TLP554 TOSHIBA PHOTOCOUPLER GaAlAs IRED & PHOTO-IC TLP554 ISOLATED LINE RECEIVER SIMPLEX/MULTIPLEX DATA TRANSMISSION COMPUTER-PERIPHERAL INTERFACE MICROPROCESSOR SYSTEM INTERFACES DIGITAL ISOLATION FOR A/D,D/A CONVERSION Unit: mm The TOSHIBA TLP554 a photocoupler which combines a GaAlAsIRED as the emitter and an integrated high gain, high speed photodetector. The output of the detector circuit is an open collector, Schottky Clamped transistor. A Faraday shield integrated on the photodetector chip reduces the effects of capacitive coupling between the input LED emitter and the high gain stages of the detector. This provides an effective common mode transient immunity of 1000V/us. z z z z z z Input Current Threshold Switching Speed Common mode transient immunity Guaranteed Performance Over Temperature Isolation Voltage UL Recognized : IF=5mA(Max.) : 10MBd(TYP,@NRZ) : ±1000V/us(Min) : 0~70°C : 2500Vrms(Min) :UL1577,File No.E67349 Truth Table (Positive Logic) INPUT ENABLE OUTPUT H H L L H H H L H L L H SCHEMATIC IF VF IO 8 3－ 6 SHIELD 7 VE IE 5 11-10C4 PIN CONFIGURATION (TOP VIEW) 1:NC 1 8 VCC ICC 2＋ JEDEC TOSHIBA Weight: 0.54 g VCC 2 7 3 6 VO GND 4 SHIELD GND 5 2:ANODE 3:CATHODE 4:N.C. 5:GND 6:VO(OUTPUT) 7:VE(ENABLE) 8:VCC A 0.1μF bypass capacitor must be connected Between pins 8 and 5.(See Note 1) 1 2007-10-01 TLP554 Recommended Operating Conditions CHARACTERISTIC SYMBOL MIN. TYP. MAX. UNIT Low Level input Voltage VFL -3 0 1.0 V High Level input current IFH 6.3* ⎯ 20 mA Supply Voltage VCC 4.5 5 5.5 V High-Level Enable Voltage VEH 2.0 ⎯ VCC V Low-Level Enable Voltage VEL 0 ⎯ 0.8 V N ⎯ ⎯ 8 ⎯ Topr 0 ⎯ 70 °C Fan Out(TTL Load) Operating Temperature Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. *6.3mA condition permits at least 20% CTR degradation Initial switching threshold is 5.0mA or less. Absolute Maximum Ratings (Ta = 25°C) DETECTOR LED CHARACTERISTIC SYMBOL RATING UNIT Forward Current IF 20 mA Reverse Voltage VR 5 V Output Current IO 25 mA Output Voltage VO -0.5~7 V Supply Voltage (Note 2) VCC 7 V Enable Voltage (Note 3) VE 5.5 V PO 40 mW Storage Temperature Range Tstg −55~125 °C Operating Temperature Range Topr −40~85 °C Output Power Dissipation Lead Soldering Temperature (10 s) (Note 4) Tsol 260 °C Isolation Voltage (AC, 1 minute, R.H.≤ 60%) (Note 5) BVS 2500 Vrms Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note 1) The VCC supply voltage to each TLP554 isolator must be bypassed by a 0.1μF capacitor or larger.This can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and GND pins each device. (Note 2) 1 Minute Maximum. (Note 3) Not to exceed VCC by more than 500mV. (Note 4) 2mm below seating plane. (Note 5) Device considered a two-terminal device :Pins 1,2,3 and 4 shorted together,and Pins 5, 6,7 and 8 shorted together. 2 2007-10-01 TLP554 Electrical Characteristics (Ta = 0~70°C , VCC=4.5~5.5V , VFL≤1.0V) CHARACTERISTIC Forward Voltage SYMBOL VF Temperature Coefficient of Forward Voltage ∆VF/∆Ta TEST CONDITION MIN. IF = 10 mA , Ta=25°C TYP.* MAX. UNIT 1.65 1.80 V IF = 10 mA , ⎯ -2.0 ⎯ mV/°C Input Reverse Current IR VR=5V, Ta=25°C ⎯ ⎯ 10 μA Input Capacitance CT V = 0 , f = 1MHz , Ta=25°C ⎯ 45 ⎯ pF Ta=0~70°C ⎯ 10 250 Ta=25°C ⎯ 0.5 10 High-Level Output Current IOH VF = 1.0V VO = 5.5V VE = 2.0V μA Low-Level Output Voltage VOL IF=5mA , VE=2.0V , IOL=13mA ⎯ 0.4 0.6 V High Level input current IFH IOL=13mA , VE=2.0V , VOL=0.6V ⎯ ⎯ 5 mA IF=0mA ⎯ 7 15 IF=10mA ⎯ 12 19 VE=2.0V ⎯ -1.0 ⎯ VE=0.5V ⎯ -1.6 -2.0 2.0 ⎯ ⎯ ⎯ ⎯ 0.8 ⎯ 0.6 ⎯ pF 14 ⎯ Ω High Level ICCH Low Level ICCL High Level IEH Supply Current Enable Current VCC=5.5V VE=0.5V mA VCC=5.5V Low Level IEL High Level VEH ⎯ Low Level VEL ⎯ Enable Voltage (Note 6) Capacitance (Input-Output) CS VS=0 , f=1MHz , Ta=25℃ Resistance (Input-Output) RS VS=500V , Ta=25℃ , R.H. ≤60% 10 5×10 10 mA V (*)All typ.values are at Ta=25°C (Note 6) No pull up resistor required as the device has an internal pull up resistor. 3 2007-10-01 TLP554 Switching Characteristics (Ta = 25°C , VCC=5V) CHARACTERISTIC Propagation Delay Time SYMBOL L→H H→L TYP. MAX. IF=7.5→0mA ⎯ 60 120 tpHL CL=15pF IF=0→7.5mA ⎯ 60 120 IF=7.5→0 / 0→7.5mA RL=350Ω, CL=15pF ⎯ 30 ⎯ ⎯ 30 ⎯ RL=350Ω CL=15pF IF=7.5 mA VE=0.5→3.0V ⎯ 25 ⎯ VE=3.0→0.5V ⎯ 25 ⎯ IF=0mA VO(Min)=2.0V 1000 10000 ⎯ IF=7.5mA (Note 7) VO(Max)=0.8V -1000 Output Fall Time(10-90%) tf tELH Outout MIN. RL=350Ω tr Common Mode Transient Immunity at Hight Level Outout Common Mode Transient Immunity at Low Level TEST CONDITION tpLH Output Rise Time(10-90%) Enable Propagation Delay Time TEST CIRCUIT tEHL 1 2 VCM=400V CMH 3 ns ns ns V/μs RL=350Ω CML UNIT -10000 ⎯ (Note 7) CMHּThe maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state(i.e.,VOUT>2.0V) CMLּThe maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state(i.e.,VOUT<0.8V) Measured in volts per microsecond(V/μs). (Note 8) Maximum electrostatic discharge voltage for any pins:180V(C=200pF,R=0) 4 2007-10-01 TLP554 IF=7.5mA 5 2007-10-01 TLP554 6 2007-10-01 TLP554 7 2007-10-01 TLP554 RESTRICTIONS ON PRODUCT USE 20070701-EN • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2007-10-01