Features • PWM and Direction-controlled Driving of Four Externally-powered NMOS Transistors • A Programmable Dead Time Is Included to Avoid Peak Currents Within the H-bridge • Integrated Charge Pump to Provide Gate Voltages for High-side Drivers and to Supply the Gate of the External Battery Reverse Protection NMOS • 5V/3.3V Regulator and Current Limitation Function • Reset Derived From 5V/3.3V Regulator Output Voltage • Sleep Mode With Supply Current of Typically < 45 µA, Wake-up by Signal on Pins EN2 • • • • • • or on LIN Interface A Programmable Window Watchdog Battery Overvoltage Protection and Battery Undervoltage Management Overtemperature Warning and Protection (Shutdown) LIN 2.1 Compliant 3.3V/5V Regulator with Trimmed Band Gap QFN32 Package H-bridge Motor Driver ATA6823 1. Description The ATA6823 is designed for several body and powertrain applications. The IC is used to drive a continuous current motor in a full H-bridge configuration. An external microcontroller controls the driving function of the IC by providing a PWM signal and a direction signal and allows the use of the IC in a motor-control application. The PWM control is performed by the low-side switch; the high-side switch is permanently on in the driving phase. The VMODE configuration pin can be set to 5V or 3.3V mode (for regulator and interface high level). The window watchdog has a programmable time, programmable by choosing a certain value of the external watchdog resistor RWD, internally trimmed to an accuracy of 10%. For communication a LIN transceiver 2.1 is integrated. 4856H–AUTO–07/09 Figure 1-1. Block Diagram M CP VRES RGATE RGATE H2 H1 S1 S2 RGATE RGATE L1 L2 PGND CPLO GND Charge Pump HS Driver 2 HS Driver 1 LS Driver 1 LS Driver 2 VBAT CPIH DG3 OT UV 12V Regulator VG VBAT PBAT OV OTP 12 bit CC CC timer Oscillator CP DG2 DG1 Logic Control Vint 5V Regulator VINT Supervisor WD timer VBAT EN2 VBG VBATSW VCC 5V Regulator LIN LIN Bandgap VCC WD EN1 VCC /RESET DIR PWM RX TX Microcontroller Battery 2 VMODE ATA6823 4856H–AUTO–07/09 ATA6823 2. Pin Configuration Pinning QFN32 EN2 VBATSW VBAT VCC PGND L1 L2 PBAT Figure 2-1. 1 2 3 4 5 6 7 8 32 31 30 29 28 27 26 25 24 23 22 Atmel YWW 21 ATA6823 20 ZZZZZ-AL 19 18 17 9 10 11 12 13 14 15 16 VG CPLO CPHI VRES H2 S2 H1 S1 TX DIR PWM EN1 RX DG3 DG2 DG1 VMODE VINT RWD CC /RESET WD GND LIN Note: Table 2-1. YWW ATA6823 ZZZZZ AL Date code (Y = Year - above 2000, WW = week number) Product name Wafer lot number Assembly sub-lot number Pin Description Pin Symbol I/O Function 1 VMODE I 2 VINT I/O 3 RWD I 4 CC I/O RC combination to adjust cross conduction time 5 /RESET O Reset signal for microcontroller 6 WD I Watchdog trigger signal 7 GND I 8 LIN I/O 9 TX I Transmit signal to LIN bus from microcontroller 10 DIR I Defines the rotation direction for the motor 11 PWM I PWM input controls motor speed 12 EN1 I Microcontroller output to keep the chip in Active mode 13 RX O Receive signal from LIN bus for microcontroller 14 DG3 O Diagnostic output 3 15 DG2 O Diagnostic output 2 16 DG1 O Diagnostic output 1 17 S1 I/O Source voltage H-bridge, high-side 1 18 H1 O Gate voltage H-bridge, high-side 1 19 S2 I/O Source voltage H-bridge, high-side 2 20 H2 O Gate voltage H-bridge, high-side 2 21 VRES I/O Gate voltage for reverse protection NMOS, blocking capacitor 470 nF/25V/X7R Selector for VCC and interface logic voltage level Blocking capacitor 220 nF/10V/X7R Resistor defining the watchdog interval Ground for chip core LIN-bus terminal 3 4856H–AUTO–07/09 Table 2-1. 4 Pin Description (Continued) Pin Symbol I/O Function 22 CPHI I 23 CPLO O 24 VG I/O 25 PBAT I Power supply (after reverse protection) for charge pump and H-bridge 26 L2 O Gate voltage H-bridge, low-side 2 27 L1 O Gate voltage H-bridge, low-side 1 28 PGND I Power ground for H-bridge and charge pump 29 VCC O 5V/100 mA supply for microcontroller, blocking capacitor 2.2 µF/10V/X7R 30 VBAT I Supply voltage for IC core (after reverse protection) 31 VBATSW O 100Ω PMOS switch from VVBAT 32 EN2 I Enable input Charge pump capacitor 220 nF/25V/X7R Blocking capacitor 470 nF/25V/X7R ATA6823 4856H–AUTO–07/09 ATA6823 3. Functional Description 3.1 3.1.1 Power Supply Unit with Supervisor Functions Power Supply The IC is supplied by a reverse-protected battery voltage. To prevent it from destruction, proper external protection circuitry has to be added. It is recommended to use at least a capacitor combination of storage and HF caps behind the reverse protection circuitry and closed to the VBAT pin of the IC (see Figure 1-1 on page 2). A fully-internal low-power and low-drop regulator, stabilized by an external blocking capacitor provides the necessary low-voltage supply needed for the wake-up process. The low-power band gap reference is trimmed and is used for the bigger VCC regulator, too. All internal blocks are supplied by the internal regulator. Note: The internal supply voltage VINT must not be used for any other supply purpose! Nothing inside the IC except the logic interface to the microcontroller is supplied by the 5V/3.3V VCC regulator. A power-good comparator checks the output voltage of the VINT regulator and keeps the whole chip in reset as long as the voltage is too low. There is a high-voltage switch which brings out the battery voltage to the pin VBATSW for measurement purposes. This switch is switched ON for VCC = HIGH and stays ON in case of a watchdog reset going to sleep mode, VBATSW turns OFF. The signal can be used to switch on external voltage regulators, etc. 3.1.2 Voltage Supervisor This block is intended to protect the IC and the external power MOS transistors against overvoltage on battery level and to manage undervoltage on it. Function: in case of both overvoltage alarm (VTHOV) and of undervoltage alarm (VTHUV) the external NMOS