MITSUBISHI M5M28F101AFP

MITSUBISHI
LSIs
MITSUBISHI
LSIs
M5M28F101AFP,J,VP,RV-85,-10
M5M28F101AFP,J,VP,RV-85,-10
1048576-BIT
1048576-BIT
(131072-WORD
(131072-WORD
BY BY
8-BIT)
8-BIT)
CMOS
CMOS
FLASH
FLASH
MEMORY
MEMORY
ADDRESS
INPUTS
DATA INPUTS/
OUTPUTS
1
32
2
31
3
30
4
29
5
28
6
7
8
9
10
27
26
25
24
23
11
22
12
21
13
20
14
19
15
18
16
17
VCC
ENABLE
WE WRITE
INPUT
NC
A14
A13
A8 ADDRESS
INPUTS
A9
A11
OE OUTPUT
ENABLE INPUT
A10 ADDRESS INPUT
ENABLE
CE CHIP
INPUT
D7
D6
D5
D4
D3
DATA
INPUTS/
OUTPUTS
Outline 525mil 32pin SOP (32P2M-A)
30
5
29
6
28
7
27
8
26
9
25
M5M28F101AJ
20
A14
A13
A8
A9
A11
OE
A10
CE
D7
D1
D2
GND
D3
D4
D5
D6
19
21
18
22
13
17
23
12
16
24
11
14
10
15
A7
A6
A5
A4
A3
A2
A1
A0
D0
Micro-computer system and peripheral equipment
31
1
APPLICATION
32
2
4
Speed item ........................................................ 85 ns (max.)
Speed item .......................................................100 ns (max.)
................................... VCC = 5V±0.5V
Power supply voltage ...................................
Write and erase voltage ................................
................................ VPP = 12V±0.6V
Byte program and Chip erase
Auto program and Auto erase
Program/erase operation controlled by software command
Program/erase pulse controlled by an embedded timer
10000 program/erase cycles
Tri-state output buffer
TTL-compatible input and output in read and write mode
Contained device-identifier code
Incorporated data-protection
Available packaging for Surface Mount
VPP
A16
A15
A12
A7
A6
A5
A4
A3
A2
A1
A0
D0
D1
D2
GND
M5M28F101AFP
FEATURES
PIN CONFIGURATION (TOP VIEW)
A12
A15
A16
VPP
VCC
WE
NC
The MITSUBISHI M5M28F101A is high-speed 1048576-bit CMOS
Flash Memories. This is suitable for the applications with microprocessor or micro-controller where on-board reprogramming is
required. The M5M28F101A is fabricated by N-channel double
polysilicon gate for memory and CMOS technology for peripheral
circuits, and is available in 32pin plastic molded packages.
3
DESCRIPTION
Outline 32pin PLCC (32P0)
A11
A9
A8
A13
A14
NC
WE
VCC
VPP
A16
A15
A12
A7
A6
A5
A4
1
32
2
31
3
30
4
29
5
28
6
27
7
26
8
9
M5M28F101AVP
25
24
10
23
11
22
12
21
13
20
14
19
15
18
16
17
Outline 32pin TSOP type-I (8x20mm)
32P3H-E (normal bend)
OE
A10
CE
D7
D6
D5
D4
D3
GND
D2
D1
D0
A0
A1
A2
A3
A4
A5
A6
A7
A12
A15
A16
VPP
VCC
WE
NC
A14
A13
A8
A9
A11
16
17
15
18
14
19
13
20
12
21
11
22
10
9
8
23
M5M28F101ARV
24
25
7
26
6
27
5
28
4
29
3
30
2
31
1
32
A3
A2
A1
A0
D0
D1
D2
GND
D3
D4
D5
D6
D7
CE
A10
OE
Outline 32pin TSOP type-I (8x20mm)
32P3H-F (reverse bend)
NC : NO CONNECTION
1
(970407)
MITSUBISHI LSIs
M5M28F101AFP,J,VP,RV-85,-10
1048576-BIT (131072-WORD BY 8-BIT) CMOS FLASH MEMORY
BLOCK DIAGRAM
A9
A8
PROGRAM
VOLTAGE SW.
ERASE VOLTAGE SW.
