TOSHIBA TLP719

TLP719
TOSHIBA PHOTOCOUPLER GaAℓAs IRED + PHOTO−IC
TLP719
Unit in mm
Digital logic ground isolation
Line receivers
Microprocessor system interfaces
Switching power supply feedback control
Transistor invertors
4.58±0.25
Open collector
•
Package type
: SDIP6
•
Isolation voltage
: 5000 Vrms (min)
•
•
Common mode transient immunity
Switching speed
: ±10 kV/us(min) @VCM = 400 V
: tpHL/ tpLH = 0.8 μs (max)
@ IF = 16 mA , VCC = 5 V,
RL = 1.9 kΩ , Ta = 25 °C
•
TTL compatible
•
Construction mechanical rating
•
•
UL recognized
Option (D4)
TÜV approved
+0.25
4.0 −0.20
7.62±0.25
−0.05
1.27±0.2
1.25±0.25
0.4±0.1
9.7±0.3
11-5J1
•
Creepage Distance
Clearance
Insulation Thickness
1 2 3
0.25± +0.10
The TOSHIBA TLP719 consists of a GaAℓAs high-output light-emitting diode and a
high-speed detector.
This unit is a 6-lead SDIP. The TLP719 is 50% smaller than the 8-pin DIP and
meets the reinforced insulation class requirements of international safety standards.
Therefore the mounting area can be reduced in equipment requiring safety standard
certification.
The TLP719 has a Faraday shield integrated on the photodetector chip to provide
an effective common mode noise transient immunity. Therefore this product is
suitable for application in noisy environmental conditions.
3.65 +0.15
−0.25
6.8±0.25
6 5 4
TOSHIBA
11-5J1
Weight：0.26 g (t yp .)
PIN CONFIGURATION (Top View)
7.62-mm pitch
standard type
10.16-mm pitch
TLPXXXF type
7.0 mm (min)
7.0 mm (min)
0.4 mm (min)
1
6
8.0 mm (min)
8.0 mm (min)
0.4 mm (min)
2
5
: UL1577, File No. E67349
3
SHIELD
1 : ANODE
2 : N.C.
3 : CATHODE
4 : EMITTER (GND)
5 : COLLECTOR (OUTPUT)
4
6 : VCC
: EN60747-5-2
Certificate No. R50033433
Maximum operating insulation voltage : 890 Vpk
Highest permissible over voltage
: 8000 Vpk
( Note ) When a EN60747-5-2 approved type is needed,
please designate the “Option(D4)”
SCHEMATIC
IF
1
ICC
IO
VF
3
6
5
SHIELD
4
VCC
VO
GND
A 0.1-μF bypass capacitor must be
connected between pins 4 and 6.
(See Note 7.)
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2007-10-01
TLP719
Absolute Maximum Ratings (Ta = 25 °C)
Characteristic
Symbol
Rating
Unit
(Note 1)
IF
25
mA
Pulse forward current
(Note 2)
IFP
50
mA
Peak transient forward current
(Note 3)
IFPT
1
A
VR
5
V
(Note 4)
PD
45
mW
Junction temperature
Tj
125
°C
Output current
IO
8
mA
Peak output current
IOP
16
mA
Output voltage
VO
−0.5~20
V
Supply voltage
VCC
−0.5~30
V
PO
100
mW
Tj
125
°C
Operating temperature range
Topr
−55~100
°C
Storage temperature range
Tstg
−55~125
°C
Lead soldering temperature (10 s)
Tsol
260
°C
BVS
5000
Vrms
LED
Forward current
Reverse voltage
Detector
Diode power dissipation
Output power dissipation
(Note 5)
Junction Temperature
Isolation voltage (AC, 1 minute, R.H.≤ 60 %)
(Note 6)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Derate 0.45 mA / °C above 70 °C.
Note 2: 50% duty cycle, 1 ms pulse width.