motor bridge transistors will be switched off. The failure state will be flagged via DG2. No other actions will be carried out. The voltage supervision block is connected to VBAT and filtered by a first-order low pass with a corner frequency of typical 15 kHz. 3.1.3 Temperature Supervisor There is a temperature sensor integrated on-chip to prevent the IC from overheating due to a failure in the external circuitry and to protect the external NMOSFET transistors. In case of detected overtemperature (150°C), the diagnostic pin DG3 will be switched to “H” to signalize this event to the microcontroller. It should undertake actions to reduce the power dissipation in the IC. In case of detected overtemperature (165°C), the VCC regulator and all drivers including the LIN transceiver will be switched OFF immediately and /RESET will go LOW. Both temperature thresholds are correlated. The absolute tolerance is ±10°C and there is a built-in hysteresis of about 10°C to avoid fast oscillations. After cooling down below the 155°C threshold; the IC will go into Active mode. The LIN interface has a separate thermal shutdown with disabled the low-side driver at typically 165°C. 5 4856H–AUTO–07/09 3.2 Sleep Mode To be able to guarantee the low quiescent current of the inactive IC, a Sleep mode is established. In Sleep mode it is possible to wake-up the IC by using the pins EN2 or LIN. In Sleep mode, the following blocks are active: • Band gap • Internal 5V regulator (VINT) with external blocking capacitor of 220 nF • Input structure for detecting the EN2 pins threshold • Wake-up block of the LIN receive part 3.3 Wake-up and Sleep Mode Strategy The IC has two modes: Sleep and Active. The change between the modes is described below. The default state after power-on is Active mode. The wake-up procedure brings the IC from a standby mode (Sleep) to an active mode (Active). The internal 5V supply VINT, the EN2 pin input structure and a certain part of the LIN receiver are permanently active to ensure a proper startup of the system. The Go to Active and Go to Sleep procedures are implemented as follows: • Go to Active by activating pin EN2 The input EN2 is intended as a switch-on pin from an external signal. Its input structure consists of a comparator with built-in hysteresis. It is ESD-protected by diodes against GND and VVBAT; for this reason the input voltage level must be positive and not higher than VVBAT. Pulling the EN2 pin up to the VVBAT level will drive the IC into Active mode. EN2 is debounced with a time constant of 20 µs, based on a 100 kHz clock. • Go to Active using the LIN interface The second possibility for wake-up can be performed using the LIN transceiver. In Sleep mode, the LIN receiver is partially active. The wake-up by LIN requires 2 steps: 1. If the voltage on pin LIN is below a value of V/DATwake (about VVBAT – 2V) the receive part of the LIN interface is active (not to be confused with Active mode of the whole IC). The active receive part is able to detect a valid LOW on the LIN pin. 2. If LIN = LOW during a filter time twakeLIN (typically 70 µs) the IC will change to Active mode. A short change back to HIGH during the filter time will reset the filter. This information is stored in a latch after entering Active mode If the change to Active mode was caused by LIN, the EN1 or EN2 pins may remain LOW without disturbing the Active mode. • Stay in Active via EN1 The input EN1 is intended to keep the IC in Active Mode via a signal from the microcontroller. The input is ESD-protected by diodes against GND and VCC. Therefore, the input voltage must be positive and not higher than VCC. EN1 cannot be used to switch from Sleep to Active because the VCC regulator is off in the Sleep mode and VCC will be zero. • Go to Sleep A HIGH to LOW transition at pin EN1 and a following permanent LOW for the time t gotosleep (typically 20 µs) switches the IC to Sleep mode. 6 ATA6823 4856H–AUTO–07/09 ATA6823 Figure 3-1 illustrates the wake-up by LIN. The status PREWAKE is characterized by the activated receive block of the LIN interface. After going to Active mode, the VCC regulator starts working. Go to Sleep is possible with a valid HIGH to LOW transition at pin EN1 (permanent LOW for longer than tdb) if EN1 was in a valid HIGH state (HIGH for longer than tdb) before. Figure 3-1. Wake-up by pin LIN Active Mode Sleep Mode Active Mode EN1 VCC LIN Tgotosleep = 20 µs 3.4 Twakelin = 70 µs Regulator Wake-up Time 5V/3.3V VCC Regulator The 5V/3.3V regulator is fully integrated on-chip. It requires only a 2.2 µF ceramic capacitor for stability and has 100 mA current capability. Using the VMODE pin, the output voltage can be selected to either 5V or 3.3V. Switching of the output voltage during operation is not intended to be supported. The VMODE pin must be hard-wired to either VINT for 5V or to GND for 3.3V. The logic HIGH level of the microcontroller interface will be adapted to the VCC regulator voltage. The output voltage accuracy is in general < ±3%; in the 5V mode with VVBAT < 9V it is limited to < 5%. To prevent destruction of the IC, the current delivered by the regulator is limited to maximum 100 mA to 350 mA. The delivered voltage will break down and a reset may occur. Please note that this regulator is the main heat source on the chip. The maximum output current at maximum battery voltage and high ambient temperature can only guaranteed if the IC is mounted on an efficient heat sink. A power-good comparator checks the output voltage of the VCC regulator and keeps the external microcontroller in reset as long as the voltage is too low. 7 4856H–AUTO–07/09 Figure 3-2. Correlation between VCC Output Voltage and Reset Threshold 5.15V 4.9V VCC1 4.85V VtHRESH 4.1V VCC1-VtHRESH = VCC1 - VtHRESH The voltage difference between the regulated output voltage and the upper reset threshold voltage is higher than 75 mV (VMODE = HIGH) and higher than 50 mV (VMODE = LOW). 