ATMEL AT49SV12804

Features
• 1.65V - 1.95V Read/Write
• High Performance
•
•
•
•
•
•
•
•
•
•
– Random Access Time – 70 ns
– Page Mode Read Time – 20 ns
– Synchronous Burst Frequency – 66 MHz
– Configurable Burst Operation
Sector Erase Architecture
– Sixteen 4K Word Sectors with Individual Write Lockout
– Two Hundred Fifty-four 32K Word Main Sectors with Individual Write Lockout
Typical Sector Erase Time: 32K Word Sectors – 500 ms; 4K Word Sectors – 100 ms
Thirty-two Plane Organization, Permitting Concurrent Read in Any of the Thirty-one
Planes not Being Programmed/Erased
Suspend/Resume Feature for Erase and Program
– Supports Reading and Programming Data from Any Sector by Suspending Erase
of a Different Sector
– Supports Reading Any Word by Suspending Programming of Any Other Word
Low-power Operation
– 30 mA Active
– 10 µA Standby
VPP Pin for Write Protection and Accelerated Program/Erase Operations
RESET Input for Device Initialization
CBGA and TSOP Packages
Seventeen 128-bit Protection Registers (2,176 Bits)
Common Flash Interface (CFI)
Description
The AT49SN/SV12804 is a 1.8-volt 128-megabit Flash memory. The memory is
divided into multiple sectors and planes for erase operations. The AT49SN/SV12804
is organized as 8,388,608 x 16 bits. The device can be read or reprogrammed off a
single 1.8V power supply, making it ideally suited for In-System programming. The
device can be configured to operate in the asynchronous/page read (default mode) or
burst read mode (not available for the AT49SV12804). The burst read mode is used to
achieve a faster data rate than is possible in the asynchronous/page read mode. If the
AVD and the CLK signals are both tied to GND and the burst configuration register is
configured to perform asynchronous reads, the device will behave like a standard
asynchronous Flash memory. In the page mode, the AVD signal can be tied to GND or
can be pulsed low to latch the page address. In both cases the CLK can be tied to
GND.
128-megabit
(8M x 16)
Burst/Page
Mode 1.8-volt
Flash Memory
AT49SN12804
AT49SV12804
Preliminary
The AT49SN/SV12804 is divided into thirty-two memory planes. A read operation can
occur in any of the thirty-one planes which is not being programmed or erased. This
concurrent operation allows improved system performance by not requiring the system to wait for a program or erase operation to complete before a read is performed.
To further increase the flexibility of the device, it contains an Erase Suspend and Program Suspend feature. This feature will put the erase or program on hold for any
amount of time and let the user read data from or program data to any of the remaining sectors. There is no reason to suspend the erase or program operation if the data
to be read is in another memory plane.
The VPP pin provides data protection and faster programming and erase times. When
the VPP input is below 0.4V, the program and erase functions are inhibited. When VPP
is at 0.9V or above, normal program and erase operations can be performed. With VPP
at 12.0V, the program (Dual-word Program command) and erase operations are
accelerated.
Rev. 3314A–FLASH–4/04
1
AT49SN/SV12804: Pin Configurations
Pin Name
Pin Function
I/O0 - I/O15
Data Inputs/Outputs
A0 - A22
Addresses
CE
Chip Enable
OE
Output Enable
WE
Write Enable
AVD(1)
Address Latch Enable
(1)
CLK
Clock
RESET
Reset
(1)
WP
Write Protect
VPP
Write Protection and Power Supply for Accelerated Program Operations
WAIT(1)
WAIT
VCCQ
Output Power Supply
Note:
1. These signals are not available for use with the AT49SV12804. The AT49SV12804 can only be used in the asynchronous/page mode.
AT49SN12804: CBGA – Top View
1
A
B
C
D
E
F
G
2
2
3
4
5
6
7
8
A11
A8 VSS VCC VPP A18
A6
A4
A12
A9
A20 CLK RESET A17
A5
A3
A13 A10 A21 AVD WE A19
A7
A2
A15 A14 WAIT A16 I/O12 WP A22
A1
VCCQ I/O15 I/O6 I/O4 I/O2 I/O1 CE
A0
VSS I/O14 I/013 I/O11 I/O10 I/O9 I/O0 OE
I/O7 VSS I/O5 VCC I/O3 VCCQ I/O8 VSS
AT49SV12804: TSOP – Top View
Type 1
A21
NC
A20
A19
A18
A17
A16
A15
VCC
A14
A13
A12
A11
CE
VPP
RST
A10
A9
A8
A7
VSS
A6
A5
A4
A3
A2
A1
A0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
NC
WE
OE
NC
I/O15
I/O7
I/O14
I/O6
VSS
I/O13
I/O5
I/O12
I/O4
VCCQ
VSS
I/O11
I/O3
I/O10
I/O2
VCC
I/O9
I/O1
I/O8
I/O0
NC
NC
A22
NC
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
Device
Operation
COMMAND SEQUENCES: When the device is first powered on, it will be in the read mode.
Command sequences are used to place the device in other operating modes such as program
and erase. The command sequences are written by applying a low pulse on the WE input with
CE low and OE high or by applying a low-going pulse on the CE input with WE low and OE
high. Prior to the low-going pulse on the CE or WE signal, the address input may be latched by
a low-to-high transition on the AVD signal. If the AVD is not pulsed low, the address will be
latched on the first rising edge of the WE or CE. Valid data is latched on the rising edge of the
WE or the CE pulse, whichever occurs first. The addresses used in the command sequences
are not affected by entering the command sequences.
BURST CONFIGURATION COMMAND: The Program Burst Configuration Register command
is used to program the burst configuration register. The burst configuration register determines
several parameters that control the read operation of the device. Bit B15 determines whether
synchronous burst reads are enabled or asynchronous reads are enabled. Since the page
read operation is an asynchronous operation, bit B15 must be set for asynchronous reads to
enable the page read feature. Bit B14 determines whether a four-word page or an eight-word
page will be used. The rest of the bits in the burst configuration register are used only for the
burst read mode. Bits B13 - B11 of the burst configuration register determine the clock latency
for the burst mode. The latency can be set to two, three, four, five or six cycles. The clock
latency versus input clock frequency table is shown on page 20. The “Burst Read Waveform”
as shown on page 31 illustrates a clock latency of four; the data is output from the device four
clock cycles after the first valid clock edge following the high-to-low AVD edge. The B10 bit of
the configuration register determines the polarity of the WAIT signal. The B9 bit of the burst
configuration register determines the number of clocks that data will be held valid (see Figure
4). The Hold Data for 2 Clock Cycles Read Waveform is shown on page 31. The clock latency
is not affected by the value of the B9 bit. The B8 bit of the burst configuration register determines when the WAIT signal will be asserted. When synchronous burst reads are enabled, a
linear burst sequence is selected by setting bit B7. Bit B6 selects whether the burst starts and
the data output will be relative to the falling edge or the rising edge of the clock. Bits B2 - B0 of
the burst configuration register determine whether a continuous or fixed-length burst will be
used and also determine whether a four-, eight- or sixteen-word length will be used in the
fixed-length mode. When a four-, eight- or sixteen-word burst length is selected, Bit B3 can be
used to select whether burst accesses wrap within the burst length boundary or whether they
cross word length boundaries to perform linear accesses (see Table 5). All other bits in the
burst configuration register should be programmed as shown on page 20. The default state
(after power-up or reset) of the burst configuration register is also shown on page 20.
ASYNCHRONOUS READ: There are two types of asynchronous reads – AVD pulsed and
standard asynchronous reads. The AVD pulsed read operation of the device is controlled by
CE, OE, and AVD inputs. The outputs are put in the high-impedance state whenever CE or OE
is high. This dual-line control gives designers flexibility in preventing bus contention. The data
at the address location defined by A0 - A22 and captured by the AVD signal will be read when
CE and OE are low. The address location passes into the device when CE and AVD are low;
the address is latched on the low-to-high transition of AVD. Low input levels on the OE and CE
pins allow the data to be driven out of the device. The access time is measured from stable
address, falling edge of AVD or falling edge of CE, whichever occurs last. During the AVD
pulsed read, the CLK signal may be static high or static low. For standard asynchronous
reads, the AVD and CLK signal should be tied to GND. The asynchronous read diagrams are
shown on page 28.
PAGE READ: The page read operation of the device is controlled by CE, OE, and AVD inputs.
The CLK input is ignored during a page read operation and should be tied to GND. The page
size can be four words (default value) or eight words depending on what value bit B14 of the
burst configuration register is programmed to. During a page read, the AVD signal can transition low and then transition high, transition low and remain low, or can be tied to GND. If a high
to low transition on the AVD signal occurs, as shown in Page Read Cycle Waveform 1, the
3
3314A–FLASH–4/04
page address is latched by the low-to-high transition of the AVD signal. However, if the AVD
signal remains low after the high-to-low transition or if the AVD signal is tied to GND, as shown
in Page Read Cycle Waveform 2, then the page address (determined by A22 - A3 for an eight
word page and A22 - A2 for a four-word page) cannot change during a page read operation.
The first word access of the page read is the same as the asynchronous read. The first word is
read at an asynchronous speed of 90 ns. Once the first word is read, toggling A0 and A1 (fourword page mode) or toggling A0, A1, and A2 (eight word page mode) will result in subsequent
reads within the page being output at a speed of 20 ns. If the AVD and the CLK pins are both
tied to GND, the device will behave like a standard asynchronous Flash memory. The page
read diagrams are shown on page 22.
