7
D
Q
IEC logic symbol
L
D6
8
D
Q
L
D7
9
D
Q
L
D8
10
D
Q
L
D9
11
D
Q
L
D
Q
L
Q
13
1
23
Q0
22
Q1
21
Q2
20
Q3
19
Q4
18
Q5
17
Q6
16
Q7
15
Q8
14
Q9
001aae913
Fig 3.
Logic diagram
74ABT841_3
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 03 — 25 March 2010
© NXP B.V. 2010. All rights reserved.
2 of 15
74ABT841
NXP Semiconductors
10-bit bus interface latch; 3-state
5. Pinning information
5.1 Pinning
74ABT841
OE
1
24 VCC
D0
2
23 Q0
D1
3
22 Q1
D2
4
21 Q2
D3
5
20 Q3
D4
6
19 Q4
D5
7
18 Q5
D6
8
17 Q6
D7
9
16 Q7
D8 10
15 Q8
D9 11
14 Q9
GND 12
13 LE
001aae910
Fig 4.
Pin configuration
5.2 Pin description
Table 2.
Pin description
Symbol
Pin
Description
OE
1
output enable input (active LOW)
D0 to D9
2, 3, 4, 5, 6, 7, 8, 9,10, 11
data input
GND
12
ground (0 V)
LE
13
latch enable input (active falling edge)
Q0 to Q9
23, 22, 21, 20, 19, 18, 17, 16, 15, 14
data output
VCC
24
positive supply voltage
74ABT841_3
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 03 — 25 March 2010
© NXP B.V. 2010. All rights reserved.
3 of 15
74ABT841
NXP Semiconductors
10-bit bus interface latch; 3-state
6. Functional description
Table 3.
Function table[1]
Input
Output
Operating mode
OE
LE
nD
Q0 to Q9
L
H
L
L
L
H
H
H
L
↓
l
L
L
↓
h
H
H
X
X
Z
high-impedance
L
L
X
NC
hold
[1]
transparent
latched
H = HIGH voltage level;
h = HIGH voltage level one set-up time prior to the LOW-to-HIGH LE transition;
L = LOW voltage level;
l = LOW voltage level one set-up time prior to the LOW-to-HIGH LE transition;
↓ = HIGH-to-LOW clock transition;
NC = no change;
X = don’t care;
Z = high-impedance OFF-state.
7. Limiting values
Table 4.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
VCC
supply voltage
Conditions
Min
Max
Unit
−0.5
+7.0
V
input voltage
[1]
−1.2
+7.0
V
VO
output voltage
output in OFF-state or HIGH-state
[1]
−0.5
+5.5
V
IIK
input clamping current
VI < 0 V
−18
-
mA
IOK
output clamping current
VO < 0 V
−50
-
mA
IO
output current
output in LOW-state
-
128
mA
-
150
°C
−65
+150
°C
VI
Tj
junction temperature
Tstg
storage temperature
[2]
[1]
The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
[2]
The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150 °C.
74ABT841_3
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 03 — 25 March 2010
© NXP B.V. 2010. All rights reserved.
4 of 15
74ABT841
NXP Semiconductors
10-bit bus interface latch; 3-state
8. Recommended operating conditions
Table 5.
Recommended operating conditions
Symbol
Parameter
VCC
Conditions
Min
Typ
Max
Unit
supply voltage
4.5
-
5.5
V
VI
input voltage
0
-
VCC
V
VIH
HIGH-level input voltage
2.0
-
-
V
VIL
LOW-level input voltage
-
-
0.8
V
IOH
HIGH-level output current
−32
-
-
mA
IOL
LOW-level output current
-
-
64
mA
Δt/ΔV
input transition rise and fall rate
0
-
5
ns/V
Tamb
ambient temperature
−40
-
+85
°C
in free air
9. Static characteristics
Table 6.
