PHILIPS 74AHC259D

INTEGRATED CIRCUITS
DATA SHEET
74AHC259; 74AHCT259
8-bit addressable latch
Product specification
File under Integrated Circuits, IC06
2000 Mar 14
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
FEATURES
DESCRIPTION
• ESD protection:
HBM EIA/JESD22-A114-A exceeds 2000 V
MM EIA/JESD22-A115-A exceeds 200 V
CDM EIA/JESD22-C101 exceeds 1000 V
The 74AHC/AHCT259 are high-speed Si-gate CMOS
devices and are pin compatible with Low power Schottky
TTL (LSTTL). They are specified in compliance with
JEDEC standard No. 7A.
• Balanced propagation delays
The 74AHC/AHCT259 are high-speed 8-bit addressable
latches designed for general purpose storage applications
in digital systems. The ‘259’ are multifunctional devices
capable of storing single-line data in eight addressable
latches, and also 3-to-8 decoder and demultiplexer, with
active HIGH outputs (Q0 to Q7), functions are available.
• All inputs have Schmitt-trigger actions
• Combines demultiplexer and 8-bit latch
• Serial-to-parallel capability
• Output from each storage bit available
• Random (addressable) data entry
The ‘259’ also incorporates an active LOW common reset
(MR) for resetting all latches as well as an active LOW
enable input (LE).
• Easily expandable
• Common reset input
• Useful as a 3-to-8 active HIGH decoder
The ‘259’ has four modes of operation as shown in the
mode select table. In the addressable latch mode, data on
the data line (D) is written into the addressed latch. The
addressed latch will follow the data input with all nonaddressed latches remaining in their previous states.
In the memory mode, all latches remain in their previous
states and are unaffected by the data or address inputs.
• Inputs accept voltages higher than VCC
• For AHC only: operates with CMOS input levels
• For AHCT only: operates with TTL input levels
• Specified from −40 to +85 °C and from −40 to +125 °C.
In the 3-to-8 decoding or demultiplexing mode, the
addressed output follows the state of the (D) input with all
other outputs in the LOW state. In the reset mode all
outputs are LOW and unaffected by the address
(A0 to A2) and data (D) input. When operating the ‘259’ as
an address latch, changing more than one bit of the
address could impose a transient-wrong address.
Therefore, this should only be done while in the memory
mode.
The mode select table summarizes the operations of
the ‘259’.
2000 Mar 14
2
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
QUICK REFERENCE DATA
GND = 0 V; Tamb = 25 °C; tr = tf ≤ 3.0 ns.
TYPICAL
SYMBOL
PARAMETER
CONDITIONS
UNIT
AHC
tPHL/tPLH
propagation delay
D to Qn
CL = 15 pF; VCC = 5 V
4.1
4.1
ns
An to Qn
5.3
5.5
ns
LE to Qn
4.3
4.3
ns
MR to Qn
3.9
3.9
ns
3.0
3.0
pF
4.0
4.0
pF
13
17
pF
CI
input capacitance
CO
output capacitance
CPD
power dissipation capacitance
VI = VCC or GND
CL = 50 pF; f = 1 MHz; notes 1 and 2
Notes
1. CPD is used to determine the dynamic power dissipation (PD in µW).
PD = CPD × VCC2 × fi + ∑ (CL × VCC2 × fo) where:
fi = input frequency in MHz;
fo = output frequency in MHz;
∑ (CL × VCC2 × fo) = sum of outputs;
CL = output load capacitance in pF;
VCC = supply voltage in Volts.
2. The condition is VI = GND to VCC.
2000 Mar 14
AHCT
3
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
FUNCTION TABLE
See note 1.