SYNCHRONOUS READS: Synchronous reads (not available on the AT49SV12804) are used
to achieve a faster data rate that is possible in the asynchronous/page read mode. The device
can be configured for continuous or fixed-length burst access. The burst read operation of the
device is controlled by CE, OE, CLK and AVD inputs. The initial read location is determined as
for the AVD pulsed asynchronous read operation; it can be any memory location in the device.
In the burst access, the address is latched on the rising edge of the first clock pulse when AVD
is low or the rising edge of the AVD signal, whichever occurs first. The CLK input signal controls the flow of data from the device for a burst operation. After the clock latency cycles, the
data at the next burst address location is read for each following clock cycle.
Figure 1. Word Boundary
Word D0 - D3
D0 D1
D2
Word D4 - D7
D3 D4
D5
D6 D7
Word D8 - D11
Word D12 - D15
D8 D9 D10 D11 D12 D13 D14 D15
16-word Boundary
CONTINUOUS BURST READ: During a continuous burst read, any number of addresses can
be read from the memory. When operating in the linear burst read mode (B7 = 1) with
the burst wrap bit (B3 = 1) set, the device may incur an output delay when the burst
sequence crosses the first 16-word boundary in the memory (see Figure 1). If the starting
address is D0 - D12, there is no delay. If the starting address is D13 - D15, an output delay
equal to the initial clock latency is incurred. The delay takes place only once, and only if the
burst sequence crosses a 16-word boundary. To indicate that the device is not ready to continue the burst, the device will drive the WAIT pin low (B10 and B8 = 0) during the clock cycles
in which new data is not being presented. Once the WAIT pin is driven high (B10 and B8 = 0),
the current data will be valid. The WAIT signal will be tri-stated when the CE or OE signal is
high.
In the “Burst Read Waveform” as shown on page 31, the valid address is latched at point A.
For the specified clock latency of three, data D13 is valid within 13 ns of clock edge B. The
low-to-high transition of the clock at point C results in D14 being read. The transition of the
clock at point D results in a burst read of D15. The clock transition at point E does not cause
new data to appear on the output lines because the WAIT signal goes low (B10 and B8 = 0)
after the clock transition, which signifies that the first boundary in the memory has been
crossed and that new data is not available. After a clock latency of three, the clock transition at
point F does cause a burst read of data D16 because the WAIT signal goes high (B10 and B8
= 0) after the clock transition indicating that new data is available. Additional clock transitions,
like at point G, will continue to result in burst reads.
4
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
FIXED-LENGTH BURST READS: During a fixed-length burst mode read, four, eight or sixteen words of data may be burst from the device, depending upon the configuration. The
device supports a linear burst mode. The burst sequence is shown on page 21. When operating in the linear burst read mode (B7 = 1) with the burst wrap bit (B3 = 1) set, the device may
incur an output delay when the burst sequence crosses the first 16-word boundary in the
memory. If the starting is D0 - D12, there is no delay. If the starting address is D13 - D15, an
output delay equal to the initial clock latency is incurred. The delay takes place only once, and
only if the burst sequence crosses a 16-word boundary. To indicate that the device is not
ready to continue the burst, the device will drive the WAIT pin low (B10 and B8 = 0) during the
clock cycles in which new data is not being presented. Once the WAIT pin is driven high (B10
and B8 = 0), the current data will be valid. The WAIT signal will be tri-stated when the CE or
OE signal is high.
The “Four-word Burst Read Waveform” on page 32 illustrates a fixed-length burst cycle. The
valid address is latched at point A. For the specified clock latency of four, data D0 is valid
within 13 ns of clock edge B. The low-to-high transition of the clock at point C results in D1
being read. Similarly, D2 and D3 are output following the next two clock cycles. Returning CE
high ends the read cycle. There is no output delay in the burst access wrap mode (B3 = 0).
BURST SUSPEND: The Burst Suspend feature allows the system to temporarily suspend a
synchronous burst operation if the system needs to use the Flash address and data bus for
other purposes. Burst accesses can be suspended during the initial latency (before data is
received) or after the device has output data. When a burst access is suspended, internal
array sensing continues and any previously latched internal data is retained.
Burst Suspend occurs when CE is asserted, the current address has been latched (either rising edge of AVD or valid CLK edge), CLK is halted, and OE is deasserted. The CLK can be
halted when it is at VIH or VIL. To resume the burst access, OE is reasserted and the CLK is
restarted. Subsequent CLK edges resume the burst sequence where it left off.
Within the device, OE gates the WAIT signal. Therefore, during Burst Suspend the WAIT signal reverts to a high-impedance state when OE is deasserted. See “Burst Suspend Waveform”
on page 32.
RESET: A RESET input pin is provided to ease some system applications. When RESET is at
a logic high level, the device is in its standard operating mode. A low level on the RESET pin
halts the present device operation and puts the outputs of the device in a high-impedance
state. When a high level is reasserted on the RESET pin, the device returns to read mode.
ERASE: Before a word can be reprogrammed it must be erased. The erased state of the
memory bits is a logical “1”. The entire memory can be erased by using the Chip Erase command or individual planes can be erased by using the Plane Erase command or individual
sectors can be erased by using the Sector Erase command.
5
3314A–FLASH–4/04
CHIP ERASE: Chip Erase is a two-bus cycle operation. The automatic erase begins on the
rising edge of the last WE pulse. Chip Erase does not alter the data of the protected sectors.
The hardware reset during chip erase will stop the erase, but the data will be of an unknown
state.
PLANE ERASE: As an alternative to a full Chip Erase, the device is organized into thirty-two
planes that can be individually erased. The Plane Erase command is a two-bus cycle operation. The plane whose address is valid at the second rising edge of WE will be erased. The
Plane Erase command does not alter the data in the protected sectors.
SECTOR ERASE: The device is organized into multiple sectors that can be individually
erased. The Sector Erase command is a two-bus cycle operation. The sector whose address
is valid at the second rising edge of WE will be erased provided the given sector has not been
protected.
WORD PROGRAMMING: The device is programmed on a word-by-word basis. Programming
is accomplished via the internal device command register and is a two-bus cycle operation.
The programming address and data are latched in the second cycle. The device will automatically generate the required internal programming pulses. Please note that a “0” cannot be
programmed back to a “1”; only erase operations can convert “0”s to “1”s.
FLEXIBLE SECTOR PROTECTION: The AT49SN/SV12804 offers two sector protection
modes, the Softlock and the Hardlock. The Softlock mode is optimized as sector protection for
sectors whose content changes frequently. The Hardlock protection mode is recommended
for sectors whose content changes infrequently. Once either of these two modes is enabled,
the contents of the selected sector is read-only and cannot be erased or programmed. Each
sector can be independently programmed for either the Softlock or Hardlock sector protection
mode. At power-up and reset, all sectors have their Softlock protection mode enabled.
SOFTLOCK AND UNLOCK: The Softlock protection mode can be disabled by issuing a twobus cycle Unlock command to the selected sector. Once a sector is unlocked, its contents can
be erased or programmed. To enable the Softlock protection mode, a two-bus cycle Softlock
command must be issued to the selected sector.
HARDLOCK AND WRITE PROTECT (WP): The Hardlock sector protection mode operates in
conjunction with the Write Protection (WP) pin. The Hardlock sector protection mode can be
enabled by issuing a two-bus cycle Hardlock software command to the selected sector. The
state of the Write Protect pin affects whether the Hardlock protection mode can be overridden.
• When the WP pin is low and the Hardlock protection mode is enabled, the sector cannot be
unlocked and the contents of the sector is read-only.
• When the WP pin is high, the Hardlock protection mode is overridden and the sector can be
unlocked via the Unlock command.
6
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
To disable the Hardlock sector protection mode, the chip must be either reset or power cycled.
Table 1. Hardlock and Softlock Protection Configurations in Conjunction with WP
Softlock
Erase/
Prog
Allowed?
VPP
WP
Hardlock
VCC
0
0
0
Yes
No sector is locked
VCC
0
0
1
No
Sector is Softlocked. The
Unlock command can unlock
the sector.
VCC
0
1
1
No
Hardlock protection mode is
enabled. The sector cannot be
unlocked.
VCC
1
0
0
Yes
No sector is locked.
VCC
1
0
1
No
Sector is Softlocked. The
Unlock command can unlock
the sector.
VCC
1
1
0
Yes
Hardlock protection mode is
overridden and the sector is
not locked.
VCC
1
1
1
No
Hardlock protection mode is
overridden and the sector can
be unlocked via the Unlock
command.
VIL
x
x
x
No
Erase and Program Operations
cannot be performed.
Comments
Figure 2. Sector Locking State Diagram
UNLOCKED
[000]
LOCKED
A
B
[001]
C
Power-Up/Reset
Default
C
WP = VIL = 0
Hardlocked
[011]
A
[110]
B
C
WP = VIH = 1
A
[100]
Hardlocked is disabled by
WP = VIH
[111]
C
Power-Up/Reset
Default
B
[101]
A = Unlock Command
B = Softlock Command
C = Hardlock Command
Note:
1. The notation [X, Y, Z] denotes the locking state of a sector. The current locking state of a
sector is defined by the state of WP and the two bits of the sector-lock status D[1:0].
7
3314A–FLASH–4/04
SECTOR PROTECTION DETECTION: A software method is available to determine if the sector protection Softlock or Hardlock features are enabled. When the device is in the software
product identification mode a read from the I/O0 and I/O1 at address location 00002H within a
sector will show if the sector is unlocked, softlocked, or hardlocked.