Static characteristics
Symbol Parameter
25 °C
Conditions
Min
Typ
Max
Min
Max
−1.2
−0.9
-
−1.2
-
V
VCC = 4.5 V; IOH = −3 mA
2.5
3.5
-
2.5
-
V
VCC = 5.0 V; IOH = −3 mA
3.0
4.0
-
3.0
-
V
VCC = 4.5 V; IOH = −32 mA
2.0
2.6
-
2.0
-
V
-
0.42
0.55
-
0.55
V
-
0.13
0.55
-
0.55
V
control pins
-
±0.01
±1.0
-
±1.0
μA
data pins
-
±5
±100
-
±100
μA
-
±5.0
±100
-
±100
μA
-
±5.0
±50
-
±50
μA
VIK
input clamping voltage
VCC = 4.5 V; IIK = −18 mA
VOH
HIGH-level output
voltage
VI = VIL or VIH
VOL
LOW-level output
voltage
VCC = 4.5 V; IOL = 64 mA;
VI = VIL or VIH
VOL(pu)
power-up LOW-level
output voltage
VCC = 5.5 V; IO = 1 mA;
VI = GND or VCC
II
input leakage current
VCC = 5.5 V; VI = GND or 5.5 V
IOFF
power-off leakage
current
VCC = 0 V; VI or VO ≤ 4.5 V
IO(pu/pd)
power-up/power-down
output current
VCC = 2.0 V; VO = 0.5 V;
VI = GND or VCC; OEn HIGH
IOZ
OFF-state output current VCC = 5.5 V; VI = VIL or VIH
[2]
-
5.0
50
-
50
μA
VO = 0.5 V
-
−5.0
−50
-
−50
μA
-
5.0
50
-
50
μA
−180
−100
−50
−180
−50
mA
output leakage current
HIGH-state; VO = 5.5 V;
VCC = 5.5 V; VI = GND or VCC
IO
output current
VCC = 5.5 V; VO = 2.5 V
Product data sheet
[1]
VO = 2.7 V
ILO
74ABT841_3
−40 °C to +85 °C Unit
[3]
All information provided in this document is subject to legal disclaimers.
Rev. 03 — 25 March 2010
© NXP B.V. 2010. All rights reserved.
5 of 15
74ABT841
NXP Semiconductors
10-bit bus interface latch; 3-state
Table 6.
Static characteristics …continued
Symbol Parameter
ICC
supply current
25 °C
Conditions
−40 °C to +85 °C Unit
Min
Typ
Max
Min
Max
outputs HIGH-state
-
0.5
250
-
250
μA
outputs LOW-state
-
25
38
-
38
mA
outputs disabled
-
0.5
250
-
250
μA
-
0.5
1.5
-
1.5
mA
VCC = 5.5 V; VI = GND or VCC
ΔICC
additional supply current per input pin; VCC = 5.5 V; one
input at 3.4 V; other inputs at VCC
or GND
CI
input capacitance
VI = 0 V or VCC
-
4
-
-
-
pF
CO
output capacitance
outputs disabled; VO = 0 V or VCC
-
7
-
-
-
pF
[4]
[1]
For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.
[2]
This parameter is valid for any VCC between 0 V and 2.1 V with a transition time of up to 10 ms. For VCC = 2.1 V to VCC = 5 V ± 10 %, a
transition time of up to 100 μs is permitted.
[3]
Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
[4]
This is the increase in supply current for each input at 3.4 V.
10. Dynamic characteristics
Table 7.
Dynamic characteristics
GND = 0 V; for test circuit, see Figure 9.
