TLP550 TOSHIBA Photocoupler Infrared LED + Photo IC TLP550 Digital Logic Isolation Line Receiver Feedback Control Power Supply Control Switching Power Supply Transistor Inverter Unit in mm TLP550 constructs a high emitting diode and a one chip photo diode− transistor. TLP550 has no base connection, and is suitable for application at noisy environmental condition. This unit is 8−lead DIP package. z Isolation voltage: 2500 Vrms (min.) z Switching speed: tpHL, tpLH = 0.5μs (typ.)(RL=1.9 kΩ) z TTL compatible TOSHIBA 11−10C4 Weight: 0.54 g (typ.) z UL recognized: UL1577, file No. E67349 Pin Configuration (top view) 1 8 2 7 3 6 4 5 1 : N.C. 2 : Anode 3 : Cathode 4 : N.C. 5 : Emitter 6 : Collector 7 : N.C. 8 : Cathode Schematic ICC VCC IF 8 2 VF 3 IO 6 5 1 VO GND 2007-10-01 TLP550 Current Transfer Ratio Classification Current Transfer Ratio (%) (IC/IF) MIN MAX Marking of Classification (None) 10 ― Blank, O, Y Rank O 19 ― O Rank Y 35 ― Y Absolute Maximum Ratings (Ta = 25°C) Characteristic Symbol Rating Unit (Note 1) IF 25 mA Pulse forward current (Note 2) IFP 50 mA Peak transient forward current (Note 3) IFPT 1 A VR 5 V PD 45 mW Output current IO 8 mA Peak output current IOP 16 mA Supply voltage VCC −0.5~15 V Output voltage VO −0.5~15 V PO 100 mW Operating temperature range Topr −55~100 °C Storage temperature range Tstg −55~125 °C Lead solder temperature (10s) Tsol 260 °C BVS 2500 Vrms LED Forward current Reverse voltage Diode power dissipation Detector (Note 4) Output power dissipation (Note 5) Isolation voltage (AC, 1min., R.H. = 40~60%) (Note 6) Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note 1) Derate 0.8mA above 70°C. (Note 2) 50% duty cycle, 1ms pulse width. Derate 1.6mA / °C above 70°C. (Note 3) Pulse width 1μs, 300pps. (Note 4) Derate 0.9mW / °C above 70°C. (Note 5) Derate 2mW / °C above 70°C. 2 2007-10-01 TLP550 Electrical Characteristics (Ta = 25°C) Characteristic Symbol Detector LED Forward voltage Forward voltage temperature coefficient Test condition Typ. Max. Unit VF IF = 16 mA 1.45 1.65 1.85 V ΔVF /ΔTa IF = 16 mA ― −2 ― mV / °C Reverse current IR VR = 5 V ― ― 10 μA Capacitance between terminal CT VF = 0, f = 1MHz ― 60 ― pF IOH (1) IF = 0 mA, VCC = VO = 5.5 V ― 3 500 nA IOH (2) IF = 0 mA, VCC = VO = 15 V ― ― 5 μA IOH IF = 0 mA, VCC = VO = 15 V Ta = 70°C ― ― 50 μA ICCH IF = 0 mA, VCC = 15 V ― 0.01 1 μA 10 30 ― Rank : 0 19 30 ― Rank : Y 35 50 Ta = 0~70°C 5 ― ― 15 ― ― ― 0.4 V ― Ω pF High level output current High level supply voltage Ta = 25°C Current transfer ratio Coupled Min. IO / IF IF = 16 mA VCC = 4.5 V VO = 0.4 V Rank : 0, Y % Low level output voltage VOL IF = 16 mA, VCC = 4.5 V IO = 1.1 mA (rank 0: IO = 2.4mA) ― Isolation resistance RS R.H. = 40~60%, V = 1kV DC (Note 6) ― Capacitance between input to output