TOSHIBA TLP114A_07

TLP114A
TOSHIBA Photocoupler
GaAℓAs Ired & Photo−IC
TLP114A
Digital Logic Isolation.
Line Receiver.
Power Supply Control Feedback Control.
Switching Power Supply.
Transistor Inverter.
Unit in mm
The TOSHIBA mini flat coupler TLP114A is a small outline coupler,
suitable for surface mount assembly.
TLP114A consists of a high output power GaAℓAs light emitting diode,
optically coupled to a high speed detector of one chip
photodiode-transistor.
•
Isolation voltage: 3750 Vrms (min.)
•
Switching speed: tpHL = 0.8μs, tpLH = 0.8μs (max.)
(RL = 1.9 kΩ)
•
TTL compatible
•
UL recognized: UL1577, file no. E67349
TOSHIBA
Weight: 0.09g
11−4C2
Pin Configuration (top view)
6
1
1 : ANODE
3 : CATHODE
4 : EMITTER (GND)
5 : COLLECTOR (OUTPUT).
6 : VCC
5
3
SHIELD
4
Schematic
IF
ICC
VCC
1
IO
VF
3
1
6
VO
5
GND
SHIELD
4
2007-10-01
TLP114A
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
(Note 1)
IF
20
mA
Pulse forward current
(Note 2)
IFP
40
mA
Peak transient forward current
(Note 3)
IFPT
1
A
Reverse voltage
VR
5
V
Output current
IO
8
mA
Peak output current
IOP
16
mA
Supply voltage
VCC
−0.5~30
V
Output voltage
VO
−0.5~20
V
PO
100
mW
Operating temperature range
Topr
−55~100
°C
Storage temperature range
Tstg
−55~125
°C
Lead solder temperature(10 sec.)
Tsol
260
°C
BVS
3750
Vrms
Detector
LDE
Forward current
Output power dissipation
(Note 4)
Isolation Voltage
(AC,1 min., R.H.≤ 60°%)
(Note 5)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
(Note 1) Derate 0.36mA / °C above 70°C.
(Note 2) 50% duty cycle, Ims pulse width.
Derate 0.72mA / °C above 70°C.
(Note 3) Pulse width≤ 1μs, 300pps.
(Note 4) Derate 1.8mW / °C above 70°C.
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2007-10-01
TLP114A
Electrical Characteristics (Ta = 25°C)
Characteristic
Symbol
Coupled
Detector
LDE
Forward voltage
Forward voltage
temperature coefficient
Test Condition
Min.
Typ.
Max.
Unit
VF
IF = 16mA
1.22
1.42
1.72
V
ΔVF / ΔTa
IF = 16mA
―
−2
―
mV /°C
Reverse current
IR
VR = 3V
―
―
10
μA
Capacitance between
terminals
CT
VF = 0, f = 1MHz
―
30
―
pF
IOH (1)
IF = 0mA, VCC = VO = 5.5V
―
3
500
nA
IOH (2)
IF = 0mA, VCC = 30V
VO = 20V
―
―
5
IOH
IF = 0mA, VCC = 30V
VO = 20V, Ta = 70°C
―
―
50
High level supply
current
ICCH
IF = 0mA, VCC = 30V
―
0.01
1
μA
Current transfer ratio
IO / IF
20
―
―
%
―
―
0.4
V
―
Ω
High level output
current
Low level output
voltage
VOL
Isolation resistance
RS
Stray capacitance
IF = 16mA, VCC = 4.5V
VO = 0.4V
IF = 16mA, VCC = 4.5V
IO = 2.4 mA
R.H.≤ 60%, VS = 500V
VS= 0, f = 1MHz
CS
between input to output
μA
(Note 5)
(Note 5)
5×10
10
10
14
―
0.8
―
pF
Min.
Typ.
Max.
Unit
―
―
0.8
μs
―
―
0.8
μs
5000
10000
―
V / μs
−5000
−10000
―
V / μs
Switching Characteristics (Ta = 25°C, VCC = 5V)
Symbol
Test
Cir−
cuit
tpHL
1
tpLH
1
Common mode transient
immunity at high output
level
CMH
2
Common mode transient
immunity at low output
level
CML
Characteristic
Propagation delay time
(H→ L)
Propagation delay time
(L→ H)
Test Condition
IF = 0→ 16mA
VCC = 5V, RL = 1.9kΩ
IF = 16→ 0mA
VCC = 5V, RL = 1.9kΩ
IF = 0mA,
VCM = 400Vp−p
RL = 4.1kΩ
IF = 16mA,
2
VCM = 400Vp−p
RL = 4.1kΩ
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2007-10-01
TLP114A
(Note 5) Device considered a two−terminal device: Pins 1 and 3 shorted together, and pins 4,
5 and 6 shorted together.