Table 2. Sector Protection Status
I/O1
I/O0
Sector Protection Status
0
0
Sector Not Locked
0
1
Softlock Enabled
1
0
Hardlock Enabled
1
1
Both Hardlock and Softlock Enabled
READ STATUS REGISTER: The status register indicates the status of device operations and
the success/failure of that operation. The Read Status Register command causes subsequent
reads to output data from the status register until another command is issued. To return to
reading from the memory, issue a Read command.
The status register bits are output on I/O7 - I/O0. The upper byte, I/O15 - I/O8, outputs 00H
when a Read Status Register command is issued.
The contents of the status register [SR7:SR0] are latched on the falling edge of OE or CE
(whichever occurs last), which prevents possible bus errors that might occur if status register
contents change while being read. CE or OE must be toggled with each subsequent status
read, or the status register will not indicate completion of a Program or Erase operation.
When the Write State Machine (WSM) is active, SR7 will indicate the status of the WSM; the
remaining bits in the status register indicate whether the WSM was successful in performing
the preferred operation (see Table 3).
8
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
READ STATUS REGISTER IN THE BURST MODE: The waveform below shows a status
register read during a program operation. The two-bus cycle command for a program operation is given followed by a read status register command. Following the read status register
command, the AVD signal is pulsed low to latch the valid address at point A. With the OE signal pulsed low and for the specified clock latency of three, the status register output is valid
within 13 ns from clock edge B. The same status register data is output on successive clock
edges. To update the status register output, the AVD signal needs to be pulsed low and the
next data is available after a clock latency of three. The status register output is also available
after the chosen clock latency during an erase operation.
Figure 3. Read Status Register in the Burst Mode
A
B
CLK
CE
OE
AVD
WE
A0 - A22
I/O0 - I/O15
WAIT
Note:
XX
40H/10H
ADDRESS
DATA
70H
00H
80H
(1)
1. The WAIT signal is for a burst configuration setting of B10 and B8 = 0.
9
3314A–FLASH–4/04
Table 3. Status Register Bit Definition
WSMS
ESS
ES
PRS
VPPS
PSS
SLS
PLS
7
6
5
4
3
2
1
0
Notes
SR7 WRITE STATE MACHINE STATUS (WSMS)
1 = Ready
0 = Busy
Check Write State Machine bit first to determine Word Program
or Sector Erase completion, before checking program or erase
status bits.
SR6 = ERASE SUSPEND STATUS (ESS)
1 = Erase Suspended
0 = Erase In Progress/Completed
When Erase Suspend is issued, WSM halts execution and sets
both WSMS and ESS bits to “1” – ESS bit remains set to “1” until
an Erase Resume command is issued.
SR5 = ERASE STATUS (ES)
1 = Error in Sector Erase
0 = Successful Sector Erase
When this bit is set to “1”, WSM has applied the max number of
erase pulses to the sector and is still unable to verify successful
sector erasure.
SR4 = PROGRAM STATUS (PRS)
1 = Error in Programming
0 = Successful Programming
When this bit is set to “1”, WSM has attempted but failed to
program a word
SR3 = VPP STATUS (VPPS)
1 = VPP Low Detect, Operation Abort
0 = VPP OK
The VPP status bit does not provide continuous indication of VPP
level. The WSM interrogates VPP level only after the Program or
Erase command sequences have been entered and informs the
system if VPP has not been switched on. The VPP is also checked
before the operation is verified by the WSM.
SR2 = PROGRAM SUSPEND STATUS (PSS)
1 = Program Suspended
0 = Program in Progress/Completed
When Program Suspend is issued, WSM halts execution and
sets both WSMS and PSS bits to “1”. PSS bit remains set to “1”
until a Program Resume command is issued.
SR1 = SECTOR LOCK STATUS
1 = Prog/Erase attempted on a locked sector; Operation aborted.
0 = No operation to locked sectors
If a Program or Erase operation is attempted to one of the locked
sectors, this bit is set by the WSM. The operation specified is
aborted and the device is returned to read status mode.
SR0 = Plane Status (PLS)
Indicates program or erase status of the addressed plane.
Note:
1. A Command Sequence Error is indicated when SR1, SR3, SR4 and SR5 are set.
Table 4. Status Register Device WSMS and Write Status Definition
10
WSMS
(SR7)
PLS
(SR0)
0
0
The addressed plane is performing a program/erase operation.
0
1
A plane other than the one currently addressed is performing a program/erase operation.
1
x
No program/erase operation is in progress in any plane. Erase and Program suspend bits (SR6, SR2)
indicate whether other planes are suspended.
Description
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
ERASE SUSPEND/ERASE RESUME: The Erase Suspend command allows the system to
interrupt a sector erase or plane erase operation. The erase suspend command does not work
with the Chip Erase feature. Using the erase suspend command to suspend a sector erase
operation, the system can program or read data from a different sector within the same plane.
Since this device is organized into thirty-two planes, there is no need to use the erase suspend
feature while erasing a sector when you want to read data from a sector in another plane. After
the Erase Suspend command is given, the device requires a maximum time of 15 µs to suspend the erase operation. After the erase operation has been suspended, the plane that
contains the suspended sector enters the erase-suspend-read mode. The system can then
read data or program data to any other sector within the device. An address is not required
during the Erase Suspend command. During a sector erase suspend, another sector cannot
be erased. To resume the sector erase operation, the system must write the Erase Resume
command. The Erase Resume command is a one-bus cycle command, which does require
the plane address. Read, Read Status Register, Product ID Entry, Clear Status Register, Program, Program Suspend, Erase Resume, Sector Softlock/Hardlock, Sector Unlock are valid
commands during an erase suspend.
PROGRAM SUSPEND/PROGRAM RESUME: The Program Suspend command allows the
system to interrupt a programming operation and then read data from a different word within
the memory. After the Program Suspend command is given, the device requires a maximum
of 10 µs to suspend the programming operation. After the programming operation has been
suspended, the system can then read from any other word within the device. An address is not
required during the program suspend operation. To resume the programming operation, the
system must write the Program Resume command. The program suspend and resume are
one-bus cycle commands. The command sequence for the erase suspend and program suspend are the same, and the command sequence for the erase resume and program resume
are the same. Read, Read Status Register, Product ID Entry, Program Resume are valid commands during a Program Suspend.
128-BIT PROTECTION REGISTERS: The AT49SN/SV12804 contains seventeen (PR0 PR16) 128-bit registers that can be used for security purposes in system design. Please see
the Protection Register Addressing Table on page 19 for the address locations within each
protection register. The first protection register (PR0) is divided into two 64-bit blocks. The two
blocks are designated as block A and block B. The data in block A is non-changeable and is
programmed at the factory with a unique number. The data in block B is programmed by the
user and can be locked out such that data in the block cannot be reprogrammed. The other 16
registers (PR1 - PR16) have 128 bits (16 words) each that are all user programmable. To program block B in PR0 or to program PR1 - PR16 register, a two-bus cycle command must be
used as shown in the Command Definition table on page 18. To lock out block B in PRO or to
lock out PR1 - PR16, a two-bus cycle command must also be used as shown in the Command
Definition table. To lock out block B in PRO, the address used in the second bus cycle is 080h
and data bit D1 must be zero during the second bus cycle. All other data bits during the second bus cycle are don’t cares. To lock out PR1 - PR16, the address used in the second bus
cycle is 089h and sixteen bits of data are programmed. If any of these bits is programmed to a
zero, the appropriate register is locked. After being locked, the protection register cannot be
unlocked. To determine whether block B in PRO or PR1 - PR16 is locked out, the Product ID
Entry command is given followed by a read operation from address 80H or address 89H,
respectively. (This command is shown as status of protection in the Command Definition
table). For block B in PRO, if data bit D1 is zero, block B is locked. If data bit D1 is one, block B
can be reprogrammed. For PR1 - PR16, sixteen bits of data are read out. Each bit represents
the protection status of a particular register. If the bit is a zero, the register is locked. If the bit
is a one, the register can be reprogrammed. To read a protection register, the Product ID Entry
command is given followed by a normal read operation from an address within the protection
register. After determining whether a register is protected or not or reading the protection register, the Read command must be given to return to the read mode.
11
3314A–FLASH–4/04
CFI: Common Flash Interface (CFI) is a published, standardized data structure that may be
read from a flash device. CFI allows system software to query the installed device to determine the configurations, various electrical and timing parameters, and functions supported by
the device. CFI is used to allow the system to learn how to interface to the flash device most
optimally. The two primary benefits of using CFI are ease of upgrading and second source
availability. The command to enter the CFI Query mode is a one-bus cycle command which
requires writing data 98h to any address. The CFI Query command can be written when the
device is ready to read data or can also be written when the part is in the product ID mode.
Once in the CFI Query mode, the system can read CFI data at the addresses given in Table
on page 31. To return to the read mode, the read command should be issued.
HARDWARE DATA PROTECTION: Hardware features protect against inadvertent programs
to the AT49SN/SV12804 in the following ways: (a) VCC sense: if VCC is below 1.2V (typical),
the device is reset and the program and erase functions are inhibited. (b) VCC power-on delay:
once VCC has reached the VCC sense level, the device will automatically time-out 10 ms (typical) before programming. (c) Program inhibit: holding any one of OE low, CE high or WE high
inhibits program cycles. (d) Noise filter: pulses of less than 15 ns (typical) on the WE or CE
inputs will not initiate a program cycle. (e) VPP is less than VILPP.
