MITSUBISHI M5M51R16AWG-15L

MITSUBISHI LSIs
M5M51R16AWG -10L, -12L, -15L,
-10H, -12H, -15H
1048576-BIT(65536-WORD BY 16-BIT)CMOS STATIC RAM
PIN CONFIGURATION (TOP VIEW)
DESCRIPTION
The M5M51R16AWG is a 1048576-bit CMOS static RAM
organized as 65536 words by 16-bits, which are fabricated using
high-performance CMOS technology. The use of CMOS cells and
periphery results in a high density and low power static RAM.
The M5M51R16AWG can achieve low stand-by current and low
operation current and ideal for the battery back-up application.
The M5M51R16AWG is packaged in a 48-pin chip scale package
which is a high reliability and high density surface mount device
(SMD). Using this type of devices, it becomes very easy to design
a small system.
The M5M51R16AWG is fully compatible with the M5M51R16WG.
1
2
3
4
5
6
BC1
OE
A6
A3
A0
NC
DQ16
BC2
A7
A2
S
DQ1
DQ14 DQ15
A5
A1
DQ2
DQ3
GND DQ13
NC
A4
DQ4
VCC
A
B
C
D
E
VCC
DQ12 GND
NC
DQ5 GND
F
DQ11 DQ10
A14
DQ7
DQ6
G
FEATURE
Power supply current
Type name
A9
Access time
(max)
M5M51R16AWG- 10L
M5M51R16AWG- 12L
M5M51R16AWG- 15L
100ns
120ns
150ns
M5M51R16AWG- 10H
M5M51R16AWG- 12H
M5M51R16AWG- 15H
100ns
120ns
150ns
Active
(max)
DQ9
NC
A10
A13
W
DQ8
NC
A8
A11
A12
A15
NC
H
Stand-by
(max)
4µA
10mA
(1MHz)
2µA
PIN CONFIGURATION (BOTTOM VIEW)
• Single +1.8V~2.7V power supply
• Low power down current 0.05µA(typ.)
• Directly TTL compatible : All inputs and outputs
• Easy memory expansion and power down by S,BC1 and BC2
• Data hold on +1.0V power supply
• Three-state outputs : OR-tie capability
• OE prevents data contention in the I/O bus
• Common data I/O
• Separate control of lower and upper bytes by BC1 and BC2
• Package
48-pin chip scale package(CSP)
Ball pitch : 0.75mm
Package size: 7.0mm x 8.5mm
6
5
4
3
2
1
NC
A0
A3
A6
OE
BC1
DQ1
S
A2
A7
BC2
DQ16
DQ3
DQ2
A1
A5
DQ15 DQ14
VCC
DQ4
A4
NC
DQ13 GND
GND
DQ5
NC
GND
DQ12 VCC
DQ6
DQ7
A14
A9
DQ10 DQ11
DQ8
W
A13
A10
NC
DQ9
A15
A12
A11
A8
NC
A
B
C
D
E
F
APPLICATION
Small capacity memory units.
G
H
NC
Outline
48FJA
NC : NO CONNECTION
Aug.1. 1998
MITSUBISHI
ELECTRIC
1
MITSUBISHI LSIs
M5M51R16AWG -10L, -12L, -15L,
-10H, -12H, -15H
1048576-BIT(65536-WORD BY 16-BIT)CMOS STATIC RAM
FUNCTION
The operation mode of the M5M51R16A series are
determined by a combination of the device control
inputs S, W, OE, BC1 and BC2. Each mode is
summarized in the function table.
A write cycle is executed whenever the low level W
overlaps with the low level BC1 and/or BC2 and the
low level S. The address must be set up before the
write cycle and must be stable during the entire cycle.
The data is latched into a cell on the trailing edge of
W, BC1, BC2 or S, whichever occurs first, requiring
the set-up and hold time relative to these edge to be
maintained. The output enable input OE directly
controls the output stage. Setting the OE at a high
level, the output stage is in a high-impedance state,
and the data bus contention problem in the write cycle
is eliminated.
A read cycle is executed by setting W at a high level
and OE at a low level while BC1 and/or BC2 and S
are in an active state. (BC1 and/or BC2=L, S=L)
When setting BC1 at a high level and the other pins
are in an active state, upper-Byte are in a selectable
mode in which both reading and writing are enabled,
and lower -Byte are in a non-selectable mode. And
when setting BC2 at a high level and the other pins
are in an active state, lower-Byte are in a selectable
mode in which both reading and writing are enabled,
and upper -Byte are in a non-selectable mode.
When setting BC1 and BC2 at a high level or S at
a high level, the chips are in a non-selectable mode in
which both reading and writing are disabled.