INPUTS
OUTPUTS
OPERATING MODE
reset
demultiplexer
(active HIGH
8-channel)
decoder (when D = H)
memory (do nothing)
addressable latch
MR
LE
D
A0
A1
A2
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
L
H
X
X
X
X
L
L
L
L
L
L
L
L
d
L
L
L
Q=d
L
L
L
L
L
L
L
d
H
L
L
L
Q=d
L
L
L
L
L
L
d
L
H
L
L
L
Q=d
L
L
L
L
L
d
H
H
L
L
L
L
Q=d
L
L
L
L
d
L
L
H
L
L
L
L
Q=d
L
L
L
d
H
L
H
L
L
L
L
L
Q=d
L
L
d
L
H
H
L
L
L
L
L
L
Q=d
L
L
H
H
L
H
L
d
H
H
H
L
L
L
L
L
L
L
Q=d
X
X
X
X
q0
q1
q2
q3
q4
q5
q6
q7
d
L
L
L
Q=d
q1
q2
q3
q4
q5
q6
q7
d
H
L
L
q0
Q=d
q2
q3
q4
q5
q6
q7
d
L
H
L
q0
q1
Q=d
q3
q4
q5
q6
q7
d
H
H
L
q0
q1
q2
Q=d
q4
q5
q6
q7
d
L
L
H
q0
q1
q2
q3
Q=d
q5
q6
q7
d
H
L
H
q0
q1
q2
q3
q4
Q=d
q6
q7
d
L
H
H
q0
q1
q2
q3
q4
q5
Q=d
q7
H
H
H
H
q0
q1
q2
q3
q4
q5
q6
Q=d
Note
1. H = HIGH voltage level;
L = LOW voltage level;
X = don’t care;
d = HIGH or LOW data one set-up time prior to the LOW-to-HIGH LE transition;
q = lower case letters indicate the state of the referenced output established during the last cycle in which it was
addressed or cleared.
ORDERING INFORMATION
PACKAGES
TYPE NUMBER
TEMPERATURE
RANGE
PINS
PACKAGE
MATERIAL
CODE
−40 to +125 °C
16
SO
plastic
SOT109-1
74AHC259PW
16
TSSOP
plastic
SOT403-1
74AHCT259D
16
SO
plastic
SOT109-1
74AHCT259PW
16
TSSOP
plastic
SOT403-1
74AHC259D
2000 Mar 14
4
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
PINNING
PIN
SYMBOL
DESCRIPTION
1, 2 and 3
A0, A1 and A2
address input
4, 5, 6, 7, 9, 10, 11 and 12
Q0 to Q7
latch outputs
8
GND
ground (0 V)
13
D
data input
14
LE
latch enable input (active LOW)
15
MR
conditional reset input (active LOW)
16
VCC
DC supply voltage
handbook, halfpage
A0 1
16 VCC
A1 2
15 MR
A2 3
14 LE
14
handbook, halfpage
LE
Q0
13
D
Q1
Q2
13 D
Q0 4
259
Q1 5
Q2 6
Q3
12 Q7
1
11 Q6
2
Q3 7
10 Q5
GND 8
9 Q4
3
Q4
A1
Q5
A2
Q6
Q7
5
6
7
9
10
11
12
MR
15
MNA574
Fig.1 Pin configuration.
2000 Mar 14
A0
4
MNA573
Fig.2 Logic symbol.
5
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
13
handbook, halfpage
Z9
15
G8
14
G10
9,10D
DX
0
1
handbook, halfpage
1
C10
8R
0
2
G
3
0
7
2
4
5
1
A0
Q1
5
2
A1
Q2
6
3
A2
Q3
7
Q4
9
1-of-8
DECODER
8 LATCHES
7
3
9
4
4
1
6
2
Q0
14
LE
Q5 10
15
MR
Q6 11
13
D
Q7 12
10
5
11
MNA571
6
12
7
MNA572
Fig.3 IEC logic symbol.
Fig.4 Functional diagram.
OPERATING MODE SELECT TABLE
LE
MR
MODE
L
H
addressable latch
H
H
memory
L
L
active HIGH 8-channel demultiplexer
H
L
reset
Note
1. H = HIGH voltage level;
L = LOW voltage level.