INPUT LEVELS: While operating with a 1.65V to 1.95V power supply, the address inputs and
control inputs (OE, CE and WE) may be driven from 0 to 2.5V without adversely affecting the
operation of the device. The I/O lines can be driven from 0 to VCCQ + 0.6V.
OUTPUT LEVELS: For the AT49SN/SV12804, output high levels are equal to VCCQ - 0.1V
(not VCC). VCCQ must be regulated between 1.8V - 2.25V.
12
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
Word Program Flowchart
Word Program Procedure
Bus
Operation
Start
Write 40,
Word Address
(Setup)
Write Data,
Word Address
(Confirm)
Program
Suspend
Loop
Read Status
Register
Command
Write
Program
Setup
Data = 40
Addr = Location to program
Write
Data
Data = Data to program
Addr = Location to program
Read
None
Status register data: Toggle CE or
OE to update status register
Idle
None
Check SR7
1 = WSM Ready
0 = WSM Busy
No
0
SR7 =
Suspend?
Yes
1
Full Status
Check
(If Desired)
Comments
Repeat for subsequent Word Program operations.
Full status register check can be done after each program, or after a
sequence of program operations.
Write FF after the last operation to set to the Read state.
Program
Complete
Full Status Check Flowchart
Read Status
Register
SR3 =
1
VP P Range
Error
Full Status Check Procedure
Bus
Operation
Command
Idle
None
Check SR3:
1 = VPP Error
Idle
None
Check SR4:
1 = Data Program Error
Idle
None
Check SR1:
1 = Sector locked; operation aborted
0
SR4 =
1
Program
Error
0
SR1 =
1
Device
Protect Error
Comments
SR3 MUST be cleared before the Write State Machine allows further program
attempts.
If an error is detected, clear the status register before continuing operations –
only the Clear Status Register command clears the status register error bits.
0
Program
Successful
13
3314A–FLASH–4/04
Program Suspend/Resume Flowchart
Bus
Operation
Start
Write B0
Any Address
Program Suspend/Resume Procedure
Program
Suspend
Write
Read
Status
Data = 70
Addr = Any address within the Same Plane
Read
None
Status register data: Toggle CE or
OE to update status register
Addr = Any address
Idle
None
Check SR7
1 = WSM Ready
0 = WSM Busy
Idle
None
Check SR2
1 = Program suspended
0 = Program completed
Write
Read Array
Data = FF
Addr = Any address within the Suspended
Plane
Read
None
Read data from any sector in the memory
other than the one being programmed
Write
Program
Resume
Read Status
Register
SR7 =
Comments
Write
(Program Suspend)
Write 70
Any Address
(Read Status)
within
the Same Plane
Command
0
Data = B0
Addr = Sector address to Suspend (SA)
1
SR2 =
0
Program
Completed
1
Write FF
Suspend Plane
(Read Array)
Read
Data
Done
Reading
Write FF
No
Read
Data
(Read
Array)
Data = D0
Addr = Any address
Yes
Write D0
Any Address
If the Suspend Plane was placed in Read mode:
(Program Resume)
Write
Program
Resumed
Write 70H
Any Address
within
the Same Plane
14
Read
Status
Return Plane to Status mode:
Data = 70
Addr = Any address within the Same Plane
(Read Status)
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
Erase Suspend/Resume Flowchart
Bus
Operation
Start
Write B0,
Any Address
(Erase Suspend)
Write 70,
Any Address
(Read Status)
Read Status
Register
SR7 =
Erase Suspend/Resume Procedure
0
Command
Write
Erase
Suspend
Write
Read
Status
Data = 70
Addr = Any address
Read
None
Status register data: Toggle CE or
OE to update status register
Addr = Any address within the Same Plane
Idle
None
Check SR7
1 = WSM Ready
0 = WSM Busy
Idle
None
Check SR6
1 = Erase suspended
0 = Erase completed
Write
Read or
Program
Read or
Write
None
Write
Program
Resume
1
SR6 =
0
Erase
Completed
1
Read
or Program?
Read
No
Program
Loop
Done?
Comments
Data = B0
Addr = Any address within the Same Plane
Data = FF or 40
Addr = Any address
Read or program data from/to sector other
than the one being erased
Yes
(Erase Resume)
Write D0,
Any Address
Write FF
Erase
Resumed
Read Array
Data
(Read Array)
Data = D0
Addr = Any address
If the Suspended Plane was placed in Read mode or a Program loop:
Write 70H
Any Address
within
the Same Plane
Write
Read
Status
Return Plane to Status mode:
Data = 70
Addr = Any address within the Same Plane
(Read Status)
15
3314A–FLASH–4/04
Sector Erase Flowchart
Sector Erase Procedure
Bus
Operation
Start
Write 20,
Sector Address
Command
Write
Sector
Erase
Setup
Data = 20
Addr = Sector to be erased (SA)
Write
Erase
Confirm
Data = D0
Addr = Sector to be erased (SA)
Read
None
Status register data: Toggle CE or
OE to update status register data
Idle
None
Check SR7
1 = WSMS Ready
0 = WSMS Busy
(Sector Erase)
Write D0,
(Erase Confirm)
Sector Address
Suspend
Erase
Loop
Read Status
Register
No
Suspend
Erase
0
SR7 =
Yes
1
Full Erase
Status Check
(If Desired)
Repeat for subsequent sector erasures.
Full status register check can be done after each sector erase, or after a
sequence of sector erasures.
Write FF after the last operation to enter read mode.
Sector Erase
Complete
Full Erase Status Check Flowchart
Read Status
Register
SR3 =
1
VP P Range
Error
Full Erase Status Check Procedure
Bus
Operation
Command
Idle
None
Check SR3:
1 = VPP Range Error
Idle
None
Check SR4, SR5:
Both 1 = Command Sequence Error
Idle
None
Check SR5:
1 = Sector Erase Error
Idle
None
Check SR1:
1 = Attempted erase of locked sector;
erase aborted.
0
SR4, SR5 =
1,1
Command
Sequence Error
0
SR5 =
1
Sector Erase
Error
1
Sector Locked
Error
0
SR1 =
0
Sector Erase
Successful
16
Comments
Comments
SR1, SR3 must be cleared before the Write State Machine allows further
erase attempts.
Only the Clear Status Register command clears SR1, SR3, SR4, SR5.
If an error is detected, clear the status register before attempting an
erase retry or other error recovery.
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
Protection Register Programming
Flowchart
Protection Register Programming Procedure
Bus
Operation
Command
Comments
Start
Write C0,
PR Address
Write PR
Address & Data
(Confirm Data)
Program
Complete
Full Status Check Flowchart
Read Status
Register Data
0, 1
Program Error
1, 1
Register Locked;
Program Aborted
0
SR1, SR4 =
0
Program
Successful
Protection
Program
Data = Data to Program
Addr = Location to Program
Read
None
Status register data: Toggle CE or
OE to update status register data
Idle
None
Check SR7
1 = WSMS Ready
0 = WSMS Busy
Full Status Check Procedure
Bus
Operation
Command
Idle
None
Check SR1, SR3, SR4:
0,1,1 = VPP Range Error
Idle
None
Check SR1, SR3, SR4:
0,0,1 = Programming Error
Idle
None
Check SR1, SR3, SR4:
1, 0,1 = Sector locked; operation
aborted
VP P Range Error
0
SR1, SR4 =
Write
Program Protection Register operation addresses must be within the
protection register address space. Addresses outside this space will
return an error.
Repeat for subsequent programming operations.
Full status register check can be done after each program, or after a
sequence of program operations.
Write FF after the last operation to return to the Read mode.
Full Status
Check
(If Desired)
1, 1
Data = C0
Addr = First Location to Program
0
1
SR3, SR4 =
Program
PR Setup
(Program Setup)
Read Status
Register
SR7 =
Write
Comments
SR3 must be cleared before the Write State Machine allows further
program attempts.
Only the Clear Status Register command clears SR1, SR3, SR4.
If an error is detected, clear the status register before attempting a
program retry or other error recovery.
17
3314A–FLASH–4/04
Command Definition in Hex(1)
Command
Sequence
1st Bus
Cycle
2nd Bus
Cycle
Bus
Cycles
Addr
Data
Read
1
PA(2)
FF
Chip Erase
2
XX
Plane Erase
2
XX
Sector Erase
2
Word Program
2
Dual Word Program
(9)
SA
Addr
(14)
Addr
Data
21
Addr
D0
22
Addr
D0
20
(3)
D0
(14)
DIN
40/10
3
Addr0
E0
Erase/Program Suspend
1
XX
B0
Erase/Program Resume
1
PA
D0
1
PA
90
2
SA
Product ID Entry
(13)
Sector Softlock
Sector Hardlock
2
SA
Addr
DIN0
60
SA(3)
01
60
(3)
2F
(3)
D0
2
SA
60
Read Status Register
2
PA
70
Clear Status Register
1
XX
50
XX
SA
Addr0
Sector Unlock
(8)
3rd Bus
Cycle
SA
SA
XX
DOUT(4)
C0
Addr(10)
DIN
Program PR0 (Block B) or PR1-PR16
2
Lock Protection PR0 – Block B
2
80
C0
80
FFFD
Lock Protection PR1-PR16
2
XX
C0
89
DIN(11)
Status of Protection PR0 (Block B)
2
PA
90
80
DOUT(5)
Status of Protection PR1-PR16
2
PA
90
89
DOUT(12)
Program Burst Configuration Register
2
Addr(6)
60
Addr(6)
Read Burst Configuration Register
2
PA
90
CFI Query
1
XX
98
Notes:
18
(7)
PAX005
Addr
Data
Addr1
DIN1
03
DOUT
1. The DATA FORMAT shown for each bus cycle is as follows; I/O7 - I/O0 (Hex). I/O15 - I/O8 are don’t care. The ADDRESS FORMAT shown
for each bus cycle is as follows: A7 - A0 (Hex). Address A22 through A8 are don’t care.
