PH6030L N-channel TrenchMOS logic level FET Rev. 01 — 29 July 2008 Product data sheet 1. Product profile 1.1 General description Logic level N-channel enhancement mode Field-Effect Transistor (FET) in a plastic package using TrenchMOS technology. 1.2 Features and benefits Lead-free package Optimized for use in DC-to-DC converters Logic level compatibile Very low switching and conduction losses 1.3 Applications DC-to-DC convertors Switched-mode power supplies Notebook computers Voltage regulators 1.4 Quick reference data Table 1. Quick reference Symbol Parameter Conditions Min Typ Max Unit VDS drain-source voltage Tj ≥ 25 °C; Tj ≤ 150 °C - - 30 V ID drain current Tmb = 25 °C; VGS = 10 V; see Figure 1; see Figure 3 - - 76.7 A VGS = 4.5 V; ID = 25 A; VDS = 12 V; see Figure 11; see Figure 12 - 3.1 - nC VGS = 10 V; ID = 25 A; Tj = 25 °C; see Figure 9; see Figure 10 - 4.7 6 mΩ Dynamic characteristics QGD gate-drain charge Static characteristics RDSon drain-source on-state resistance PH6030L NXP Semiconductors N-channel TrenchMOS logic level FET 2. Pinning information Table 2. Pinning information Pin Symbol Description Simplified outline 1, 2, 3 S source 4 G gate mb D mounting base; connected to drain Graphic symbol D mb G mbb076 S 1 2 3 4 SOT669 (LFPAK) 3. Ordering information Table 3. Ordering information Type number Package Name PH6030L LFPAK Description Version Plastic single-ended surface-mounted package (LFPAK); SOT669 4 leads 4. Limiting values Table 4. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Conditions Min Max Unit VDS drain-source voltage Tj ≥ 25 °C; Tj ≤ 150 °C - 30 V 25 °C ≤ Tj ≤ 150 °C; RGS = 20 kΩ VDGR drain-gate voltage VGS gate-source voltage ID drain current - 30 V -20 20 V VGS = 10 V; Tmb = 100 °C; see Figure 1 - 48.5 A VGS = 10 V; Tmb = 25 °C; see Figure 1; see Figure 3 - 76.7 A IDM peak drain current tp ≤ 10 µs; pulsed; Tmb = 25 °C; see Figure 3 - 300 A Ptot total power dissipation Tmb = 25 °C; see Figure 2 - 62.5 W Tstg storage temperature -55 150 °C Tj junction temperature -55 150 °C Source-drain diode IS source current Tmb = 25 °C - 52 A ISM peak source current tp ≤ 10 µs; pulsed; Tmb = 25 °C - 208 A VGS = 10 V; Tj(init) = 25 °C; ID = 31 A; Vsup ≤ 30 V; tp = 0.14 ms; RGS = 50 Ω; unclamped inductive load - 95 mJ Avalanche ruggedness EDS(AL)S non-repetitive drain-source avalanche energy PH6030L_1 Product data sheet © NXP B.V. 2008. All rights reserved. Rev. 01 — 29 July 2008 2 of 12 PH6030L NXP Semiconductors N-channel TrenchMOS logic level FET 03aa23 120 03aa15 120 Ider (%) Pder (%) 80 80 40 40 0 0 0 50 100 150 200 0 50 100 150 Tmb (°C) Fig 1. Normalized continuous drain current as a function of mounting base temperature Fig 2. Normalized total power dissipation as a function of mounting base temperature 003aab245 103 ID (A) 200 Tmb (°C) Limit RDSon = VDS / ID tp = 10 μ s 102 100 μ s 1 ms 10 10 ms 100 ms DC 1 10-1 10-1 1 10 VDS (V) 102 Fig 3. Safe operating area; continuous and peak drain currents as a function of drain-source voltage PH6030L_1 Product data sheet © NXP B.V. 2008. All rights reserved. Rev. 01 — 29 July 2008 3 of 12 PH6030L NXP Semiconductors N-channel TrenchMOS logic level FET 5. Thermal characteristics Table 5. Thermal characteristics Symbol Parameter Conditions Min Typ Max Unit Rth(j-mb) thermal resistance from junction to mounting base see Figure 4 - - 2 K/W 003aab246 10 Zth(j-mb) (K/W) 1 δ = 0.5 0.2 0.1 10-1 0.05 0.02 δ= P tp T single pulse t tp T 10 -2 10-5 10-4 10-3 10-2 10-1 1 tp (s) 10 Fig 4. Transient thermal impedance from junction to solder point as a function of pulse duration PH6030L_1 Product data sheet © NXP B.V. 2008. All rights reserved. Rev. 01 — 29 July 2008 4 of 12 PH6030L NXP Semiconductors N-channel TrenchMOS logic level FET 6. Characteristics Table 6. Symbol Characteristics Parameter Conditions Min Typ Max Unit ID = 250 µA; VGS = 0 V; Tj = -55 °C 27 - - V ID = 250 µA; VGS = 0 V; Tj = 25 °C 30 - - V - - 2.6 V ID = 1 mA; VDS = VGS; Tj = 150 °C; see Figure 7 0.8 - - V ID = 1 mA; VDS = VGS; Tj = 25 °C; see Figure 7; see Figure 8 1.3 1.7 2.15 V Static characteristics V(BR)DSS VGS(th) IDSS IGSS RDSon RG drain-source breakdown voltage gate-source threshold ID = 1 mA; VDS = VGS; Tj = -55 °C; see voltage Figure 7 drain leakage current gate leakage current drain-source on-state resistance gate resistance VDS = 30 V; VGS = 0 V; Tj = 25 °C - - 1 µA VDS = 30 V; VGS = 0 V; Tj = 150 °C - - 100 µA VGS = 16 V; VDS = 0 V; Tj = 25 °C - - 100 nA VGS = -16 V; VDS = 0 V; Tj = 25 °C - - 100 nA VGS = 10 V; ID = 25 A; Tj = 150 °C; see Figure 9 - 8.5 10.6 mΩ VGS = 4.5 V; ID = 25 A; Tj = 25 °C; see Figure 9; see Figure 10 - 7.3 9.7 mΩ VGS = 10 V; ID = 25 A; Tj = 25 °C; see Figure 9; see Figure 10 - 4.7 6 mΩ f = 1 MHz - 1.75 - Ω ID = 25 A; VDS = 12 V; VGS = 4.5 V; see Figure 11; see Figure 12 - 15.2 - nC ID = 0 A; VDS = 0 V; VGS = 4.5 V; see Figure 11 - 14 - nC Dynamic characteristics QG(tot) total gate charge QGS gate-source charge QGD gate-drain charge QGS1 - 8.5 - nC - 3.1 - nC pre-threshold gate-source charge - 4.1 - nC QGS2 post-threshold gate-source charge - 4.4 - nC VGS(pl) gate-source plateau voltage ID = 25 A; VDS = 12 V; see Figure 11; see Figure 12 - 3.5 - V Ciss input capacitance VDS = 12 V; VGS = 0 V; f = 1 MHz; Tj = 25 °C; see Figure 13 - 2260 - pF VDS = 0 V; VGS = 0 V; f = 1 MHz; Tj = 25 °C; see Figure 13 - 2540 - pF VDS = 12 V; VGS = 0 V; f = 1 MHz; Tj = 25 °C; see Figure 13 - 460 - pF - 210 - pF Coss output capacitance Crss reverse transfer capacitance ID = 25 A; VDS = 12 V; VGS = 4.5 V; see Figure 12; see Figure 12 PH6030L_1 Product data sheet © NXP B.V. 2008. All rights reserved. Rev. 01 — 29 July 2008 5 of 12 PH6030L NXP Semiconductors N-channel TrenchMOS logic level FET Table 6. Characteristics …continued Symbol Parameter Conditions Min Typ Max Unit td(on) turn-on delay time - 25 - ns tr rise time VDS = 12 V; RL = 0.5 Ω; VGS = 4.5 V; RG(ext) = 5.6 Ω - 53 - ns td(off) turn-off delay time - 27 - ns tf fall time - 14 - ns Source-drain diode VSD source-drain voltage IS = 25 A; VGS = 0 V; Tj = 25 °C; see Figure 14 - 0.85 1.2 V trr reverse recovery time IS = 20 A; dIS/dt = -100 A/µs; VGS = 0 V; VDS = 30 V - 34 - ns Qr recovered charge IS = 20 A; dIS/dt = -100 A/µs; VGS = 0 V - 11.5 - nC 003aab247 100 VGS (V) = 10 ID (A) 80 6 5 003aab249 100 4.5 ID (A) 80 4 60 60 3.6 3.4 40 40 3.2 20 20 3 Tj = 150 °C 25 °C 2.8 0 0 0 0.2 0.4 0.6 VDS (V) 0.8 Fig 5. Output characteristics: drain current as a function of drain-source voltage; typical values 0 2 3 4 VGS (V) 5 Fig 6. Transfer characteristics: drain current as a function of gate-source voltage; typical values PH6030L_1 Product data sheet 1 © NXP B.V. 2008. All rights reserved. Rev. 01 — 29 July 2008 6 of 12 PH6030L NXP Semiconductors N-channel TrenchMOS logic level FET 003aab272 3 003aab271 10−3 ID (A) VGS(th) (V) max 10−4 2 max typ min typ 1.5 min 10−5 1 0.5 0 -60 10−6 0 60 120 180 0 0.5 1 1.5 2 Tj (°C) Fig 7. Gate-source threshold voltage as a function of junction temperature 003aab273 2 Fig 8. Sub-threshold drain current as a function of gate-source voltage 003aab248 16 3.2 RDSon (mΩ) a 2.5 VGS (V) 3.4 3.6 1.6 12 VGS (V) = 4 1.2 4.5 8 5 6 0.8 10 4 0.4 0 -60 0 0 60 120 Tj (°C) 180 Fig 9. Normalized drain-source on-state resistance factor as a function of junction temperature 0 40 60 80 ID (A) 100 Fig 10. Drain-source on-state resistance as a function of drain current; typical values PH6030L_1 Product data sheet 20 © NXP B.V. 2008. All rights reserved. Rev. 01 — 29 July 2008 7 of 12 PH6030L NXP Semiconductors N-channel TrenchMOS logic level FET 003aab250 10 VGS ID = 25 A Tj = 25 °C (V) VDS ID 8 VGS(pl) 12 V VDS = 19 V 6 VGS(th) VGS 4 QGS1 QGS2 QGS QGD QG(tot) 2 003aaa508 0 Fig 11. Gate charge waveform definitions 0 10 20 30 QG (nC) 40 Fig 12. Gate-source voltage as a function of gate charge; typical values 003aab252 104 003aab251 100 IS (A) C (pF) 80 Ciss 60 10 3 40 Coss Tj = 25 °C 150 °C 20 Crss 10 2 10-1 1 10 