In this mode, the output stage is in a high-impedance
state, allowing OR -tie with other chips and memory
expansion by BC1, BC2 and S. S, BC1 and BC2
control the power down feature. When S, BC1 and
BC2 go high, the power supply current is reduced as
low as the stand-by current which is specified as Icc3
or Icc4, and the memory data can be held at +1.0V
power supply, enabling battery back-up operation
during power-failure or power-down operation in the
non-selected mode.
FUNCTION TABLE
S W OE BC1 BC2
L H L
L
L
Mode
Word Read
Upper-Byte Read
Icc
DQ1~8 DQ9~16
Dout
Active
Dout
Dout
Active
Dout
High-Z
Active
Din
Din
Active
High-Z
Din
Active
Din
High-Z
Active
L
H
L
H
L (Lower-Byte Non selection) High-Z
L
H
L
L
H
L
L
X
L
L
L
L
X
H
L
L
L
X
L
H
L
X
H
H H
X X
X X
X
H
X
X
H
X
Lower-Byte Read
(Upper-Byte Non selection)
Word Write
Upper-Byte Write
(Lower-Byte Non selection)
Lower-Byte Write
(Upper-Byte Non selection)
Output disable
Non selection
Non selection
High-Z High-Z Active
High-Z High-Z Stand-by
High-Z High-Z Stand-by
(High-Z=High-impedance)
BLOCK DIAGRAM
B6 DQ1
C5 DQ2
A4 D4
A3 A4
A2 B4
A1 C4
A0 A5
A15 H5
A14 F4
C6 DQ3
65536 WORDS x16 BITS
E5 DQ5
( 512 ROWS
x 256 COLUMNS
x 8 BLOCKS )
F6 DQ6
F5 DQ7
G6 DQ8
A13 G4
A12 H4
ADDRESS
INPUTS
D5 DQ4
G1 DQ9
DATA
INPUTS/
OUTPUTS
F2 DQ10
F1 DQ11
A8 H2
E2 DQ12
A9 F3
D2 DQ13
A10 G3
C1 DQ14
A11 H3
C2 DQ15
B1 DQ16
A7 B3
A5 C3
A6 A3
CLOCK
GENERATOR
CHIP SELECT
S B5
INPUT
WRITE CONTROL
G5
W
INPUT
D6 Vcc
OUTPUT ENABLE OE A2
INPUT
E6 GND
(0V)
D1 GND
(0V)
BYTE
CONTROL
INPUTS
Aug.1. 1998
E1 Vcc
BC2 B2
E3 GND
(0V)
BC1 A1
MITSUBISHI
ELECTRIC
2
MITSUBISHI LSIs
M5M51R16AWG -10L, -12L, -15L,
-10H, -12H, -15H
1048576-BIT(65536-WORD BY 16-BIT)CMOS STATIC RAM
ABSOLUTE MAXIMUM RATINGS
Symbol
Vcc
VI
Vo
Pd
Topr
Tstg
Parameter
Supply voltage
Input voltage
Output voltage
Power dissipation
Operating temperature
Storage temperature
Conditions
With respect to GND
Ta=25°C
Ratings
-0.2 ~ 4.6
-0.2* ~ Vcc+0.2(max.4.6V)
0 ~ Vcc
1
0 ~ 70
-65 ~150
Unit
V
V
V
W
°C
°C
* -1.0V in case of AC ( Pulse width ≤ 30ns )
DC ELECTRICAL CHARACTERISTICS
Symbol
( Ta = 0 ~ 70°C, Vcc = 1.8V~2.7V, unless otherwise noted )
Parameter
Limits
Conditions
Min
VIH
High-level input voltage
0.7 x Vcc
VIL
Low-level input voltage
-0.2*
VOH
High-level output voltage
IOH = -0.1mA
VOL
Low-level output voltage
IOL = 0.1mA
Input current
VI =0 ~Vcc
II
Io
Output current in off-state
Typ
Max
Vcc+0.2V V
0.4
1.6
BC1 and BC2 = VIH or S = VIH or
OE = VIH, VI/O = 0~ Vcc
BC1 and BC2 = VIL, S = VIL
other inputs = VIH or VIL
Output-open(duty 100%)
Unit
V
V
0.2
V
±1
µA
±1
µA
Min
cycle
15
25
mA
1MHz
7
10
mA
10
15
mA
ICC2B
Byte operation(8bit)
Active supply current
(AC,TTL level)
Min
(BC1 = VIH and BC2 = VIL) or (BC1 = VIL and cycle
BC2 = VIH) , S = VIL ,other inputs = VIH or VIL
1MHz
Output-open(duty 100%)
5
8
mA
ICC3
1) S≥Vcc-0.2V, other inputs = 0~Vcc
2) BC1 and BC2 ≥Vcc-0.2V,S≤0.2V,
other inputs = 0~Vcc
-L
4
Stand-by current
µA
-H
2
µA
0.3
mA
ICC1W
ICC2W
ICC1B
ICC4
Word operation(16bit)
Active supply current
(AC,TTL level)
Stand-by current
BC1 and BC2 = VIH or S = VIH,
other inputs = 0~Vcc
* -1.0V in case of AC ( Pulse width ≤ 30ns )
CAPACITANCE
Symbol
CI
CO
( Ta = 0 ~ 70°C, Vcc = 1.8V~2.7V, unless otherwise noted )
Parameter
Input capacitance
Output capacitance
Conditions
VI=GND, Vi=25mVrms, f=1MHz
VO=GND, Vo=25mVrms, f=1MHz
Min
Limits
Typ
Max
6
10
Unit
pF
pF
Note 1: Direction for current flowing into an IC is positive (no mark).