2. PA is the plane address (A22 - A18). Any address within a plane can be used.
3. SA = sector address. Any word address within a sector can be used to designate the sector address (see pages 22 - 25 for details).
4. The status register bits are output on I/O7 - I/O0.
5. If data bit D1 is “0”, block B is locked. If data bit D1 is “1”, block B can be reprogrammed.
6. See “Burst Configuration Register” on page 20. Bits B15 - B0 of the burst configuration register determine A15 - A0. Addresses A16 - A22
can select any plane.
7. The plane address has to be the same as the plane address in the second bus cycle.
8. Any address within the user programmable protection register region.
9. This fast programming option enables the user to program two words in parallel only when VPP = 12V. The addresses, Addr0 and Addr1, of
the two words, DIN0 and DIN1, must only differ in address A0. This command should be used during manufacturing purposes only.
10. Address locations are shown on next page.
11. DIN represents 16 bits of data. If any bit is programmed to a “0”, the appropriate protection register is locked.
12. DOUT represents 16 bits of data. Each bit corresponds to the protection status of a given register. The most significant bit read out corresponds to PR16, and the last significant bit corresponds to PR0. If the data bit is a “0”, the register is locked. If the data bits is a “1”, the
register can be programmed.
13. The manufacturer code is read from address 0000H, and the device code is read from address 0001H.
14. The first bus cycle address should be the same as the word address to be programmed.
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
Absolute Maximum Ratings*
Temperature under Bias ................................ -55°C to +125°C
*NOTICE:
Storage Temperature ..................................... -65°C to +150°C
All Input Voltages Except VPP
(including NC Pins)
with Respect to Ground ...................................-0.6V to +6.25V
VPP Input Voltage
with Respect to Ground ......................................... 0V to 12.5V
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.
All Output Voltages
with Respect to Ground ...........................-0.6V to VCCQ + 0.6V
Protection Register Addressing Table
PRO
PR1
PR2
Address
Use
Block
A8
A7
A6
A5
A4
A3
A2
A1
A0
81
Factory
A
0
1
0
0
0
0
0
0
1
82
Factory
A
0
1
0
0
0
0
0
1
0
83
Factory
A
0
1
0
0
0
0
0
1
1
84
Factory
A
0
1
0
0
0
0
1
0
0
85
User
B
0
1
0
0
0
0
1
0
1
86
User
B
0
1
0
0
0
0
1
1
0
87
User
B
0
1
0
0
0
0
1
1
1
88
User
B
0
1
0
0
0
1
0
0
0
8A
User
0
1
0
0
0
1
0
1
0
•
•
•
•
•
•
91
User
0
1
0
0
1
0
0
0
1
92
User
0
1
0
0
1
0
0
1
0
1
0
1
0
0
0
0
1
•
•
•
•
A1
•
•
User
0
•
•
•
102
PR16
1
•
•
•
•
•
0
0
0
0
0
0
1
0
0
0
0
0
1
0
0
1
•
•
•
•
109
Note:
User
•
•
•
User
1
1. All address lines not specified in the above table must be 0 when accessing the Protection Register, i.e., A22 - A9 = 0.
19
3314A–FLASH–4/04
Burst Configuration Register
B15
0
1(1)
Synchronous Burst Reads Enabled
Asynchronous Reads Enabled
B14
0(1)
1
Four-word Page
Eight-word Page
B13 - B11:
010(2)
011
100
101
110(1)
Clock Latency of Two
Clock Latency of Three
Clock Latency of Four
Clock Latency of Five
Clock Latency of Six
B10
0
1(1)(3)
WAIT Signal is Asserted Low
WAIT Signal is Asserted High
B9
0
1(1)
Hold Data for One Clock
Hold Data for Two Clocks
B8
0
1(1)
WAIT Asserted during Clock Cycle in which Data is Valid
WAIT Asserted One Clock Cycle before Data is Valid
B7
1(1)
Linear Burst Sequence
B6
0
1(1)
Burst Starts and Data Output on Falling Clock Edge
Burst Starts and Data Output on Rising Clock Edge
B5 - B4
00(1)
Reserved for Future Use
B3
0
1(1)
Wrap Burst Within Burst length set by B2 - B0
Don’t Wrap Accesses Within Burst Length set by B2 - B0
B2 - B0
001
010
011
111(1)
Four-word Burst
Eight-word Burst
Sixteen-word Burst
Continuous Burst
Notes:
1. Default State
2. Burst configuration setting of B13 - B11 = 010 (clock latency of two), B9 = 1 (hold data for two clock cycles) and B8 = 1 (WAIT asserted one
clock cycle before data is valid) is not supported.
3. Data is not ready when WAIT is asserted.
Clock Latency versus Input Clock Frequency
Minimum Clock Latency
(Minimum Number of Clocks Following Address Latch)
Input Clock Frequency
5, 6
≤ 66 MHz
4
≤ 61 MHz
2, 3
≤ 40 MHz
Figure 4. Output Configuration
CLK
20
1 CLK
Data Hold
(B9 = 0)
I/00 - I/015
2 CLK
Data Hold
(B9 = 1)
I/00 - I/015
VALID
OUTPUT
VALID
OUTPUT
VALID
OUTPUT
VALID
OUTPUT
VALID
OUTPUT
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
Table 5. Sequence and Burst Length
Burst Addressing Sequence (Decimal)
4-word Burst
Length
B2 – B0 = 001
8-word Burst Length
B2 – B0 = 010
16-word Burst
Length
B2 – B0 = 011
Continuous Burst
B2 – B0 = 111
Linear
Linear
Linear
Linear
Start
Addr.
(Decimal)
Wrap
B3 = 0
0
0
0-1-2-3
0-1-2-3-4-5-6-7
0-1-2...14-15
0-1-2-3-4-5-6...
1
0
1-2-3-0
1-2-3-4-5-6-7-0
1-2-3...14-15-0
1-2-3-4-5-6-7...
2
0
2-3-0-1
2-3-4-5-6-7-0-1
2-3-4...15-0-1
2-3-4-5-6-7-8...
3
0
3-0-1-2
3-4-5-6-7-0-1-2
3-4-5...15-0-1-2
3-4-5-6-7-8-9...
4
0
4-5-6-7-0-1-2-3
4-5-6...15-0-1-2-3
4-5-6-7-8-9-10...
5
0
5-6-7-0-1-2-3-4
5-6-7...15-0-1...4
5-6-7-8-9-10-11...
6
0
6-7-0-1-2-3-4-5
6-7-8...15-0-1...5
6-7-8-9-10-11-12...
7
0
7-0-1-2-3-4-5-6
7-8-9...15-0-1...6
7-8-9-10-11-12-13...
...
...
...
...
...
14
0
14-15-0-1...13
14-15-16-17-18-19-20
15
0
15-0-1-2-3...14
15-16-17-18-19-20-21
...
...
Wrap
B3 = 1
...
...
...
...
...
...
...
0
1
0-1-2-3
0-1-2-3-4-5-6-7
0-1-2...14-15
0-1-2-3-4-5-6...
1
1
1-2-3-4
1-2-3-4-5-6-7-8
1-2-3...15-16
1-2-3-4-5-6-7...
2
1
2-3-4-5
2-3-4-5-6-7-8-9
2-3-4...16-17
2-3-4-5-6-7-8...
3
1
3-4-5-6
3-4-5-6-7-8-9-10
3-4-5...17-18
3-4-5-6-7-8-9...
4
1
4-5-6-7-8-9-10-11
4-5-6...18-19
4-5-6-7-8-9-10...
5
1
5-6-7-8-9-10-11-12
5-6-7...19-20
5-6-7-8-9-10-11...
6
1
6-7-8-9-10-11-12-13
6-7-8...20-21
6-7-8-9-10-11-12...
7
1
7-8-9-10-11-12-13-14
7-8-9...21-22
7-8-9-10-11-12-13...
...
...
...
...
...
...
...