2000 Mar 14
6
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
RECOMMENDED OPERATING CONDITIONS
74AHC
SYMBOL
PARAMETER
74AHCT
CONDITIONS
UNIT
MIN.
TYP. MAX. MIN.
TYP. MAX.
4.5
5.0
5.5
V
VCC
DC supply voltage
2.0
5.0
5.5
VI
input voltage
0
−
5.5
0
−
5.5
V
VO
output voltage
0
−
VCC
0
−
VCC
V
Tamb
operating ambient temperature
see DC and AC
characteristics
per device
−40
+25
+85
−40
+25
+85
°C
−40
+25
+125 −40
+25
+125 °C
VCC = 3.3 ±0.3 V
−
−
100
−
−
−
ns/V
VCC = 5 ±0.5 V
−
−
20
−
−
20
ns/V
tr, tf
input rise and fall ratios (∆t/∆f)
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134); voltages are referenced to GND (ground = 0 V).
SYMBOL
PARAMETER
CONDITIONS
MIN. MAX. UNIT
VCC
DC supply voltage
−0.5
+7.0
V
VI
input voltage
−0.5
+7.0
V
IIK
DC input diode current
−
−20
mA
VI < −0.5 V; note 1
IOK
DC output clamping diode current VO < −0.5 V or VO > VCC + 0.5 V; note 1
IO
DC output sink current
ICC
DC VCC or GND current
Tstg
storage temperature
PD
power dissipation per package
−0.5 V < VO < VCC + 0.5 V
for temperature range: −40 to +125 °C; note 2
−
±20
mA
−
±25
mA
−
±75
mA
−65
+150 °C
−
500
Notes
1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. For SO packages: above 70 °C the value of PD derates linearly with 8 mW/K.
For TSSOP packages: above 60 °C the value of PD derates linearly with 5.5 mW/K.
2000 Mar 14
7
mW
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
DC CHARACTERISTICS
74AHC family
Over recommended operating conditions; voltages are referenced to GND (ground = 0 V).
Tamb (°C)
TEST CONDITIONS
SYMBOL
OTHER
VIH
VIL
VOH
VOL
−40 to +125 UNIT
TYP.
MAX. MIN. MAX. MIN. MAX.
2.0
1.5
−
−
1.5
−
1.5
−
V
3.0
2.1
−
−
2.1
−
2.1
−
V
5.5
3.85 −
−
3.85 −
3.85 −
V
2.0
−
−
0.5
−
0.5
−
0.5
V
3.0
−
−
0.9
−
0.9
−
0.9
V
5.5
−
−
1.65
−
1.65
−
1.65
V
2.0
1.9
2.0
−
1.9
−
1.9
−
V
3.0
2.9
3.0
−
2.9
−
2.9
−
V
4.5
4.4
4.5
−
4.4
−
4.4
−
V
VI = VIH or VIL;
IO = −4.0 mA
3.0
2.58 −
−
2.48 −
2.40 −
V
VI = VIH or VIL;
IO = −8.0 mA
4.5
3.94 −
−
3.8
−
3.70 −
V
VI = VIH or VIL;
IO = 50 µA
2.0
−
0
0.1
−
0.1
−
0.1
V
3.0
−
0
0.1
−
0.1
−
0.1
V
4.5
−
0
0.1
−
0.1
−
0.1
V
VI = VIH or VIL;
IO = 4.0 mA
3.0
−
−
0.36
−
0.44
−
0.55
V
VI = VIH or VIL;
IO = 8.0 mA
4.5
−
−
0.36
−
0.44
−
0.55
V
−
1.0
−
2.0
µA
±2.5
−
±10.0 µA
LOW-level input
voltage
LOW-level output
voltage
VCC (V)
MIN.