3.5 Reset and Watchdog Management The timing basis of the watchdog is provided by the trimmed internal oscillator. Its period TOSC is adjustable via the external resistor RWD. The watchdog expects a triggering signal (a rising edge) from the microcontroller at the WD input within a period time window of TWD. In order to save current consumption, the watchdog is switched off during Sleep mode. Figure 3-3. Timing Diagram of the Watchdog Function tresshort tres /RESET td td t1 t2 t1 t2 WD 3.5.1 Timing Sequence For example, with an external resistor RWD = 33 kΩ ±1% we get the following typical parameters of the watchdog. TOSC = 12.32 µs, t1 = 12.1 ms, t2 = 9.61 ms, TWD = 16.88 ms ±10% The times tres = 68 ms and td = 68 ms are fixed values with a tolerance of 10%. 8 ATA6823 4856H–AUTO–07/09 ATA6823 After ramp-up of the battery voltage (power-on reset), the VCC regulator is switched on. The reset output, /RESET, stays low for the time tres (typically 68 ms), then switches to high. For an initial lead time td (typically 68 ms for setups in the controller) the watchdog waits for a rising edge on WD to start its normal window watchdog sequence. If no rising edge is detected, the watchdog will reset the microcontroller for tres and wait td for the rising edge on WD. Times t1 (close window) and t2 (open window) form the window watchdog sequence. To avoid receiving a reset from the watchdog, the triggering signal from the microcontroller must hit the time frame of t2 = 9.61 ms. The trigger event will restart the watchdog sequence. Figure 3-4. TWD versus RWD 60 50 typ TWD (ms) max 40 30 min 20 10 0 10 20 30 40 50 60 70 80 90 100 RWD (kΩ) If triggering fails, /RESET will be pulled to ground for a shortened reset time of typically 2 ms. The watchdog start sequence is similar to the power-on reset. The internal oscillator is trimmed to a tolerance of < ±10%. This means that t1 and t2 can also vary by ±10%. The following calculation shows the worst case calculation of the watchdog period Twd which the microcontroller has to provide. t1min = 0.90 × t1 = 10.87 ms, t1max = 1.10 × t1 = 13.28 ms t2min = 0.90 × t2 = 8.65ms, t2max = 1.10 × t2 = 10.57 ms Twdmax = t1min + t2min = 10.87 ms + 8.65 ms = 19.52 ms Twdmin = t1max = 13.28 ms Twd = 16.42 ms ±3.15 ms (±19.1%) Figure 3-4 above shows the typical watchdog period TWD depending on the value of the external resistor ROSC. A reset will be active for VCC < VtHRESx; the level VtHRESx is realized with a hysteresis (HYSRESth). 9 4856H–AUTO–07/09 3.6 LIN Transceiver A bi-directional bus interface is implemented for data transfer between the LIN bus and the local LIN protocol controller. The transceiver consists of a low side driver (1.2V at 40 mA) with slew rate control, wave shaping, current limitation, and a high-voltage comparator followed by a debouncing unit in the receiver. 3.6.1 Transmit Mode During transmission, the data at the pin TX will be transferred to the bus driver to generate a bus signal on pin LIN. To minimize the electromagnetic emission of the bus line, the bus driver has an integrated slew rate control and wave-shaping unit. Transmission will be interrupted in the following cases: • Thermal shutdown active or overtemperature LIN active • Sleep mode Figure 3-5. Definition of Bus Timing Parameters tBit tBit tBit TX (input to transmitting Node) tBus_dom(max) tBus_rec(min) Thresholds of receiving node 1 THRec(max) VS (Transceiver supply of transmitting node) THDom(max) LIN Bus Signal Thresholds of receiving node 2 THRec(min) THDom(min) tBus_dom(min) tBus_rec(max) RX (output of receiving Node 1) trx_pdf(1) trx_pdr(1) RX (output of receiving Node 2) trx_pdr(2) 10 trx_pdf(2) ATA6823 4856H–AUTO–07/09 ATA6823 The recessive BUS level is generated from the integrated 30 kΩ pull-up resistor in series with an active diode. This diode prevents the reverse current of VBUS during differential voltage between VSUP and BUS (VBUS > VSUP). No additional termination resistor is necessary to use the ATA6823 in LIN slave nodes. If this IC is used for LIN master nodes, it is necessary that the BUS pin be terminated via an external 1 kΩ resistor in series with a diode to VBAT. 3.6.2 3.7 3.7.1 TXD Dominant Time-out Function The TXD input has an internal pull-down resistor. An internal timer prevents the bus line from being driven permanently in dominant state. If TXD is forced low longer than tdom > 18.4 ms, the pin LIN will be switched off to recessive mode. To reset this mode switch TXD to high (> 10 µs) before switching LIN to dominant again. Control Inputs EN1, EN2, DIR, PWM Pins EN1, EN2 Any of the enable pins may be used to activate the IC with a HIGH. EN1 is a low level input, EN2 can withstand a voltage up to 40V. Internal pull-down resistors are included. 3.7.2 Pin DIR Logical input to control the direction of the external motor to be controlled by the IC. An internal pull-down resistor is included. 3.7.3 Pin PWM Logical input for PWM information delivered by external microcontroller. Duty cycle and frequency at this pin are passed through to the H-bridge. An internal pull-down resistor is included. Table 3-1. Status of the IC Depending on Control Inputs and Detected Failures Control Inputs Driver Stage for External Power MOS Comments ON DIR PWM H1 L1 H2 L2 0 X X OFF OFF OFF OFF Standby mode 1 0 PWM ON OFF /PWM PWM Motor PWM forward 1 1 PWM /PWM PWM ON OFF Motor PWM reverse The internal signal ON is high when • At least one valid trigger has been accepted (SYNC = 1) • VVBAT is inside the specified range (UV = 0 and nOV = 1) • The charge pump has reached its minimum voltage (CPOK = 1) and • The device is not overheated (OT2 = 0) In case of a short circuit, the appropriate transistor is switched off after a debounce time of about 10 µs. In order to avoid cross current through the bridge, a cross conduction timer is implemented. Its time constant is programmable by means of an RC combination. 