VCC (5V)
A7
GND (0V)
A6
A5
A4
VPP (5V, 12V)
X-DECODER
131072 WORD
x8 BIT
CELL MATRIX
Y-DECODER
Y-GATE
CHIP ENABLE
OUTPUT ENABLE
CIRCUITS
OUTPUT SENSE
AND
OUTPUT BUFFERS
A3
ADDRESS
INPUTS
A2
A1
A0
A16
A15
A14
A13
A12
A11
A10
CHIP ENABLE INPUT CE
VERIFY
VOLTAGE
SW.
TIMER
CONTROL
CIRCUITS
COMMAND
LATCH
OUTPUT ENABLE INPUT OE
WRITE ENABLE WE
INPUT
D0 D1 D2 D3 D4 D5 D6 D7
DATA INPUTS/OUTPUTS
FUNCTION
DATA PROTECTION
M5M28F101A are set to the Read-only mode or Read-write mode
by applying the voltage of V PPL or V PPH, respectively, to V PP pin. In
Read-only mode, three operation modes, Read, Out-put disable
and Stand-by are accessible. While, in Read-Write mode, four
operation modes, Read, Output disable, Stand-by and Write are
functional.
1.
Read
Set CE and OE terminals to the read mode (low level). Low level
input to CE and OE, and address signals to the address inputs
(A0~A16) make the data contents of the designated address
location available at data input/output(D0~D7).
Output Disable
When OE is at high level, output from the devices is disabled. Data
input/output are in a high-impedance (High-Z) state.
2.
3.
Power Supply Voltage
When the power supply voltage (Vcc) is less than 2.5V, the
device ignores WE signal.
Write Inhibit
In the cases, as below, write mode is not set.
1) When OE is terminated to the low level.
2) From each mode beginning through finish after 2nd rising
edge of WE for program, auto-program, erase, and autoerase.
Over-erase Protection
Just after powering up, if erase command is inputted, erase
operation is not executed. Once byte-program is performed or
verified data is not FFH in the erase-verify mode, successive
command input for erase will be accepted. Because of this, it
is applicable to the case of multi-chip erasing simultaneously.
Stand-by
When CE is at high level, the devices is in the stand-by mode and
its power consumption is substantially reduced. Data input/output
are in a high-impedance (High-Z) state.
Write
Software command accomplishes program and erase operations
via the command latch in the device, when high voltage is supplied
to VPP. The contents of the latch serve as input to the internal
controller. The controller output dictates the function of device. The
command latch is written by bringing WE to low level, while CE is
at low level and OE is at high level. Addresses are latched on the
falling edge of WE, while data is latched on the rising edge of WE.
Standard micro-processor write timings are used.
2
(970407)
MITSUBISHI LSIs
M5M28F101AFP,J,VP,RV-85,-10
1048576-BIT (131072-WORD BY 8-BIT) CMOS FLASH MEMORY
SOFTWARE COMMAND
When V PP is low (VPP = V PPL), the contents of the command latch
are fixed to 00H, and the device is in read-only mode. When VPP is
high (V PP = VPPH), the device enters read/write mode. The device
operations are selected by writing specific software command into
the command latch.
Read Command
The device is in read mode after writing Read Command (00H) to
the command latch. The device continues to be in read mode until
the other commands are written. When VPP powers-up to high
voltage (VPP = V PPH), the default contents of the command latch is
00H. So it is ensured that the false alteration of memory data does
not occur during VPP power transition.
Program Command
Program Command is the command for byte-program, and
program is initiated by twice of write cycles. Program Command
(40H) is written to the command latch in first write cycle, and the
address and data to be programmed are latched in second write
cycle. Then the address and data are latched on the falling edge
and the rising edge of WE pulse, respectively. The byte- program
operation is initiated at the rising edge of WE in second write
cycle, and terminates in 10 µs, controlled by the internal timer.
Program Verify Command
Following byte program, the programmed byte must be verified.
The program-verify is initiated by writing Program Verify Command
(C0H) to the command latch. After writing Program Verify
Command, programmed data is verified in read mode. Then the
address information is not needed.
Auto Program Command
Auto Program Command is the command for automated program
and program-verify of one byte, and Auto Program is initiated by
twice of write cycles.
Auto Program Command (10H or 50H) is written to the command
latch in first write cycle, and the address and data to be
programmed are latched in second write cycle. Then the address
and data are latched on the falling edge and the rising edge of WE
pulse, respectively. The program operation is initiated at the rising
edge of WE in second write cycle, and program-verify begin automatically. So it is not necessary to program-verify mode after this.
