MP4501 TOSHIBA Power Transistor Module Silicon NPN Epitaxial Type (Four Darlington Power Transistors in One) MP4501 Industrial Applications High Power Switching Applications Hammer Drive, Pulse Motor Drive and Inductive Load Switching • Package with heat sink isolated to lead (SIP 12 pins) • High collector power dissipation (4-device operation) • High collector current: IC (DC) = 3 A (max) Unit: mm : PT = 5 W (Ta = 25°C) • High DC current gain: hFE = 2000 (min) (VCE = 2 V, IC = 1.5 A) • Diode included for absorbing fly-back voltage Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit Collector-base voltage VCBO 120 V Collector-emitter voltage VCEO 100 V Emitter-base voltage VEBO 6 V DC IC 3 Pulse ICP 6 IB 0.5 A PC 3.0 W Collector current Continuous base current Collector power dissipation (1-device operation) Collector power dissipation Ta = 25°C (4-device operation) Tc = 25°C A JEITA ― TOSHIBA 2-32B1A Weight: 6.0 g (typ.) W 25 VIsol 1000 V Tj 150 °C Tstg −55 to 150 °C Junction temperature Storage temperature range ― 5.0 PT Isolation voltage JEDEC Array Configuration 2 3 4 5 1 9 8 10 11 12 6 7 R1 R2 R1 ≈ 4.5 kΩ R2 ≈ 300 Ω 1 2004-07-01 MP4501 Marking MP4501 JAPAN Part No. (or abbreviation code) Lot No. A line indicates lead (Pb)-free package or lead (Pb)-free finish. Thermal Characteristics Characteristics Thermal resistance from junction to ambient Symbol Max Unit ΣRth (j-a) 25 °C/W ΣRth (j-c) 5.0 °C/W TL 260 °C (4-device operation, Ta = 25°C) Thermal resistance from junction to case (4-device operation, Tc = 25°C) Maximum lead temperature for soldering purposes (3.2 mm from case for 10 s) Electrical Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Collector cut-off current ICBO VCB = 120 V, IE = 0 A ― ― 10 μA Collector cut-off current ICEO VCE = 100 V, IB = 0 A ― ― 10 μA Emitter cut-off current IEBO VEB = 6 V, IC = 0 A 0.5 ― 2.5 mA Collector-base breakdown voltage V (BR) CBO IC = 1 mA, IE = 0 A 120 ― ― V Collector-emitter breakdown voltage V (BR) CEO IC = 10 mA, IB = 0 A 100 ― ― V hFE (1) VCE = 2 V, IC = 1.5 A 2000 ― 15000 hFE (2) VCE = 2 V, IC = 3 A 1000 ― ― DC current gain Collector-emitter VCE (sat) IC = 1.5 A, IB = 3 mA ― ― 1.5 Base-emitter VBE (sat) IC = 1.5 A, IB = 3 mA ― ― 2.0 fT VCE = 2 V, IC = 0.5 A ― 60 ― MHz VCB = 10 V, IE = 0 A, f = 1 MHz ― 30 ― pF ― 0.3 ― ― 2.0 ― ― 0.4 ― Transition frequency Collector output capacitance Turn-on time Cob ton Input Storage time 20 μs tstg IB2 IB2 IB1 Switching time Fall time IB1 Output 20 Ω Saturation voltage ― V μs VCC = 30 V tf IB1 = −IB2 = 3 mA, duty cycle ≤ 1% 2 2004-07-01 MP4501 Emitter-Collector Diode Ratings and Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Maximum forward current IFM ― ― ― 3 A Surge current IFSM t = 1 s, 1 shot ― ― 6 A IF = 1 A, IB = 0 A ― 1.2 1.8 V Forward voltage VF Reverse recovery time trr Reverse recovery charge Qrr IF = 3 A, VBE = −3 V, dIF/dt = −50 A/μs ― 1.0 ― μs ― 5 ― μC Flyback-Diode Rating and Characteristics (Ta = 25°C) Characteristics Maximum forward current Symbol Test Condition Min Typ. Max Unit IFM ― ― ― 3 A Reverse current IR VR = 120 V ― ― 0.4 μA Reverse voltage VR IR = 100 μA 120 ― ― V Forward voltage VF IF = 0.5 A ― ― 1.8 V 3 2004-07-01 MP4501 IC – VCE IC – VBE 6 6 10 3 Common emitter 1 5 (A) (A) 0.3 4 Collector current IC Collector current IC 5 VCE = 2 V 0.5 0.2 3 2 IB = 0.15 mA Common emitter Tc = 25°C 1 1 2 3 4 5 Collector-emitter voltage 6 3 2 Tc = 100°C 1 0 0 0 4 0 0 7 0.4 VCE (V) 0.8 VCE (V) 25 −55 1000 500 0.1 2.8 VBE (V) 0.3 1 Collector current IC 3 10 Tc = 25°C 2.0 IC = 6 A 1.6 5 4 3 2 1.2 1 0.8 0.1 0.4 0.5 ) 300 0.05 2.4 Common emitter Tc = 100°C 3000 2.0 VCE – IB Common emitter VCE = 2 V 5000 1.6 2.4 Collector-emitter voltage DC current gain hFE 10000 1.2 Base-emitter voltage hFE – IC 20000 −55 25 0 0.1 (A) 0.3 1 3 10 30 100 300 Base current IB (mA) VCE (sat) – IC VBE (sat) – IC 10 Common emitter Base-emitter saturation voltage VBE (sat) (V) Collector-emitter saturation voltage VCE (sat) (V) 10 IC/IB = 500 5 3 1 Tc = −55°C 0.5 100 0.3 0.1 0.3 25 1 Collector current IC 3 Common emitter 3 Tc = −55°C 1 (A) 25 100 0.5 0.3 0.1 10 IC/IB = 500 5 0.3 1 Collector current IC 4 3 10 (A) 2004-07-01 MP4501 rth – tw Transient thermal resistance rth (°C/W) 300 100 Curves should be applied in thermal limited area. (single nonrepetitive pulse) The figure shows thermal resistance per device versus pulse width. (4) 30 (3) (2) 10 (1) 3 -No heat sink/Attached on a circuit board(1) 1-device operation (2) 2-device operation 1 (3) 3-device operation (4) 4-device operation 0.3 0.001 0.01 0.1 1 Circuit board 10 Pulse width 100 1000 tw (s) PT – Ta Safe Operating Area 10 IC max (pulsed)* 100 μs* 5 10 ms* 1 ms* Total power dissipation 1 0.5 0.3 (1) 1-device operation (2) 2-device operation (3) 3-device operation (4) 4-device operation Attached on a circuit board 6 (4) (3) 4 (2) Circuit board (1) 2 0.1 0 0 0.05 0.03 *: Single nonrepetitive pulse Tc = 25°C Curves must be derated linearly with increase in temperature. 0.01 0.3 1 3 10 30 40 80 120 160 200 Ambient temperature Ta (°C) VCEO max 100 Collector-emitter voltage VCE (V) ΔTj – PT 160 Junction temperature increase ΔTj (°C) Collector current IC (A) 3 PT (W) 8 (1) (2) (3) (4) 120 80 Circuit board Attached on a circuit board 40 0 0 (1) 1-device operation (2) 2-device operation (3) 3-device operation (4) 4-device operation 2 4 6 Total power dissipation 5 8 PT 10 (W) 2004-07-01 MP4501 RESTRICTIONS ON PRODUCT USE 20070701-EN • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 6 2004-07-01