14
1
14-15...28-29
14-15-16-17-18-19-20
15
1
15-16...29-30
15-16-17-18-19-20-21
21
3314A–FLASH–4/04
Memory Organization – AT49SN/SV12804
Plane
Plane
Size
(Bits)
1
4M
•
•
•
1
2
•
•
•
Size Words
x16 Address Range (A22 - A0)
SA0
4K
00000 - 00FFF
SA1
4K
01000 - 01FFF
SA2
4K
02000 - 02FFF
SA3
4K
03000 - 03FFF
SA4
4K
04000 - 04FFF
SA5
4K
05000 - 05FFF
SA6
4K
06000 - 06FFF
SA7
4K
07000 - 07FFF
SA8
32K
08000 - 0FFFF
SA9
32K
10000 - 17FFF
•
•
•
•
•
•
•
•
•
SA13
32K
30000 - 37FFF
SA14
32K
38000 -3FFFF
SA15
32K
40000 - 47FFF
•
•
•
•
•
•
•
•
•
2
SA22
32K
78000 - 7FFFF
3
SA23
32K
80000 - 87FFF
•
•
•
•
•
•
•
•
•
3
SA30
32K
B8000 - BFFFF
4
SA31
32K
C0000 - C7FFF
•
•
•
•
•
•
•
•
•
•
•
•
4
SA38
32K
F8000 - FFFFF
5
SA39
32K
100000 - 107FFF
•
•
•
•
•
•
•
•
•
•
•
•
5
SA46
32K
138000 - 13FFFF
6
SA47
32K
140000 - 147FFF
•
•
•
•
•
•
•
•
•
•
•
•
6
SA54
32K
178000 - 17FFFF
7
SA55
32K
180000 - 187FFF
•
•
•
•
•
•
•
•
•
•
•
•
SA62
32K
1B8000 - 1BFFFF
•
•
•
7
22
4M
Sector
4M
4M
4M
4M
4M
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
Memory Organization – AT49SN/SV12804 (Continued)
Plane
Size
(Bits)
Sector
Size Words
x16 Address Range (A22 - A0)
SA63
32K
1C0000 - 1C7FFF
•
•
•
•
•
•
•
•
•
8
SA70
32K
1F8000 - 1FFFFF
9
SA71
32K
200000-207FFF
•
•
•
•
•
•
•
•
•
9
SA78
32K
238000 - 23FFFF
10
SA79
32K
240000 - 247FFF
•
•
•
•
•
•
•
•
•
10
SA86
32K
278000 - 27FFFF
11
SA87
32K
280000 - 287FFF
•
•
•
•
•
•
•
•
•
•
•
•
11
SA94
32K
2B8000 - 2BFFFF
12
SA95
32K
2C0000 - 2C7FFF
•
•
•
•
•
•
•
•
•
•
•
•
12
SA102
32K
2F8000 - 2FFFFF
13
SA103
32K
300000 - 307FFF
•
•
•
•
•
•
•
•
•
•
•
•
13
SA110
32K
338000 - 33FFFF
14
SA111
32K
340000 - 347FFF
•
•
•
•
•
•
•
•
•
•
•
•
14
SA118
32K
378000 - 37FFFF
15
SA119
32K
380000 - 387FFF
•
•
•
•
•
•
•
•
•
•
•
•
15
SA126
32K
3B8000 - 3BFFFF
16
SA127
32K
3C0000 - 3C7FFF
•
•
•
•
•
•
•
•
•
SA134
32K
3F8000 - 3FFFFF
Plane
8
•
•
•
•
•
•
•
•
•
•
•
•
16
4M
4M
4M
4M
4M
4M
4M
4M
4M
23
3314A–FLASH–4/04
Memory Organization – AT49SN/SV12804 (Continued)
Plane
Size
(Bits)
Sector
Size Words
x16 Address Range (A22 - A0)
SA135
32K
400000 - 407FFF
•
•
•
•
•
•
•
•
•
17
SA142
32K
438000 - 43FFFF
18
SA143
32K
440000 - 447FFF
•
•
•
•
•
•
•
•
•
18
SA150
32K
478000 - 47FFFF
19
SA151
32K
480000 - 487FFF
•
•
•
•
•
•
•
•
•
19
SA158
32K
4B8000 - 4BFFFF
20
SA159
32K
4C0000 - 4C7FFF
•
•
•
•
•
•
•
•
•
•
•
•
20
SA166
32K
4F8000 - 4FFFFF
21
SA167
32K
500000 - 507FFF
•
•
•
•
•
•
•
•
•
•
•
•
21
SA174
32K
538000 - 53FFFF
22
SA175
32K
540000 - 547FFF
•
•
•
•
•
•
•
•
•
•
•
•
22
SA182
32K
578000 - 57FFFF
23
SA183
32K
580000 - 587FFF
•
•
•
•
•
•
•
•
•
•
•
•
23
SA190
32K
5B8000 - 5BFFFF
24
SA191
32K
5C0000 - 5C7FFF
•
•
•
•
•
•
•
•
•
24
SA198
32K
5F8000 - 5FFFFF
25
SA199
32K
600000 - 607FFF
•
•
•
•
•
•
•
•
•
SA206
32K
638000 - 63FFFF
Plane
17
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
25
24
4M
4M
4M
4M
4M
4M
4M
4M
4M
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
Memory Organization – AT49SN/SV12804 (Continued)
Plane
Size
(Bits)
Sector
Size Words
x16 Address Range (A22 - A0)
SA207
32K
640000 - 647FFF
•
•
•
•
•
•
•
•
•
26
SA214
32K
678000 - 67FFFF
27
SA215
32K
680000 - 687FFF
•
•
•
•
•
•
•
•
•
27
SA222
32K
6B8000 - 6BFFFF
28
SA223
32K
6C0000 - 6C7FFF
•
•
•
•
•
•
•
•
•
28
SA230
32K
6F8000 - 6FFFFF
29
SA231
32K
700000 - 707FFF
•
•
•
•
•
•
•
•
•
•
•
•
29
SA238
32K
738000 - 73FFFF
30
SA239
32K
740000 - 747FFF
•
•
•
•
•
•
•
•
•
•
•
•
30
SA246
32K
778000 - 77FFFF
31
SA247
32K
780000 - 787FFF
•
•
•
•
•
•
•
•
•
•
•
•
SA254
32K
7B8000 - 7BFFFF
SA255
32K
7C0000 - 7C7FFF
SA256
32K
7C8000 - 7CFFFF
•
•
•
•
•
•
•
•
•
SA261
32K
7F0000 - 7F7FFF
SA262
4K
7F8000 - 7F8FFF
Plane
26
•
•
•
•
•
•
•
•
•
4M
4M
4M
4M
4M
4M
31
32
•
•
•
4M
32
SA263
4K
7F9000 - 7F9FFF
SA264
4K
7FA000 - 7FAFFF
SA265
4K
7FB000 - 7FBFFF
SA266
4K
7FC000 - 7FCFFF
SA267
4K
7FD000 - 7FDFFF
SA268
4K
7FE000 - 7FEFFF
SA269
4K
7FF000 - 7FFFFF
25
3314A–FLASH–4/04
DC and AC Operating Range
AT49SN/SV12804-70
Operating Temperature (Case)
Industrial
-40°C - 85°C
VCC Power Supply
1.65V - 1.95V
Operating Modes
Mode
CE
Read
Burst Read
OE
WE
RESET
VPP(4)
Ai
I/O
VIL
VIL
VIH
VIH
X
Ai
DOUT
VIL
VIL
VIH
VIH
X
Ai
DOUT
Ai
DIN
X
High Z
Program/Erase
VIL
VIH
VIL
VIH
VIHPP(5)
Standby/Program
Inhibit
VIH
X(1)
X
VIH
X
X
X
VIH
VIH
X
X
VIL
X
VIH
X
X
X
X
X
VILPP(6)
Output Disable
X
VIH
X
VIH
X
Reset
X
X
X
VIL
X
(3)
Program Inhibit
High Z
X
High Z
A0 = VIL, A1 - A22 = VIL
Manufacturer Code(3)
A0 = VIH, A1 - A22 = VIL
Device Code(3)
Product Identification
Software
Notes:
26
1.
2.
3.
4.
5.
6.
VIH
X can be VIL or VIH.
Refer to AC programming waveforms.
Manufacturer Code: 001FH; Device Code: 00BBH
The VPP pin can be tied to VCC. For faster program/erase operations, VPP can be set to 12.0V ± 0.5V.
VIHPP (min) = 0.9V.
VILPP (max) = 0.4V.
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
DC Characteristics
Symbol
Parameter
Condition
ILI
Input Load Current
ILO
Max
Units
VIN = 0V to VCC
1
µA
Output Leakage Current
VI/O = 0V to VCC
1
µA
ISB1
VCC Standby Current CMOS
CE = VCCQ - 0.3V to VCC
20
µA
ICC(1)
VCC Active Current
f = 66 MHz; IOUT = 0 mA
30
mA
ICCRE
VCC Read While Erase Current
f = 66 MHz; IOUT = 0 mA
50
mA
ICCRW
VCC Read While Write Current
f = 66 MHz; IOUT = 0 mA
50
mA
VIL
Input Low Voltage
0.4
V
VIH
Input High Voltage
VOL
Output Low Voltage
VOH
Output High Voltage
Note:
Min
VCCQ - 0.2
IOL = 100 µA
IOL = 2.1 mA
V
0.1
0.25
IOH = -100 µA
VCCQ - 0.1
IOH = -400 µA
1.4
V
V
1. In the erase mode, ICC is 30 mA.
Input Test Waveforms and Measurement Level
1.4V
AC
DRIVING
LEVELS
0.9V
AC
MEASUREMENT
LEVEL
0.4V
tR, tF < 5 ns
Output Test Load
VCCQ
1.8K
OUTPUT
PIN
1.3K
30 pF
Pin Capacitance
f = 1 MHz, T = 25°C(1)
Typ
Max
Units
Conditions
CIN
4
6
pF
VIN = 0V
COUT
8
12
pF
VOUT = 0V
Note:
1. This parameter is characterized and is not 100% tested.
27
3314A–FLASH–4/04
AC Asynchronous Read Timing Characteristics
Symbol
Parameter
tACC1
Min
Max
Units
Access, AVD To Data Valid
70
ns
tACC2
Access, Address to Data Valid
70
ns
tCE
Access, CE to Data Valid
70
ns
tOE
OE to Data Valid
20
ns
tAHAV
Address Hold from AVD
9
ns
tAVLP
AVD Low Pulse Width
10
ns
tAVHP
AVD High Pulse Width
10
ns
tAAV
Address Valid to AVD
7
ns
tDF
CE, OE High to Data Float
tOH
Output Hold from OE, CE or Address, Whichever Occurred First
tRO
RESET to Output Delay
25
ns
ns
150
ns
AVD Pulsed Asynchronous Read Cycle Waveform(1)(2)
tCE
CE
tDF
I/O0-I/O15
DATA VALID
tACC2
tDF
A2 -A22
tAHAV
tAAV
tACC2
A0 -A1
tAAV
tAVHP
(1)
tAHAV
AVD
tAVLP
tACC1
tOE
OE
tRO
RESET
Notes:
1. After the high-to-low transition on AVD, AVD may remain low as long as the address is stable.
2. CLK may be static high or static low.
Asynchronous Read Cycle Waveform(1)(2)(3)(4)
tRC
ADDRESS VALID
A0 - A22
CE
tCE
tOE
OE
tDF
tOH
tACC2
tRO
RESET
I/O0 - I/O15
Notes:
28
HIGH Z
OUTPUT
VALID
1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change
without impact on tACC.