And the complete of Auto Program can be indicated by data
polling.
Data polling is the indication of the complete of Auto Program.
During the Auto Program, on WE=V IH and CE=OE=VIL , the data of
D0~D7 are the inverse of written datum. When Auto Program is
completed, the written datum will be output. It is necessary to fix
the address of written byte during data polling.
Erase Verify Command
Following each erase, all bytes must be verified. The erase verify
is initiated by writing Erase Verify Command (A0H) to the
command latch, while the address to be verified is latched on the
falling edge of the WE pulse. The erase verify command must be
written to the command latch and each address is latched before
each byte is verified. The operation continues for each byte until a
byte is not erased, or the last address is accessed.
Auto Erase Command
Auto Erase Command is the command for automated erase and
erase-verify of all bytes, and Auto Erase is initiated by twice of the
Erase Command (30H) consecutively to the command latch. First,
the preprogram operation is initiated at the rising edge of WE in
second write cycle, and so all byte become zero data. Second,
erase and erase-verify begin, automatically. So it is not necessary
to preprogram and erase-verify mode. And the complete of Auto
Erase can be indicated by status polling.
Status polling is the indication of the complete of Auto Erase.
During the Auto Erase, on WE=VIH and CE=OE=VIL , the data of
D7 is "0". When Auto Erase is completed, the data of D7 is "1".
(D0~D7 are "FFH". )
Reset Command
Reset Command is the command to safely abort the erase or
program sequences. Following erase or program command in first
write cycle, the operation is aborted safely by writing the two
consecutive Reset Commands (FFH). Then the device enters read
mode without altering memory contents.
Read Device Identifier Code
Device Identifier operation is initiated by writing 80H into the
command latch. Following the command write, the manufacturer
code (1CH) and the device code (D9H) can be read from address00000H and 00001H, respectively.
The M5M28F101A is supported with the Common Device
Identifier Code of MITSUBISHI 1M Flash memory (x8) family.
Common Device Identifier operation is initiated by writing 90H into
the command latch. Under this case, following the command write,
the manufacturer code (1CH) and the device code (D0H) can be
read from address-00000H and 00001H, respectively. Additionally,
Common Device Identifier operation is initiated by rising A9 to high
voltage for PROM programmers.
Erase Command
Erase Command is the command for chip-erase, and chip-erase is
initiated by writing twice of the Erase Command (20H)
consecutively to the command latch. The erase operation is
initiated with the rising edge of the WE pulse and terminates in
9.5ms, controlled by the internal timer. This two-step sequence for
chip-erase prevents from erasing accidentally.
3
(970407)
MITSUBISHI LSIs
M5M28F101AFP,J,VP,RV-85,-10
1048576-BIT (131072-WORD BY 8-BIT) CMOS FLASH MEMORY
MODE SELECTION
Pins
CE
OE
WE
VPP
Data I/O
Read
Output disable
Stand by
Read
Output disable
Stand by
Write
VIL
VIL
VIH
VIL
VIL
VIH
VIL
VIL
VIH
X
VIL
VIH
X
VIH
VIH
VIH
X
VIH
VIH
X
VIL
VPPL
VPPL
VPPL
VPPH
VPPH
VPPH
VPPH
Data out
Hi-Z
Hi-Z
Data out
Hi-Z
Hi-Z
Data out
Mode
Read-Only
Read/Write
Note 1 : X can be VIL or VIH
ABSOLUTE MAXIMUM RATINGS
Symbol
VI1
VI2
VI3
Topr
Tstg
Parameter
All input or output voltage except VPP/A9
VPP supply voltage
A9 supply voltage
Operating temperature
Storage temperature
Ratings
–0.6~7
–0.6~14.0
–0.6~13.5
–10~80
–65~125
Conditions
With respect to Ground
Unit
V
V
V
°C
°C
SOFTWARE COMMAND DEFINITION
Mode
Write
First bus cycle
Address
X
Data I/O
00H
Mode
–––
Write
X
40H
Write
Write
X
C0H
Read
Auto Program
Write
X
10H or 50H
Write
Erase (Chip Erase)
Erase verify
Auto Erase
Reset
Read device identifier code
Read common device identifier code
Write
Write
Write
Write
Write
Write
X
Verify address
X
X
X
X
20H
A0H
30H
FFH
80H
90H
Write
Read
Write
Write
Read
Read
Command
Read
Program
(Byte Program)
Program verify
Second bus cycle
Address
Data I/O
–––
–––
Program
Program Data
Address
X
Program
Address
Verify Data
Program Data
X
X
X
X
ADI
ADI
20H
Verify Data
30H
FFH
DDI1
DDI2
Note 2 : Write and read mode are defined in mode selection table.