Derate 0.9 mA / °C above 70 °C.
Note 3: Pulse width ≤ 1 μs, 300 pps.
Note 4: Derate 0.8 mW / °C above 70 °C.
Note 5: Derate 1.8 mW / °C above 70 °C.
Note 6: Device considered a two-terminal device: pins 1, 2 and 3 paired with pins 4, 5 and 6 respectively.
Note 7: A ceramic capacitor (0.1 μF) should be connected from pin 6 to pin 4 to stabilize the operation of the
high-gain linear amplifier. Failure to provide the bypassing may impair the switching property.
The total lead length between capacitor and coupler should not exceed 1 cm.
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2007-10-01
TLP719
Electrical Characteristics (Ta = 25 °C)
Characteristic
LED
Forward voltage
Forward voltage
Temperature coefficient
Symbol
Min.
Typ.
Max.
Unit
1.65
1.85
V
VF
IF = 16 mA
ΔVF / ΔTa
IF = 16 mA
―
−2
―
mV / °C
Reverse current
IR
VR = 5 V
―
―
10
μA
Capacitance between terminals
CT
VF = 0 V , f = 1 MHz
―
45
―
pF
IF = 0 mA ,VCC = VO = 5.5 V
―
3
500
nA
IF = 0 mA ,VCC = 30 V
―
―
5
―
―
50
IOH (1)
HIGH-level output current
Detector
Test Condition
IOH (2)
IOH
VO = 20 V
μA
IF = 0 mA ,VCC = 30 V
VO = 20 V,Ta = 70 °C
HIGH-level supply current
ICCH
IF = 0 mA ,VCC = 30 V
―
0.01
1
μA
Supply voltage
VCC
ICC = 0.01 mA
30
―
―
V
Output voltage
VO
IO = 0.5 mA
20
―
―
V
Min.
Typ.
Max.
Unit
20
―
―
%
―
―
0.4
V
Min.
Typ.
Max.
Unit
―
0.8
―
pF
―
Ω
Coupled Electrical Characteristics (Ta = 25 °C)
Characteristic
Current transfer ratio
LOW-level output voltage
Symbol
IO / IF
VOL
Test Condition
IF = 16 mA ,VCC = 4.5 V
VO = 0.4 V
IF = 16 mA, VCC = 4.5 V
IO = 2.4 mA
Isolation Characteristics (Ta = 25 °C)
Characteristic
Symbol
Capacitance input to output
CS
Isolation resistance
RS
Test Condition
V = 0 V , f = 1 MHz
R.H. ≤ 60% ,VS = 500 V
AC, 1 minute
Isolation voltage
BVS
(Note 6)
(Note 6)
1×10
12
10
14
5000
―
―
AC, 1 second , in oil
―
10000
―
DC, 1 minute , in oil
―
10000
―
3
Vrms
Vdc
2007-10-01
TLP719
Switching Characteristics (Ta = 25 °C, VCC = 5 V)
Characteristic
Test
Circuit
Symbol
Propagation delay time
(H→ L)
Test Condition
tpHL
Fig1
Min.
Typ.
Max.
Unit
IF = 0→ 16 mA
RL = 1.9kΩ
―
―
0.8
μs
―
―
0.8
μs
(L→ H)
tpLH
IF = 16→ 0 mA
RL = 1.9kΩ
Common mode transient
immunity at logic HIGH output
(Note 8)
CMH
IF = 0 mA
VCM = 400 Vp−p
RL = 1.9kΩ
10000
―
―
V / μs
IF = 16 mA
VCM = 400 Vp−p
RL = 1.9 kΩ
−10000
―
―
V / μs
Propagation delay time
Common mode transient
immunity at logic LOW output
(Note 8)
Fig2
CML
Note 8 : CML is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic
LOW state (VO < 0.8 V).
CMH is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic
HIGH state (VO >2 V).