11 4856H–AUTO–07/09 Table 3-2. Status of the Diagnostic Outputs Device Status Diagnostic Outputs Comments CPOK OT1 OV UV SC DG1 DG2 DG3 0 X X X X – 1 – Charge pump failure X 1 X X X – – 1 Overtemperature warning X X 1 X X – 1 – Overvoltage X X X 1 X – 1 – Undervoltage X X X 1 1 X represents: don't care – no effect) OT1: Overtemperature warning OV: Overvoltage of VBAT UV: Undervoltage of VBAT SC: Short circuit CPOK: Charge pump OK – – Short circuit X Note: In order to be able to distinguish between a wake-up from LIN or from EN2, the source of wake-up is flagged in DG1 until the first valid trigger (LIN = 0, EN2 = 1). 3.8 VG Regulator The VG regulator is used to generate the gate voltage for the low-side driver. Its output voltage will be used as one input for the charge pump, which generates the gate voltage for the high-side driver. The purpose of the regulator is to limit the gate voltage for the external power MOS transistors to 12V. It needs a ceramic capacitor of 470 nF for stability. The output voltage is reduced if the supply voltage at VBAT falls below 12V. 3.9 Charge Pump The integrated charge pump is needed to supply the gates of the external power MOS transistors. It needs a shuffle capacitor of 220 nF and a reservoir capacitor of 470 nF. Without load, the output voltage on the reservoir capacitor is VVBAT plus VG. The charge pump is clocked with a dedicated internal oscillator of 100 KHz. The charge pump is designed to reach a good EMC level. 3.10 Thermal Shutdown There is a thermal shutdown block implemented. With rising junction temperature, a first warning level will be reached at 150°C. At this point the IC stays fully functional and a warning will be sent to the microcontroller. At junction temperature 165°C the VCC regulator will be switched off and a reset occurs. 3.11 H-bridge Driver The IC includes two push-pull drivers for control of two external power NMOS used as high-side drivers and two push-pull drivers for control of two external power NMOS used as low-side drivers. The drivers are able to be used with standard and logic-level power NMOS. The drivers for the high-side control use the charge pump voltage to supply the gates with a voltage of VG above the battery voltage level. The low-side drivers are supplied by VG directly. It is possible to control the external load (motor) in the forward and reverse direction (see Table 3-1 on page 11). The duty cycle of the PMW controls the speed. A duty cycle of 100% is possible in both directions. 12 ATA6823 4856H–AUTO–07/09 ATA6823 3.11.1 Cross Conduction Time To prevent high peak currents in the H-bridge, a non-overlapping phase for switching the external power NMOS is realized. An external RC combination defines the cross conduction time in the following way: tCC (µs) = 0.41 × RCC (kΩ) × CCC (nF) (tolerance: ±5% ±0.15 µs) The RC combination is charged to 5V and the switching level of the internal comparator is 67% of the start level. The resistor RCC must be greater than 5 kΩ and should be as close as possible to 10 kΩ, the CCC value has to be ≤ 5 nF. Use of COG capacitor material is recommended. The time measurement is triggered by the PWM or DIR signal crossing the 50% level. Figure 3-6. Timing of the Drivers PWM or DIR 50% t tLxHL tLxf tLxLH tLxr 80% tCC Lx 20% t tHxLH tCC tHxr tHxHL tHxf 80% Hx 20% t The delays tHxLH and tLxLH include the cross conduction time tCC. 13 4856H–AUTO–07/09 3.12 Short Circuit Detection To detect a short in H-bridge circuitry, internal comparators detect the voltage difference between source and drain of the external power NMOS. If the transistors are switched ON and the source-drain voltage difference is higher than the value VSC (4V with tolerances) for a time > tSC (typically 10 µs) the signal SC (short circuit) will be set and the drivers will be switched off immediately. The diagnostic pin DG1 will be set to “H”. With the next transition on pin PWM, the bit will be cleared and the corresponding drivers, depending on the DIR pin, will be switched on again. There is a PBAT supervision block implemented to detect the possible voltage drop on PBAT during a short circuit. If the voltage at PBAT falls under VSCPB (5.6V with tolerances) for a time > tSC the drivers will be switched off immediately and DG1 will be set to “H”. It will be cleared as above. 14 ATA6823 4856H–AUTO–07/09 ATA6823 4. Absolute Maximum Ratings Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Pin Description Pin Name Min. Max. Unit Ground GND 0 0 V Power ground PGND –0.3 +0.3 V Reverse protected battery voltage VBAT –0.3 +40 V Reverse protected battery voltage PBAT –0.3 +40 V V Digital output /RESET –0.3 VVCC + 0.3 V Digital output DG1, DG2, DG3 –0.3 VVCC + 0.3 4.9V output, external blocking capacitor VINT –0.3 +5.5 V Cross conduction time capacitor/resistor CC –0.3 VVINT + 0.3 V combination Digital input coming from microcontroller WD –0.3 VVINT + 0.3 V V Watchdog timing resistor RWD –0.3 VVCC + 0.3 Digital input direction control DIR –0.3 VVCC + 0.3 V V Digital input PWM control + Test mode PWM –0.3 VVCC + 0.3 + 0.3 V Digital input for enable control EN1 –0.3 VVCC Digital input for enable control EN2 –0.3 VVBAT + 0.3 V 5V regulator output VCC –0.3 +5.5 V V Digital input VMODE –0.3 VVINT + 0.3 12V output, external blocking capacitor VG –0.3 +16 V V Digital output RX –0.3 VVCC + 0.3 V Digital input TX –0.3 VVCC + 0.3 VVBAT + 2 V LIN data pin LIN –27(1) Source external high-side NMOS S1, S2 –2 +40(3) V VVG + 0.3 V Gates external low-side NMOS L1, L2 VPGND – 0.3 VSx + 16(2) V Gates of external high-side NMOS H1, H2 VSx – 1(2) Charge pump CPLO –0.3 VPBAT + 0.3 V V Charge pump CPHI –0.3 VVRES + 0.3 (4) V Charge pump output VRES –0.3 +40 V Switched VBAT VBATSW –0.3 VVBAT + 0.3 –40 +150 °C Storage temperature ϑ STORE Notes: 1. For VVBAT ≤ 13.5V 2. x = 1.2 3. t < 0.5s 4. Load dump of t < 0.5s tolerated 5. Thermal Resistance Parameters Symbol Value Unit Thermal resistance junction to heat slug Rthjc <5 K/W Thermal resistance junction to ambient when heat slug is soldered to PCB(1) Rthja 29 K/W Note: 1. Thermal resistance junction ambient: 29 K/W (at airflow of 0 LFPM), valid for JEDEC Standard 4-layer Thermal test board with 5 x 5 thermal via matrix (100 µm drill hole, filled vias). 