ADI = Address of Device Identifier : 00000H for manufacturer code, 00001H for device code.
DDI1 = Data of Device Identifier : 1CH for manufacturer code, D9H for device code.
DDI2 = Data of Common Device Identifier : 1CH for manufacturer code, D0H for device code.
COMMON DEVICE IDENTIFIER CODE (not use the software command)
Pins
Code
Manufacturer Code
Device Code
A0
D7
D6
D5
D4
D3
D2
D1
D0
VIL
VIH
0
1
0
1
0
0
1
1
1
0
1
0
0
0
0
0
Hex.
Data
1CH
D0H
Note 3 : A9 = 11.5V~13.0V
A1~A8, A10~A16, CE, OE = VIL, WE = VIH
VCC = VPP = 5V±0.5V
CAPACITANCE
Symbol
CIN
COUT
4
Parameter
Input capacitance (Address, CE, OE, WE)
Output capacitance
Test conditions
Ta = 25°C, f = 1MHz, Vin = Vout = 0V
Min
Limits
Typ
Max
8
12
Unit
pF
pF
(970407)
MITSUBISHI LSIs
M5M28F101AFP,J,VP,RV-85,-10
1048576-BIT (131072-WORD BY 8-BIT) CMOS FLASH MEMORY
DC ELECTRICAL CHARACTERISTICS (Ta = 0~70°C, Vcc = 5V±0.5V, unless otherwise noted)
Symbol
Parameter
ILI
ILO
ISB1
ISB2
ICC1
ICC2
ICC3
Input leakage current
Output leakage current
IPP1
VPP read current
IPP2
IPP3
VIL
VIH
VOL
VOH1
VOH2
VPPL
VPPH
VPP program current
VPP erase current
Input low voltage
Input high voltage
Output low voltage
Test conditions
Min
Limits
Typ
0V≤VIN≤VCC
0V≤VOUT≤VCC
VCC = 5.5V, CE = VIH
VCC = 5.5V, CE = VCC±0.2V
VCC stand-by current
VCC = 5.5V, CE = VIL, f = 11.8MHz, IOUT = 0mA
VCC active read current
VCC program current
VCC erase current
VPP = VPPH
VPP = VPPH
0V≤VPP≤VCC
VCC<VPP≤6.5V
VPP = VPPH
VPP = VPPH
VPP = VPPH
– 0.5
2.0
IOL = 5.8mA
IOH = –2.5mA
IOH = –100µA
Output high voltage
Max
10
10
1
100
30
30
30
10
100
100
30
30
0.8
Vcc+0.5
0.45
2.4
0
11.4
µA
µA
mA
µA
mA
mA
mA
µA
mA
mA
V
V
V
V
Vcc–0.4
VPP voltage during read-only mode
VPP voltage during read/write mode
Unit
12.0
6.5
12.6
V
V
AC ELECTRICAL CHARACTERISTICS (Ta = 0~70°C, Vcc = 5V±0.5V, unless otherwise noted)
Read-Only Mode
Symbol
tRC
ta (AD)
ta (CE)
ta (OE)
tCLZ
tOLZ
tDF
tOH
tWRR
tAVAV
tAVQV
tELQV
tGLQV
tELQX
tGLQX
tGHQZ
tOH
tWHGL
Parameter
Read cycle time
Address access time
Chip enable access time
Output enable access time
Chip enable to output in low Z
Output enable to output in low Z
Output enable high to output in low Z
Output hold from CE, OE, addresses
Write recovery time before read
Limits
M5M28F101A-85 M5M28F101A-10
Min
Max
Min
Max
85
100
85
100
85
100
50
45
0
0
0
0
25
25
0
0
6
6
Unit
ns
ns
ns
ns
ns
ns
ns
ns
µs
Note 4 : VCC must be applied simultaneously or before VPP and removed simultaneously or after VPP.
Timing measurements are made under AC WAVEFORMS FOR READ OPERATIONS.