Note 2: Typical value is Vcc = 2.0V, Ta = 25°C
Note 3: CI,CO are periodically sampled and are not 100% tested.
Aug.1. 1998
MITSUBISHI
ELECTRIC
3
MITSUBISHI LSIs
M5M51R16AWG -10L, -12L, -15L,
-10H, -12H, -15H
1048576-BIT(65536-WORD BY 16-BIT)CMOS STATIC RAM
AC ELECTRICAL CHARACTERISTICS ( Ta = 0 ~ 70°C, Vcc = 1.8V~2.7V, unless otherwise noted )
(1) MEASUREMENT CONDITIONS
Input pulse level • • • • • • • VIH = 0.7 x Vcc + 0.2V, VIL = 0.2V
1 TTL
Input rise and fall time • • • • 5ns
Reference level • • • • • • • • VOH = 0.9V, VOL = 0.9V
DQ
Output loads • • • • • • • • • Fig.1,CL = 30pF
CL = 5pF ( for ten, tdis )
CL ( Including scope
and JIG )
Transition is measured ±200mV from steady
state voltage. ( for ten, tdis )
Fig.1 Output load
(2)READ CYCLE
Limits
Symbol
tCR
ta(A)
ta(S)
ta(BC1)
ta(BC2)
ta(OE)
tdis(S)
tdis(BC1)
tdis(BC2)
tdis(OE)
ten(S)
ten(BC1)
ten(BC2)
ten(OE)
tV(A)
-10L,-10H
Min
Max
100
100
100
Parameter
Read cycle time
Address access time
Chip select access time
BC1 access time
BC2 access time
Output enable access time
Output disable time after S high
Output disable time after BC1 high
Output disable time after BC2 high
Output disable time after OE high
Output enable time after S low
Output enable time after BC1 low
Output enable time after BC2 low
Output enable time after OE low
Data valid time after address change
10
10
10
5
10
-12L,-12H
Min
Max
120
120
120
120
120
60
40
40
40
40
10
10
10
5
10
-10L,-10H
Min
Max
-12L,-12H
Min
Max
100
75
0
85
85
85
85
50
0
0
120
85
0
100
100
100
100
55
0
0
100
100
50
35
35
35
35
-15L,-15H
Min
Max
150
150
150
150
150
75
50
50
50
50
10
10
10
5
10
Unit
-15L,-15H
Min
Max
150
100
0
120
120
120
120
60
0
0
50
50
5
5
10
10
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
(3)WRITE CYCLE
Limits
Symbol
tCW
tw(W)
tsu(A)
tsu(A-WH)
tsu(BC1)
tsu(BC2)
tsu(S)
tsu(D)
th(D)
trec(W)
tdis(W)
tdis(OE)
ten(W)
ten(OE)
ten(BC1)
ten(BC2)
Aug.1. 1998
Parameter
Write cycle time
Write pulse width
Address set up time
Address set up time with respect to W
BC1 setup time
BC2 setup time
Chip select set up time
Data set up time
Data hold time
Write recovery time
Output disable time after W low
Output disable time after OE high
Output enable time after W high
Output enable time after OE low
Output enable time after BC1 low
Output enable time after BC2 low
MITSUBISHI
ELECTRIC
40
40
35
35
5
5
10
10
5
5
10
10
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
4
MITSUBISHI LSIs
M5M51R16AWG -10L, -12L, -15L,
-10H, -12H, -15H
1048576-BIT(65536-WORD BY 16-BIT)CMOS STATIC RAM
(4) TIMING DIAGRAMS
Read cycle
tCR
A 0~15
tv(A)
ta(A)
ta(BC1) or
ta(BC2)
BC1 and/or BC2
(Note 4)
tdis(BC1) or
tdis(BC2)
(Note 4)
tdis(S)
(Note 4)
tdis(OE)
(Note 4)
ta(S)
S
(Note 4)
ta(OE)