Symbol Parameter
tPLH
25 °C; VCC = 5.0 V
Conditions
−40 °C to +70 °C; Unit
VCC = 5.0 V ± 0.5 V
Min
Typ
Max
Min
Max
LOW to HIGH
propagation delay
Dn to Qn; see Figure 5
2.1
4.1
5.5
2.1
6.2
ns
LE to Qn; see Figure 6
2.1
4.1
5.9
2.1
6.5
ns
HIGH to LOW
propagation delay
Dn to Qn; see Figure 5
2.0
4.0
5.5
2.0
6.2
ns
LE to Qn; see Figure 6
2.8
4.6
6.2
2.8
6.7
ns
tPZH
OFF-state to HIGH
propagation delay
OE to Qn; see Figure 7
1.0
3.0
4.5
1.0
5.3
ns
tPZL
OFF-state to LOW
propagation delay
OE to Qn; see Figure 7
2.2
4.1
5.6
2.2
6.3
ns
tPHZ
HIGH to OFF-state
propagation delay
OE to Qn; see Figure 7
2.7
4.7
6.2
2.7
7.1
ns
tPLZ
LOW to OFF-state
propagation delay
OE to Qn; see Figure 7
2.8
4.6
6.1
2.8
6.5
ns
tsu(H)
set-up time HIGH
Dn to LE; see Figure 8
2.5
1.0
-
2.5
-
ns
tsu(L)
set-up time LOW
Dn to LE; see Figure 8
1.5
0
-
1.5
-
ns
th(H)
hold time HIGH
Dn to LE; see Figure 8
1.5
0.2
-
1.5
-
ns
th(L)
hold time LOW
Dn to LE; see Figure 8
+1.0
−0.8
-
1.0
-
ns
tWH
pulse width HIGH
LE; see Figure 6
3.3
1.9
-
3.3
-
ns
tWL
pulse width LOW
LE; see Figure 6
3.3
1.9
-
3.3
-
ns
tPHL
74ABT841_3
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 03 — 25 March 2010
© NXP B.V. 2010. All rights reserved.
6 of 15
74ABT841
NXP Semiconductors
10-bit bus interface latch; 3-state
11. Waveforms
VI
VM
Dn
VM
GND
tPLH
tPHL
VOH
VM
Qn
VM
VOL
001aae916
VM = 1.5 V
VOL and VOH are typical voltage output levels that occur with the output load.
Fig 5.
Propagation delay for data to output
VI
VM
LE
VM
VM
GND
tWH
tWL
tPLH
tPHL
VOH
Qn
VM
VM
VOL
001aae914
VM = 1.5 V
VOL and VOH are typical voltage output levels that occur with the output load.
Fig 6.
Propagation delay, latch enable input to output and enable pulse width
VI
OE input
VM
GND
tPZL
tPLZ
3.5 V
output
LOW-to-OFF
OFF-to-LOW
VM
VOL + 0.3 V
VOL
tPHZ
VOH
tPZH
VOH − 0.3 V
output
HIGH-to-OFF
OFF-to-HIGH
VM
GND
outputs
enabled
outputs
disabled
outputs
enabled
001aal299
VM = 1.5 V
VOL and VOH are typical voltage output levels that occur with the output load.
Fig 7.
3-state output (Qn) enable and disable times
74ABT841_3
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 03 — 25 March 2010
© NXP B.V. 2010. All rights reserved.
7 of 15
74ABT841
NXP Semiconductors
10-bit bus interface latch; 3-state
VI
Dn
VM
VM
VM
VM
GND
tsu(H)
th(H)
tsu(L)
th(L)
VI
VM
LE
VM
GND
001aae918
VM = 1.5 V
The shaded areas indicate when the input is permitted to change for predictable output performance.
Fig 8.
Data set-up and hold times
VI
tW
90 %
90 %
negative
pulse
VM
10 %
0V
VCC
10 %
tf
tr
tr
tf
VI
90 %
positive
pulse
0V
VEXT
VM
VI
DUT
RT
90 %
RL
VO
G
CL
RL
VM
VM
10 %
10 %
mna616
tW
001aai298
a. Input pulse definition
b. Test circuit
Test data and VEXT levels are given in Table 8.
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = Test voltage for switching times.
Fig 9.
Table 8.
Test circuit for measuring switching times
Test data
Input
Load
VEXT
VI
fI
tW
tr, tf
CL
RL
tPHL, tPLH
tPZH, tPHZ
tPZL, tPLZ
3.0 V
1 MHz
500 ns
≤ 2.5 ns
50 pF
500 Ω
open
open
7.0 V
74ABT841_3
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 03 — 25 March 2010
© NXP B.V. 2010. All rights reserved.
8 of 15
74ABT841
NXP Semiconductors
10-bit bus interface latch; 3-state
12. Package outline
SO24: plastic small outline package; 24 leads; body width 7.5 mm
SOT137-1
D
E
A
X
c
HE
y
v M A
Z
24
13
Q
A2
A
(A 3)
A1
pin 1 index
θ
Lp
L
1
12
e
detail X
w M
bp
0
5
10 mm
scale
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
UNIT
A
max.