5
(970407)
MITSUBISHI LSIs
M5M28F101AFP,J,VP,RV-85,-10
1048576-BIT (131072-WORD BY 8-BIT) CMOS FLASH MEMORY
Read/Write Mode
Symbol
tWC
tAS
tAH
tDS
tDH
tWRR
tRRW
tCS
tCH
tWP
tWPH
tDP
tDE
tOEH
tDAEC
tDAP
tVSC
tOWP
tOWS
tOWH
tOAS
tOAH
tODS
tODH
tAVAV
tAVWL
tWLAX
tDVWH
tWHDX
tWHGL
tGHWL
tELWL
tWHEH
tWLWH
tWHWL
tWHWL1
tWHWL2
tVPEH
Limits
Parameter
M5M28F101A-85
Min
85
0
60
50
10
6
0
20
0
60
20
10
9.5
100
1.7
12
1
70
0
0
0
55
45
20
Write cycle time
Address set-up time
Address hold time
Data set-up time
Data hold time
Write recovery time before read
Read recovery time before write
Chip enable set-up time
Chip enable hold time
Write pulse width
Write pulse width high
Duration of program operation
Duration of erase operation
Output enable hold time before status / data polling
Duration of auto erase operation
Duration of auto program operation
VPP set-up time to chip enable low
Write pulse width (optional write)
Write enable set-up time (optional write)
Write enable hold time (optional write)
Address set-up time (optional write)
Address hold time (optional write)
Data set-up time (optional write)
Data hold time (optional write)
Max
12.5
400
M5M28F101A-10
Min
100
0
60
50
10
6
0
20
0
60
20
10
9.5
100
1.7
12
1
70
0
0
0
55
45
20
Unit
Max
ns
ns
ns
ns
ns
µs
ns
ns
ns
ns
ns
µs
ms
ns
s
µs
µs
ns
ns
ns
ns
ns
ns
ns
12.5
400
Note 5 : a. Read timing parameters during read/write mode are the same as during read-only mode.
b. VCC must be applied simultaneously or before VPP and removed simultaneously or after VPP.
AC WAVEFORMS FOR READ OPERATIONS
TEST CONDITIONS
FOR AC CHARACTERISTICS
VIH
ADDREVIL
SSES
Input voltage : VIL = 0.45V, VIH = 2.4V
Input rise and fall times : ≤10ns
Reference voltage
at timing measurement : 1.5V
Output load : 1TTL gate + CL
(= 100pF)
or
CE
ADDRESS VALID
tRC
VIH
VIL
OE
ta (CE)
VIH
VIL
WE
tWRR
tDF
1.3V
VIH
ta (OE)
VIL
1N914
tOH
3.3kΩ
tOLZ
DATA
VOH
VOL
VCC
6
HIGH-Z
tCLZ
ta (AD)
OUTPUT VALID
HIGH-Z
DUT
CL = 100pF
5.0V
GND
(970407)
MITSUBISHI LSIs
M5M28F101AFP,J,VP,RV-85,-10
1048576-BIT (131072-WORD BY 8-BIT) CMOS FLASH MEMORY
AC WAVEFORMS FOR PROGRAM OPERATIONS
CE
VIL
tCS
tCH
tRRW
tWPH
VIH
DIN
C0H
COMMAND SET
DATA SET
COMMAND SET
tVSC
DATA TO BE VERIFIED
tODH
VPPH
tOAS
tOWS
OPTIONAL WRITE
tODS
tOWH
VIH
VIL
CE
tDS
40H
VPPL
WE
ta (CE)
tDH
5.0V
0.0V
VPP
tWRR
tDP
ta (OE)
tWP
VIL
VCC
tAH
VIH
VIL
DATA
tAS
VIH
VIL
WE
tWC
VIH
VIL
OE
PROGRAM VERIFY
PROGRAM
VIH
ADDRESSES
tOAH
tOWP
VIH
VIL
