PSMN013-100ES N-channel 100 V 13.9 mΩ standard level MOSFET in I2PAK Rev. 02 — 19 February 2010 Objective data sheet 1. Product profile 1.1 General description Standard level N-channel enhancement MOSFET in I2PAK package qualified to 175C. This product is designed and qualified for use in a wide range of industrial, communications and domestic equipment. 1.2 Features and benefits Low conduction losses due to low on-state resistance Suitable for high frequency applications due to fast switching characteristics 1.3 Applications DC-to-DC converters Motor control Load switching Server power supplies 1.4 Quick reference data Table 1. Quick reference Symbol Parameter Conditions Min Typ Max Unit VDS drain-source voltage Tj ≥ 25 °C; Tj ≤ 175 °C - - 100 V ID drain current Tmb = 25 °C; VGS = 10 V; see Figure 1 - - 68 A Ptot total power dissipation Tmb = 25 °C; see Figure 2 - - 170 W Tj junction temperature -55 - 175 °C VGS = 10 V; Tj(init) = 25 °C; ID = 68 A; Vsup ≤ 100 V; unclamped; RGS = 50 Ω - - 127 mJ Avalanche ruggedness EDS(AL)S non-repetitive drain-source avalanche energy Dynamic characteristics QGD gate-drain charge VGS = 10 V; ID = 25 A; VDS = 50 V; see Figure 14 and 13 - 17 - nC QG(tot) total gate charge VGS = 10 V; ID = 25 A; VDS = 50 V; see Figure 13 and 14 - 59 - nC PSMN013-100ES NXP Semiconductors N-channel 100 V 13.9 mΩ standard level MOSFET in I2PAK Table 1. Quick reference …continued Symbol Parameter Conditions Min Typ Max Unit VGS = 10 V; ID = 15 A; Tj = 100 °C; see Figure 11 - - 25 mΩ VGS = 10 V; ID = 15 A; Tj = 25 °C; see Figure 12 and 11 - 11 13.9 mΩ Static characteristics RDSon drain-source on-state resistance 2. Pinning information Table 2. Pinning information Pin Symbol Description Simplified outline 1 G gate 2 D drain 3 S source mb D mounting base; connected to drain Graphic symbol D mb G mbb076 S 1 2 3 SOT226 (I2PAK) 3. Ordering information Table 3. Ordering information Type number Package Name Description Version PSMN013-100ES I2PAK plastic single-ended package (I2PAK); TO-262 SOT226 PSMN013-100ES_2 Objective data sheet All information provided in this document is subject to legal disclaimers. Rev. 02 — 19 February 2010 © NXP B.V. 2010. All rights reserved. 2 of 14 PSMN013-100ES NXP Semiconductors N-channel 100 V 13.9 mΩ standard level MOSFET in I2PAK 4. Limiting values Table 4. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Conditions Min Max Unit VDS drain-source voltage Tj ≥ 25 °C; Tj ≤ 175 °C - 100 V VDGR drain-gate voltage Tj ≤ 175 °C; Tj ≥ 25 °C; RGS = 20 kΩ - 100 V VGS gate-source voltage ID drain current -20 20 V VGS = 10 V; Tmb = 100 °C; see Figure 1 - 47 A VGS = 10 V; Tmb = 25 °C; see Figure 1 - 68 A - 272 A IDM peak drain current tp ≤ 10 µs; pulsed; Tmb = 25 °C Tmb = 25 °C; see Figure 2 Ptot total power dissipation - 170 W Tstg storage temperature -55 175 °C Tj junction temperature -55 175 °C Tsld(M) peak soldering temperature - 260 °C Source-drain diode IS source current Tmb = 25 °C - 68 A ISM peak source current tp ≤ 10 µs; pulsed; Tmb = 25 °C - 272 A - 127 mJ Avalanche ruggedness non-repetitive VGS = 10 V; Tj(init) = 25 °C; ID = 68 A; Vsup ≤ 100 V; drain-source avalanche unclamped; RGS = 50 Ω energy EDS(AL)S 003aac512 80 ID (A) 03aa16 120 Pder (%) 60 80 40 40 20 0 0 0 Fig 1. 50 100 150 Tmb (°C) 200 Continuous drain current as a function of mounting base temperature PSMN013-100ES_2 Objective data sheet 0 50 100 150 200 Tmb (°C) Fig 2. Normalized total power dissipation as a function of mounting base temperature All information provided in this document is subject to legal disclaimers. Rev. 02 — 19 February 2010 © NXP B.V. 2010. All rights reserved. 