TPC8216-H TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (U-MOSⅥ-H) TPC8216-H High Efficiency DC-DC Converter Applications Notebook PC Applications Portable-Equipment Applications • Small footprint due to a small and thin package • High-speed switching • Small gate charge: QSW = 3.4 nC (typ.) • Low drain-source ON-resistance: RDS (ON) = 13.6 mΩ (typ.) • High forward transfer admittance: |Yfs| = 19 S (typ.) • Low leakage current: IDSS = 10 μA (max) (VDS = 30 V) • Enhancement mode: Vth = 1.3 to 2.3 V (VDS = 10 V, ID = 0.1 mA) Unit: mm Absolute Maximum Ratings (Ta = 25°C) Characteristic Symbol Rating Unit Drain−source voltage VDSS 30 V Drain−gate voltage (RGS = 20 kΩ) VDGR 30 V Gate−source voltage VGSS ±20 V DC (Note 1) ID 6.4 Pulse (Note 1) IDP 25.6 PD (1) 1.5 PD (2) 1.1 PD (1) 0.75 PD 2) 0.45 Single-pulse avalanche energy (Note 4) EAS 53 mJ Avalanche current IAR 6.4 A Repetitive avalanche energy (Note 2a, Note 3b, Note 5) EAR 0.13 mJ Channel temperature Tch 150 ℃ Storage temperature range Tstg −55 to 150 ℃ Drain current Single-device Drain power operation (Note 3a) dissipation Single-device value (t = 10 s) (Note 2a) at dual operation (Note 3b) Single-device Drain power operation (Note 3a) dissipation Single-device value (t = 10 s) (Note 2b) at dual operation (Note 3b) A JEDEC ⎯ JEITA ⎯ TOSHIBA 2-6J1E Weight: 0.085 g (typ.) W Circuit Configuration W 8 7 6 5 1 2 3 4 Note: For Notes 1 to 4, refer to the next page. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating” Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). This transistor is an electrostatic-sensitive device. Handle with care. 1 2009-02-23 TPC8216-H Thermal Characteristics Characteristic Single-device operation (Note 3a) Thermal resistance, channel to ambient (t = 10 s) (Note 2a) Single-device value at dual operation (Note 3b) Single-device operation (Note 3a) Thermal resistance, channel to ambient (t = 10 s) (Note 2b) Single-device value at dual operation (Note 3b) Symbol Max Rth (ch-a) (1) 83.3 Rth (ch-a) (2) 114 Rth (ch-a) (1) 167 Rth (ch-a) (2) 278 Unit °C/W Marking TPC8216 H Part No. (or abbreviation code) Lot No. Note: A line under a Lot No. identifies the indication of product Labels. [[G]]/RoHS COMPATIBLE or [[G]]/RoHS [[Pb]] Please contact your TOSHIBA sales representative for details as to environmental matters such as the RoHS compatibility of Product. The RoHS is the Directive 2002/95/EC of the European Parliament and of the Council of 27 January 2003 on the restriction of the use of certain hazardous substances in electrical and electronic equipment. Note Note 1: Ensure that the channel temperature does not exceed 150°C. Note 2: (a) Device mounted on a glass-epoxy board (a) (b) Device mounted on a glass-epoxy board (b) FR-4 25.4 × 25.4 × 0.8 (unit: mm) FR-4 25.4 × 25.4 × 0.8 (unit: mm) (a) (b) Note 3: a) The power