HIGH-level input
voltage
HIGH-level output
voltage
−40 to +85
25
PARAMETER
VI = VIH or VIL;
IO = −50 µA
II
input leakage
current
VI = VCC or GND
5.5
−
−
0.1
IOZ
3-state output
OFF-state current
VI = VIH or VIL;
5.5
VO = VCC or GND
−
−
±0.25 −
ICC
quiescent supply
current
VI = VCC or GND;
IO = 0
5.5
−
−
4.0
−
40
−
80
µA
CI
input capacitance
−
−
3
10
−
10
−
10
pF
2000 Mar 14
8
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
74AHCT family
Over recommended operating conditions; voltages are referenced to GND (ground = 0 V).
TEST CONDITIONS
SYMBOL
Tamb (°C)
PARAMETER
−40 to +85
25
OTHER
VCC (V)
−40 to +125 UNIT
MIN. TYP. MAX. MIN. MAX. MIN. MAX.
VIH
HIGH-level input
voltage
4.5 to 5.5 2.0
−
−
2.0
−
2.0
−
V
VIL
LOW-level input
voltage
4.5 to 5.5 −
−
0.8
−
0.8
−
0.8
V
VOH
HIGH-level output
voltage
VI = VIH or VIL;
IO = −50 µA
4.5
4.4
4.5
−
4.4
−
4.4
−
V
VI = VIH or VIL;
IO = −8.0 mA
4.5
3.94 −
−
3.8
−
3.70 −
V
VI = VIH or VIL;
IO = 50 µA
4.5
−
0
0.1
−
0.1
−
0.1
V
VI = VIH or VIL;
IO = 8.0 mA
4.5
−
−
0.36
−
0.44
−
0.55
V
−
1.0
−
2.0
µA
±2.5
−
±10.0 µA
VOL
LOW-level output
voltage
II
input leakage
current
VI = VIH or VIL
5.5
−
−
0.1
IOZ
3-state output
OFF-state current
VI = VIH or VIL;
5.5
VO = VCC or GND
per input pin;
other inputs at
VCC or GND;
IO = 0
−
−
±0.25 −
ICC
quiescent supply
current
VI = VCC or GND; 5.5
IO = 0
−
−
4.0
−
40
−
80
µA
∆ICC
additional
quiescent supply
current per input
pin
VI = VCC − 2.1 V
other inputs at
VCC or GND;
IO = 0
4.5 to 5.5 −
−
1.35
−
1.5
−
1.5
mA
CI
input capacitance
−
3
10
−
10
−
10
pF
2000 Mar 14
−
9
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
AC CHARACTERISTICS
Type 74AHC259
GND = 0 V; tr = tf ≤ 3.0 ns.
Tamb (°C)
TEST CONDITIONS
SYMBOL
−40 to +85
25
PARAMETER
WAVEFORMS
CL
MIN.
−40 to +125
UNIT
TYP.
MAX. MIN. MAX.
MIN.
MAX.
propagation delay see Figs 5 and 11 15 pF −
D to Qn
5.8
11.5
1.0
13.5
1.0
15.0
ns
propagation delay see Figs 6 and 11
An to Qn
−
7.5
14.5
1.0
17.0
1.0
18.5
ns
propagation delay see Figs 7 and 11
LE to Qn
−
6.2
12.0
1.0
14.0
1.0
15.2
ns
tPHL
propagation delay see Figs 8 and 11
MR to Qn
−
5.4
10.5
1.0
12.5
1.0
13.5
ns
tPHL/tPLH
propagation delay see Figs 5 and 11 50 pF −
D to Qn
7.3
14.5
1.0
17.0
1.0
18.5
ns
propagation delay see Figs 6 and 11
An to Qn
−
9.1
18.0
1.0
21.0
1.0
23.0
ns
propagation delay see Figs 7 and 11
LE to Qn
−
7.7
15.5
1.0
17.5
1.0
19.0
ns
tPHL
propagation delay see Figs 8 and 11
MR to Qn
−
7.0
13.5
1.0
15.5
1.0
17.0
ns
tW
LE pulse width
HIGH or LOW
see Figs 7 and 11
5.0
−
−
5.0
−
5.0
−
ns
MR pulse width
LOW
see Figs 8 and 11
5.0
−
−
5.0
−
5.0
−
ns
tsu
set-up time
D to LE, An to LE
see Figs 9,
10 and 11
4.0
−
−
4.0
−
4.0
−
ns
th
hold time D to LE, see Figs 9 and 11
An to LE
1.0
−
−
1.0
−
1.0
−
ns
VCC = 3.0 to 3.6 V; note 1
tPHL/tPLH
2000 Mar 14
10
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
Tamb (°C)
TEST CONDITIONS
SYMBOL
−40 to +85
25
PARAMETER
WAVEFORMS
CL
MIN.