(Note 6) Maximum electrostatic discharge voltage for any pins: 100V(C=200pF, R=0)
Test Circuit 1: Switching Time Test Circuit
IF
PULSE INPUT
1
6
PW = 100μs
DUTY RATIO = 1/10
0
RL
5
VO
4
OUTPUT
MONITOR
3
5V
VO
1.5V
100Ω
IF MONITOR
IF
VCC = 5V
1.5V
VOL
tpHL
tpLH
Test Circuit =2: Common Mode Transient Immunity Test Circuit
90%
VCC = 5V
IF
1
6
5
3
4
400V
VCM
RL
10%
VO
tr
OUTPUT
MONITOR
VO
(IF = 0mA)
VCM
0V
tf
5V
2V
0.8V
PULSE GEN
ZO = 50Ω
VO
VOL
(IF = 16mA)
CMH =
320(V)
320(V)
CML =
tr (μs) ,
tr (μs)
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2007-10-01
TLP114A
ΔVF / Δta – IF
IF – VF
100
Forward voltage temperature
coefficient ΔVF / Δta (mV / °C )
-4.0
(mA)
Ta = 70°C
10
IF
0°C
Forward current
25°C
0
0.1
0.01
1.0
1.4
1.2
1.6
Forward voltage
-3.6
-3.2
-2.8
-2.4
-2.0
-1.6
-1.2
0.1
2.0
1.8
0.3
(V)
VF
0.5
Forward current
IOH(1) – Ta
300
10
5
IF
VF = 1V
(mA)
100 V = 5.5V
O
50
IO
30
(mA)
VCC = 5V
VO = 0.4V
3 Ta = 25°C
1
Output current
0.5
10
5
3
0.3
0.1
0.05
0.03
1
0.5
0
20
40
80
60
Ambient temperature
IO / IF
–
100
Ta
0.01
0.1
120
0.3 0.5
(°C)
1
3
5
Forward current
IF
(mA)
1.2
IF = 16mA
30
100°C
- 25°C
25°C
10
5
VCC = 5V
3
VO = 0.4V
3
5
Forward current
IF
0.3 0.5
1
10
30
IO / IF (IO / IF)
50
1.0
Nor,alized
Ta = 25°C
1
0.1
30 50
10
IO / IF – Ta
IF
100
Current transfer ratio
IO / IF (%)
30
IO – IF
10
VCC = 5.5V
High level output currency
IOH(1) (nA)
3
1
0.6
0.8
(mA)
Normalized to
VCC = 4.5V
VO = 0.4V
Ta = 25°C
0.4
0
50
8mA
-20
0
20
40
Ambient temperature
5
60
Ta
80
100
(°C)
2007-10-01
TLP114A
VO L – Ta
IO – VO
VCC = 5V
Low level output voltage
VOL (V)
16
25mA
12
20mA
15mA
8
10mA
4
0
0
VCC = 5V
Ta = 25°C
IO
(mA)
20
Output current
0.4
0.3
IF = 16mA
IO = 2.4mA
0.2
8mA
1.1mA
0.1
IF = 5mA
2
1
3
Output voltage
VO
0
- 25
5
4
0
25
Ambient temperature
(V)
tpHL, tpLH – RL
75
Ta
100
(°C)
tpHL, tpLH – Ta
3
5
IF = 16mA
3 VCC = 5V
Ta = 25°C
IF = 16mA
VCC = 5V
Propagation delay time
tpHL, tpLH (μs)
Propagation delay time
tpHL, tpLH (μs)
50
tpLH
1
0.5
0.3
tpHL
RL = 1.9kΩ
1
0.5
tpLH
0.3
tpHL
0.1
1
3
5
0.1
10
Load resistance
30
RL
50
100
(kΩ)
0
20
40
Ambient temperature
6
80
60
Ta
100
(°C)
2007-10-01
TLP114A
RESTRICTIONS ON PRODUCT USE
20070701-EN
• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patents or other rights of
TOSHIBA or the third parties.
• GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break,
cut, crush or dissolve chemically.
• Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
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2007-10-01