dissipation and thermal resistance values are shown for a single device (During single-device operation, power is only applied to one device.) b) The power dissipation and thermal resistance values are shown for a single device (During dual operation, power is evenly applied to both devices.) Note 4: VDD = 24 V, Tch = 25°C (Initial), L = 1.0 mH, RG = 25 Ω, IAR = 6.4 A Note 5: Repetitive rating: pulse width limited by maximum channel temperature Note 6: • on the lower left of the marking indicates Pin 1. * Weekly code: (three digits) Week of manufacture (01 for the first week of the year, continuing up to 52 or 53) Year of manufacture (the last digit of the year) 2 2009-02-23 TPC8216-H Electrical Characteristics (Ta = 25°C) Characteristic Symbol Test Condition Min Typ. Max Unit Gate leakage current IGSS VGS = ±20 V, VDS = 0 V ⎯ ⎯ ±100 nA Drain cutoff current IDSS VDS = 30 V, VGS = 0 V ⎯ ⎯ 10 μA V (BR) DSS ID = 10 mA, VGS = 0 V 30 ⎯ ⎯ V V (BR) DSX ID = 10 mA, VGS = −20 V 15 ⎯ ⎯ Vth VDS = 10 V, ID = 0.1 mA 1.3 ⎯ 2.3 RDS (ON) VGS = 4.5 V, ID = 3.2 A ⎯ 16.5 23.0 RDS (ON) VGS = 10 V , ID = 3.2 A ⎯ 13.6 20.0 Forward transfer admittance |Yfs| VDS = 10 V , ID = 3.2 A 9.5 19 ⎯ Input capacitance Ciss ⎯ 900 1170 Reverse transfer capacitance Crss ⎯ 65 104 Output capacitance Coss ⎯ 200 ⎯ ⎯ 2.5 3.6 ⎯ 2.3 ⎯ ⎯ 7.0 ⎯ Gate threshold voltage Drain-source ON-resistance Gate resistance Rg Rise time VDS = 10 V, VGS = 0 V, f = 1 MHz VDS = 10 V, VGS = 0 V, f = 5 MHz tr VGS Turn-on time ton Turn-off time Total gate charge (gate-source plus gate-drain) (Note 7) Qgs1 Gate-drain (“Miller”) charge Qgd Gate switch charge QSW 4.7 Ω mΩ S pF Ω 9.2 ⎯ ⎯ 28 ⎯ VDD ≈ 24 V, VGS = 10 V, ID = 6.4 A ⎯ 14 ⎯ VDD ≈ 24 V, VGS = 5 V, ID = 6.4 A ⎯ 7.6 ⎯ ⎯ 2.4 ⎯ ⎯ 2.5 ⎯ ⎯ 3.4 ⎯ VDD ≈ 15 V Duty ≤ 1%, tw = 10 μs toff Gate-source charge 1 V ns ⎯ tf Qg 出力 0V Switching time Fall time ID = 3.2 A 10 V RL = 4.7Ω Drain-source breakdown voltage VDD ≈ 24 V, VGS = 10 V, ID = 6.4 A nC Source−Drain Ratings and Characteristics (Ta = 25°C) Characteristic Drain reverse current Forward voltage (diode) Pulse (Note 1) Symbol Test Condition Min Typ. Max Unit IDRP ⎯ ⎯ ⎯ 25.6 A ⎯ ⎯ −1.2 V VDSF IDR = 6.4 A, VGS = 0 V 3 2009-02-23 TPC8216-H 4 3.6 3.4 6 20 3.2 3.4 Common source Ta =25°C Pulse test 15 3.2 ID 3 6 Drain current Drain current ID (A) 8 3.6 10 Common source Ta = 25°C Pulse test 3.1 10 ID – VDS 6 5 4 3.8 ID – VDS (A) 10 2.9 4 2.8 2 10 3 5 2.7 2.8 VGS = 2.6 V 0 0 0.2 0.4 0.6 0.8 Drain-source voltage VDS VGS = 2.6 V 0 0 1 0.4 (V) 4 Ta = −55°C 2 1 2 3 Gate-source voltage 4 VGS 0.2 5 ID = 6.4 A 0.1 3.2 1.6 0 0 2 (V) 4 Drain-source ON-resistance RDS (ON) (mΩ) Forward transfer admittance Ta = −55°C 25 100 1 1 Drain current 10 ID 8 VGS 10 (V) RDS (ON) – ID 100 Common source VDS = 10 V Pulse test |Yfs| (S) ⎪Yfs⎪ – ID 0.1 0.1 6 Gate-source voltage 100 10 (V) Common source