3 of 14 PSMN013-100ES NXP Semiconductors N-channel 100 V 13.9 mΩ standard level MOSFET in I2PAK 5. Thermal characteristics Table 5. Thermal characteristics Symbol Parameter Rth(j-mb) Rth(j-a) Conditions Min Typ Max Unit thermal resistance from see Figure 3 junction to mounting base - 0.5 0.9 K/W thermal resistance from vertical in free air junction to ambient - 60 - K/W 003a a d575 1 Zth (j-mb) (K/W) 10 δ = 0.5 -1 0.2 0.1 0.05 10-2 0.02 δ= P tp T s ingle s hot 10-3 t tp T 10 -4 1e -6 Fig 3. 10-5 10-4 10-3 10-2 10-1 1 tp (s ) 10 Transient thermal impedance from junction to mounting base as a function of pulse duration; typical values PSMN013-100ES_2 Objective data sheet All information provided in this document is subject to legal disclaimers. Rev. 02 — 19 February 2010 © NXP B.V. 2010. All rights reserved. 4 of 14 PSMN013-100ES NXP Semiconductors N-channel 100 V 13.9 mΩ standard level MOSFET in I2PAK 6. Characteristics Table 6. Symbol Characteristics Parameter Conditions Min Typ Max Unit Static characteristics V(BR)DSS drain-source breakdown voltage ID = 0.25 mA; VGS = 0 V; Tj = -55 °C 90 - - V ID = 0.25 mA; VGS = 0 V; Tj = 25 °C 100 - - V VGS(th) gate-source threshold voltage ID = 1 mA; VDS = VGS; Tj = 175 °C; see Figure 9 1 - - V ID = 1 mA; VDS = VGS; Tj = 25 °C; see Figure 10 and 9 2 3 4 V ID = 1 mA; VDS = VGS; Tj = -55 °C; see Figure 10 - - 4.8 V IDSS drain leakage current VDS = 100 V; VGS = 0 V; Tj = 125 °C - - 100 µA VDS = 100 V; VGS = 0 V; Tj = 25 °C - 0.06 2 µA IGSS gate leakage current VGS = 20 V; VDS = 0 V; Tj = 25 °C - 10 100 nA VGS = -20 V; VDS = 0 V; Tj = 25 °C - 10 100 nA VGS = 10 V; ID = 15 A; Tj = 175 °C; see Figure 11 - 30 38.9 mΩ VGS = 10 V; ID = 15 A; Tj = 100 °C; see Figure 11 - - 25 mΩ VGS = 10 V; ID = 15 A; Tj = 25 °C; see Figure 12 and 11 - 11 13.9 mΩ - 1 - Ω ID = 25 A; VDS = 50 V; VGS = 10 V; see Figure 13 and 14 - 59 - nC ID = 0 A; VDS = 0 V; VGS = 10 V - 47.6 - nC RDSon RG drain-source on-state resistance internal gate resistance f = 1 MHz (AC) Dynamic characteristics QG(tot) total gate charge QGS gate-source charge ID = 25 A; VDS = 50 V; VGS = 10 V; see Figure 13 and 14 - 13.8 - nC QGS(th) pre-threshold gate-source charge ID = 25 A; VDS = 50 V; VGS = 10 V; see Figure 14 - 9.2 - nC QGS(th-pl) post-threshold gate-source charge - 4.6 - nC QGD gate-drain charge ID = 25 A; VDS = 50 V; VGS = 10 V; see Figure 14 and 13 - 17 - nC VGS(pl) gate-source plateau voltage VDS = 50 V; see Figure 14 and 13 - 4.4 - V Ciss input capacitance - 3195 - pF Coss output capacitance VDS = 50 V; VGS = 0 V; f = 1 MHz; Tj = 25 °C; see Figure 15 - 221 - pF Crss reverse transfer capacitance - 136 - pF PSMN013-100ES_2 Objective data sheet All information provided in this document is subject to legal disclaimers. Rev. 02 — 19 February 2010 © NXP B.V. 2010. All rights reserved. 5 of 14 PSMN013-100ES NXP Semiconductors N-channel 100 V 13.9 mΩ standard level MOSFET in I2PAK Table 6. Characteristics …continued Symbol Parameter Conditions Min Typ Max Unit td(on) turn-on delay time - 20.7 - ns tr rise time VDS = 50 V; RL = 2 Ω; VGS = 10 V; RG(ext) = 4.7 Ω; Tj = 25 °C - 25 - ns td(off) turn-off delay time - 52.5 - ns tf fall time - 24 - ns - 0.8 1.2 V Source-drain diode VSD source-drain voltage IS = 15 A; VGS = 0 V; Tj = 25 °C; see Figure 16 trr reverse recovery time Qr recovered charge IS = 25 A; dIS/dt = 100 A/µs; VGS = 0 V; VDS = 50 V 003a a d577 200 20 ID (A) - 52 - ns - 109 - nC 003a a d580 5000 10 Cis s C (pF) 6 160 4000 5.5 120 3000 5 Crs s 80 2000 4.5 40 VGS (V) = 4 0 0 Fig 4. 