Figure 1. Switching Time Test Circuit
IF
PULSE INPUT
( PW = 100 μs
Duty = 10%)
→
VCC = 5 V
1
6
2
5
3
4
RL
IF
VO
MONITORING NODE
0.1 μF
tpHL
tpLH
VO
5V
SHIELD
IF MONITORING NODE
1.5V
VOL
Figure 2. Common Mode Noise Immunity Test Circuit.
IF
→
SW
A
B
1
6
2
5
3
4
−
VCM
RL=1.9kΩ
VO
0.1μF
VCM
tr
VOH
SW:B (IF= 0 mA)
SHIELD
+
90%
VCC=5V
VOL
SW:A (IF = 16 mA)
4
tf
400 V
10%
0V
CMH
2V
0.8 V
CML
320 (V)
tr (μs)
CMH =
CML = −
320 (V)
tf (μs)
2007-10-01
TLP719
ΔVF / ΔTa – IF
Forward current
IF (mA)
50
30
Forward voltage temperature coefficient
Δvf / Δta (mV / °C)
IF – V F
100
Ta = 25°C
10
5
3
1
0.5
0.3
0.1
0.05
0.03
0.01
1.0
1.2
1.4
1.6
Forward voltage
1.8
VF
2.0
−2.6
−2.4
−2.2
−2.0
−1.8
−1.6
−1.4
0.1
0.3 0.5
3
Forward current
(V)
IOH(1) – Ta
IF
5
10
30
(mA)
IO – IF
10
300
(mA)
100
50
IO
30
Output current
High level output current
IOH(1) (nA)
1
10
5
3
VCC = 5 V
5
VO = 0.4 V
3
Ta = 25°C
1
0.5
0.3
0.1
0.05
0.03
1
0
40
80
120
Ambient temperature
Ta
0.01
0.1
160
0.3 0.5
(°C)
1
(mA)
IO / IF – Ta
VCC = 5 V
VO = 0.4 V
50
1.0
30
IO / IF
(%)
IO / IF
IF
300
1.2
10
Normalized
Ta = 25°C
Current transfer ratio
30 50 100
10
5
Forward current
IO / IF – IF
100
3
25°C
100°C
5
3
0.8
0.6
Normalized to
IF = 16 mA
0.4
VCC = 4.5 V
VO = 0.4 V
0.2
1
0.3 0.5
1
3
Forward current
5
10
IF
30
0
-40
50
(mA)
-20
0
20
40
Ambient temperature
5
60
Ta
80
100
(°C)
2007-10-01
TLP719
IO – VO
VO – IF
VCC = 5 V
30mA
10
5
VO (V)
(mA)
8
IO
20mA
4
RL
Vo
15mA
4
10mA
2
IF = 5mA
1
3
2
4
Output voltage
5
VO
6
4
8
12
Forward current
16
20
IF
(mA)
24
tpHL , tpLH - Ta
5
VCC=5V
tpLH
Ta=25℃
3.9 kΩ
1
(V)
I F =16mA
3
RL = 2 kΩ
0
0
7
tpHL, tpLH - RL
5
Ta = 25°C
2
10 kΩ
Propagation delay time
tpHL, tpLH （μs）
Output current
6
Output voltage
3
0
0
Propagation delay time
tpHL, tpLH (μs）
VCC = 5V
IF
Ta = 25°C
25mA
1
0.5
tpHL
0.3
3
I F =16mA
VCC=5V
RL=1.9kΩ
1
0.5
tpHL
0.3
tpLH
0.1
1
3
5
10
30
50
0.1
-40
100
Load resistance　R L　（ｋΩ）
-20
0
20
40
60
80
100
Ambient temperature　Ta　（℃）
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TLP719
RESTRICTIONS ON PRODUCT USE
20070701-EN
• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patents or other rights of
TOSHIBA or the third parties.
• GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break,
cut, crush or dissolve chemically.
• Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
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2007-10-01