Ta = 25℃ Pulse test (V) VDS Drain-source voltage ID Drain current 6 100 2 VDS – VGS Common source VDS = 10 V Pulse test 0 0 VDS 0.3 (A) 8 1.6 Drain-source voltage ID – VGS 10 1.2 0.8 Common source Ta = 25°C Pulse test VGS = 4.5 V 1 0.1 100 (A) 10 10 1 Drain current 4 10 ID 100 (A) 2009-02-23 TPC8216-H RDS (ON) – Ta IDR – VDS 30 100 Common source Ta = 25°C Pulse test 25 ID = 1.6,3.2,6.4 A Drain reverse current IDR (A) Drain-source ON-resistance RDS (ON) (mΩ) Common source Pulse test 20 VGS = 4.5 V 15 10 ID = 1.6,3.2,6.4 A VGS = 10 V 4.5 3 1 10 VGS = 0 V 10 1 5 0 −80 −40 0 40 80 Ambient temperature 120 Ta 0.1 0 160 −0.2 (°C) −0.4 −0.6 −0.8 Drain-source voltage Capacitance – VDS −1.0 VDS (V) 80 120 −1.2 Vth – Ta 10000 3 Gate threshold voltage Vth (V) Ciss Crss Common source VGS = 0 V f = 1 MHz Ta = 25°C 10 0.1 1 100 10 Drain-source voltage VDS 1 Common source 0.5 V DS = 10 V ID = 0.1 mA Pulse test 0 −80 −40 0 (V) Ambient temperature 1.2 (2) 0.8 (V) 40 (3) (4) 0.4 0 0 50 100 Ambient temperature 150 Ta 20 Common source ID = 6.4 A Ta = 25°C Pulse test VDS (1) (°C) 50 Device mounted on a Glass-epoxy board (a) (Note 2a) (1)Single-device operation (Note 3a) (2)Single-device value at dual operation (Note 3b) Device mounted on a glass-epoxy board (b) (Note 2b) (3)Single-device operation (Note 3a) (4)Single-device value at dual operation (Note 3b) t=10s Drain-source voltage Drain power dissipation PD (W) 1.6 Ta 160 Dynamic input/output characteristics PD – Ta 2 40 30 12 VGS VDS = 24 V 6 20 12 10 VDD = 24 V 5 4 6 0 2 4 6 8 Total Gate charge (°C) 8 12 0 200 16 10 Qg 12 14 (V) 100 1.5 VGS Capacitance Coss 2 Gate-source voltage 1000 C (pF) 2.5 0 16 (nC) 2009-02-23 TPC8216-H rth – tw Transient thermal impedance rth (°C/W) 1000 Single - pulse (4) (3) (2) (1) 100 10 Device mounted on a glass-epoxy board (a) (note 2a) (1)Single-device opration (Note 3a) (2)Single-device value at dual opration (Note 3b) Device mounted on a glass-epoxy board (b) (Note 2b) (3)Single-device opration (Note 3a) (4)Single-device value at dual opration (Note 3b) t = 10s 1 0.1 0.001 0.01 0.1 1 Pulse width 10 tw 100 1000 (s) Safe operating area 100 Single-device value at dual opration (note 3b) t =1ms * 10 10ms * Drain current ID (A) ID max (Pulse) * 1 0.1 * Single pulse Ta=25℃ 0.01 0.1 Curves must be derated linearly with increase in temperature. 1 Drain-source voltage VDSS max 10 VDS 100 (V) 6 2009-02-23 TPC8216-H RESTRICTIONS ON PRODUCT USE • Toshiba Corporation, and its subsidiaries and affiliates (collectively “TOSHIBA”), reserve the right to make changes to the information in this document, and related hardware, software and systems (collectively “Product”) without notice. • This document and any information herein may not be reproduced without prior written permission from TOSHIBA. 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