−40 to +125
UNIT
TYP.
MAX. MIN. MAX.
MIN.
MAX.
propagation delay see Figs 5 and 11 15 pF −
D to Qn
4.1
7.5
1.0
9.0
1.0
10.0
ns
propagation delay see Figs 6 and 11
An to Qn
−
5.3
9.5
1.0
11.5
1.0
12.5
ns
propagation delay see Figs 7 and 11
LE to Qn
−
4.3
8.0
1.0
9.5
1.0
10.5
ns
tPHL
propagation delay see Figs 8 and 11
MR to Qn
−
3.9
7.0
1.0
8.5
1.0
9.5
ns
tPHL/tPLH
propagation delay see Figs 5 and 11 50 pF −
D to Qn
5.3
9.5
1.0
11.0
1.0
12.0
ns
propagation delay see Figs 6 and 11
An to Qn
−
6.5
11.5
1.0
13.5
1.0
15.0
ns
propagation delay see Figs 7 and 11
LE to Qn
−
5.5
10.0
1.0
11.5
1.0
12.5
ns
tPHL
propagation delay see Figs 8 and 11
MR to Qn
−
5.1
9.0
1.0
10.5
1.0
11.5
ns
tW
LE pulse width
HIGH or LOW
see Figs 7 and 11
5.0
−
−
5.0
−
5.0
−
ns
MR pulse width
LOW
see Figs 8 and 11
5.0
−
−
5.0
−
5.0
−
ns
tsu
set-up time
D to LE, An to LE
see Figs 9,
10 and 11
4.0
−
−
4.0
−
4.0
−
ns
th
hold time D to LE, see Figs 9 and 11
An to LE
1.0
−
−
1.0
−
1.0
−
ns
VCC = 4.5 to 5.5 V; note 2
tPHL/tPLH
Notes
1. Typical values at VCC = 3.3 V.
2. Typical values at VCC = 5.0 V.
2000 Mar 14
11
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
Type 74AHCT259
GND = 0 V; tr = tf ≤ 3.0 ns.
Tamb (°C)
TEST CONDITIONS
SYMBOL
−40 to +85
25
PARAMETER
WAVEFORMS
CL
MIN.
−40 to +125
UNIT
TYP.
MAX. MIN. MAX.
MIN.
MAX.