1 2 3 VDS (V) Output characteristics: drain current as a function of drain-source voltage; typical values PSMN013-100ES_2 Objective data sheet 1000 0 4 Fig 5. 2 4 6 8 10 VGS (V) Input and reverse transfer capacitances as a function of gate-source voltage; typical values All information provided in this document is subject to legal disclaimers. Rev. 02 — 19 February 2010 © NXP B.V. 2010. All rights reserved. 6 of 14 PSMN013-100ES NXP Semiconductors N-channel 100 V 13.9 mΩ standard level MOSFET in I2PAK 003a a d585 45 003a a d586 150 gfs (S ) 120 RDS on (mΩ) 35 90 25 60 15 30 0 5 4 Fig 6. 8 12 16 VGS (V) 0 20 Drain-source on-state resistance as a function of gate-source voltage; typical values Fig 7. 003a a d582 100 ID (A) 30 60 90 120 150 I D (A) Forward transconductance as a function of drain current; typical values 003aad280 5 VGS(th) (V) 80 4 60 3 max typ Tj = 175 °C 2 40 min 25 °C 1 20 0 −60 0 0 Fig 8. 2 4 VGS (V) 6 Transfer characteristics: drain current as a function of gate-source voltage; typical values PSMN013-100ES_2 Objective data sheet Fig 9. 0 60 120 180 Tj (°C) Gate-source threshold voltage as a function of junction temperature All information provided in this document is subject to legal disclaimers. Rev. 02 — 19 February 2010 © NXP B.V. 2010. All rights reserved. 7 of 14 PSMN013-100ES NXP Semiconductors N-channel 100 V 13.9 mΩ standard level MOSFET in I2PAK 03aa35 10−1 ID (A) min 10−2 typ 003aad774 3.2 a max 2.4 10−3 1.6 10−4 0.8 10−5 10−6 0 2 4 0 -60 6 0 60 120 VGS (V) Fig 10. Sub-threshold drain current as a function of gate-source voltage 003aad578 30 RDSon (mΩ) Tj (°C) 180 Fig 11. Normalized drain-source on-state resistance factor as a function of junction temperature 003a a d583 10 VGS (V) VGS (V) = 4.5 8 25 VDS = 50V 6 20 4 5 15 2 20 10 6 10 0 20 40 60 80 ID (A) Fig 12. Drain-source on-state resistance as a function of drain current; typical values PSMN013-100ES_2 Objective data sheet 0 0 15 30 45 QG (nC) 60 Fig 13. Gate-source voltage as a function of gate charge; typical values All information provided in this document is subject to legal disclaimers. Rev. 02 — 19 February 2010 © NXP B.V. 2010. All rights reserved. 8 of 14 PSMN013-100ES NXP Semiconductors N-channel 100 V 13.9 mΩ standard level MOSFET in I2PAK 003aad581 104 VDS Ciss C (pF) ID 103 VGS(pl) Coss VGS(th) VGS QGS1 QGS Crss 102 QGS2 QGD QG(tot) 003aaa508 10 10−2 10−1 1 102 10 VDS (V) Fig 15. Input, output and reverse transfer capacitances as a function of drain-source voltage; typical values Fig 14. Gate charge waveform definitions 003a a d584 100 IS (A) 80 60 40 Tj = 175 °C 20 25 °C 0 0 0.3 0.6 0.9 VS D (V) 1.2 Fig 16. Source (diode forward) current as a function of source-drain (diode forward) voltage; typical values PSMN013-100ES_2 Objective data sheet All information provided in this document is subject to legal disclaimers. Rev. 02 — 19 February 2010 © NXP B.V. 2010. All rights reserved. 9 of 14 PSMN013-100ES NXP Semiconductors N-channel 100 V 13.9 mΩ standard level MOSFET in I2PAK 7. Package outline Plastic single-ended package (I2PAK); low-profile 3-lead TO-262 SOT226 A A1 E D1 mounting base D L1 Q b1 L 1 2 3 c b e e 0 5 10 mm scale DIMENSIONS (mm are the original dimensions) UNIT A A1 b b1 c D max D1 E e L L1 Q mm 4.5 4.1 1.40 1.27 0.85 0.60 1.3 1.0 0.7 0.4 11 1.6 1.2 10.3 9.7 2.54 15.0 13.5 3.30 2.79 2.6 2.2 OUTLINE VERSION SOT226 REFERENCES IEC JEDEC JEITA EUROPEAN PROJECTION ISSUE DATE 06-02-14 09-08-25 TO-262 Fig 17. Package outline SOT226 (I2PAK) PSMN013-100ES_2 Objective data sheet All information provided in this document is subject to legal disclaimers. Rev. 02 — 19 February 2010 © NXP B.V. 2010. All rights reserved. 