15 4856H–AUTO–07/09 6. Operating Range The operating conditions define the limits for functional operation and parametric characteristics of the device. Functionality outside these limits is not implied unless otherwise stated explicitly. Parameters Symbol Min. Max. Unit Operating supply voltage (1) VVBAT1 VTHUV VTHOV V Operating supply voltage (2) VVBAT2 6 VTHUV V Operating supply voltage (3) VVBAT3 3 <6 V Operating supply voltage (4) VVBAT4 0 <3 V Operating supply voltage (5) VVBAT5 > VTHOV 40 V Operating supply voltage (6) VVBAT6 7 18 V Normal functionality Tj –40 +150 °C Normal functionality, overtemperature warning Tj 150 165 °C Drivers for H1, H2, L1, L2, and LIN are switched OFF, VCC regulator is OFF Tj 165 180 °C Note: 1. Full functionality 2. H-bridge drivers are switched off (undervoltage detection) 3. H-bridge drivers are switched off, 5V/3.3V regulator with reduced parameters, RESET works correctly 4. H-bridge drivers are switched off, 5V regulator not working, RESET not correct 5. H-bridge drivers are switched off 6. Full LIN functionality in conformance with LIN specification 2.1 7. Noise and Surge Immunity, ESD and Latch-up Parameters Standard and Test Conditions Conducted interferences ISO 7637-1 Conducted disturbances CISP25 ESD according to IBEE LIN EMC - Pins LIN, PBAT, VBAT - Pin EN2 (33 kΩ serial resistor) Test specification 1.0 following IEC 61000-4-2 Value Level 4(1) Level 5 ±6 kV ±5 kV ESD HBM with 1.5 kΩ/100 pF ESD- STM5.1-2001 JESD22-A114E 2007 CEI/IEC 60749-26: 2006 AEC-Q100-002-Ref_D ±4 kV ESD HBM with 1.5 kΩ/100 pF Pins EN2, LIN, PBAT, VBAT against GND ESD- STM5.1-2001 JESD22-A114E 2007 CEI/IEC 60749-26: 2006 AEC-Q100-002-Ref_D ±8 kV ESD CDM (field induced method) ESD STM5.3.1 - 1999 ±1 kV Note: 1. Test pulse 5: Vbat max = 40V Static latch-up tested according to AEC-Q100-004 and JESD78. • 3 to 6 samples, 0 failures • Electrical post stress testing at room temperature In test, the voltage at the pins VBAT, LIN, CP, VBATSW, Hx, and Sx must not exceed 45V when not able to drive the specified current. 16 ATA6823 4856H–AUTO–07/09 ATA6823 8. Electrical Characteristics All parameters given are valid for VTHUV ≤ VVBAT ≤ VTHOV and for –40°C ≤ ϑambient ≤ 125°C unless stated otherwise. No. Parameters Test Conditions Pin Symbol Min. Typ. Max. Unit Type* 1 Power Supply and Supervisor Functions 1.1 Current consumption VVBAT VVBAT = 13.5V(1) 25, 30 IVBAT1 7 mA A 1.2 Current consumption VVBAT VVBAT =13.5V in Standby mode 25, 30 IVBAT2 50 µA A 1.3 Internal power supply 2 VINT 4.8 4.94 5.1 V A 1.4 Band gap voltage 3 VBG 1.225 1.235 1.245 V A 1.5 Overvoltage threshold Up VVBAT 30 VTHOV_UP 21.2 22.7 V A 1.5.1 Overvoltage threshold Down VVBAT 30 VTHOV_DOWN 19.8 21.3 V A 1.6 Overvoltage threshold hysteresis VVBAT 30 VTOVhys 1 2.4 V A 1.7 Undervoltage threshold Up VVBAT 30 VTHUV_UP 6.8 7.4 V A 1.7.1 Undervoltage threshold Down VVBAT 30 VTHUV_DOWN 6.5 7.0 V A 1.8 Undervoltage threshold hysteresis VVBAT Measured during qualification only 30 VTUVhys 0.2 0.6 V A 1.9 On resistance of VVBAT switch VVBAT = 13.5V 31 RON_VBATSW 100 Ω A 2 5V/3.3V Regulator 2.1 Regulated output voltage 9V < VVBAT < 40V Iload = 0 mA to 100 mA 29 VCC1 4.85 (3.2) 5.15 (3.4) V A 2.2 Regulated output voltage 6V < VVBAT ≤ 9V Iload = 0 mA to 100 mA 29 VCC2 4.75 (3.2) 5.25 (3.4) V A 2.3 Line regulation Iload = 0 mA to 100 mA 29 DC line regulation <1 50 mV A 2.4 Load regulation Iload = 0 mA to 100 mA 29 DC load regulation <10 50 mV A 2.5 Output current limitation VVBAT > 6V 29 IOS1 100 350 mA A 2.6 Serial inductance to CVCC including PCB 29 ESL 1 20 nH D * Type: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter Notes: 1. EN, DIR, PWM = high 2. The use of X7R material is recommended 3. For higher values, stability at zero load is not guaranteed 4. Tested during qualification only 5. Value depends on TOSC; function tested with digital test pattern 6. Tested during characterization only 7. Supplied by charge pump 8. See section “Cross Conduction Time” 9. Voltage between source-drain of external switching transistors in active case 10. The short-circuit message will never be generated for switch-on time < tsc 17 4856H–AUTO–07/09 8. Electrical Characteristics (Continued) All parameters given are valid for VTHUV ≤ VVBAT ≤ VTHOV and for –40°C ≤ ϑambient ≤ 125°C unless stated otherwise. No. Parameters 2.7 Serial resistance to CVCC including PCB 2.8 Blocking cap at VCC 2.9 Pin Symbol Min. Max. Unit Type* 29 ESR 0 0.5 Ω D 29 CVCC 1.1 3.3 µF D HIGH threshold VMODE 1 VMODE H 4.0 V A 2.10 LOW threshold VMODE 1 VMODE L V A VCC threshold voltage level VMODE = “H” for /RESET (VMODE = “L”) 29 VtHRESH V A Tracking of reset threshold VMODE = “H” 3.1a with regulated output (VMODE = “L”) voltage 29 VVCC1-VtHRESH 75 (50) mV A 3.2 VCC threshold voltage level VMODE = “H” for /RESET (VMODE = “L”) 29 VtHRESL 4.3 (2.86) V A 3.3 Hysteresis of /RESET level VMODE = “H” (VMODE = “L”)(4) 29 HYSRESth 70 mV A 3.4 Length of pulse at /RESET pin (5) 5 tres 6800 T100 A 3.5 Length of short pulse at /RESET pin (5) 5 tresshort 200 T100 A 3.6 Wait