propagation delay see Figs 5 and 11 15 pF −
D to Qn
4.1
7.5
1.0
9.0
1.0
10.0
ns
propagation delay see Figs 6 and 11
An to Qn
−
5.5
9.5
1.0
11.5
1.0
12.5
ns
propagation delay see Figs 7 and 11
LE to Qn
−
4.3
8.0
1.0
9.5
1.0
10.4
ns
tPHL
propagation delay see Figs 8 and 11
MR to Qn
−
3.9
7.0
1.0
8.5
1.0
9.5
ns
tPHL/tPLH
propagation delay see Figs 5 and 11 50 pF −
D to Qn
5.4
9.5
1.0
11.0
1.0
12.0
ns
propagation delay see Figs 6 and 11
An to Qn
−
6.6
12.0
1.0
14.0
1.0
15.5
ns
propagation delay see Figs 7 and 11
LE to Qn
−
5.5
10.0
1.0
12.0
1.0
13.0
ns
tPHL
propagation delay see Figs 8 and 11
MR to Qn
−
5.1
9.0
1.0
10.5
1.0
11.5
ns
tW
LE pulse width
HIGH or LOW
see Figs 7 and 11
5.0
−
−
5.0
−
5.0
−
ns
MR pulse width
LOW
see Figs 8 and 11
5.0
−
−
5.0
−
5.0
−
ns
VCC = 4.5 to 5.5 V; note 1
tPHL/tPLH
tsu
set-up time
see Figs 9,
D to LE, An to LE 10 and 11
4.0
−
−
4.0
−
4.0
−
ns
th
hold time D to LE, see Figs 9 and 11
An to LE
1.0
−
−
1.0
−
1.0
−
ns
Note
1. Typical values at VCC = 5.0 V.
2000 Mar 14
12
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
AC WAVEFORMS
handbook, halfpageVCC
handbook, halfpageVCC
VM(1)
D input
GND
GND
t PHL
t PHL
t PLH
VOH
t PLH
VOH
VM(2)
Qn output
VOL
MNA569
FAMILY
VI INPUT
REQUIREMENTS
AHC
GND to VCC
AHCT
GND to 3.0 V
VM(2)
Qn output
VOL
Fig.5
VM(1)
An input
VM(1)
INPUT
VM(2)
OUTPUT
MNA568
VM(1)
INPUT
VM(2)
OUTPUT
FAMILY
VI INPUT
REQUIREMENTS
50% VCC 50% VCC
AHC
GND to VCC
50% VCC 50% VCC
1.5 V
AHCT
GND to 3.0 V
1.5 V
50% VCC
The data input (D) to output (Qn)
propagation delays.
Fig.6
50% VCC
The address input (An) to output (Qn)
propagation delays.
VCC
handbook, full pagewidth
D input
GND
VCC
VM(1)
LE input
GND
tW
t PHL
t PLH
VOH
VM(2)
Qn output
VOL
VM(1)
INPUT
MNA570
VM(2)
OUTPUT
FAMILY
VI INPUT
REQUIREMENTS
AHC
GND to VCC
50% VCC 50% VCC
AHCT
GND to 3.0 V
1.5 V
50% VCC
Fig.7 The enable input (LE) to output (Qn) propagation delays, the enable input pulse width.
2000 Mar 14
13
Philips Semiconductors
Product specification
8-bit addressable latch
74AHC259; 74AHCT259
handbook, halfpage VCC
VCC
handbook, halfpage
VM(1)
MR input
VM(1)
An input
GND
ADDRESS STABLE
GND
tW
t su
t PHL
th
VCC
VOH
VM(1)
LE input
VM(2)
Qn output
VOL
MNA550
GND
MNA548
The shaded areas indicate when the input is permitted to change for
predictable output performance.
VM(1)
INPUT
VM(2)
OUTPUT
FAMILY
VI INPUT
REQUIREMENTS
AHC
GND to VCC
50% VCC 50% VCC
AHC
GND to VCC
50% VCC
AHCT
GND to 3.0 V
1.5 V
AHCT
GND to 3.0 V
1.5 V
Fig.8
FAMILY
50% VCC
The conditional reset input (MR) to output
(Qn) propagation delays.
Fig.9
VI INPUT
REQUIREMENTS
VM(1)
INPUT
The address set-up and hold time for
An inputs to LE input.
VCC
handbook, full pagewidth
VM(1)
LE input
GND
t su
t su
th
th
VCC
VM(1)
D input
GND
VOH
VM(2)
Q=D
Qn output
VOL
VM(1)
INPUT
Q=D
MNA549
VM(2)
OUTPUT
FAMILY
VI INPUT
REQUIREMENTS
AHC
GND to VCC
50% VCC 50% VCC
AHCT
GND to 3.0 V
1.5 V
50% VCC
The shaded areas indicate when the input is permitted to change
for predictable output performance.