A1
A2
A3
bp
c
D (1)
E (1)
e
HE
L
Lp
Q
v
w
y
mm
2.65
0.3
0.1
2.45
2.25
0.25
0.49
0.36
0.32
0.23
15.6
15.2
7.6
7.4
1.27
10.65
10.00
1.4
1.1
0.4
1.1
1.0
0.25
0.25
0.1
0.01
0.019 0.013
0.014 0.009
0.61
0.60
0.30
0.29
0.05
0.419
0.043
0.055
0.394
0.016
inches
0.1
0.012 0.096
0.004 0.089
0.043
0.039
0.01
0.01
Z
(1)
0.9
0.4
0.035
0.004
0.016
θ
o
8
o
0
Note
1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.
REFERENCES
OUTLINE
VERSION
IEC
JEDEC
SOT137-1
075E05
MS-013
JEITA
EUROPEAN
PROJECTION
ISSUE DATE
99-12-27
03-02-19
Fig 10. Package outline SOT137-1 (SO24)
74ABT841_3
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 03 — 25 March 2010
© NXP B.V. 2010. All rights reserved.
9 of 15
74ABT841
NXP Semiconductors
10-bit bus interface latch; 3-state
SSOP24: plastic shrink small outline package; 24 leads; body width 5.3 mm
D
SOT340-1
E
A
X
c
HE
y
v M A
Z
24
13
Q
A2
A
(A 3)
A1
pin 1 index
θ
Lp
L
1
12
bp
e
detail X
w M
0
2.5
5 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
A
max.
A1
A2
A3
bp
c
D (1)
E (1)
e
HE
L
Lp
Q
v
w
y
Z (1)
θ
mm
2
0.21
0.05
1.80
1.65
0.25
0.38
0.25
0.20
0.09
8.4
8.0
5.4
5.2
0.65
7.9
7.6
1.25
1.03
0.63
0.9
0.7
0.2
0.13
0.1
0.8
0.4
8
o
0
o
Note
1. Plastic or metal protrusions of 0.2 mm maximum per side are not included.
OUTLINE
VERSION
SOT340-1
REFERENCES
IEC
JEDEC
JEITA
EUROPEAN
PROJECTION
ISSUE DATE
99-12-27
03-02-19
MO-150
Fig 11. Package outline SOT340-1 (SSOP24)
74ABT841_3
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 03 — 25 March 2010
© NXP B.V. 2010. All rights reserved.
10 of 15
74ABT841
NXP Semiconductors
10-bit bus interface latch; 3-state
TSSOP24: plastic thin shrink small outline package; 24 leads; body width 4.4 mm
D
SOT355-1
E
A
X
c
HE
y
v M A
Z
13
24
Q
A2
(A 3)
A1
pin 1 index
A
θ
Lp
L
1
12
bp
e
detail X
w M
0
2.5
5 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
A
max.
A1
A2
A3
bp
c
D (1)
E (2)
e
HE
L
Lp
Q
v
w
y
Z (1)
θ
mm
1.1
0.15
0.05
0.95
0.80
0.25
0.30
0.19
0.2
0.1
7.9
7.7
4.5
4.3
0.65
6.6
6.2
1
0.75
0.50
0.4
0.3
0.2
0.13
0.1
0.5
0.2
8o
0o
Notes
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
2. Plastic interlead protrusions of 0.25 mm maximum per side are not included.
OUTLINE
VERSION
SOT355-1
REFERENCES
IEC
JEDEC
JEITA
EUROPEAN
PROJECTION
ISSUE DATE
99-12-27
03-02-19
MO-153
Fig 12. Package outline SOT355-1 (TSSOP24)
74ABT841_3
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 03 — 25 March 2010
© NXP B.V. 2010. All rights reserved.
11 of 15
74ABT841
NXP Semiconductors
10-bit bus interface latch; 3-state
13. Abbreviations
Table 9.