for the first WD trigger (5) 5 td 6800 T100 A 3.7 Time for VCC < VtHRESL before activating /RESET (4) 29 tdelayRESL 0.5 2 µs C 3.8 Resistor defining internal bias currents for watchdog oscillator 3 RRWD 10 91 kΩ D 3.9 Watchdog oscillator period RRWD = 33 kΩ 3 TOSC 11.09 13.55 µs A 3.11 Watchdog input low-voltage threshold 6 VILWD 0.3 × VVCC V A 3.12 Watchdog input high-voltage threshold 6 VIHWD 0.7 × VVCC V A 3.13 Hysteresis of watchdog input voltage threshold 6 VhysWD 0.3 V A 6 t1 3 3.1 Test Conditions (2), (3) Typ. 0.7 Reset and Watchdog 3.14 Close window (5) 4.9 (3.25) 200 350 (220) 0.7 980 × TOSC A * Type: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter Notes: 1. EN, DIR, PWM = high 2. The use of X7R material is recommended 3. For higher values, stability at zero load is not guaranteed 4. Tested during qualification only 5. Value depends on TOSC; function tested with digital test pattern 6. Tested during characterization only 7. Supplied by charge pump 8. See section “Cross Conduction Time” 9. Voltage between source-drain of external switching transistors in active case 10. The short-circuit message will never be generated for switch-on time < tsc 18 ATA6823 4856H–AUTO–07/09 ATA6823 8. Electrical Characteristics (Continued) All parameters given are valid for VTHUV ≤ VVBAT ≤ VTHOV and for –40°C ≤ ϑambient ≤ 125°C unless stated otherwise. No. Parameters 3.15 Open window 3.16 Output low-voltage of /RESET 3.17 Internal pull-up resistor at pin /RESET 4 Test Conditions Pin Symbol Min. (5) 6 t2 At IOLRES = 1 mA 5 VOLRES 5 RPURES 5 Typ. Max. Unit 780 × TOSC 10 Type* A 0.4 V A 15 kΩ A LIN Transceiver, 7V ≤ VVBAT ≤ 18V 4.1 Low-level output current Normal mode; VLIN = 0V, VRX = 0.4V 13 ILRXD 2 mA A 4.2 High-level output current Normal mode; VLIN = VVBAT VRX = VCC – 0.4V 13 IHRXD 1 mA A 4.3 Driver recessive output voltage RLOAD = 1000Ω to VBAT 8 VBUSrecdrv 0.9 × VVBAT V A 4.4 Driver dominant voltage VBUSdom_DRV_LoSUP VVBAT = 7.0V Rload = 500Ω 8 V_LoSUP 1.2 V A 4.5 Driver dominant voltage VBUSdom_DRV_HiSUP VVBAT = 18V Rload = 500Ω 8 V_HiSUP 2 V A 4.6 Driver dominant voltage VBUSdom_DRV_LoSUP VVBAT = 7.0V Rload = 1000Ω 8 V_LoSUP_1k 0.6 V A 4.7 Driver dominant voltage VBUSdom_DRV_HiSUP VVBAT = 18V Rload = 1000Ω 8 V_HiSUP_1k_ 0.8 V A 4.8 Pull up resistor to VS serial diode required 8 RLIN 20 47 kΩ A 4.9 Current limitation VBUS = VVBAT_max 8 IBUS_LIM 50 200 mA A Input leakage current at the receiver including 4.10 pull-up resistor as specified Input leakage current driver off VBUS = 0V VVBAT = 12V 8 IBUS_PAS_dom –1 mA A Leakage current LIN 4.11 recessive Driver off 7V < VVBAT < 18V 7V < VBUS < 18V VBUS = VVBAT 8 IBUS_PAS_rec µA A 20 * Type: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter Notes: 1. EN, DIR, PWM = high 2. The use of X7R material is recommended 3. For higher values, stability at zero load is not guaranteed 4. Tested during qualification only 5. Value depends on TOSC; function tested with digital test pattern 6. Tested during characterization only 7. Supplied by charge pump 8. See section “Cross Conduction Time” 9. Voltage between source-drain of external switching transistors in active case 10. The short-circuit message will never be generated for switch-on time < tsc 19 4856H–AUTO–07/09 8. Electrical Characteristics (Continued) All parameters given are valid for VTHUV ≤ VVBAT ≤ VTHOV and for –40°C ≤ ϑambient ≤ 125°C unless stated otherwise. No. Test Conditions Pin Symbol Min. Leakage current at ground loss Control unit disconnected 4.12 from ground Loss of local ground must not affect communication in the residual network 7V < VVBAT < 18V GNDDevice = VS VVBAT = 12V 0V < VBUS < 18V 8 IBUS_NO_gnd –1 Node has to sustain the current that can flow under 4.13 this condition. Bus must remain operational under this condition 7V < VVBAT < 18V VVBAT disconnected VSUP_Device = GND 0V < VBUS < 18V 8 IBUS Center of receiver threshold 7V < VVBAT < 18V VBUS_CNT = (Vth_dom + Vth_rec)/2 8 VBUS_CNT 4.15 Receiver dominant state 7V < VVBAT < 18V VEN = 5V 8 VBUSdom 4.16 Receiver recessive state 7V < VVBAT < 18V VEN = 5V 8 VBUSrec 4.17 Receiver input hysteresis 7V < VVBAT < 18V VHYS = Vth_rec – Vth_dom 8 VBUShys 4.18 Duty cycle 1 7V < VVBAT < 18V THrec(max) = 0.744 × VVBAT THDom(max) = 0.581 × VVBAT tBit = 50 µs D1 = tBus_rec(min)/(2 × tBit) Load1: 1 nF + 1 kΩ Load2: 10 nF + 500Ω 8 D1 4.19 Duty cycle 2 7V < VVBAT < 18V THrec(min) = 0.422 × VVBAT THDom(min) = 0.284 × VVBAT tBit = 50 µs D2 = tBus_rec(max)/(2×tBit) Load1: 1 nF + 1 kΩ Load2: 10 nF + 500Ω 8 D2 4.14 Parameters 0.475 × VVBAT Typ. 0.5 × VVBAT Max. Unit Type* +1 mA A 100 µA A 0.525 × VVBAT V A 0.4 × VVBAT V A V A V A 0.6 × VVBAT 0.175 × VVBAT 0.396 A 0.581 A * Type: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter Notes: 1. EN, DIR, PWM = high 2. The use of X7R material is recommended 3. For higher values, stability at zero load is not guaranteed 4. Tested during qualification only 5. Value depends on TOSC; function tested with digital test pattern 6. Tested during characterization only 7. Supplied by charge pump 8. See section “Cross Conduction Time” 9. Voltage between source-drain of external switching transistors in active case 10. The short-circuit message will never be generated for switch-on time < tsc 20 ATA6823 4856H–AUTO–07/09 ATA6823 8. Electrical Characteristics (Continued) All parameters given are valid for VTHUV ≤ VVBAT ≤ VTHOV and for –40°C ≤ ϑambient ≤ 125°C unless stated otherwise. No. Pin Symbol Min. 4.20 Duty cycle 3 7V < VVBAT < 18V THrec(max) = 0.778 × VVBAT THDom(max) = 0.616 × VVBAT tBit = 96 µs D3 = tBus_rec(min)/(2 × tBit) Load1: 1 nF + 1 kΩ Load2: 10 nF + 500Ω 8 D3 0.417 4.21 Duty cycle 4 7V < VVBAT < 18V THrec(min) = 0.389 × VVBAT THDom(min) = 0.251 × VVBAT tBit = 96 µs D4 = tBus_rec(max)/(2 × tBit) Load1: 