Fig.10 The data set-up and hold time for D input to LE input.
2000 Mar 14
14
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
S1
handbook, full pagewidth
VCC
PULSE
GENERATOR
VI
1000 Ω
VO
VCC
open
GND
D.U.T.
CL
RT
MNA219
TEST
S1
tPLH/tPHL
open
tPLZ/tPZL
VCC
tPHZ/tPZH
GND
Definitions for test circuit.
CL = load capacitance including jig and probe capacitance (See Chapter “AC characteristics”).
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
Fig.11 Load circuitry for switching times.
2000 Mar 14
15
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
PACKAGE OUTLINES
SO16: plastic small outline package; 16 leads; body width 3.9 mm
SOT109-1
D
E
A
X
c
y
HE
v M A
Z
16
9
Q
A2
A
(A 3)
A1
pin 1 index
θ
Lp
1
L
8
e
0
detail X
w M
bp
2.5
5 mm
scale
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
UNIT
A
max.
A1
A2
A3
bp
c
D (1)
E (1)
e
HE
L
Lp
Q
v
w
y
Z (1)
mm
1.75
0.25
0.10
1.45
1.25
0.25
0.49
0.36
0.25
0.19
10.0
9.8
4.0
3.8
1.27
6.2
5.8
1.05
1.0
0.4
0.7
0.6
0.25
0.25
0.1
0.7
0.3
0.069
0.010 0.057
0.004 0.049
0.01
0.019 0.0100 0.39
0.014 0.0075 0.38
0.16
0.15
0.050
0.039
0.016
0.028
0.020
0.01
0.01
0.004
0.028
0.012
inches
0.244
0.041
0.228
θ
Note
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
REFERENCES
OUTLINE
VERSION
IEC
JEDEC
SOT109-1
076E07
MS-012
2000 Mar 14
EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
97-05-22
99-12-27
16
o
8
0o
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
TSSOP16: plastic thin shrink small outline package; 16 leads; body width 4.4 mm
SOT403-1
E
D
A
X
c
y
HE
v M A
Z
9
16
Q
(A 3)
A2
A
A1
pin 1 index
θ
Lp
L
1
8
e
detail X
w M
bp
0
2.5
5 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
A
max.
A1
A2
A3
bp
c
D (1)
E (2)
e
HE
L
Lp
Q
v
w
y
Z (1)
θ
mm
1.10
0.15
0.05
0.95
0.80
0.25
0.30
0.19
0.2
0.1
5.1
4.9
4.5
4.3
0.65
6.6
6.2
1.0
0.75
0.50
0.4
0.3
0.2
0.13
0.1
0.40
0.06
8
0o
Notes
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
2. Plastic interlead protrusions of 0.25 mm maximum per side are not included.
OUTLINE
VERSION
SOT403-1
2000 Mar 14
REFERENCES
IEC
JEDEC
EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
95-04-04
99-12-27
MO-153
17
o
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
SOLDERING
If wave soldering is used the following conditions must be
observed for optimal results:
Introduction to soldering surface mount packages
• Use a double-wave soldering method comprising a
turbulent wave with high upward pressure followed by a
smooth laminar wave.
This text gives a very brief insight to a complex technology.
A more in-depth account of soldering ICs can be found in
our “Data Handbook IC26; Integrated Circuit Packages”
(document order number 9398 652 90011).
• For packages with leads on two sides and a pitch (e):
– larger than or equal to 1.27 mm, the footprint
longitudinal axis is preferred to be parallel to the
transport direction of the printed-circuit board;
There is no soldering method that is ideal for all surface
mount IC packages. Wave soldering is not always suitable
for surface mount ICs, or for printed-circuit boards with
high population densities. In these situations reflow
soldering is often used.