Abbreviations
Acronym
Description
BiCMOS
Bipolar Complementary Metal-Oxide Semiconductor
DUT
Device Under Test
ESD
ElectroStatic Discharge
HBM
Human Body Model
MM
Machine Model
14. Revision history
Table 10.
Revision history
Document ID
Release date
Data sheet status
Change notice
Supersedes
74ABT841_3
20100325
Product data sheet
-
74ABT841_2
74ABT841_2
20100302
Product data sheet
-
74ABT841
Modifications:
74ABT841
74ABT841_3
Product data sheet
•
The format of this data sheet has been redesigned to comply with the new identity guidelines
of NXP Semiconductors.
•
•
Legal texts have been adapted to the new company name where appropriate.
DIP 24 (SOT222-1) package removed from Section 3 “Ordering information” and Section 12
“Package outline”.
19950906
Product specification
-
All information provided in this document is subject to legal disclaimers.
Rev. 03 — 25 March 2010
-
© NXP B.V. 2010. All rights reserved.
12 of 15
74ABT841
NXP Semiconductors
10-bit bus interface latch; 3-state
15. Legal information
15.1 Data sheet status
Document status[1][2]
Product status[3]
Definition
Objective [short] data sheet
Development
This document contains data from the objective specification for product development.
Preliminary [short] data sheet
Qualification
This document contains data from the preliminary specification.
Product [short] data sheet
Production
This document contains the product specification.
[1]
Please consult the most recently issued document before initiating or completing a design.
[2]
The term ‘short data sheet’ is explained in section “Definitions”.
[3]
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
15.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to offer functions and qualities beyond those described in the
Product data sheet.
15.3 Disclaimers
Limited warranty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warranties, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
Suitability for use in automotive applications — This NXP
Semiconductors product has been qualified for use in automotive
applications. The product is not designed, authorized or warranted to be
74ABT841_3
Product data sheet
suitable for use in medical, military, aircraft, space or life support equipment,
nor in applications where failure or malfunction of an NXP Semiconductors
product can reasonably be expected to result in personal injury, death or
severe property or environmental damage. NXP Semiconductors accepts no
liability for inclusion and/or use of NXP Semiconductors products in such
equipment or applications and therefore such inclusion and/or use is at the
customer’s own risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on a weakness or default in the
customer application/use or the application/use of customer’s third party
customer(s) (hereinafter both referred to as “Application”). It is customer’s
sole responsibility to check whether the NXP Semiconductors product is
suitable and fit for the Application planned. Customer has to do all necessary
testing for the Application in order to avoid a default of the Application and the
product. NXP Semiconductors does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individual agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
No offer to sell or license — Nothing in this document may be interpreted or
construed as an offer to sell products that is open for acceptance or the grant,
conveyance or implication of any license under any copyrights, patents or
other industrial or intellectual property rights.
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from national authorities.
15.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
All information provided in this document is subject to legal disclaimers.
Rev. 03 — 25 March 2010
© NXP B.V. 2010. All rights reserved.
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16. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
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Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 03 — 25 March 2010
© NXP B.V. 2010. All rights reserved.
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17. Contents
1
2
3
4
5
5.1
5.2
6
7
8
9
10
11
12
13
14
15
15.1
15.2
15.3
15.4
16
17
General description . . . . . . . . . . . . . . . . . . . . . . 1
Features and benefits . . . . . . . . . . . . . . . . . . . . 1
Ordering information . . . . . . . . . . . . . . . . . . . . . 2
Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2
Pinning information . . . . . . . . . . . . . . . . . . . . . . 3
Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3
Functional description . . . . . . . . . . . . . . . . . . . 4
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 4
Recommended operating conditions. . . . . . . . 5
Static characteristics. . . . . . . . . . . . . . . . . . . . . 5
Dynamic characteristics . . . . . . . . . . . . . . . . . . 6
Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9
Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Revision history . . . . . . . . . . . . . . . . . . . . . . . . 12
Legal information. . . . . . . . . . . . . . . . . . . . . . . 13
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 13
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Contact information. . . . . . . . . . . . . . . . . . . . . 14
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
© NXP B.V. 2010.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
Date of release: 25 March 2010
Document identifier: 74ABT841_3