1 nF + 1 kΩ Load2: 10 nF + 500Ω 8 D4 0.590 7V < VVBAT < 18V trec_pd = max (trx_pdr, trx_pdf) 13 trx_pd 6 µs 7V < VVBAT < 18V trx_sym = trx_pdr – trx_pdf 13 trx_sym –2 +2 µs 8 TBUS 30 150 µs A 0.3 × VVCC V A V A 4.22 Parameters Receiver propagation delay Symmetry of receiver 4.23 propagation delay rising edge minus falling edge 4.24 5 Test Conditions Dominant time for wake-up 7V < VVBAT < 18V via LIN-bus VLIN = 0V Typ. Max. Unit Type* A 90 A A Control Inputs EN1, DIR, PWM, WD, TX 5.1 Input low-voltage threshold 12, 10, 11, 6, 9 VIL 5.2 Input high-voltage threshold 12, 10, 11, 6, 9 VIH 0.7 × VVCC 5.3 Hysteresis 12, 10, 11, 6, 9 HYS 0.3 0.5 0.7 V A 5.4 Pull-down resistor EN1, DIR, PWM, WD 12, 10, 11, 6, RPD 25 50 100 kΩ A 5.5 Pull-up resistor TX 25 50 100 kΩ A 100 ns D 3 × T100 µs B 5.6 Rise/fall time 5.7 Debounce time EN1 (6) 9 RPU 12, 10, 11, 6, 9 trf 12 tdb 2 × T100 * Type: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter Notes: 1. EN, DIR, PWM = high 2. The use of X7R material is recommended 3. For higher values, stability at zero load is not guaranteed 4. Tested during qualification only 5. Value depends on TOSC; function tested with digital test pattern 6. Tested during characterization only 7. Supplied by charge pump 8. See section “Cross Conduction Time” 9. Voltage between source-drain of external switching transistors in active case 10. The short-circuit message will never be generated for switch-on time < tsc 21 4856H–AUTO–07/09 8. Electrical Characteristics (Continued) All parameters given are valid for VTHUV ≤ VVBAT ≤ VTHOV and for –40°C ≤ ϑambient ≤ 125°C unless stated otherwise. No. 6 Parameters Test Conditions Pin Symbol Min. Typ. Max. Unit Type* VVBAT + VVG V A V A 11 µs A Charge Pump 6.1 Charge pump voltage Load = 0A 21 VCP 6.2 Charge pump voltage Load = 3 mA, CCP = 100 nF 21 VCP VVBAT + VVG – 1 6.3 Period charge pump oscillator 21 T100 9 6.4 CP load current in VG without CP load 24 IVGCPz 0.6 mA A 6.5 CP load current in VG with Load = 3 mA, CP load CCP = 100 nF 24 IVGCP 4 mA A 6.6 Charge pump OK threshold UP 21 VCPOK_UP TBD 5.6 TBD V A 6.7 Charge pump OK threshold DOWN 21 VCPOK_DOWN TBD 4.8 TBD V A 7 H-bridge Driver VVG – 0.5V VVG V A Load = 0A 7.1 Low-side driver HIGH output voltage 26, 27 VLxH 7.2 ON-resistance of sink stage of pins L1, L2 26, 27 RDSON_LxL, x = 1, 2 20 Ω A 7.3 ON-resistance of source stage of pins L1, L2 26, 27 RDSON_LxH, x = 1, 2 20 Ω A 7.4 Output peak current at pins VLx = 3V L1, L2, switched to LOW 26, 27 ILxL, x = 1, 2 mA A 7.5 Output peak current at pins VLx = 3V L1, L2, switched to HIGH 26, 27 ILxH, x = 1, 2 –100 mA A 7.6 Pull-down resistance at pins L1, L2 26, 27 RPDLx x = 1, 2 140 kΩ A 7.7 ON-resistance of sink stage of pins H1, H2 VSx = 0 18, 20 RDSON_HxL, x = 1, 2 20 Ω A 7.8 ON-resistance of source stage of pins H1, H2 VSx = VVBAT 18, 20 RDSON_HxH, x = 1, 2 20 Ω A 100 30 * Type: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter Notes: 1. EN, DIR, PWM = high 2. The use of X7R material is recommended 3. For higher values, stability at zero load is not guaranteed 4. Tested during qualification only 5. Value depends on TOSC; function tested with digital test pattern 6. Tested during characterization only 7. Supplied by charge pump 8. See section “Cross Conduction Time” 9. Voltage between source-drain of external switching transistors in active case 10. The short-circuit message will never be generated for switch-on time < tsc 22 ATA6823 4856H–AUTO–07/09 ATA6823 8. Electrical Characteristics (Continued) All parameters given are valid for VTHUV ≤ VVBAT ≤ VTHOV and for –40°C ≤ ϑambient ≤ 125°C unless stated otherwise. No. Parameters 7.9 Pin Symbol Min. Unit Type* = 13.5V V Output peak current at pins VBAT VSx = VVBAT Hx, switched to LOW VHx = VVBAT + 3V 18, 20 IHxL, x = 1, 2 100 mA A 7.10 = 13.5V V Output peak current at pins VBAT VSx = VVBAT Hx, switched to HIGH VHx = VVBAT + 3V 18, 20 IHxH, x = 1, 2 –100 mA A 7.11 Static switch output low voltage at pins Hx and Lx VSx = 0V IHx = 1 mA ILx = 1 mA 18, 20, 26, 27 VHxL, VLxL x = 1, 2 0.3 V A ILx = –10 µA (PWM = static) 18, 20 VHxHstat1(7) VVBAT + VVG – 1 VVBAT + VVG V A VVBAT = VPBAT = 9V, I_VG = –20 mA 17, 18, 19, 20 RPDHx 30 150 kΩ A Propagation delay time, Figure 3-6 on page 13 7.15 low-side driver from high to VVBAT = 13.5V low 26, 27 tLxHL 0.5 µs A Propagation delay time, 7.16 low-side driver from low to VVBAT = 13.5V high 26, 27 tLxLH 0.5 + tCC µs A 7.17 Fall time low-side driver VVBAT = 13.5V CGx=5 nF 26, 27 tLxf 0.5 µs A 7.18 Rise time low-side driver VVBAT = 13.5V 26, 27 tLxr 0.5 µs A Propagation delay time, 7.19 high-side driver from high to low Figure 3-6 on page 13 VVBAT = 13.5V 18, 20 tHxHL 0.5 µs A Propagation delay time, 7.20 high-side driver from low to VVBAT = 13.5V high 18, 20 tHxLH 0.5 + tCC µs A 7.21 Fall time high-side driver VVBAT = 13.5V, CGx = 5 nF 18, 20 tHxf 0.5 µs A 7.22 Rise time high-side driver VVBAT = 13.5V 18, 20 tHxr 0.5 µs A Static high-side switch 7.12 output high-voltage pins H1, H2 7.13 Sink resistance between Hx and Sx Test Conditions Typ. Max. Dynamic Parameters 7.23 Cross conduction time RCC = 10 kΩ, CCC = 1 nF 7.24 External resistor (8) 4 tCC 3.75 4 RCC 5 4.45 µs A kΩ D * Type: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter Notes: 1. EN, DIR, PWM = high 2. The use of X7R material is recommended 3. For higher values, stability at zero load is not guaranteed 4. Tested during qualification only 5. Value depends on TOSC; function tested with digital test pattern 6. Tested during characterization only 7. Supplied by charge pump 8. See section “Cross Conduction Time” 9. Voltage between source-drain of external switching transistors in active case 10. The short-circuit message will never be generated for switch-on time < tsc 23 4856H–AUTO–07/09 8. Electrical