– smaller than 1.27 mm, the footprint longitudinal axis
must be parallel to the transport direction of the
printed-circuit board.
Reflow soldering
The footprint must incorporate solder thieves at the
downstream end.
Reflow soldering requires solder paste (a suspension of
fine solder particles, flux and binding agent) to be applied
to the printed-circuit board by screen printing, stencilling or
pressure-syringe dispensing before package placement.
• For packages with leads on four sides, the footprint must
be placed at a 45° angle to the transport direction of the
printed-circuit board. The footprint must incorporate
solder thieves downstream and at the side corners.
Several methods exist for reflowing; for example,
infrared/convection heating in a conveyor type oven.
Throughput times (preheating, soldering and cooling) vary
between 100 and 200 seconds depending on heating
method.
During placement and before soldering, the package must
be fixed with a droplet of adhesive. The adhesive can be
applied by screen printing, pin transfer or syringe
dispensing. The package can be soldered after the
adhesive is cured.
Typical reflow peak temperatures range from
215 to 250 °C. The top-surface temperature of the
packages should preferable be kept below 230 °C.
Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal
of corrosive residues in most applications.
Wave soldering
Manual soldering
Conventional single wave soldering is not recommended
for surface mount devices (SMDs) or printed-circuit boards
with a high component density, as solder bridging and
non-wetting can present major problems.
Fix the component by first soldering two
diagonally-opposite end leads. Use a low voltage (24 V or
less) soldering iron applied to the flat part of the lead.
Contact time must be limited to 10 seconds at up to
300 °C.
To overcome these problems the double-wave soldering
method was specifically developed.
When using a dedicated tool, all other leads can be
soldered in one operation within 2 to 5 seconds between
270 and 320 °C.
2000 Mar 14
18
Philips Semiconductors
Product specification
74AHC259;
74AHCT259
8-bit addressable latch
Suitability of surface mount IC packages for wave and reflow soldering methods
SOLDERING METHOD
PACKAGE
REFLOW(1)
WAVE
BGA, LFBGA, SQFP, TFBGA
not suitable
suitable(2)
HLQFP, HSQFP, HSOP, HTQFP, HTSSOP, SMS
not
PLCC(3), SO, SOJ
suitable
LQFP, QFP, TQFP
SSOP, TSSOP, VSO
suitable
suitable
suitable
not
recommended(3)(4)
suitable
not
recommended(5)
suitable
Notes
1. All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum
temperature (with respect to time) and body size of the package, there is a risk that internal or external package
cracks may occur due to vaporization of the moisture in them (the so called popcorn effect). For details, refer to the
Drypack information in the “Data Handbook IC26; Integrated Circuit Packages; Section: Packing Methods”.
2. These packages are not suitable for wave soldering as a solder joint between the printed-circuit board and heatsink
(at bottom version) can not be achieved, and as solder may stick to the heatsink (on top version).
3. If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave direction.
The package footprint must incorporate solder thieves downstream and at the side corners.
4. Wave soldering is only suitable for LQFP, TQFP and QFP packages with a pitch (e) equal to or larger than 0.8 mm;
it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.65 mm.
5. Wave soldering is only suitable for SSOP and TSSOP packages with a pitch (e) equal to or larger than 0.65 mm; it is
definitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.
DEFINITIONS
Data sheet status
Objective specification
This data sheet contains target or goal specifications for product development.
Preliminary specification
This data sheet contains preliminary data; supplementary data may be published later.
Product specification
This data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 60134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
2000 Mar 14
19
Philips Semiconductors – a worldwide company
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For all other countries apply to: Philips Semiconductors,
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5600 MD EINDHOVEN, The Netherlands, Fax. +31 40 27 24825
Internet: http://www.semiconductors.philips.com
SCA 69
© Philips Electronics N.V. 2000
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
Printed in The Netherlands
613507/01/pp20
Date of release: 2000
Mar 14
Document order number:
9397 750 06821