3. tDF is specified from OE or CE, whichever occurs first (CL = 5 pF).
4. AVD and CLK should be tied low.
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
AC Asynchronous Read Timing Characteristics
Symbol
Parameter
Max
Units
tACC1
Access, AVD To Data Valid
Min
70
ns
tACC2
Access, Address to Data Valid
70
ns
tCE
Access, CE to Data Valid
70
ns
tOE
OE to Data Valid
tAHAV
Address Hold from AVD
9
ns
tAVLP
AVD Low Pulse Width
10
ns
tAVHP
AVD High Pulse Width
10
ns
tAAV
Address Valid to AVD
7
tDF
CE, OE High to Data Float
25
ns
tRO
RESET to Output Delay
150
ns
tPAA
Page Address Access Time
20
ns
20
ns
ns
Page Read Cycle Waveform 1(1)
tCE
CE
tDF
I/O0-I/O15
DATA VALID
tACC2
tDF
A2 -A22
tAHAV
tAAV
tPAA
tACC2
A0 -A1
tAAV
tAVHP
(1)
tAHAV
AVD
tAVLP
tACC1
tOE
OE
tRO
RESET
Note:
1. After the high-to-low transition on AVD, AVD may remain low as long as the page address is stable.
Page Read Cycle Waveform 2(1)
tCE
CE
tDF
I/O0-I/O15
DATA VALID
tACC2
tDF
A2 -A22
tPAA
tACC2
A0 -A1
(1)
AVD
VIL
tOE
OE
tRO
RESET
Note:
1. AVD may remain low as long as the page address is stable.
29
3314A–FLASH–4/04
AC Burst Read Timing Characteristics
Symbol
Parameter
Min
Max
tCLK
CLK Period
15
ns
tCKH
CLK High Time
4
ns
tCKL
CLK Low Time
4
ns
tCKRT
CLK Rise Time
3.5
ns
tCKFT
CLK Fall Time
3.5
ns
tACK
Address Valid to Clock
7
ns
tAVCK
AVD Low to Clock
7
ns
tCECK
CE Low to Clock
7
ns
tCKAV
Clock to AVD High
3
ns
tQHCK
Output Hold from Clock
3
ns
tAHCK
Address Hold from Clock
8
ns
tCKRY
Clock to WAIT Delay
tCESAV
CE Setup to AVD
10
ns
tAAV
Address Valid to AVD
10
ns
tAHAV
Address Hold From AVD
9
ns
tCKQV
CLK to Data Delay
13
ns
tCEQZ
CE High to Output High-Z
10
ns
13
Units
ns
Burst Read Cycle Waveform
tCLK
...
...
...
CLK
tCKH
tCKL
tAHCK
tCECK
CE
tCE
tCESAV
tAVCK
(2)
AVD
tACK
tCKAV
tAAV
I/O0-I/O15
tCKQV
tAHAV
tCEQZ
tQHCK
D13
... D14
D15
D16
D17
A0-A21
OE
tCKRY
WAIT
Notes:
30
tCKRY
(1)
1. The WAIT signal (dashed line) shown is for a burst configuration register setting of B10 and B8 = 0. The WAIT Signal (solid
line) shown is for a burst configuration setting of B10 = 1 and B8 = 0.
2. After the high-to-low transition on AVD, AVD may remain low.
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
Burst Read Waveform (Clock Latency of 3)
B
A
D
C
F
E
G
CLK
CE
AVD
OE
VALID
A0-A21
D13
I/O0-I/O15
WAIT
Note:
(1)
D14
D16
D15
D17
D18
HIGH Z
HIGH Z
1. Dashed line reflects a B10 and B8 setting of 0 in the configuration register. Solid line reflects a B10 setting of 0 and B8
setting of 1 in the configuration register.
Hold Data for 2 Clock Cycles Read Waveform (Clock Latency of 3)
AVD
CLK
CE
OE
A0-A21
I/O0-I/O15
A9
D13
D14
D15
D16
WAIT(1)
Note:
1. Dashed line reflects a burst configuration register setting of B10 and B8 = 0, B9 = 1.
Solid line reflects a burst configuration register setting of B10 = 0, B9 and B8 = 1
31
3314A–FLASH–4/04
Four-word Burst Read Waveform (Clock Latency of 4)
B
A
C
CLK
CE
AVD
OE
VALID
A0-A21
I/O0-I/O15
WAIT
Note:
D0
(1)
D1
D2
D3
HIGH Z
HIGH Z
1. The WAIT signal shown is for a burst configuration register of B10 and B8 = 1.
Burst Suspend Waveform
tCLK
(2)
tCKH
...
CLK
tCKL
tAHCK
tCECK
CE
tCE
tCEAV
tAVCK
AVD
tACK
tCKAV
tAAV
I/O0-I/O15
tCKQV
tAHAV
tCEQZ
tQHCK
D0
D1
D1
D2
A0-A21
tDF
tOE
OE
WAIT (2)
Notes:
32
1. The WAIT signal (dashed line) shown is for a burst configuration register setting of B10 and B8 = 0. The WAIT Signal (solid
line) shown is for a burst configuration setting of B10 = 1 and B8 = 0.
2. During Burst Suspend, CLK signal can be held low or high.
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
AC Word Load Characteristics 1
Symbol
Parameter
Min
Max
Units
tAAV
Address Valid to AVD High
10
ns
tAHAV
Address Hold Time from AVD High
9
ns
tAVLP
AVD Low Pulse Width
10
ns
tDS
Data Setup Time
50
ns
tDH
Data Hold Time
0
ns
tCESAV
CE Setup to AVD
10
ns
tWP
CE or WE Low Pulse Width
35
ns
tWPH
CE or WE High Pulse Width
25
ns
tWEAV
WE High Time to AVD Low
25
ns
tCEAV
CE High Time to AVD Low
25
ns
AC Word Load Waveforms 1
WE Controlled(1)
CE
I/O0-I/O15
DATA VALID
A0 -A22
tAAV
tAHAV
AVD
tDS
tAVLP
tDH
tWEAV
tWP
WE
Note:
1. After the high-to-low transition on AVD, AVD may remain low as long as the CLK input does not toggle.
CE Controlled(1)
WE
I/O0-I/O15
DATA VALID
A0 -A22
tAAV
tAHAV
AVD
tDS
tAVLP
tCESAV
CE
Note:
tWP
tDH
tCEAV
1. After the high-to-low transition on AVD, AVD may remain low as long as the CLK input does not toggle.
33
3314A–FLASH–4/04
AC Word Load Characteristics 2
Symbol
Parameter
Min
Max
Units
tAS
Address Setup Time to WE and CE High
50
ns
tAH
Address Hold Time
0
ns
tDS
Data Setup Time
50
ns
tDH
Data Hold Time
0
ns
tWP
CE or WE Low Pulse Width
35
ns
tWPH
CE or WE High Pulse Width
25
ns
AC Word Load Waveforms 2
WE Controlled(1)
CE
I/O0 - I/O15
DATA VALID
A0 - A22
WE
AVD
Note:
VIL
1. The CLK input should not toggle.
CE Controlled(1)
WE
I/O0 - I/O15
DATA VALID
A0 - A22
CE
AVD
Note:
34
VIL
1. The CLK input should not toggle.
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
Program Cycle Characteristics
Symbol
Parameter
Min
Typ
Max
tBP
Word Programming Time
22
µs
tSEC1
Sector Erase Cycle Time (4K word sectors)
200
ms
tSEC2
Sector Erase Cycle Time (32K word sectors)
700
ms
tES
Erase Suspend Time
15
µs
tPS
Program Suspend Time
10
µs
tERES
Delay between Erase Resume and Erase Suspend
500
Units
µs
Program Cycle Waveforms
PROGRAM CYCLE
OE
CE
tBP
tWP
WE
tWPH
tDH
tAS
tAH
(1)
A0 - A22
ADDRESS
XX
tWC
I/O0 - I/O15
tDS
INPUT DATA
Note 3
VIL
AVD
Sector, Plane or Chip Erase Cycle Waveforms
OE
(2)
CE
tWP
tWPH
WE
tDH
tAS
A0 - A22
tAH
(1)
XX
Note 4
tWC
I/O0 - I/O15
AVD
Notes:
tDS
tSEC1/2
Note 5
D0
WORD 0
WORD 1
VIL
1.
2.
3.
4.
Any address can be used to load data.
OE must be high only when WE and CE are both low.
The data can be 40H or 10H.
For chip erase, any address can be used. For plane erase or sector erase, the address depends on what plane or sector is
to be erased.
5. For chip erase, the data should be 21H, for plane erase, the data should be 22H, and for sector erase, the data should
be 20H.