Characteristics (Continued) All parameters given are valid for VTHUV ≤ VVBAT ≤ VTHOV and for –40°C ≤ ϑambient ≤ 125°C unless stated otherwise. No. Parameters Test Conditions Max. Unit Type* CCC 5 nF D 4 RONCC 200 Ω A (9) 17, 19 VSC 3.5 4 4.7 V A 7.29 Short circuit detection time (10) 17, 19 tSC 5 10 15 µs A VG regulator output 7.30 voltage VVBAT = VPBAT = 18V, I_VG = –20 mA 24 VVG 11 14 V A VVBAT = VPBAT = 9V, I_VG = –20 mA 24 VVGswitch 11 14 V A 7.25 External capacitor 7.26 RON of tCC switching transistor 7.28 Short circuit detection voltage 7.31 8 VG regulator output voltage switch mode Pin Symbol 4 Min. Typ. Input EN2 8.1 Input low-voltage threshold 32 VIL 2.3 3.6 V A 8.2 Input high-voltage threshold 32 VIH 2.8 4.0 V A 8.3 Hysteresis 32 HYS V A 8.4 Pull-down resistor 32 RPD 200 kΩ A 8.5 Rise/fall time 32 trf 100 ns D 32 tdb 2 × T100 3 × T100 µs B 15, 16 IL 2 mA A 15, 16 IH 1 mA A 8.6 9 9.1 9.2 Debounce time (6) (6) 0.47 50 100 Diagnostic Outputs DG1, DG2, DG3 Low level output current High level output current VDG = 0.4V(6) VDG = VCC – 0.4V (6) * Type: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter Notes: 1. EN, DIR, PWM = high 2. The use of X7R material is recommended 3. For higher values, stability at zero load is not guaranteed 4. Tested during qualification only 5. Value depends on TOSC; function tested with digital test pattern 6. Tested during characterization only 7. Supplied by charge pump 8. See section “Cross Conduction Time” 9. Voltage between source-drain of external switching transistors in active case 10. The short-circuit message will never be generated for switch-on time < tsc 24 ATA6823 4856H–AUTO–07/09 ATA6823 9. Application 9.1 General Remark This chapter describes the principal application for which the ATA6823 was designed. Because Atmel® cannot be considered to understand fully all aspects of the system, application, and environment, no warranties of fitness for a particular purpose are given. Table 9-1. Typical External Components Component Function Value Tolerance CVINT Blocking capacitor at VINT 220 nF, 10V, X7R 50% CVCC Blocking capacitor at VCC 2.2 µF, 10V, X7R 50% CCC Cross conduction time definition capacitor Typical 330 pF, 100V, COG RCC Cross conduction time definition resistor Typical 10 kΩ CVG Blocking capacitor at VG Typical 470 nF, 25V, X7R CCP Charge pump capacitor Typical 220 nF, 25V, X7R CVRES Reservoir capacitor Typical 470 nF, 25V, X7R RRWD Watchdog time definition resistor Typical 51 kΩ RLIN Pull-up resistor for LIN bus (master only) Typical 1 kΩ CLIN Filter capacitor for LIN bus Typical 220 pF, 100V 50% 10. Errata 10.1 Faulty Pulse at DG1 A faulty pulse of approximately 100 ns appears at pin 16 (DG1), signalizing short circuit condition, under following circumstances: General condition: PWM = HIGH and detected undervoltage of VBAT (signalized at pin 15 = DG2) or detected overvoltage of VBAT (signalized at pin 15 = DG2) or detected undervoltage of the charge pump (signalized at pin 15 = DG2) or overtemperature shutdown. 10.2 Problem Fix/Workaround Set the software to ignore the faulty pulse. 25 4856H–AUTO–07/09 11. Ordering Information Extended Type Number Package Remarks ATA6823-PHQW QFN32 Pb-free 12. Package Information Package: QFN 32 - 7 x 7 Exposed pad 4.7 x 4.7 Dimensions in mm Not indicated tolerances ± 0.05 7 0.9±0.1 4.7 +0 0.05-0.05 32 25 1 32 24 1 technical drawings according to DIN specifications 17 Drawing-No.: 6.543-5097.01-4 Issue: 1; 24.02.03 26 0.6 0.3 8 8 16 9 0.65 nom. 4.55 ATA6823 4856H–AUTO–07/09 ATA6823 13. Revision History Please note that the following page numbers referred to in this section refer to the specific revision mentioned, not to this document. Revision No. History 4856H-AUTO-07/09 • LIN 2.0 to LIN 2.1 in whole document changed • Section 6 “Operating Range” on page 16 changed • LIN Transceiver part in Section 8 “Electrical Characteristics” on pages 19 to 21 changed 4856G-AUTO-01/09 • • • • • • • • • • • • Section 3 “General Statement and Conventions” on page 4 deleted Section 4 “Application” from page 5 to page 24 removed Figure 3-1 “Wake-up by pin LIN” on page 7 changed Section 4 “Absolute Maximum Ratings” on page 15 changed Section 5 “Thermal Resistance” on page 15 changed Section 6 “Operating Range” on page 16 changed Section 7 “Noise and Surge Immunity, ESD and Latch-up” on page 16 added Section 8 “Electrical Characteristics” on pages 17 to 23 changed Section 10 “Schaffner and Electromagentic Compatibility” on pages 24 to 26 deleted Table 9-1 “Typical External Components” on page 24 changed Section 10 “Errata” on page 24 added Section 11 “ESD and Latch-up Requirements” on page 26 deleted 4856F-AUTO-01/08 • Section 5.4 “5V/3.3V VCC Regulator” on pages 8 to 9 changed • Section 10 “Electrical Characteristics” number 3.3 on page 18 changed • Section 12 “Ordering Information” on page 27 changed 4856E-AUTO-07/07 • Put datasheet in a new template 27 4856H–AUTO–07/09 Headquarters International Atmel Corporation 2325 Orchard Parkway San Jose, CA 95131 USA Tel: 1(408) 441-0311 Fax: 1(408) 487-2600 Atmel Asia Unit 1-5 & 16, 19/F BEA Tower, Millennium City 5 418 Kwun Tong Road Kwun Tong, Kowloon Hong Kong Tel: (852) 2245-6100 Fax: (852) 2722-1369 Atmel Europe Le Krebs 8, Rue Jean-Pierre Timbaud BP 309 78054 Saint-Quentin-en-Yvelines Cedex France Tel: (33) 1-30-60-70-00 Fax: (33) 1-30-60-71-11 Atmel Japan 9F, Tonetsu Shinkawa Bldg. 1-24-8 Shinkawa Chuo-ku, Tokyo 104-0033 Japan Tel: (81) 3-3523-3551 Fax: (81) 3-3523-7581 Technical Support [email protected] Sales Contact www.atmel.com/contacts Product Contact Web Site www.atmel.com Literature Requests www.atmel.com/literature Disclaimer: The information in this document is provided in connection with Atmel products. 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