VDS (V) 102 Fig 13. Input, output and reverse transfer capacitances as a function of drain-source voltage; typical values 0 0.2 0.6 0.8 1 VSD (V) 1.2 Fig 14. Source current as a function of source-drain voltage; typical values PH6030L_1 Product data sheet 0.4 © NXP B.V. 2008. All rights reserved. Rev. 01 — 29 July 2008 8 of 12 PH6030L NXP Semiconductors N-channel TrenchMOS logic level FET 7. Package outline Plastic single-ended surface-mounted package (LFPAK); 4 leads A2 A E SOT669 C c2 b2 E1 b3 L1 mounting base b4 D1 D H L2 1 2 3 e 4 w M A b 1/2 X c e A (A 3) A1 C θ L detail X y C 0 2.5 5 mm scale DIMENSIONS (mm are the original dimensions) UNIT mm A A1 A2 A3 b b2 1.20 0.15 1.10 0.50 4.41 0.25 1.01 0.00 0.95 0.35 3.62 b3 b4 2.2 2.0 0.9 0.7 c D (1) c2 D1(1) E(1) E1(1) max 0.25 0.30 4.10 4.20 0.19 0.24 3.80 5.0 4.8 3.3 3.1 e H L L1 L2 w y θ 1.27 6.2 5.8 0.85 0.40 1.3 0.8 1.3 0.8 0.25 0.1 8° 0° Note 1. Plastic or metal protrusions of 0.15 mm maximum per side are not included. OUTLINE VERSION SOT669 REFERENCES IEC JEDEC JEITA EUROPEAN PROJECTION ISSUE DATE 04-10-13 06-03-16 MO-235 Fig 15. Package outline SOT669 (LFPAK) PH6030L_1 Product data sheet © NXP B.V. 2008. All rights reserved. Rev. 01 — 29 July 2008 9 of 12 PH6030L NXP Semiconductors N-channel TrenchMOS logic level FET 8. Revision history Table 7. Revision history Document ID Release date Data sheet status Change notice Supersedes PH6030L_1 20080729 Product data sheet - - PH6030L_1 Product data sheet © NXP B.V. 2008. All rights reserved. Rev. 01 — 29 July 2008 10 of 12 PH6030L NXP Semiconductors N-channel TrenchMOS logic level FET 9. Legal information 9.1 Data sheet status Document status [1][2] Product status[3] Definition Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification. [1] Please consult the most recently issued document before initiating or completing a design. [2] The term 'short data sheet' is explained in section "Definitions". [3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 9.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. 9.3 Disclaimers General — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Quick reference data — The Quick reference data is an extract of the product data given in the Limiting values and Characteristics sections of this document, and as such is not complete, exhaustive or legally binding. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. 9.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. TrenchMOS — is a trademark of NXP B.V. 10. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] PH6030L_1 Product data sheet © NXP B.V. 2008. All rights reserved. Rev. 01 — 29 July 2008 11 of 12 PH6030L NXP Semiconductors N-channel TrenchMOS logic level FET 11. Contents 1. 1.1 1.2 1.3 1.4 2. 3. 4. 5. 6. 7. 8. 9. 9.1 9.2 9.3 9.4 10. Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . .1 General description . . . . . . . . . . . . . . . . . . . . . .1 Features and benefits . . . . . . . . . . . . . . . . . . . . .1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . .1 Quick reference data . . . . . . . . . . . . . . . . . . . . .1 Pinning information . . . . . . . . . . . . . . . . . . . . . . .2 Ordering information . . . . . . . . . . . . . . . . . . . . . .2 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . .2 Thermal characteristics . . . . . . . . . . . . . . . . . . .4 Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . .5 Package outline . . . . . . . . . . . . . . . . . . . . . . . . . .9 Revision history . . . . . . . . . . . . . . . . . . . . . . . . .10 Legal information. . . . . . . . . . . . . . . . . . . . . . . . 11 Data sheet status . . . . . . . . . . . . . . . . . . . . . . . 11 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Contact information. . . . . . . . . . . . . . . . . . . . . . 11 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2008. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] Date of release: 29 July 2008 Document identifier: PH6030L_1