CS V = 0, f = 1MHz ― 0.8 ― Min. Typ. Max. ― 0.3 0.8 ― 0.5 0.8 ― 1.0 2.0 ― 0.6 1.2 ― 1500 ― V /μs ― −1500 ― V /μs 10 12 Switching Characteristics (Ta = 25°C) Characteristic Symbol Test Condition IF = 0→ 16 mA, VCC = 5V, RL = 4.1 kΩ Propagation delay time (H→ L) tpHL Propagation delay time (L→ H) tpLH Common mode transient immunity at high output level CMH Common mode transient immunity at low output level CML Unit μs (Note 7) Rank 0: RL = 1.9 kΩ IF = 16→ 0 mA, VCC = 5V, RL = 4.1 kΩ μs (Note 7) Rank 0: RL = 1.9 kΩ IF = 0 mA, VCM = 200 Vp−p RL = 4.1 kΩ (rank 0: RL = 1.9 kΩ) (Note 8) IF = 16 mA, VCM = 200 Vp−p RL = 4.1 kΩ (rank 0: RL = 1.9 kΩ) (Note 8) (Note 6) Device considered two−terminal device: Pins 1, 2, 3 and 4 shorted together and pin 5, 6, 7 and 8 shorted together. 3 2007-10-01 TLP550 (Note 7) Switching time test circuit. IF IF VCC=5V 1 8 PW = 100μs Duty ratio = 1 / 10 IF monitor 2 7 3 6 VO 51Ω Pulse input 4 5 Output monitor 0 RL VO 5V 1.5V VOL 1.5V tpHL tpLH (Note 8) Common mode transient immunity test circuit. IF 1 8 2 7 VCC=5V 90% VCM 10% RL 3 6 VO 4 5 Output monitor tr VO (IF = 0mA) VCM VO (IF = 16mA) Pulse gen 200V 0V tf 5V 2V 0.8V VOL ZO=50Ω CMH= 160 (V) tf (μs) , CML= 160 (V) tf (μs) (Note 9) Maximum electrostatic discharge voltage for any pins: 100V (C = 200pF, R = 0) 4 2007-10-01 TLP550 IF – V F (mA) 10 Forward current IF 50 30 3 Ta = 25°C 5 1 0.5 0.3 0.1 0.05 0.03 0.01 1.0 ΔVF / ΔTa – IF −2.6 Forward voltage temperature coefficient ΔVF / ΔTa (mV / ℃) 100 1.4 1.2 1.6 Forward voltage VF −2.2 −2.0 −1.8 −1.6 −1.4 0.1 2.0 1.8 −2.4 0.3 0.5 1 3 Forward current (V) IOH (1) – Ta lO – IF (mA) 100 50 IO 30 Output current IOH (μA) High level output current 30 (mA) 10 300 10 5 3 VCC = 5V 5 VO = 0.4V 3 Ta = 25°C 1 0.5 0.3 0.1 0.05 0.03 1 0.6 0 40 80 120 Ambient temperature 0.01 0.1 160 0.3 0.5 1 3 5 10 Forward current Ta (℃) IO / IF – IF 100 30 50 100 IF 300 (mA) IO / IF – Ta 1.2 VCC = 5V VO = 0.4V 50 1.0 30 Ta = −25°C Normalized IO / IF Current transfer ratio IO / IF (%) IF 10 5 100°C 10 25°C 5 3 0.8 0.6 Normalized To : 0.4 IF = 16mA VCC = 4.5V VO = 0.4V 0.2 Ta = 25°C 1 0.3 0.5 1 3 5 Forward current IF 10 30 0 −40 50 −20 0 20 40 60 80 100 (mA) Ambient temperature 5 Ta (℃) 2007-10-01 TLP550 IO – V O VO – IF 5 30mA VCC = 5V 10 4 15mA 4 10mA IF=5mA 2 0 0 RL (V) 20mA Output voltage VO Output current IO (mA) 25mA 8 6 VO 3 Ta=25°C 2 RL=2kΩ 3.9kΩ 10kΩ 1 0 1 2 3 4 5 Output voltage VO VCC = 5V IF Ta = 25°C 6 7 0 (V) 4 8 12 16 Forward current IF 20 24 (mA) tpHL, tpLH – RL 5 Propagation delay time tpLH, tpHL (μs) 3 IF = 16mA VCC = 5V Ta = 25°C tpLH 1 0.5 0.3 tpHL 0.1 1 3 5 10 30 50 100 Load resistance RL (kΩ) 6 2007-10-01 TLP550 RESTRICTIONS ON PRODUCT USE 20070701-EN • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 7 2007-10-01