ten(OE)
OE
(Note 4)
ten(BC1)
ten(BC2)
ten(S)
DQ1~16
DATA VALID
W = "H" level
Write cycle ( W control mode )
tCW
A 0~15
tsu(BC1) or tsu(BC2)
BC1 and/or BC2
(Note 4)
(Note 4)
tsu(S)
S
(Note 4)
(Note 4)
tsu(A-WH)
OE
tsu(A)
tw(W)
trec(W)
W
tdis(W)
tdis(OE)
ten(OE)
ten(W)
DATA IN
DQ1~16
STABLE
tsu(D)
Aug.1. 1998
MITSUBISHI
ELECTRIC
th(D)
5
MITSUBISHI LSIs
M5M51R16AWG -10L, -12L, -15L,
-10H, -12H, -15H
1048576-BIT(65536-WORD BY 16-BIT)CMOS STATIC RAM
Write cycle ( BC1, BC2 control mode )
tCW
A 0~15
tsu(A)
BC1 and/or BC2
tsu(BC1) or
tsu(BC2)
trec(W)
S
(Note 4)
(Note 4)
(Note 6)
(Note 5)
W
(Note 4)
(Note 4)
tsu(D) th(D)
DATA IN
STABLE
DQ1~16
Write cycle (S control mode)
tCW
A 0~15
BC1 and/or BC2
(Note 4)
(Note 4)
tsu(A)
tsu(S)
trec(W)
S
(Note 6)
W
(Note 5)
(Note 4)
(Note 4)
tsu(D)
DQ1~16
th(D)
DATA IN
STABLE
Note 4: Hatching indicates the state is "don't care".
Note 5: Writing is executed while S low overlaps BC1 and/or BC2 low and W low.
Note 6: When the falling edge of W is simultaneously or prior to the falling edge of BC1 and/or BC2
or falling edge of S, the outputs are maintained in the high impedance state.
Note 7:Don't apply inverted phase signal externally when DQ pin is output mode.
Note 8:ten,tdis are periodically sampled and are not 100% tested.
Note 9:tCR(Read cycle time) is defined as whole time from reading address set up to this address change
under read mode set condition by S,W,OE,BC1 and/or BC2.
Note 10:tCW(Write cycle time) is defined as whole time from writing address set up to this address change
under write mode set condition by S,W,BC1 and/or BC2.
Aug.1. 1998
MITSUBISHI
ELECTRIC
6
MITSUBISHI LSIs
M5M51R16AWG -10L, -12L, -15L,
-10H, -12H, -15H
1048576-BIT(65536-WORD BY 16-BIT)CMOS STATIC RAM
POWER DOWN CHARACTERISTICS
(1) ELECTRICAL CHARACTERISTICS
Symbol
( Ta = 0 ~ 70°C, unless otherwise noted )
Parameter
Test conditions
Vcc(PD) Power down supply voltage
Chip select input S
VI(BC)
Byte control inputs BC1 and
BC2
ICC(PD)
(2) TIMING REQUIREMENTS
Unit
V
0.7 x Vcc
1.0V ≤ Vcc(PD) ≤ 1.8V
Power down supply current
Max
1.0
1.8V ≤ Vcc(PD)
VI(S)
Limits
Typ
Min
V
Vcc(PD)
1.8V ≤ Vcc(PD)
0.7 x Vcc
1.0V ≤ Vcc(PD) ≤ 1.8V
V
Vcc(PD)
Vcc = 2.0V
1) S ≥ Vcc - 0.2V
other inputs = 0~Vcc
2) BC1 and BC2 ≥ Vcc - 0.2V
S ≤ 0.2V,other inputs = 0~Vcc
-L
2
µA
-H
0.05
1
( Ta = 0 ~ 70°C, unless otherwise noted )
Limits
Symbol
Parameter
Test conditions
tsu(PD)
Power down set up time
trec(PD) Power down recovery time
Min
Typ
Max
Unit
0
ns
5
ms
(3) POWER DOWN CHARACTERISTICS
S control mode
Vcc
tsu(PD)
1.8V
1.8V
trec(PD)
0.7 x Vcc
0.7 x Vcc
S
S ≥ Vcc
BC1 and BC2 control mode
Vcc
tsu(PD)
1.8V
1.8V
trec(PD)
0.7 x Vcc
0.7 x Vcc
BC1 and BC2
BC1 and BC2 ≥ Vcc
Aug.1. 1998
MITSUBISHI
ELECTRIC
7