35
3314A–FLASH–4/04
Table 6. Common Flash Interface Definition for AT49SN/SV12804
36
Address
AT49SN/SV12804
Comments
10h
0051h
“Q”
11h
0052h
“R”
12h
0059h
“Y”
13h
0003h
14h
0000h
15h
0041h
16h
0000h
17h
0000h
18h
0000h
19h
0000h
1Ah
0000h
1Bh
0016h
VCC min write/erase
1Ch
0019h
VCC max write/erase
1Dh
00B5h
VPP min voltage
1Eh
00C5h
VPP max voltage
1Fh
0004h
Typ word write – 16 µs
20h
0000h
21h
0009h
Typ block erase – 500 ms
22h
0011h
Typ chip erase – 131,000 ms
23h
0004h
Max word write/typ time
24h
0000h
n/a
25h
0003h
Max block erase/typ block erase
26h
0003h
Max chip erase/ typ chip erase
27h
0018h
Device size
28h
0001h
x16 device
29h
0000h
x16 device
2Ah
0000h
Multiple byte write not supported
2Bh
0000h
Multiple byte write not supported
2Ch
0003h
3 regions, x = 3
2Dh
00FDh
64K bytes, Y = 253
2Eh
0000h
64K bytes, Y = 253
2Fh
0000h
64K bytes, Z = 256
30h
0001h
64K bytes, Z = 256
31h
0007h
8K bytes, Y = 7
32h
0000h
8K bytes, Y = 7
33h
0020h
8K bytes, Z = 32
34h
0000h
8K bytes, Z = 32
35h
0007h
8K bytes, Y = 7
36h
0000h
8K bytes, Y = 7
37h
0020h
8K bytes, Z = 32
38h
0000h
8K bytes, Z = 32
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
Table 6. Common Flash Interface Definition for AT49SN/SV12804 (Continued)
Address
AT49SN/SV12804
Comments
VENDOR SPECIFIC EXTENDED QUERY
41h
0050h
“P”
42h
0052h
“R”
43h
0049h
“I”
44h
0031h
Major version number, ASCII
45h
0030h
Minor version number, ASCII
46h
00BFh
Bit 0 – chip erase supported, 0 – no, 1 – yes
Bit 1 – erase suspend supported, 0 – no, 1 – yes
Bit 2 – program suspend supported, 0 – no, 1 – yes
Bit 3 – simultaneous operations supported, 0 – no, 1 – yes
Bit 4 – burst mode read supported, 0 – no, 1 – yes
Bit 5 – page mode read supported, 0 – no, 1 – yes
Bit 6 – queued erase supported, 0 – no, 1 – yes
Bit 7 – protection bits supported, 0 – no, 1 – yes
0002h
Bit 8 – top (“0”), bottom (“1”), or both top and bottom (“2”) boot block
device
Undefined bits are “0”
48h
000Fh
Bit 0 – 4 word linear burst with wrap around, 0 – no, 1 – yes
Bit 1 – 8 word linear burst with wrap around, 0 – no, 1 – yes
Bit 2 – 16 word linear burst with wrap around, 0 – no, 1 – yes
Bit 3 – continuos burst, 0 – no, 1 – yes
Undefined bits are “0”
49h
0003h
Bit 0 – 4 word page, 0 – no, 1 – yes
Bit 1 – 8 word page, 0 – no, 1 – yes
Undefined bits are “0”
4Ah
0080h
Location of protection register lock byte, the section’s first byte
4Bh
0003h
# of bytes in the factory prog section of prot register – 2*n
4Ch
0007h
# of bytes in the user prog section of prot register – 2*n – 132
4Dh
0020h
Number of planes – 32 planes
47h
37
3314A–FLASH–4/04
AT49SN/SV12804 Ordering Information
ICC (mA)
tACC
(ns)
Active
Standby
Ordering Code
Package
Operation Range
70
30
0.01
AT49SN12804-70CI
56C3
Industrial
(-40° to 85°C)
70
30
0.01
AT49SV12804-70TI
56T
Industrial
(-40° to 85°C)
Package Type
56C3
56-ball, Plastic Chip-size Ball Grid Array Package (CBGA)
56T
56-lead, Plastic Thin Small Outline Package (TSOP)
38
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
AT49SN/SV12804 [Preliminary]
Packaging Information
56C3 – CBGA
D
0.12 C
C Seating Plane
E
Side View
A1
Top View
A
D1
1.375 mm Ref
8 7
6
5
4
3
2 1
A
B
C
E1
D
COMMON DIMENSIONS
(Unit of Measure = mm)
E
F
G
e
2.75 mm Ref
e
Øb
SYMBOL
MIN
NOM
MAX
A
–
–
1.00
A1
0.21
–
–
D
7.90
8.00
8.10
D1
Bottom View
E
NOTE
5.25 TYP
9.90
10.00
E1
4.50 TYP
e
0.75 TYP
Øb
0.35 TYP
10.10
1/9/04
R
2325 Orchard Parkway
San Jose, CA 95131
TITLE
56C3, 56-ball (8 x 7 Array), 8 x 10 x 1.0 mm Body, 0.75 mm Ball Pitch
Ceramic Ball Grid Array Package (CBGA)
DRAWING NO.
56C3
REV.
A
39
3314A–FLASH–4/04
56T – TSOP
PIN 1
0º ~ 8º
c
Pin 1 Identifier
D1 D
L
b
e
L1
A2
E
A
GAGE PLANE
SEATING PLANE
COMMON DIMENSIONS
(Unit of Measure = mm)
A1
MIN
NOM
MAX
A
–
–
1.20
A1
0.05
–
0.15
A2
0.95
1.00
1.05
D
19.80
20.00
20.20
D1
18.20
18.40
18.60
Note 2
E
13.80
14.00
14.20
Note 2
L
0.50
0.60
0.70
SYMBOL
Notes:
1. This package conforms to JEDEC reference MO-142, Variation EC.
2. Dimensions D1 and E do not include mold protrusion. Allowable
protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.
3. Lead coplanarity is 0.10 mm maximum.
L1
0.25 BASIC
b
0.10
0.15
0.20
c
0.10
–
0.21
e
NOTE
0.50 BASIC
10/23/03
R
40
2325 Orchard Parkway
San Jose, CA 95131
TITLE
56T, 56-lead (14 x 20 mm Package) Plastic Thin Small Outline
Package, Type I (TSOP)
DRAWING NO.
REV.
56T
C
AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04
Atmel Corporation
2325 Orchard Parkway
San Jose, CA 95131, USA
Tel: 1(408) 441-0311
Fax: 1(408) 487-2600
Regional Headquarters
Europe
Atmel Sarl
Route des Arsenaux 41
Case Postale 80
CH-1705 Fribourg
Switzerland
Tel: (41) 26-426-5555
Fax: (41) 26-426-5500
Asia
Room 1219
Chinachem Golden Plaza
77 Mody Road Tsimshatsui
East Kowloon
Hong Kong
Tel: (852) 2721-9778
Fax: (852) 2722-1369
Japan
9F, Tonetsu Shinkawa Bldg.
1-24-8 Shinkawa
Chuo-ku, Tokyo 104-0033
Japan
Tel: (81) 3-3523-3551
Fax: (81) 3-3523-7581
Atmel Operations
Memory
2325 Orchard Parkway
San Jose, CA 95131, USA
Tel: 1(408) 441-0311
Fax: 1(408) 436-4314
RF/Automotive
Theresienstrasse 2
Postfach 3535
74025 Heilbronn, Germany
Tel: (49) 71-31-67-0
Fax: (49) 71-31-67-2340
Microcontrollers
2325 Orchard Parkway
San Jose, CA 95131, USA
Tel: 1(408) 441-0311
Fax: 1(408) 436-4314
La Chantrerie
BP 70602
44306 Nantes Cedex 3, France
Tel: (33) 2-40-18-18-18
Fax: (33) 2-40-18-19-60
ASIC/ASSP/Smart Cards
1150 East Cheyenne Mtn. Blvd.
Colorado Springs, CO 80906, USA
Tel: 1(719) 576-3300
Fax: 1(719) 540-1759
Biometrics/Imaging/Hi-Rel MPU/
High Speed Converters/RF Datacom
Avenue de Rochepleine
BP 123
38521 Saint-Egreve Cedex, France
Tel: (33) 4-76-58-30-00
Fax: (33) 4-76-58-34-80
Zone Industrielle
13106 Rousset Cedex, France
Tel: (33) 4-42-53-60-00
Fax: (33) 4-42-53-60-01
1150 East Cheyenne Mtn. Blvd.
Colorado Springs, CO 80906, USA
Tel: 1(719) 576-3300
Fax: 1(719) 540-1759
Scottish Enterprise Technology Park
Maxwell Building
East Kilbride G75 0QR, Scotland
Tel: (44) 1355-803-000
Fax: (44) 1355-242-743
Literature Requests
www.atmel.com/literature
Disclaimer: Atmel Corporation makes no warranty for the use of its products, other than those expressly contained in the Company’s standard
warranty which is detailed in Atmel’s Terms and Conditions located on the Company’s web site. The Company assumes no responsibility for any
errors which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without notice, and
does not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Atmel are
granted by the Company in connection with the sale of Atmel products, expressly or by implication. Atmel’s products are not authorized for use
as critical components in life support devices or systems.
© Atmel Corporation 2004. All rights reserved. Atmel ® and combinations thereof are the registered trademarks of Atmel Corporation or its
subsidiaries. Other terms and product names may be the trademarks of others.
Printed on recycled paper.
3314A–FLASH–4/04
xM