10 of 14 PSMN013-100ES NXP Semiconductors N-channel 100 V 13.9 mΩ standard level MOSFET in I2PAK 8. Revision history Table 7. Revision history Document ID Release date Data sheet status Change notice Supersedes PSMN013-100ES_2 20100219 Objective data sheet - PSMN013-100ES_1 - - Modifications: PSMN013-100ES_1 PSMN013-100ES_2 Objective data sheet • Various changes to content. 20090917 Objective data sheet All information provided in this document is subject to legal disclaimers. Rev. 02 — 19 February 2010 © NXP B.V. 2010. All rights reserved. 11 of 14 PSMN013-100ES NXP Semiconductors N-channel 100 V 13.9 mΩ standard level MOSFET in I2PAK 9. Legal information 9.1 Data sheet status Document status [1][2] Product status[3] Definition Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification. [1] Please consult the most recently issued document before initiating or completing a design. [2] The term 'short data sheet' is explained in section "Definitions". [3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 9.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. Product specification — The information and data provided in a Product data sheet shall define the specification of the product as agreed between NXP Semiconductors and its customer, unless NXP Semiconductors and customer have explicitly agreed otherwise in writing. In no event however, shall an agreement be valid in which the NXP Semiconductors product is deemed to offer functions and qualities beyond those described in the Product data sheet. 9.3 Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. NXP Semiconductors does not accept any liability related to any default, damage, costs or problem which is based on a weakness or default in the customer application/use or the application/use of customer’s third party customer(s) (hereinafter both referred to as “Application”). It is customer’s sole responsibility to check whether the NXP Semiconductors product is suitable and fit for the Application planned. Customer has to do all necessary testing for the Application in order to avoid a default of the Application and the product. NXP Semiconductors does not accept any liability in this respect. Quick reference data — The Quick reference data is an extract of the product data given in the Limiting values and Characteristics sections of this document, and as such is not complete, exhaustive or legally binding. Disclaimers Limited warranty and liability — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. In no event shall NXP Semiconductors be liable for any indirect, incidental, punitive, special or consequential damages (including - without limitation - lost profits, lost savings, business interruption, costs related to the removal or replacement of any products or rework charges) whether or not such damages are based on tort (including negligence), warranty, breach of contract or any other legal theory. Notwithstanding any damages that customer might incur for any reason whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards customer for the products described herein shall be limited in accordance with the Terms and conditions of commercial sale of NXP Semiconductors. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. PSMN013-100ES_2 Objective data sheet Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation of the device at these or any other conditions above those given in the Recommended operating conditions section (if present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting values will permanently and irreversibly affect the quality and reliability of the device. Terms and conditions of commercial sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, unless otherwise agreed in a valid written individual agreement. In case an individual agreement is concluded only the terms and conditions of the respective agreement shall apply. NXP Semiconductors hereby expressly objects to applying the customer’s general terms and conditions with regard to the purchase of NXP Semiconductors products by customer. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. All information provided in this document is subject to legal disclaimers. Rev. 02 — 19 February 2010 © NXP B.V. 2010. All rights reserved. 12 of 14 PSMN013-100ES NXP Semiconductors N-channel 100 V 13.9 mΩ standard level MOSFET in I2PAK Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities. Non-automotive qualified products — Unless the data sheet of an NXP Semiconductors product expressly states that the product is automotive qualified, the product is not suitable for automotive use. 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In the event that customer uses the product for design-in and use in automotive applications to automotive specifications and standards, customer (a) shall use the product without NXP Semiconductors’ warranty of the product for such automotive applications, use and specifications, and (b) whenever customer uses the product for automotive applications beyond NXP Semiconductors’ specifications such use shall be solely at customer’s own risk, and (c) customer fully indemnifies NXP Semiconductors for any liability, damages or failed product claims resulting from customer design and use of the product for automotive applications beyond NXP Semiconductors’ standard warranty and NXP Semiconductors’ product specifications. 9.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. TrenchMOS — is a trademark of NXP B.V. 10. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] PSMN013-100ES_2 Objective data sheet All information provided in this document is subject to legal disclaimers. Rev. 02 — 19 February 2010 © NXP B.V. 2010. All rights reserved. 13 of 14 PSMN013-100ES NXP Semiconductors N-channel 100 V 13.9 mΩ standard level MOSFET in I2PAK 11. Contents 1 1.1 1.2 1.3 1.4 2 3 4 5 6 7 8 9 9.1 9.2 9.3 9.4 10 Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . .1 General description . . . . . . . . . . . . . . . . . . . . . .1 Features and benefits . . . . . . . . . . . . . . . . . . . . .1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . .1 Quick reference data . . . . . . . . . . . . . . . . . . . . .1 Pinning information . . . . . . . . . . . . . . . . . . . . . . .2 Ordering information . . . . . . . . . . . . . . . . . . . . . .2 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . .3 Thermal characteristics . . . . . . . . . . . . . . . . . . .4 Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . .5 Package outline . . . . . . . . . . . . . . . . . . . . . . . . .10 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . 11 Legal information. . . . . . . . . . . . . . . . . . . . . . . .12 Data sheet status . . . . . . . . . . . . . . . . . . . . . . .12 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . .12 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . .13 Contact information. . . . . . . . . . . . . . . . . . . . . .13 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2010. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] Date of release: 19 February 2010 Document identifier: PSMN013-100ES_2