AC WAVEFORMS FOR ERASE OPERATIONS
ERASE
VIH
ADDRESSES
CE
VIL
tCS
tCH
tRRW
tWPH
tWP
VIH
20H
COMMAND SET
ta (CE)
tDH
tDS
20H
A0H
COMMAND SET
COMMAND SET
DATA TO BE VERIFIED
5.0V
0.0V
VPP
tWRR
ta (OE)
VIL
VCC
tDE
VIH
VIL
DATA
tAS
VIH
VIL
WE
tAH
VIH
VIL
OE
tWC
ERASE VERIFY
tVSC
VPPH
VPPL
7
(970407)
MITSUBISHI LSIs
M5M28F101AFP,J,VP,RV-85,-10
1048576-BIT (131072-WORD BY 8-BIT) CMOS FLASH MEMORY
AC WAVEFORMS FOR AUTO PROGRAM OPERATION
PROGRAM / DATA POLLING
VIH
ADDRESSES
CE
ADDRESS
VALID
VIL
tWC
tCS
ta (AD)
tAH
ta (CE)
tCH
tWPH
tRRW
tOEH
ta (OE)
VIH
tDAP
VIL
DATA
ADDRESS VALID
VIH
VIL
WE
ADDRESS VALID
VIH
VIL
OE
tAS
tWP
VIH
VIL
tDH
tDS
10H
or
50H
Din
Din
COMMAND SET
DATA SET
OUTPUT
Din
Din
OUTPUT
5.0V
VCC
VPP
0.0V
tVSC
VPPH
VPPL
AC WAVEFORMS FOR AUTO CHIP ERASE OPERATION
ADDRESSES
ERASE / STATUS POLLING
VIH
VIL
CE
tWC
ta (CE)
VIH
VIL
OE
VIL
WE
tCS
tDAEC
tWP
VIH
tDH
tDS
30H
COMMAND SET
30H
COMMAND SET
"1" /(FFH)
"0"
D7OUTPUT
"0"
D7OUTPUT
D7 /
(D0~D7)OUTPUT
5.0V
0.0V
VPP
tOEH
VIH
VIL
VCC
ta (OE)
tWPH
tRRW
VIL
DATA
tCH
VIH
tVSC
VPPH
VPPL
8
(970407)
MITSUBISHI LSIs
M5M28F101AFP,J,VP,RV-85,-10
1048576-BIT (131072-WORD BY 8-BIT) CMOS FLASH MEMORY
PROGRAMMING AND ERASE ALGORITHM FLOW CHART
PROGRAM :
ERASE :
INPUT DATA
START
INPUT DATA
START
VCC = 5V, VPP = VPPH
VCC = 5V, VPP = VPPH
ADDR = FIRST LOCATION
YES
ALL
BYTES = 00H?
X=0
WRITE PROGRAM
COMMAND
40H
WRITE PROGRAM DATA
DIN
NO
PROGRAM ALL
BYTES = 00H
ADDR = FIRST LOCATION
DURATION = 10µs
X=0
X=X+1
WRITE PROGRAMVERIFY COMMAND
C0H
WRITE ERASE COMMAND
20H
WRITE ERASE COMMAND
20H
DURATION = 6µs
DURATION = 9.5ms
X=X+1
X = 25?
YES
WRITE ERASE-VERIFY
COMMAND
A0H
NO
DURATION = 6µs
FAIL
VERIFY
BYTE?
PASS
PASS
VERIFY
BYTE?
X = 1000?
FAIL
YES
NO
INC ADDR
NO
LAST ADDR?
FAIL
VERIFY
BYTE?
YES
WRITE READ COMMAND
PASS
VPP = VPPL
INC ADDR
DEVICE
PASSED
NO
PASS
VERIFY
BYTE?
FAIL
LAST ADDR?
DEVICE
FAILED
YES
WRITE READ COMMAND
VPP = VPPL
DEVICE
PASSED
DEVICE
FAILED
(Erase Complete)
9
(970407)
MITSUBISHI LSIs
M5M28F101AFP,J,VP,RV-85,-10
1048576-BIT (131072-WORD BY 8-BIT) CMOS FLASH MEMORY
AUTO PROGRAM AND AUTO ERASE OPERATION
AUTO PROGRAM :
AUTO ERASE :
START
INPUT DATA
VCC = 5.0V, VPP = VPPH
INPUT DATA
VCC = 5.0V, VPP = VPPH
WRITE AUTO PROGRAM
SETUP COMMAND
10H OR
50H
WRITE AUTOERASE
SETUP COMMAND
30H
WRITE AUTO PROGRAM
ADDRESS DATA
DIN
WRITE AUTOERASE
COMMAND
30H
DATA POLLING
INCREMENT ADDR
START
NO
LAST ADDR?
STATUS POLLING
ERASURE
COMPLETE
YES
PROGRAMMING
COMPLETE
10
(970407)